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Yasuo Cho

Section

New Industry Creation Hatchery Center

Job title

Specially Appointed Professor(Research)

Degree

工学博士（東北大学）

researchmap

https://researchmap.jp/read0017186

J-GLOBAL ID

200901003907438870

Committee Memberships 38

ナノテスティング学会企画運営委員会　企画運営委員

2018/11 - Present
Japan-Korea Conference on Ferroelectricity　Organizing Committee委員

2012/04 - Present
The Dielectric Society of Japan　Director and Vice Chair

2019/12 - 2022/03
強誘電体応用会議　論文委員，運営委員

2006/04 - 2022/03
International Conference on Non-contact Atomic Force Microscopy　Program Committee 委員

2012/04 - 2013/03
International Conference on Non-contact Atomic Force Microscopy　Program Committee 委員

2012/04 - 2013/03
強誘電体応用会議　運営委員

2006/04 -
9th International Conference on Non-contact Atomic Force Microscopy　Program Committee 委員

2006/04 -
6th Japan-Korea Conference on Ferroelectricity　Organization Committee 委員

2006/04 -
強誘電体応用会議　運営委員

2006/04 -
9th International Conference on Non-contact Atomic Force Microscopy　Program Committee 委員

2006/04 -
6th Japan-Korea Conference on Ferroelectricity　Organization Committee 委員

2006/04 -
International Symposium Micro-And-Nano-Scale Domain Structuring In Ferroelectrics　International Advisory Committee 委員

2005/04 -
International Symposium Micro-And-Nano-Scale Domain Structuring In Ferroelectrics　International Advisory Committee 委員

2005/04 -
The 8th International Sumposium on Ferroic Domains and Micro-to-Nano-scopic Structures　Program Committee 委員

2004/04 -
CIMTEC 2006 (11th International Comferences on Modern Materials amd Technologies)　Advisory Boards 委員

2004/04 -
The 8th International Sumposium on Ferroic Domains and Micro-to-Nano-scopic Structures　Program Committee 委員

2004/04 -
CIMTEC 2006 (11th International Comferences on Modern Materials amd Technologies)　Advisory Boards 委員

2004/04 -
超音波エレクトロニクスの基礎と応用に関するシンポジウム　運営委員

2002/04 -
超音波エレクトロニクスの基礎と応用に関するシンポジウム　運営委員

2002/04 -
日本音響学会　論文部会委員

2001/04 -
日本音響学会　評議員

2001/04 -
日本音響学会　論文部会委員

2001/04 -
日本音響学会　評議員

2001/04 -
日本音響学会　東北支部庶務幹事

2000/04 -
強誘電体メモリ国際会議実行委員会　委員

2000/04 -
日本音響学会　東北支部庶務幹事

2000/04 -
強誘電体メモリ国際会議実行委員会　委員

2000/04 -
IEEE International Ultrasonics Symposium Technical Program Committee　委員（Group 4 (SAWs))

1999/04 -
IEEE International Ultrasonics Symposium Technical Program Committee　委員（Group 4 (SAWs))

1999/04 -
1998 IEEE International Ultrasonics Symposium (Sendai) Local Committee　現地委員

1998/04 -
超音波エレクトロニクスの基礎と応用に関するシンポジウム　運営委員

1998/04 -
ＪＪＡＰ編集委員会　編集委員

1998/04 -
日本音響学会　東北支部会計幹事

1998/04 -
1998 IEEE International Ultrasonics Symposium (Sendai) Local Committee　現地委員

1998/04 -
超音波エレクトロニクスの基礎と応用に関するシンポジウム　運営委員

1998/04 -
ＪＪＡＰ編集委員会　編集委員

1998/04 -
日本音響学会　東北支部会計幹事

1998/04 -

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Professional Memberships 6

IDEMA JAPAN

2022/11 - Present
The Dielectric Society of Japan

2019/12 - Present
日本音響学会
応用物理学会
電子情報通信学会
米国電気電子学会(The Institute of Electrical and Electronics Engineers,Inc.)

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Research Interests 6

半導体計測
強誘電体記録
走査型非線形誘電率顕微鏡
薄膜表面界面物性
電子デバイス
応用物理学

Research Areas 1

Manufacturing technology (mechanical, electrical/electronic, chemical engineering) / Electronic devices and equipment /

Awards 14

40th JSAP Outstanding Paper Award Recipients 2018(Award for Best Review Paper)

2018/09　The Japan Society of Applied Physics　High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy
平成27年度科学技術分野の文部科学大臣表彰科学技術賞開発部門

2015/04/15　文部科学省文部科学大臣　走査型非線形誘電率顕微鏡法の開発
2014年服部報公会「報公賞」

2014/10/09　公益財団法人服部報公会　非線形誘電率顕微鏡の発明・実用化と電子デバイス開発への応用
ISIF² OUTSTANDING ACHIEVEMENT AWARD

2009/09/29　ISIF²(Inrernational Symposium on Integrated Ferroelectrics and Functionalities)　For work in scanning nonlinear dielectric microscopy in the field of Ferroelectric Materials
JJAP Editorial Contribution Award

2008/04/08　The Japan Society of Applied Physics
ドコモ・モバイル・サイエンス賞

2006/10/20　モバイル・コミュニケーション・ファンド　「次世代移動体通信用超高密度ＳＮＤＭ強誘電体プローブメモリに関する研究」
Researcher of the Year 2005

2006/03/01　Pacific Nanotechnology
超音波シンポジウム論文賞

2005/11/17　超音波エレクトロニクスの基礎と応用に関するシンポジウム　「Three-Dimensional Measurement for Absolute Value of Polarization Angle by Scanning Nonlinear Dielectric Microscopy」
藤尾フロンティア賞

2005/06/04　映像情報メディア学会　「ＳＮＤＭ強誘電体プローブメモリの研究」
ナノプローブテクノロジー賞

2004/07/21　日本学術振興会ナノプローブテクノロジー第１６７委員会　「非線形誘電率顕微鏡の開発と次世代メモリ技術への展開」
第３６回市村学術賞功績賞

2004/04/28　新技術開発財団　「非線形誘電率顕微鏡の発明実用化と超高密度強誘電体記録への応用」
Quality Presentation Recognition By the 1994 IEEE MIT-S International Microwave Symposium.

1994/09/10　IEEE MICROWAVE THEORY AND TECHNIQUES SOCIETY　“20dB EFFICIENCY INCREMENT OF SURFACE ACOUSTIC WAVE ELASTIC CONVOLVER USING ACTIVELY CONTROLLED NONLINEAR PIEZOELECTRIC EFFECT”
平成3年度電気関係学会関西支部連合大会奨励賞

1992/04/17　電気関係学会関西支部　「ＰＺＴセラミックスの印加電界による音速変化の動的測定」
日本音響学会第4回栗屋潔学術奨励賞

1987/03/27　日本音響学会　「LiNbO3単結晶の３次の弾性・圧電・誘電及び電歪定数の測定評価」

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Papers 415

Insulating tip for scanning near-field microwave microscopes: Application to van der Waals semiconductor imaging International-journal Peer-reviewed

Kohei Yamasue, Koki Takano, Taiyo Ishizuka, Yasuo Cho

Applied Physics Letters　126　(24)　242107-1-242107-6　2025/06/16
Publisher: AIP Publishing
DOI： 10.1063/5.0268493 　

ISSN： 0003-6951

eISSN： 1077-3118

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Scanning nonlinear dielectric microscopy, a scanning near-field microwave microscopy (SNMM) technique, has been effectively used for characterizing semiconductor materials and devices by detecting variations in capacitance between a conductive tip and sample. However, for semiconductors without surface insulating layers, either native oxides or intentionally fabricated ones, conventional conductive tips are unsuitable because direct tip–sample contact induces charge injection, hampering the imaging of intrinsic semiconductor properties, particularly dominant carrier concentration distributions. To address this limitation, we propose an insulating tip, prepared by depositing a thin insulating layer on a conductive tip. We demonstrate that this insulating tip enables the imaging of intrinsic semiconductor properties while preventing charge injection. Our approach can be extended to other SNMM techniques, thereby broadening their applications in semiconductor material and device characterization.
Selective Synthesis of Large-Area Monolayer Tin Sulfide from Simple Substances International-journal

Kazuki Koyama, Jun Ishihara, Nozomi Matsui, Atsuhiko Mori, Sicheng Li, Jinfeng Yang, Shiro Entani, Takeshi Odagawa, Makito Aoyama, Chaoliang Zhang, Ye Fan, Ibuki Kitakami, Sota Yamamoto, Toshihiro Omori, Yasuo Cho, Stephan Hofmann, Makoto Kohda

Nano Letters　25　(25)　9985-9993　2025/05/20
Publisher: American Chemical Society (ACS)
DOI： 10.1021/acs.nanolett.5c01639 　

ISSN： 1530-6984

eISSN： 1530-6992
Visualization of the local dipole moment at the Si(111) surface using DFT calculations International-journal

Akira Sumiyoshi, Kohei Yamasue, Yasuo Cho, Jun Nakamura

Scientific Reports　15　(1)　2025/03/03
Publisher: Springer Science and Business Media LLC
DOI： 10.1038/s41598-025-91645-1 　

eISSN： 2045-2322
Nonlinear, elastic, piezoelectric, electrostrictive, and dielectric constants of lithium tantalate International-journal Peer-reviewed

Yasuo Cho, Ryo Nakagawa, Toshimaro Yoneda, Takeshi Nakao, Mamoru Ikeura

Journal of Applied Physics　136　(12)　2024/09/26
Publisher: AIP Publishing
DOI： 10.1063/5.0220550 　

ISSN： 0021-8979

eISSN： 1089-7550

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Three third-order dielectric constants, 8 electrostrictive constants, 13 third-order piezoelectric constants, and 14 third-order elastic constants for lithium tantalate (LiTaO3) single crystals, which are mainly used in surface acoustic wave (SAW) devices, were determined as part of basic research to realize SAW devices with a low degree of nonlinearity. The third-order dielectric constants were determined by measuring the change in capacitance along selected directions when an alternating electric field was applied to the crystal. The electrostrictive constants were determined by measuring the change in capacitance when static stress was applied. Some of the piezoelectric constants were determined directly from the change in sound velocity due to the application of an alternating electric field, whereas others were obtained from the measured dielectric constants, electrostrictive constants, and the change in sound velocity due to an alternating electric field. In addition, the elastic constants (compliance) were determined using the three aforementioned determined nonlinear constants and the measured small-amplitude ultrasonic velocity change as a function of applied static stress. The measurements performed in the present study are more advanced than those reported for LiNbO3 single crystals in 1987 due to the adoption of the d-form nonlinear piezoelectric equation (instead of the e-form) and a higher degree of precision using dynamic measurement methods. The use of the d-form of the nonlinear piezoelectric equation allows many nonlinear constants to be determined independently from other nonlinear constants, eliminating measurement errors associated with these other constants. The d-form nonlinear constants obtained in the present study were converted to e-form constants to make them applicable to the analysis of nonlinear phenomena in piezoelectric devices.
Analysis of Nanoscale Ferroelectric Domain Dynamics Based on Image Processing of Local C-V Maps International-journal

Yohiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho

2024 IEEE Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium (UFFC-JS)　1-3　2024/09/22
Publisher: IEEE
DOI： 10.1109/uffc-js60046.2024.10793582 　
SNDM Study of the MOS Interface State Densities on the 3C-SiC / 4H-SiC Stacked Structure International-journal

Hiroyuki Nagasawa, Yasuo Cho, Maho Abe, Takenori Tanno, Michimasa Musya, Masao Sakuraba, Yusuke Sato, Shigeo Sato

Solid State Phenomena　362　33-40　2024/08/27
Publisher: Trans Tech Publications, Ltd.
DOI： 10.4028/p-3wy1yi 　

eISSN： 1662-9779

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The layer structure of 3C-SiC stacked on 4H-SiC is implemented by simultaneous lateral epitaxy (SLE). The SLE, involving spontaneous nucleation of 3C-SiC(111) on the 4H-SiC(0001) surface followed by step-controlled epitaxy, facilitates the creation of a single-domain 3C-SiC layer with an epitaxial relationship to the underlying 4H-SiC, establishing a coherent (111)//(0001) interface aligned in the basal plane. An extremely low state density at an interface between thermally grown SiO₂and SLE-grown 3C-SiC layer is revealed by local deep level transient spectroscopy (local-DLTS) based on scanning nonlinear dielectric microscopy (SNDM).
In-plane distribution of huge local permittivity of KTa1−xNbxO3 estimated from local phase transition temperatures and spatially averaged permittivity International-journal Peer-reviewed

Takashi Sakamoto, Tadayuki Imai, Masahiro Sasaura, Shogo Yagi, Kazuo Fujiura, Yasuo Cho

Review of Scientific Instruments　95　(7)　2024/07/01
Publisher: AIP Publishing
DOI： 10.1063/5.0211977 　

ISSN： 0034-6748

eISSN： 1089-7623

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Potassium tantalate niobate (KTa1−xNbxO3, KTN) single crystals have a very large relative permittivity εr (&gt;104) just above the paraelectric to ferroelectric phase transition temperature (TC). The quadratic electro-optic coefficient and the electro-strictive coefficient are also very large because of their proportionality to εr2. However, the local relative permittivity can easily vary spatially due to the incongruently melting nature of KTN. In this study, we quantitatively estimated the in-plane distribution of the huge local relative permittivity of KTN. First, we measured the spatial distribution of TC using scanning nonlinear dielectric microscopy, then deposited the electrodes and measured the temperature dependence of the spatially averaged permittivity using an LCR meter. Following that, we evaluated the spatial distribution of the huge local permittivity from the combination of the spatial distribution of TC and the spatially averaged permittivity. Finally, we measured the deflection angle of light to confirm the validity of the εr estimation procedure. The maximum error for the estimated permittivity was estimated to be around 3.3%.
Data-Driven Analysis of High-Resolution Hyperspectral Image Data Sets through Nanoscale Capacitance–Voltage Measurements to Visualize Ferroelectric Domain Dynamics International-journal Peer-reviewed

Yoshiomi Hiranaga, Yuki Noguchi, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho

ACS Applied Nano Materials　7　(8)　8525-8536　2024/07
Publisher: American Chemical Society (ACS)
DOI： 10.1021/acsanm.3c04636 　

ISSN： 2574-0970

eISSN： 2574-0970
Correlation analysis on local capacitance-voltage profiles of a SiO₂/SiC interface observed by time-resolved scanning nonlinear dielectric microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)　2023/03/07
Publisher: IEEE
DOI： 10.1109/edtm55494.2023.10103002 　
Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy International-journal Peer-reviewed

Kohei Yamasue, Yasuo Cho

Microelectronics Reliability　135　114588-114588　2022/08
Publisher: Elsevier BV
DOI： 10.1016/j.microrel.2022.114588 　

ISSN： 0026-2714
Nanoscale mapping to assess the asymmetry of local C–V curves obtained from ferroelectric materials International-journal Peer-reviewed

Yoshiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho

Japanese Journal of Applied Physics　61　(SN)　SN1014-SN1014　2022/07/27
Publisher: IOP Publishing
DOI： 10.35848/1347-4065/ac7f7a 　

ISSN： 0021-4922

eISSN： 1347-4065

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Abstract The asymmetry in the capacitance–voltage (C–V) curves obtained from a ferroelectric material can provide information concerning the internal microstructure of a specimen. The present study visualized nanoscale switching of a HfO₂-based ferroelectric thin film in real space based on assessing asymmetry using a local C–V mapping method. Several parameters were extracted from the local C–V curves at each point. The parameter V_i, indicating the lateral shift of the local C–V curve, was employed as an indicator of local imprint. In addition, the differences in the areas between the C–V curves for the forward and reverse sweeps, S_f − S_r, provided another slightly different indicator of nanoscale switching asymmetry. These parameters obtained from asymmetric C–V curves are thought to be related to internal electric fields and local stress caused by defects in the film. The work reported here also involved a cluster analysis of the extracted parameters using the k-means method.
Surface Potential Fluctuations of SiO2/SiC Interfaces Investigated by Local Capacitance-Voltage Profiling Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

Materials Science Forum　1062　335-340　2022/05/31
Publisher: Trans Tech Publications, Ltd.
DOI： 10.4028/p-2t7zak 　

eISSN： 1662-9752

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We investigate surface potential fluctuations on SiO₂/SiC interfaces by local capacitance-voltage profiling based on time-resolved scanning nonlinear dielectric microscopy. As experimental indicators of surface potential fluctuations, we measured the spatial fluctuations of local capacitance-voltage and its first derivative profiles through the detection of the voltages at the infection points of the profiles. We show that, even for a sample with a nitrided interface with low interface defect density, the fluctuations of the measured voltages are much higher than the thermal energy at room temperature. This indicates the existence of high potential fluctuations, which can give the significant impacts on the carrier transport at the SiO₂/SiC interface of SiC metal-oxide-semiconductor field effect transistors.
Microscopic Evaluation of Al2O3/p-Type Diamond (111) Interfaces Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Yu Ogata, Kohei Yamasue, Xufang Zhang, Tsubasa Matsumoto, Norio Tokuda, Yasuo Cho

Materials Science Forum　1062　298-303　2022/05/31
Publisher: Trans Tech Publications, Ltd.
DOI： 10.4028/p-n0z51t 　

eISSN： 1662-9752

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Improvement of channel mobility is required to improve the performance of the inversion channel MOSFETs using diamond. The previous studies have suggested that high interface defect density (D_it) at the Al₂O₃/diamond (111) interface has a significant impact on the carrier transport property on a channel region. To investigate the physical origins of the high D_it, especially from microscopic point of view, here we investigate Al₂O₃/p-type diamond (111) interfaces using scanning nonlinear dielectric microscopy (SNDM). We find the high spatial fluctuations of Al₂O₃/hydroxyl (OH)-terminated diamond (111) interface properties and their difference by the flatness of the diamond surface.
Local capacitance-voltage profiling on MoS₂/SiO₂ and MoS₂/h-BN/SiO₂ by scanning nonlinear dielectric microscopy assisted with an insulating tip

Taiyo Ishizuka, Kohei Yamasue, Yasuo Cho

2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)　2022/03/06
Publisher: IEEE
DOI： 10.1109/edtm53872.2022.9798093 　
Boxcar Averaging Scanning Nonlinear Dielectric Microscopy Invited Peer-reviewed

Kohei Yamasue, Yasuo Cho

Nanomaterials　12　(5)　794-1-794-19　2022/02/26
Publisher: MDPI AG
DOI： 10.3390/nano12050794 　

eISSN： 2079-4991

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Scanning nonlinear dielectric microscopy (SNDM) is a near-field microwave-based scanning probe microscopy method with a wide variety of applications, especially in the fields of dielectrics and semiconductors. This microscopy method has often been combined with contact-mode atomic force microscopy (AFM) for simultaneous topography imaging and contact force regulation. The combination SNDM with intermittent contact AFM is also beneficial for imaging a sample prone to damage and using a sharp microscopy tip for improving spatial resolution. However, SNDM with intermittent contact AFM can suffer from a lower signal-to-noise (S/N) ratio than that with contact-mode AFM because of the shorter contact time for a given measurement time. In order to improve the S/N ratio, we apply boxcar averaging based signal acquisition suitable for SNDM with intermittent contact AFM. We develop a theory for the S/N ratio of SNDM and experimentally demonstrate the enhancement of the S/N ratio in SNDM combined with peak-force tapping (a trademark of Bruker) AFM. In addition, we apply the proposed method to the carrier concentration distribution imaging of atomically thin van der Waals semiconductors. The proposed method clearly visualizes an anomalous electron doping effect on few-layer Nb-doped MoS2. The proposed method is also applicable to other scanning near-field microwave microscopes combined with peak-force tapping AFM such as scanning microwave impedance microscopy. Our results indicate the possibility of simultaneous nanoscale topographic, electrical, and mechanical imaging even on delicate samples.
Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack

Koharu Suzuki, Kohei Yamasue, Yasuo Cho

Microelectronics Reliability　126　114278-114278　2021/11
Publisher: Elsevier BV
DOI： 10.1016/j.microrel.2021.114278 　

ISSN： 0026-2714
Local capacitance-voltage profiling and high voltage stress effect study of SiO2/SiC structures by time-resolved scanning nonlinear dielectric microscopy

K. Yamasue, Y. Cho

Microelectronics Reliability　126　114284-114284　2021/11
Publisher: Elsevier BV
DOI： 10.1016/j.microrel.2021.114284 　

ISSN： 0026-2714
Simulation of nanoscale domain growth for ferroelectric recording International-journal Peer-reviewed

Kenji Fukuzawa, Yoshiomi Hiranaga, Yasuo Cho

AIP Advances　11　(11)　115117-115117　2021/11/01
Publisher: AIP Publishing
DOI： 10.1063/5.0074004 　

eISSN： 2158-3226
Simultaneous Interface Defect Density and Differential Capacitance Imaging by Time-Resolved Scanning Nonlinear Dielectric Microscopy

Kohei Yamasue, Yasuo Cho

International Symposium for Testing and Failure Analysis　2021/10/31
Publisher: ASM International
DOI： 10.31399/asm.cp.istfa2021p0441 　

ISSN： 0890-1740

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Abstract This work highlights the unique capabilities of time-resolved scanning nonlinear dielectric microscopy as demonstrated in the study of SiO2/SiC interfaces. Scanning nonlinear dielectric microscopy (SNDM) is a microwave-based scanning probe technique with high sensitivity to variations in tip-sample capacitance. Time-resolved SNDM, a modified version, is used in this study because it allows simultaneous nanoscale imaging of interface defect density (Dit) and differential capacitance (dC/dV), lending itself to correlation analysis and a better understanding of the relationships that influence interface quality. Through cross-correlation analysis, it is shown that Dit images are not strongly correlated with simultaneously obtained dC/dV images, but rather with difference images derived from dC/dV images recorded with different voltage sweep directions. The results indicate that the dC/dV images visualize the nonuniformity of the total interface charge density and the difference images reflect that of Dit at a particular energy range.
Flexoelectric nanodomains in rare-earth iron garnet thin films under strain gradient Peer-reviewed

Hiroyasu Yamahara, Bin Feng, Munetoshi Seki, Masaki Adachi, Md Shamim Sarker, Takahito Takeda, Masaki Kobayashi, Ryo Ishikawa, Yuichi Ikuhara, Yasuo Cho, Hitoshi Tabata

Communications Materials　2　(1)　2021/09

DOI： 10.1038/s43246-021-00199-y 　

eISSN： 2662-4443
High-precision local C–V mapping for ferroelectrics using principal component analysis International-journal Peer-reviewed

Yoshiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho

Japanese Journal of Applied Physics　60　(SF)　SFFB09-SFFB09　2021/08/02

DOI： 10.35848/1347-4065/ac13d9 　

ISSN： 0021-4922

eISSN： 1347-4065
Local C-V Characterization for Ferroelectric Films

Yoshiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho

IEEE International Symposium on Applications of Feeroelectric, ISAF 2021, International Symposium on Integrated Functionalities, ISIF 2021 and Piezoresponse Force Microscopy Workshop, PFM 2021 - Proceedings　2021/05/16
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI： 10.1109/ISAF51943.2021.9477316 　
Material Design Strategy for Enhancement of Readback Signal Intensity in Ferroelectric Probe Data Storage International-journal Peer-reviewed

Yoshiomi Hiranaga, Yasuo Cho

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control　68　(3)　859-864　2021/03
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
DOI： 10.1109/tuffc.2020.3006909 　

ISSN： 0885-3010

eISSN： 1525-8955
Local C–V mapping for ferroelectrics using scanning nonlinear dielectric microscopy International-journal Peer-reviewed

Yoshiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho

Journal of Applied Physics　128　(24)　244105-244105　2020/12/28

DOI： 10.1063/5.0029630 　

ISSN： 0021-8979

eISSN： 1089-7550
Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETs International-journal Peer-reviewed

K. Yamasue, Y. Cho

Microelectronics Reliability　114　113829-113829　2020/11
Publisher: Elsevier BV
DOI： 10.1016/j.microrel.2020.113829 　

ISSN： 0026-2714
Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy International-journal Peer-reviewed

J. Hirota, K. Yamasue, Y. Cho

Microelectronics Reliability　114　113774-113774　2020/11
Publisher: Elsevier BV
DOI： 10.1016/j.microrel.2020.113774 　

ISSN： 0026-2714
Atomic Resolution Studies on Surface Dipoles by Noncontact Scanning Nonlinear Dielectric Microscopy and Potentiometry International-journal Peer-reviewed

Kohei Yamasue, Yasuo Cho

2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)　2020/10
Publisher: IEEE
DOI： 10.1109/ifcs-isaf41089.2020.9234884 　
Effects of deposition conditions on the ferroelectric properties of (Al1−xScx)N thin films Peer-reviewed

Shinnosuke Yasuoka, Takao Shimizu, Akinori Tateyama, Masato Uehara, Hiroshi Yamada, Morito Akiyama, Yoshiomi Hiranaga, Yasuo Cho, Hiroshi Funakubo

Journal of Applied Physics　128　(11)　114103-114103　2020/09/21

DOI： 10.1063/5.0015281 　

ISSN： 0021-8979

eISSN： 1089-7550
Nanoscale characterization of unintentional doping of atomically thin layered semiconductors by scanning nonlinear dielectric microscopy International-journal Peer-reviewed

K. Yamasue, Y. Cho

Journal of Applied Physics　128　(7)　074301-074301　2020/08/21
Publisher: AIP Publishing
DOI： 10.1063/5.0016462 　

ISSN： 0021-8979

eISSN： 1089-7550
Influence of Non-Uniform Interface Defect Clustering on Field-Effect Mobility in SiC MOSFETs Investigated by Local Deep Level Transient Spectroscopy and Device Simulation International-journal Peer-reviewed

Kohei Yamasue, Yuji Yamagishi, Yasuo Cho

Materials Science Forum　1004　627-634　2020/07
Publisher: Trans Tech Publications, Ltd.
DOI： 10.4028/www.scientific.net/msf.1004.627 　

eISSN： 1662-9752

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It has recently been shown that interface defect density (<italic>D</italic>_it) at SiO₂/SiC interfaces can have non-uniform clustered distribution through the measurement by local deep level transient spectroscopy (local DLTS). Here we investigate the influence of the non-uniform <italic>D</italic>_it clustering on the field-effect mobility in SiC metal-oxide-semiconductor field effect transistors (MOSFETs) by device simulation. We develop a three dimensional numerical model of a SiC MOSFET, which can incorporate actual <italic>D</italic>_itdistributions measured by local DLTS. Our main result is that the impact of the non-uniform <italic>D</italic>_it clustering on field-effect mobility is negligible for a SiC MOSFET with high <italic>D</italic>_it formed by dry thermal oxidation but it becomes significant for that with lower <italic>D</italic>_it by post-oxidation annealing. The result indicates that channel mobility can be further improved by making <italic>D</italic>_it distribution uniform as well as reducing <italic>D</italic>_it.
A scanning nonlinear dielectric microscopic investigation of potential-induced degradation in monocrystalline silicon solar cells Peer-reviewed

Yasuo Cho, Sachiko Jonai, Atsushi Masuda

Appl. Phys. Lett.,　116　182107-1-182107-4　2020/05
Evaluation of interface defect density distribution on macrostepped SiO₂/SiC by time-resolved local deep level transient spectroscopy Peer-reviewed

Anna Hosaka, Kohei Yamasue, Judith Woerle, Corrado Bongiorno, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho

The 38th Annual NANO Testing Symposium (NANOTS2019)　75-79　2019/11
Improvement of signal-to-noise ratio in semiconductor carrier distribution imaging by intermittent scanning nonlinear dielectric microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

The 38th Annual NANO Testing Symposium (NANOTS2019)　130-134　2019/11
Development of cantilevers with insulating coating for semiconductor carrier distribution imaging using scanning nonlinear dielectric microscopy and its application to layered semiconductors Peer-reviewed

Koki Takano, Kohei Yamasue, Yasuo Cho

The 38th Annual NANO Testing Symposium (NANOTS2019)　135-140　2019/11
Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

Proceedings from the 45th International Symposium for Testing and Failure Analysis　498-503　2019/11
Carrier Profiling of the 10-nm-order structure in a 3D Flash memory cell using scanning nonlinear dielectric microscopy Peer-reviewed

Jun Hirota, Ken Hoshino, Tsukasa Nakai, Kohei Yamasue, Yasuo Cho

Proceedings from the 45th International Symposium for Testing and Failure Analysis　490-493　2019/11
Boxcar Averaging Based Scanning Nonlinear Dielectric Microscopy and Its Application to Carrier Distribution Imaging on 2D Semiconductors Peer-reviewed

Kohei Yamasue, Yasuo Cho

2019 IEEE International Integrated Reliability Workshop (IIRW)　2019/10
Publisher: IEEE
DOI： 10.1109/iirw47491.2019.8989887 　
A Study on Evaluation of Interface Defect Density on High-K/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Koharu Suzuki, Kohei Yamasue, Yasuo Cho

2019 IEEE International Integrated Reliability Workshop (IIRW)　2019/10
Publisher: IEEE
DOI： 10.1109/iirw47491.2019.8989881 　
Spatially-Resolved Evaluation of Interface Defect Density on Macrostepped SiO2/SiC using Local Deep Level Transient Spectroscopy Peer-reviewed

Anna Hosaka, Kohei Yamasue, Judith Woerle, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho

2019 IEEE International Integrated Reliability Workshop (IIRW)　2019/10
Publisher: IEEE
DOI： 10.1109/iirw47491.2019.8989888 　
Flexoelectricity and ferrimagnetism in strain-gradient rare-earth iron garnet thin films

Yamahara Hiroyasu, Shamim Sarker Md., Seki Munetoshi, Cho Yasuo, Tabata Hitoshi

JSAP Annual Meetings Extended Abstracts　2019.2　1495-1495　2019/09/04
Publisher: The Japan Society of Applied Physics
DOI： 10.11470/jsapmeeting.2019.2.0_1495 　

eISSN： 2436-7613
Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy Peer-reviewed

K. Yamasue, Y. Cho

Microelectronics Reliability　Vol.100-101　113345 -1-113345 -5　2019/09

DOI： 10.1016/j.microrel.2019.06.037 　
Two-dimensional defect mapping of the SiO2/4H-SiC interface Peer-reviewed

Judith Woerle, Brett C. Johnson, Corrado Bongiorno, Kohei Yamasue, Gabriel Ferro, Dipanwita Dutta, Thomas A. Jung, Hans Sigg, Yasuo Cho, Ulrike Grossner, Massimo Camarda

PHYSICAL REVIEW MATERIALS　3　084602-1-084602-8　2019/08

DOI： 10.1103/PhysRevMaterials.3.084602 　
Carrier distribution imaging using ∂C/∂z-mode scanning nonlinear dielectric microscopy Peer-reviewed

Yoshiomi Hiranaga, Yasuo Cho

Rev. Sci. Instrum　Vol.90　083705.1-083705.12　2019/08

DOI： 10.1063/1.5097906 　
High Resolution Mapping of Defects at SiO₂/SiC Interfaces by Local-DLTS Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy

Yuji Yamagishi, Yasuo Cho

2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)　2019/07
Publisher: IEEE
DOI： 10.1109/ipfa47161.2019.8984905 　
High Resolution Observation of Subsurface Defects at SiO₂/4H-SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy

Yuji Yamagishi, Yasuo Cho

2019 IEEE International Reliability Physics Symposium (IRPS)　2019/03
Publisher: IEEE
DOI： 10.1109/irps.2019.8720482 　
Local Evaluation of Al2O3 Passivation Layers for Monocrystalline Silicon Solar Cells by Super-Higher-Order Scanning Nonlinear Dielectric Microscopy

Kento Kakikawa, Yuji Yamagishi, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC　3118-3120　2018/11/26
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI： 10.1109/PVSC.2018.8547292 　
Improved signal intensity in carrier distribution imaging of few-layer MoS2 by scanning nonlinear dielectric microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

The 38th Annual NANO Testing Symposium (NANOTS2018)　196-199　2018/11
High resolution observation of defects at SiO2/4H-SiC interfaces using time-resolved scanning nonlinear dielectric microscopy Peer-reviewed

Y. Yamagishi, Y. Cho

Microelectronics Reliability　Vol.88-90　242-245　2018/10

DOI： 10.1016/j.microrel.2018.07.058 　
Quantitative imaging of mos interface trap distribution by using local deep level transient spectroscopy

Norimichi Chinone, Yasuo Cho

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA　2018-　2018/08/30
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI： 10.1109/IPFA.2018.8452565 　
Quantitative evaluation of carrier distribution in silicon solar cell using scanning nonlinear dielectric microscopy

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA　2018-　2018/08/30
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI： 10.1109/IPFA.2018.8452172 　
Visualization of traps at SiO2/SiC interfaces near the conduction band by local deep level transient spectroscopy at low temperatures Peer-reviewed

Takayuki Abe, Yuji Yamagishi, Yasuo Cho

Jpn.J.Appl.Phys,　57　08NB12-1-08NB12-5　2018/07

DOI： 10.7567/JJAP.57.08NB12 　
Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

Applied Physics Letters　112　(24)　243102-1-243102-5　2018/06/11
Publisher: American Institute of Physics Inc.
DOI： 10.1063/1.5032277 　

ISSN： 0003-6951
Charge state evaluation of passivation layers for silicon solar cells by scanning nonlinear dielectric microscopy Peer-reviewed

K. Kakikawa, Y. Yamagishi, Y. Cho, K. Tanahashi, H. Takato

IEEE International Reliability Physics Symposium Proceedings　2018-　PPV.11-PPV.14　2018/05/25
Publisher: Institute of Electrical and Electronics Engineers Inc.
DOI： 10.1109/IRPS.2018.8353683 　

ISSN： 1541-7026
Scanning probe-type data storage beyond hard disk drive and flash memory Peer-reviewed

Yasuo Cho, Seungbum Hong

MRS Bulletin　43　(5)　365-370　2018/05/01
Publisher: Cambridge University Press
DOI： 10.1557/mrs.2018.98 　

ISSN： 0883-7694
Nanoscale linear permittivity imaging based on scanning nonlinear dielectric microscopy Peer-reviewed

Yoshiomi Hiranaga, Norimichi Chinone, Yasuo Cho

Nanotechnology　29　(20)　205709-1-205709-9　2018/03/26
Publisher: Institute of Physics Publishing
DOI： 10.1088/1361-6528/aab3c2 　

ISSN： 1361-6528 0957-4484
Improvement of local deep level transient spectroscopy for microscopic evaluation of SiO2/4H-SiC interfaces Peer-reviewed

Yuji Yamagishi, Yasuo Cho

Materials Science Forum　924　289-292　2018
Publisher: Trans Tech Publications Ltd
DOI： 10.4028/www.scientific.net/MSF.924.289 　

ISSN： 0255-5476
High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy Invited Peer-reviewed

Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　56　(10)　100101-1-100101-10　2017/10

DOI： 10.7567/JJAP.56.100101 　

ISSN： 0021-4922

eISSN： 1347-4065
Dynamic observation of ferroelectric domain switching using scanning nonlinear dielectric microscopy Peer-reviewed

Yoshiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　56　(10)　10PF16-1-10PF16-7　2017/10

DOI： 10.7567/JJAP.56.10PF16 　

ISSN： 0021-4922

eISSN： 1347-4065
Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer by scanning nonlinear dielectric microscopy Peer-reviewed

Hiroyuki Odagawa, Koshiro Terada, Yohei Tanaka, Hiroaki Nishikawa, Takahiko Yanagitani, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　56　(10)　10PF18-1-10PF18-4　2017/10

DOI： 10.7567/JJAP.56.10PF18 　

ISSN： 0021-4922

eISSN： 1347-4065
Nanosecond microscopy of capacitance at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy Peer-reviewed

Y. Yamagishi, Y. Cho

APPLIED PHYSICS LETTERS　111　(16)　163103-1-163103-5　2017/10

DOI： 10.1063/1.4999794 　

ISSN： 0003-6951

eISSN： 1077-3118
Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer Peer-reviewed

Hiroyuki Odagawa, Koshiro Terada, Yohei Tanaka, Hiroaki Nishikawa, Takahiko Yanagitani, Yasuo Cho

Jpn.J.Appl.Phys,　56　10PF18-1-10PF18-4　2017/09
Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy and its application to imaging two-dimensional distribution of SiO2/SiC interface traps Peer-reviewed

N. Chinone, Y. Cho

JOURNAL OF APPLIED PHYSICS　122　(10)　105701-1-105701-9　2017/09

DOI： 10.1063/1.4991739 　

ISSN： 0021-8979

eISSN： 1089-7550
Quantitative Analysis of Active Dopant Distribution and Estimation of Effective Diffusivity in Phosphorus-Implanted Emitter of Si Solar Cell Using Scanning Nonlinear Dielectric Microscopy

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

IEEE PVSC-44　2017/08

DOI： 10.1063/1.4994813 　
Evaluation of silicon- and carbon-face SiO2/SiC MOS interface quality based on scanning nonlinear dielectric microscopy Peer-reviewed

Norimichi Chinone, Alpana Nayak, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho

APPLIED PHYSICS LETTERS　111　(6)　061602-1-061602-4　2017/08

DOI： 10.1063/1.4990865 　

ISSN： 0003-6951

eISSN： 1077-3118
Quantitative measurement of active dopant density distribution in phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy Peer-reviewed

K. Hirose, K. Tanahashi, H. Takato, Y. Cho

APPLIED PHYSICS LETTERS　111　(3)　032101-1-032101-4　2017/07

DOI： 10.1063/1.4994813 　

ISSN： 0003-6951

eISSN： 1077-3118
Universal parameter evaluating SiO2/SiC interface quality based on scanning nonlinear dielectric microscopy Peer-reviewed

Norimichi Chinone, Alpana Nayak, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Yuji Kiuchi, Hajime Okumura, Yasuo Cho

Materials Science Forum　897　159-162　2017
Publisher: Trans Tech Publications Ltd
DOI： 10.4028/www.scientific.net/MSF.897.159 　

ISSN： 0255-5476
Two-dimensional imaging of trap distribution in SiO2/SiC interface using local deep level transient spectroscopy based on super-higher-order scanning nonlinear dielectric microscopy Peer-reviewed

Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho

Materials Science Forum　897　127-130　2017
Publisher: Trans Tech Publications Ltd
DOI： 10.4028/www.scientific.net/MSF.897.127 　

ISSN： 0255-5476
Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy Peer-reviewed

N. Chinone, R. Kosugi, Y. Tanaka, S. Harada, H. Okumura, Y. Cho

MICROELECTRONICS RELIABILITY　64　566-569　2016/09

DOI： 10.1016/j.microrel.2016.07.088 　

ISSN： 0026-2714
Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy

N. Chinone, R. Kosugi, Y. Tanaka, S. Harada, H. Okumura, Y. Cho

MICROELECTRONICS RELIABILITY　64　566-569　2016/09

DOI： 10.1016/j.microrel.2016.07.088 　

ISSN： 0026-2714
Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry Peer-reviewed

Kohei Yamasue, Hirokazu Fukidome, Keiichiro Tashima, Maki Suemitsu, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　55　(8)　08NB02-1-08NB02-5　2016/08

DOI： 10.7567/JJAP.55.08NB02 　

ISSN： 0021-4922

eISSN： 1347-4065
Simultaneous observation of two dimensional electron gas and polarization in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy Peer-reviewed

Kotaro Hirose, Yasunori Goto, Norimichi Chinone, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　55　(8)　08NB13-1-08NB13-3　2016/08

DOI： 10.7567/JJAP.55.08NB13 　

ISSN： 0021-4922

eISSN： 1347-4065
Visualization of Gate-Bias-Induced Carrier Redistribution in SiC Power DIMOSFET Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Norimichi Chinone, Yasuo Cho

IEEE TRANSACTIONS ON ELECTRON DEVICES　63　(8)　3165-3170　2016/08

DOI： 10.1109/TED.2016.2571780 　

ISSN： 0018-9383

eISSN： 1557-9646
TWO-DIMENSIONAL CHARACTERIZATION OF PHOSPHORUS-IMPLANTED EMITTER AND PHOSPHORUS-DIFFUSED EMITTER OF SILICON SOLAR CELL USING SUPER-HIGHER-ORDER SCANNING NONLINEAR DIELECTRIC MICROSCOPY

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Norimichi Chinone, Yasuo Cho

32nd European Photovoltaic Solar Energy Conference and Exhibition　527-530　2016/07
High-density ferroelectric recording using a hard disk drive-type data storage system Peer-reviewed

Tomonori Aoki, Yoshiomi Hiranaga, Yasuo Cho

JOURNAL OF APPLIED PHYSICS　119　(18)　184101-1-184101-8　2016/05

DOI： 10.1063/1.4948940 　

ISSN： 0021-8979

eISSN： 1089-7550
Two-dimensional Analysis of Carrier Distribution in Phosphorus-Implanted Emitter and Phosphorus-Diffused Emitter using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Norimichi Chinonel, Yasuo Cho

2016 IEEE 43RD PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)　3671-3674　2016

ISSN： 0160-8371
Two-dimensional local deep level transient spectroscopy imaging using super-higher-order scanning nonlinear dielectric microscopy Peer-reviewed

N. Chinone, Y. Cho, R. Kosugi, Y. Tanaka, S. Harada, H. Okumura

ISTFA 2016: CONFERENCE PROCEEDINGS FROM THE 42ND INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS　441-445　2016
Proposal of local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy and 2-dimensional imaging of trap distribution in SiO2/SiC interface Peer-reviewed

Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho

Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)　360-364　2016

ISSN： 1946-1550
Method for measuring polarity-inverted layered structure in dielectric thin films using scanning nonlinear dielectric microscopy International-journal Peer-reviewed

Hiroyuki Odagawa, Koshiro Terada, Hiroaki Nishikawa, Takahiko Yanagitani, Yasuo Cho

FERROELECTRICS　498　(1)　47-51　2016

DOI： 10.1080/00150193.2016.1169493 　

ISSN： 0015-0193

eISSN： 1563-5112
Lamb Wave Resonators and Resonator Filters in Periodical Poled Z-cut LiTaO3 Plate

Michio Kadota, Takashi Ogami, Kansho Yamamoto, Yasuo Cho, Shuji Tanaka

2016 IEEE 11TH ANNUAL INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS (NEMS)　2016

DOI： 10.1109/NEMS.2016.7758302 　
Nondestructive and local evaluation of SiO2/SiC interface using super-higher-order scanning nonlinear dielectric microscopy Peer-reviewed

Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho

Materials Science Forum　858　469-472　2016
Publisher: Trans Tech Publications Ltd
DOI： 10.4028/www.scientific.net/MSF.858.469 　

ISSN： 0255-5476
Visualization of polarization and two dimensional electron gas distribution in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy Peer-reviewed

Kotaro Hirose, Norimichi Chinone, Yasuo Cho

Materials Science Forum　858　1182-1185　2016
Publisher: Trans Tech Publications Ltd
DOI： 10.4028/www.scientific.net/MSF.858.1182 　

ISSN： 0255-5476
Visualization and analysis of active dopant distribution in a p-i-n structured amorphous silicon solar cell using scanning nonlinear dielectric microscopy Peer-reviewed

K. Hirose, N. Chinone, Y. Cho

AIP ADVANCES　5　(9)　097136-1-097136-7　2015/09

DOI： 10.1063/1.4931028 　

ISSN： 2158-3226
Scanning nonlinear dielectric potentiometry Peer-reviewed

Kohei Yamasue, Yasuo Cho

REVIEW OF SCIENTIFIC INSTRUMENTS　86　(9)　093704-1-093704-8　2015/09

DOI： 10.1063/1.4930181 　

ISSN： 0034-6748

eISSN： 1089-7623
Experimental study of electric dipoles on an oxygen-adsorbed Si(100)-2 x 1 surface by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Masataka Suzuki, Kohei Yamasue, Yasuo Cho

APPLIED PHYSICS LETTERS　107　(3)　03604-1-031604-5　2015/07

DOI： 10.1063/1.4927244 　

ISSN： 0003-6951

eISSN： 1077-3118
Interfacial Charge States in Graphene on SiC Studied by Noncontact Scanning Nonlinear Dielectric Potentiometry Peer-reviewed

Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho

PHYSICAL REVIEW LETTERS　114　(22)　226103-1-226103-5　2015/06

DOI： 10.1103/PhysRevLett.114.226103 　

ISSN： 0031-9007

eISSN： 1079-7114
A -site-driven ferroelectricity in strained ferromagnetic La2 NiMnO6 thin films Peer-reviewed

R. Takahashi, I. Ohkubo, K. Yamauchi, M. Kitamura, Y. Sakurai, M. Oshima, T. Oguchi, Y. Cho, M. Lippmaa

Physical Review B - Condensed Matter and Materials Physics　91　(13)　2015/04

DOI： 10.1103/PhysRevB.91.134107 　

ISSN： 1098-0121

eISSN： 1550-235X
A-site-driven ferroelectricity in strained ferromagnetic La2NiMnO6 thin films Peer-reviewed

R. Takahashi, I. Ohkubo, K. Yamauchi, M. Kitamura, Y. Sakurai, M. Oshima, T. Oguchi, Y. Cho, M. Lippmaa

PHYSICAL REVIEW B　91　(13)　134107-1-134107-9　2015/04

DOI： 10.1103/PhysRevB.91.134107 　

ISSN： 2469-9950

eISSN： 2469-9969
Carrier redistribution analysis of gate-biased SiC power-MOSFET using super-higher-order scanning nonlinear dielectric microscopy Peer-reviewed

Norimichi Chinone, Yasuo Cho

ISTFA 2015: CONFERENCE PROCEEDINGS FROM THE 41ST INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS　329-332　2015
Observation of polarization and two dimensional electron gas in AIGaN/GaN heterostructure using scanning nonlinear dielectric microscopy Peer-reviewed

K. Hirose, N. Chinone, Y. Cho

ISTFA 2015: CONFERENCE PROCEEDINGS FROM THE 41ST INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS　333-335　2015
Interfacial capacitance between a ferroelectric Fe3O4 thin film and a semiconducting Nb:SrTiO3 substrate Peer-reviewed

R. Takahashi, Y. Cho, M. Lippmaa

JOURNAL OF APPLIED PHYSICS　117　(1)　014104-1-014104-10　2015/01

DOI： 10.1063/1.4905384 　

ISSN： 0021-8979

eISSN： 1089-7550
Investigation of solution-processed bismuth-niobium-oxide films Peer-reviewed

Satoshi Inoue, Tomoki Ariga, Shin Matsumoto, Masatoshi Onoue, Takaaki Miyasako, Eisuke Tokumitsu, Norimichi Chinone, Yasuo Cho, Tatsuya Shimoda

Journal of Applied Physics　116　(15)　2014/10/21
Publisher: American Institute of Physics Inc.
DOI： 10.1063/1.4898323 　

ISSN： 1089-7550 0021-8979
Investigation of Hydrogen-Intercalated Graphene on 4H-SiC(0001) by Noncontact Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho

ecoss30　2014/09/04
Pb(Zr,Ti)O

Hiranaga Yoshiomi, Cho Yasuo

Jpn. J. Appl. Phys.　53　(9)　09PA05　2014/09/03
Publisher: Institute of Physics
DOI： 10.7567/JJAP.53.09PA05 　

ISSN： 0021-4922

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Pb(Zr,Ti)O<inf>3</inf>(PZT) thin films for ferroelectric probe data storage technology were studied. (001)-oriented PZT thin films were deposited on SrRuO<inf>3</inf>/SrTiO<inf>3</inf>substrates by rf magnetron sputtering. Dc voltage was applied on the films using a metal-coated tip and the poling region was observed by scanning nonlinear dielectric microscopy (SNDM). The contrasts in the positive and negative poling regions in the SNDM images obtained were improved by using the PZT films after ion-beam irradiation. This suggests that a surface layer of a few nanometers in thickness was formed on the as-grown PZT film and the polarization was not invertible in the surface layer. The deposition condition was examined with focus on deposition temperature. Nanosized domain dots were successfully formed on a PZT film deposited at 550 °C.
A New Atomically Resolved Potentiometry for Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

ecoss30　2014/09/03
Atomic-dipole-moment induced local surface potential on Si(111)-(7 x 7) surface studied by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

APPLIED PHYSICS LETTERS　105　(12)　2014/09

DOI： 10.1063/1.4896323 　

ISSN： 0003-6951

eISSN： 1077-3118
Improved study of electric dipoles on the Si(100)-2 x 1 surface by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

APPLIED PHYSICS LETTERS　105　(10)　2014/09

DOI： 10.1063/1.4895031 　

ISSN： 0003-6951

eISSN： 1077-3118
Pb(Zr,Ti)O-3 recording media for probe data storage devices prepared by rf magnetron sputtering Peer-reviewed

Yoshionni Hiranaga, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　53　(9)　09PA05-1-09PA05-5　2014/09

DOI： 10.7567/JJAP.53.09PA05 　

ISSN： 0021-4922

eISSN： 1347-4065
Improved study of electric dipoles on the Si(100)-2 x 1 surface by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

APPLIED PHYSICS LETTERS　105　(10)　2014/09

DOI： 10.1063/1.4895031 　

ISSN： 0003-6951

eISSN： 1077-3118
Improved study of electric dipoles on the Si(100)-2 x 1 surface by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

APPLIED PHYSICS LETTERS　105　(10)　101603-1-101603-3　2014/09

DOI： 10.1063/1.4895031 　

ISSN： 0003-6951

eISSN： 1077-3118
Atomic-dipole-moment induced local surface potential on Si(111)-(7 x 7) surface studied by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

APPLIED PHYSICS LETTERS　105　(12)　121601-1-121601-5　2014/09

DOI： 10.1063/1.4896323 　

ISSN： 0003-6951

eISSN： 1077-3118
Nano-Domains and Related Phenomena in Congruent Lithium Tantalate Single Crystals Studied by Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Yasuo Cho

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL　61　(8)　1368-1378　2014/08

DOI： 10.1109/TUFFC.2014.3045 　

ISSN： 0885-3010

eISSN： 1525-8955
Cross-sectional dopant profiling and depletion layer visualization of SiC power double diffused metal-oxide-semiconductor field effect transistor using super-higher-order nonlinear dielectric microscopy Peer-reviewed

N. Chinone, T. Nakamura, Y. Cho

JOURNAL OF APPLIED PHYSICS　116　(8)　084509-1-084509-7　2014/08

DOI： 10.1063/1.4893959 　

ISSN： 0021-8979

eISSN： 1089-7550
Charge gradient microscopy: high-speed visualization of polarization charges using a nanoscale probe Invited Peer-reviewed

Seungbum Hong, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, Andreas Roelofs

Nanoscale Spectroscopy and Nanotechnology 8　2014/07/30
High-Resolution Imaging of Hydrogen-Intercalated Graphene on 4H-SiC(0001) Using Non-Contact Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Kohei Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, Y. Cho

ICN+T 2014 , ABSTRACTS　2014/07/21
A Novel Method for Simultaneous Measurement of Topography and Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy Peer-reviewed

K. Yamasue, Yasuo Cho

ICN+T 2014 , ABSTRACTS　2014/07/21
Charge gradient microscopy Peer-reviewed

Seungbum Hong, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, Andreas Roelofs

Proceedings of the National Academy of Sciences of the United States of America　111　(18)　6566-6569　2014/04/23
Pyroelectric Detection of Spontaneous Polarization in Multiferroic La2NiMnO6 Thin Films Invited Peer-reviewed

Ryota Takahashi, Isao Ohkubo, Miho Kitamura, Masaharu Oshima, Yasuo Cho, Mikk Lippmaa

2014 MRS Spring Meeting ABSTRACTS　2014/04/22
Charge Gradient Microscopy: A Method to Image Ferroelectric and Piezoelectric Domains Peer-reviewed

Andreas Roelofs, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, Seungbum Hong

2014 MRS Spring Meeting ABSTRACTS　2014/04/22
Electrical conduction in nanodomains in congruent lithium tantalate single crystal Peer-reviewed

Yasuo Cho

APPLIED PHYSICS LETTERS　104　(4)　042905-1-042905-4　2014/01

DOI： 10.1063/1.4863754 　

ISSN： 0003-6951

eISSN： 1077-3118
Measurement of Nonlinear Dielectric Constants of Pb(Zr, Ti)O-3 Thin Films for Ferroelectric Probe Data Storage Technology Peer-reviewed

Y. Hiranaga, Y. Cho

2014 JOINT IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, INTERNATIONAL WORKSHOP ON ACOUSTIC TRANSDUCTION MATERIALS AND DEVICES & WORKSHOP ON PIEZORESPONSE FORCE MICROSCOPY (ISAF/IWATMD/PFM)　87-90　2014

DOI： 10.1109/ISAF.2014.6922979 　
Conduction in Nanodomains in Lithium Tantalate Single Crystal Invited Peer-reviewed

Yasuo Cho

ICSS 2013 ABSTRACTS　2013/12/16
Current Conduction around Nanodomain Inversion Dot in Lithium Tantalate Single Crystal Studied by Using C-AFM and SNDM Peer-reviewed

Yasuo Cho

2013 MRS fall meeting ABSTRACTS　2013/12/05
Site Specific Measurement of Atomic Dipole Moment Induced Local Surface Potentials on Si(111)-(7×7) Surface by Noncontact Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

2013 MRS fall meeting ABSTRACTS　2013/12/05

DOI： 10.1063/1.4896323 　
High Resolution Visualization of Carrier Distribution in SiC-MOSFET Using Super-Higher-Order Nonlinear Dielectric Microscopy Peer-reviewed

Norimichi Chinone, Takashi Nakamura, Yasuo Cho

2013 MRS fall meeting ABSTRACTS　2013/12/04
Interfacial Capacitance between an Fe3 O4 Film and a Nb:TiO3 Substrate Peer-reviewed

Ryota Takahashi, Yasuo Cho, Mikk Lippmaa

2013 MRS fall meeting ABSTRACTS　2013/12/03
Site-specific Measurement of Atomic Dipole Moment Induced Surface Potential on Si(111)-(7×7) by Noncontact Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

ACSIN-12 & ICSPM21, ABSTRACTS　2013/11/05
Effectiveness of the scanning nonlinear dielectric microscopy on the failure analysis of semiconductor devices Invited Peer-reviewed

Koichiro Honda, Yasuo Cho

24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. ABSTRACTS　2013/10/02
CURRENT CONDUCTION AROUND NANODOMAIN INVERSION DOT IN LITHIUM TANTALATE SINGLE CRYSTAL Peer-reviewed

Yasuo Cho

13th International Meeting on Ferroelectricity, IMF-13, ABSTRACTS　2013/09/20
Observation of atomic dipole moment on hydrogen and oxygen adsorbed Si(111)-7×7 surfaces by using noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Y. Cho, D. Mizuno, K. Yamasue

19th International Vacuum Congress, ABSTRACTS　2013/09/13
Atomic dipole moment distribution on a hydrogen-adsorbed Si(111)-(7 × 7) surface observed by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Daisuke Mizuno, Kohei Yamasue, Yasuo Cho

Applied Physics Letters　103　(10)　2013/09/02

DOI： 10.1063/1.4820348 　

ISSN： 0003-6951
Atomic dipole moment distribution on a hydrogen-adsorbed Si(111)-(7 x 7) surface observed by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Daisuke Mizuno, Kohei Yamasue, Yasuo Cho

APPLIED PHYSICS LETTERS　103　(10)　101601-1-101601-5　2013/09

DOI： 10.1063/1.4820348 　

ISSN： 0003-6951

eISSN： 1077-3118
Measurements of Nonlinear Dielectric Constants of Pb(Zr,Ti)O-3 Thin Films Using a Dynamic Measuring Method Peer-reviewed

Yoshiomi Hiranaga, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　52　(9)　09KA08-1-09KA08-4　2013/09

DOI： 10.7567/JJAP.52.09KA08 　

ISSN： 0021-4922

eISSN： 1347-4065
Site specific measurement of surface potential shift on Si(111)-(7ｘ7) surface by noncontact scanning nonliear dielectric microscopy Peer-reviewed

Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

NC-AFM 2013 ABSTRACTS　2013/08/08
Nano -Domains and Their Related Phenomena in LiTaO3 Single Crystal Studied by Using Scanning Nonlinear Dielectric Microscopy Invited Peer-reviewed

Yasuo Cho

2013 Joint UFFC, EFTF and PFM Symposium, ABSTRACTS　2013/07/25
Investigation of physical and electrical properties of hydrogen-adsorbed Si(111)-7×7 surface by using noncontact scanning nonlinear dielectric microscopy Peer-reviewed

DAISUKE MIZUNO, KOHEI YAMASUE, AND YASUO CHO

18th Microscopy of Semiconducting Materials Meeting ABSTRACTS　2013/04/08
Electronic state of carbon material surface by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Shin-ichiro Kobayashi, Yasuo Cho

APS March Meeting 2013, ABSTRACTS　2013/03/21
Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7 × 7) surface by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

Journal of Applied Physics　113　(1)　pp242-101-1-pp242-101-5　2013/01/07

DOI： 10.1063/1.4772705 　

ISSN： 0021-8979
High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy Peer-reviewed

N. Chinone, K. Yamasue, K. Honda, Y. Cho

18TH MICROSCOPY OF SEMICONDUCTING MATERIALS CONFERENCE (MSM XVIII)　471　2013

DOI： 10.1088/1742-6596/471/1/012023 　

ISSN： 1742-6588
High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy Peer-reviewed

N. Chinone, K. Yamasue, K. Honda, Y. Cho

18TH MICROSCOPY OF SEMICONDUCTING MATERIALS CONFERENCE (MSM XVIII)　471　012023　2013

DOI： 10.1088/1742-6596/471/1/012023 　

ISSN： 1742-6588
Atomic Scale Imaging of TiO2(100) Reconstructed Surfaces by Noncontact Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Nobuhiro Sawai, Kohei Yamasue, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　51　(12)　121801-121807　2012/12

DOI： 10.1143/JJAP.51.121801 　

ISSN： 0021-4922
Scanning nonlinear dielectric microscopy nano science and technology Invited Peer-reviewed

Yasuo Cho

2012 EMN Fall Meeting ABSTRACTS　2012/12/01
Scanning nonlinear dielectric microscopy observation of accumulated charges in metal-SiO2-SiN-SiO2-Si flash memory by detecting higher-order nonlinear permittivity Peer-reviewed

Koichiro Honda, Yasuo Cho

APPLIED PHYSICS LETTERS　101　(24)　242101-1-242102-5　2012/12

DOI： 10.1063/1.4769352 　

ISSN： 0003-6951
Observation of Threshold Voltage Distribution of Transistors in a Metal-SiO2-SiN-SiO2-semiconductor Flash Memory Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Koichiro Honda, Yasuo Cho

2012 MRS fall meeting ABSTRACTS　2012/11/29
Non-contact Scanning Nonlinear Dielectric Microscopy Studies of Atomic Dipole Moments on Hydrogen-adsorbed Si(111)-7×7 Surface Peer-reviewed

Daisuke Mizuno, Kohei Yamasue, Yasuo Cho

2012 MRS fall meeting ABSTRACTS　2012/11/28
Super Higher Order Nonlinear Dielectric Microscopy with Super High Resolution Peer-reviewed

Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga, Koichiro Honda, Yasuo Cho

2012 MRS fall meeting ABSTRACTS　2012/11/27
Lateral resolution improvement in scanning nonlinear dielectric microscopy by measuring super-higher-order nonlinear dielectric constants Peer-reviewed

N. Chinone, K. Yamasue, Y. Hiranaga, K. Honda, Y. Cho

APPLIED PHYSICS LETTERS　101　(21)　213112-1-213112-4　2012/11

DOI： 10.1063/1.4766349 　

ISSN： 0003-6951
Observing of charges stored in metal-oxide-nitride-oxide semiconductor flash memory by using higher order nonlinear dielectric microscopy Peer-reviewed

K. Honda, T. Iwai, Y. Cho

The 15th European Microscopy Congress (emc2012) manchester ABSTRACTS　2012/09/17
Resolution improvement of scanning nonlinear dielectric microscopy by measuring the super higher-order nonlinear dielectric constants Peer-reviewed

N.Chinone, K. Yamasue, Y. Hiranaga, K.Honda, Y. Cho

The 15th European Microscopy Congress (emc2012) manchester ABSTRACTS　2012/09/17
Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy Peer-reviewed

Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　51　(9)　09LE07-1-09LE07-5　2012/09

DOI： 10.1143/JJAP.51.09LE07 　

ISSN： 0021-4922
Atomic electric dipole moment visualization using scanning nonlinear dielectric microscopy Invited Peer-reviewed

Y. CHO

11th International Symposium on Ferroic Domains and Micro-to Nanoscopic Structures , 11th Russia/CIS/Baltic/Japan/Symposium on Ferroelectricity), ABSTRACTS　2012/08/21
Super-higher order nonlinear dielectric microscopy studies on ferroelectric materials and semiconductor devices Peer-reviewed

N.CHINONE, K. YAMASUE, Y. HIRANAGA, K.HONDA, Y. CHO

International Conference on Nanoscience + Technology 2012, ABSTRACTS　2012/07/24
Observation of dipole moments on hydrogen-adsorbed Si(111)-(7×7) surface by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Daisuke Mizuno, Kohei Yamasue, Yasuo Cho

15th International Conference on non-contact Atomic Force Microscopy, ABSTRACTS　2012/07/05
Simultaneous imaging of current and local dipole moments of Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

15th International Conference on non-contact Atomic Force Microscopy, ABSTRACTS　2012/07/02
Visualization of Electrons Localized in Metal-Oxide-Nitride-Oxide-Semiconductor Flash Memory Thin Gate Films by Detecting High-Order Nonlinear Permittivity Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Koichiro Honda, Yasuo Cho

APPLIED PHYSICS EXPRESS　5　(3)　036602-1-036602-3　2012/03

DOI： 10.1143/APEX.5.036602 　

ISSN： 1882-0778
New evaluation of fullerene molecules on Si(111)-(7 x 7) reconstructed structure using non-contact scanning non-linear dielectric microscopy Peer-reviewed

Shin-ichiro Kobayashi, Yasuo Cho

SURFACE SCIENCE　606　(3-4)　174-180　2012/02

DOI： 10.1016/j.susc.2011.09.011 　

ISSN： 0039-6028
Super Higher-Order Nonlinear Dielectric Microscopy Peer-reviewed

N.Chinone, K. Yamasue, Y. Hiranaga, Y. Cho

The 19th International Colloquium on Scanning Probe Microscopy, ABSTRACTS　2011/12/20
Visualization of Electrons Localized in Metal –SiO2-SiN-SiO2-Semiconductor Flash Memory Thin Gate Films by Detecting the Higher-Order Nonlinear Dielectric Constant Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Koichiro Honda, Yasuo Cho

2011 MRS fall meeting ABSTRACTS　2011/11/28
Observation of local dipole moments on cleaned Si(111) surface with defects by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Kohei YAMASUE, Yasuo Cho

14th International Conference on Noncontact Atomic Force Microscopy, ABSTRACTS　2011/09/19
Observation of Polarization Distribution on Si(111) Surface by Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Kohei Yamasue, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　50　(9)　09NE12-1-09NE12-5　2011/09

DOI： 10.1143/JJAP.50.09NE12 　

ISSN： 0021-4922
Scanning nonlinear dielectric microscopy Invited Peer-reviewed

Yasuo Cho

JOURNAL OF MATERIALS RESEARCH　26　(16)　2007-2016　2011/08

DOI： 10.1557/jmr.2011.219 　

ISSN： 0884-2914

eISSN： 2044-5326
Study of TiO2(100) Reconstructed Surfaces by Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Nobuhiro Sawai, Yasuo Cho

7th NANOSCIENCE and NANOTECHNOLOGY CONFERENCE, ABSTRACTS　2011/06/30
Scanning nonlinear dielectric microscopy with high resolution and its application to next generation high density ferroelectric data storage Invited Peer-reviewed

Yasuo Cho

E-MRS ICAM IUMRS 2011 Spring Meeting, ABSTRACTS　2011/05/10
Development of Label-Free Bioaffinity Sensor Using a Lumped-Constant Microwave Resonator Probe Peer-reviewed

Noriaki Okazaki, Taito Nishino, Toyohiro Chikyow, Yasuo Cho

APPLIED PHYSICS EXPRESS　4　(1)　017001-1-017001-3　2011/01

DOI： 10.1143/APEX.4.017001 　

ISSN： 1882-0778
Scanning Nonlinear Dielectric Microscopy Invited Peer-reviewed

Y. Cho

2010 MRS Fall Meeting ABSTRACTS　2010/12/01
Observation of electrochemical capacitance in a graphite surface by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Shin-ichiro Kobayashi, Yasuo Cho

PHYSICAL REVIEW B　82　(24)　245427-1-245427-19　2010/12

DOI： 10.1103/PhysRevB.82.245427 　

ISSN： 1098-0121
Ferroelectric Super-High Density Peer-reviewed

Yasuo Cho, Kenkou Tanaka, Yoshiomi Hiranaga

The 3rd International Symposium on Innovations in Advanced Materials for Optics & Electronics, ABSTRACTS　2010/10/17
SNDM Ferroelectric Data Storage with Servo-Controlled Tracking Technique Peer-reviewed

Kenkou Tanaka, Yasuo Cho

19th International Symposium on the Applications of Ferroelectrics ABSTRACTS　2010/08/09
Actual information storage with a recording density of 4 Tbit/in.(2) in a ferroelectric recording medium Peer-reviewed

Kenkou Tanaka, Yasuo Cho

APPLIED PHYSICS LETTERS　97　(9)　092901-1-092901-3　2010/08

DOI： 10.1063/1.3463470 　

ISSN： 0003-6951
Imaging of the surface structure of TiO2(110) by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Nobuhiro Kin, Yasuo Cho

JOURNAL OF APPLIED PHYSICS　107　(10)　104121-1-104121-4　2010/05

DOI： 10.1063/1.3428509 　

ISSN： 0021-8979
Investigation of interface between fullerene molecule and Si(111)-7x7 surface by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Shin-ichiro Kobayashi, Yasuo Cho

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B　28　(3)　C4D18-C4D23　2010/05

DOI： 10.1116/1.3373959 　

ISSN： 1071-1023
Noncontact scanning nonlinear dielectric microscopy imaging of TiO2(110) surfaces Peer-reviewed

Nobuhiro Kin, Yasuo Cho

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B　28　(3)　C4D5-C4D10　2010/05

DOI： 10.1116/1.3427661 　

ISSN： 1071-1023
Acoustic Wave Devices composed Periodical Poled Z-cut LiTaO3 Plate” Fourth International Symposium on Acoustic Wave Devices for Future Mobile Communication Systems Peer-reviewed

Michio Kadota, Takashi Ogami, Kansho Yamamoto, Yasuo Cho

Third International Workshop on Piezo-Devices Based on Latest MEMS Technologies ABSTRACTS　2010/03/03
Intermittent contact scanning nonlinear dielectric microscopy Peer-reviewed

Yoshiomi Hiranaga, Yasuo Cho

REVIEW OF SCIENTIFIC INSTRUMENTS　81　(2)　023705-1-023705-5　2010/02

DOI： 10.1063/1.3274138 　

ISSN： 0034-6748
Investigation of interface between fullerene molecule and Si (111)-7×7 surface by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Shin-Ichiro Kobayashi, Yasuo Cho

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics　28　(3)　C4-D23　2010
Publisher: AVS Science and Technology Society
DOI： 10.1116/1.3373959 　

ISSN： 2166-2754 2166-2746
Observation of dopant profile of transistors sing scanning nonlinear dielectric microscopy Peer-reviewed

K. Honda, K. Ishikawa, Y. Cho

16TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS　209　(1)　012050-1-012050-4　2010

DOI： 10.1088/1742-6596/209/1/012050 　

ISSN： 1742-6588
Observation of dopant profile of transistors using scanning nonlinear dielectric microscopy Invited Peer-reviewed

K. Honda, K. Ishikawa, Y. Cho

Journal of Physics: Conference Series　209　2010
Publisher: Institute of Physics Publishing
DOI： 10.1088/1742-6596/209/1/012050 　

ISSN： 1742-6596 1742-6588
Ferroelectric Data Recording Using Servo-Controlled Tracking Technique Peer-reviewed

Kenkou Tanaka, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　49　(9)　2010

DOI： 10.1143/JJAP.49.09MA16 　

ISSN： 0021-4922
Acoustic Wave Devices Composed of Periodically Poled Z-Cut LiTaO3 Plate Using Edge Reflection Peer-reviewed

Michio Kadota, Takashi Ogami, Kansho Yamamoto, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　49　(7)　07HD22-1-07HD22-3　2010

DOI： 10.1143/JJAP.49.07HD22 　

ISSN： 0021-4922

eISSN： 1347-4065
Ferroelectric Data Recording Using Servo-Controlled Tracking Technique Peer-reviewed

Kenkou Tanaka, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　49　(9)　09MA16-1-09MA16-3　2010

DOI： 10.1143/JJAP.49.09MA16 　

ISSN： 0021-4922
Development of Ferroelectric Data Storage Test System for High - Density and High - Speed Read/Write Peer-reviewed

Y.Tanaka, T.Uda,Y.Kurihashi, Y.Kimoto, H.Tochishita, M.Kadota, Y.Cho

2009 MRS fall meeting ABSTRACTS　2009/12/03
Study of TiO₂(100) 1×1 and 1×3 Surfaces by Non-contact Scanning Nonlinear Dielectric Microscopy Combined with Scanning Tunneling Microscopy Peer-reviewed

N.Kin, Y.Cho

2009 MRS fall meeting ABSTRACTS　2009/12/02
Dependence of long term stability on the initial radius of small inverted domains formed on congruent single-crystal LiTaO3 Peer-reviewed

Nozomi Odagawa, Yasuo Cho

APPLIED PHYSICS LETTERS　95　(14)　142907-1-142907-3　2009/10

DOI： 10.1063/1.3237171 　

ISSN： 0003-6951
Characterization of Semiconductor Devices Using the Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Koichiro Honda, Yasuo Cho

Microscopy　44　(№.3)　170-173　2009/10
Publisher:
ISSN： 1349-0958
Nano-Domain Formation on Ferroelectrics and Development of HDD-Type Ferroelectric Data Storage Test System Peer-reviewed

Yoshiomi Hiranaga, Tomoya Uda, Yuichi Kurihashi, Yasuo Cho, Michio Kadota, Hikari Tochisita

21th International Symposium on Integrated Ferroelectrics and Functionalities, ABSTRACTS　2009/09/29
Nanodomain Formation on Ferroelectrics and Development of Hard-Disk-Drive-Type Ferroelectric Data Storage Devices Peer-reviewed

Yoshiomi Hiranaga, Tomoya Uda, Yuichi Kurihashi, Hikari Tochishita, Michio Kadota, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　48　(9)　2009/09

DOI： 10.1143/JJAP.48.09KA18 　

ISSN： 0021-4922
Non-contact scanning nonlinear dielectric microscopy imaging of TiO₂(110) surfaces Peer-reviewed

Nobuhiro Kin, Yasuo Cho

12th International Conference on Noncontact Atmic Force Microscopy and Casimir 2009 Workshop, Abstracts　2009/08/12
Characterizations of Carbon Material by Non-contact Scanning Non-liniar Dielectric Microscopy Peer-reviewed

Shin-ichiro Kobayashi, Yasuo Cho

12th International Conference on Noncontact Atmic Force Microscopy and Casimir 2009 Workshop, Abstracts　2009/08/12
Characterization and comparison of nanoscale domain boundary in congruent and stoichiometric LiTaO3 with scanning nonlinear dielectric microscopy Peer-reviewed

Dae-Yong Jeong, Yasuo Cho

APPLIED PHYSICS LETTERS　95　(2)　022908-1-022908-3　2009/07

DOI： 10.1063/1.3182713 　

ISSN： 0003-6951
Observation of local dipole moment of Si atoms on Si(100) surfaces using noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Nobuhiro Kin, Yuhei Osa, Yasuo Cho

JOURNAL OF APPLIED PHYSICS　106　(1)　1-5　2009/07

DOI： 10.1063/1.3158049 　

ISSN： 0021-8979
Observation of Dopant Profile Using Scanning Nonlinear Dielectroc Microscopy Peer-reviewed

KOICHIRO HONDA, KENYA ISHIKAWA, YASUO CHO

Microscopy of Semiconducting Materials(MSM)XVI, Abstract　2009/03/20
Coustic filter and resonator on periodical poled LiTaO3 Peer-reviewed

Michio Kadota, Takashi Ogami, Kansho Yamamoto, Yasuo Cho

Proceedings - IEEE Ultrasonics Symposium　2009

DOI： 10.1109/ULTSYM.2009.5442084 　

ISSN： 1051-0117
Acoustic Wave Devices using Periodical Poled Z-cut LiTaO3 Plate Peer-reviewed

Michio Kadota, Takashi Ogami, Kansho Yamamoto, Yasuo Cho

2009 JOINT MEETING OF THE EUROPEAN FREQUENCY AND TIME FORUM AND THE IEEE INTERNATIONAL FREQUENCY CONTROL SYMPOSIUM, VOLS 1 AND 2　919-+　2009

DOI： 10.1109/FREQ.2009.5168322 　

ISSN： 1075-6787
Multiferroism at Room Temperature in BiFeO3/BiCrO3(111) Artificial Superlattices Invited Peer-reviewed

Noriya Ichikawa, Masaya Arai, Yusuke Imai, Kei Hagiwara, Hiroshi Sakama, Masaki Azuma, Yuichi Shimakawa, Mikio Takano, Yasutoshi Kotaka, Masashi Yonetani, Hironori Fujisawa, Masaru Shimizu, Kenya Ishikawa, Yasuo Cho

APPLIED PHYSICS EXPRESS　1　(10)　101302-1-101302-3　2008/10

DOI： 10.1143/APEX.1.101302 　

ISSN： 1882-0778
In-Plane Distribution of Phase Transition Temperature of KTa1-xNbxO3 Measured with Single Temperature Sweep Invited Peer-reviewed

Takashi Sakamoto, Masahiro Sasaura, Shogo Yagi, Kazuo Fujiura, Yasuo Cho

APPLIED PHYSICS EXPRESS　1　(10)　101601-1-101601-3　2008/10

DOI： 10.1143/APEX.1.101601 　

ISSN： 1882-0778
The influence of 180 degrees ferroelectric domain wall width on the threshold field for wall motion Invited Peer-reviewed

Samrat Choudhury, Yulan Li, Nozomi Odagawa, Aravind Vasudevarao, L. Tian, Pavel Capek, Volkmar Dierolf, Anna N. Morozovska, Eugene A. Eliseev, Sergei Kalinin, Yasuo Cho, Long-qing Chen, Venkatraman Gopalan

JOURNAL OF APPLIED PHYSICS　104　(8)　084107-1-084107-7　2008/10

DOI： 10.1063/1.3000459 　

ISSN： 0021-8979
Observations of domain structure and ferroelectricity in Bi(Ni0.5Ti0.5)O-3 ceramics fabricated by high-pressure sintering Peer-reviewed

Kazuya Kitada, Masafumi Kobune, Wataru Adachi, Tetsuo Yazawa, Hiroyuki Saitoh, Katsutoshi Aoki, Jun'ichiro Mizuki, Kenya Ishikawa, Yoshiomi Hiranaga, Yasuo Cho

CHEMISTRY LETTERS　37　(5)　560-561　2008/05

DOI： 10.1246/cl.2008.560 　

ISSN： 0366-7022

eISSN： 1348-0715
Scanning Nonlinear Dielectric Microscopy Nano-Science and Technology for Next Generation High Density Ferroelectric Data Storage Invited Peer-reviewed

Kenkou Tanaka, Yuichi Kurihashi, Tomoya Uda, Yasuhiro Daimon, Nozomi Odagawa, Ryusuke Hirose, Yoshiomi Hiranaga, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS　47　(5)　3311-3325　2008/05

DOI： 10.1143/JJAP.47.3311 　

ISSN： 0021-4922

eISSN： 1347-4065
Observation of a local dipole moment of Si atoms on Si(100) surfaces using non-contact scanning nonlinear dielectric microscopy

Nobuhiro Kin, Yuhei Osa, Yasuo Cho

Materials Research Society Symposium Proceedings　1110　108-113　2008
Publisher: Materials Research Society
DOI： 10.1557/proc-1110-c09-18 　

ISSN： 0272-9172
Quantitative Measurement of Dopant Concentration Profiling by Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Kenya Ishikawa, Koichiro Honda, Yasuo Cho

NANOSCALE PHENOMENA IN FUNCTIONAL MATERIALS BY SCANNING PROBE MICROSCOPY　1025　2008

DOI： 10.1557/PROC-1025-B12-05 　

ISSN： 0272-9172
Observation of the Si (111)-7×7 reconstructed surface and fullerene molecule by the non-contact scanning nonlinear dielectric microscopy Invited Peer-reviewed

Shin-Ichiro Kobayashi, Ryusuke Hirose, Yasuo Cho

Shinku/Journal of the Vacuum Society of Japan　51　(12)　771-778　2008
Publisher: Vacuum Society of Japan
DOI： 10.3131/jvsj2.51.771 　

ISSN： 0559-8516
Novel HDD-type SNDM ferroelectric data storage system aimed at high-speed data transfer with single probe operation Peer-reviewed

Yoshiomi Hiranaga, Tomoya Uda, Yuichi Kurihashi, Kenkou Tanaka, Yasuo Cho

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL　54　(12)　2523-2528　2007/12

DOI： 10.1109/TUFFC.2007.571 　

ISSN： 0885-3010
Atomic dipole moment distribution of si atoms on a Si(111)-(7x7) surface studied using noncontact scanning nonlinear dielectric microscopy Peer-reviewed

Yasuo Cho, Ryusuke Hirose

PHYSICAL REVIEW LETTERS　99　(18)　186101-1-186101-4　2007/11

DOI： 10.1103/PhysRevLett.99.186101 　

ISSN： 0031-9007
Scanning nonlinear magnetic microscopy Peer-reviewed

Makoto Endo, Koya Ohara, Yasuo Cho

REVIEW OF SCIENTIFIC INSTRUMENTS　78　(7)　073704-1-073704-5　2007/07

DOI： 10.1063/1.2752609 　

ISSN： 0034-6748
Scanning nonlinear dielectric microscope with super high resolution Peer-reviewed

Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS　46　(7B)　4428-4434　2007/07

DOI： 10.1143/JJAP.46.4428 　

ISSN： 0021-4922
Cross-sectional observation of nanodomain dots formed in both congruent and stoichiometric LiTaO3 crystals Peer-reviewed

Yasuhiro Daimon, Yasuo Cho

APPLIED PHYSICS LETTERS　90　(19)　192906-1-192906-3　2007/05

DOI： 10.1063/1.2737906 　

ISSN： 0003-6951
Spatial distribution of phase transition temperature of KTa1-xNbxO3 measured using scanning nonlinear dielectric microscopy Peer-reviewed

Takashi Sakamoto, Koichiro Nakamura, Kazuo Fujiura, Yasuo Cho

APPLIED PHYSICS LETTERS　90　(22)　222908-1-222908-3　2007/05

DOI： 10.1063/1.2745217 　

ISSN： 0003-6951
Selective poling and characterization of ferroelectric poly(vinylidene fluoride-trifluoroethylene) by scanning nonlinear dielectric microscopy Peer-reviewed

Jong-Yoon Ha, Seok-Jin Yoon, Dae-Yong Jeong, Yasuo Cho

MACROMOLECULAR RESEARCH　15　(1)　86-89　2007/02

ISSN： 1598-5032
Resolution enhancement in contact-type scanning nonlinear dielectric microscopy using a conductive carbon nanotube probe tip Peer-reviewed

Kenya Ishikawa, Koichiro Honda, Yasuo Cho

NANOTECHNOLOGY　18　(8)　084015-1-084015-6　2007/02

DOI： 10.1088/0957-4484/18/8/084015 　

ISSN： 0957-4484
Observation of the Si(111) 7x7 atomic structure using non-contact scanning nonlinear dielectric microscopy Peer-reviewed

Ryusuke Hirose, Koya Ohara, Yasuo Cho

NANOTECHNOLOGY　18　(8)　084014-1-084014-5　2007/02

DOI： 10.1088/0957-4484/18/8/084014 　

ISSN： 0957-4484
走査型非線形誘電率顕微鏡によるフラッシュメモリ中の蓄積電荷の可視化 Peer-reviewed

本田耕一郎, 長康雄

表面科学　28　(2)　78-83　2007/02
Publisher:
DOI： 10.1380/jsssj.28.78 　

ISSN： 0388-5321
Nanodomain Manipulation for Ferroelectric Data Storage with High Recording Density, Fast Domain Switching and Low Bit Error Rate Peer-reviewed

Yoshiomi Hiranaga, Sunao Hashimoto, Nozomi Odagawa, Kenkou Tanaka, Yasuo Cho

2006 15th IEEE International Symposium on Applications of Ferroelectrics　280-283　2007

ISSN： 1099-4734
Cross-sectional Observation of Nano-domain Dots Formed in Congruent Single-crystal LiTaO₃ Peer-reviewed

Yasuo Cho, Yasuhiro Daimon

Proceedings of 2006 MRS Fall Meeting　966　0966-T09-03.1-0966-T09-03.6　2007
Simultaneous Observation of Surface Morphology and Dielectric Properties Using Non-Contact Scanning Nonlinear Dielectric Microscopy with Atomic Resolution Peer-reviewed

Ryusuke Hirose, Yasuo Cho

Proceedings of 2006 MRS Fall Meeting　966　0966-T09-08.1-0966-T09-08.6　2007
Nanoscale ferroelectric information storage based on scanning nonlinear dielectric microscopy Peer-reviewed

Yasuo Cho

JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY　7　(1)　105-116　2007/01

DOI： 10.1166/jnn.2007.009 　

ISSN： 1533-4880
Non-contact probe control and high-speed writing for rotated-disk-type ferroelectric data storage devices Invited Peer-reviewed

Y. Hiranaga, T. Uda, Y. Kurihashi, K. Tanaka, N. Odagawa, Y. Cho

2007 SIXTEENTH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2　326-329　2007

DOI： 10.1109/ISAF.2007.4393255 　

ISSN： 1099-4734
Study of long-term-retention characteristics and wall behavior of nano-inverted domains on congruent single-crystal LiTaO(3) based on wall energy Peer-reviewed

Nozomi Odagawa, Yasuo Cho

2007 SIXTEENTH IEEE INTERNATIONAL SYMPOSIUM ON THE APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2　333-335　2007

DOI： 10.1109/ISAF.2007.4393257 　

ISSN： 1099-4734
Cross-sectional observation of nano-domain dots formed in congruent single-crystal LiTaO3 Peer-reviewed

Yasuhiro Damon, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS　45　(46-50)　L1304-L1306　2006/12

DOI： 10.1143/JJAP.45.L1304 　

ISSN： 0021-4922
Wall behavior of nanodomains as a function of their initial state Peer-reviewed

Nozomi Odagawa, Yasuo Cho

APPLIED PHYSICS LETTERS　89　(19)　192906-1-192906-3　2006/11

DOI： 10.1063/1.2385860 　

ISSN： 0003-6951
Using an electroconductive carbon nanotube probe tip in scanning nonlinear dielectric microscopy Peer-reviewed

K. Ishikawa, Y. Cho

REVIEW OF SCIENTIFIC INSTRUMENTS　77　(10)　103708-1-103708-3　2006/10

DOI： 10.1063/1.2360985 　

ISSN： 0034-6748
Long-term-retention characteristics of small inverted dots formed on congruent single-crystal LiTaO3 Peer-reviewed

Nozomi Odagawaa, Yasuo Cho

APPLIED PHYSICS LETTERS　89　(10)　102906-1-102906-3　2006/09

DOI： 10.1063/1.2345827 　

ISSN： 0003-6951
Study of long-term-retention characteristics and wall behavior of nano-inverted domains on congruent single-crystal LiTaO3 based on wall energy Peer-reviewed

Nozomi Odagawa, Yasuo Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS　45　(9B)　7560-7563　2006/09

DOI： 10.1143/JJAP.45.7560 　

ISSN： 0021-4922
A diamond-tip probe with silicon-based piezoresistive strain gauge for high-density data storage using scanning nonlinear dielectric microscopy Peer-reviewed

Hirokazu Takahashi, Takahito Ono, Atsushi Onoe, Yasuo Cho, Masayoshi Esashi

Journal of Micromechanics and Microengineering　16　(8)　1620-1624　2006/08/01

DOI： 10.1088/0960-1317/16/8/025 　

ISSN： 0960-1317

eISSN： 1361-6439
Non-contact scanning nonlinear dielectric microscopy utilizing higher order nonlinear dielectric signal Peer-reviewed

K. Ohara, Y. Cho

Ferroelectrics　336　263-270　2006/07/01

DOI： 10.1080/00150190600697871 　

ISSN： 0015-0193 1563-5112
Piezoelectric performance and domain structure of epitaxial PbTiO3 thin film deposited by hydrothermal method Peer-reviewed

T Morita, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS　45　(5B)　4489-4492　2006/05

DOI： 10.1143/JJAP.45.4489 　

ISSN： 0021-4922
Visualization of charges stored in the floating gate of flash memory by scanning nonlinear dielectric microscopy Peer-reviewed

K Honda, S Hashimoto, Y Cho

NANOTECHNOLOGY　17　(7)　S185-S188　2006/04

DOI： 10.1088/0957-4484/17/7/S14 　

ISSN： 0957-4484
Nanodomain manipulation for ultrahigh density ferroelectric data storage Peer-reviewed

Y Cho, S Hashimoto, N Odagawa, K Tanaka, Y Hiranaga

NANOTECHNOLOGY　17　(7)　S137-S141　2006/04

DOI： 10.1088/0957-4484/17/7/S06 　

ISSN： 0957-4484
Three-dimensional observation of nanoscale ferroelectric domains using scanning nonlinear dielectric microscopy with electric field correction by Kelvin probe force microscopy Peer-reviewed

T Sugihara, Y Cho

NANOTECHNOLOGY　17　(7)　S162-S166　2006/04

DOI： 10.1088/0957-4484/17/7/S10 　

ISSN： 0957-4484
High-density ferroelectric recording using diamond probe by scanning nonlinear dielectric microscopy Peer-reviewed

Hirokazu Takahashi, Astushi Onoe, Takahito Ono, Yasuo Cho, Masayoshi Esashi

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers　45　(3 A)　1530-1533　2006/03/08

DOI： 10.1143/JJAP.45.1530 　

ISSN： 0021-4922

eISSN： 1347-4065
Piezoelectric property of an epitaxial lead titanate thin film deposited by the hydrothermal method Peer-reviewed

T Morita, Y Cho

APPLIED PHYSICS LETTERS　88　(11)　112908-1-112908-3　2006/03

DOI： 10.1063/1.2183364 　

ISSN： 0003-6951
Nanodomain manipulation for reduction of bit error rate in terabit/inch(2)-class ferroelectric data storage Peer-reviewed

Y Hiranaga, K Tanaka, Y. Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS　45　(3B)　2220-2224　2006/03

DOI： 10.1143/JJAP.45.2220 　

ISSN： 0021-4922
Retention loss phenomena in hydrothermally fabricated heteroepitaxial PbTiO3 films studied by scanning probe microscopy Peer-reviewed

WS Ahn, WW Jung, SK Choi, Y Cho

APPLIED PHYSICS LETTERS　88　(8)　082902-1-082902-3　2006/02

DOI： 10.1063/1.2178417 　

ISSN： 0003-6951

eISSN： 1077-3118
Long term retention characteristic of small inverted dots formed on congruent single-crystal LiTaO3

Yasuo Cho, Nozomi Odagawa

Materials Research Society Symposium Proceedings　966　90-95　2006
Publisher: Materials Research Society
DOI： 10.1557/proc-0966-t11-21 　

ISSN： 0272-9172
Scanning nonlinear dielectric microscopy and its use in next-generation ultrahigh-density ferroelectric data storage Peer-reviewed

Y Cho, H Odagawa, K Ohara, Y Hiranaga

ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS　89　(1)　19-31　2006

DOI： 10.1002/ecjb.20170 　

ISSN： 8756-663X
10Tbit/inch2 Ferroelectric Data Storage with Offset Voltage Application Method Peer-reviewed

Sunao Hashimoto, Yasuo Cho

Proceedings of 2005 MRS Fall Meeting　902E　0902-T10-42.1-0902-T10-42.6　2006

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通研インポート200703
Surface Potential Investigation on Nano Domain Formation in Lithium Tantable Single Crystal Peer-reviewed

Mirai Katoh, Yasuo Cho

Proceedings of 2005 MRS Fall Meeting　902E　0902-T10-50.1-0902-T10-50.6　2006

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通研インポート200703
Real Information Recording in Ferroelectric Data Stroage Medium with Memory Density of 1 Tbit/inch2 Peer-reviewed

Tanaka Kenkou, Hiranaga Yoshiomi, Yasuo Cho

Proceedings of 2005 MRS Fall Meeting　902E　0902-T10-41.1-0902-T10-41.6　2006

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通研インポート200703
Observation of [110] surface band within {101} a-domain of heteroepitaxial PbTiO3 thin film fabricated by hydrothermal epitaxy Peer-reviewed

SK Choi, SH Ahn, WW Jung, JC Park, SA Song, CB Lim, Y Cho

APPLIED PHYSICS LETTERS　88　(5)　052901-1-052901-3　2006/01

DOI： 10.1063/1.2171489 　

ISSN： 0003-6951
Terabit per square inch information data storage on ferroelectrics with low bit error rate Peer-reviewed

Y. Hiranaga, K. Tanaka, Y. Cho

FERROELECTRICS　333　99-106　2006

DOI： 10.1080/00150190600689373 　

ISSN： 0015-0193
Non-contact scanning nonlinear dielectric microscopy utilizing higher order nonlinear dielectric signal Peer-reviewed

K. Ohara, Y. Cho

FERROELECTRICS　336　263-270　2006

DOI： 10.1080/00150190600697871 　

ISSN： 0015-0193
Visualization using the Scanning Nonlinear Dielectric Microscopy of electrons and holes localized in the thin gate film of Metal-Oxide-Nitride-Oxide-Semiconductor type flash memory Peer-reviewed

Koichiro Honda, Yasuo Cho

7TH ANNUAL NON-VOLATILE MEMORY TECHNOLOGY SYMPOSIUM　1-+　2006
Ferroelectric ultra high-density data storage based on scanning nonlinear dielectric microscopy Peer-reviewed

Yasuo Cho, Sunao Hashimoto, Nozomi Odagawa, Kenkou Tanaka, Yoshiorm Hiranaga

7TH ANNUAL NON-VOLATILE MEMORY TECHNOLOGY SYMPOSIUM　31-36　2006
Long-term-retention characteristics of small inverted dots formed on congruent single-crystal LiTaO3 Peer-reviewed

Nozomi Odagawa, Yasuo Cho

Applied Physics Letters　89　(10)　0966-T11-21.1-0966-T11-21.6　2006

DOI： 10.1063/1.2345827 　

ISSN： 0003-6951
Real information storage using ferroelectrics with a density of 1 TBIT/INCH2 Peer-reviewed

K. Tanaka, Y. Hiranaga, Y. Cho

FERROELECTRICS　340　99-105　2006

DOI： 10.1080/00150190600889080 　

ISSN： 0015-0193
Realization of 10 Tbit/in.(2) memory density and subnanosecond domain switching time in ferroelectric data storage Peer-reviewed

Y. Cho, S Hashimoto, N Odagawa, K Tanaka, Y Hiranaga

APPLIED PHYSICS LETTERS　87　(23)　232907-1-232907-3　2005/12

DOI： 10.1063/1.2140894 　

ISSN： 0003-6951

eISSN： 1077-3118
Ultrahigh-density ferroelectric data storage with low bit error rate Peer-reviewed

Y Hiranaga, Y. Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS　44　(9B)　6960-6963　2005/09

DOI： 10.1143/JJAP.44.6960 　

ISSN： 0021-4922
Investigation of three-dimensional domain structure in LiTaO3 by scanning nonlinear dielectric microscopy Peer-reviewed

T Sugihara, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS　44　(9B)　7169-7173　2005/09

DOI： 10.1143/JJAP.44.7169 　

ISSN： 0021-4922
Nano-sized domain inversion characteristics in LiNbO3 group single crystals using SNDM Peer-reviewed

A Onoe, S Hashimoto, Y Cho

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY　120　(1-3)　130-133　2005/07

DOI： 10.1016/j.mseb.2005.02.009 　

ISSN： 0921-5107
Ultrahigh-density ferroelectric data storage based on scanning nonlinear dielectric microscopy Peer-reviewed

Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS　44　(7B)　5339-5343　2005/07

DOI： 10.1143/JJAP.44.5339 　

ISSN： 0021-4922
Three-dimensional measurement for absolute value of polarization angle by scanning nonlinear dielectric microscopy Peer-reviewed

T Sugihara, H Odagawa, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS　44　(6B)　4325-4329　2005/06

DOI： 10.1143/JJAP.44.4325 　

ISSN： 0021-4922
Visualization of electrons and holes localized in the thin gate film of metal-oxide-nitride-oxide-semiconductor type Flash memory by scanning nonlinear dielectric microscopy Peer-reviewed

K Honda, S Hashimoto, Y Cho

NANOTECHNOLOGY　16　(3)　S90-S93　2005/03

DOI： 10.1088/0957-4484/16/3/017 　

ISSN： 0957-4484
Non-contact scanning nonlinear dielectric microscopy Peer-reviewed

K Ohara, Y Cho

NANOTECHNOLOGY　16　(3)　S54-S58　2005/03

DOI： 10.1088/0957-4484/16/3/010 　

ISSN： 0957-4484
Visualization of electrons and holes localized in gate thin film of metal SiO2-Si3N4-SiO2 semiconductor-type flash memory using scanning nonlinear dielectric microscopy after writing-erasing cycling Peer-reviewed

K Honda, S Hashimoto, Y Cho

APPLIED PHYSICS LETTERS　86　(6)　063515-1-063515-3　2005/02

DOI： 10.1063/1.1862333 　

ISSN： 0003-6951
Three-dimensional observation of nano-scale ferroelectric domain using scanning nonlinear dielectric microscopy

Yasuo Cho, Tomoyuki Sugihara

Materials Research Society Symposium Proceedings　902　165-170　2005
Publisher: Materials Research Society
DOI： 10.1557/proc-0902-t06-04 　

ISSN： 0272-9172
Piezoelectric property of epitaxial PbTiO3 thin film deposited by hydrothermal method Peer-reviewed

T Morita, Y Cho

2005 IEEE Ultrasonics Symposium, Vols 1-4　1083-1086　2005

ISSN： 1051-0117
Development of Ultra-High Vacuum Scanning Nonlinear Dielectric Microscope and Near Atomic Scale Observation of Ferroelectric Material Surfaces Peer-reviewed

Hiroyuki Odagawa, Yasuo Cho

Proceedings of MRS Fall Meeting　838E　O14.1.1-O14.1.6　2005
Absolute Measurement of Three-dimensional Polarization Direction Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Yasuo Cho, Tomoyuki Sugihara

Proceedings of 2004 MRS Fall Meeting　838E　O7.3.1-O7.3.6　2005
Perfectly c-axis oriented epitaxial lead titanate thin film deposited by a hydrothermal method for a data storage medium Peer-reviewed

T Morita, Y Cho

MATERIALS AND PROCESSES FOR NONVOLATILE MEMORIES　830　147-152　2005

ISSN： 0272-9172
Visualization using scanning nonlinear dielectric microscopy of electrons and holes localized in the thin gate film of a metal-SiO2-Si3N4-SiO2-semiconductor flash memory Peer-reviewed

K Honda, Y Cho

APPLIED PHYSICS LETTERS　86　(1)　2005/01

DOI： 10.1063/1.1846147 　

ISSN： 0003-6951
Hydrothermally deposited PbTiO3 epitaxial thin film Peer-reviewed

T Morita, Y Cho

JOURNAL OF THE KOREAN PHYSICAL SOCIETY　46　(1)　10-14　2005/01

ISSN： 0374-4884
Scanning Nonlinear Dielectric Microscope and Its Application to Next Generation Super High-Density Ferroelectric Data Storage Invited Peer-reviewed

Yasuo Cho, Hiroyuki Odagawa, Koya Ohara, Yoshiomi Hiranaga

The IEICE Transactions on Electronics C (Japanese Edition)　88-C　(1)　1-12　2005/01
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 1345-2827
Effect of the surface adsorbed water on the studying of ferroelectrics by scanning nonlinear dielectric microscopy Peer-reviewed

K Ohara, Y. Cho

JOURNAL OF APPLIED PHYSICS　96　(12)　7460-7463　2004/12

DOI： 10.1063/1.1810194 　

ISSN： 0021-8979
A hydrothermally deposited epitaxial lead titanate thin film on strontium ruthenium oxide bottom electrode Peer-reviewed

T Morita, Y. Cho

APPLIED PHYSICS LETTERS　85　(12)　2331-2333　2004/09

DOI： 10.1063/1.1794867 　

ISSN： 0003-6951
Epitaxial PbTiO3 thin films on SrTiO3(100) and SrRuO3/SrTiO3(100) substrates deposited by a hydrothermal method Peer-reviewed

T Morita, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　43　(9B)　6535-6538　2004/09

DOI： 10.1143/JJAP.43.6535 　

ISSN： 0021-4922
Evaluation of bit error rate for ferroelectric data storage Peer-reviewed

Y Hiranaga, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　43　(9B)　6632-6634　2004/09

DOI： 10.1143/JJAP.43.6632 　

ISSN： 0021-4922
Observation of surface polarization distribution using temperature-controlled scanning nonlinear dielectric microscopy Peer-reviewed

K Ohara, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　43　(7B)　4629-4633　2004/07

DOI： 10.1143/JJAP.43.4629 　

ISSN： 0021-4922
Ferroelectric property of an epitaxial lead zirconate titanate thin film deposited by a hydrothermal method Peer-reviewed

T Morita, Y Wagatsuma, H Morioka, H Funakubo, N Setter, Y Cho

JOURNAL OF MATERIALS RESEARCH　19　(6)　1862-1868　2004/06

DOI： 10.1557/JMR.2004.0243 　

ISSN： 0884-2914
Ferroelectric properties of an epitaxial lead zirconate titanate thin film deposited by a hydrothermal method below the Curie temperature Peer-reviewed

T Morita, Y Wagatsuma, Y. Cho, H Morioka, H Funakubo, N Setter

APPLIED PHYSICS LETTERS　84　(25)　5094-5096　2004/06

DOI： 10.1063/1.1762973 　

ISSN： 0003-6951
Nanosecond switching of nanoscale ferroelectric domains in congruent single-crystal LiTaO3 using scanning nonlinear dielectric microscopy Peer-reviewed

K Fujimoto, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　43　(5B)　2818-2821　2004/05

DOI： 10.1143/JJAP.43.2818 　

ISSN： 0021-4922
Ferroelectric single crystal recording media fabricated by polarization controlled wet etching process Peer-reviewed

Y Hiranaga, Y Wagatsuma, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS　43　(4B)　L569-L571　2004/04

DOI： 10.1143/JJAP.43.L569 　

ISSN： 0021-4922
Domain structure in a micron-sized PbZr1-xTixO3 single crystal on a Ti substrate fabricated by hydrothermal synthesis Peer-reviewed

DJ You, WW Jung, SK Choi, Y. Cho

APPLIED PHYSICS LETTERS　84　(17)　3346-3348　2004/04

DOI： 10.1063/1.1702129 　

ISSN： 0003-6951
Characterization of LiNb1-xTaxO3 composition-spread thin film by the scanning microwave microscope Peer-reviewed

Noriaki Okazaki, Sohei Okazaki, Hiroko Higuma, Shoji Miyashita, Yasuo Cho, Jun Nishimura, Tomoteru Fukumura, Masashi Kawasaki, Makoto Murakami, Yukio Yamamoto, Yuji Matsumoto, Hideomi Koinuma, Tetsuya Hasegawa

Applied Surface Science　223　(1-3)　196-199　2004/02/15

DOI： 10.1016/S0169-4332(03)00916-4 　

ISSN： 0169-4332
Ferroelectric property of an epitaxial lead zirconate titanate thin film deposited by a hydrothermal method

T Morita, Y Wagatsuma, Y Cho, H Morioka, H Funakubo

FERROELECTRIC THIN FILMS XII　784　231-236　2004

ISSN： 0272-9172
Polarization reversal anti-parallel to the applied electric field observed using a scanning nonlinear dielectric microscopy Peer-reviewed

T Morita, Y. Cho

FERROELECTRIC THIN FILMS XII　784　447-452　2004

ISSN： 0272-9172
First prototype of high-density ferroelectric data storage system

Y Hiranaga, Y. Cho, Y Wagatsuma

FERROELECTRIC THIN FILMS XII　784　453-458　2004

ISSN： 0272-9172
Temperature controlled scanning nonlinear dielectric microscopy

K Ohara, Y Cho

ADVANCED DATA STORAGE MATERIALS AND CHARACTERIZATION TECHNIQUES　803　27-33　2004

ISSN： 0272-9172
Visualization of electrons and holes localized in the gate thin film of metal-oxide nitride-oxide semiconductor type flash memory by using scanning nonlinear dielectric microscopy Peer-reviewed

K Honda, Y Cho

ADVANCED DATA STORAGE MATERIALS AND CHARACTERIZATION TECHNIQUES　803　21-26　2004

ISSN： 0272-9172
A hydrothermally deposited epitaxial PbTiO3 thin film on SrRuO3 bottom electrode for the ferroelectric ultra-high density storage medium Peer-reviewed

T Morita, Y Cho

INTEGRATED FERROELECTRICS　64　247-257　2004

DOI： 10.1080/10584580490894645 　

ISSN： 1058-4587
Polarization reversal anti-parallel to the applied electric field observed using a scanning nonlinear dielectric microscopy Peer-reviewed

T Morita, Y Cho

APPLIED PHYSICS LETTERS　84　(2)　257-259　2004/01

DOI： 10.1063/1.1637938 　

ISSN： 0003-6951
Fundamental study on ferroelectric data storage with the density above 1 Tbit/inch(2) using congruent lithium tantalate Peer-reviewed

Y. Cho, Y Hiranaga, K Fujimoto, Y Wagatsuma, A Onoe

INTEGRATED FERROELECTRICS　61　77-81　2004

DOI： 10.1090/10584580490458810 　

ISSN： 1058-4587
Observation of ring shaped domain patterns using a scanning nonlinear dielectric microscopy Peer-reviewed

M Katoh, T Morita, Y Cho

INTEGRATED FERROELECTRICS　68　207-219　2004

DOI： 10.1080/10584580490896517 　

ISSN： 1058-4587
LiTaO3 recording media prepared by polarization controlled wet etching process Peer-reviewed

Y Hiranaga, Y Wagatsuma, Y Cho

INTEGRATED FERROELECTRICS　68　221-228　2004

DOI： 10.1080/10584580490896526 　

ISSN： 1058-4587
Visualization of electrons and holes localized in the gate thin film of metal-oxide nitride-oxide semiconductor type flash memory by using scanning nonlinear dielectric microscopy Peer-reviewed

K Honda, Y Cho

ADVANCED DATA STORAGE MATERIALS AND CHARACTERIZATION TECHNIQUES　803　(3)　21-26　2004

DOI： 10.1088/0957-4484/16/3/017 　

ISSN： 0272-9172
High-speed switching of nanoscale ferroelectric domains in congruent single-crystal LiTaO3 Peer-reviewed

K Fujimoto, Y. Cho

APPLIED PHYSICS LETTERS　83　(25)　5265-5267　2003/12

DOI： 10.1063/1.1635961 　

ISSN： 0003-6951
Scanning Nonlinear Dielectric Microscopy :Overview -A High Resolution Tool for Observing Ferroelectric Domains and Nano-domain Engineering- Peer-reviewed

Yasuo Cho

Journal of the Korean Ceramic Society　40　(11)　1047-1057　2003/11
SNDM Nanodomain Engineering for Ultra High-Density Ferroelectric Data Storage Invited Peer-reviewed

Yasuo CHO

Proceedings of the 8th IUMRS International Conference on Advanced Materials　2003/10
Observation of domain walls in PbZr0.2Ti0.8O3 thin film using scanning nonlinear dielectric microscopy Peer-reviewed

K Matsuura, Y Cho, R Ramesh

APPLIED PHYSICS LETTERS　83　(13)　2650-2652　2003/09

DOI： 10.1063/1.1609252 　

ISSN： 0003-6951
Observation of antiparallel polarization reversal using a scanning nonlinear dielectric microscope Peer-reviewed

T Morita, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　42　(9B)　6214-6217　2003/09

DOI： 10.1143/JJAP.42.6214 　

ISSN： 0021-4922
Tbit/inch² Ferroelectric Data Storage Using SNDM Nano Domain Engineering System Peer-reviewed

Yasuo CHO, Yoshiomi HIRANAGA, Kenjiro FUJIMOTO, Yasuo WAGATSUMA, Atsushi ONOE, Kazuya TERABE, Kenji KITAMURA

Proceedings of the 10th European Meeting on Ferroelectricity　2003/08
Ultrahigh-Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Yoshiomi Hiranaga, Yasuo Cho, Kenjiro Fujimoto, Yasuo Wagatsuma, Atsushi Onoe

Japanese Journal of Applied Physics　42　(9B)　6050-6054　2003/06/19
Publisher: INSTITUTE OF PURE AND APPLIED PHYSICS
DOI： 10.1143/jjap.42.6050 　

ISSN： 0021-4922

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Ferroelectrics have generated considerable interest as promising storage media. In this paper, an investigation of ultrahigh-density ferroelectric data storage based on scanning nonlinear dielectric microscopy (SNDM) was carried out. For the purpose of obtaining fundamental knowledge of high-density ferroelectric data storage, several experiments on nanodomain formation in lithium tantalate (LiTaO3) single crystal were conducted. As a result, a very small inverted domain with a radius of 6 nm was successfully formed in stoichiometric LiTaO3 (SLT), and in addition, a domain dot array with an areal density of 1.5 Tbit/inch2 was written on congruent LiTaO3 (CLT). Additionally, the first prototype high-density ferroelectric data storage system was developed. Using this system, reading and writing data transfer rates were evaluated.
Scanning Nonlinear Dielectric Microscope Peer-reviewed

Yasuo CHO

Proceeding of Characterization and Imaging Symposium　277-299　2003/06
Terabit inch(-2) ferroelectric data storage using scanning nonlinear dielectric microscopy nanodomain engineering system Peer-reviewed

Y Cho, K Fujimoto, Y Hiranaga, Y Wagatsuma, A Onoe, K Terabe, K Kitamura

NANOTECHNOLOGY　14　(6)　637-642　2003/06

DOI： 10.1088/0957-4484/14/6/314 　

ISSN： 0957-4484
Three dimensional polarization direction measurement using scanning nonlinear dielectric microscopy with rotating electric field Peer-reviewed

H Odagawa, Y Cho

JOURNAL OF THE KOREAN PHYSICAL SOCIETY　42　S1169-S1173　2003/04

ISSN： 0374-4884
Tbit/inch² Ferroelectric Data Storage Based on Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Yasuo CHO, Yoshiomi HIRANAGA, Kenjiro FUJIMOTO, Atsushi ONOE, Kazuya TERABE, Kenji KITAMURA

Transactions of the Material Research Society of Japan, vol.28-1　28　109-112　2003/03

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Tbit/inch(2) data storage using scanning nonlinear dielectric microscopy Peer-reviewed

Y Cho, K Fujimoto, Y Hiranaga, Y Wagatsuma, A Onoe, K Terabe, K Kitamura

FERROELECTRICS　292　51-58　2003

DOI： 10.1080/00150190390222817 　

ISSN： 0015-0193
Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy Peer-reviewed

Y Cho, K Matsuura, N Valanoor, R Ramesh

FERROELECTRICS　292　171-180　2003

DOI： 10.1080/00150190390222961 　

ISSN： 0015-0193
Basic study on high-density ferroelectric data storage using scanning nonlinear dielectric microscopy

Y Hiranaga, K Fujimoto, Y Wagatsuma, Y Cho, A Onoe, K Terabe, K Kitamura

FERROELECTRIC THIN FILMS XI　748　261-266　2003

ISSN： 0272-9172
Measurement of three dimensional polarization direction in ferroelectric thin films using scanning nonlinear dielectric microscopy with rotating electric field

H Odagawa, Y Cho

FERROELECTRIC THIN FILMS XI　748　267-272　2003

ISSN： 0272-9172
Microscale to nanoscale ferroelectric domain and surface engineering of a near-stoichiometric LiNbO3 crystal Peer-reviewed

K Terabe, M Nakamura, S Takekawa, K Kitamura, S Higuchi, Y Gotoh, Y Cho

APPLIED PHYSICS LETTERS　82　(3)　433-435　2003/01

DOI： 10.1063/1.1538351 　

ISSN： 0003-6951
Tbit/inch(2) ferroelectric data storage based on scanning nonlinear dielectric microscopy Peer-reviewed

Y. Cho, K Fujimoto, Y Hiranaga, Y Wagatsuma, A Onoe, K Terabe, K Kitamura

APPLIED PHYSICS LETTERS　81　(23)　4401-4403　2002/12

DOI： 10.1063/1.1526916 　

ISSN： 0003-6951
Ferroelectric nano-domain engineering Invited Peer-reviewed

Yasuo Cho, Kazuya Terabe, Kenji Kitamura

Proceedings of International Symposium on Nano-Intelligent Materials/ System (ISNIMS)　29-34　2002/10
Tbit/inch2 ferroelectric data storage using SNDM nano domain engineering system Peer-reviewed

Yasuo Cho, Kenjiro Fujimoto, Yoshiomi Hiranaga, Yasuo Wagatsuma, Atsushi Onoe, Kazuya Terabe, Kenji Kitamura

Proceedings of Trend in Nanotechnology 2002 (TNT2002)　195-196　2002/09
Quantitative measurement of linear dielectric constant using scanning nonlinear dielectric microscopy with electro-conductive cantilever Peer-reviewed

K Ohara, Y Cho

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　41　(7B)　4961-4964　2002/07

DOI： 10.1143/JJAP.41.4961 　

ISSN： 0021-4922
High-density ferroelectric data storage using scanning nonlinear dielectric microscopy

HIRANAGA Yoshiomi, FUJIMOTO Kenjiro, WAGATSUMA Yasuo, CHO Yasuo, ONOE Atsushi, TERABE Kazuya, KITAMURA Kenji

ITE Technical Report　26　(38)　13-17　2002/06/14
Publisher: The Institute of Image Information and Television Engineers
DOI： 10.11485/itetr.26.38.0_13 　

ISSN： 1342-6893

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Scanning Nonlinear Dielectric Microscope (SNDM) is the method for observing ferroelectric polarization distribution, and now, its resolution has become to the sub-nanometer order. Up to now, we have studied high-density ferroelectric data storage using this microscope. In this study, we selected stoichiometric and congruent LiTaO_3 single crystals as ferroelectric recording media. At first, using stoichiometric LiTaO_3 (SLT), we studied polarization inversion characteristics in detail, and as a result, we achieved forming small inverted domain with the radius of 6 nm. And we also studied the retention of inverted domain. Next, using congruent LiTaO_3 (CLT), we achieved high-density data storage in excess of 1 Tbit/inch^2.
Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials Peer-reviewed

N Okazaki, H Odagawa, Y Cho, T Nagamura, D Komiyama, T Koida, H Minami, P Ahmet, T Fukumura, Y Matsumoto, M Kawasaki, T Chikyow, H Koinuma, T Hasegawa

APPLIED SURFACE SCIENCE　189　(3-4)　222-226　2002/04

DOI： 10.1016/S0169-4332(01)01013-3 　

ISSN： 0169-4332
Measuring ferroelectric polarization component parallel to the surface by scanning nonlinear dielectric microscopy Peer-reviewed

H Odagawa, Y Cho

APPLIED PHYSICS LETTERS　80　(12)　2159-2161　2002/03

DOI： 10.1063/1.1463707 　

ISSN： 0003-6951
Observation of ferroelectric nano-domains using scanning nonlinear dielectric imaging and piezoresponse imaging Peer-reviewed

K Matsuura, Y Cho

APPLIED SURFACE SCIENCE　188　(3-4)　421-424　2002/03

DOI： 10.1016/S0169-4332(01)00964-3 　

ISSN： 0169-4332
Development of scanning microwave microscope for high-throughput characterization of combinatorial dielectric thin film Peer-reviewed

N Okazaki, P Ahmet, T Chikyow, H Odagawa, Y. Cho, T Fukumura, M Kawasaki, M Ohtani, H Koinuma, T Hasegawa

COMBINATORIAL AND ARTIFICIAL INTELLIGENCE METHODS IN MATERIALS SCIENCE　700　119-124　2002

ISSN： 0272-9172
Scanning nonlinear dielectric microscopy - a high resolution tool for observing ferroelectric domains and nano-domain engineering Peer-reviewed

Y Cho

INTEGRATED FERROELECTRICS　50　189-198　2002

DOI： 10.1080/10584580290172224 　

ISSN： 1058-4587
Quantitative measurement of dielectric properties using scanning nonlinear dielectric microscopy with electro-conductive cantilever Peer-reviewed

Koya Ohara, Yasuo Cho

Integrated Ferroelectrics　50　209-217　2002

DOI： 10.1080/10584580215512 　

ISSN： 1058-4587 1607-8489
Nano-sized inverted domain formation in stoichiometric LiTaO3 single crystal using scanning nonlinear dielectric microscopy Peer-reviewed

Y Hiranaga, K Fujimoto, Y Cho, Y Wagatsuma, A Onoe, K Terabe, K Kitamura

INTEGRATED FERROELECTRICS　49　203-209　2002

DOI： 10.1080/10584580290171919 　

ISSN： 1058-4587
Study on surface layer formed on LiNbO3 single crystal using higher order nonlinear dielectric microscopy Peer-reviewed

Y Cho, K Ohara, H Odagawa

FERROELECTRICS　269　207-212　2002

DOI： 10.1080/00150190211132 　

ISSN： 0015-0193
Nanoscale measurement techniques of three-dimensional ferroelectric polarization using scanning nonlinear dielectric microscopy Peer-reviewed

H Odagawa, Y Cho

FERROELECTRICS　268　149-154　2002

DOI： 10.1080/00150190211092 　

ISSN： 0015-0193

eISSN： 1563-5112
Study on the periodically poled LiNbO3 for high performance QPM devices using scanning nonlinear dielectric microscopy Peer-reviewed

Y Cho, S Kazuta, H Itho

FERROELECTRICS　273　2601-2606　2002

DOI： 10.1080/00150190211768 　

ISSN： 0015-0193
超高分解能走査型非線形誘電率顕微鏡 Peer-reviewed

長康雄

応用物理　71　(1)　62-65　2002/01
Publisher:
DOI： 10.11470/oubutsu1932.71.62 　

ISSN： 0369-8009
Higher order nonlinear dielectric microscopy Peer-reviewed

Y Cho, K Ohara

FERROELECTRIC THIN FILMS X　688　329-334　2002

ISSN： 0272-9172
Scanning electron-beam dielectric microscopy for the temperature coefficient distribution of dielectric materials Invited Peer-reviewed

Y. Cho

COMBINATORIAL AND ARTIFICIAL INTELLIGENCE METHODS IN MATERIALS SCIENCE　700　103-112　2002

ISSN： 0272-9172
Tbit/inch(2) ferroelectric data storage using scanning nonlinear dielectric microscopy Peer-reviewed

Y Cho, K Fujimoto, Y Hiranaga, J Liu, Y Wagatuma, A Onoe, K Terabe, K Kitamura

PROCEEDINGS OF THE 2002 2ND IEEE CONFERENCE ON NANOTECHNOLOGY　255-259　2002

DOI： 10.1109/NANO.2002.1032241 　
Tbit/inch(2) ferroelectric data storage using scanning nonlinear dielectric microscopy Peer-reviewed

Y Cho, K Fujimoto, Y Hiranaga, J Liu, Y Wagatuma, A Onoe, K Terabe, K Kitamura

PROCEEDINGS OF THE 2002 2ND IEEE CONFERENCE ON NANOTECHNOLOGY　255-259　2002
Scanning nonlinear dielectric microscopy -a high resolution tool for observing ferroelectric domains and nano-domain engineering Peer-reviewed

Yasuo Cho

Integrated Ferroelectrics　50　189-198　2002
Publisher: Taylor and Francis Inc.
DOI： 10.1080/743817685 　

ISSN： 1607-8489 1058-4587
Higher-order nonlinear dielectric microscopy Peer-reviewed

Yasuo Cho, Koya Ohara

Applied Physics Letters　79　(23)　3842-3844　2001/12/03

DOI： 10.1063/1.1421645 　

ISSN： 0003-6951
Photoluminescence quenching by optical bias in AlGaAs/GaAs single quantum wells

Tomohiro Sakai, Takayuki Watanabe, Yasuo Cho, Kaori Matsuura, Hiroshi Funakubo

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers　40　(11)　6477-6480　2001/11

ISSN： 0021-4922
Scanning-nonlinear-dielectric-microscopy study on periodically poled LiNbO3 for a high-performance quasi-phase matching device Peer-reviewed

Yasuo Cho, Satoshi Kazuta, Hiromasa Ito

Applied Physics Letters　79　(18)　2955-2957　2001/10/29

DOI： 10.1063/1.1414299 　

ISSN： 0003-6951
Characterization of Ferroelectric Property of C-Axis- and Non-C-Axis-Oriented Epitaxially Grown Bi2Vo5.5 Thin Films Peer-reviewed

Tomohiro Sakai, Takayuki Watanabe, Yasuo Cho, Kaori Matsuura, Hiroshi Funakubo

Japanese Journal of Applied Physics　40　(11)　6481-6486　2001/08/07
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.40.6481 　

ISSN： 0021-4922

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Epitaxial Bi2VO5.5 films with $c$-axis- and non-$c$-axis-orientations were grown by metalorganic chemical vapor deposition. (001)-, (114)- and (102)-oriented Bi2VO5.5 films were epitaxialy grown on (100), (110) and (111)SrTiO3 substrates, respectively. Electrical properties of the (001)- and (114)-oriented films on $(100)\text{SrRuO}_{3}\parallel (100)\text{SrTiO}_{3}$ and $(110)\text{SrRuO}_{3}\parallel (110)\text{SrTiO}_{3}$ substrates were compared. The dielectric constant ($\varepsilon_{\text{r } }$) of the (001)-oriented film was smaller than that of the (114)-oriented one, suggesting that $\varepsilon_{\text{r } }$ along the $c$-axis is smaller than that along other axes. Leakage current density of the (001)-oriented film was smaller than that of the (114)-oriented one. These results were in good agreement with those of the crystallographically equivalent oriented films of SrBi2Ta2O9 and Bi4Ti3O12. Ferroelectricity and domain structure were observed for both films by Polarization-Electric field measurements and scanning nonlinear dielectric microscopy, respectively. However, the large difference of remanent polarization depending on the film orientation observed for SrBi2Ta2O9 and Bi4Ti3O12 films was not observed for Bi2VO5.5 films.
Fundamental Study of Surface Layer on Ferroelectrics by Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Koya Ohara, Yasuo Cho

Japanese Journal of Applied Physics　40　(9B)　5833-5836　2001/07/06
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.40.5833 　

ISSN： 0021-4922

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Distribution and growth of very thin surface layers on ferroelectric materials are investigated by scanning nonlinear dielectric microscopy. This microscopy technique involves the measurement of higher order nonlinear dielectric constants, with depth resolution down to one unit cell order. By changing the order of nonlinearity of the dielectric response, we obtain information about the surface layer on lead zirconate titanate (PZT) thin film and also observe the growth process of a surface paraelectric layer on LiNbO₃ single crystal.
Fundamental studies on ferroelectric recording using nonlinear dielectric microscopy

CHO Yasuo, MATSUURA Kaori, KAZUTA Satoshi, KITAMURA Kenji

ITE Technical Report　25　(36)　49-56　2001/06/07
Publisher: The Institute of Image Information and Television Engineers
DOI： 10.11485/itetr.25.36.0_49 　

ISSN： 1342-6893

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Scanning Nonlinear Dielectric Microscopy(SNDM)is the first successful purely electrical method for observing ferroelectric domains. Now its resolution has become to the sub-nanometer order. In this paper fundamental study on applying SNDM system to the ferroelectric reading and writing sistem is performed. At first, to check the performance of the SNDM system as a ferroelectric recording system, we conduct a fundamental study on the writing of domain inversion dot in PZT thin film and succeed have a very small domain dots with the size of 25nm. Next, we form small inverted domain dots in stoichiometric LiTaO_3 single crystal for the purpose of a basic investigation of domain dynamics in a very small area. The relationship between the voltage for domain reversal and the inverted area and the relationship between the inverted domain area and the voltage application time are obtained.
Higher order nonlinear dielectric imaging using scanning nonlinear dielectric microscopy Peer-reviewed

Y Cho, K Ohara

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　40　(6B)　4349-4353　2001/06

DOI： 10.1143/JJAP.40.4349 　

ISSN： 0021-4922
Fundamental study on nano domain engineering using scanning nonlinear dielectric microscopy Peer-reviewed

K Matsuura, Y. Cho, H Odagawa

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　40　(6B)　4354-4356　2001/06

DOI： 10.1143/JJAP.40.4354 　

ISSN： 0021-4922
Measurement of the ferroelectric domain distributions using nonlinear dielectric response and piezoelectric response Peer-reviewed

K Matsuura, Y. Cho, H Odagawa

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　40　(5B)　3534-3537　2001/05

DOI： 10.1143/JJAP.40.3534 　

ISSN： 0021-4922
New functions of scanning nonlinear dielectric microscopy - Higher-order measurement and vertical resolution Peer-reviewed

Y. Cho, K Ohara, A Koike, H Odagawa

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　40　(5B)　3544-3548　2001/05

DOI： 10.1143/JJAP.40.3544 　

ISSN： 0021-4922
Single crystal growth of KNbO3 and application to surface acoustic wave devices Peer-reviewed

K Yamanouchi, Y Wagatsuma, H Odagawa, Y Cho

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY　21　(15)　2791-2795　2001

ISSN： 0955-2219

eISSN： 1873-619X
Simultaneous observation of ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy Peer-reviewed

H Odagawa, Y Cho

PROCEEDINGS OF THE 2001 12TH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, VOLS I AND II　987-990　2001
Theoretical analysis of SAW propagation characteristics under the strained medium and applications for high temperature stable high coupling SAW substrates Peer-reviewed

K Yamanouchi, K Kotani, H Odagawa, Y Cho

PROCEEDINGS OF THE 2001 12TH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, VOLS I AND II　471-474　2001
Higher order nonlinear dielectric imaging Peer-reviewed

Y. Cho, K Ohara

INTEGRATED FERROELECTRICS　38　(1-4)　657-666　2001

DOI： 10.1080/10584580108016913 　

ISSN： 1058-4587
Small inverted domain formation in stoichiometric LiTaO3 single crystal using scanning nonlinear dielectric microscopy Peer-reviewed

S Kazuta, Y Cho, H Odagawa, K Kitamura

INTEGRATED FERROELECTRICS　38　(1-4)　693-701　2001

DOI： 10.1080/10584580108016917 　

ISSN： 1058-4587
Observation of artificial nano-domains in ferroelectric thin films using nonlinear dielectric imaging and piezo imaging Peer-reviewed

K Matsuura, Y Cho

INTEGRATED FERROELECTRICS　38　(1-4)　703-711　2001

DOI： 10.1080/10584580108016918 　

ISSN： 1058-4587
NANOMATER SCALE DOMAIN MEASUREMENT ON FERROELECTRIC THIN FILMS USING SCANNING NONLINEAR DIELECTRIC MICROSCOPY Peer-reviewed

H.Odagawa, K. Matsuura, Y.Cho

Material Research Society Symposium Proceedings　655　CC7.4.1-CC7.4.6　2001
Image production mechanism for scanning nonlinear dielectric microscopy with super high resolution and its application to quantitative evaluation of linear and nonlinear dielectric properties of ferroelectric materials Peer-reviewed

Y Cho, K Ohara, S Kazuta, H Odagawa

INTEGRATED FERROELECTRICS　32　(1-4)　825-834　2001

ISSN： 1058-4587
Observation of nano-size ferroelectric domains and crystal polarity using scanning nonlinear dielectric microscopy Peer-reviewed

H Odagawa, Y Cho, S Kazuta

INTEGRATED FERROELECTRICS　32　(1-4)　917-926　2001

ISSN： 1058-4587
Simultaneous observation of nanometer size ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy Peer-reviewed

H Odagawa, Y Cho

FERROELECTRICS　251　(1-4)　29-36　2001

ISSN： 0015-0193
Scanning nonlinear dielectric microscopy for investigation of nano-sized ferroelectric domains and local crystal anisotropy Peer-reviewed

Y Cho

FERROELECTRICS　253　(1-4)　691-700　2001

ISSN： 0015-0193
Scanning electron-beam dielectric microscopy for the temperature coefficient distribution of dielectric ceramics Peer-reviewed

Y Cho, O Jintsugawa, A Satoh, H Odagawa, K Yamanouchi

ANALYTICAL SCIENCES　17　S63-S66　2001

DOI： 10.14891/analscisp.17icpp.0.s63.0 　

ISSN： 0910-6340
Scanning nonlinear dielectric microscopy with nanometer resolution Peer-reviewed

Y Cho, S Kazuta, K Matsuura, H Odagawa

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY　21　(10-11)　2131-2134　2001

DOI： 10.1016/S0955-2219(01)00187-X 　

ISSN： 0955-2219
Theory of scanning nonlinear dielectric microscopy and application to quantitative evaluation Peer-reviewed

Y Cho, K Ohara, S Kazuta, H Odagawa

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY　21　(10-11)　2135-2139　2001

DOI： 10.1016/S0955-2219(01)00188-1 　

ISSN： 0955-2219
Determination of crystal polarities of piezoelectric thin film using scanning nonlinear dielectric microscopy Peer-reviewed

S Kazuta, Y. Cho, H Odagawa

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY　21　(10-11)　1581-1584　2001

DOI： 10.1016/S0955-2219(01)00069-3 　

ISSN： 0955-2219
Microscopic observation of the temperature coefficient distribution of microwave materials using scanning electron-beam dielectric microscopy Peer-reviewed

Y Cho, A Satoh, H Odagawa

JOURNAL OF THE EUROPEAN CERAMIC SOCIETY　21　(15)　2735-2738　2001

DOI： 10.1016/S0955-2219(01)00354-5 　

ISSN： 0955-2219
Nano domain engineering using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Y. Cho, K Matsuura, S Kazuta, H Odagawa, K Terabe, K Kitamura

PROCEEDINGS OF THE 2001 1ST IEEE CONFERENCE ON NANOTECHNOLOGY　352-357　2001

DOI： 10.1109/NANO.2001.966447 　
Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy Peer-reviewed

H Odagawa, Y Cho

SURFACE SCIENCE　463　(1)　L621-L625　2000/08

DOI： 10.1016/S0039-6028(00)00636-1 　

ISSN： 0039-6028
SCANNING NONLINEAR DIELECTRIC MICROSCOPY WITH NANOMETER RESOLUTION Peer-reviewed

Y. Cho, S. Kazuta, K. Matsuura

Proceedings of the 2000 12th IEEE International Symposium on the Applications of Ferroelectrics　279-282　2000/08
DETERMINATION OF CRYSTAL POLARITIES OF PIEZOELECTRIC THIN FILMS USING SCANNING NONLINEAR DIELECTRIC MICROSCOPY Peer-reviewed

S. Kazuta, Y. Cho, H. Odagawa

Proceedings of the 200012th IEEE International Symposium on the Applications of Ferroelectrics　983-986　2000/08
Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy Invited Peer-reviewed

H Odagawa, Y Cho

SURFACE SCIENCE　463　(1)　L621-L625　2000/08

ISSN： 0039-6028
A THEORY FOR THE IMAGE PRODUCTION MECHANISM OF SCANNING NONLINEAR DIELECTRIC MICROSCOPY AND ITS APPLICATION TO THE QUANTITATIVE EVALUATION OF LINEAR AND NONLINEAR DIELECTRIC PROPERTIES OF FERROELECTRIC AND PIEZOELECTRIC MATERIALS Peer-reviewed

Y. Cho, K. Ohara, S. Kazuta, H. Odagawa

Proceedings of the 2000 12th IEEE International Symposium on the Applications of Ferroelectrics　991-993　2000/08
Theoretical and Experimental Study on Nanoscale Ferroelectric Domain Measurement Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Hiroyuki Odagawa, Yasuo Cho

Japanese Journal of Applied Physics　39　(9B)　5719-5722　2000/06/07
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.39.5719 　

ISSN： 0021-4922

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We describe theoretical and experimental studies for nano-scale ferroelectric domain measurements using scanning nonlinear dielectric microscopy (SNDM). We calculate one-dimensional images of a 180^º c-c domain boundary and show that SNDM has an atomic-scale resolution theoretically. Experimental results show that we measure the c-c domain on the lead zirconate titanate (PZT) thin film with the width of 1.5 nm and that the resolution of the microscope is less than 0.5 nm.
Scanning electron-beam dielectric microscopy for the investigation of the temperature coefficient distribution of dielectric ceramics Peer-reviewed

Y Cho, O Jintsugawa, K Yamanouchi

JOURNAL OF THE AMERICAN CERAMIC SOCIETY　83　(5)　1299-1301　2000/05

ISSN： 0002-7820
Simultaneous Observation of Ferroelectric Domain Patterns by ScanningNonlinear Dielectric Microscope and Surface Morphology by Atomic Force Microscope Peer-reviewed

Hiroyuki Odagawa, Yasuo Cho, Hiroshi Funakubo, Kuniharu Nagashima

Japanese Journal of Applied Physics　39　(6B)　3808-3810　2000/03/16

DOI： 10.1143/JJAP.39.3808 　
Determination of Electrostrictive and Third-Order Dielectric Constants of Piezoelectric Ceramics Peer-reviewed

Yasuo Cho

Japanese Journal of Applied Physics　39　(6A)　3524-3527　2000/03/06
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.39.3524 　

ISSN： 0021-4922

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In this study, all six electrostrictive constants and all two third-order dielectric constants of lead zirconate titanate (PZT) ceramic are measured. To measure electrostrictive constants, new dynamic measuring methods to obtain capacitance variation with alternating stress and alternating electric field were used. These new methods enable us to obtain the electrostrictive constants and the third-order dielectric constants in the state of fixed polarization without an aging effect. These measured constants, defined in the d-form basic piezoelectric equation in which the electric field and stress are chosen to be independent field variables, are transformed into the constants defined in the g-form where electric displacement and stress are independent field variables for the reader's convenience.
Theoretical Analysis of Surface Acoustic Wave Propagation Characteristics under Strained Media and Application for High Temperature Stable High Coupling Acoustic Wave Substrates Peer-reviewed

Kazuhiko Yamanouchi, Kenji Kotani, Hiroyuki Odagawa, Yasuo Cho

Japanese Journal of Applied Physics　39　(5B)　3032-3035　2000/02/10
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.39.3032 　

ISSN： 0021-4922

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Among the important properties required for surface acoustic waves (SAW) substrates are a large electromechanical coupling coefficient ($k^{2}$), small temperature coefficient of frequency (TCF) and low propagation loss. The LiNbO3 and LiTaO3 have good properties as the SAW substrates with a large size. Unfortunately, these possess the defect of having large values of TCF@. In this paper, SAW-bonded composite substrates with a large $k^{2}$, small TCF, low propagation loss and no dispersion using conventional bonders are investigated theoretically and experimentally. The propagation characteristics of SAWs under strained piezoelectric crystals using the higher-order elasticity theory have been analyzed. The theoretical results show zero TCF on LiNbO3/SiO2 substrates. The experimental results for LiNbO3/glass substrates revealed a TCF of [${-}19$ ppm/°C]. The propagation properties were almost the same as those of the single crystal.
Determination of the Polarities of ZnO Thin Films on Polar and Nonpolar Substrates Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Satoshi Kazuta, Yasuo Cho, Hiroyuki Odagawa, Michio Kadota

Japanese Journal of Applied Physics　39　(5B)　3121-3124　2000/02/03

DOI： 10.1143/JJAP.39.3121 　
Quantitative Measurement of Linear and Nonlinear Dielectric Characteristic Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

Yasuo Cho, Satoshi Kazuta, Koya Ohara, Hiroyuki Odagawa

Japanese Journal of Applied Physics　39　(5B)　3086-3089　2000/01/20

DOI： 10.1143/JJAP.39.3086 　
Quantitative study on the nonlinear piezoelectric effect in KNbO3 single crystals for a highly efficient surface acoustic wave elastic convolver Peer-reviewed

Yasuo Cho, Noriyuki Oota, Hiroyuki Odagawa, Kazuhiko Yamanouchi

Journal of Applied Physics　87　(7)　3457-3461　2000
Publisher: American Institute of Physics Inc.
DOI： 10.1063/1.372366 　

ISSN： 0021-8979
Scanning nonlinear dielectric microscopy with nanometer resolution Peer-reviewed

Yasuo Cho, Satoshi Kazuta, Kaori Matsuura

Applied Physics Letters　75　(18)　2833-2835　1999/11/01
Publisher: American Institute of Physics Inc.
DOI： 10.1063/1.125165 　

ISSN： 0003-6951
Scanning Nonlinear Dielectric Microscopy with Contact Sensing Mechanism for Observation of Nano-Meter Sized Ferroelectric Domains Peer-reviewed

Yasuo Cho, Satoshi Kazuta, Kaori Matsuura

Japanese Journal of Applied Physics　38　(9B)　5689-5694　1999/07
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.38.5689 　

ISSN： 0021-4922

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A new scanning nonlinear dielectric microscope with very highresolution for the observation of ferroelectric polarization was developed.This microscope has a newly developed contact sensing mechanism fordetecting the exact contact point of a probe needle with respect to thesurface of a specimen.This contact sensing mechanism enables us to use a probe needle with a verythin pointed end.Using the new microscope, domains in BaTiO3 single crystal and inPbTiO3 thin film were observed.By measuring the c-c domain wall of BaTiO3, the microscope wasconfirmed to have nanometer-order resolution.
Determination of the temperature coefficient distribution of dielectric ceramics using scanning photothermal dielectric microscopy Peer-reviewed

Y Cho, T Kasahara

JOURNAL OF THE AMERICAN CERAMIC SOCIETY　82　(7)　1720-1724　1999/07

ISSN： 0002-7820
Observation of Ferroelectric Polarization in KN60₃ Thin Films and Surface Acoustic Wave Properties Peer-reviewed

Hiroyuki Odagawa, Kenji Kotani, Yasuo Cho, Kazuhiko Yamanouchi

Japanese Journal of Applied Physics　38　(5B)　3275-3278　1999/02
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.38.3275 　

ISSN： 0021-4922

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In this paper, the properties of KNbO3 films, which are deposited on SrTiO3 (STO) substrate using the metal organic chemical vapor deposition (MOCVD) method, are investigated for surface acoustic wave (SAW) applications. As-grown KNbO3 films on STO substrates are sufficiently piezoelectric. The experimental results show an electromechanical coupling coefficient (k2) of 0.021 at the center frequency of 960 MHz and λ/h=0.24 (λ: SAW wavelength, h: KNbO3 film thickness). These values show fairly good agreement with theoretical ones calculated by using the piezoelectric constants of single crystals. The ferroelectric polarization distribution of KNbO3 films is also measured using a scanning nonlinear dielectric microscope. The result shows that the polarizations of the as-grown film are in the same positive direction along the surface normal.
Observation of Ultrathin Single-Domain Layers Formed on LiTaO₃ and LiNbO₃ Surfaces Using Scanning Nonlinear Dielectric Microscope with Submicron Resolutin Peer-reviewed

Yasuo Cho, Kaori Matsuura, Satoshi Kazuta, Hiroyuki Odagawa, Kazuhiko Yamanouchi

Japanese Journal of Applied Physics　38　(5B)　3279-3282　1999/02
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.38.3279 　

ISSN： 0021-4922

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The formation of very thin domain layers on the surface of multidomain lithium tantalate by heat treatment is observed by scanning nonlinear dielectric microscopy. A similar phenomenon of forming a very thin single-domain layer was also observed on the surface of periodically polarized lithium niobate single crystal. By measuring the thickness of the single-domain layers, the depth sensitivity of the scanning nonlinear dielectric microscope with submicron resolution was estimated.
Theoretical analysis of SAW propagation characteristics under the strained medium and applications for high temperature stable high coupling SAW substrates Peer-reviewed

K Yamanouchi, K Kotani, H Odagawa, Y Cho

1999 IEEE ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1 AND 2　239-242　1999

ISSN： 1051-0117
Scanning nonlinear dielectric microscope for investigation of ferroelectric domains Peer-reviewed

Y Cho, K Yamanouchi

FERROELECTRICS　222　(1-4)　189-196　1999

ISSN： 0015-0193
Temperature coefficient image of dielectric materials using scanning photothermal dielectric microscope Peer-reviewed

Y Cho, K Yamanouchi

FERROELECTRICS　223　(1-4)　337-+　1999

ISSN： 0015-0193
Measurement of Surface Impedance of Bi(Pb)-Sr-Ca-Cu-O Film under a DC Magnetic Field Peer-reviewed

Haruichi Kanaya, Yoshihiro Sakimoto, Yasuo Cho, Ikuo Awai

Japanese Journal of Applied Physics　37　(2)　500-501　1998/11
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.37.500 　

ISSN： 0021-4922

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The temperature and DC magnetic field dependence of surface impedance (Z_s) of high temperature superconducting Bi(Pb)-Sr-Ca-Cu-O (BPSCCO) films on MgO substrate were measured at microwave frequency. At a low temperature, surface resistance (R_s) increases rapidly in the low DC magnetic field range and gradually in the high-field range. However, the surface reactance (X_s) also increases rapidly in low fields but hardly changes in high fields. At high temperature, R_s shows only a monotonic increase vs the field but X_s hardly changes.
New Piezoelectric KNbO3 Films for Saw Applications Peer-reviewed

K.Yamanouchi, H. Odagawa, T.Kojima, Y.Cho

Proceedings of the Eleventh IEEE International Symposium on Application of Ferroelectrics　385-388　1998/08
Scanning Nonliear Dielectric Microscope with Submicron Resolution Peer-reviewed

Yasuo Cho, Kaori Matsuura, K. Yamanouchi

Proceedings of the Eleventh IEEE International Symposium on Application of Ferroelectrics　435-438　1998/08
Fundamental Studies on Scanning Electron-Beam Dielectric Microscopy Peer-reviewed

Yasuo Cho, Kazuhiko Yamanouchi

Japanese Journal of Applied Physics　37　(9B)　5349-5352　1998/06
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.37.5349 　

ISSN： 0021-4922

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Fundamental studies on scanning electron-beam dielectric microscopy are elucidated. This microscopy is used for determining the temperature coefficient distribution of dielectric materials using an electron-beam as a heat source instead of a light source of a photothermal dielectric microscope. This microscopy, with the abilities of in situ observations of SEM images and material compositions, has an intrinsic resolution better than that of photothermal dielectric microscopy. To demonstrate the usefulness of this technique, the two-dimensional image of a two-phase composite ceramic composed of TiO₂ and Bi₂Ti₄O₁₁ is measured.
Scanning Nonlinear Dielectric Microscope for Investigation of Ferroelectric Domains Invited Peer-reviewed

Yasuo Cho, Kazuhiko Yamanouchi

Proceedings of the Fifth International Symposium on Ferroic Domains and Mesoscopic Structures　447-454　1998/04
Scanning Nonlinear Dielectric Microscope Peer-reviewed

Yasuo Cho

応用物理　67　(3)　327-331　1998/03

DOI： 10.11470/oubutsu1932.67.327 　
"Scanning Nonlinear Dieletric Microscope with Submicron Resolution" Peer-reviewed

Yasuo Cho, Kaori Matsuura, Jun-ichi Kushibiki

Japanese Journal of Applied Physics　37　(5B)　3132-3133　1998/02
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.37.3132 　

ISSN： 0021-4922

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A new probe using a tungsten needle for the scanning nonlinear dielectric microscope has been developed. This probe has a submicron resolution. This probe combined with a submicron stage is used to observe the distribution of domains in a lithium tantalate substrate with a proton exchanged inversion layer and also in polarized and depolarized lead zirconate titanate ceramics.
"A Surface Acoustic Wave Elastic Convolver using a KNbO₃ Single Crystal Substrate" Peer-reviewed

Kazuhiko Yamanouchi, Hiroyuki Odagawa, Kenyuu Morozumi, Yasuo Cho

Japanese Journal of Applied Physics　37　(5B)　2933-2935　1998/02
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.37.2933 　

ISSN： 0021-4922

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Elastic convolvers are very important in signal processing devices of spread spectrum communication (SSC) systems. Highly efficient convolvers are required in the application of the spread spectrum and next stage communication systems. A high value of the coupling coefficient is very important for wideband and high efficiency surface acoustic wave (SAW) devices, such as SAW convolvers. Potassium niobate (KNbO₃) has large piezoelectric constants and a very large electromechanical coupling coefficient (K²) of 0.53 for surface acoustic waves, which is about 10 times higher than that of LiNbO₃. Therefore, highly efficient elastic SAW convolvers using KNbO₃ substrates are expected in the future. In this paper, the use of the rotated 60^° Y-cut, X-propagating KNbO₃ substrates in convolvers is demonstrated. The experimental results show that the efficiency of the convolver using 60^° Y-X KNbO₃ is 15 dB higher than that of the convolver using Y-Z LiNbO₃.
New piezoelectric KNbO3 films for SAW device applications Peer-reviewed

K Yamanouchi, H Odagawa, T Kojima, Y Cho

1998 IEEE ULTRASONICS SYMPOSIUM - PROCEEDINGS, VOLS 1 AND 2　203-206　1998

ISSN： 1051-0117
Quantitative study on the nonlinear piezoelectric effect of KNbO3 single crystal for super highly efficient SAW elastic convolver Peer-reviewed

Y Cho, N Oota, K Morozumi, H Odagawa, K Yamanouchi

1998 IEEE ULTRASONICS SYMPOSIUM - PROCEEDINGS, VOLS 1 AND 2　289-292　1998

ISSN： 1051-0117
Microwave characteristics of YBaCuO coplanar waveguide resonators fabricated by the sol-gel process on polycrystalline MgO Peer-reviewed

H Kanaya, T Kaneyuki, H Senoh, Y Cho, Awai, I

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　36　(10)　6311-6315　1997/10

DOI： 10.1143/JJAP.36.6311 　

ISSN： 0021-4922
Temperature Coefficient Image of Dielectvic Material Peer-reviewed

Yasuo Cho, Teruaki Kasahara

Japanese Journal of Applied Physics　36　(9B)　6001-6003　1997/07
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.36.6001 　

ISSN： 0021-4922

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Two dimensional images of the distribution of the relative values of the temperature coefficient of the dielectric constant of a two phase composite ceramic composed of TiO2 and Bi2Ti4O11 are observed using a photothermal dielectric microscope. The images clearly show that each grain of TiO2 has a negative temperature coefficient and each of Bi2Ti4O11 a positive one, and that the macroscopic averaged temperature coefficient of the ceramic is relatively small due to the cancellation of the coefficients with opposite signs.
Observation of Photothermal Dielectric Signal for Powder Peer-reviewed

Yasuo Cho, Tomoyuki Kumamaru, Teruaki Kasahara

JAPANESE JOURNAL OF APPLIED PHYSICS　36　(5B)　3303-3304　1997/03
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.36.3303 　

ISSN： 0021-4922

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A new photothermal dielectric (PTD) technique for measuring the thermal characteristics of powder is proposed. Using this technique, the PTD signal from a PZT powder is measured. The data shows that the average grain size of the powder can be estimated by using this PTD technique.
Scanning Nonlinear Dielectric Microscope Using a Lumped Constant Resonator Probe and Its Application to Investigation of Ferroelectric Polarization Distributions Peer-reviewed

Yasuo Cho, Shigeyuki Atsumi, Kiyoshi Nakamura

Japanese Journal of Applied Physics　36　(5B)　3152-3156　1997/02
Publisher: The Japan Society of Applied Physics
DOI： 10.1143/JJAP.36.3152 　

ISSN： 0021-4922

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A new probe using a lumped constant resonator for the scanning nonlinear dielectric microscope has been developed. This probe has sufficient resolution to observe the area distribution of ferroelectric polarization. Using this probe, the distributions of the domains in the thin film of a copolymer of vinylidene fluoride and trifluoroethylene and in a lithium niobate substrate with a titanium-diffused inversion layer are observed.
Microwave measurement of coplanar-type resonator fabricated with YBCO film Peer-reviewed

Haruichi Kanaya, Tomohiko Kaneyuki, Hidehiro Senoh, Yasuo Cho, Ikuo Awai

Applied Superconductivity　5　(1-6)　193-199　1997
Publisher: Elsevier Ltd
DOI： 10.1016/S0964-1807(98)00025-8 　

ISSN： 0964-1807
Observation of ferroelectric polarization in the noncontact mode of a scanning nonlinear dielectric microscope Peer-reviewed

Y. Cho, A Kirihara, T Saeki

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　36　(1A)　360-363　1997/01

DOI： 10.1143/JJAP.36.360 　

ISSN： 0021-4922
High efficiency elastic convolver using KNbO3 substrate Peer-reviewed

K Yamanouchi, H Odagawa, K Morozumi, Y Cho

1997 IEEE ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1 & 2　335-338　1997
New photothermal technique using photothermal dielectric effect Peer-reviewed

Y. Cho, T Kumamaru

PROGRESS IN NATURAL SCIENCE　6　S647-S652　1996/12

ISSN： 1002-0071
Photothermal dielectric effect with liquid Peer-reviewed

Y Cho, T Kumamaru

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　35　(5B)　2907-2911　1996/05

DOI： 10.1143/JJAP.35.2907 　

ISSN： 0021-4922
New photothermal technique using photothermal dielectric effect Peer-reviewed

Y Cho, T Kumamaru

9TH INTERNATIONAL CONFERENCE ON PHOTOACOUSTIC AND PHOTOTHERMAL PHENOMENA, CONFERENCE DIGEST　6　544-545　1996
Photothermal dielectric spectroscopic microscope Peer-reviewed

Y Cho, T Kumamaru

REVIEW OF SCIENTIFIC INSTRUMENTS　67　(1)　19-28　1996/01

DOI： 10.1063/1.1146544 　

ISSN： 0034-6748
Scanning nonlinear dielectric microscope Peer-reviewed

Yasuo Cho, Akio Kirihara, Takahiro Saeki

Review of Scientific Instruments　67　(6)　2297-2303　1996
Publisher: American Institute of Physics Inc.
DOI： 10.1063/1.1146936 　

ISSN： 0034-6748
Scanning nonlinear dielectric microscope for investigation of polarization distributions Peer-reviewed

Y Cho, A Kirihara

ISAF '96 - PROCEEDINGS OF THE TENTH IEEE INTERNATIONAL SYMPOSIUM ON APPLICATIONS OF FERROELECTRICS, VOLS 1 AND 2　1　355-358　1996
非線形誘電率分布測定用顕微鏡 Peer-reviewed

長康雄, 桐原昭雄, 佐伯考央

電子情報通信学会論文誌C　78C-1　(11)　593-598　1995/11
微細加工プロセス技術とGHz帯弾性表面波変換器 Peer-reviewed

目黒敏靖, 長康雄, 山之内和彦

日本音響学会誌　51　(10)　769-773　1995/10
Publisher: The Acoustical Society of Japan (ASJ)
DOI： 10.20697/jasj.51.10_769 　

ISSN： 0369-4232
THEORETICAL AND EXPERIMENTAL STUDIES OF PHOTOTHERMAL DIELECTRIC SPECTROSCOPIC MICROSCOPE Peer-reviewed

Y CHO, T KUMAMARU

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　34　(5B)　2895-2899　1995/05

DOI： 10.1143/JJAP.34.2895 　

ISSN： 0021-4922
DYNAMIC MEASUREMENT OF CAPACITANCE VARIATION OF PIEZOELECTRIC CERAMICS WITH STRESS Peer-reviewed

Y. Cho, Y MANDAI

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　34　(3)　1591-1594　1995/03

DOI： 10.1143/JJAP.34.1591 　

ISSN： 0021-4922
Development of nonlinear dielectric microscope and its application to measurement of ferroelectric polarization Invited Peer-reviewed

Y Cho, A Kirihara, T Saeki

1995 IEEE ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1 AND 2　529-534　1995

ISSN： 1051-0117
CONTROL OF NONLINEAR PIEZOELECTRICITY AND ITS APPLICATION TO EFFICIENCY IMPROVEMENT OF SURFACE-ACOUSTIC-WAVE ELASTIC CONVOLVER Peer-reviewed

Y CHO, S HAITSUKA, M KADOTA

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　33　(5B)　3031-3034　1994/05

DOI： 10.1143/JJAP.33.3031 　

ISSN： 0021-4922
20DB EFFICIENCY INCREMENT OF SURFACE-ACOUSTIC-WAVE ELASTIC CONVOLVER USING ACTIVELY CONTROLLED NONLINEAR PIEZOELECTRIC EFFECT Peer-reviewed

Y CHO, S HAITSUKA, M KADOTA

1994 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3　1217-1220　1994

ISSN： 0149-645X
ACTIVE CONTROL OF NONLINEAR PIEZOELECTRIC EFFECT AND ITS APPLICATION TO 20-DB EFFICIENCY IMPROVEMENT OF SAW ELASTIC CONVOLVER Peer-reviewed

Y. Cho, S HAITSUKA, M KADOTA

1994 IEEE ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1-3　109-113　1994

ISSN： 1051-0117
EXPERIMENTAL DEMONSTRATION OF THE REDUCTION OF THE NUMBER OF INDEPENDENT ELECTROSTRICTIVE CONSTANTS OF PIEZOELECTRIC CERAMICS Peer-reviewed

Y CHO, Y MANDAI

1994 IEEE ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1-3　959-963　1994

ISSN： 1051-0117
SURFACE-ACOUSTIC-WAVE SOLITON PROPAGATING ON THE METALLIC GRATING WAVE-GUIDE Peer-reviewed

Y CHO, N MIYAGAWA

APPLIED PHYSICS LETTERS　63　(9)　1188-1190　1993/08

ISSN： 0003-6951
DYNAMIC METHOD FOR MEASURING THE VELOCITY VARIATION OF ULTRASOUND IN PIEZOELECTRIC CERAMICS WITH STRESS Peer-reviewed

Y CHO, F MATSUNO

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS　32　(8A)　L1092-L1094　1993/08

ISSN： 0021-4922
EFFICIENCY ENLARGEMENT OF SURFACE-ACOUSTIC-WAVE ELASTIC CONVOLVER BY EMPHASIZING NONLINEAR PIEZOELECTRIC EFFECT Peer-reviewed

Y CHO, S HAITSUKA, M KADOTA

ELECTRONICS LETTERS　29　(12)　1117-1119　1993/06

DOI： 10.1049/el:19930745 　

ISSN： 0013-5194
DYNAMIC METHOD FOR MEASURING THE VELOCITY VARIATION OF ULTRASOUND IN PIEZOELECTRIC CERAMICS WITH AN ALTERNATING ELECTRIC-FIELD Peer-reviewed

Y CHO, F MATSUNO

REVIEW OF SCIENTIFIC INSTRUMENTS　64　(5)　1244-1247　1993/05

DOI： 10.1063/1.1144124 　

ISSN： 0034-6748
NONLINEAR EQUIVALENT-CIRCUIT MODEL ANALYSIS OF ACOUSTIC DEVICES AND PROPAGATION OF SURFACE-ACOUSTIC-WAVE Peer-reviewed

Y CHO, J WAKITA, N MIYAGAWA

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　32　(5B)　2261-2264　1993/05

ISSN： 0021-4922
INFLUENCE OF RARE-EARTH IONS ON BAO-TIO2-RARE EARTH OXIDE CERAMICS FOR MICROWAVE APPLICATIONS Peer-reviewed

K FUKUDA, FUJII, I, R KITOH, Y CHO, AWAI, I

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　32　(4)　1712-1715　1993/04

DOI： 10.1143/JJAP.32.1712 　

ISSN： 0021-4922
弾性波素子の非線形等価回路 Peer-reviewed

長康雄, 脇田淳司

電子情報通信学会論文誌A　J76-A　(2)　108-117　1993/02
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5707
PZTセラミックスの非線形定数の動的測定 Peer-reviewed

長康雄, 松野文彦

電子情報通信学会論文誌A　J76-A　(2)　153-160　1993/02
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5707
Relations between the constants of electrostrictive materials and some examples of their application to piezoelectric ceramics Peer-reviewed

Yasuo Cho, Fumihiko Matsuno

Electronics and Communications in Japan (Part III: Fundamental Electronic Science)　76　(1)　20-30　1993

DOI： 10.1002/ecjc.4430760103 　

ISSN： 1520-6440 1042-0967
Nonlinear equivalent circuits of acoustic devices Peer-reviewed

Yasuo Cho, Junji Wakita

Electronics and Communications in Japan (Part III: Fundamental Electronic Science)　76　(10)　12-23　1993

DOI： 10.1002/ecjc.4430761002 　

ISSN： 1520-6440 1042-0967
Dynamic measurement of nonlinear constants of PZT ceramics Peer-reviewed

Yasuo Cho, Fumihiko Matsuno

Electronics and Communications in Japan (Part III: Fundamental Electronic Science)　76　(7)　90-99　1993

DOI： 10.1002/ecjc.4430760708 　

ISSN： 1520-6440 1042-0967
SURFACE-ACOUSTIC-WAVE SOLITON PROPAGATING ON THE METALLIC GRATING WAVE-GUIDE Peer-reviewed

Y CHO, N MIYAGAWA

IEEE 1993 ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1 AND 2　63　(9)　853-858　1993

DOI： 10.1063/1.109766 　

ISSN： 1051-0117
NONLINEAR EQUIVALENT-CIRCUITS OF ACOUSTIC DEVICES Peer-reviewed

Y CHO, J WAKITA

IEEE 1993 ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1 AND 2　867-872　1993

ISSN： 1051-0117
SURFACE-ACOUSTIC-WAVE SOLITON PROPAGATING ON THE METALLIC GRATING WAVE-GUIDE Peer-reviewed

Y CHO, N MIYAGAWA

IEEE 1993 ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1 AND 2　853-858　1993

ISSN： 1051-0117
DYNAMIC MEASURING METHOD OF CAPACITANCE VARIATION OF PIEZOELECTRIC CERAMICS WITH ALTERNATING ELECTRIC-FIELD Peer-reviewed

Y CHO, F MATSUNO

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　31　(11)　3627-3631　1992/11

DOI： 10.1143/JJAP.31.3627 　

ISSN： 0021-4922
The Relations between the Constants of Electrostrictive Materials and Some Examples of Their Application to Piezoelectric Ceramics Peer-reviewed

Yasuo Cho, Fumihiko Matsuno

Transaction of the institute of ELECTRONICS, INFORMATION and Communication ENGINEERS　J75-A　(5)　875-882　1992/05
A STUDY ON THE SCALAR WAVE-EQUATION FOR NONLINEAR SURFACE ACOUSTIC-WAVE DISTORTION Peer-reviewed

Y CHO, K YAMANOUCHI

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　31　(1)　89-93　1992/01

DOI： 10.1143/JJAP.31.89 　

ISSN： 0021-4922
DYNAMIC MEASURING METHOD OF VELOCITY AND CAPACITANCE VARIATION OF PIEZOELECTRIC CERAMICS WITH ALTERNATING ELECTRIC-FIELD Peer-reviewed

Y. Cho, F MATSUNO

IEEE 1992 ULTRASONICS SYMPOSIUM : PROCEEDINGS, VOLS 1 AND 2　1029-1034　1992

ISSN： 1051-0117
SURFACE ACOUSTIC-WAVE PARAMAGNETIC-RESONANCE IN IRON DOPED-LINBO3 Peer-reviewed

Y CHO, H HORIE, K YAMANOUCHI

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　29　19-21　1990

ISSN： 0021-4922
SHF-Range Surface Acoustic Wave Inter-Digital Transducers Using Electron Beam Exposure Peer-reviewed

K.Yamanouchi, Y.Cho, T.Meguro

IEEE 1988 ULTRASONICS SYMPOSIUM PROCEEDINGS　115-118　1988/11
THEORETICAL AND EXPERIMENTAL STUDIES OF LINBO3 DEGENERATE ACOUSTIC ELASTIC CONVOLVER Peer-reviewed

Y CHO, K YAMANOUCHI

JOURNAL OF APPLIED PHYSICS　61　(5)　1728-1739　1987/03

DOI： 10.1063/1.338070 　

ISSN： 0021-8979
NONLINEAR, ELASTIC, PIEZOELECTRIC, ELECTROSTRICTIVE, AND DIELECTRIC-CONSTANTS OF LITHIUM-NIOBATE Peer-reviewed

Y CHO, K YAMANOUCHI

JOURNAL OF APPLIED PHYSICS　61　(3)　875-887　1987/02

DOI： 10.1063/1.338138 　

ISSN： 0021-8979
Nonlinear Constants of Lithium Niobate Peer-reviewed

Y.Cho, K.Yamanouchi

IEEE 1986 ULTRASONICS SYMPOSIUM PROCEEDINGS　1083-1088　1986/11
Theoretical and Experimental Studies of Transverse-HorizontalConvolver Peer-reviewed

Y.Cho, K.Yamanouchi

IEEE 1986 ULTRASONICS SYMPOSIUM PROCEEDINGS　153-156　1986/11
THEORETICAL AND EXPERIMENTAL-STUDY OF TRANSVERSE-HORIZONTAL CONVOLVER Peer-reviewed

Y CHO, K YAMANOUCHI

ELECTRONICS LETTERS　22　(16)　835-836　1986/07

DOI： 10.1049/el:19860572 　

ISSN： 0013-5194
ELECTROSTRICTIVE AND 3RD-ORDER DIELECTRIC-CONSTANTS OF LITHIUM-NIOBATE Peer-reviewed

Y CHO, K YAMANOUCHI

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　24　76-79　1985

ISSN： 0021-4922

Show all ︎Show first 5

Misc. 129

Simultaneous Local Capacitance-Voltage Profiling and Deep Level Transient Spectroscopy Using Time-Resolved Scanning Nonlinear Dielectric Microscopy International-journal Peer-reviewed

Yasuo Cho

ELECTRONIC DEVICE FAILURE ANALYSIS　24　(1)　17-28　2022/02
Publisher: Electronic Device Failure Analysis Society(EDFAS)
Nanoscale Mapping of Domain Switching Behavior in Ferroelectric Films

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

応用物理学会春季学術講演会講演予稿集(CD-ROM)　68th　2021

ISSN： 2436-7613
Noise Reduction by Principal Component Analysis for Local C-V Mapping

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

応用物理学会秋季学術講演会講演予稿集(CD-ROM)　82nd　2021

ISSN： 2436-7613
傾斜格子歪み希土類鉄ガーネットにおけるフレクソ分極とフェリ磁性の共存

山原弘靖, SHAMIM S. Md, 関宗俊, 長康雄, 田畑仁

応用物理学会秋季学術講演会講演予稿集(CD-ROM)　80th　2019

ISSN： 2758-4704
走査型プローブ顕微鏡(非線形誘電率顕微鏡)を用いたデバイス観察 Invited

長康雄

表面と真空　61　(4)　221-226　2018/04

DOI： 10.1380/vss.61.221 　
走査型非線形誘電率顕微鏡を用いたSiO₂上剥離WSe₂観察におけるキャリア分布の直流バイアス依存性

山末耕平, 加藤俊顕, 金子俊郎, 長康雄

応用物理学会春季学術講演会講演予稿集(CD-ROM)　65th　ROMBUNNO.20p‐C202‐7　2018/03/05
Ferroelectric Materials and Their Applications FOREWORD

Yoshihiro Kuroiwa, Akira Ando, Yasuo Cho, Norifumi Fujimura, Makoto Iwata, Ken-ichi Kakimoto, Kazumi Kato, Hajime Nagata, Masaru Shimizu, Takaaki Tsurumi

JAPANESE JOURNAL OF APPLIED PHYSICS　56　(10)　2017/10

DOI： 10.7567/JJAP.56.10P001 　

ISSN： 0021-4922

eISSN： 1347-4065
Introduction of Scanning Nonlinear Dielectric Microscopy and Its Applications to the Evaluation of Electronic Materials and Devices Invited Peer-reviewed

YAMASUE Kohei, CHINONE Norimichi, CHO Yasuo

The Journal of the Institute of Electrical Engineers of Japan　137　(10)　697-700　2017/10
Publisher: The Institute of Electrical Engineers of Japan
DOI： 10.1541/ieejjournal.137.697 　

ISSN： 1340-5551
SNDM強誘電体プローブメモリ

長康雄

Magnetics Jpn.　12　(3)　109-114　2017/05
Publisher: The Magnetics Society of Japan
ISSN： 1880-7208
走査型非線形誘電率顕微鏡を用いたナノスケール分極反転過程の動的観察

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

応用物理学会春季学術講演会講演予稿集(CD-ROM)　64th　2017

ISSN： 2436-7613
強誘電性HfO₂薄膜におけるナノスケール分極反転ドット書き込み

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

応用物理学会秋季学術講演会講演予稿集(CD-ROM)　78th　2017

ISSN： 2436-7613
Y添加HfO₂薄膜における強誘電ドメイン反転のSNDM観察 (磁気記録・情報ストレージ)

平永良臣, 長康雄, 三村和仙, 清水荘雄, 舟窪浩

電子情報通信学会技術研究報告 = IEICE technical report : 信学技報　116　(348)　35-39　2016/12/08
Publisher: 電子情報通信学会
ISSN： 0913-5685
Y添加HfO₂薄膜における強誘電ドメイン反転のSNDM観察 (マルチメディアストレージ)

平永良臣, 長康雄, 三村和仙, 清水荘雄, 舟窪浩

映像情報メディア学会技術報告 = ITE technical report　40　(44)　35-39　2016/12
Publisher: 映像情報メディア学会
ISSN： 1342-6893
走査型非線形誘電率顕微鏡(SNDM)による半導体微細構造の高分解能評価

長康雄

応用物理　85　(7)　560-567　2016/07
Publisher: 応用物理学会
ISSN： 0369-8009
強誘電性Y:HfO₂薄膜におけるナノスケールドメイン反転 (磁気記録・情報ストレージ)

陳舟, 平永良臣, 清水荘雄, 片山きりは, 三村和仙, 舟窪浩, 長康雄

電子情報通信学会技術研究報告 = IEICE technical report : 信学技報　115　(490)　29-32　2016/03/04
Publisher: 電子情報通信学会
ISSN： 0913-5685
強誘電性Y:HfO₂薄膜におけるナノスケールドメイン反転 (マルチメディアストレージ)

陳舟, 平永良臣, 清水荘雄, 片山きりは, 三村和仙, 舟窪浩, 長康雄

映像情報メディア学会技術報告 = ITE technical report　40　(7)　29-32　2016/03
Publisher: 映像情報メディア学会
ISSN： 1342-6893
走査型非線形誘電率顕微鏡における強誘電性Y:HfO₂薄膜のドメイン反転

CHEN Zhou, 平永良臣, 清水荘雄, 片山きりは, 三村和仙, 舟窪浩, 長康雄

応用物理学会春季学術講演会講演予稿集(CD-ROM)　63rd　2016

ISSN： 2436-7613
強誘電体プローブデータストレージ : 現状と今後の展開 (磁気記録・情報ストレージ)

平永良臣, 長康雄

電子情報通信学会技術研究報告 = IEICE technical report : 信学技報　115　(356)　31-36　2015/12/10
Publisher: 電子情報通信学会
ISSN： 0913-5685
強誘電体プローブデータストレージ : 現状と今後の展開 (マルチメディアストレージ)

平永良臣, 長康雄

映像情報メディア学会技術報告 = ITE technical report　39　(48)　31-36　2015/12
Publisher: 映像情報メディア学会
ISSN： 1342-6893
3J1-5 Quantitative Thickness Measurement in Layered Polarity-Inverted Piezoelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy

Terada Koshiro, Nishikawa Hiroaki, Tanaka Yohei, Odagawa Hiroyuki, Yanagitani Takahiko, Cho Yasuo

Proceedings of Symposium on Ultrasonic Electronics　36　"3J1-5-1"-"3J1-5-2"　2015/11/05
Publisher: Steering committee of symposium on ultrasonic electronics
ISSN： 1348-8236

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In this paper, the method for obtaining thickness of polarity inverted structure in a layered ferroelectric and/or piezoelectric thin film using SNDM is proposed. It showed that layer thickness can be estimated from the output signal of SNDM by choosing an appropriate tip radius. Also, we showed an experimental result in AlN films which have polarity-inverted layer fabricated by RF magnetron sputtering. This method can be applied to multi layered structure by measuring with various probe tips having different tip radius and by analyzing the results.
Removal of Surface Layers of Ferroelectric Recording Media by Ion Beam Irradiation

115　(71)　31-36　2015/06/04
Publisher: 電子情報通信学会
ISSN： 0913-5685
Removal of Surface Layers of Ferroelectric Recording Media by Ion Beam Irradiation

39　(19)　31-36　2015/06
Publisher: 映像情報メディア学会
ISSN： 1342-6893
走査型非線形誘電率顕微鏡法(SNDM)－次世代パワーデバイス(SiC, GaN& Si系パワーデバイス及び太陽電池,etc.)評価用最強ツールとして－”

長康雄

分析サロン　7　1-6　2015/02
Publisher: ナノエレクトロニクス計測分析技術研究会
非接触走査型非線形誘電率ポテンショメトリによる4H-SiC(0001)上グラフェンの観察

山末耕平, 吹留博一, 舩窪一智, 末光眞希, 長康雄

応用物理学会秋季学術講演会講演予稿集(CD-ROM)　76th　2015
A-siteが変位する強磁性強誘電体:La₂NiMnO₆薄膜

高橋竜太, 大久保勇男, 大久保勇男, 山内邦彦, 北村未歩, 桜井康成, 尾嶋正治, 小口多美夫, 小口多美夫, 長康雄, MIKK Lippmaa

応用物理学会秋季学術講演会講演予稿集(CD-ROM)　76th　2015
Achievement of Much Higher Memory Density and Realization of Successive Writing and Reading Operation in HDD-Type Ferroelectric Data Storage System

AOKI Tomonori, HIRANAGA Yoshiomi, CHO Yasuo

IEICE technical report. Magnetic recording　114　(355)　29-33　2014/12/11
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685

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Ferroelectric data storage system records the data bits in the form of the polarization direction. In this system, data bits are read by scanning nonlinear dielectric microscopy (SNDM). The domain wall of typical ferroelectric materials is as thin as a few lattice parameters, which is favorable for high-density data storage. Up to now, we demonstrated recording with a density of 2 Tbit/inch has been achieved in rotating state by HDD-type ferroelectric data storage system. In this study, we achieved much higher memory density above 3 Tbit/inch^2 and succeeded a series of writing and reading operation under a bit spacing of 25.8 nm (which corresponds to a memory density of 1 Tbit/inch^2)
Achievement of Much Higher Memory Density and Realization of Successive Writing and Reading Operation in HDD-Type Ferroelectric Data Storage System

38　(50)　29-33　2014/12
Publisher: 映像情報メディア学会
ISSN： 1342-6893
Study on PZT thin films for ultra-high density ferroelectric data storage based on scanning nonlinear dielectric microscopy

CHEN Yitong, HIRANAGA Yoshiomi, CHO Yasuo

IEICE technical report. Magnetic recording　114　(327)　17-22　2014/11/25
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685

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Lead zirconate titanate ( Pb(Zr,Ti)O_3:PZT) thin film is one of the promising candidate ferroelectrics for the next generation high density ferroelectric data storage based on scanning nonlinear dielectric microscopy(SNDM). Its very large nonlinear dielectric constants enables us to achieve high speed reading. To use this advantage, high quality PZT thin film with high polarization switching speed of very small nano-domain dots is required. In this paper, we describe the fabrication method for high quality PZT film using Radio-frequency magnetron sputtering equipment. We investigated the quality of the films as functions of the amount of Pb and the thickness of film. The properties of these films are measured and discussed.
Study on PZT thin films for ultra-high density ferroelectric data storage based on scanning nonlinear dielectric microscopy

38　(45)　17-22　2014/11
Publisher: 映像情報メディア学会
ISSN： 1342-6893
Measurement of Nonlinear Permittivities of PZT Thin Films Used in Ferroelectric Probe Data Storage Technology

HIRANAGA Yoshiomi, CHO Yasuo

IEICE technical report. Magnetic recording　114　(77)　1-5　2014/06/12
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685

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The development of ferroelectric materials with large nonlinear permittivity is important for improving the reading bit rate in ferroelectric probe data storage. In this study, Pb(Zr,Ti)O_3(PZT) thin films are prepared with various Zr/Ti ratio and evaluated for this novel data storage technology. Nonlinear dielectric constants of the PZT films were studied in detail. The nonlinear dielectric constants of the PZT films with Zr/Ti=52/48 was measured to be 50 aF/V under bias voltage application, which was approximately 70 times larger than that of LiTaO_3 single crystal.
Measurement of Nonlinear Permittivities of PZT Thin Films Used in Ferroelectric Probe Data Storage Technology

38　(22)　1-5　2014/06
Publisher: 映像情報メディア学会
ISSN： 1342-6893
非接触走査型非線形誘電率顕微鏡による水素インターカレートされた4H-SiC(0001)上グラフェンの観察

山末耕平, 吹留博一, 舩窪一智, 末光眞希, 長康雄

応用物理学会秋季学術講演会講演予稿集(CD-ROM)　75th　2014
非接触走査型非線形誘電率顕微鏡による4H-SiC(0001)上グラフェンの高分解能観察

山末耕平, 吹留博一, 舩窪一智, 末光眞希, 長康雄

応用物理学会春季学術講演会講演予稿集(CD-ROM)　61st　2014
La₂NiMnO₆薄膜の強誘電性

高橋竜太, 大久保勇男, 大久保勇男, 北村未歩, 桜井康成, 尾嶋正治, 尾嶋正治, 長康雄, LIPPMAA Mikk

応用物理学会春季学術講演会講演予稿集(CD-ROM)　61st　2014
Observation of Vth Distribution of MONOS Flash Memory Using Scanning Nonlinear Dielectric Microscopy

HONDA K., CHO Y.

IEICE technical report　111　(33)　7-12　2011/05/06
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685

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In flash memory, both the "1" and "0" states are stored by changing the threshold voltage (Vth) of the transistor, where the Vth shifts are induced by stored charges. The metal-SiO_2-SiN-SiO_2-semiconductors (MONOS) memory stores charges in the SiN film of the gate SiO_2-SiN-SiO_2 (ONO) film. By using a scanning nonlinear dielectric microscopy (SNDM), we have succeeded in the identification of the charges (electrons and holes) concentrated areas in the ONO gate film in high-resolution. In the MONOS flash memory; we also succeeded in visualizing the Vth distribution of cell transistors by detecting a DC-biased SNDM signal. Thus, it is expected that SNDM will be an effective method for analyzing the semiconductor devices.
24pYE-7 Ferroelectric Domain structures Observed by Scanning Nonlinear Dielectric Microscopy

Hiranaga Yoshiomi, Cho Yasuo

Meeting abstracts of the Physical Society of Japan　63　(1)　935-935　2008/02/29
Publisher: The Physical Society of Japan (JPS)
ISSN： 1342-8349
26pTD-8 Observation of Fullerene Molecule by using Non-contact Scanning Nonlinear Dielectric Microscopy

Kobayashi Shin-ichiro, Cho Yasuo

Meeting abstracts of the Physical Society of Japan　63　(1)　908-908　2008/02/29
Publisher: The Physical Society of Japan (JPS)
ISSN： 1342-8349
Synthesis and characterization of Bi(Ni0.5Ti0.5)O-3

Hiroyuki Saitoh, Kazuya Kitada, Masafumi Kobune, Wataru Adachi, Tetsuo Yazawa, Kenya Ishikawa, Yoshiomi Hiranaga, Yasuo Cho, Katsutoshi Aoki

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES　64　C522-C523　2008

DOI： 10.1107/S0108767308083220 　

ISSN： 2053-2733
Ferromagnetism and Ferroelectricity in BiFeO3/BiCrO3 Artificial 1/1 Superlattice

Noriya Ichikawa, Yusuke Imai, Kei Hagiwara, Masaya Arai, Atsushi Tanokura, Hiroshi Sakama, Masaki Azuma, Yuichi Shimakawa, Mikio Takano, Yasutoshi Kotaka, Masashi Yonetani, Hironori Fujisawa, Masaru Shimizu, Kenya Ishikawa, Yasuo Cho

Mater. Res. Soc. Symp. Proc.　1110E　(1)　C03-15　2008
23pYJ-5 Scanning nonlinear dielectric microscopy with atomic resolution

Cho Yasuo, Hirose Ryusuke, Kobayashi Shin-ichiro, Saito Akio

Meeting abstracts of the Physical Society of Japan　62　(2)　958-958　2007/08/21
Publisher: The Physical Society of Japan (JPS)
ISSN： 1342-8349
INV-1 Scanning nonlinear dielectric microscopy with super-high resolution

Cho Yasuo

Proceedings of Symposium on Ultrasonic Electronics　27　21-24　2006/11/15
Publisher: Steering committee of symposium on ultrasonic electronics
ISSN： 1348-8236

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Scanning nonlinear dielectric microscopy (SNDM) with super-high resolution is described. At first, experimental results for ferroelectric domain and the visualization of charge stored in flash memories are shown, following the description of theory and principle of SNDM. Next, higher-order nonlinear dielectric imaging method and non-contact SNDM (nc-SNDM) are proposed. Using this nc-SNDM technique, the first achievement of atomic resolution in capacitance measurement is successfully demonstrated. In addition to this technique, a new 3D-type of SNDM to measure the 3D distribution of ferroelectric polarization has been developed. Finally, a very high density ferroelectric data storage based on SNDM with the density of 10 T-bits/inch^2 is demonstrated.
C-6-5 回転ディスク型非接触強誘電体記録装置の開発(C-6.電子部品・材料,一般講演)

夘田知也, 平永良臣, 長康雄

電子情報通信学会ソサイエティ大会講演論文集　2006　(2)　12-12　2006/09/07
Publisher: 一般社団法人電子情報通信学会
10項超音波エレクトロニクス研究会(3節工学研究会,第5章国際会議・シンポジウム等)

長康雄, 大原鉱也

東北大学電気通信研究所研究活動報告　12　276-277　2006/08/01
10項超音波エレクトロニクス研究会(3節工学研究会,第5章国際会議・シンポジウム等)

長康雄, 平永良臣

東北大学電気通信研究所研究活動報告　13　284-285　2006/01/01
P3-11 Simultaneous measurement of topography and dielectric constant distribution by NC-SNDM with sub-nanometer order height resolution

Ohara Koya, Cho Yasuo

Proceedings of Symposium on Ultrasonic Electronics　26　361-362　2005/11/16
Publisher: Steering committee of symposium on ultrasonic electronics
ISSN： 1348-8236
P3-15 Piezoelectric Dronerties of the hydrothermal deposited enitaxial PbTiO_3 thin nlm

Morita Takeshi, Cho Yasuo

Proceedings of Symposium on Ultrasonic Electronics　26　369-370　2005/11/16
Publisher: Steering committee of symposium on ultrasonic electronics
ISSN： 1348-8236
圧電・超音波材料非線形誘電率顕微鏡を用いた3次元分極方位の絶対計測--3次元ドメイン構造の可視化

杉原智之, 小田川裕之, 長康雄

超音波techno　17　(3)　46-50　2005/05
Publisher: 日本工業出版
ISSN： 0916-2410
非線形誘電率顕微鏡を用いた超高密度強誘電体記録

長康雄

表面科学　26　(4)　220-225　2005/04
Publisher: 日本表面科学会
DOI： 10.1380/jsssj.26.220 　
Super High-Density Ferroelectric Digital Data Recording Using Scanning Nonlinear Dielectric Microscopy Probe Strage Technique

FUJIMOTO Kenjiro, MAEDA Takanori, TAKAHASHI Hirokazu, ONOE Atsushi, CHO Yasuo

IEICE technical report. Magnetic recording　104　(547)　25-29　2005/01/07
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685

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The authors are studying ferroelectric probe memory using scanning nonlinear dielectric microscopy (SNDM) method as a reproduction technique to realize a next generation super high-density data storage system. We already demonstrated the possibility of ferroelectric data storage in excess of 1 Tbit/inch^2 using a congruent LiTaO_3 (CLT) thin crystal plate as a recording media. In this paper, the ferroelectricity of CLT was investigated more precisely, and very high-speed switching characteristic of nano-second order was successfully found out. This characteristic is also suitable for ferroelectric recording media as well as the characteristic of higher storage density. We also performed quasi-digital data recording experiments. Digital signal was recorded with the density of 726 Mdpi in CLT media, and the recorded digital signal was well reproduced by a single scan of a probe.
Diamond probe with silicon-based piezo strain gauge for high density data storage using scanning nonlinear dielectric microscopy Peer-reviewed

Hirokazu Takahashi, Atsushi Onoe, Takahito Ono, Yasuo Cho, Masayoshi Esashi

Digest of Technical Papers - International Conference on Solid State Sensors and Actuators and Microsystems, TRANSDUCERS '05　2　1338-1341　2005

DOI： 10.1109/SENSOR.2005.1497328 　
非線形誘電率顕微鏡

長康雄

顕微鏡　40　(1)　33-36　2005
Publisher: 日本顕微鏡学会
DOI： 10.11410/kenbikyo2004.40.33 　

ISSN： 1349-0958
B-3 Three-dimensional measurement for absolute value of polarization angle Using Scanning Nonlinear Dielectric Microscopy

Sugihara Tomoyuki, Odagawa Hiroyuki, Cho Yasuo

Proceedings of Symposium on Ultrasonic Electronics　25　9-10　2004/10/27
Publisher: Steering committee of symposium on ultrasonic electronics
ISSN： 1348-8236
Tbits/inch^2 Ferroelectric Data Storage Based on Scanning Nonlinear Dielectric Microscopy

CHO Yasuo, HIRANAGA Yoshiomi

Technical report of IEICE. OME　104　(285)　37-42　2004/09/02
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685

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Scanning Nonlinear Dielectric Microscope (SNDM) is the method for observing ferroelectric polarization distribution, and now, its resolution has become to the sub-nanometer order. Up to now, we have studied high-density ferroelectric data storage using this microscope. In this study, we selected stoichiometric and congruent LiTaO_3 single crystals as ferroelectric recording media. At first, using stoichiometric LiTaO_3 (SLT), we studied polarization inversion characteristics in detail, and as a result, we achieved forming small inverted domain with the radius of 6nm. And we also studied the retention of inverted domain. Next, using congruent LiTaO_3 (CLT), we achieved high-density data storage in 1.5Tbit/inch^2 and bit error ratio of 1.2×10^<-3>.
Diamond probe for ultra-high-density ferroelectric data storage based on scanning nonlinear dielectric microscopy Peer-reviewed

Hirokazu Takahashi, Takahito Ono, Yasuo Cho, Masayoshi Esashi

Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)　536-539　2004

ISSN： 1084-6999
A-3 Ultrahigh-speed switching characteristics of ferroelectric nano-domain

Fujimoto Kenjiro, Cho Yasuo

Proceedings of Symposium on Ultrasonic Electronics　24　5-6　2003/11/12
Publisher: Steering committee of symposium on ultrasonic electronics
ISSN： 1348-8236
強誘電ナノ・ドメイン・エンジニアリング

北村健二, 寺部一弥, 長康雄

機能材料　23　(10)　46-54　2003/10
Publisher: シーエムシー出版
ISSN： 0286-4835
非線形誘電率顕微鏡の開発と電子材料への展開

長康雄

セラミックス　38　(10)　786-790　2003/10
Publisher: 日本セラミックス協会
ISSN： 0009-031X
A ring shaped poling nano-dot using a Scanning Nonlinear Dielectric Microscopy

KATOH Mirai, MORITA Takeshi, CHO Yasuo

Proceedings of the Society Conference of IEICE　2003　(2)　14-14　2003/09/10
Publisher: The Institute of Electronics, Information and Communication Engineers
C-6-12 走査型非線形誘電率顕微鏡を用いた Si_3N_4/SiO_2/Si 半導体基板への電荷記録

橋本直, 平永良臣, 長康雄, 本田耕一郎

電子情報通信学会ソサイエティ大会講演論文集　2003　(2)　15-15　2003/09/10
Publisher: 一般社団法人電子情報通信学会
C-7-1 強誘電微小分極反転ドメインの生成とデータストレージシステムの試作

平永良臣, 我妻康夫, 長康雄, 尾上篤

電子情報通信学会ソサイエティ大会講演論文集　2003　(2)　18-18　2003/09/10
Publisher: 一般社団法人電子情報通信学会
A Correction of Applied Electric Field in the Observation of Ferroelectric Polarization Distribution Using 3D-Type Scanning Nonlinear Dielectric Microscopy

Sugihara Tomoyuki, Odagawa Hiroyuki, Cho Yasuo

Proceedings of the Society Conference of IEICE　2003　(2)　13-13　2003/09/10
Publisher: The Institute of Electronics, Information and Communication Engineers
Scanning nonlinear dielectric microscopy and its application to nano-domain engineering

Cho Yasuo

Meeting abstracts of the Physical Society of Japan　58　(2)　862-862　2003/08/15
Publisher: The Physical Society of Japan (JPS)
ISSN： 1342-8349
非線形誘電率顕微鏡を用いたドメイン構造観察

長康雄

機能材料　22　(12)　12-17　2002/12
Publisher: シーエムシー出版
ISSN： 0286-4835
Observation of Ferroelectric Nano-domains Using Scanning Nonlinear Dielectric Microscopy

Yasuo Cho

Materia　41　(12)　852-853　2002/12
Publisher: The Japan Institute of Metals(JIM)
DOI： 10.2320/materia.41.852 　

ISSN： 1340-2625
超高分解能走査型非線形誘電率顕微鏡

長康雄

応用物理　71　(1)　62-65　2002/01
Publisher: 応用物理学会
DOI： 10.11470/oubutsu1932.71.62 　
Fundamental studies on ferroelectric recording using nonlinear dielectric microscopy

CHO Yasuo, MATSUURA Kaori, KAZUTA Satoshi, KITAMURA Kenji

IEICE technical report. Magnetic recording　101　(105)　49-56　2001/05/31
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685

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Scanning Nonlinear Dielectric Microscopy (SNDM) is the first successful purely electrical method for observing ferroelectric domains. Now its resolution has become to the sub-nanometer order. In this paper fundamental study on applying SNDM system to the ferroelectric reading and writing system is performed. At first, to check the performance of the SNDM system as a ferroelectric recording system, we conduct a fundamentak study on the writing of domain inversion dot in PZT thin film and succeed to have a very small domain dots with the size of 25nm. Next, we form small inverted domain dots in stoichiometric LiTaO_3 single crystal for the purpose of a basic investigation of domain dynamics in a very small area. The relation ship between the voltage for domain reversal and the inverted area and the relationship between the inverted domain area and the voltage application time are obtained.
Observation of domain structures by scanning nonlinear dielectric microscopy

Cho Yasuo

Meeting abstracts of the Physical Society of Japan　56　(1)　876-876　2001/03/09
Publisher: The Physical Society of Japan (JPS)
ISSN： 1342-8349
走査型非線型誘電率顕微鏡を用いた強誘電体層状化合物の原子分解測定

長康雄, 松浦かおり, 舟窪浩, 入江寛, 宮山勝, 野口祐ニ

応用物理学会春期発表会　30p-YC-2　563　2001
OB01 Measurement of the ferroelectric distributions using nonlinear dielectric response and piezoelectric response

Matsuura Kaori, Cho Yasuo, Odagawa Hiroyuki

Symposium on ultrasonic electronics　(21)　11-12　2000/11/06
Publisher: Steering committee of symposium on ultrasonic electronics
PB01 New Functions of Scanning Nonlinear Dielectric Microscopy : Higher order measurement and Vertical Resolution

Cho Yasuo, Ohara Koya, Koike Atsushi, Odagawa Hiroyuki

Symposium on ultrasonic electronics　(21)　87-88　2000/11/06
Publisher: Steering committee of symposium on ultrasonic electronics
走査型非線形誘電率顕微鏡－圧電デバイスをミクロに探る

長康雄

日本音響学会誌　56　(10)　721-726　2000/10
Publisher: 日本音響学会
DOI： 10.20697/jasj.56.10_721 　

ISSN： 0369-4232
Measurement of the ferroelectric distributions using nonlinear dielectric response and piezoelectric response

MATSUURA Kaori, CHO Yasuo, ODAGAWA Hiroyuki

IEICE technical report. Ultrasonics　100　(291)　1-7　2000/09/12
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685

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Scanning Nonlinear Dielectric Microscopy(SNDM)is the first successful purely electrical method for observing the nonlinear dielectric distributions. Now its resolution has become to the sub-nanometer order with conductive cantilever for the probe needle. On the other hand, as another method for measuring the ferroelectric domains, the piezoelectric response imaging method is often used. In this paper, we compare the resolution of SNDM with that of piezoelectric response and confirm that SNDM has much higher resolution than that obtained by piezo imaging. Finally, the fundamental study to apply SNDM system to the ferroelectric reading and writing system are performed.
New Functions of Scanning Nonlinear Dielectric Microscopy : Higher Order Measurement and Vertical Resolution

CHO Yasuo, OHARA Koya, KOIKE Atsushi, ODAGAWA Hiroyuki

IEICE technical report. Ultrasonics　100　(291)　9-15　2000/09/12
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685

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Recently, we have proposed and developed the SNDM, which is a new, purely electrical technique for imaging the state of ferroelectric polarization and the local crystal anisotropy of dielectric materials. This time, we investigated the new functions of SNDM, which are measurement of the higher order nonlinear dielectric constant and the vertical resolution of SNDM. It is expected to obtain the higher resolution by the higher order measurement than that by the conventional SNDM imaging. Moreover, using the very high vertical resolution of SNDM, a new microscopy for measuring the microscopic topography and a new displacement sensor for the very small will be available.
Detection of ultra small vibration by using Scanning Nonlinear Dielectric Microscopy

CHO Yasuo, KOIKE Atsushi, OHARA Koya, ODAGAWA Hiroyuki

2000　(2)　913-914　2000/09/01

ISSN： 1340-3168
Observation of ferroelectric domains using scanning nonlinear dielectric microscopy

CHO Y., OGADAWA H., KAZUTA S., OHARA K.

Meeting abstracts of the Physical Society of Japan　55　(1)　823-823　2000/03/10
Publisher: The Physical Society of Japan (JPS)
ISSN： 1342-8349
PF-3 Simultaneous observation of ferroelectric domain patterns by SNDM and surface morphology by AFM

Odagawa Hiroyuki, Cho Yasuo, Funakubo Hiroshi, Nagashima Kuniharu

Symposium on ultrasonic electronics　(20)　243-244　1999/11/17
Publisher: Steering committee of symposium on ultrasonic electronics
PF-2 Determination of the orientation of ZnO thin film using scanning nonlinear dielectric microscopy

Kazuta S., Cho Y., Odagawa H., Kadota M.

Symposium on ultrasonic electronics　(20)　241-242　1999/11/17
Publisher: Steering committee of symposium on ultrasonic electronics
F-3 Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy

Cho Y., Kazuta S., Oohara K., Odagawa H.

Symposium on ultrasonic electronics　(20)　303-304　1999/11/17
Publisher: Steering committee of symposium on ultrasonic electronics
PC-5 Theoretical Analysis of SAW Propagation Characteristics under the Strained Medium and Applications for High Temperature Stable High Coupling SAW Substrates

Yamanouchi K., Kotani K., Odagawa H., Cho Y.

Symposium on ultrasonic electronics　(20)　51-52　1999/11/17
Publisher: Steering committee of symposium on ultrasonic electronics
Temperature Coefficient Image of Dielectric Material using Scanning Electron-Beam Dielectric Microscopy

CHO Y., JINTSUGAWA O., SATO A., YAMANOUCHI K.

IEICE technical report. Ultrasonics　99　(314)　45-51　1999/09/21
Publisher: The Institute of Electronics, Information and Communication Engineers
ISSN： 0913-5685
ニオブ酸カリウムの非線形圧電定数とコンボルバへの応用 (特集 21世紀を拓く革新的超音波材料群)

長康雄, 太田憲行, 小田川裕之

超音波techno　11　(9)　27-31　1999/09
Publisher: 日本工業出版
ISSN： 0916-2410
Determination of the orientation of ZnO thin film using scanning nonlinear dielectric microscopy.

CHO Y., KAZUTA S., ODAGAWA H., KADOTA M.

1999　(2)　1013-1014　1999/09/01

ISSN： 1340-3168
Simultaneous observation of ferroelectric domain patterns by SNDM and surface morphology by AFM.

ODAGAWA Hiroyuki, CHO Yasuo

1999　(2)　1015-1016　1999/09/01

ISSN： 1340-3168
Quantitative measurement of Dielectric Characteristics Using Scanning Nonlinear Dielectric Microscopy.

CHO Yasuo, OOHARA Koya, KAZUTA Satoshi, ODAGAWA Hiroyuki

1999　(2)　1039-1040　1999/09/01

ISSN： 1340-3168
Temperature Stable High Coupling SAW Bonded Substrate

KOTANI K., CHO Y., ODAGAWA H., YAMANOUCHI K.

1999　(1)　831-832　1999/03/01

ISSN： 1340-3168
Fabrication of KNbO_3 Thin Film Using 2-Target RF Magnetron Sputter

ODAGAWA H., NOHARA Y, CHO Y., WAGATSUMA Y., YAMANOUCHI K.

1999　(1)　1009-1010　1999/03/01

ISSN： 1340-3168
OE9 Measurement of nonlinear piezoelectric constants of KNbO_3 single crystal

Oota N., Cho Y., Odagawa H., Yamanouchi K.

Symposium on ultrasonic electronics　(19)　23-24　1998/11/26
Publisher: Steering committee of symposium on ultrasonic electronics
PE7 Observation of Ferroelectric Polarization in KNbO_3 Thin Films and SAW Propaties

Kotani K., Odagawa H., Cho Y., Yamanouchi K.

Symposium on ultrasonic electronics　(19)　85-86　1998/11/26
Publisher: Steering committee of symposium on ultrasonic electronics
PE8 Ultra thin single domain layers formed on LiTaO_3 and LiNbO_3 surfaces

Cho Yasuo, Matsuura Kaori, Kazuta Satoshi, Yamanouchi Kazuhiko

Symposium on ultrasonic electronics　(19)　87-88　1998/11/26
Publisher: Steering committee of symposium on ultrasonic electronics
MESUREMENT OF NONLINEAR PIEZOELECTRIC CONSTANTS OF KNbO_3 SINGLE CRYSTAL

OOTA N., CHO Y., ODAGAWA H., YAMANOUCHI K.

IEICE technical report. Ultrasonics　98　(271)　9-15　1998/09/18
Publisher: The Institute of Electronics, Information and Communication Engineers

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KNbO_3 single crystal has attracted much interst as a pizoelectric material for nonlinear acoustic surface wave(SAW) devices such as acoustic convolvers. The successful application of this crystal to SAW convolvers depends on knowledge of the third-order piezoelectric constant. In this paper, at first, it is demonstrated that the simple measurement of the nonlinear piezoelectric constants of e_<355> is very effective in the quantitative estimation of the efficiency of elastic convolver. Next, to evaluate convolver efficiencies, the third-order piezoelectric constants, e_<355> and e_<344>, in the rotated Y-cut KNbO_3 substrate are measured by using the dynamic measuring method for velocity variation under alternating applied electric field, using the measured results, the qualitative realtionships between the value of the third-order piezoelectric constant and the convolution efficiency are discussed.
Observation of Ferroelectric Polarization in KNbO_3 Thin Films and SAW Properties

KOTANI Kenji, ODAGAWA Hiroyuki, CHO Yasuo, YAMANOUCHI Kazuhiko

IEICE technical report. Ultrasonics　98　(270)　45-50　1998/09/17
Publisher: The Institute of Electronics, Information and Communication Engineers

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This paper describes the observation of ferroelectric polarization in KNbO_3 thin films made by MOCVD using scanning nonlinear dielectric microscope and the measurement of surface acoustic wave properties in the films. The result shows that the polarizations in the as-grown films are in the same positive to the surface normal. The KNbO_3 films which are carried out a poling process are also measured. The results of the observation by scanning nonlinear dielectric microscope correspond to the measurement results of the SAW propagation.
Observation of Ferroelectric Polarization in KNbO_3 Thin Films and SAW Propaties

ODAGAWA H., KOTANI K., CHO Y., YAMANOUCHI K.

1998　(2)　1061-1062　1998/09/01

ISSN： 1340-3168
Measurement of nonlinear piezoelectric constants of KNbO_3 single crystal.

OOTA N., CHO Y., ODAGAWA H., YAMANOUCHI K.

1998　(2)　1181-1182　1998/09/01

ISSN： 1340-3168
Growth of Piezo-electronic KNbO_3 Thin Films by MOCVD and Application of SAW Transducers

YAMANOUCHI K., KOJIMA T., ODAGAWA H., CHO Y., ONOE A., YOSHIDA A., CHIKUMA K.

1998　(1)　963-964　1998/03/01

ISSN： 1340-3168
Fundamental Studies on Scanning Electron-Beam Dielectric Microscopy.

CHO Yasuo, NAGANO H., YAMANOUCHI K.

1998　(1)　889-890　1998/03/01

ISSN： 1340-3168
走査型非線形誘電率顕微鏡

長康雄

応用物理　67　(3)　327-331　1998/03
Publisher: 応用物理学会
DOI： 10.11470/oubutsu1932.67.327 　

ISSN： 0369-8009
OE1 A Surface Acoustic Wave Elastic Convolver Using KNbO_3 Single Crystal Substrate

Yamanouchi Kazuhiko, Morozumi Kenyu, Odagawa Hiroyuki, Cho Yasuo

Symposium on ultrasonic electronics　(18)　1-2　1997/11/12
Publisher: Steering committee of symposium on ultrasonic electronics
OB5 Observation of Submicron Ferroelectric Domains Using Scanning Nonlinear Dielectric Microscope

Cho Yasuo, Matsuura Kaori

Symposium on ultrasonic electronics　(18)　233-234　1997/11/12
Publisher: Steering committee of symposium on ultrasonic electronics
A Surface Acoustic Wave Elastic Convolver Using KNbO_3 Single Crystal Substrate

MOROZUMI Kenyu, ODAGAWA Hiroyuki, CHO Yasuo, YAMANOUCHI Kazuhiko

IEICE technical report. Ultrasonics　97　(276)　25-30　1997/09/25
Publisher: The Institute of Electronics, Information and Communication Engineers

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KNbO_3 single crystal has a large piezoelectric constants. We know that Y-X KNbO_3 has a large electro-mechanical coupling coefficient (k^2) of 0.53, which is about 10 times larger than that of LiNbO_3. A high value of coupling coefficient is very important for wideband and high efficiency SAW devices. We studied elastic convolvers using KNbO_3 substrate that is very important for the spread spectrum communication devices. The results of our experiment show that the efficiency of the convolver using 60° Y-X KNbO_3 is 15dB higher than that of the convolver using Y-Z LiNbO_3.
Obsrevation of Submicron Ferroelectric Domains Using Scanning Nonlinear Dielectric Microscope.

CHO Yasuo, MATSUURA Kaori

1997　(2)　1049-1050　1997/09/01

ISSN： 1340-3168
A Surface Acoustic Wave Elastic Convolver Using KNbO_3 Substrate.

MOROZUMI Kenyu, ODAGAWA Hiroyuki, YAMANOUCHI Kazuhiko, CHO Yasuo

1997　(2)　981-982　1997/09/01

ISSN： 1340-3168
Measurement of Quality Factor of Coplanar-Type Resonators Fabricated by YBCO Films

Kaneyuki Tomohiko, Kanaya Haruichi, Cho Yasuo, Awai Ikuo

Proceedings of the IEICE General Conference　1997　(1)　144-144　1997/03/06
Publisher: The Institute of Electronics, Information and Communication Engineers
Observation of Ferroelectric Domain Image Using Scanning Nonliner Dielectric Microscope.

CHO Yasuo, OTSUMI Sigeyuki

1997　(2)　1017-1018　1997/03/01

ISSN： 1340-3168
An Elastic Convolver Using KNbO_3 Substrate.

YAMANOUCHI Kazuhiko, ODAGAWA Hiroyuki, MOROZUMI Kenyu, CHO Yasuo

1997　(2)　1019-1020　1997/03/01

ISSN： 1340-3168
Observation of the Temperature Coefficient Image Using Scanning Photothermal Dielect-ric Microscope.

CHO Yasuo, KASAHARA Teruaki

1997　(2)　1015-1016　1997/03/01

ISSN： 1340-3168
Application of Coplanar-Type Microwave Device Fabricated by YBCO Films

KANEYUKI Tomohiko, SENOH Hidehiro, KANAYA Haruichi, CHO Yasuo, AWAI Ikuo

IEICE technical report. Antennas and propagation　96　(374)　107-112　1996/11/22
Publisher: The Institute of Electronics, Information and Communication Engineers

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High temperature superconducting(HTS) materials are very promising for high frequency passive devices because of their extremely low loss at microwave region. YBCO films were prepared on MgO poly-crystal substrates by the sol-gel process. Their microwave charactaristics were measured by TE_<011> mode dielectric resonator method. Secondly, a coplanar waveguide(CPW) resonator and 2-pole bandpass filter(BPF), around 2GHz, are fabricated with the superconductors. As a result, we obtained a low loss superconductor BPF.
New Purely Electrical Method for Imaging the Distribution of Ferroelectric Polarization Using Microwave Technique

CHO Yasuo, ATSUMI Shigeyuki

IEICE technical report. Antennas and propagation　96　(374)　85-92　1996/11/22
Publisher: The Institute of Electronics, Information and Communication Engineers

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A new purely electrical method for imaging the distribution of ferroelectric polarization (Scanning nonlinear dielectric microscope) is described. The theory for the microscope is based on the fact that the image of the area distribution of ferroelectric polarization is obtained by the microscopic measurement of the distribution of the nonlinear dielectric constant. Especially, in this report, we focus on the subject about the polarization image with high resolution obtained by using a new developed very small lumped constant resonator probe.
OC4 Scanning nonliner dielectric microscope using lumped constant circuit probe

Cho Yasuo, Atsumi Shigeyuki

Symposium on ultrasonic electronics　(17)　119-120　1996/10/23
Publisher: Steering committee of symposium on ultrasonic electronics
OD5 Measurement of Photothermal Dielectric Signal with Powder

Cho Yasuo, Kumamaru Tomoyuki, Kasahara Teruaki

Symposium on ultrasonic electronics　(17)　9-10　1996/10/23
Publisher: Steering committee of symposium on ultrasonic electronics
One-Dimensional Simulation for The Nonliner Wave Behavior in Composite Materials.

CHO Y., IDEGAMI K., BREAZEALE M. A.

1996　(2)　1041-1042　1996/09/01

ISSN： 1340-3168
Estimation of Powder Grain Size Using Photothermal Dielectric Microscope.

CHO Yasuo, KUMAMARU Tomoyuki, KASAHARA Teruaki

1996　(2)　955-956　1996/09/01

ISSN： 1340-3168
PA5 Measurement of Photothermal Dielectric Signal with Liquid

Cho Yasuo, Kumamaru Tomoyuki

Symposium on ultrasonic electronics　(16)　63-64　1995/11/27
Publisher: Steering committee of symposium on ultrasonic electronics
Spectroscopic Measurement of Optical Materials Using Photothermal Dielectric Spectroscopic Microscope.

CHO Yasuo, KUMAMARU Tomoyuki

1995　(2)　1099-1100　1995/09/01

ISSN： 1340-3168
Observation of Ferroelectric Polarization by The Non-contact Mode of Nonlinear Dielectric Microscorpe.

CHO Yasuo, KIRIHARA Akio, SAEKI Takahiro

1995　(2)　1097-1098　1995/09/01

ISSN： 1340-3168
Observation of Distribution of Remanent Polarization in P(VDF-T_rFE) Thin Film Using Non-linerar Dielectric Microscope

CHO Yasuo, KIRIHARA Akio, SAEKI Takahiro

1995　(1)　1061-1062　1995/03/01

ISSN： 1340-3168
Development of Photo Thermal Dielectric Microscope for Liquid and Powder Materials

CHO Yasuo, KUMAMARU Tomoyuki, ODA Shunsuke

1995　(1)　1059-1060　1995/03/01

ISSN： 1340-3168
Evaluation of Temperature Characteristic of Dielectric Materials Using Photo Thermal Dielectric Microscope

CHO Yasuo, YOKOYAMA Koji

1995　(1)　989-990　1995/03/01

ISSN： 1340-3168
Observation of Transition Ions doped in LiNbO_3 by Photo Thermal Dielectric Spectoroscopic Microscope

CHO Yasuo, KUMAMARU Tomoyuki, ODA Shunsuke

1995　(1)　987-988　1995/03/01

ISSN： 1340-3168
J-5 Photodielectric Spectroscopic Microscope

Cho Yasuo, Kumamaru Tomoyuki

Symposium on ultrasonic electronics　(15)　297-298　1994/11/28
Publisher: Steering committee of symposium on ultrasonic electronics
Development of Measuring Technique of Temperature Characteristic of Dielectric Ceramics for Microwave Application Using Photo Thermal Dielectric Microscope

Cho Yasuo, Yokoyama Koji, Kumamaru Tomoyuki, Kirihara Akio

IEICE technical report. Microwaves　94　(375)　1-6　1994/11/25
Publisher: The Institute of Electronics, Information and Communication Engineers

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A photo thermal dielectric microscope(PTDM)for measuring the temprature characteristic of dielectric materials for microwave application is developed.Next,it is successfully demonstrated that the temperature characteristics of the dielectric ceramics are measured with enough accuracy at the microwave frequency range by using this PTDM
Nonlinear Dielectric Microscope

Cho Yasuo, Kirihara Akio, Saeki Takahiro

IEICE technical report. Ultrasonics　94　(330)　17-22　1994/11/16
Publisher: The Institute of Electronics, Information and Communication Engineers

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This paper describes a new technique for imaging the distributing of nonlinear dielectric constants of ferroelectric materials.This technique enable us to image polarization vectors and crystallization of them,because the nonlinear(third-order) dielectric constants(third-rank tensor)are very sensitive to the state of their spontaneous polarization and crystallization,while their linear dielectric coefficients(second-rank tensor)are insensitive to them.
Fundamental Studies on The Photodielectric Microscope

CHO Yasuo, KUMAMARU Tomoyuki

1994　(2)　44-44　1994/09/26
Publisher: The Institute of Electronics, Information and Communication Engineers
Fundamental Studies on The Nonlinear Dielectric Microscope

CHO Yasuo, KIRIHARA Akio, SAEKI Takahiro

1994　(2)　45-45　1994/09/26
Publisher: The Institute of Electronics, Information and Communication Engineers
Preparation of Thin BSCCO Polycry stalline Film and its Microwave Application

Isoyama Shinji, Cho Yasuo, Awai Ikuo

Technical report of IEICE. SCE　94　(8)　15-20　1994/04/20
Publisher: The Institute of Electronics, Information and Communication Engineers

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The purpose of this study is microwave application of BSCCO thick.(polycrystalline)film.At first,BSCCO thick film(2212)was prepared on a polycrystalline KgO substrate by the melting method. But since the film was very thick(100-200μm),it was not adequate f or high-precision etching.Thus,using the solution made of glycerin and material powder,we have tried to make films thinner and obtained 5-30μm thickness.Next using TE_011>,mode dielectric rod resenator,surface impedance of the film was deterilined at 10.3 GHz.At last,lines and resonators which are the basis of high frequency circuit were made in the coplaner configuration.
PC25 Control of the Nonlinear Piezoelectricity and its Application to the Efficiency Enlargement of Surface Acoustic Wave Elastic Convolver

Cho Yasuo, Haitsuka Shin-ichi, Kadota Michio

Symposium on ultrasonic electronics　(14)　249-250　1993/12/07
Publisher: Steering committee of symposium on ultrasonic electronics
PA16 Nonlinear Equivalent Circuit Model Analysis of Acoustic Devices and Propagation of SAW

Cho Yasuo, Wakita Junji, Miyagawa Nozomu

Symposium on ultrasonic electronics　(13)　63-64　1992/11/30
Publisher: Steering committee of symposium on ultrasonic electronics
1-B-3 Surface Acoustic Wave Paramagnetic Resonance in Iron-Doped LiNbO_3

CHO Y., HORIE H., YAMANOUCHI K.

Symposium on ultrasonic electronics　(10)　15-16　1989/11/07
Publisher: Steering committee of symposium on ultrasonic electronics
NONLINEAR CONSTANTS OF LITHIUM-NIOBATE

Y CHO, K YAMANOUCHI

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL　34　(3)　389-389　1987/05

ISSN： 0885-3010
InSb/LiNbO3構造弾性表面波非線形デバイス

山之内和彦, 長康雄, 稲田勉

東北大学電通談話会記録　51　(2)　p50-57　1982/08
Publisher: 東北大学電気通信研究所工学研究会
ISSN： 0385-7719

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Books and Other Publications 19

Scanning Nonlinear Dielectric Microscopy - Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices -

Yasuo Cho

ELSEVIER　2020/05/21

ISBN: 9780128172469
マイクロビームアナリシス・ハンドブック

日本学術振興会, マイクロビームアナリシス, 委員会

オーム社　2014/06/30

ISBN: 9784274504969
Innovative Graphene Technologies: Evaluation and Applications Volume 2

Shin-ichiro Kobayashi, Yasuo Cho

SMITHERS RAPRA TECHNOLOGY LTD, 2013　2013/09

ISBN: 9781909030213
Applied Scanning Probe Methods X-Biomimetics and Industrial Applications-

Yasuo Cho

Springer　2008

ISBN: 9783540740841
Roadmap of Scanning Probe Microscopy

共著

Springer (Germany)　2006

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通研インポート200703
Polar Oxides - Properties, Characterization, and Imaging

EDITED BY R.Waser, U.BÖttger, Y. Cho

S.Tiedke(Germany)　2005
Ferroelectric Thun Films – Basic Properties and Device Physics for Memory Applications

EDITED BY, M.Okuyama, Y.Ishibashi(Japa, Yasuo Cho

Springer(Germany)　2005
分極反転デバイスの基礎と応用

宮澤信太郎, 栗村直監修, 長康雄

オプトロニクス社　2005
走査プローブ顕微鏡と局所分光

重川秀美, 吉村雅満, 坂田亮, 川津璋編, 長康雄

裳華房　2005
走査型プローブ顕微鏡最新技術と未来予測

森田清三, 編著, 長康雄

Maruzen　2005
強誘電体メモリーの新展開

石原宏監修, 長康雄

シーエムシー出版　2004
Nanoscale Characterization of Ferroelectric Materials-Scanning Probe Microscopy Approach

EDITED BY, M.Alexe, A.Gruverman, Y.Cho

Springer(New York)　2004
Ferroelectric Random Access Memories –Fundamentals and Applications

EDITED BY, Hiroshi Ishiwara, Masanori Okuyama, Yoshihiro Arimoto, Yasuo Cho

Springer(New York)　2004
Advances in IMAGING and ELECTRON PHYSICS

EDITED BY, PETER W. HAWKES, YASUO CHO

Academic Press(New York)　2003
ナノテクノロジー大事典

川合知二監修, 長康雄

工業調査会　2003
誘電体材料の特性と測定・評価および応用技術

技術情報協会, 長康雄

技術情報協会　2001
超音波便覧

超音波便覧編集委員会編, 長康雄

Maruzen　1999
Handbook of Acoustic Devices

CHO Yasuo

1991
Properties of Lithium Niobate

CHO Yasuo

1989

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Presentations 950

Nanosecond Dielectric Response by Optical Irradiation for High Speed SNDM Probe Memory International-presentation Invited

Yasuo Cho

ISyDMA’9　2025/05/08
時間分解走査型非線形誘電率顕微鏡によるSiO2/SiC の温度制御局所DLTS測定

山末耕平, 長康雄

第72回回応用物理学会春季学術講演会　2025/03/17
熱アシスト誘電体記録における光照射ナノ秒誘電応答

長康雄, 山末耕平

第72回回応用物理学会春季学術講演会　2025/03/15
SAWデバイスに多用される多結晶金属材料の非線形弾性定数の決定

長康雄, 中川亮, 米田年麿, 中尾武志, 池浦守

第72回回応用物理学会春季学術講演会　2025/03/15
MOS Interface Charge State Mapping by Scanning Nonlinear Dielectric Microscopy International-presentation Invited

Yasuo Cho

INEC 2025　2025/01/04
Combined Local DLTS/CV Measurement of Al2O3/OH-Diamond (111) Interface by Time-Resolved Scanning Nonlinear Dielectric Microscopy International-presentation

Yasuo Cho

MRS Fall Meeting & Exhibit 2024　2024/12/04
Determination of Nonlinear Elastic Constants of Polycrystalline Metallic Materials Used in Surface Acoustic Wave Devices International-presentation

Yasuo Cho

UFFC-JS 2024 (Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium)　2024/09/26
Measurement of Stress Free Electrostrictive Constants and Nonlinear Dielectric Constants of LiNbO3 Single Crystal International-presentation

Yasuo Cho

UFFC-JS 2024 (Ultrasonics, Ferroelectrics, and Frequency Control Joint Symposium)　2024/09/24
走査型非線形誘電率顕微鏡によるAl2O3/OHダイヤモンド(111)の局所DLTS/CV特性同時測定

山末耕平, 松本翼, 德田規夫, 長康雄

第85回応用物理学会秋季学術講演会　2024/09/19
第一原理計算を用いた Si(111)-(7x7)表面における表面双極子の可視化

住吉晶, 山末耕平, 長康雄, 中村淳

第85回応用物理学会秋季学術講演会　2024/09/18
実用的強誘電体記録を目指したPZT大面積記録媒体の開発

長康雄, 平永良臣

第85回応用物理学会秋季学術講演会　2024/09/17
HAFeR技術開発の為の時間分解SNDM法

長康雄, 山末耕平

第85回応用物理学会秋季学術講演会　2024/09/17
Nanoscale probing of charge states at the Al2O3/OH-diamond (111) interface and their impact on diamond MOSFET performance International-presentation

Kohei Yamasue, Yu Ogata, Tsubasa Matsumoto, Norio Tokuda, Yasuo Cho

The 14th International Conference on Nitride Semiconductors (ICDCM2024)　2024/09/04
Heat Assisted Ferroelectric Reading for High Speed SNDM Ferroelectric Probe Data Storage International-presentation

Yasuo Cho

ECOSS-37 : European Conference on Surface Science　2024/06/20
Heat‐Assisted Ferroelectric Reading for High-Speed Scanning Nonlinear Dielectric Microscopy Ultrahigh‐Density Ferroelectric Data Storage International-presentation Invited

Yasuo Cho

ISyDMA’8 : 8th International Symposium on Dielectric Materials and Applications　2024/05/14
局所C-Vマップの画像処理に基づくナノスケール強誘電分極反転ダイナミクスの解析

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

第71回応用物理学会春季学術講演会　2024/03/24
周期的傾斜分極反転構造とベタ電極からなるSAWデバイス

松村理司, 島野耀康, 大野直輝, 柳谷隆彦, 長康雄

第71回応用物理学会春季学術講演会　2024/03/24
LiNbO3単結晶のstress free電歪定数と非線形誘電定数の計測

長康雄, 中川亮, 米田年麿, 中尾武志, 池浦守

第71回応用物理学会春季学術講演会　2024/03/23
時間分解走査型非線形誘電率顕微鏡による局所MOS容量-電圧特性測定とゆらぎ解析

山末耕平, 長康雄

第71回応用物理学会春季学術講演会　2024/03/23
走査型プローブ顕微鏡が切り開く表面科学と電子デバイス応用への展開～走査型非線形誘電率顕微鏡を中心として～ Invited

長康雄

第68回数理工学センター(MCME)セミナー　2024/03/11
走査型非線形誘電率顕微鏡を用いたGaN-MOSの高性能化に資する計測評価

長康雄

INNOPELシンポジウム2023　2024/02/28
SAWデバイスの非線形性に関するこれまでの研究 Invited

中川亮, 長康雄

圧電材料・デバイスシンポジウム2024　2024/01/30
周期的傾斜分極反転構造を用いたベタ電極によるSAWの励振

松村理司, 島野耀康, 大野直輝, 柳谷隆彦, 長康雄

圧電材料・デバイスシンポジウム2024　2024/01/29
LiTaO3単結晶の総ての非線形定数の決定 Invited

長康雄

圧電材料・デバイスシンポジウム2024　2024/01/29
A simulation for the in-plane distribution of the surface dipole moment using DFT calculations International-presentation

Akira Sumiyoshi, Kohei Yamasue, Yasuo Cho, Jun Nakamura

The 31st International Colloquium on Scanning Probe Microscopy (ICSPM31)　2023/12/08
Heat Assisted Ferroelectric Reading for High Speed Ferroelectric Probe Data Storage International-presentation

Yasuo Cho

2023 MRS Fall Meeting & Exhibit　2023/11/30
Local Capacitance-Voltage Profiling of Al2O3/OH-Diamond (111) by Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Yu Ogata, Tsubasa Matsumoto, Norio Tokunaga, Yasuo Cho

2023 MRS Fall Meeting & Exhibit　2023/11/29
Nanoscale Fluctuation Analysis on Capacitance-Voltage Profiles of Semiconductors by Time-Resolved Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Yasuo Cho

2023 MRS Fall Meeting & Exhibit　2023/11/28
SNDM Study on Cubic and Hexagonal Epitaxially Stacked SiC MOS Interfaces International-presentation

Yasuo Cho, Hiroyuki Nagasawa, Masao Sakuraba, Shigeo Sato

2023 MRS Fall Meeting & Exhibit　2023/11/28
Determination of Nonlinear Dielectric and Electrostrictive Constants of Lithium Tantalate Single Crystal International-presentation

Yasuo Cho, Ryo Nakagawa, Toshimaro Yoneda, Takeshi Nakao, Mamoru Ikeura

2023 MRS Fall Meeting & Exhibit　2023/11/28
Microscopic evaluation of SiO2/GaN interface for power device applications by scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Katsunori Ueno, Tsurugi Kondo, Ryo Tanaka, Shinya Takasima, Yasuo Cho

2023/11/16
時間分解走査型非線形誘電率顕微鏡によるAl2O3/ダイヤモンドの局所容量-電圧特性のナノスケールゆらぎ評価

山末耕平, 尾形結友, 松本翼, 德田規夫, 長康雄

第43回ナノテスティングシンポジウム (NANOTS2023)　2023/11/07
Heat-assisted Ferroelectric Reading for High Speed Ultrahigh-density Ferroelectric Data Storage International-presentation

Yasuo Cho

MS&T 23　2023/10/02
熱アシストSNDM強誘電体プローブメモリ

長康雄

第84回応用物理学会秋季学術講演会　2023/09/22
第一原理計算を用いたSi(111)-(2x2)表面における表面双極子の可視化

住吉晶, 山末耕平, 長康雄, 中村淳

第84回応用物理学会秋季学術講演会　2023/09/22
時間分解SNDMによるAl2O3/ダイヤモンドの局所MOS容量-電圧特性測定

山末耕平, 尾形結友, 松本翼, 德田規夫, 長康雄

第84回応用物理学会秋季学術講演会　2023/09/21
3C-SiC/4H-SiC積層構造MOS界面のSNDM評価

長康雄, 長澤弘幸, 櫻庭政夫, 佐藤茂雄

第84回応用物理学会秋季学術講演会　2023/09/21
LiTaO3単結晶の非線形定数の計測

長康雄, 中川亮, 米田年麿, 中尾武志, 池浦守

第84回応用物理学会秋季学術講演会　2023/09/20
Capacitance Variation Under Applied Electric Field and Stress for Nonlinear Dielectric and Electrostrictive Constants of Lithium Tantalate Single Crystal International-presentation

Yasuo Cho, Ryo Nakagawa, Toshimaro Yoneda, Takeshi Nakao, Mamoru Ikeura

IUS 2023　2023/09/06
Velocity Variation Under Applied Electric Field and Stress for Nonlinear Piezoelectric and Elastic Constants of Lithium Tantalate Single Crystal International-presentation

Yasuo Cho, Ryo Nakagawa, Toshimaro Yoneda, Takeshi Nakao, Mamoru Ikeura

IUS 2023　2023/09/05
Carrier distribution in mechanicallyexfoliated WSe2/SiO2 and suspended WSe2 measured by scanning nonlinear dielectric microscopy International-presentation

Yasuo Cho

ecoss 36　2023/08/31
Heat-Assisted Ferroelectric Reading for Scanning Nonlinear Dielectric Microscopy Probe Memory International-presentation

Yasuo Cho, Yoshiomi Hiranaga

IEEE International Symposium on Applications of Ferroelectrics (ISAF2023)　2023/07/27
Dynamic Measurement of Capacitance Variation Under Applied Electric Field for Lithium Tantalate Single Crystal with Nonlinear Dielectric Constants International-presentation

Yasuo Cho, Ryo Nakagawa, Toshimaro Yoneda, Takeshi Nakao, Mamoru Ikeura

IEEE International Symposium on Applications of Ferroelectrics (ISAF2023)　2023/07/25
Research on Correlation Between Grain Boundaries and Ferroelectric Switching Behaviors Through Statistical Analysis of Local C-V Map Datasets International-presentation

Yoshiomi Hiranaga, Yuki Noguchi, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho

IEEE International Symposium on Applications of Ferroelectrics (ISAF2023)　2023/07/24
時間分解SNDMによる界面欠陥準位の可視化 Invited

長康雄

日本顕微鏡学会第79回学術講演会　2023/06/27
傾斜歪希土類鉄ガーネット薄膜におけるフレクソエレクトリック分極 Invited

山原弘靖, Feng Bing, 関宗俊, 足立真輝, Shamim Sarker, 武田崇仁, 小林正起, 石川亮, 幾原雄一, 長康雄, 田畑仁

第70回応用物理学会春季学術講演会　2023/03/17
走査型非線形誘電率顕微鏡によるブラックシリコン太陽電池のキャリア分布イメージング International-coauthorship

長康雄, Iandolo Beniamino, Hansen Ole

第70回応用物理学会春季学術講演会　2023/03/17
局所C-Vマップの機械学習解析に基づくグレイン境界と強誘電ドメイン挙動の相関に関する統計的評価

平永良臣, 野口雄貴, 三村和仙, 清水荘雄

第70回応用物理学会春季学術講演会　2023/03/16
Investigation of development of stoichiometric LiNbO3 recording media for SNDM probe memory

Nana Sun, Kanamori Hiroaki, Iizuka Takeshi, Konishi Akio, Yasuo Cho

2023/03/15
SNDM強誘電体プローブメモリにおける超高速再生法の提案

長康雄, 平永良臣

第70回応用物理学会春季学術講演会　2023/03/15
Correlation analysis on local capacitance-voltage profiles of a SiO2/SiC interface observed by time-resolved scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Yasuo Cho

7th IEEE Electron Devices Technology and Manufacturing(EDTM) Conference 2023　2023/03/10
LiTaO3単結晶の総ての非線形定数の決定 Invited

長康雄

圧電材料・デバイスシンポジウム2024　2023/01/29
Statistical analysis of local C-V map data for ferroelectric thin films International-presentation Invited

Yoshiomi Hiranaga, Yasuo Cho

7th International Symposium on Dielectric Materials and Applications (ISyDMA’7)　2022/12/06
Scanning Nonlinear Dielectric Microscopic Investigation of Mechanically Exfoliated WSe2/SiO2 and Suspended WSe2 International-presentation

Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiaki Kato, Yasuo Cho

2022 MRS Fall Meeting & Exhibit　2022/11/30
Microscopic carrier distribution imaging of black silicon solar cell by scanning nonlinear dielectric microscopy International-presentation International-coauthorship

Yasuo Cho, Beniamino Iandolo, Ole Hansen

The 33rd International Photovoltaic Science and Engineering Conference (PVSEC-33)　2022/11/16
Experimental research on curved photovoltaic modules : effects of hot spots, interconnect schemes and curvature on electrical PV performance International-presentation International-coauthorship

Sachiko Jonai, Haruto Morishita, Yasuo Cho, Diego Bronneberg, Martin Huijzer, Angèle Reinders

The 33rd International Photovoltaic Science and Engineering Conference (PVSEC-33)　2022/11/15
時間分解走査型非線形誘電率顕微鏡によるSiO2/SiC の局所容量-電圧特性のナノスケールゆらぎ解析

山末耕平, 長康雄

第42回ナノテスティングシンポジウム (NANOTS2022)　2022/11/08
半導体材料・デバイス評価・解析のための走査型プローブ顕微鏡技術 Invited

長康雄

第42回ナノテスティングシンポジウム (NANOTS2022)　2022/11/08
Real-space analysis on surface potential fluctuations of Al2O3/GaN interfaces by scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Yasuo Cho

International Workshop on Nitride Semiconductor(IWN2022)　2022/10/12
局所C-Vマッピング法による強誘電体薄膜のナノスケール分極反転ダイナミクスのクラスタ解析

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

第83回応用物理学会秋季学術講演会　2022/09/20
Comparative study on carrier distribution of mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy International-presentation

Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, Yasuo Cho

THE 22ND INTERNATIONAL VACUUM CONGRESS (IVC-22)　2022/09/12
Quantitative measurement of active dopant density distribution in black silicon solar cell using scanning nonlinear dielectric microscopy International-presentation International-coauthorship

Yasuo Cho, Beniamino Iandolo, Ole Hansen

49th IEEE Photovoltaic Specialists Conference (PVSC 49)　2022/06/07
Carrier Profile Mapping in a 3D Flash Memory Cell using Scanning Nonlinear Dielectric Microscopy International-presentation Invited

Jun Hirota, Ken Hoshino, Kohei Yamasue, Yasuo Cho

The 6th Electron Devices Technology and Manufacturing Conference (EDTM 2022)　2022/03/09
Local Capacitance-Voltage Profiling on MoS2/SiO2 and MoS2/h-BN/SiO2 by Scanning Nonlinear Dielectric Microscopy Assisted with an Insulating Tip International-presentation

Taiyo Ishizuka, Kohei Yamasue, Yasuo Cho

The 6th Electron Devices Technology and Manufacturing Conference (EDTM 2022)　2022/03/08
Recording Medium Design Aiming at Realizing Ferroelectric Probe Data Storage International-presentation

Yoshiomi Hiranaga, Yasuo Cho

The Sixth International Symposium on Dielectric Materials and Applications　2021/12/17
Nanoscale Domain Dynamics Characterization Using Local C-V Mapping International-presentation Invited

Yoshiomi Hiranaga, Yasuo Cho

The Sixth International Symposium on Dielectric Materials and Applications　2021/12/15
Nanoscale study on surface potential fluctuations of SiO2/SiC interfaces by timeresolved scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Yasuo Cho

52th IEEE Semiconductor Interface Specialists Conference　2021/12/11
Scanning Nonlinear Dielectric Microscopic Investigation of Active Dopant Density Distribution in Black Silicon Solar Cell International-presentation International-coauthorship

Yasuo Cho, Beniamino Iandolo, Ole Hansen

2021 MRS Fall Meeting & Exhibit　2021/12/01
Microscopic Carrier Distribution Imaging of Atomically-Thin van der Waals Semiconductors by Scanning Nonlinear Dielectric Microscopy International-presentation

Yasuo Cho, Kohei Yamasue

2021 MRS Fall Meting & Exhibit　2021/12/02
A Scanning Nonlinear Dielectric Microscopic Investigation of Al2O3/Diamond MOS Interfaces International-presentation

Yasuo Cho, Yu Ogata, Kohei Yamasue, Xufang Zhang, Tsubasa Matsumoto, Norio Tokuda

2021 MRS Fall Meeting & Exhibit　2021/12/01
Simultaneous interface defect density and differential capacitance imaging by time-resolved scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Yasuo Cho

The 47th International Symposium for Testing and Failure Analysis Conference(ISTFA2021)　2021/11/01
Surface potential fluctuations of SiO2/SiC interfaces investigated by local capacitance-voltage profiling based on time-resolved scanning nonlinear dielectric microscopy International-presentation

K. YAMASUE, Y.CHO

ECSCRM 2021　2021/10/27
Nanoscale evaluation of Al2O3/diamond MOS interfaces using time-resolved scanning nonlinear dielectric microscopy International-presentation

Y. OGATA, K. YAMASUE, X. ZHANG, T. MATSUMOTO, N. TOKUDA, Y. CHO

ECSCRM 2021　2021/10/27
時間分解走査型非線形誘電率顕微鏡による直流バイアスストレス印加時のhigh-κ/SiO2/Siにおける局所容量-電圧特性測定

鈴木小春, 山末耕平, 長康雄

第41回ナノテスティングシンポジウム,　2021/10/27
時間分解SNDMを用いたダイヤモンドMOS界面の界面準位密度評価に関する検討

尾形結友, 山末耕平, 張旭芳, 松本翼, 徳田規夫, 長康雄

第41回ナノテスティングシンポジウム,　2021/10/27
時間分解走査型非線形誘電率顕微鏡によるSiO2/SiC界面のナノスケールキャリダイナミクスの可視化

山末耕平, 長康雄

第41回ナノテスティングシンポジウム　2021/10/25
Local Capacitance-Voltage Profiling and Deep Level Transient Spectroscopy of SiO2/SiC Interfaces by Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Yasuo Cho

IPFA2021　2021/09/14
Nanoscale characterization techniques for ultra-thin van der Waals semiconductors based on scanning nonlinear dielectric microscopy International-presentation Invited

Kohei Yamasue, Yasuo Cho

The 5th international symposium on“Elucidation of Next Generation Functional Materials・Surface and Interface Properties”　2021/10/08
Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack International-presentation

Koharu Suzuki, Kohei Yamasue, Yasuo Cho

ESREF2021　2021/10/07
Local capacitance-voltage profiling and high voltage stress effect study of SiO2/SiC structures by time-resolved scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Koharu Suzuki, Yasuo Cho

ESREF2021　2021/10/05
Nanoscale analysis of unintentional p- to n-type transition on ultrathin MoS2 layers International-presentation

Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, Yasuo Cho

ICN+T 2021　2021/07/14
Nanoscale capacitance-voltage characteristics measurement of a high-κ/SiO2/Si gate stack effected by DC bias stress International-presentation

Koharu Suzuki, Kohei Yamasue, Yasuo Cho

ICN+T 2021　2021/07/14
内因的非線形誘電率の温度依存性と強誘電体プローブデータストレージにおける媒体材料設計

平永良臣, 長康雄

第38回強誘電体会議　2021/06/03
局所 C-V 曲線で観るナノスケール強誘電分極反転挙動

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

第38回強誘電体会議　2021/06/02
Downscaling and Low Temperature Deposition of Ferroelectric (Al1-xScx)N Thin Films Deposited by Dual Sputtering International-presentation

Shinnosuke Yasuoka, Takao Shimizu, Masato Uehara, Hiroshi Yamada, Morito Akiyama, Yoshiomi Hiranaga, Yasuo Cho, Hiroshi Funakubo

IEEE ISAF-ISIF-PFM 2021 Virtual Conference　2021/05/19
Local C-V Characterization for Ferroelectric Films International-presentation

Yoshiomi Hiranaga, Takanori Mimura, Takao Shimizu, Hiroshi Funakubo, Yasuo Cho

IEEE ISAF-ISIF-PFM 2021 Virtual Conference　2021/05/19
局所C-Vマッピングを用いた強誘電分極反転挙動のナノスケール評価

平永良臣, 長康雄

第68回応用物理学会春季学術講演会　2021/03/18
強誘電体薄膜における分極反転挙動のナノスケールマッピング

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

第68回応用物理学会春季学術講演会　2021/03/16
Microscopic capacitancevoltage characteristics measurement of a SiO2/SiC MOS structure by timeresolved scanning nonlinear dielectric microscopy International-presentation

K. Yamasue, Y. Cho

51th IEEE Semiconductor Interface Specialists Conference　2020/12/17
Nanoscale Evaluation of DC Bias Stress Induced Interface Defect Density of a High-κ/SiO2/Si Gate Stacks using TimeResolved Scanning Nonlinear Dielectric Microscopy International-presentation

K.Suzuki, K. Yamasue, Y. Cho

51th IEEE Semiconductor Interface Specialists Conference　2020/12/17
Nanoscale comparison of bias dependent carrier distributions in mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy International-presentation

K.Takano, K. Yamasue, T.Kato, T. Kaneko, Y. Cho

51th IEEE Semiconductor Interface Specialists Conference　2020/12/16
A Scanning Nonlinear Dielectric Microscopic Investigation of Potential-Induced Degradation in Monocrystalline Silicon Solar Cells International-presentation

Yasuo Cho, Sachiko Jonai, Atsushi Masuda

2020 VIRTUAL MRS SPRING/FALL MEETING & EXHIBIT　2020/11/28
SNDMによる半導体材料・素子評価の将来展望 Invited

長康雄

第40回ナノテスティングシンポジウム(NANOTS2020)　2020/11/16
Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETs International-presentation

Kohei Yamasue, Yasuo Cho

31ST EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS(ESREF 2020)　2020/10/06
Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy International-presentation

Jun Hirota, Kohei Yamasue, Yasuo Cho

31ST EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES, FAILURE PHYSICS AND ANALYSIS(ESREF 2020)　2020/10/05
Intirinsic Nonlinear Permittivity Enhancement Through Curie-Point Control Aimimg at Improving Readout Speed in Ferroelectric Probe Data Storage International-presentation

Yoshiomi Hiranaga, Yasuo Cho

IEEE IFCS-ISAF 2020 Virtual Conference　2020/07/20
Atomic resolution studies on surface dipoles by noncontact scanning nonlinear dielectric microscopy and potentiometry International-presentation Invited

Kohei Yamasue, Yasuo Cho

IEEE IFCS-ISAF 2020 Virtual Conference　2020/07/23
Temperature Dependence of Intrinsic Nonlinear Permittivity and Material Design of Recording Media for Ferroelectric Probe Data Storage

2020/05/27
Scanning nonlinear dielectric microscopy nano science and technology for next generation ultra-high density ferroelectric data storage beyond hard disk drive and flash memory International-presentation Invited

Yasuo Cho

ISyDMA’5 Virtual Edition　2020/04/15
Observation of interface state density distribution in macrostepped SiO2/SiC using local-DLTS(2) International-coauthorship

Anna Hosaka, Kohei Yamasue, Judith Woerl, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho

2020/03/15
⾛査型⾮線形誘電率顕微鏡による機械剥離WSe2/SiO2と架橋型WSe2のキャリア分布の観察

高野幸喜,山末耕平,加藤俊顕,金子俊郎,長康雄

第67回応用物理学会春季学術講演会　2020/03/15
キュリー点制御による内因的⾮線形誘電率の増⼤とその強誘電体プローブデータストレージへの応⽤

平永良臣,長康雄

第67回応用物理学会春季学術講演会　2020/03/14
界⾯⽋陥分布の空間スケールとSiC MOSFETの電界効果移動度の関係に関する数値的検討

山末耕平,長康雄

第67回応用物理学会春季学術講演会　2020/03/13
2D Interface Defect Density Evaluation on Macrostepped SiO2/SiC Using Local Deep Level Transient Spectroscopy Based on Scanning Nonlinear Dielectric Microscopy International-presentation

A. Hosaka, K. Yamasue, J. Woerle, G. Ferro, U. Grossner, M. Camarda, Y. Cho

50th IEEE Semiconductor Interface Specialists Conference　2019/12/12
A New Evaluation Technique for Interface Defect Density on High-κ/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric Microscopy International-presentation

K. Suzuki, K. Yamasue, Y. Cho

50th IEEE Semiconductor Interface Specialists Conference　2019/12/12
High resolution characterizations of fine structure of electric devices and materials using scanning nonlinear dielectric microscopy International-presentation Invited

Yasuo Cho

High Frequency Scanning Probe Microscopy Workshop　2019/12/12
Nanoscale carrier distribution imaging on atomically-thin layered semiconductors by scanning nonlinear dielectric microscopy International-presentation Invited

Kohei Yamasue, Yasuo Cho

The 4th international symposium on “Elucidation of Property of Next Generation Functional Materials and Surface/Interface”　2019/12/09
Unintentional n-Type Doping on Single Layer Nb-Doped MoS2 Observed by Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Yasuo Cho

2019 MRS Fall Meeting & Exhibit　2019/12/05
走査型非線形誘電率顕微鏡による半導体キャリア分布観察のための絶縁膜付き探針の開発と層状半導体評価への応用

高野幸喜, 山末耕平, 長康雄

第39回ナノテスティングシンポジウム, (NANOTS2019)　2019/11/19
間欠接触走査型非線形誘電率顕微鏡を用いた半導体キャリア分布観察における信号雑音比の改善

山末耕平, 長康雄

第39回ナノテスティングシンポジウム, (NANOTS2019)　2019/11/19
高調波∂C/∂z-SNDM信号を用いた半導体評価

平永良臣, 長康雄

第39回ナノテスティングシンポジウム, (NANOTS2019)　2019/11/18
時間分解・局所DLTS 法を用いたマクロステップを有する SiO2/SiCの界面準位密度分布評価

保坂杏奈, 山末耕平, J. Woerle, G. Ferro, U. Grossner, M. Camarda, 長康雄

第39回ナノテスティングシンポジウム (NANOTS2019)　2019/11/18
Carrier profiling of the 10-nm-order structure in a 3D Flash memory cell using scanning nonlinear dielectric microscopy International-presentation

Jun Hirota, Ken Hoshino, Tsukasa Nakai, Kohei Yamasue, Yasuo Cho

International Symposium for Testing and Failure Analysis 2019 (ISTFA 2019)　2019/11/14
Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Yasuo Cho

International Symposium for Testing and Failure Analysis 2019 (ISTFA 2019)　2019/11/13
Carrier Distribution Investigation of Potential-Induced Degradation in Monocrystalline Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy International-presentation

Yasuo Cho

The 29th International PV Science and Engineering Conference (PVSEC-29)　2019/11/07
Boxcar averaging based scanning nonlinear dielectric microscopy and its application to carrier distribution imaging on 2D semiconductors International-presentation

Kohei Yamasue, Yasuo Cho

2019 International Integrated Reliability Workshop (IIRW)　2019/10
A study on evaluation of interface defect density on high-κ/SiO2/Si and SiO2/Si gate stacks using scanning nonlinear dielectric microscopy International-presentation

Koharu Suzuki, Kohei Yamasue, Yasuo Cho

2019 International Integrated Reliability Workshop (IIRW)　2019/10
Spatially-resolved evaluation of interface defect density on macrostepped SiO2/SiC using local deep level transient spectroscopy International-presentation International-coauthorship

Anna Hosaka, Kohei Yamasue, Judith Woerle, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho

2019 International Integrated Reliability Workshop (IIRW)　2019/10
Spatially Resolved Defect Mapping of the SiO2/4H-SiC Interface

Judith Woerle, Brett Johnson, Corrado Bongiorno, Kohei Yamasue, Gabriel Ferro, Dipanwita Dutta, Yasuo Cho, Ulrike Grossner, Massimo Camarda

International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)　2019/10/02
Flexoelectricity and magnetism in strain-gradient rare-earth iron garnet thin films International-presentation

Hiroyasu Yamahara, Sarker Md Shamim, Munetoshi Seki, Yasuo Cho, Hitoshi Tabata

26th International Workshop on Oxide Electronics (iWOE26)　2019/10/01
Influence of non-uniform interface defect distribution on channel mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation International-presentation

Kohei Yamasue, Yuji Yamagishi, Yasuo Cho

International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)　2019/10/01
Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Yasuo Cho

The 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis(ESREF 2019)　2019/09/25
SNDM強誘電体プローブデータストレージの再生信号強度に関する現象論的考察

平永良臣, 長康雄

第80回応用物理学会秋季学術講演会　2019/09/19
不均一な界面欠陥分布がSiC MOSFETのチャネル移動度に及ぼす影響 ― 局所DLTS測定とデバイスシミュレーションに基づく検討 ―

山末耕平, 山岸裕史, 長康雄

第80回応用物理学会秋季学術講演会　2019/09/19
局所DLTS法を用いたマクロステップを有するSiCにおける界面準位密度分布の測定

保坂杏奈, 山末耕平, Judith Woerle, Corrado Bongiorno, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, 長康雄

第80回応用物理学会秋季学術講演会　2019/09/19
傾斜格子歪み希土類鉄ガーネットにおけるフレクソ分極とフェリ磁性の共存

山原弘靖, Sarker Md. Shamim, 関宗俊, 長康雄, 田畑仁

第80回応用物理学会秋季学術講演会　2019/09/18
走査型非線形誘電率顕微鏡を用いたSiO2/Siにおける界面状態不均一の可視化に関する検討

鈴木小春, 山末耕平, 長康雄

第80回応用物理学会秋季学術講演会　2019/09/18
絶縁膜付き探針を用いた層状半導体のSNDM観察

高野幸喜, 山末耕平, 長康雄

第80回応用物理学会秋季学術講演会　2019/09/18
Improvement of Signal-to-Noise Ratio in Carrier Distribution Imaging in Intermittent Contact Scanning Nonlinear Dielectric Microscopy Based on Boxcar Integration International-presentation

Kohei Yamasue, Yasuo Cho

18th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII)　2019/09/10
High-Resolution Observation of Ferroelectric Domains Using Scanning Nonlinear Dielectric Microscopy With Ultra Sharp Diamond Probe International-presentation

Tomotaka Ishida, Yoshiomi Hiranaga, Yasuo Cho

Asia-Pacific PFM 2019　2019/08/12
∂C/∂z-Mode Scanning Nonlinear Dielectric Microscopy for Linear Permittivity Imaging International-presentation Invited

Yoshiomi Hiranaga, Yasuo Cho

Asia-Pacific PFM 2019　2019/08/12
High Resolution Mapping of Defects at SiO2/SiC Interfaces by Local-DLTS Based on Time Resolved Scanning Nonlinear Dielectric Microscopy International-presentation

Yuji Yamagishi, Yasuo Cho

The International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA ) 2019　2019/07/05
Surface dipole induced potentials on metals observed by noncontact scanning nonlinear dielectric potentiometry International-presentation

Kohei Yamasue, Yasuo Cho

The 17th International Conference on the Formation of Semiconductor Interfaces (ICFSI-17)　2019/06/27
Local Dielectric Dispersion Characterization Using Electrostatic Force Microscopy with Dual-Bias Modulation

HIRANAGA Yoshiomi, CHO Yasuo

fma-36　2019/05/30
High Resolution Observation of Subsurface Defects at SiO2/4H-SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy International-presentation

Y. Yamagishi, Y. Cho

IRPS 2019　2019/03/31
極細導電性探針を用いた高分解能強誘電ドメイン観察

石田知嵩, 平永良臣, 長康雄

第66回応用物理学会春季学術講演会　2019/03/11
二重バイアス変調静電引力顕微鏡を用いたポリフッ化ビニリデンの誘電緩和測定

平永良臣, 長康雄

第66回応用物理学会春季学術講演会　2019/03/11
非接触走査型非線形誘電率ポテンショメトリによる金属表面の双極子誘起電位の観察

山末耕平, 長康雄

第66回応用物理学会春季学術講演会　2019/03/11
走査型非線形誘電率顕微鏡による半導体キャリア分布観察のための絶縁膜付きカンチレバーの開発 (2)

高野幸喜, 山末耕平, 長康雄

第66回応用物理学会春季学術講演会　2019/03/10
高調波∂C/∂z-SNDM信号を用いた半導体キャリア分布観察

平永良臣, 長康雄

第66回応用物理学会春季学術講演会　2019/03/09
走査型非線形誘電率顕微鏡 Invited

長康雄

第23回結晶工学セミナー　2018/12/21
High Resolution Mapping of Subsurface Defects at SiO2/SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy International-presentation

Y. Yamagishi, Y. Cho

SISC 2018　2018/12/08
Local Evaluation of Non-Uniform Charge Distribution in Al2O3 Passivation Layers for Silicon Solar Cells Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy International-presentation

Kento Kakikawa, Yuji Yamagishi, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

2018 MRS Fall Meeting & Exhibit　2018/11/29
Nanoscale Linear Dielectric Constant Imaging Using ∂C/∂z -Mode Scanning Nonlinear Dielectric Microscopy International-presentation

Yoshiomi Hiranaga, Yasuo Cho

2018 MRS Fall Meeting & Exhibit　2018/11/28
High-Resolution Observation of Defects at SiO2/SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy International-presentation

Yuji Yamagishi, Yasuo Cho

2018 MRS Fall Meeting & Exhibit　2018/11/27
Electric Field Effects on Few-Layer WSe2/SiO2 Investigated by Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, Yasuo Cho

2018 MRS Fall Meeting & Exhibit　2018/11/25
超高次走査型非線形誘電率顕微鏡法による結晶シリコン太陽電池用Al2O3パッシベーション膜の微視的評価

柿川賢斗, 山岸裕史, 棚橋克人, 高遠秀尚, 長康雄

第38回ナノテスティングシンポジウム　2018/11/20
走査型非線形誘電率顕微鏡による数層MoS2のキャリア分布観察における信号強度の改善

山末耕平, 長康雄

第38回ナノテスティングシンポジウム　2018/11/20
∂C/∂z-SNDM による半導体評価に関する数値シミュレーション

平永良臣, 長康雄

第38回ナノテスティングシンポジウム　2018/11/19
High resolution mapping of subsurface defects at SiO2/SiC interfaces by local deep level transient spectroscopy

Y. Yamagishi, Y. Cho

2018/11/19
Novel carrier measurement methodology for floating gate of sub-20 nm node flash memory using scanning nonlinear dielectric microscopy International-presentation

Jun Hirota, Yuji Yamagishi, Shiro Takeno, Yasuo Cho

ISTFA 2018　2018/10/29
High resolution mapping of subsurface defects at SiO2/SiC interfaces by time-resolved scanning nonlinear dielectric microscopy International-presentation

Yuji Yamagishi, Yasuo Cho

ISTFA 2018　2018/10/29
Quantitative imaging of carrier distribution in silicon solar cell using scanning nonlinear dielectric microscopy International-presentation

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

ISTFA 2018　2018/10/29
Nanoscale Permittivity Imaging Using ∂C/∂z-mode Scanning Nonlinear Dielectric Microscopy International-presentation

Y. Hiranaga, Y. Cho

ACSIN-14 & ICSPM26　2018/10/25
Evaluation of Local Charge State in Al2O3 Passivation Layers of Silicon Solar Cells Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy International-presentation

K. Kakikawa, Y. Yamagishi, K. Tanahashi, H. Takato, Y. Cho

ACSIN-14 & ICSPM26　2018/10/23
Few-layer WSe2 on SiO2 Observed by Scanning Nonlinear Dielectric Microscopy and Electrostatic Force Microscopy International-presentation

K. Yamasue, T. Kato, T. Kaneko, Y. Cho

ACSIN-14 & ICSPM26　2018/10/22
High resolution observation of defects at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy International-presentation

Yuji Yamagishi, Yasuo Cho

ESREF2018　2018/10/04
ブラックシリコンのキャリア分布評価に向けた非線形誘電率顕微鏡法の適用可能性の検討

柿川賢斗, 長康雄

第79回応用物理学会秋季学術講演会　2018/09/20
∂C/∂z-SNDM法による半導体ドーパント濃度測定に関する数値シミュレーション

平永良臣, 長康雄

第79回応用物理学会秋季学術講演会　2018/09/19
High resolution characterizations of fine structure of semiconductor device and material using scanning nonlinear dielectric microscopy Invited

CHO Yasuo

2018/09/19
走査型非線形誘電率顕微鏡による半導体キャリア分布観察のための絶縁膜付きカンチレバーの開発

高野幸喜, 山末耕平, 長康雄

第79回応用物理学会秋季学術講演会　2018/09/18
走査型非線形誘電率顕微鏡と静電気力顕微鏡を用いたSiO2上剥離WSe2におけるキャリア分布観察

山末耕平, 加藤俊顕, 金子俊郎, 長康雄

第79回応用物理学会秋季学術講演会　2018/09/18
High-resolution observation of defects at nitride SiO2/4H-SiC interfaces by local deep level transient spectroscopy International-presentation

Y. Yamagishi, K. Yamasue, Y. Cho

ECSCRM2018　2018/09/04
DC bias dependent nanoscale carrier distribution on a few-layer WSe2 on SiO2 observed by scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, Yasuo Cho

ecoss34　2018/08/29
Nanoscale Linear Permittivity Imaging Based on Scanning Nonlinear Dielectric Microscopy International-presentation Invited

Yoshiomi Hiranaga, Yasuo Cho

IUMRS-ICEM 2018　2018/08/21
∂C/∂z-mode scanning nonlinear dielectric microscopy for imaging nanoscale linear permittivity International-presentation

Yoshiomi Hiranaga, Yasuo Cho

ICN+T2018　2018/07/27
Scanning nonlinear dielectric microscopy study on nanoscale carrier distribution in two dimensional semiconductors International-presentation

Kohei Yamasue, Yasuo Cho

ICN+T2018　2018/07/24
Development of time-resolved scanning nonlinear dielectric microscopy and its application to local deep level transient spectroscopy International-presentation

Norimichi Chinone, Yasuo Cho

ICN+T2018　2018/07/23
Quantitative Imaging of MOS Interface Trap Distribution by Using Local Deep Level Transient Spectroscopy International-presentation

Norimichi Chinone, Yasuo Cho

IPFA 2018　2018/07/18
Quantitative Evaluation of Carrier Distribution in Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy International-presentation

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

IPFA 2018　2018/07/18
Imaging of nanoscale linear permittivity by using ∂C/∂z-mode scanning nonlinear dielectric microscopy International-presentation

Yoshiomi Hiranaga, Yasuo Cho

Electroceramics XVI　2018/07/09
∂C/∂z-Mode Scanning Nonlinear Dielectric Microscopy for Local Permittivity Imaging International-presentation

Yoshiomi Hiranaga, Yasuo Cho

ECAPD-2018　2018/06/27
Measurement Method of Depth Profile in Polarity-Inverted Layered Structure Using Scanning Nonlinear Dielectric Microscopy with Soft Probe tip International-presentation

Hiroyuki Odagawa, Yohei Tanaka, Yasuo Cho

ECAPD-2018　2018/06/27
Improved readout speed in ferroelectric probe data storage with large nonlinear permittivity media International-presentation

Reshan Maduka Abeysinghe, Yoshiomi Hiranaga, Yasuo Cho

ECAPD-2018　2018/06/25
∂C/∂z-mode SNDM for imaging nanoscale linear permittivity International-presentation Invited

Yoshiomi HIRANAGA, Yasuo CHO

The 3rd International Symposium on“Recent Trends in the Elucidation and Function Discovery of Next Generation Functional Materials of Surface / Interface Properties　2018/06/19
Local Evaluation of Al2O3 Passivation Layers for Crystalline Silicon Solar Cells by Super-Higher-Order Scanning Nonlinear Dielectric Microscopy International-presentation

Kento Kakikawa, Yuji Yamagishi, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

World Conference on Photovoltaic Energy Conversion(WCPEC7)　2018/06/14
Local Permittivity Measurement Using ∂C/∂z-Mode Scanning Nonlinear Dielectric Microscopy International-presentation

Y. HIRANAGA, Y. CHO

2018 ISAF-FMA-AMF-AMEC-PFM Joint Conference　2018/05/31
HDD Type High Speed Data Readout Demonstrations in Ferroelectric Data Storage Using Pb(Zr,Ti)O3 Recording Medium International-presentation

R. M. ABEYSINGHE, Y. HIRANAGA, Y. CHO

2018 ISAF-FMA-AMF-AMEC-PFM Joint Conference　2018/05/31
Quantitative measurement of active dopant density distribution in textured emitter of phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy International-presentation

CHO Yasuo

TechConnect World 2018　2018/05/16
Scanning nonlinear dielectric microscopy in peak-force tapping mode and its application to transition metal dichalcogenides International-presentation

CHO Yasuo

ISPM2018　2018/05/11
Nondestructive Measurements of Double-Layered Piezoelectric Polarity-Inverted Structure Using Scanning Nonlinear Dielectric International-presentation

CHO Yasuo

Third International Symposium on Dielectric Materials and Applications　2018/04/19
Nanoscale Linear Permittivity Measurement Using Scanning Nonlinear Dielectric Microscopy International-presentation Invited

CHO Yasuo

Third International Symposium on Dielectric Materials and Applications　2018/04/19
走査型非線形誘電率顕微鏡を用いたSiO2上剥離WSe2観察におけるキャリア分布の直流バイアス依存性

山末耕平, 加藤俊顕, 金子俊郎, 長康雄

第65回応用物理学会春季学術講演会　2018/03/20
低温局所DLTS法による伝導帯近傍の界面準位分布の可視化 (2)

阿部貴之, 山岸裕史, 長康雄

第65回応用物理学会春季学術講演会　2018/03/20
高分解能局所DLTSによるSiO2/4H-SiC界面の欠陥分布観察

山岸裕史, 長康雄

第65回応用物理学会春季学術講演会　2018/03/20
走査型非線形誘電率常磁性共鳴顕微鏡法の開発に関する理論的検討

原田明永, 山岸裕史, 長康雄

第65回応用物理学会春季学術講演会　2018/03/19
超高次非線形誘電率顕微鏡法によるシリコン太陽電池用Al2O3パッシベーション膜の微視的評価

柿川賢斗, 山岸裕史, 棚橋克人, 高遠秀尚, 長康雄

第65回応用物理学会春季学術講演会　2018/03/19
バイアス掃引SNDM法による分極反転特性の面内分布観察

平永良臣, 長康雄

第65回応用物理学会春季学術講演会　2018/03/19
Charge State Evaluation of Passivation Layers for Silicon Solar Cells by Scanning Nonlinear Dielectric Microscopy International-presentation

K. Kakikawa, Y. Yamagishi, H. Takato, K. Tanahashi, Y. Cho

IRPS2018　2018/03/14
Nanoscale carrier distribution imaging of layered semiconductor materials using scanning nonlinear dielectric microscopy International-presentation

K. Yamasue, Y. Cho

PCSI 25　2018/01/14
Local deep level transient spectroscopy imaging for MOS interface trap distribution International-presentation

N. Chinone, Y. Cho

PCSI 25　2018/01/14
Demonstration of High Speed Reading in Ferroelectric Data Storage Using Pb(Zr,Ti)O₃ Recording Medium

Reshan Maduka Abeysinghe, Yoshiomi Hiranaga, Yasuo Cho

電子情報通信学会磁気記録・情報ストレージ研究会(MR)　2017/12/07
Local evaluation of Al₂O₃ passivation layers crystalline silicon solar cells by super-higher-order scanning nonlinear dielectric microscopy International-presentation

K. Kakikawa, Y. Yamagishi, H. Takato, K. Tanahashi, Y. Cho

ICSPM25　2017/12/07
Local Carrier Distribution Imaging of Two-Dimensional Semiconductors by Scanning Nonlinear Dielectric Microscopy International-presentation

K. Yamasue, Y. Cho

ICSPM25　2017/12/07
Visualization of Traps at SiO₂/SiC Interfaces near the Conduction Band by Local Deep Level Transient Spectroscopy at Low Temperatures International-presentation

T. Abe, Y. Yamagishi, Y. Cho

ICSPM25　2017/12/07
Quantitative imaging of MOS interface trap using local deep level transient spectroscopy based on scanning nonlinear dielectric microscopy International-presentation

N. Chinone, Y. Cho

48th IEEE Semiconductor Interface Specialists Conference　2017/12/06
Quantitative Measurement of Active Dopant Density Distribution and Evaluation of Effective Diffusivities in Phosphorus-Implanted Monocrystalline Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy International-presentation

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

2017 MRS fall meeting　2017/11/26
Quantitative Imaging of SiO₂/SiC Interface Trap Density Using Local Deep Level Transient Spectroscopy International-presentation

Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho

2017 MRS fall meeting　2017/11/26
EVALUATION OF EFFECTIVE DIFFUSIVITIES AND THREE-DIMENSIONAL SIMULATION OF CARRIER DISTRIBUTION IN PHOSPHORUS-IMPLANTED EMITTER OF SI SOLAR CELL USING SCANNING NONLINEAR DIELECTRIC MICROSCOPY International-presentation

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

PVSEC-27　2017/11/12
局所DLTS法を用いたSiO2/SiC界面欠陥密度の定量イメージング

茅根慎通, 長康雄

第37回ナノテスティングシンポジウム　2017/11/08
高度な欠陥分布評価のための局所DLTSの高度化

山岸裕史, 長康雄

第37回ナノテスティングシンポジウム　2017/11/08
Imaging of MOS Interface Trap Distribution using Local Deep Level Transient Spectroscopy Based on Scanning Nonlinear Dielectric Microscopy International-presentation

N. Chinone, Y. Cho

AVS 64th International Symposium & Exhibition　2017/10/31
Local Carrier and Charge Distribution Imaging on Molybdenum Disulfide by Scanning Nonlinear Dielectric Microscopy International-presentation

K. Yamasue, Y. Cho

ISSS-8 2017　2017/10/22
Alternative Storage Technology Study about Ferro-Electric Recording International-presentation

Yasuo Cho

ASTC Fall 2017 Research Review Meeting　2017/10/16
Two‐dimensional imaging of MOS interface trap using local deep level transient spectroscopy based on scanning nonlinear dielectric microscopy International-presentation

N. Chinone, Y. Cho

DRIP XVII　2017/10/08
DC bias dependence of local deep level transient spectroscopy spectrum and quantitative two-dimensional imaging of SiO₂/SiC interface trap density₂ International-presentation

N. Chinone, R. Kosugi, S. Harada, Y. Tanaka, H. Okumura, Y. Cho

ESREF2017　2017/09/25
Improvement of Local Deep Level Transient Spectroscopy for Microscopic Evaluation of SiO₂/4H-SiC Interfaces International-presentation

Yuji Yamagishi, Yasuo Cho

ICSCRM2017　2017/09/17
DC bias dependence of local deep level transient spectroscopy signal and quantitative two-dimensional imaging of SiO₂/SiC interface trap density International-presentation

N. Chinone, R. Kosugi, Y. Tanaka, S. Harada, H. Okumura, Y. Cho

ICSCRM2017　2017/09/17
Atomic resolution imaging and carrier type determination of Molybdenum disulfide by noncontact scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Yasuo Cho

ecoss33　2017/08/27
走査型プローブ顕微鏡(非線形誘電率顕微鏡)を用いたデバイス観察

2017年真空・表面科学合同講演会　2017/08/17
Local deep level transient spectroscopy for two-dimensional MOS interface characterization based on scanning nonlinear dielectric microscopy International-presentation

N. Chinone, Y. Cho

16th International Conference on the Formation of Semiconductor Interfaces(icsfi2017)　2017/07/02
Quantitative Analysis of Active Dopant Distribution and Estimation of Effective Diffusivity in Phosphorus-Implanted Emitter of Si Solar Cell Using Scanning Nonlinear Dielectric Microscopy International-presentation

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

IEEE PVSC-44　2017/06/25
SNDMによる分極反転過程の動的観察

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

第34回強誘電体応用会議　2017/05/31
走査型非線形誘電率顕微法による層状極性反転圧電薄膜の層厚の定量測定

小田川裕之, 田中陽平, 寺田浩史士, 西川宏明, 柳谷隆彦, 長康雄

第34回強誘電体応用会議　2017/05/31
Local Deep Level Transient Spectroscopy Imaging on Trap Distribution in SiC MOS Interface Based on Scanning Nonlinear Dielectric Microscopy International-presentation

N. Chinone, Y. Cho

The 19th International Scanning Probe Microscopy Conference　2017/05/16
Atomic Resolution Imaging of MoS2 by Scanning Nonlinear Dielectric Microscopy International-presentation

K.Yamasue, Y. Cho

The 19th International Scanning Probe Microscopy Conference　2017/05/16
Dynamic Observation of Nanoscale Domain Switching Behaviors in Ferroelectric HfO2 films Using Scanning Nonlinear Dielectric Microscopy International-presentation

Y. Hiranaga, T. Mimura, T. Shimizu, H. Funakubo, Y. Cho

2017 Joint IEEE ISAF-IWATMD-PFM　2017/05/07
Ferroelectric Probe Data Storage Using HfO₂-Based Thin-Film Recording Media International-presentation

Y. Hiranaga, T. Mimura, T. Shimizu, H. Funakubo, Y. Cho

2017 Joint IEEE ISAF-IWATMD-PFM　2017/05/07
Measurement Method of Multi-layer Piezoelectric Polarity-inverted Structure Using Scanning Nonlinear Dielectric Microscopy International-presentation

H. Odagawa, Y. Tanaka, T. Yanagitani, Y. Cho

2017 Joint IEEE ISAF-IWATMD-PFM　2017/05/07
走査型非線形誘電率顕微鏡(SNDM)による半導体MOS界面評価

日本学術振興会ワイドギャップ半導体光・電子デバイス第162委員会第103回研究会　2017/04/28
Local deep level transient spectroscopy for two-dimensional trap distribution in MOS interface using super-higher-order scanning nonlinear dielectric microscopy International-presentation

The 20th Microscopy of Semi Conducting Materials　2017/04/09
走査型非線形誘電率ポテンショメトリを用いたGaN の自発分極測定に関する実験的検討

山末耕平, 長康雄

第64回応用物理学会春季学術講演会　2017/03/14
∂C/∂z-SNDM法によるナノスケール線形誘電率分布の定量測定

平永良臣, 茅根慎通, 長康雄

第64回応用物理学会春季学術講演会　2017/03/14
走査型非線形誘電率顕微鏡を用いたリンイオン注入単結晶Si太陽電池の活性化ドーパント分布の定量評価及び実効拡散係数の推定

廣瀬光太郎, 棚橋克人, 高遠秀尚, 長康雄

第64回応用物理学会春季学術講演会　2017/03/14
電流計測AFMとSNDMによるSiO2/4H-SiC界面の不均一性評価

山岸裕史, 茅根慎通, 長康雄

第64回応用物理学会春季学術講演会　2017/03/14
走査型非線形誘電率顕微鏡を用いた局所DLTSによる界面トラップ分布の時定数依存性の観察

茅根慎通, 小杉亮治, 田中保宣, 原田信介, 奥村元, 長康雄

第64回応用物理学会春季学術講演会　2017/03/14
走査型非線形誘電率顕微鏡を用いたナノスケール分極反転過程の動的観察

平永良臣, 三村和仙, 清水荘雄, 舟窪浩, 長康雄

第64回応用物理学会春季学術講演会　2017/03/14
走査型非線形誘電率顕微鏡を用いたパワーデバイス中の電荷分布の評価・解析

日本パワーデバイス用シリコンおよび関連半導体材料に関する研究会　2017/02/22
非接触走査型非線形誘電率顕微鏡・ポテンショメトリを用いた表面原子双極子モーメントの観測

日本顕微鏡学会走査型プローブ顕微鏡分科会研究会　2017/02/03
Local Deep Level Transient Spectroscopy Imaging Based on Scanning Nonlinear Dielectric Microscopy International-presentation

Norimichi Chinone, Yasuo Cho

The 2nd International Symposium on “Recent Trends in Analysis Techniques for Functional Materials and Devices　2017/01/17
Polarization Charge Density Measurement by Noncontact Scanning Nonlinear Dielectric Potentiometry International-presentation

K. Yamasue, Y. Cho

ICSPM24　2016/12/14
Y添加HfO₂薄膜における強誘電ドメイン反転のSNDM観察

平永良臣, 長康雄, 三村和仙, 清水荘雄, 舟窪浩

電子情報通信学会磁気記録・情報ストレージ研究会(MR)　2016/12/08
Local deep level Transient Spectroscopy Imaging for Characterization of Two-Dimensional Trap Distribution in SiO2/SiC Interface Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy International-presentation

Norimichi Chinone, Ryoji Kosugi, Yasuonori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho

2016 MRS fall meeting　2016/11/27
Universal Parameter Characterizing SiO₂/SiC Interface Quality Based on Scanning Nonlinear Dielectric Microscopy International-presentation

Norimichi Chinone, Alpana Nayak, Ryoji Kosugi, Yasuonori Tanaka, Shinsuke Harada, Yuji Kiuchi, Hajime Okumura, Yasuo Cho

2016 MRS fall meeting　2016/11/27
走査型非線形誘電率顕微鏡法による局所DLTS法の提案とSiO₂/SiC界面欠陥の高空間分解能可視化技術への応用

茅根慎通, 小杉亮治, 田中保宣, 原田信介, 奥村元, 長康雄

第36回ナノテスティングシンポジウム　2016/11/09
走査型非線形誘電率顕微鏡法によるシリコン太陽電池のキャリア濃度の定量評価

廣瀬光太郎, 棚橋克人, 高遠秀尚, 長康雄

第36回ナノテスティングシンポジウム　2016/11/09
Two-dimensional local deep level transient spectroscopy imaging using super-higher-order scanning nonlinear dielectric microscopy International-presentation

N. Chinone, R.Kosugi, Y. Tanaka, S. Harada, H. Okumura, Y. Cho

ISTFA2016　2016/11/06
Quantitative Analysis of Two-dimensional Carrier Concentration in Phosphorus-implanted Emitter Solar Cell using Scanning Nonlinear Dielectric Microscopy International-presentation

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Yasuo Cho

PVSEC26　2016/10/24
Two-dimensional imaging of trap distribution in SiO2 /SiC interface using local deep level transient spectroscopy based on super-higher-order scanning nonlinear dielectric microscopy International-presentation

N. Chinone, R.Kosugi, Y. Tanaka, S. Harada, H. Okumura, Y. Cho

ecscrm2016　2016/09/25
Universal parameter evaluating SiO2 /SiC interface quality based on scanning nonlinear dielectric microscopy International-presentation

N. Chinone, A. Nayak, R.Kosugi, Y. Tanaka, S. Harada, Y. Kiuchi, H. Okumura, Y. Cho

ecscrm2016　2016/09/25
Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy International-presentation

Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinske Harada, Hajime Okumura, Yasuo Cho

ESREF2016　2016/09/19
SNDM線形誘電率ナノイメージングにおける高調波信号像

平永良臣, 茅根慎通, 長康雄

第77回応用物理学会秋季学術講演会　2016/09/13
非接触走査型非線形誘電率ポテンショメトリによるSi(111)-(7x7)表面における分極電荷密度の原子スケール観察

山末耕平, 長康雄

第77回応用物理学会秋季学術講演会　2016/09/13
走査型非線形誘電率顕微鏡によるSiO₂/4H-SiC界面の局所容量特性評価

山岸裕史, 茅根慎通, 長康雄

第77回応用物理学会秋季学術講演会　2016/09/13
SiO₂/SiC界面欠陥由来による局所DLTS像の直流バイアス依存性観測

茅根慎通, 小杉亮治, 田中保宣, 原田信介, 奥村元, 長康雄

第77回応用物理学会秋季学術講演会　2016/09/13
走査型非線形誘電率顕微鏡を用いた単結晶シリコン太陽電池のリンイオン注入エミッタにおけるドーパント分布の定量測定

廣瀬光太郎, 棚橋克人, 高遠秀尚, 長康雄

第77回応用物理学会秋季学術講演会　2016/09/13
非線形誘電率顕微鏡法を用いた次世代パワーエレクトロニクス用半導体素子の観測

第29回公益社団法人日本セラミックス協会秋季シンポジウム　2016/09/07
非線形誘電率顕微鏡（SNDM）の原理とデバイス計測への応用

JASIS2016　2016/09/06
Surface polarization on a Si(111) reconstructed surface measured by noncontact scanning nonlinear dielectric potentiometry International-presentation

K. Yamasue, Y. Cho

ecoss32　2016/08/28
Nanoscaled Permittivity Distribution Imaging Using an SNDM Probe International-presentation

Y. Hiranaga, N. Chinone, K. Hirose, Y. Cho

2016 Joint ISAF/ECAPD/PFM Conference　2016/08/21
Ferroelectric Nanodomain Observation in Yttrium-Doped HfO2 Thin Films Using Scanning Nonlinear Dielectric Microscopy International-presentation

Z. Chen, Y. Hiranaga, T. Shimizu, K. Katayama, T. Mimura, H. Funakubo, Y. Cho

2016 Joint ISAF/ECAPD/PFM Conference　2016/08/21
Quantitative thickness measurement in polarity-inverted piezoelectric layered thin film using scanning nonlinear dielectric microscopy International-presentation

H. Odagawa, K. Terada, H. Nishikawa, Y. Tanaka, T. Yanagitani, Y. Cho

2016 Joint ISAF/ECAPD/PFM Conference　2016/08/21
Surface polarization measurement on a reconstructed Si(111) surface by noncontact scanning nonlinear dielectric potentiometry International-presentation

K. Yamasue, Y. Cho

NC-AFM 2016　2016/07/25
Proposal of Local Deep Level Transient Spectroscopy Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy and 2-Dimensional Imaging of Trap Distribution in SiO2 /SiC Interface International-presentation

N. Chinone, R.Kosugi, Y. Tanaka, S. Harada, H. Okumura, Y. Cho

IPFA 2016　2016/07/18
Two-Dimensional Characterization of Phosphorus-Implanted Emitter and Phosphorus-Diffused Emitter of Silicon Solar Cell Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy International-presentation

K. Hirose, N. Chinone, Y. Cho

EU PVSEC 2016　2016/06/20
Two-Dimensional Characterization of Active Dopant Distribution in a p-i-n Structured Amorphous Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy International-presentation

K. Hirose, N. Chinone, Y. Cho

EU PVSEC 2016　2016/06/20
An Universal Parameter Showing SiO₂/SiC Interface Quality of Both Silicon and Carbon-face based on Scanning Nonlinear Dielectric Microscopy International-presentation

Norimichi Chinone, Alpana Nayak, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Yuji Kiuchi, Hajime Okumura, Yasuo Cho

ISCSI-VII/ ISTDM 2016　2016/06/07
Two-dimensional Analysis of Carrier Distribution in Phosphorus-Implanted Emitter and Phosphorus-Diffused Emitter using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy International-presentation

Kotaro Hirose, Katsuto Tanahashi, Hidetaka Takato, Norimichi Chinone, Yasuo Cho

43rd IEEE Photovoltaic Specialists Conference　2016/06/05
SNDMによる線形誘電率ナノイメージング

平永良臣, 茅根慎通, 廣瀬光太郎, 長康雄

第33回強誘電体応用会議　2016/05/25
走査型非線形誘電率顕微鏡を用いたdC/dVとdC/dz測定によるキャリア濃度の定量化に関する研究

劉彬, 平永良臣, 茅根慎通, 長康雄

第63回応用物理学会春季学術講演会　2016/03/19
超高次走査型非線形誘電率顕微鏡法を用いた単結晶シリコン太陽電池のリンイオン注入エミッタ層におけるキャリア分布の可視化

廣瀬光太郎, 棚橋克人, 高遠秀尚, 茅根慎通, 長康雄

第63回応用物理学会春季学術講演会　2016/03/19
超高次非線形誘電率顕微鏡法を用いた局所DLTS法の提案とSiO2/SiC界面評価への応用

茅根慎通, 小杉亮治, 田中保宣, 原田信介, 奥村元, 長康雄

第63回応用物理学会春季学術講演会　2016/03/19
SNDM線形誘電率ナノイメージングにおける空間分解能の数値解析

平永良臣, 茅根慎通, 長康雄

第63回応用物理学会春季学術講演会　2016/03/19
走査型非線形誘電率顕微鏡における強誘電性Y:HfO₂薄膜のドメイン反転

陳舟, 平永良臣, 清水荘雄, 片山きりは, 三村和仙, 舟窪浩, 長康雄

第63回応用物理学会春季学術講演会　2016/03/19
非接触走査型非線形誘電率ポテンショメトリとケルビンプローブフォース顕微鏡法の実験的比較

向出周太, 山末耕平, 阿部真之, 長康雄

第63回応用物理学会春季学術講演会　2016/03/19
走査型非線形誘電率ポテンショメトリによる表面自発分極の測定に関する検討

山末耕平, 長康雄

第63回応用物理学会春季学術講演会　2016/03/19
SNDM線形誘電率ナノイメージングに関する有限要素法シミュレーション

平永良臣, 茅根慎通, 長康雄

第63回応用物理学会春季学術講演会　2016/03/19
強誘電性Y:fO2薄膜におけるナノスケールドメイン反転

陳舟, 平永良臣

電子情報通信学会磁気記録・情報ストレージ研究会(MR)　2016/03/04
強誘電体プローブデータストレージ～現状と今後の展開～

平永良臣, 長康雄

電子情報通信学会磁気記録・情報ストレージ研究会(MR)　2015/12/10
Two dimensional electron gas and polarization measurement in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy International-presentation

K. Hirose, Y. Goto, N. Chinone, Y. Cho

ICSPM23　2015/12/10
Graphene on C-terminated Face of 4H-SiC Observed by Noncontact Scanning Nonlinear Dielectric Potentiometry International-presentation

K. Yamasue, H. Fukidome, K. Tashima, M. Suemitsu, Y. Cho

ICSPM23　2015/12/10
Simultaneous Imaging of Atomically Resolved Topography and Potential of Graphene on C-Terminated Face of SiC Using Scanning Nonlinear Dielectric Potentiometry International-presentation

Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho

2015 MRS fall meeting　2015/11/29
Polarization and Two Dimensional Electron Gas Visualization in AlGaN/GaN Heterostructure International-presentation

Kotaro Hirose, Norimichi Chinone, Yasunori Goto, Yasuo Cho

2015 MRS fall meeting　2015/11/29
Negligible Covalent Bonding in Proper Ferroelectric Ferromagnet: Strained La2NiMnO6 Thin Film International-presentation

Ryota Takahashi, Isao Ohkubo, Kunihiko Yamauchi, Miho Kitamura, Yasunari Sakurai, Masaharu Oshima, Tamio Oguchi, Yasuo Cho

2015 MRS fall meeting　2015/11/29
Hard-Disk-Drive-Type Ferroelectric Data Recording with Memory Density over 1 Tbit/inch2 Based on Scanning Nonlinear Dielectric Microscopy International-presentation

Tomonori Aoki, Yoshiomi Hiranaga, Yasuo Cho

2015 MRS fall meeting　2015/11/29
Local and Nondestructive Evaluation of SiO2/SiC Interface Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy International-presentation

Norimichi Chinone, Ryoji Kosugi, Yasuonori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho

2015 MRS fall meeting　2015/11/29
Investigation of Oxygen Adsorbed Si(100)-(2x1) Surface Using Noncontact Scanning Nonlinear Dielectric Microscopy International-presentation

Masataka Suzuki, Kohei Yamasue, Yasuo Cho

2015 MRS fall meeting　2015/11/29
Dopant Profiling Analysis of P-I-N Structure in Thin-Film Amorphous Silicon Solar Cell Using Scanning Nonlinear Dielectric Microscopy International-presentation

Kotaro Hirose, Norimichi Chinone, Yasuo Cho

2015 MRS fall meeting　2015/11/29
Visualization of Carrier Distribution in Operated SiC Power-MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy International-presentation

Norimichi Chinone, Yasuo Cho

2015 MRS fall meeting　2015/11/29
超高次走査型非線形誘電率顕微鏡法によるSiC-DMOSFET断面キャリア分布のGS間電圧依存性解析

茅根慎通, 長康雄

第35回ナノテスティングシンポジウム　2015/11/11
超高次走査型非線形誘電率顕微鏡法によるSiCパワートランジスタ内pn接合位置の同定手法に関する検討

茅根慎通, 後藤安則, 長康雄

第35回ナノテスティングシンポジウム　2015/11/11
走査型非線形誘電率顕微鏡法を用いたAlGan/GaNヘテロ結合の2次元電子ガス及び分極の測定

廣瀬光太郎, 後藤安則, 茅根慎通, 長康雄

第35回ナノテスティングシンポジウム　2015/11/11
超高次走査型非線形誘電率顕微鏡法を用いたアモルファスシリコン太陽電池のpin接合の断面測定

廣瀬光太郎, 茅根慎通, 長康雄

第35回ナノテスティングシンポジウム　2015/11/11
走査型非線形誘電率顕微鏡

長康雄

第35回ナノテスティングシンポジウム　2015/11/11
Carrier redistribution analysis of gate-biased SiC power-MOSFET using super-higher-order scanning nonlinear dielectric microscopy International-presentation

Norimichi Chinone, Yasuo Cho

ISTFA 2015　2015/11/01
Observation of polarization and two dimensional electron gas in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy International-presentation

Kotaro Hirose, Norimichi Chinone, Yasuo Cho

ISTFA 2015　2015/11/01
走査型非線形誘電率顕微鏡法による極性反転層状構造圧電膜の層厚の定量測定

寺田浩士朗, 西川宏明, 田中陽平, 小田川裕之, 柳谷隆彦, 長康雄

電子情報通信学会超音波研究会(US)　2015/10/09
Visualization of gate-bias dependent carrier distribution in SiC power-MOSFET using super-higher-order scanning nonlinear dielectric microscopy International-presentation

Norimichi Chinone, Yasuo Cho

ESREF 2015　2015/10/05
Microscopic investigation of SiO2/SiC interface using super-higher-order scanning nonlinear dielectric microscopy International-presentation

Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho

ESREF 2015　2015/10/05
Visualization of polarization and two dimensional electron gas distribution in AlGaN/GaN heterostructure using scanning nonlinear dielectric microscopy International-presentation

Kotaro Hirose, Norimichi Chinone, Yasuo Cho

ICSCRM 2015　2015/10/04
Nondestructive and local evaluation of SiO2/SiC interface using superhigher-order scanning nonlinear dielectric microscopy International-presentation

Norimichi Chinone, Ryoji Kosugi, Yasunori Tanaka, Shinsuke Harada, Hajime Okumura, Yasuo Cho

ICSCRM 2015　2015/10/04
A-siteが変位する強磁性強誘電体：La2NiMnO6薄膜

高橋竜太, 大久保勇男, 山内邦彦, 北村未歩, 桜井康成, 尾嶋正治, 小口多美夫, 長康雄

第76回応用物理学会秋季学術講演会　2015/09/13
超高次走査型非線形誘電率顕微鏡による単結晶Si太陽電池の光照射によるキャリア分布変化の測定

廣瀬光太郎, 茅根慎通, 長康雄

第76回応用物理学会秋季学術講演会　2015/09/13
超高次走査型非線形誘電率顕微鏡法による次世代パワー半導体デバイスの評価と走査型非線形誘電率ポテンショメトリの提案

長康雄, 茅根慎通, 廣瀬光太郎, 山末耕平

第76回応用物理学会秋季学術講演会　2015/09/13
非接触走査型非線形誘電率ポテンショメトリによる4H-SiC(000\bar{1})上グラフェンの観察

山末耕平, 吹留博一, 舩窪一智, 末光眞希, 長康雄

第76回応用物理学会秋季学術講演会　2015/09/13
超高次非線形誘電率顕微鏡法を用いたSiO2/SiC界面評価技術の検討

茅根慎通, 小杉亮治, 田中保宣, 原田信介, 奥村元, 長康雄

第76回応用物理学会秋季学術講演会　2015/09/13
SNDMプローブによる線形誘電率分布の新規測定法を用いた誘電体薄膜の評価

平永良臣, 茅根慎通, 廣瀬光太郎, 長康雄

第76回応用物理学会秋季学術講演会　2015/09/13
SNDMプローブを用いたナノスケール線形誘電率分布マッピング

平永良臣, 茅根慎通, 廣瀬光太郎, 長康雄

第76回応用物理学会秋季学術講演会　2015/09/13
Observation of graphene on C-terminated face of SiC using noncontact scanning nonlinear dielectric potentiometry International-presentation

K. Yamasue, H. Fukidome, K. Funakubo, M. Suemitsu, Y. Cho

nc AFM 2015　2015/09/07
Oxygen adsorption on a Si(100)-(2×1) surface studied by noncontact scanning nonlinear dielectric microscopy International-presentation

M. Suzuki, K. Yamasue, Y. Cho

nc AFM 2015　2015/09/07
Graphene on C-terminated face of 4H-SiC studied by noncontact scanning nonlinear dielectric potentiometry International-presentation

Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho

ECOSS-31　2015/08/31
Non-contact scanning nonlinear dielectric microscopy study of oxygen-adsorption on a Si(100)-(2×1) surface International-presentation

Kohei Yamasue, Masataka Suzuki, Yasuo Cho

ECOSS-31　2015/08/31
Charge Gradient Microscopy : Electromechanical Charge Scraping and Refill of Screening Charges International-presentation

Seungbum Hong, Sheng Tong, Yoon-Young Choi, Woon Ik Park, Liliana Stan, Yoshiomi Hiranaga, Yasuo Cho

MMC 2015　2015/06/29
Read/Write Demonstration of Ferroelectric Probe Data Storage with a Density Exceeding 1 Tbit/inch² International-presentation

T. Aoki, Y. Hiranaga, Y. Cho

13th EUROPEAN MEETING ON FERROELECTRICITY　2015/06/28
Method for Measuring Polarity-Inverted Layered Structure in Dielectric Thin Films Using Scanning Nonlinear Dielectric Microscopy International-presentation

H.Odagawa, K.Terada, H.Nishikawa, T.Yanagitani, Y. Cho

13th EUROPEAN MEETING ON FERROELECTRICITY　2015/06/28
Surface Analytical Study on Ferroelectric Recording Media Using XPS and SNDM International-presentation

Y. Hiranaga, Y. T. Chen, Y. Cho

13th EUROPEAN MEETING ON FERROELECTRICITY　2015/06/28
HYDROGEN-INTERCALATED GRAPHENE ON SiC STUDIED BY NONCONTACT SCANNING NONLINEAR DIELECTRIC POTENTIOMETRY International-presentation

Cho Y, Yamasue K, Fukidome H, Funakubo K, Suemitsu M

International Scanning Probe Microscopy Rio 2015　2015/06/21
SCANNING NONLINEAR DIELECTRIC POTENTIOMETRY：NEW STRATEGY FOR MESURING DIPOLE-INDUCED POTENTIALS IN ATOIMIC SCALE International-presentation

Cho Y, Yamasue K

International Scanning Probe Microscopy Rio 2015　2015/06/21
Gate-bias dependent carrier distribution visualization in SiC power-MOSFET using super-higher-order SNDM International-presentation

Norimichi Chinone, Yasuo Cho

EMN CANCUN MEETING 2015　2015/06/08
イオンビーム照射による薄膜強誘電体記録媒体の表面層の除去

平永良臣, 長康雄

電子情報通信学会磁気記録・情報ストレージ研究会(MR)　2015/06/04
Data Bit Recording with a Density Exceeding 1 Tbit/inch2 Using an HDD-Type Ferroelectric Probe Data Storage Unit International-presentation

T. Aoki, Y. Hiranaga, Y. Cho

2015 JOINT ISAF-ISIF-PFM CONFERENCE　2015/05/24
Effect of Ion Beam Irradiation on Recording Media of Ferroelectric Probe Data Storage International-presentation

Y. Hiranaga, Y. T. Chen, Y. Cho

2015 JOINT ISAF-ISIF-PFM CONFERENCE　2015/05/24
X線光電子分光法によるPZT薄膜記録媒体の分析とイオンビーム照射による表面層の除去

平永良臣, 陳一桐, 長康雄

第32回強誘電体応用会議　2015/05/20
HDD型強誘電体プローブデータストレージ試験装置における高密度ビット列の記録・再生

青木朋徳, 平永良臣, 長康雄

第32回強誘電体応用会議　2015/05/20
強誘電体プローブデータストレージ

平永良臣, 青木朋徳, 陳一桐, 長康雄

第62回応用物理学会春季学術講演会　2015/03/11
強誘電体プローブデータストレージ用PZT 薄膜媒体の表面層のXPS 測定

平永良臣, 陳一桐, 長康雄

第62回応用物理学会春季学術講演会　2015/03/11
走査型非線形誘電率ポテンショメトリによる自発分極誘起電位の選択的測定

山末耕平, 長康雄

第62回応用物理学会春季学術講演会　2015/03/11
超高次非線形誘電率顕微鏡法を用いた交流バイアス印加によるSiC-DMOSFET断面におけるキャリア分布のゲート電圧依存性の解析

茅根慎通, 長康雄

第62回応用物理学会春季学術講演会　2015/03/11
ハードディスクドライブ型強誘電体記録装置における更なる高密度化とビット列の実時間再生

青木朋徳, 平永良臣, 長康雄

第62回応用物理学会春季学術講演会　2015/03/11
非接触走査型非線形誘電率顕微鏡を用いた酸素吸着Si(100)-2×1 表面における電気双極子モーメント分布の観察

鈴木将敬, 山末耕平, 長康雄

第62回応用物理学会春季学術講演会　2015/03/11
走査型非線形誘電率顕微鏡によるAlGaN/GaN構造の2次元電子ガス及び分極の評価

廣瀬光太郎, 茅根慎通, 長康雄

第62回応用物理学会春季学術講演会　2015/03/11
走査型非線形誘電率顕微鏡によるアモルファスシリコン太陽電池のpin接合の可視化

廣瀬光太郎, 茅根慎通, 長康雄

第62回応用物理学会春季学術講演会　2015/03/11

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講演奨励賞受賞記念講演
非線形誘電率顕微鏡法による低濃度ドーパントプロファイル評価

広田潤, 鷹野正宗, 竹野史郎, 赤堀浩史, 茅根慎通, 長康雄

第62回応用物理学会春季学術講演会　2015/03/11
Charge Gradient Microscopy:Electromechanical Charge Scraping at the Nanoscale International-presentation

S. Hong, S. Tong, Y. Choi, W. Park, Y. Hiranaga, Y. Cho, A. Roelofs

EMA2015　2015/01/21
ハードディスクドライブ型強誘電体記録における更なる高密度化の達成と記録・再生の一連動作の実現

青木朋徳, 平永良臣, 長康雄

電子情報通信学会磁気記録・情報ストレージ研究会　2014/12/11
Scanning Nonlinear Dielectric Microscopy for Visualization of Dopant Distribution in Amorphous Silicon Solar Cells International-presentation

K. Hirose, N. Chinone, Y. Cho

ICSPM22　2014/12/11
Simultaneous Observation of Topography and Electric Dipole Moments on Si(100)-2×1 Surface Using Non-Contact Scanning Nonlinear Dielectric Microscopy International-presentation

Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

2014 MRS fall meeting　2014/11/30
Dipole-Induced Potential Measurement Using Noncontact Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Yasuo Cho

2014 MRS fall meeting　2014/11/30
Comparative Study on Pristine and Hydrogen-Intercalated Graphene on 4H-SiC(0001) Surface Using Noncontact Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho

2014 MRS fall meeting　2014/11/30
非線形誘電率顕微鏡法を用いたPZT薄膜材料記録に関する研究

陳一桐, 平永良臣, 長康雄

電子情報通信学会磁気記録・情報ストレージ研究会　2014/11/25
超高次非線形誘電率顕微鏡法によるSiC-DMOSFETの断面計測

茅根慎通, 長康雄

先進パワー半導体分科会第1回講演会　2014/11/19
超高次非線形誘電率顕微鏡法によるバイアス印加状態におけるSiC-DMOSFET断面の空乏層分布の観察

茅根慎通, 長康雄

第34回ナノテスティングシンポジウム(NANOTS2014)　2014/11/12
Evaluation of Power SiC -MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy : Imaging of Carrier Distribution and Depletion Layer International-presentation

N. Chinone, T. Nakamura, Y. Cho

ISTFA 2014　2014/11/09
High resolution imaging of dopant and depletion layer distribution in SiC power MOSFET using super-higher-order nonlinear dielectric microscopy International-presentation

Norimichi Chinone, Takashi Nakamura

ESREF2014　2014/09/29
超高次非線形誘電率顕微鏡を用いた実動作中SiC-DMOSFETの断面観察

茅根慎通, 長康雄

第75回応用物理学会秋季学術講演会　2014/09/17
RFマグネトロンスパッタ法により作製したPZT薄膜媒体へのナノドメインドットの書き込み

平永良臣, 長康雄

第75回応用物理学会秋季学術講演会　2014/09/17
非接触走査型非線形誘電率顕微鏡による水素インターカレートされた4H-SiC(0001)上グラフェンの観察

山末耕平, 吹留博一, 舩窪一智, 末光眞希, 長康雄

第75回応用物理学会秋季学術講演会　2014/09/17
走査型非線形誘電率顕微鏡によるアモルファスシリコン太陽電池のpin接合の可視化

廣瀬光太郎, 茅根慎通, 長康雄

第75回応用物理学会秋季学術講演会　2014/09/17

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【講演奨励賞】
Investigation of Hydrogen-Intercalated Graphene on 4H-SiC(0001) by Noncontact Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho

ecoss30　2014/08/31
A New Atomically Resolved Potentiometry for Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Yasuo Cho

ecoss30　2014/08/31
Investigation of electric dipole moments on Si(100)-2×1 surface using non-contact scanning nonlinear dielectric microscopy International-presentation

Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

ecoss30　2014/08/31
Noncontact scanning nonlinear dielectric microscopy study of graphene on 4H-SiC(0001) and its hydrogen-intercalation International-presentation

Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho

NC-AFM 2014　2014/08/04
Surface potentiometry based on scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Yasuo Cho

NC-AFM 2014　2014/08/04
Observation of electric dipole moments on Si(100)-2×1 surface by using non-contact scanning nonlinear dielectric microscopy International-presentation

Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

NC-AFM 2014　2014/08/04
Charge gradient microscopy: high-speed visualization of polarization charges using a nanoscale probe International-presentation

Seungbum Hong, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Yasuo Cho, Andreas Roelofs

NSS8 2014　2014/07/28
High-Resolution Imaging of Hydrogen-Intercalated Graphene on 4H-SiC(0001) Using Non-Contact Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, H. Fukudome, K.Funakubo, M.Suemitsu, Y.Cho

ICN+T 2014　2014/07/20
A Novel Method for Simultaneous Measurement of Topography and Dipole-Induced Local Surface Potential Based on Noncontact Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Yasuo Cho

ICN+T 2014　2014/07/20
Study of Electric Dipole Moment Distribution on Si(100)-2×1 Surface by Non-Contact Scanning Nonlinear Dielectric Microscopy International-presentation

Masataka Suzuki, K. Yamasue, M. Abe, Y. Sugimoto, Y. Cho

ICN+T 2014　2014/07/20
Conduction in nanodomain inversion dots in congruent lithium tantalate single crystal International-presentation

Conference on Application of Polar Dielectrics 2014　2014/07/07
Measurement of Polarization Structure in Layered Piezoelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy International-presentation

H. Odagawa, T. Yanagitani

Conference on Application of Polar Dielectrics 2014　2014/07/07
強誘電体プローブデータストレージ用記録媒体の非線形誘電率の測定

平永良臣

電子情報通信学会磁気記録・情報ストレージ研究会　2014/06/12
RFマグネトロンスパッタ法によるプローブデータストレージ用PZT薄膜媒体の作製

平永良臣

第31回強誘電体応用会議　2014/05/28
一致溶融組成LiTaO3単結晶中に形成されたナノドメインの電気伝導

長康雄

第31回強誘電体応用会議　2014/05/28
Measurement of Nonlinear Dielectric Constants of PZT Thin Films used in Ferroelectric Probe Data Storage Technology International-presentation

Y. Hiranaga, Y. Cho

2014 Joint IEEE ISAF-IWATMD-PFM　2014/05/12
Pyroelectric Detection of Spontaneous Polarization in Multiferroic La₂NiMnO₆ Thin Films International-presentation

Ryota Takahashi, Isao Ohkubo, Miho Kitamura, Masaharu Oshima

2014 MRS Spring Meeting　2014/04/21
Charge Gradient Microscopy: A Method to Image Ferroelectric and Piezoelectric Domains International-presentation

Andreas Roelofs, Sheng Tong, Woon Ik Park, Yoshiomi Hiranaga, Seungbum Hong

2014 MRS Spring Meeting　2014/04/21
非接触走査型非線形誘電率顕微鏡による４H- SiC (0001) 上グラフェンの高分解能観察

山末耕平, 吹留博一, 船窪一智, 末光眞希

第61回応用物理学会春季学術講演会　2014/03/17
非接触走査型非線形誘電率顕微鏡を用いたSi (100) ‐2×1表面における双極子モーメントの観察

鈴木将敬, 山末耕平, 阿部真之, 杉本宣昭

第61回応用物理学会春季学術講演会　2014/03/17
プローブデータストレージ用PZT薄膜媒体の非線形誘電率分布

平永良臣

第61回応用物理学会春季学術講演会　2014/03/17
ハードディスクドライブ型強誘電体記録装置を用いた高密度記録

青木朋徳, 平永良臣

第61回応用物理学会春季学術講演会　2014/03/17
非接触走査型非線形誘電率顕微鏡による形状・表面電位の同時観察

山末耕平

第61回応用物理学会春季学術講演会　2014/03/17
超高次非線形誘電率顕微鏡によるSiC-DMOSFETの空乏層の可視化

茅根慎通, 中村孝

第61回応用物理学会春季学術講演会　2014/03/17
La₂NiMnO₆薄膜の強誘電性

高橋竜太, 大久保勇男, 北村未歩, 桜井康成, 尾嶋正治

第61回応用物理学会春季学術講演会　2014/03/17
2Tbit/inch²の記録密度を持つハードディスクドライブ型強誘電体記録に関する基礎実験

青木朋徳, 平永良臣

電子情報通信学会磁気記録・情報ストレージ研究会　2014/01/24
Conduction in Nanodomains in Lithium Tantalate Single Crystal International-presentation

ICSS 2013　2013/12/15
Interfacial Capacitance between an Fe₃O₄Film and a Nb:TiO₃ Substrate International-presentation

Ryota Takahashi, Mikk Lippmaa

2013 MRS fall meeting　2013/12/01
High Resolution Visualization of Carrier Distribution in SiC-MOSFET Using Super-Higher-Order Nonlinear Dielectric Microscopy International-presentation

Norimichi Chinone, Takashi Nakamura

2013 MRS fall meeting　2013/12/01
Current Conduction around Nanodomain Inversion Dot in Lithium Tantalate Single Crystal Studied by Using C-AFM and SNDM International-presentation

2013 MRS fall meeting　2013/12/01
Site Specific Measurement of Atomic Dipole Moment Induced Local Surface Potentials on Si(111)-(7×7) Surface by Noncontact Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto

2013 MRS fall meeting　2013/12/01
超高次非線形誘電率顕微鏡法を用いたSiC-パワーMOSFET 断面におけるキャリヤ分布の可視化

茅根慎通, 中村孝

第33回ナノテスティングシンポジウム(NANOTS2013)　2013/11/13
Site-specific Measurement of Atomic Dipole Moment Induced Surface Potential on Si(111)-(7×7) by Noncontact Scanning Nonlinear Dielectric Microscopy International-presentation

Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto

ACSIN-12 & ICSPM21　2013/11/04
Effectiveness of the scanning nonlinear dielectric microscopy on the failure analysis of semiconductor devices International-presentation

Koichiro Honda

24th European Symposium Reliability on Electron Devices, Failure Physics and Analysis.　2013/09/30
SrTiO₃基板上に成膜したPZT薄膜の非線形誘電率測定

平永良臣

第74回応用物理学会秋季学術講演会　2013/09/16
非接触走査型非線形誘電率顕微鏡を用いたSi(111)-(7×7)表面における表面電位のサイト依存性測定

山末耕平, 阿部真之, 杉本宣昭

第74回応用物理学会秋季学術講演会　2013/09/16
超高次非線形誘電率顕微鏡法のパワーデバイス評価への応用―SiC-MOSFETの断面測定―

茅根慎通, 中村孝

第74回応用物理学会秋季学術講演会　2013/09/16
Atomic dipole moment induced variation of local surface potential on Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy International-presentation

K.Yamasue

19th International Vacuum Congress　2013/09/09
Observation of atomic dipole moment on hydrogen and oxygen adsorbed Si(111)-7×7 surfaces by using noncontact scanning nonlinear dielectric microscopy International-presentation

D. Mizuno, K.Yamasue

19th International Vacuum Congress　2013/09/09
CURRENT CONDUCTION AROUND NANODOMAIN INVERSION DOT IN LITHIUM TANTALATE SINGLE CRYSTAL International-presentation

13^th International Meeting on Ferroelectricity / IMF-13　2013/09/02
Bias voltage dependence of atomic dipole moment and topography on hydrogen-adsorbed Si(111)-(7×7) surface studied by noncontact scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Daisuke Mizuno

NC-AFM 2013　2013/08/05
Site specific measurement of surface potential shift on Si(111)-(7x7) surface by noncontact scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto

NC-AFM 2013　2013/08/05
Nano-Domains and Their Related Phenomena in LiTaOCH₃ Single Crystal Studied by Using Scanning Nonlinear Dielectric Microscopy International-presentation

2013 Joint UFFC, EFTF and PFM Symposium(IEEE 2013)　2013/07/21
動的測定法による強誘電体薄膜の非線形誘電率測定

平永良臣

第30回強誘電体応用会議　2013/05/22
High resolution imaging of cross section of metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy International-presentation

N. Chinone, K. Yamasue, K. Honda, AND Y, Cho

18th Microscopy of Semiconducting Materials Meeting　2013/04/07
Investigation of physical and electrical properties of hydrogen-adsorbed Si(111)-7×7 surface by using noncontact scanning nonlinear dielectric microscopy International-presentation

DAISUKE MIZUNO, KOHEI YAMASUE, AND YASUO CHO

18th Microscopy of Semiconducting Materials Meeting　2013/04/07
非接触走査型非線形誘電率顕微鏡を用いた水素吸着Si(111)-7×7表面の形状像と双極子モーー面と像の外部電場依存性の観察

水野大督, 山末耕平

第60回応用物理学関係連合講演会　2013/03/27
非接触走査型非線形誘電率顕微鏡を用いたSi(111)-7×7表面の双極子モーメント像と表面電位像の同時観察

山末耕平

第60回応用物理学関係連合講演会　2013/03/27
非線形誘電率顕微鏡によるNAND-Flashメモリ中の蓄積電子の観察

本田耕一郎

第60回応用物理学関係連合講演会　2013/03/27
Electronic state of carbon material surface by non-contact scanning nonlinear dielectric microscopy International-presentation

Shin-ichiro Kobayashi

APS March Meeting 2013　2013/03/18
Atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface observed by using noncontact scanning nonlinear dielectric microscopy International-presentation

Daisuke Mizuno

The 20^th International Colloquium on Scanning Probe Microscopy　2012/12/17
Scanning nonlinear dielectric microscopy nano science and technology International-presentation

EMN FALL 2012　2012/11/29
Super Higher Order Nonlinear Dielectric Microscopy with Super High Resolution International-presentation

Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga, Koichiro Honda

2012 MRS fall meeting　2012/11/25
Non-contact Scanning Nonlinear Dielectric Microscopy Studies of Atomic Dipole Moments on Hydrogen-adsorbed Si(111)‐(7×7) Surface International-presentation

Daisuke Mizuno, Kohei Yamasue

2012 MRS fall meeting　2012/11/25
Observing of Threshold Voltage Distribution of Transistors in a Metal-SiO₂-SiN-SiO₂-semiconductor Flash Memory Using Scanning Nonlinear Dielectric Microscopy International-presentation

Koichiro Honda

2012 MRS fall meeting　2012/11/25
走査型非線形誘電率顕微鏡法を用いた高次非線形誘電率測定によるMONOS型メモリの蓄積電荷観察

本田耕一郎

第32回LSIテスティングシンポジウム　2012/11/07
Observing of charges stored in metal-oxide-nitride-oxide semiconductor flash memory by using higher order nonlinear dielectric microscopy International-presentation

K. Honda, T. Iwai

The 15th European Microscopy Congress 2012 manchester　2012/09/16
Resolution improvement of scanning nonlinear dielectric microscopy by measuring the super higher-order nonlinear dielectric constants International-presentation

N.Chinone, K. Yamasue, Y. Hiranaga, K.Honda

The 15th European Microscopy Congress 2012 manchester　2012/09/16
動的測定法によるPZT薄膜の非線形誘電率測定

平永良臣

第73回応用物理学会学術講演会　2012/09/11
非接触走査型非線形誘電率顕微鏡を用いたSi(111)再構成表面観察における双極子モーメント分布の可視化メカニズムに関する検討

山末耕平

第73回応用物理学会学術講演会　2012/09/11
超高次非線形誘電率顕微鏡によるMOS型電界効果トランジスタ断面の高分解能観察

茅根慎通, 山末耕平, 本田耕一郎

第73回応用物理学会学術講演会　2012/09/11
非線形誘電率顕微鏡法によるMONOS型メモリの蓄積電子の高分解能観察

本田耕一郎

第73回応用物理学会学術講演会　2012/09/11
Atomic electric dipole moment visualization using scanning nonlinear dielectric microscopy International-presentation

Joint International Symposium ISFD-11^th-RCBJSF　2012/08/20
Super-higher order nonlinear dielectric microscopy studies on ferroelectric materials and semiconductor devices International-presentation

N.CHINONE, K. YAMASUE, Y. HIRANAGA, K.HONDA

International Conference on Nanoscience + Technology 2012　2012/07/23
Simultaneous imaging of current and local dipole moments of Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy International-presentation

山末耕平

15^th International Conference on non-contact Atomic Force Microscopy　2012/07/01
Observation of dipole moments on hydrogen-adsorbed Si(111)-(7×7) surface by non-contact scanning nonlinear dielectric microscopy International-presentation

水野大督, 山末耕平

15^th International Conference on non-contact Atomic Force Microscopy　2012/07/01
超高次非線形誘電率顕微鏡を用いた強誘電体ナノ分極の観察

茅根慎通, 山末耕平, 平永良臣

第29回強誘電体応用会議　2012/05/23
高次非線形誘電率計測による走査型非線形誘電率顕微鏡の高分解能化

茅根慎通, 山末耕平

第59回応用物理学関係連合講演会　2012/03/14
非接触走査型非線形誘電率顕微鏡を用いた水素吸着Si(111)-7×7表面の観察

水野大督, 山末耕平

第59回応用物理学関係連合講演会　2012/03/14
非接触走査型非線形誘電率顕微鏡を用いたSi(111)-7×7表面の非線形誘電率像/電流像同時観察

山末耕平

第59回応用物理学関係連合講演会　2012/03/14
高次非線形誘電率顕微鏡によるMONOS型メモリの蓄積電荷の高分解能観察

本田耕一郎, 岩井敏彦

第59回応用物理学関係連合講演会　2012/03/14
原子間顕微鏡を用いた電界ドーピングによるNiO薄膜のキャリア濃度制御

木下健太郎, 依田貴稔, 澤井暢大, 本田耕一郎

第59回応用物理学関係連合講演会　2012/03/14
原子分解能を持つ走査型非線形誘電率顕微鏡

「原子分解能顕微鏡の歴史と最先端」公開研究会　2012/02/10
Super Higher-Order Nonlinear Dielectric Microscopy International-presentation

N.Chinone, K.Yamasue, Y.Hiranaga, Y.Cho

The 19^th International Colloquium on Scanning Probe Microscopy　2011/12/20
超高分解能走査型非線形誘電率顕微鏡の開発と応用

第31回表面科学学術講演会　2011/12/17
Visualization of Electrons Localized in Metal-SiO₂-SiN-SiO₂-Semiconductor Flash Memory Thin Gate Films by Detecting the Higher-Order Nonlinear Dielectric Constant Using Scanning Nonlinear Dielectric Microscopy International-presentation

Koichiro Honda, Yasuo Cho

2011 MRS fall meeting　2011/11/28
走査型非線形誘電率顕微鏡によるMONOS型メモリのVth 分布観察

本田耕一郎, 長康雄

第31回LSIテスティングシンポジウム　2011/11/11
Observation of local dipole moments on cleaned Si(111)surface with defects by non-contact scanning nonlinear dielectric microscopy International-presentation

Kohei Yamasue, Yasuo Cho

14^th International Conference on Noncontact Atomic Force Microscopy　2011/09/19
完全暗状態でのKFM測定の実現～SNDMによるカンチレバー変位検出～

廣瀬龍介, 山岡武博, 長康雄

第72回応用物理学関係連合講演会　2011/08/31
非接触走査型非線形誘電率顕微鏡によるSi(111)表面の電荷分布に関する検討

山末耕平, 長康雄

第72回応用物理学関係連合講演会　2011/08/31
Study of TiO₂(100) Reconstructed Surfaces by Scanning Nonlinear Dielectric Microscopy International-presentation

Nobuhiro Sawai, Yasuo Cho

7^th NANOSCIENCE and NANOTECHNOLOGY CONFERENCE　2011/06/27
走査型非線形誘電率顕微鏡にｙるSi(111)表面の分布観察

山末耕平

第28回強誘電体応用会議講演予稿集　2011/05/25
走査型非線形誘電率顕微鏡によるSi(111)表面の分極分布観察

山末耕平

第28回強誘電体応用会議講演予稿集　2011/05/25
Scanning nonlinear dielectric microscopy with high resolution and its application to next generation high density ferroelectric data storage International-presentation

E-MRS ICAM IUMRS 2011 Spring Meeting　2011/05/09
走査型非線形誘電率顕微鏡法によるMONOS型メモリのVth 分布観察

電子情報通信学会技術研究報告　2011/05
集中定数回路型LCマイクロ波共振器を用いた非標識バイオアフィニティーセンサーの開発

岡崎紀明, 西野泰斗, 知京豊裕

第58回応用物理学関係連合講演会　2011/03/24

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発表会は東日本大震災のため中止，講演会は成立
強誘電体ドメインのナノスケール選択エッチング

平永良臣

第58回応用物理学関係連合講演会　2011/03/24

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発表会は東日本大震災のため中止，講演会は成立
強誘電体回転ディスク記録方式におけるシングルトラック記録・再生

木本康宏, 平永良臣

第58回応用物理学関係連合講演会　2011/03/24

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発表会は東日本大震災のため中止，講演会は成立
強誘電体ディスクリート記録媒体に関する基礎的研究

隅山直樹, 平永良臣

第58回応用物理学関係連合講演会　2011/03/24

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発表会は東日本大震災のため中止，講演会は成立
非接触走査型非線形誘電率顕微鏡によるSi(111)表面のドメイン境界観察

山末耕平

第58回応用物理学関係連合講演会　2011/03/24

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発表会は東日本大震災のため中止，講演会は成立
走査型非線形誘電率顕微鏡法によるMONOS型メモリのVｔｈ分布観察

本田耕一郎, 樋口治

第58回応用物理学関係連合講演会　2011/03/24

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発表会は東日本大震災のため中止，講演会は成立
Scanning Nonlinear Dielectric Microscopy International-presentation

Kenkou Tanaka

2010 MRS Fall Meeting　2010/11/29
Ferroelectric Super-High Density Data Storage Based on Scanning Nonlinear Dielectric Microscopy International-presentation

Kenkou Tanaka, Yoshiomi Hiranaga

The 3^rd International Symposium on Innovations in Advanced Materials for Optics & Electronics　2010/10/17
SNDM Ferroelectric Data Storage with Servo-Controlled Tracking Technique International-presentation

Kenkou Tanaka

19th International Symposium on the Applications of Ferroelectrics　2010/08/09
Ferroeloctric data recording using servo-controlled tracking technique International-presentation

田中健巧

22^nd International Symposium on Integrated Functionalities 2010　2010/06/13
強誘電体記録方式サーボ・トラッキング法を用いたデータ記録

田中健巧

第2７回強誘電体応用会議　2010/05/26
Non-contact SNDMによるSrTiO₃表面像観察とそのメカニズムの考察

金暢大

第57回応用物理学関係連合講演会　2010/03/17
サーボ・トラッキング法を用いた強誘電体高密度記録

田中健巧

第57回応用物理学関係連合講演会　2010/03/17
強誘電体ディスクリート媒体の作製とデータ記録に関する研究

隅山直樹, 平永良臣

第57回応用物理学関係連合講演会　2010/03/17
走査型非線形誘電率顕微鏡法を用いた電界効果トランジスタの2次元ドーパントプロファイリング

樋口治, 本田耕一郎

第57回応用物理学関係連合講演会　2010/03/17
Acoustic Wave Devices composed Periodical Poled Z-cut LiTaO₃ Plate International-presentation

Michio Kadota, Takashi Ogami, Kansho Yamamoto, Yasuo Cho

Fourth International Symposium on Acoustic Wave Devices for Future Mobile Communication Systems (Third International Workshop on Piezo-Devices Based on Latest MEMS Technologies)　2010/03/03
Development of Ferroelectric Data Storage Test System for High - Density and High - Speed Read/Write International-presentation

平永良臣

2009 MRS fall meeting　2009/11/30
Study of TiO₂(100)1×1 and 1×3 Surfaces by Non-contact Scanning Nonlinear Dielectric Microscopy Combined with Scanning Tunneling Microscopy International-presentation

金暢大

2009 MRS fall meeting　2009/11/30
Observation of Dopant Profile of Transistors Using Scanning Nonlinear Dielectric Microscopy International-presentation

本田耕一郎

2009 MRS fall meeting　2009/11/30
走査型非線形誘電率顕微鏡（SNDM)による誘電率分布計測の試み

廣瀬龍介, 安武正敏, 山岡武博, 長康雄

第70回応用物理学会学術講演会　2009/09/08
Nano-Domain Formation on Ferroelectrics and Development of HDD-Type Ferroelectric Data Storage Test system International-presentation

Yoshiomi Hiranaga, Tomoya Uda, Yuichi Kurihashi, Yasuo Cho, Michio Kadota, Hikari Tochisita

21^st International Symposium on Integrated Ferroelectric and Functionalities　2009/09
Non-contact scanning nonlinear dielectric microscopy imaging of TiO₂(110) surfaces International-presentation

N.Kin

12^th International Conference on Noncontact Atomic Force Microscopy (NC-AFM)　2009/08/10
Characterizations of Carbon Material by Non-contact Scanning Non-linear Dielectric Microscopy International-presentation

S.Kobayashi

12^th International Conference on Noncontact Atomic Force Microscopy (NC-AFM)　2009/08/10
強誘電ナノ分極反転とHDD型強誘電体記録デバイスの開発

平永良臣, 夘田知也, 栗橋悠一, 村田製作所, 門田道雄, 栃下光

第26回強誘電体応用会議　2009/05
分極反転弾性波デバイス

門田道雄, 小上貴史, 山本観照, 株, 村田製作所

第38回 EMシンポジウム　2009/05
Acoustic Wave Devices using Periodical Poled Z-cut LiTaO₃ Plate International-presentation

Michio Kadota, Takashi Ogami, Kansho Yamamoto

EFTF-IFCS 2009 joint-conference　2009/04
Observation of Dopant Profile Using Scanning Nonlinear Dielectric Microscopy International-presentation

Koichiro Honda, Kenya Ishikawa

Microcopy of Semiconducting Materials (MSM) XVI　2009/03
LiTaO_R#D3薄膜への高密度記録及びデータ再生試験

木本康宏, 栗橋悠一, 平永良臣, 村田製作所, 門田道雄, 栃下光

第56回応用物理学関係連合講演会　2009/03
ハードディスクドライブ型SNDM強誘電体記録装置を用いた高速記録・再生試験

栗橋悠一, 平永良臣, 村田製作所, 門田道雄, 栃下光

第56回応用物理学関係連合講演会　2009/03
湿度制御化におけるナノドメイン反転

平永良臣

第56回応用物理学関係連合講演会　2009/03
非接触状態における高密度強誘電体記録

田中健巧, 夘田知也

第56回応用物理学関係連合講演会　2009/03
非接触-走査型非線形誘電率顕微鏡によるSi（110）-16x2構造の観察

長侑平, 金暢大

第56回応用物理学関係連合講演会　2009/03
非接触型-非線形誘電率顕微鏡によるHOPG表面の観察

小林慎一郎

第56回応用物理学関係連合講演会　2009/03
Non-contact SNDM によるルチルTiO₂表面構造の観察

金暢大

第56回応用物理学関係連合講演会　2009/03
非接触型-非線形誘電率顕微鏡によるフラーレン分子とSi表面との界面評価

小林慎一郎

第56回応用物理学関係連合講演会　2009/03
Ferromagnetism and Ferroelectricity in BiFeO3/BiCrO3 Artificial 1/1 Superlattice International-presentation

Noriya Ichikawa, Yusuke Imai, Kei Hagiwara, Masaya Arai, Atsushi Tanokura, Hiroshi Sakuma, Masaki Azuma, Yuichi Shimakawa, Mikio Takano, Yasutoshi Kotaka, Masashi Yonetani, Hironori Fujisawa, Masaru Shimizu, Kenya Ishikawa

2008 MRS Fall Meeting　2008/12/01
Observation of a local dipole moment of Si atoms on Si(100) surfaces using non-contact Scanning Nonlinear Dielectric Microscopy International-presentation

Nobuhiro Kin, Yuhei Osa

2008 MRS Fall Meeting　2008/12/01
SNDMのドーパントプロファイル計測への応用

本田耕一郎, 石川健哉

第28回LSIテスティングシンポジウム　2008/11/12
Next Generation Ferroelectric high Density Data Storage Based on Scanning Nonlinear Dielectric Microscopy International-presentation

Yoshiomi Hiranaga, Kenkou Tanaka, Yuichi Kurihashi, Tomoya Uda

The 2nd IEEE Nanotechnology Materials and Devices Conference　2008/10/20
定比組成LiTaO3単結晶分極反転特性に対するイオンビーム照射の影響

畑中佑紀, 平永良臣

第69回応用物理学会学術講演会　2008/09/02
4 Tbit/inch2 記録密度の強誘電体実データ記録

田中健巧

第69回応用物理学会学術講演会　2008/09/02
Noncontact probe control of ferroelectric data storage system based on SNDM International-presentation

Tomoya Uda, Yoshiomi Hiranaga

The 7th Korea-Japan Conference on Ferroelectricity　2008/08/06
High Speed Read/Write Using HDD-type SNDM Ferroelectric Data Storage System with Single Probe International-presentation

Yuichi Kurihashi, Yoshiomi Hiranaga

The 7th Korea-Japan Conference on Ferroelectricity　2008/08/06
Instrumentation of the Highly Sensitive Scanning Nonlinear Dielectric Microscope International-presentation

M. Yasutake, R. Hirose

International Conference on Nanoscience + Technology 2008　2008/07/20
Scanning nonlinear dielectric microscopy with super high resolution

Ryusuke Hirose, Shin-ichiro Kobayashi, Nobuhiro Kin

第27回電子材料シンポジウム　2008/07/09
Scanning Nonlinear Dielectric Microscopy Nano Science and Technology for Next Generation High Density Ferroelectric Data Storage International-presentation

Kenkou Tanaka, Yuichi Kurihashi, Tomoya Uda, Yasuhiro Daimon, Nozomi Odagawa, Ryusuke Hirose, Yoshiomi Hiranaga

20th International Symposium on Integrated Ferroelectrics　2008/06/09
Actual Information Storage with a Recording Density of Above 1 Tbpsi International-presentation

Kenkou Tanaka

20th International Symposium on Integrated Ferroelectrics　2008/06/09
Fast Data Read/Write Using Novel HDD-Type Ferroelectrics Data Storage System International-presentation

Yoshiomi Hiranaga

20th International Symposium on Integrated Ferroelectrics　2008/06/09
HDD型強誘電体記録デバイスにおける高速記録再生

平永良臣, 夘田知也, 栗橋悠一

第25回強誘電体応用会議　2008/05/28
Nano Dot Manipulation with memory density of above 1Tbit/inch2 in Ferroelectric Data Storage System International-presentation

T. Kenkou

2008 MRS Spring Meeting　2008/03/24
Scanning Nonlinear Dielectric Microscopy Nanoscience and Technology for Next Generation High Density Ferroelectric Data Storage International-presentation

2008 MRS Spring Meeting,　2008/03/24

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非接触型非線形誘電率顕微鏡によるフラーレン分子の観察

小林慎一郎

日本物理学会第63回年次大会　2008/03
間欠接触走査型非線形誘電率顕微鏡の開発

平永良臣

第55回応用物理学関係連合講演会　2008/03
走査型非線形誘電率顕微鏡法を用いた電界効果トランジスタのドーパントプロファイリング

石川健哉, 本田耕一郎

第55回応用物理学関係連合講演会　2008/03
非接触‐走査型非線形誘電率顕微鏡によるSi(100)-2x1構の観察

長侑平, 金暢大

第55回応用物理学関係連合講演会　2008/03
NC-SNDM法を用いた強誘電体記録における非接触書き込み(2)

夘田知也, 平永良臣

第55回応用物理学関係連合講演会　2008/03
強誘電体材料を用いた薄片化単結晶記録媒体の大面積化

ブイヤンモイヌル, 平永良臣

第55回応用物理学関係連合講演会　2008/03
Atomic Dipole Moment Distributions on Semiconductor and Insulator Surface Studied using Non-contact Scanning Nonlinear Dielectric Microscopy International-presentation

Ryusuke Hirose

2007 MRS Fall Meeting　2007/11/26
Visualization of Charges Localized in the Thin Gate Film of Metal-Oxide-Nitride-Oxide-Semiconductor Type Flash Memory using the Scanning Nonlinear Dielectric Microscopy – Detecting the Higher Order Nonlinear Dielectric Constant International-presentation

Koichiro Honda

2007 MRS Fall Meeting　2007/11/26
Nanoscale Structure of a Ferroelectric Domain Wall using Scanning Probe Microscopy International-presentation

Lili Tian, Sergei Kalinin, Eugene Eliseev, Anna Mozorovska, Nozomi Odagawa, Venkatraman Gopalan

2007 MRS Fall Meeting　2007/11/26
Quantitative Measurement of Dopant Concentration Profiling by Scanning Nonlinear Dielectric Microscopy International-presentation

Kenya Ishikawa, Koichiro Honda

2007 MRS Fall Meeting　2007/11/26
Observation of Atomic Dipole Moment on GaAs(110) Cleavage Surface using Non-Contact Scanning Nonlinear Dielectric Microscopy International-presentation

Akio Saito, Ryusuke Hirose

2007 MRS Fall Meeting　2007/11/26
Scanning nonlinear dielectric microscopy with atomic resolution International-presentation

13th US-Japan Seminar on Dielectric and Piezoelectric Ceramics　2007/11/04
Atomic dipole moment observation of Si(111)7x7 surface using non-contact scanning nonlinear dielectric microscopy International-presentation

Ryusuke Hirose

The 10th International Conference on Non-Contact Atomic Force Microscopy　2007/09/16
Observation of atomic structure of SrTiO3 insulating surface using non-contact scanning nonlinear dielectric microscopy International-presentation

Ryusuke Hirose

The 10th International Conference on Non-Contact Atomic Force Microscopy　2007/09/16
Single organic molecule observation using non-contact scanning nonlinear dielectric microscopy International-presentation

Shin-ichiro Kobayashi

The 10th International Conference on Non-Contact Atomic Force Microscopy　2007/09/16
Recent progress on ultra high density SNDM ferroelectric probe memory International-presentation

Y. Hiranaga, K. Tanaka, N. Odagawa, T. Uda, Y. Kurihashi

Materials Today Asia　2007/09/03
一致溶融組成LiTaO3上に形成したナノドットの長期安定性の初期ドット半径依存性の定式化

小田川望

第68回応用物理学会学術講演会　2007/09
NC-SNDMによるGaAs(110)劈開面の原子双極子モーメント分布観察

齋藤晃央, 廣瀬龍介

第68回応用物理学会学術講演会　2007/09
走査型非線形誘電率顕微鏡法によるドーパント濃度プロファイル計測

石川健哉, 本田耕一郎

第68回応用物理学会学術講演会　2007/09
非接触方非線形誘電率顕微鏡によるSi(111)7×7構造上のC60分子の観察

小林慎一郎

第68回応用物理学会学術講演会　2007/09
NC-SNDMによるSrTiO３の原子分解能観察

廣瀬龍介

第68回応用物理学会学術講演会　2007/09
NC-SNDM法を用いた強誘電体記録における非接触書き込み

夘田知也, 平永良臣

第68回応用物理学会学術講演会　2007/09
オフセット電圧印加法を用いた極微小ドメインの形成

田中健巧

第68回応用物理学会学術講演会　2007/09
ハードディスクドライブ型強誘電体記録装置を用いた高速再生試験

栗橋悠一, 平永良臣

第68回応用物理学会学術講演会　2007/09
高次非線形透磁率顕微鏡法における探針磁化効果と非接触計測への応用

高橋和志, 石川健哉, 平永良臣, 廣瀬龍介, 遠藤誠

第68回応用物理学会学術講演会　2007/09
走査型非線形誘電率顕微法による原子スケール像観察

日本物理学会第62回年次大会　2007/09
Cross-sectional observation of nano-domain dots formed in lithium tantalite single crystal International-presentation

Yasuhiro Daimon

International Conference on Nanoscience and Technology 2007　2007/07/02
Electric dipole moment observation of single si atom on Si(111)7×7 surface using non-contact scanning nonlinear dielectric microscopy International-presentation

Ryusuke Hirose

International Conference on Nanoscience and Technology 2007　2007/07/02
Organic surface observation using non-contact scanning nonlinear dielectric microscopy International-presentation

Shin-ichiro Kobayashi

International Conference on Nanoscience and Technology 2007　2007/07/02
Visualization of charges localized in the thin gate film of Metal-Oxide-Nitride-Oxide-Semiconductor type Flash memory using the Scanning Nonlinear Dielectric Microscopy – detecting the higher order nonlinear dielectric constant International-presentation

Koichiro Honda

International Conference on Nanoscience and Technology 2007　2007/07/02
Non-Contact Probe Control and High-Speed Writing for Rotated-Disk-Type Ferroelectric Data Storage Devices International-presentation

Y. Hiranaga, T. Uda, Y. Kurihashi, K. Tanaka, N. Odagawa

The 16th IEEE International Symposium on the Applications of Ferroelectrics　2007/05/27
Study of Long-Term-Retention Characteristics and Wall Behavior of Nano-Inverted domains on Congruent Single-Crystal LiTaO3 Based on Wall Energy International-presentation

Nozomi Odagawa

The 16th IEEE International Symposium on the Applications of Ferroelectrics　2007/05/27
Basic Study On The Long Term Stability Of Small Inverted Domains Formed On Congruent Single-Crystal LiTaO3 International-presentation

Nozomi Odagawa

19th International Symposium of Integrated Ferroelectrics　2007/05/08
Scanning Nonlinear Dielectric Microscopy With Atomic Resolution For High Density Ferroelectric Data Storage International-presentation

Ryusuke Hirose, Nozomi Odagawa, Kenkou Tanaka, Yoshiomi Hiranaga

19th International Symposium of Integrated Ferroelectrics　2007/05/08
非接触型走査型非線形誘電率顕微鏡による原子分解能観察

廣瀬龍介

第24回強誘電体応用会議　2007/05
非接触－走査型非線形誘電率顕微法によるTGS (010) 劈開面の観察

齋藤晃央, 廣瀬龍介

第54回応用物理学関係連合講演会　2007/03
一致溶融組成LiTaO3上に形成した微小分極反転ドットの長期安定性の初期ドット半径依存性

小田川望

第54回応用物理学関係連合講演会　2007/03
回転ディスク型強誘電体記録装置を用いた高速記録試験

栗橋悠一, 平永良臣

第54回応用物理学関係連合講演会　2007/03
NC-SNDM法を用いた回転ディスク型強誘電体記録再生装置の非接触制御

夘田知也, 平永良臣

第54回応用物理学関係連合講演会　2007/03
強誘電体記録におけるプローブの位置制御

田中健巧

第54回応用物理学関係連合講演会　2007/03
定比タンタル酸リチウム結晶に形成されたナノドメイン反転ドットの断面計測

大門靖裕

第54回応用物理学関係連合講演会　2007/03
NC-SNDMによるSi(111)7×7表面の原子双極子モーメント分布観察

廣瀬龍介

第54回応用物理学関係連合講演会　2007/03
非接触型走査型非線形誘電率顕微鏡による原子分解能観察

廣瀬龍介

圧電材料・デバイスシンポジウム2007　2007/01
Ferroelectric nano-domain manipulation for next generation ultrahigh density data storage International-presentation

Yoshiomi Hiranaga, Kenkou Tanaka, Nozomi Odagawa

The 17th Symposium of The Materials Research Society of Japan　2006/12/08
非線形誘電率顕微鏡を用いた超高密度強誘電体データストレージ

応用電子物性分科会　2006/12
Cross-sectional Observation of Nano-domain Dots Formed in Congruent Single-crystal LiTaO3 International-presentation

Yasuhiro Daimon

2006 MRS Fall Meeting　2006/11/27
Simultaneous Observation of Surface Morphology and Dielectric Properties Using Non-Contact Scanning Nonlinear Dielectric Microscopy with Atomic Resolution International-presentation

Ryusuke Hirose

2006 MRS Fall Meeting　2006/11/27
Long Term Retention Characteristic of Small Inverted Dots Formed on Congruent Single-Crystal LiTaO3 International-presentation

Nozomi Odagawa

2006 MRS Fall Meeting　2006/11/27
Visualization Using the Scanning Nonlinear Dielectric Microscopy of Electrons and Holes Localized in the Thin Gate Film of Metal-Oxide-Nitride-Oxide-Semiconductor Type Flash Memory International-presentation

Koichiro Honda

2006 Non-Volatile Memory Technology Symposium　2006/11/05
Ferroelectric Ultra High-Density Data Storage Based on Scanning Nonlinear Dielectric Microscopy International-presentation

Sunao Hashimoto, Nozomi Odagawa, Kenkou Tanaka, Yoshiomi Hiranaga

2006 Non-Volatile Memory Technology Symposium　2006/11/05
超高分解能走査型非線形誘電率顕微鏡

第27回超音波エレクトロニクスの基礎と応用に関するシンポジウム　2006/11
Ferroelectric Ultra High-Density Data Storage Based on Scanning Nonlinear Dielectric Microscopy International-presentation

International Probe Storage Workshop Ⅳ　2006/10/12
Ferroelectric nano-domain manipulation for next generation ultrahigh density data storage International-presentation

Yoshiomi Hiranaga, Kenkou Tanaka, Sunao Hashimoto, Nozomi Odagawa

8th European Conference on Applications of Polar Dielectrics　2006/09/05
Non-contact Scanning Nonlinear Dielectric Microscopy utilizing Higher Order Nonlinear Dielectric Signal Detection International-presentation

Koya Ohara, Ryusuke Hirose

16th International Microscopy Congress　2006/09/03
誘電計測で電子デバイス開発から原子観測まで

第44回茅コンファレンス　2006/09
回転ディスク型非接触強誘電体記録装置の開発

夘田知也, 平永良臣

2006年電子情報通信学会エレクトロニクスソサイエティ大会　2006/09
Ferroelectric Data Storage with 10 Tbit/Inch2 Memory Density and Sub Nano-Second Domain Switching Time International-presentation

Sunao Hashimoto, Nozomi Odagawa, Kenkou Tanaka, Yoshiomi Hiranaga

The 6th Japan-Korea Conference on Ferroelectrics　2006/08/17
大面積を有するプローブメモリ用強誘電体単結晶記録媒体の作製と評価

平永良臣

第67回応用物理学会学術講演会　2006/08
強誘電体媒体に形成されたナノドメイン反転ドットの断面計測

大門靖裕

第67回応用物理学会学術講演会　2006/08
ナノスケール周期分極反転リチウムタンタレートの作製

田中健巧

第67回応用物理学会学術講演会　2006/08
非接触－走査型非線形誘電率顕微鏡法によるSi(111)7×7構造の観察

廣瀬龍介

第67回応用物理学会学術講演会　2006/08
導電性CNTプローブを用いたSNDM測定によるFG型フラッシュメモリの蓄積電荷の観察

石川健哉, 本田耕一郎

第67回応用物理学会学術講演会　2006/08
強誘電体を記録媒体とした高密度デジタルデータ記録再生

藤本健二郎, 前田孝則, 尾上篤

第67回応用物理学会学術講演会　2006/08
走査型非線形誘電率顕微鏡を用いたKTa1-XNbxO3(KTN)結晶の相転移温度測定

坂本尊, 中村孝一郎, 藤浦和夫

第67回応用物理学会学術講演会　2006/08
Nanodomain Manipulation for Ferroelectric Data Storage with High Recording Density, Fast Domain Switching and Low Bit Error Rate International-presentation

Yoshiomi Hiranaga, Sunao Hashimoto, Nozomi Odagawa, Kenkou Tanaka

15th International Symposium on the Applications of Ferroelectrics　2006/07/31
Ferroelectric Nano-Domain Manipulation for Next Generation Ultrahigh Density Data Storage International-presentation

Y. Hiranaga, K. Tanaka, S. Hashimoto, N. Odagawa

International Conference on Nanoscience and Technology 2006　2006/07/30
Non-Contact Nonlinear Dielectric Microscopy with Atomic Resolution International-presentation

R. Hirose, K. Ohara

International Conference on Nanoscience and Technology 2006　2006/07/30
Scanning Nonlinear Magnetic Microscopy International-presentation

M. Endo

International Conference on Nanoscience and Technology 2006　2006/07/30
Visualization Using the Scanning Nonlinear Dielectric Microscopy of Electrons and Holes Localized in the Thin Gate Film Of Metal-Oxide-Nitride-Oxide- Semiconductor Type Flash Memory International-presentation

K. Honda

International Conference on Nanoscience and Technology 2006　2006/07/30
Scanning Nonlinear Dielectric Microscope for Imaging Ferroelectric Domain Patterns in Various Environments International-presentation

M. Yasutake, K. Watanabe, S. Hasumura

International Conference on Nanoscience and Technology 2006　2006/07/30
Simultaneous observation of dielectric properties and tunneling current using non-contact scanning nonlinear dielectric microscopy International-presentation

Ryusuke Hirose, Koya Ohara

9th International Conference on Non-contact Atomic Force Microscopy　2006/07/16
Scanning Nonlinear Magnetic microscopy International-presentation

Makoto Endo, Koya Ohara

9th International Conference on Non-contact Atomic Force Microscopy　2006/07/16
Scanning Nonlinear Dielectric Microscope using Electro-Conductive Carbon Nanotube Probe Tip International-presentation

Kenya Ishikawa

9th International Conference on Non-contact Atomic Force Microscopy　2006/07/16
Visualization of charges localized in the thin gate film of Metal-Oxide-Nitride-Oxide- Semiconductor type Flash memory using the Scanning Nonlinear Dielectric Microscopy – detecting the higher order nonlinear dielectric constant International-presentation

Koichiro Honda

9th International Conference on Non-contact Atomic Force Microscopy　2006/07/16
Ferroelectric domain engineering for the ultra high-density data storage International-presentation

Sunao Hashimoto, Nozomi Odagawa, Kenkou Tanaka, Yoshiomi Hiranaga

The 9th International Symposium on Ferroic Domains and Micro-to Nanoscopic Structures　2006/06/26
Cross-sectional observation of nano-domain dots International-presentation

Yasuhiro Daimon

The 9th International Symposium on Ferroic Domains and Micro-to Nanoscopic Structures　2006/06/26
Nano Scale Periodically Poled Structure Formed in Lithium Tantalate International-presentation

Kenkou Tanaka

The 9th International Symposium on Ferroic Domains and Micro-to Nanoscopic Structures　2006/06/26
Very high-density digital image data recording using ferroelectric medium International-presentation

Kenjiro Fujimoto, Takanori Maeda, Atsushi Onoe

The 9th International Symposium on Ferroic Domains and Micro-to Nanoscopic Structures　2006/06/26
一致溶融組成LiTaO3上に形成した微小分極反転ドットの長期保持特性

小田川望

第23回強誘電体応用会議　2006/05
回転ディスク型SNDM強誘電体プローブメモリの試作

平永良臣

第23回強誘電体応用会議　2006/05
3D-SNDMを用いたリラクサー型強誘電体Pb(Zn1/3Nb2/3)O3-PbTiO3の観察

杉原智之

第53回応用物理学関係連合講演会　2006/03
AuナノクラスターによるSNDM信号強度の増大

齋藤晃央, 大原鉱也

第53回応用物理学関係連合講演会　2006/03
強誘電体記録媒体へのデジタル画像データの高密度記録・再生

藤本健二郎, 前田孝則, 尾上篤

第53回応用物理学関係連合講演会　2006/03
一致融解組成LiTaO3におけるナノドメイン反転ドットの断面計測(2)

大門靖裕

第53回応用物理学関係連合講演会　2006/03
一致融解組成LiTaO3上に形成した微小分極反転ドットの長期保持特性の観測

小田川望

第53回応用物理学関係連合講演会　2006/03
走査型非線形透磁率顕微鏡による磁界分布計測

遠藤誠, 大原鉱也, 村岡裕明, 山川清志

第53回応用物理学関係連合講演会　2006/03
導電性CNTカンチレバーによるSNDM測定の分解能向上

石川健哉

第53回応用物理学関係連合講演会　2006/03
“非線形誘電率顕微鏡による有機シラン系化合物薄膜の観測

小林慎一郎, 大原鉱也, 西川尚男, 小川智

第53回応用物理学関係連合講演会　2006/03
Three-dimensional observation of nano-scale ferroelectric domain using scanning nonlinear dielectric microscopy International-presentation

Tomoyuki Sugihara

2005 MRS Fall Meeting　2005/11/28
Real Information Recording in Ferroelectric Data Stroage Medium with Memory Density of 1 Tbit/inch2 International-presentation

Tanaka Kenkou, Hiranaga Yoshiomi

2005 MRS Fall Meeting　2005/11/28
10Tbit/inch2 Ferroelectric Data Storage with Offset Voltage Application Method International-presentation

Sunao Hashimoto

2005 MRS Fall Meeting　2005/11/28
Surface Potential Investigation on Nano Domain Formation in Lithium Tantable Single Crystal International-presentation

Mirai Katoh

2005 MRS Fall Meeting　2005/11/28
Nanoscale Pieezoelectric and Nonlinear Dielectric Response across a Single 180°Ferroelectric Domain Wall International-presentation

Lili Tian, Venkatraman Gopalan, David A. Scrymgeour, Tomoyuki Sugihara, Koya Ohara

2005 MRS Fall Meeting　2005/11/28
Visualization of Charges Stored in Flash memories using in Scanning Nonlinear Dielectric Microscopy International-presentation

Koichiro Honda, Sunao Hashimoto

2005 MRS Fall Meeting　2005/11/28
非接触型走査型非線形誘電率顕微鏡を用いた表面形状及び誘電率分布の同時計測(Simultaneous measurement of topography and dielectric constant distribution by NC-SNDM with sub-nanometer order height resolution) International-presentation

大原鉱也

Ultrason. Electron Symposium　2005/11/16
Ferroelectric Domain Engineering for the Ultra High-Density Data Storage with 10Tbit/inch2 Memory Density and Sub Nano-Second Switching Time International-presentation

S. Hashimoto, N. Odagawa, K. Tanaka, Y. Hiranaga

International Symposium Micro- and Nano-scale Domain Structuring in Ferroelectrics (ISDS’05)　2005/11/15
Real Information Storage Using Ferroelectrics with the Density of 1 Tbit/ inch2 International-presentation

K. Tanaka, Y. Hiranaga

International Symposium Micro- and Nano-scale Domain Structuring in Ferroelectrics (ISDS’05)　2005/11/15
Study on Nano-Scale Ferroelectric Domains Using Scanning Nonlinear Dielectric Microscopy International-presentation

6th Pacific Rim Conference on Ceramic and Glass Technology　2005/09/11
NON-CONTACT SCANNING NONLINEAR DIELECTRIC MICROSCOPY UTILIZING HIGHER ORDER NONLINEAR DIELECTRIC CONSTANT DETECTION International-presentation

Koya Ohara

11th International Meeting on Ferroelectricity　2005/09/05
TERABIT PER SQUARE INCH INFORMATION DATA STORAGE ON FERROELECTRICS WITH BIT ERROR RATE International-presentation

Yoshiomi Hiranaga

11th International Meeting on Ferroelectricity　2005/09/05
KFMによる電界分布補正機構付きSNDMを用いた強誘電体分極の面内計測

杉原智之

第66回応用物理学会学術講演会　2005/09
一致溶融組成LiTaO3上に形成した微小分極反転ドットの長期保持特性の観測

小田川望

第66回応用物理学会学術講演会　2005/09
強誘電体高密度実データ記録のビット誤り率の向上

田中健巧, 平永良臣

第66回応用物理学会学術講演会　2005/09
探針下での強誘電体ナノ分極反転の湿度依存症

加藤未来

第66回応用物理学会学術講演会　2005/09
一致溶融組成LiTaO3におけるナノドメイン反転ドットの断面計測

大門靖裕

第66回応用物理学会学術講演会　2005/09
オフセット電圧印加法による10Tbit/inch2超級の強誘電記録の達成

橋本直

第66回応用物理学会学術講演会　2005/09
非接触強誘電体記録におけるナノドメイン反転特性の空隙依存性

佐々木裕紀, 大原鉱也

第66回応用物理学会学術講演会　2005/09
走査型非線形誘電率顕微鏡

遠藤誠, 大原鉱也

第66回応用物理学会学術講演会　2005/09
縦振動型AFMを用いた日接触型走査型非線形誘電率顕微鏡の開発

齋藤晃央, 大原鉱也

第66回応用物理学会学術講演会　2005/09
Ferroelectric data storage with 10Tbit/inch2 class memory density and sub-nanosecond switching time International-presentation

Sunao Hashimoto, Nozomi Odagawa, Kenkou Tanaka, Yoshiomi Hiranaga

8th International Conference on non-contract Atomic Force Microscopy　2005/08/15
Non-contact Scanning Nonlinear Dielectric Microscopy with sub-nanometer high resolution International-presentation

Koya Ohara

8th International Conference on non-contract Atomic Force Microscopy　2005/08/15
Three-Dimensional Observation of Nano-scale Ferroelectric Domain using Scanning Nonlinear Dielectric Microscopy with Electric Field Correction by Kelvin Prove Force Microscopy International-presentation

Tomoyuki Sugihara

8th International Conference on non-contract Atomic Force Microscopy　2005/08/15
Achievement of Low Bit Error Rate in Ferroelectric Ultrahigh-density Data Storage International-presentation

Y. Hiranaga, K. Tanaka

13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques & 13th International Colloquium on Scanning Probe Microscopy　2005/07/03
Scanning Nonlinear Dielectric Microscopy for Observation of Nano-scale Three-dimensional Ferroelectric Domain Structure International-presentation

Tomoyuki Sugihara

13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques & 13th International Colloquium on Scanning Probe Microscopy　2005/07/03
走査型非線形誘電率顕微鏡を用いたナノスケール強誘電体ドメイン構造の３次元観測

杉原智之

第２２回強誘電体応用会議　2005/05
低ビット誤り率特性を有する超高密度強誘電体記録

平永良臣

第２２回強誘電体応用会議　2005/05
誘電率を測る

第52回応用物理学関係連合講演会　2005/03
一致溶融組成LiTaO３におけるピコセカンドナノドメイン反転

小田川望

第52回応用物理学関係連合講演会　2005/03
1 Tbit/inch2 の記録密度を持つ強誘電体実データ記録

田中健巧, 平永良臣

第52回応用物理学関係連合講演会　2005/03
走査型非線形誘電率顕微鏡を用いた10Tbit/inch2級の強誘電体超高密度記録

橋本直

第52回応用物理学関係連合講演会　2005/03
３次元ベクトル非線形誘電率顕微鏡を用いたマルチドメインLiTaO3の計測

杉原智之

第52回応用物理学関係連合講演会　2005/03
強誘電体ナノドメイン生成時に生じる表面電位分布の観測

加藤未来, 森田剛

第52回応用物理学関係連合講演会　2005/03
強誘電体高密度記録における10-5オーダーのビット誤り率の達成

平永良臣

第52回応用物理学関係連合講演会　2005/03
強誘電体記録媒体への高密度デジタルデータ記録再生

藤本健二郎, 前田孝則, 高橋宏和, 尾上篤

第52回応用物理学関係連合講演会　2005/03
高次非線形誘電率顕微法を用いた非接触型走査型非線形誘電率顕微鏡の開発(Ⅱ)

大原鉱也

第52回応用物理学関係連合講演会　2005/03
DIAMOND PROBE FOR ULTRA-HIGH-DENSITY FERROELECTRIC DATE STORAGE BASED ON SCANNING NONLINER DIELECTRIC MICROSCOPY International-presentation

Hiroyuki Takahashi, Takahito Ono, Masayoshi Esashi

17th IEEE International Conference on Micro Electro Mechanical Systems, (Maastricht MEMS 2004 TECHNICAL DIGEST)　2005/01/25
Next Generation Ferroelectric Data Storage with The Density of Tbits/inch2 International-presentation

Y. Hiranaga

The 15th Symposium of The Material Research Society of Japan　2004/12/23
Development of Ultra-High Vacuum Scanning Nonlinear Dielectric Microscope and Near Atomic Scale Observation of Ferroelectric Material Surfaces International-presentation

Hiroyuki Odagawa

2004 MRS Fall Meeting　2004/11/29
Absolute Measurement of Three-dimensional Polarization Direction Using Scanning Nonlinear Dielectric Microscopy International-presentation

Tomoyuki Sugihara

2004 MRS Fall Meeting　2004/11/29
Simultaneous Observation of Topography and Polarization Using Non-contact Scanning Nonlinear Dielectric Microscopy International-presentation

Koya Ohara

2004 MRS Fall Meeting　2004/11/29
Bit Error Evaluation of Tbit/inch2 Ferroelectric Data Storage International-presentation

Yoshiomi Hiranaga

2004 MRS Fall Meeting　2004/11/29
Perfectly c-axis oriented epitaxial lead titanate thin film deposited by a hydrothermal method for a data storage International-presentation

Takeshi Morita

2004 MRS Fall Meeting　2004/11/29
非線形誘電率顕微鏡を用いた３次元分極方位の絶対計測

杉原智之, 小田川裕之

第２５回超音波エレクトロニクスの基礎と応用に関するシンポジウム　2004/10
Ultra High Density Ferroelectric Data Storage Based on Scanning Nonlinear Dielectric Microscopy International-presentation

Y. Hiranaga

Seventh International Conference on non-contact Atomic Force Microscopy　2004/09/12
Visualization using the Scanning Nonlinear Dielectric Microscopy of electrons and holes localized in the thin gate film of Metal-Oxide-Semiconductor type flash memory International-presentation

Koichiro Honda, Sunao Hashimoto

Seventh International Conference on non-contact Atomic Force Microscopy　2004/09/12
Non-contact Scanning Nonlinear Dielectric Microscopy International-presentation

Koya Ohara

Seventh International Conference on non-contact Atomic Force Microscopy　2004/09/12
Three-dimensional measurement of ferroelectric polarization using 3D-type scanning nonlinear dielectric microscopy with and electric filed correction International-presentation

Tomoyuki Sugihara, Hiroyuki Odagawa

Seventh International Conference on non-contact Atomic Force Microscopy　2004/09/12
簡易真空ＳＮＤＭの開発と表面吸着層の観測

間宮卓郎, 森田剛, 大原鉱也

第６５回応用物理学会学術講演会　2004/09
３Ｄ型非線形誘電率顕微鏡を用いた３次元分極分布の絶対測

杉原智之, 小田川裕之

第６５回応用物理学会学術講演会　2004/09
走査型非線形誘電率顕微鏡を用いた定比組成LiNbO3単結晶における微小分極反転

橋本直, 尾上篤

第６５回応用物理学会学術講演会　2004/09
走査型非線形誘電率顕微鏡を用いたLiTaO3単結晶記録媒体への高速データ記録

田中健巧, 平永良臣

第６５回応用物理学会学術講演会　2004/09
強誘電体記録におけるビット誤り率の自動評価

平永良臣

第６５回応用物理学会学術講演会　2004/09
菱面体ＰＺＴ（１１１）薄膜の超高密度記録媒体への応用

大門靖裕, 森田剛

第６５回応用物理学会学術講演会　2004/09
水熱合成法によるエピタキシャルPbTiO3薄膜の基板依存性

森田剛

第６５回応用物理学会学術講演会　2004/09
高次非線形誘電率顕微鏡法を用いた非接触型走査型非線形誘電率顕微鏡の開発

大原鉱也

第６５回応用物理学会学術講演会　2004/09
超高真空走査型非線形誘電率顕微鏡による絶縁物表面の格子レベル観察

小田川裕之

第６５回応用物理学会学術講演会　2004/09
非線形誘電率顕微鏡を用いたTbits/inch2の記録密度をもつ強誘電体記録

平永良臣

電子情報通信学会　2004/09
Polarization Reversal Mechanism of a Ring-Shaped Ferroelectric Domain Dot International-presentation

Takeshi MORITA, Mirai KATOH

The 8th International Symposium on Ferroic Domains and Micro- to Nanoscopic Structures　2004/08/24
Ferroelectric Properties of an Epitaxial PbTiO3 Thin Film Deposited by a Hydrothermal Method International-presentation

Takeshi MORITA

The 8th International Symposium on Ferroic Domains and Micro- to Nanoscopic Structures　2004/08/24
Nano-Sized domain Inversion Characteristics in LiNbO3 Group Single Crystals Using SNDM International-presentation

Atsushi Onoe, Sunao Hashimoto

The 8th International Symposium on Ferroic Domains and Micro- to Nanoscopic Structures　2004/08/24
High-Speed Switching of Nano-Scale Ferroelectric Domains in Congruent Single Crystal LiTaO3 International-presentation

Yoshiomi Hiranaga, Kenjiro Fujimoto

The 8th International Symposium on Ferroic Domains and Micro- to Nanoscopic Structures　2004/08/24
Hydrothermally Deposited PbTiO3 Epitaxial Thin Film International-presentation

Takeshi MORITA

5th Korea-Japan Conference on Ferroelectricity　2004/08/18
水熱合成法によるエピタキシャルチタン酸鉛（ＰｂＴｉＯ３）薄膜－ＳＮＤＭを用いた超高密度記録媒体への応用－

森田剛

第２１回強誘電体応用会議　2004/05
分極制御ウエットエッチング法による強誘電体単結晶記録媒体の作製と記録特性の評価

平永良臣

第２１回強誘電体応用会議　2004/05
Observation of a ring shaped domain pattern using a Scanning Nonlinear Dielectric Microscopy International-presentation

Mirai KATOH, Takeshi MORITA

The 16th International Symposium on Integrated Ferroelectrics (ISIF2004) Symposium　2004/04/05
NOVEL PREPARATION METHOD FOR FERROELECTRIC SINGLE CRYSTAL DATA STORAGE MEDIA International-presentation

Yoshiomi Hiranaga, Yasuo Wagatsuma

The 16th International Symposium on Integrated Ferroelectrics (ISIF2004) Symposium　2004/04/05
CHARACTERIZATION OF EPITAXIAL GROWTH OF PbTiO3 THIN FILMS ON (001)Nb-SrTiO3 FABRICATED BY HYDROTHERMAL SYNTHESIS METHOD International-presentation

W. W. Jung, S. K. Choi, W. S. Ahn, S. H. Ahn

The 16th International Symposium on Integrated Ferroelectrics (ISIF2004) Symposium Abstracts　2004/04/05
CHOHYDROTHERMALLY DEPOSITED EPITAXIAL LEAD TITANATE THIN FILMS ON STRONTIUM RUTHENIUM OXIDE BOTTOM ELECTRODE International-presentation

Takeshi MORITA

The 16th International Symposium on Integrated Ferroelectrics (ISIF2004) Symposium Abstracts　2004/04/05
SNDM STUDY ON NANOSECOND SWITCHING OF NANOSCALE FERROELECTRIC DOMAINS IN CONGRUENT LiTaO3 SINGLE-CRYSTAL International-presentation

Kenjiro FUJIMOTO

The 16th International Symposium on Integrated Ferroelectrics (ISIF2004) Symposium　2004/04/05
Ultra high density information storage technology International-presentation

The 16th International Symposium on Integrated Ferroelectrics (ISIF2004) Symposium　2004/04/05
一致溶融組成LiTaO3上に形成した微小分極反転ドットの長期保持特性の観測

小田川望

第５１回応用物理学関係連合講演会　2004/03
分極制御ウエットエッチング法により作製したLiTaO3単結晶記録媒体に対するデータ記録

平永良臣

第５１回応用物理学関係連合講演会　2004/03
走査型非線形誘電率顕微鏡の信号への表面吸着水の影響

大原鉱也

第５１回応用物理学関係連合講演会　2004/03
走査型非線形誘電率顕微鏡を用いたリング状分極反転現象の観測

加藤未来, 森田剛

第５１回応用物理学関係連合講演会　2004/03
走査型非線形誘電率顕微鏡を用いたLiNbO3単結晶における微小分極反転

橋本直, 尾上篤

第５１回応用物理学関係連合講演会　2004/03
水熱合成法によるチタン酸鉛エピタキシャル薄膜の成膜

森田剛

第５１回応用物理学関係連合講演会　2004/03
３次元ベクトル走査型非線形誘電率顕微鏡の印加電界補正機構と分極分布計測

杉原智之, 小田川裕之

第５１回応用物理学関係連合講演会　2004/03
非線形誘電率顕微鏡によるMONOS型Flashメモリ中の蓄積電荷の可視化

本田耕一郎

第５１回応用物理学関係連合講演会　2004/03
ウエットエッチング法による大面積強誘電体単結晶記録媒体の作製

平永良臣, 我妻康夫

圧電材料・デバイスシンポジウム　2004/01/26
STUDY ON NANO-DOMAIN FORMATION FOR FEROELECTRIC DATA STRAGE WITH THE DENSITY ABOVE 1 RBIT/INC2 International-presentation

K.FUJIMOTO, Y.HIRANAGA, Y.WAGATSUMA AND, A.ONOE

4th Asian Meeting on Ferroelectrics(AMF-4)　2003/12/12
The Observation of Surface Polarization Distribution Using Temperature Controlled Scanning Nonlinear Dielectric Microscopy International-presentation

K.Ohara

The 11th International Colloquium on Scanning Probe Microscopy　2003/12/11
Development of Ultra-high Vacuum Scanning Nonlinear Dielectric Microscope and Observation of Ferroelectric Polarization Distribution in Ferroelectric Thin Films and Single Crystals International-presentation

Hiroyuki Odagawa

2003 MRS Fall Meeting　2003/12/01
Polarization Reversal Anti-parallel to the Applied Electric Field Observed Using a Scanning Nonlinear Dielectric Microscopy International-presentation

Takeshi Morita

2003 MRS Fall Meeting　2003/12/01
Ferroelectric Properties of a Lead Zirconate Titanate Film Deposited by a Hydrothermal Method International-presentation

Takeshi Morita, Yasuo Wagatsuma, Hitoshi Morioka, Hiroshi Funakubo, Nava Setter

2003 MRS Fall Meeting　2003/12/01
First Prototype of High-Density Ferroelectric Data Storage System International-presentation

Yoshiomi Hiranaga, Yasuo Wagatsuma

2003 MRS Fall Meeting　2003/12/01
Temperature Controlled Scanning Nonlinear Dielectric Microscopy International-presentation

Koya Ohara

2003 MRS Fall Meeting　2003/12/01
Visualization of electron and holes localized in the gate thin film of Metal-Oxide-Nitride-Semiconductor type flash memory using the Scanning Non Dielectric Microscopy International-presentation

Koichiro Honda

2003 MRS Fall Meeting　2003/12/01
強誘電体ナノドメインの超高速スイッチング特性

藤本健二郎

第２４回超音波エレクトロニクスの基礎と応用に関するシンポジウム　2003/11
Scanning Nonlinear Dielectric Microscopy -A High Resolution Tool for Observing Ferroelectric Domains and Nano-Domain Engineering International-presentation

The fall meeting of Korea Ceramic Society 2003　2003/10/17
SNDM Nanodomain Engineering for Ultra High-Density Ferroelectric Data Storage International-presentation

The 8th IUMRS International Conference on Advanced Materials (IUMRS-ICAM 2003)　2003/10/08
３次元ベクトル型走査型非線形誘電率顕微鏡による強誘電ドメイン観察

小田川裕之, 杉原智之

第６４回応用物理学会学術講演会　2003/09
水熱合成法によるエピタキシャルＰＺＴ薄膜の強誘電特性の測定

森田剛, 我妻康夫, 森岡仁, 舟窪浩, N.Setter

第６４回応用物理学会学術講演会　2003/09
非線形誘電率顕微鏡とナノドメインエンジニアリング

日本物理学会　2003/09
３次元ベクトル型走査型非線形誘電率顕微鏡を用いた強誘電分極分布測定における印加電界の補正

杉原智之, 小田川裕之

２００３年電子情報通信学会エレクトロニクスソサイエティ大会　2003/09
走査型非線形誘電率顕微鏡を用いたリング状分極反転現象

加藤未来, 森田剛

２００３年電子情報通信学会エレクトロニクスソサイエティ大会　2003/09
走査型非線形誘電率顕微鏡を用いたＳｉ３Ｎ４／ＳｉＯ２／Ｓｉ半導体基板への電荷記録

橋本直, 平永良臣, 本田耕一郎

２００３年電子情報通信学会エレクトロニクスソサイエティ大会　2003/09
強誘電微小分極反転ドメインの生成とデータストレージシステムの試作

平永良臣, 我妻康夫, 尾上篤

２００３年電子情報通信学会エレクトロニクスソサイエティ大会　2003/09
Tbit/inch2 Ferroelectric Data Storage Using SNDM Nano Domain Engineering System International-presentation

Yoshiomi Hiranaga, Kenjiro Fujimoto, Yasuo Wagatsuma, Atsushi Onoe, Kazuya Terabe, Kenji Kitamura

The 10th European Meeting on Ferroelectricity　2003/08/03
ウエットエッチング法による大面積強誘電体単結晶記録媒体の作製

平永良臣, 我妻康夫

第６４回応用物理学会学術講演会　2003/08
一致溶融組成LiTaO3単結晶のP-Eヒステリシスと内部電界

藤本健二郎, 平永良臣

第６４回応用物理学会学術講演会　2003/08
走査型非線形誘電率顕微鏡法による強誘電体中のドメイン構造解析

第６４回応用物理学会学術講演会　2003/08
Scanning Nonlinear Dielectric Microscope International-presentation

Characterization and Imaging Symposium　2003/06/08
分極反転のリアルタイム計測

森田剛

第２０回強誘電体応用会議　2003/05
非線形誘電率顕微鏡を用いた超高密度強誘電体記録再生

平永良臣, 藤本健二郎, 我妻康夫, 尾上篤

第２０回強誘電体応用会議　2003/05
温度制御型走査型非線形誘電率顕微鏡

大原鉱也, 我妻康夫

第５０回応用物理学関係連合講演会　2003/03
走査型マイクロ波顕微鏡によるLiNbO3-LiTaO3コンポジションスプレッド薄膜の特性評価

岡崎壮平, 岡崎紀明, 樋熊弘子, 宮下章志, 村上真, 松本祐司, 鯉沼秀臣, 長谷川哲也

第５０回応用物理学関係連合講演会　2003/03
強誘電体高密度データストレージシステムの試作

平永良臣, 我妻康夫, 尾上篤

第５０回応用物理学関係連合講演会　2003/03
強誘電体ナノドメインの超高速スイッチング特性

藤本健二郎, 森田剛

第５０回応用物理学関係連合講演会　2003/03
超高真空走査型非線形誘電率顕微鏡の開発

小田川裕之, 大原鉱也

第５０回応用物理学関係連合講演会　2003/03
非線形誘電率顕微鏡のＦＥＭ数値解析

吉岡毅, 大原鉱也, 森田剛

第５０回応用物理学関係連合講演会　2003/03
非線形誘電率顕微鏡を用いた分極反転リアルタイム計測

森田剛

第５０回応用物理学関係連合講演会　2003/03
非線形誘電率顕微鏡を用いたTbit/inch2超の記録密度をもつ強誘電体記録

平永良臣, 藤本健二郎

圧電材料・デバイスシンポジウム２００３　2003/02
Tbit/inch2 ferroelectric data storage based on scanning nonlinear dielectric microscopy International-presentation

Yoshiomi Hiranaga, Kenjiro Fujimoto, Atsushi Onoe, Kazuya Terabe, Kenji Kitamura

The 14th Symposium of The Material Research Society of Japan　2002/12/20
Measurement of Three Dimensional Polarization Direction in Ferroelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy with Rotating Electric Field International-presentation

Hiroyuki Odagawa

2002 MRS Fall Meeting　2002/11
Basic Study on High-density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy International-presentation

Yoshiomi Hiranaga, Kenjiro Fujimoto, Yasuo Wagatsuma, Atsushi Onoe, Kazuya Terabe, Kenji Kitamura

2002 MRS Fall Meeting　2002/11
Ferroelectric nano-domain engineering International-presentation

Kazuya Terabe, Kenji Kitamura

International Symposium on Nano-Intelligent Materials/ System (ISNIMS)　2002/10/30
Tbit/inch2 data storage using scanning nonlinear dielectric microscopy International-presentation

K. Fujimoto, Y. Hiranaga, Y. Wagatsuma, A. Onoe, K. Terabe, K. Kitamura

7th International Symposium on Ferroic Domains and Mesoscopic Structures (ISFD7)　2002/09/15
Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy International-presentation

K. Matsuura, N. Valanoor, R. Ramesh

th International Symposium on Ferroic Domains and Mesoscopic Structures (ISFD7)　2002/09/15
Tbit/inch2 ferroelectric data storage using SNDM nano domain engineering system International-presentation

Kenjiro Fujimoto, Yoshiomi Hiranaga, Yasuo Wagatsuma, Atsushi Onoe, Kazuya Terabe, Kenji Kitamura

Trend in Nanotechnology 2002 (TNT2002)　2002/09/09
走査型非線形誘電率顕微鏡を用いた一致溶融組成LiTaO3における1.5Tbit/inch2高密度記録

劉杰, 藤本健二郎, 平永良臣, 我妻康夫, 尾上篤

第６３回応用物理学会学術講演会　2002/09
走査型非線形誘電率顕微鏡を用いたＰＺＴへのナノサイズ分極反転ドメインの生成

藤本健二郎

第６３回応用物理学会学術講演会　2002/09
走査型非線形誘電率顕微鏡を用いた強誘電体高密度記録に関する基礎的研究

平永良臣, 我妻康夫, 尾上篤, 寺部一弥, 北村健二

第６３回応用物理学会学術講演会　2002/09
Tbit/inch2 Ferroelectric data storage using scanning nonlinear dielectric microscopy International-presentation

Kenjiro Fujimoto, Yoshiomi Hiranaga, Jie Liu, Yasuo Wagatsuma, Atsushi Onoe, Kazuya Terabe, Kenji Kitamura

2002 2nd IEEE Conference on Nanotechnology (IEEE-NANO 2002)　2002/08/26
Three dimensional polarization direction measurement using scanning nonlinear dielectric microscopy with rotating electric filed International-presentation

Hiroyuki Odagawa

The 4th Japan-Korea Conference on Ferroelectrics　2002/08/21
Basic study on high-density ferroelectric data storage using scanning nonlinear dielectric microscopy International-presentation

Y. Hiranaga, K. Fujimoto, Y. Wagatsuma, A. Onoe, K. Terabe, K. Kitamura

The 4th Japan-Korea Conference on Ferroelectrics　2002/08/21
Observation of Ferroelectric Nano-Domains Using Scanning Nonlinear Dielectric Microscopy International-presentation

The 8th IUMRS International Conference on Electronic Materials IUMRS-ICEM2002　2002/06/10
非線形誘電率顕微鏡を用いたTbit/inch2の記録密度をもつ強誘電体記録

平永良臣, 藤本健二郎, 我妻康夫, 尾上篤, 寺部一弥, 北村健二

電子情報通信学会　2002/06
Scanning Nonlinear Dielectric Microscopy –A High Resolution Tool for Observing Ferroelectric Domains and Nano-Domain Engineering- International-presentation

International Joint Conference on the Application of Ferroelectrics 2002 (IFFF2002)　2002/05/28
Quantitative Measurement of Dielectric Properties Using Scanning Nonlinear Dielectric Microscopy with Electro-Conductive Cantilever International-presentation

K. Ohara

International Joint Conference on the Application of Ferroelectrics 2002 (IFFF2002)　2002/05/28
Nano-Sized Inverted Domain Dot Formation in Stoichiometric LiTaO3 Single Crystal Using Scanning Nonlinear Dielectric Microscopy International-presentation

Y. Hiranaga, Y. Wagatsuma, K. Terabe, K. Kitamura

International Joint Conference on the Application of Ferroelectrics 2002 (IFFF2002)　2002/05/28
走査型非線形誘電率顕微鏡を用いたＰＺＴ薄膜のa-c,c-cドメイン壁の観測

松浦かおり, N. Valanoor, R. Ramesh

第４９回応用物理学関係連合講演会　2002/04
カンチレバーを用いた走査型非線形誘電率顕微鏡による誘電特性の定量評価(2)

大原鉱也

第４９回応用物理学関係連合講演会　2002/04
走査型非線形誘電率顕微鏡を用いた定比組成LiTaO3単結晶におけるナノサイズ分極反転ドットの生成

平永良臣, 数田聡, 寺部一弥, 北村建二

第４９回応用物理学関係連合講演会　2002/04
走査型マイクロ波プローブ顕微鏡による多成分コンポジションスプレッド誘電体薄膜の迅速評価

岡崎紀明, 長谷川顕, アヘメト・バールハット, 鯉沼秀臣, 知京豊裕, 長谷川哲也

第４９回応用物理学関係連合講演会　2002/04
相変化膜記録ピットの走査型非線形誘電率顕微鏡による観察

西村敏哉, 渡辺和俊, 安武正敏

第４９回応用物理学関係連合講演会　2002/04
ＳＮＤＭを用いた強誘電体の観察とナノドメインエンジニアリング

第４９回応用物理学関係連合講演会　2002/04
Recent Progress on Scanning Nonlinear Dielectric Microscopy International-presentation

The 13th Symposium of The Material Research Society of Japan　2001/12/20
Quantitative Measurement of Dielectric Properties Using Electro-Conductive Cantilever International-presentation

K.Ohara

The 9th International Colloquium on Scanning Probe Microscopy　2001/12
Higher Order Nonlinear Dielectric Microscopy International-presentation

Koya Ohara

MRS 2001 Fall Meeting　2001/11/26
Scanning Nonlinear Dielectric Microscopy Study on Periodically Poled LiNbO3 for High Performance QPM Devices International-presentation

Koya Ohara, Satoshi Kazuta, Hiromasa Itoh

MRS 2001 Fall Meeting　2001/11/26
Small Inverted Domain Dot Formation in Stoichiometric LiTaO3 Single Crystal Using Scanning Nonlinear Dielectric Microscopy International-presentation

Yoshiomi Hiranaga, Satoshi Kazuta, Kazuya Terabe, Kenji Kitamura

MRS 2001 Fall Meeting　2001/11/26
Scanning Electron-Beam Dielectric Microscopy for the Temperature Coefficient Distribution of Dielectric Materials International-presentation

MRS 2001 Fall Meeting　2001/11/26
Development of Scanning Microwave Microscope for High-Throughput Characterization of Combinatorial Dielectric Thin Film International-presentation

Noriaki Okazaki, Hiroyuki Odagawa, Tomoteru Fukumura, Masashi Kawasaki, Makoto Ohtani, Hideomi Koinuma, Tetsuya Hasegawa

MRS 2001 Fall Meeting　2001/11/26
Small Inverted Domain Dot Formation in Ferroelectric Single Crystal Using Scanning Nonlinear Dielectric Microscopy International-presentation

Y.Hiranaga, S. Kazuta, K.Terabe, K.Kitamura

Ist International Meeting on Ferroelectric Random Access Memories　2001/11/19
Higher Order Nonlinear Dielectric Microscopy

Koya Ohara

Ist International Meeting on Ferroelectric Random Access Memories　2001/11/19
Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Materials with Sub-nanometer Resolution International-presentation

Ist International Meeting on Ferroelectric Random Access Memories　2001/11/19
High-Resolution Observation of Ferroelectric Domains Using Scanning Nonlinear Dielectric Microscopy International-presentation

Kaori Matsuura

Ist International Meeting on Ferroelectric Random Access Memories　2001/11/19
カンチレバーを用いた走査型非線形誘電率顕微鏡による誘電率定量計測

大原鉱也

東北大学電気通信研究所第３３回超音波エレクトロニクス研究会　2001/11
Nano Domain Engineering Using Scanning Nonlinear Dielectric Microscopy International-presentation

Kaori Matsuura, Satoshi Kazuta, Hiroyuki Odagawa, Kazuya Terabe, Kenji Kitamura

the 2001 Ist IEEE Conference on Nanotechnology　2001/10/28
Recent progress on scanning nonlinear dielectric microscopy with sub-nanometer resolution International-presentation

The 8th Workshop on Oxide Electronics　2001/09/27
"NANOSCALE MEASUREMENT OF THREE DIMENSIONAL FERROELECTRIC POLARIZATION DISTRIBUTION USING SCANNING NONLINEAR DIELECTRIC MICROSCOPY International-presentation

H. Odagawa

the 10th International Meeting on Ferroelectricity　2001/09/03
STUDY ON THE PERIODICALLY POLED LiNbO3 FOR HIGH PERFORMANCE QPM DEVICE USING SCANNING NONLINEAR DIELECTRIC MICROSCOPY International-presentation

S. Kazuta, H. Ito

the 10th International Meeting on Ferroelectricity　2001/09/03
HIGHER ORDER NONLINEAR DIELECTRIC IMAGING International-presentation

K. Ohara, H. Odagawa

the 10th International Meeting on Ferroelectricity　2001/09/03
SMALL INVERTED DOMAIN FORMATION IN STOICHIOMETRIC LiTaO3 SINGLE CRYSTAL USING SCANNING NONLINEAR DIELECTRIC MICROSCOPY International-presentation

S. Kazuta, H. Odagawa, K. Terabe, K. Kitamura

the 10th International Meeting on Ferroelectricity　2001/09/03
走査型非線形誘電率顕微鏡を用いたLiTaO3における微小分極ドットの生成と安定性

平永良臣, 寺部一弥, 北村健二

第６２回応用物理学会学術講演会　2001/09
走査型非線形誘電率顕微鏡用多点同時測定プローブの開発

藤本健二郎, 小田川裕之, 松浦かおり, 大原鉱也

第６２回応用物理学会学術講演会　2001/09
走査型マイクロ波プローブ顕微鏡によるコンビナトリアル誘電体薄膜試料の定量評価

岡崎紀明, 小田川裕之, 大谷亮, 福村知昭, 松本祐司, 川崎雅司, 鯉沼秀臣, 長谷川哲也

第６２回応用物理学会学術講演会　2001/09
走査型非線形誘電率顕微鏡によるPZT薄膜とPN接合の観察

安武正敏, 渡部和俊, 西村敏哉

第６２回応用物理学会学術講演会　2001/09
Observation of Ferroelectric Nano-Domains using Scanning Nonlinear Dielectric Microscopy International-presentation

K. Matsuura

4th international Conference on Noncontact Atomic Force Microscopy　2001/09/01
高次非線形誘電率顕微法を用いた強誘電体表面に関する基礎的研究

大原鉱也

平成13年度電気関係学会東北支部連合大会　2001/08
走査型非線形誘電率顕微鏡を用いたLiTaO3における微小分極反転ドットの生成

平永良臣, 数田聡, 寺部一弥, 北村建二

平成13年度電気関係学会東北支部連合大会　2001/08
査型非線形誘電率顕微鏡を用いた強誘電層状構造化合物Bi4Ti3O12の原子分解能観察

松浦かおり, 舟窪浩, 入江寛, 野口祐二

平成13年度電気関係学会東北支部連合大会　2001/08
非線形誘電率顕微鏡法を用いた強誘電体記録に関する基礎的検討

松浦かおり, 数田聡, 北村健二

電子情報通信学会　2001/06
走査型非線形誘電率顕微鏡を用いた高次非線形誘電率計測

大原鉱也

第１８回強誘電体応用会議　2001/05
Small Inverted Domain Formation in LiNbO3 and LiTaO3 Single Crystals Using Scanning Nonlinear Dielectric Microscopy International-presentation

S. Kazuta, K. Kitamura

13th International Symposium on Integrated Ferroelectrics　2001/03/11
Observation of Artificial Nano-Domains in Ferroelectric Thin Films Using Nonlinear Dielectric Imaging and Piezo Imaging International-presentation

K. Mastuura

13th International Symposium on Integrated Ferroelectrics　2001/03/11
Higher Order Nonlinear Dielectric Imaging International-presentation

K. Ohara

13th International Symposium on Integrated Ferroelectrics　2001/03/11
走査型非線形誘電率顕微鏡を用いた水平方向の分極評価用プローブの作製と計測

小田川裕之

第４８回応用物理学関係連合講演会　2001/03
走査型非線形誘電率顕微鏡を用いた強誘電層状構造化合物の原子分解能観測

松浦かおり, 舟窪浩, 入江寛, 宮山勝, 野口祐二

第４８回応用物理学関係連合講演会　2001/03
走査型非線形誘電率顕微鏡を用いた高次非線形誘電率計測（２）

大原鉱也

第４８回応用物理学関係連合講演会　2001/03
走査型非線形誘電率顕微鏡を用いた強誘電体のTOPOGRAPHY測定

小池敦, 小田川裕之

第４８回応用物理学関係連合講演会　2001/03
走査型非線形誘電率顕微鏡を用いた強誘電体単結晶ドメインエンジニアリング

数田聡, 小田川裕之, 北村健二

第４８回応用物理学関係連合講演会　2001/03
走査型マイクロ波プローブ顕微鏡によるコンビナトリアル誘電体試料の迅速評価

岡崎紀明, 小田川裕之, P.Ahmet, 知京豊裕, 小宮山大補, 鯉田崇, 福村知昭, 松本祐司, 川崎雅司, 鯉沼秀臣, 長谷川哲也

第４８回応用物理学関係連合講演会　2001/03
走査型非線形誘電率顕微鏡を用いたPPLNの表面層の観測

数田聡, 大原鉱也

第４８回応用物理学関係連合講演会　2001/03
Fundamental study on nano-domain engineering using scanning nonlinear dielectric microscopy International-presentation

K.Matsuura, H.Odagawa

The 8th International Colloquium on Scanning Probe Microscopy and Asian SPM(3)　2000/12
Higher Order Nonlinear Dielectric Imaging Using Scanning Nonlinear Dielectric Microscopy International-presentation

K.Ohara

The 8th International Colloquium on Scanning Probe Microscopy and Asian SPM(3)　2000/12
走査型非線形誘電率顕微鏡の高次非線形モードと垂直距離分解能

大原鉱也, 小池敦, 小田川裕之

第２１回超音波エレクトロニクスの基礎と応用に関するシンポジウム　2000/11
非線形誘電率応答と圧電応答による強誘電分極分布の観測

松浦かおり, 小田川裕之

第２１回超音波エレクトロニクスの基礎と応用に関するシンポジウム　2000/11
RECENT PROGRESS ON SCANNING NONLIEAR DIELECTRIC MICROSCOPY WITH SUB-NANOMETER RESOLUTION International-presentation

H.Odagawa, K.Matsuura, S.Kazuta, K.Ohara

MRS 2000 Fall Meeting　2000/11
NANOMATER SCALE DOMAIN MEASUREMENT ON FERROELECTRIC THIN FILMS USING SCANNING NONLINEAR DIELECTRIC MICROSCOPY International-presentation

H.Odagawa, K. Matsuura

MRS 2000 Fall Meeting　2000/11
走査型非線形誘電率顕微鏡を用いた極微小振動の検出

小池敦, 大原鉱也, 小田川裕之

日本音響学会　2000/09/21
走査型電子線誘電率顕微鏡の高次非線形モードと垂直距離分解能

大原鉱也, 小池敦, 小田川裕之

電子情報通信学会　2000/09
非線形誘電率応答と圧電応答を用いた強誘電分極分布の観測

松浦かおり, 小田川裕之

電子情報通信学会　2000/09
走査型非線形誘電率顕微鏡と圧電応答によるＰＺＴ薄膜の分極ドメイン観測

松浦かおり, 小田川裕之

第６1回応用物理学会学術講演会　2000/09
走査型非線形誘電率顕微鏡を用いた高次非線形誘電率像計測

大原鉱也, 数田聡, 小田川裕之

第６1回応用物理学会学術講演会　2000/09
走査型非線形誘電率顕微鏡を用いた強誘電体単結晶への微小分極情報書き込み(2)

数田聡, 小田川裕之, 北村健二

第６1回応用物理学会学術講演会　2000/09
走査型非線形誘電率顕微鏡の垂直距離分解能

小池敦, 大原鉱也, 小田川裕之

第６1回応用物理学会学術講演会　2000/09
Scanning Nonlinear Dielectric Microscopy wit Nanometer Resolution International-presentation

S. Kazuta, K. Mastuura

Electro CERAMICS VII 2000　2000/09
The Image Production Mechanism of Scanning Nonlinear Dielectric Microscopy and Its Application to the Quantitative Evaluation of Linear and Nonlinear Dielecrtric Properties International-presentation

K.Ohara, S.Kazuta, H.Odagawa

Electro CERAMICS VII 2000　2000/09
Scanning Electron-Beam Dielectric Microscopy for the Investigation of the Tenperature Coefficient Distribution of Dielectric Ceramics International-presentation

O.Jintsugawa, A.Satoh, K.Yamanouchi

Electro CERAMICS VII 2000　2000/09
Determication of Crystal Polarities of Piezoelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy International-presentation

S. Kazuta, H.Odagawa

Electro CERAMICS VII 2000　2000/09
Simultaneous Observation of Ferroelectric Domains and Surface Morphology Using Scanning Nonlinear Dielectric Microscopy International-presentation

H.Odagawa

Electro CERAMICS VII 2000　2000/09
走査型非線形誘電率顕微鏡法を用いた強誘電体単結晶への微小分極書き込み

数田聡, 小田川裕之

平成12年度電気関係学会東北支部連合大会　2000/08
走査型非線形誘電率顕微鏡法を用いた高次非線形誘電率像計測

大原鉱也, 数田聡, 小田川裕之

平成12年度電気関係学会東北支部連合大会　2000/08
走査型非線形誘電率顕微鏡と圧電応答による強誘電体薄膜の分極ドメイン観測

松浦かおり, 小田川裕之

平成12年度電気関係学会東北支部連合大会　2000/08
走査型非線形誘電率顕微鏡との垂直分解能

小池敦, 大原鉱也, 小田川裕之

平成12年度電気関係学会東北支部連合大会　2000/08
Single crystal growth of KNbO3 and Application to surface acoustic wave devices International-presentation

K.Yamanouchi, Y.Wagatsuma, H.Odagawa

International Conference on Microwave Materials and Their Applications (MMA2000)　2000/08
Microscopic Observation of the Temperature Coefficient Distribution of Microwave Materials Using Scanning Electron-Beam Dielectric Microscopy International-presentation

A. Satoh, H.Odagawa

International Conference on Microwave Materials and Their Applications (MMA2000)　2000/08
Scanning Nonlinear Dielectric Microscopy with Nanometer Resolution International-presentation

S.Kazuta, K.Matsuura

12th IEEE Internationl Symposium on the Applications of Ferroelectrics (ISAF2000)　2000/07
Dtermination of Crystal Polarities of Piezoelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy International-presentation

S.Kazuta, H.Odagawa

12th IEEE Internationl Symposium on the Applications of Ferroelectrics (ISAF2000)　2000/07
Simultaneous Observation of Ferroelectric Domains and Surface Morphology Using Scanning Nonlinear Dielectric Microscopy International-presentation

H.Odagawa

12th IEEE Internationl Symposium on the Applications of Ferroelectrics (ISAF2000)　2000/07
ATheory for the Image Production Mechanism of Scanning Nonlinear Dielectric Microscopy and its Application to the Quantitative Evaluation of Linear and Nonlinear Dielectric Properties of Derroelectric and Piezoelectric Matrials International-presentation

K.Ohara, S.Kazuta, H.Odagawa

12th IEEE Internationl Symposium on the Applications of Ferroelectrics (ISAF2000)　2000/07
Scanning Electron Beam Dielectrc Microscopy for the Temperature Coefficient Distribution of Dielectric Ceramics International-presentation

O. Jintsugawa, A. Satoh, H. Odagawa, K.Yamanouchi

11th International Conference on Photoacoustic and Photothermal Phenomena　2000/06
Simultaneous observation of ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy International-presentation

H. Odagawa

The Sixth international Symposium on Ferroic Domains and Mesoscopic Structures　2000/05/29
走査型非線形誘電率顕微鏡によるナノメータ分極ドメインとトポグラフィの同時観測

小田川裕之

第１７回強誘電体応用会議　2000/05
Scanning nonlinear dielectric microscopy for investigation of nano-sized ferroelectric domains and local crystal anisotoropy

The Sixth international Symposium on Ferroic Domains and Mesoscopic Structures　2000/05
高分解能走査型非線形誘電率顕微鏡による強誘電ドメイン観測

小田川裕之, 数田聡, 大原鉱也

日本物理学会　2000/03
Determination of Crystal Polaritiy of Piezoelectric Thin Film Deposited on Polar Substrate Using Scanning Nonlinear Dielectric Microscopy International-presentation

S.KAZUTA, H.ODAGAWA, M.KADOTA

12th International Symposium on Integrated Ferroelectrics　2000/03
mage Production Mechanisum for Scanning Nonlinear Dielectric Microscopy with Super High Resolution and Its Application to Quantitative Evaluation of Linear and Nonlinear Dielectric Properties of Ferroelectric Materials International-presentation

K.OHARA, S.KAZUTA, H.ODAGAWA

12th International Symposium on Integrated Ferroelectrics　2000/03
Simultaneous Observation of Nano-Sized Ferroelectric Domains and Surface Morphology Using Scanning Nonlinear dielectric Microscopy International-presentation

H.ODAGAWA

12th International Symposium on Integrated Ferroelectrics　2000/03
走査型電子線誘電率顕微鏡による２次元誘電率温度係数像の実時間計測

佐藤聡, 小田川裕之

第47回応用物理学関連連合講演会　2000/03
走査型非線形誘電率顕微鏡によるＰＺＴ薄膜のナノスケール分極ドメインの観測

小田川裕之

第47回応用物理学関連連合講演会　2000/03
走査型非線形誘電率顕微鏡法による局所異方性検出に関する基礎的検討

大原鉱也, 我妻康夫, 数田聡, 小田川裕之

第47回応用物理学関連連合講演会　2000/03
走査型非線形誘電率顕微鏡を用いた強誘電体単結晶への微小分極情報の書き込み

数田聡, 小田川裕之

第47回応用物理学関連連合講演会　2000/03
SCANNING NONLINEAR DIELECTRIC MICROSCOPY FOR INVESTIGATION OF NANO-SIZED FERROELETRIC POLARIZATION International-presentation

S.Kazuta, K. Matsuura, H.Odagawa

The 7th International Colloquium on Scanning Probe Microscopy　1999/12
Simultaneous Observation of Ferroelectric Domain Patterns by Scanning Nonlinear Dielectric Microscope and Surface Morphology by Atomic Force Microscope International-presentation

H.Odagawa

The 7th International Colloquium on Scanning Probe Microscopy　1999/12
走査型非線形誘電率顕微鏡による分極ドメイン像とAFMによるトポグラフィの同時観測

小田川裕之

第２０回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1999/11
走査型非線形誘電率顕微鏡を用いたZnO圧電薄膜の面方位決定

数田聡, 小田川裕之, 門田道雄

第２０回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1999/11
走査型非線形誘電率顕微鏡を用いた定量計測

数田聡, 大原鉱也小田川

第２０回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1999/11
走査型非線形誘電率顕微鏡を用いた圧電薄膜の面方位決定

数田聡, 門田道雄

第６０回応用物理学会学術講演会　1999/09
走査型非線形誘電率顕微鏡を用いた線形・非線形誘電率の定量計測

大原鉱也, 数田聡

第６０回応用物理学会学術講演会　1999/09
走査型非線形誘電率顕微鏡による分極ドメイン像とAFM 像の同時計測

小田川裕之

第６０回応用物理学会学術講演会　1999/09
KNbO3単結晶の圧電定数の定量評価

太田憲行, 小田川裕之, 山之内和彦

第６０回応用物理学会学術講演会　1999/09
電子線誘電率信号の実時間計測に関する基礎的検討

佐藤聡

第６０回応用物理学会学術講演会　1999/09
走査型非線形誘電率顕微鏡を用いたZnO圧電薄膜の面方位決定

数田聡, 小田川裕之, 門田道雄

日本音響学会　1999/09
走査型非線形誘電率顕微鏡による分極ドメイン像とAFMによるトポグラフィの同時観測

小田川裕之

日本音響学会　1999/09
走査型非線形誘電率顕微鏡を用いた定量計測

大原鉱也, 数田聡, 小田川裕之

日本音響学会　1999/09
走査型電子線誘電率顕微鏡による誘電率温度係数像の撮影

神通川治, 佐藤聡, 山之内和彦

電子情報通信学会　1999/09
走査型非線形誘電率顕微鏡による分極ドメイン像とAFM像の同時観測

小田川裕之

平成11年度電気関係学会東北支部連合大会　1999/08
走査型非線形誘電率顕微鏡を用いた定量計測

大原鉱也, 数田聡, 小田川裕之

平成11年度電気関係学会東北支部連合大会　1999/08
走査型非線形誘電率顕微鏡を用いたBaTiO3の分極分布観測

数田聡, 小田川裕之

平成11年度電気関係学会東北支部連合大会　1999/08
高分解能走査型電子線誘電率顕微鏡による微小領域誘電率温度係数像の撮影と実時間計測

神通川治, 佐藤聡, 小田川裕之

平成11年度電気関係学会東北支部連合大会　1999/08
KNbO3単結晶の非線形圧電定数の定量評価

太田憲行, 小田川裕之, 山之内和彦

平成11年度電気関係学会東北支部連合大会　1999/08
New Piezoelectric KNbO3 Films for Saw Applications International-presentation

K.Yamanouchi, H. Odagawa, T.Kojima

the Eleventh IEEE International Symposium on Application of Ferroelectrics　1999/08
Scanning Nonliear Dielectric Microscope with Submicron Resolution International-presentation

Kaori Matsuura, K. Yamanouchi

the Eleventh IEEE International Symposium on Application of Ferroelectrics　1999/08
LN・LT強誘電分極壁のモルフォロジー不定比組成依存性

北村健二, 古川保典, 竹川俊二, 畑中孝明, 伊藤弘昌

日本結晶成長学会　1999/07
ナノメータ分解能走査型非線形誘電率顕微鏡による分極ドメインの観測

松浦かおり, 数田聡

第１６回強誘電体応用会議　1999/05
高安定高結合弾性表面波複合型基板

小谷謙司, 小田川裕之, 山之内和彦

日本音響学会　1999/03
２ターゲットRFマグネトロンスパッタによるKNbO3薄膜の作製と弾性表面波励振特性

小田川裕之, 野原庸平, 山之内和彦

日本音響学会　1999/03
走査型電子線誘電率顕微鏡の高分解能化

神通川治, 山之内和彦

第４６回応用物理学関連連合講演会　1999/03
走査型非線形誘電率顕微鏡に

数田聡, 松浦かおり, 山之内和彦

第４６回応用物理学関連連合講演会　1999/03
高分解能走査型非線形誘電率顕微鏡によるBaTiO3単結晶ドメインの観測

松浦かおり, 数田聡, 山之内和彦

第４６回応用物理学関連連合講演会　1999/03
周期分極反転LiNbO3と擬似位相整合光パラメトリック発振

畑中孝明, 宇佐美威, 柴崎浩樹, 中村孝一郎, 伊藤宏昌

第４６回応用物理学関連連合講演会　1999/03
KNbO3単結晶の非線形圧電定数の定量評価

太田憲行, 小田川裕之, 山之内和彦

第１９回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1998/11
LiTaO3,LiNbO3表面に形成される極薄単分域層

松浦かおり, 数田聡, 山之内和彦

第１９回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1998/11
KNbO3圧電性薄膜の分極分布と弾性表面波伝搬特性

小谷謙司, 小田川裕之, 山之内和彦

第１９回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1998/11
New Piezoelectric KNBO3 Film for SAW Device Application International-presentation

K.Yamanouchi, H.Odagawa, T.Kojima

1998 IEEE Ultrasonics Symposium　1998/10
QUANTITATIVE STUDY ON THE NONLINEAR PIEZOELECTRIC EFFECT OF KNbO3 SINGLE CRYSTAL FOR SUPER HIGHLY EFFICIENT SAW ELASTIC CONVOLVER International-presentation

N.Oota, K.Morozumi, H.Odagawa, K.Yamanouchi

1998 IEEE Ultrasonics Symposium　1998/10
KNbO3圧電性薄膜の分極分布と弾性表面波伝搬特性

小谷謙司, 小田川裕之, 山之内和彦

電子情報通信学会　1998/09
KNbO3単結晶の非線形圧電定数の定量評価

太田憲行, 小田川裕之, 山之内和彦

電子情報通信学会　1998/09
ε311型非線形誘電率顕微鏡に関する基礎的検討

松浦かおり, 西中篤司, 山之内和彦

第５９回応用物理学会学術講演会　1998/09
多分域LiTaO3単結晶の熱処理による単分域表面層の形成

松浦かおり, 数田聡, 山之内和彦

第５９回応用物理学会学術講演会　1998/09
光熱誘電率信号の実時間計測に関する基礎的検討

加島隆行, 神通川治, 山之内和彦

第５９回応用物理学会学術講演会　1998/09
KNbO3圧電薄膜の分極分布と弾性表面波伝搬特性

小田川裕之, 小谷謙司, 山之内和彦

日本音響学会　1998/09
KNbO3単結晶の非線形圧電定数の定量評価

太田憲行, 小田川裕之, 山之内和彦

日本音響学会　1998/09
SCANNING NONLINEAR DIELECTRIC MICROSCOPE WITH SUBMICRON RESOLUTION International-presentation

K. Yamanouchi

ECAPD Ⅳ'98, ISAF Ⅺ '98, Electroceramics Ⅵ'98　1998/06
走査型電子線誘電率顕微鏡に関する基礎的検討

山之内和彦

第１５回強誘電体応用会議　1998/05
SCANNING NONLINEAR DIELECTRIC MICROSCOPE FOR INVESTIGATION OF FERROELECTRIC DOMAINS International-presentation

K.YAMANOUCHI

The Fifth International Symposium on Ferroic Domains and Mesoscopic Structures　1998/04/06
走査型電子線誘電率顕微鏡

永野浩之, 山之内和彦

日本音響学会　1998/03
走査型電子線誘電率顕微鏡に関する基礎的検討

永野浩之, 山之内和彦

第４５回応用物理学関連連合講演会　1998/03
KNbO3単結晶基板を用いた弾性表面波エラスティックコンボルバ

山之内和彦, 両角賢友, 小田川裕之

第１８回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1997/11
高分解能走査型非線形誘電率顕微鏡

松浦かおり

第１８回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1997/11
非線形誘電率の残留分極依存性の計測

厳忠友

第５８回応用物理学会学術講演会　1997/10
高分解能走査型非線形誘電率顕微鏡による強誘電分域の観測

松浦かおり

第５８回応用物理学会学術講演会　1997/10
高分解能走査型非線形誘電率顕微鏡による分極ドメインの観測

松浦かおり

日本音響学会　1997/09
"Observation of Dielectric temperature Coefficient Image Using Photothermal Dielectric Microscope International-presentation

T. Kasahara

1997 URSI North American Radio Science Meeting　1997/07
MICROSCOPIC OBSERVATION OF THE TEMPERATURE COEFFICIENT DISTRIBUTION OF DIELECTRIC MATERIAL FOR MICROWAVE APPLICATION USING SCANNING PHOTOTHRMAL DIELECTRIC MICROSCOPE International-presentation

T. Kasahara, K. Fukuda

1997 IEEE MTT-S International Microwave Symposium　1997/06
光熱誘電率顕微鏡を用いた誘電率温度係数像の測定

笠原輝昭

第１４回強誘電体応用会議　1997/05
光熱誘電率顕微鏡を用いた誘電率温度係数像の測定

笠原輝昭

日本音響学会　1997/03
走査型非線形誘電率顕微鏡を用いた強誘電分極像の観察

厚見茂幸

日本音響学会　1997/03
非線形誘電率の計測による強誘電体記録の再生に関する基礎的実験

松浦かおり

第４４回応用物理学関連連合講演会　1997/03
光熱誘電率顕微鏡を用いた誘電率温度係数像の計測

笠原輝昭

第４４回応用物理学関連連合講演会　1997/03
走査型非線形誘電率顕微鏡を用いた強誘電分極像の観察

厚見茂幸

第４４回応用物理学関連連合講演会　1997/03
YBCO膜の作成及び平面型マイクロ波デバイスの試作

金谷晴一, 兼行智彦, 妹尾英博

第４４回応用物理学関連連合講演会　1997/03
マイクロ波技術を用いた強誘電分極分布の純電気的測定法

厚見茂幸

電子情報通信学会　1996/11
YBCO膜を用いたコプレーナ型マイクロ波デバイスの開発

兼行智彦, 金谷晴一, 粟井郁雄

電子情報通信学会　1996/11
粉体の光熱誘電率信号の計測

熊丸知之, 笠原輝昭

第１７回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1996/10
集中定数型走査型非線形誘電率顕微鏡

厚見茂幸

第１７回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1996/10
多結晶MgO基板上に作製したPb置換Bi系高温超伝導膜の高周波表面抵抗

崎本吉大, 金谷晴一, 粟井郁雄

平成８年度電気・情報関連学会中国支部連合大会　1996/10
Y系高温超伝導膜の作製及び高周波デバイスへの応用

兼行智彦, 金谷晴一, 粟井郁雄

平成８年度電気・情報関連学会中国支部連合大会　1996/10
集中定数型走査型非線形誘電率顕微鏡による強誘電分極の観察

厚見茂幸, 中村僖良

平成８年度電気・情報関連学会中国支部連合大会　1996/10
光熱誘電率分光顕微鏡を用いた粉体の粒径推定

熊丸知之

第５７回応用物理学会学術講演会　1996/09
Sol-Gel法によるＹＢＣＯ膜の作製及び高周波特性

兼行智彦, 金谷晴一, 粟井郁雄

第５７回応用物理学会学術講演会　1996/09
光熱誘電率顕微鏡を用いた粉体の粒径推定

熊丸知之, 笠原輝昭

日本音響学会　1996/09
複合材料中の非線形波動の一次元シミュレーション

井手上公太郎, M.A.Breazaele

日本音響学会　1996/09
Scanning Nonlinear Dielectric Microscope for Investigation of Polarization Distributions International-presentation

A.Kirihara

The Tenth International Symposium on Applications of Ferroelectrics　1996/08
New Photothermal Technique Using Photothermal Dielectric International-presentation

T.Kumamaru

9th International Conference on Photoacoustic and Photothermal Phenomena　1996/06
走査型非線形誘電率顕微鏡の非接触モードによる

桐原昭雄, 佐伯考央

第１３回強誘電体応用会議　1996/05
光熱誘電率分光顕微鏡による機能性材料の評価法の開発

熊丸知之

平成７年度東北大学電気通信研究所共同プロジェクトＡ−９フォノン集積デバイス・材料の研究　1996/03
光熱誘電率分光顕微鏡を用いた機能性材料の評価法の開発

熊丸知之

日本学術振興会弾性波素子技術第１５０委員会第４6回研究会　1996/01
Development of Nonlinear Dielectric Microscope and Its Application to Measurement of Ferroelectric Polarization International-presentation

A.Kirihara, T.Saeki

1995 IEEE Ultrasonics Symposium　1995/11
液体の光熱誘電率信号の計測

熊丸知之

第１６回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1995/11
光熱誘電率分光顕微鏡を用いた光学用材料の分光測定

熊丸知之

日本音響学会　1995/09
非線形誘電率顕微鏡の非接触モードによる強誘電分極の観測

桐原昭雄, 佐伯考央

日本音響学会　1995/09
Dynamic Measurement of The Temperature Characteristic of Dielectric Material for Microwave Application Using Photo Thermal Dielectric Microscope International-presentation

K.Yokoyma, T.Kumamaru, A.Kirihara

1995 IEEE MTT-S International Microwave Symposium　1995/05
非線形誘電率顕微鏡によるＰ（ＶＤＦ−ＴｒＦＥ）膜の計測

桐原昭雄, 佐伯考央

日本音響学会　1995/03
液体及び粉体用光M誘電率顕微鏡の試作

熊丸知之, 小田俊介

日本音響学会　1995/03
光熱誘電率顕微鏡を用いた誘電材料の誘電率温度特性の評価

横山浩二

日本音響学会　1995/03
光熱誘電率分光顕微鏡による遷移金属ドープ材料の測定

熊丸知之, 小田俊介

日本音響学会　1995/03
光誘電率分光顕微鏡の基本特性評価

熊丸知之, 横山浩二, 小田俊介, 桐原昭雄

電子情報通信学会　1995/02
非線形誘電率顕微鏡

桐原昭雄, 佐伯孝央

日本学術振興会弾性波素子技術第１５０委員会第４２回研究会　1995/01
光熱誘電率分光顕微鏡

熊丸知之, 横山浩二, 小田俊介

日本学術振興会弾性波素子技術第１５０委員会第４２回研究会　1995/01
光誘電率顕微鏡

熊丸知之

日本音響学会　1994/11
非線形領域におけるＳＡＷの分散と減衰に関する一考察

宮川望

日本音響学会　1994/11
４次の非線形定数の対称性

万代幸広

日本音響学会　1994/11
Active Control of Nonlinear Piezoelectric Effect and Its Appliaction to 20dB Efficiency Improvement of SAW Elastic Convolver International-presentation

S.Haitsuka, M.Kadota

1994 IEEE Ultrasonics Symposium　1994/11
Experimental Demonstration of the Reduction of The Number of Independent Electrostrictive Constants of Piezoelectric Ceramics International-presentation

Y.Mandai

1994 IEEE Ultrasonics Symposium　1994/11
非線形誘電率顕微鏡

桐原昭雄, 佐伯孝央

電子情報通信学会　1994/11
光熱誘電率顕微鏡を用いたマイクロ波用誘電セラミックスの誘電率温度特性の評価技術の開発

横山浩二, 熊丸知之, 桐原昭雄

電子情報通信学会　1994/11
光誘電率分光顕微鏡

熊丸知之

第１５回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1994/11
ＢＳＣＣＯ厚膜の表面抵抗の測定と高周波デバイスへの応用

西村匡夫, 粟井郁雄

平成６年度電気・情報関連学会中国支部連合大会　1994/10
非線形誘電率顕微鏡

桐原昭雄, 佐伯孝央

日本音響学会　1994/10
圧電Zラミックスの電歪定数の独立数の減少に関する実験的検証

万代幸広

日本学術振興会弾性波素子技術第１５０委員会第４０回研究会　1994/09
光誘電率分光法

熊丸知之

第５５回応用物理学会学術講演会　1994/09
光誘電率顕微鏡に関する基礎的検討

熊丸知之

電子情報通信学会１９９４年秋季大会　1994/09
非線形誘電率顕微鏡に関する基礎的検討

桐原昭雄, 佐伯孝央

電子情報通信学会１９９４年秋季大会　1994/09
圧電セラミックスの印加応力による誘電率変化の動的測定と電歪定数の独立数に関する検討

万代幸広

非線形音響研究会　1994/08
圧電セラミックスの印加応力による誘電率変化の動的測定と電歪定数の独立数に関する検討

万代幸広

電子情報通信学会　1994/06
20dB Efficiency Increment of Surface Acoustic Wave Elastic Convolver Using Actively Coltrolled Nonlinear Piezoelecric Effect International-presentation

S.Haitsuka, M.Kadota

1994 IEEE MTT-S International Microwave Symposium　1994/05
薄いＢＳＣＣＯ厚膜の作製とそのマイクロ波応用

磯山伸治, 粟井郁雄

電子情報通信学会　1994/04
層状構造基板上を伝搬するＳＡＷソリトンに関する基礎的検討

宮川望

日本音響学会　1994/03
非線形圧電定数の簡易計測ノよる圧電セラミックスコンボルバの基本特性評価

灰塚真一, 門田道雄

日本音響学会　1994/03
圧電セラミックスの非線形定数の独立数に関する一検討

万代幸広

第４１回応用物理学関係連合講演会　1994/03
非線形圧電性の制御とその弾性表面波エラスティックコンボルバの高効率化への応用

灰塚真一, 門田道雄

第１４回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1993/12
圧電セラミックスの非線形圧電性の制御とそのＳＡＷエラスティックコンボルバの高効率化への応用

灰塚真一, 門田道雄

日本学術振興会弾性波素子技術第１５０委員会第３７回研究会　1993/11
Nonlinear Equivalent Circuits of Acoustic Devices International-presentation

J.Wakita

IEEE 1993 Ultrasonics Symposium　1993/11
Surface Acoustic Wave Soliton Propagating on the Metallic

N.Miyagawa

IEEE 1993 Ultrasonics Symposium　1993/11
ＢaＴiＯ3の相転移点に於ける非線形誘電率の異常現象

脇田淳司

日本音響学会　1993/10
ＡＴカット水晶振動子と縦水晶振動子の非線形等価回路の定式化と４次の弾性定数の推定

脇田淳司

日本音響学会　1993/10
ＳＡＷソリトン発生用導波路の分散性に関する一考察

宮川望

平成５年度電気・情報関連学会中国支部連合大会　1993/10
薄いＢＳＣＣＯ厚膜の作製と高周波線路への応用

磯山伸治, 粟井郁雄

平成５年度電気・情報関連学会中国支部連合大会　1993/10
Ｓｏｌ−Ｇｅｌ法によるＢｉ系超伝導薄膜の作製とコプレーナ線路への応用

西村匡夫, 粟井郁雄

平成５年度電気・情報関連学会中国支部連合大会　1993/10
非線形圧電性強調効果を用いたＳＡＷコンボルバの高効率化

灰塚真一, 門田道雄

日本音響学会　1993/03
圧電セラミックスの印加応力による音速変化の動的測定

松野文彦

日本音響学会　1993/03
金属グレーティング導波路上を伝搬するＳＡＷソリトンに関する実験的検討

宮川望

日本音響学会　1993/03
金属グレーeィング導波路上を伝搬するＳＡＷソリトンに関する基礎的検討

宮川望

日本学術振興会　1993/01
棒の伸び振動子における電場と音波の非線形相互作用の等価回路解析

脇田淳司

超音波における多波混合と位相共役波発生講演論　1992/11
弾性波素子及び弾性表面波伝搬の非線形等価回路解析

脇田淳司, 宮川望

第１３回超音波エレクトロニクスの基礎と応用に関するシンポジウム　1992/11
金属グレーティング導波路上を伝搬するＳＡＷソリトンの等価回路解析

宮川望

日本音響学会　1992/10
ＰＺＴセラミクスの非線形定数の温度特性

松野文彦

日本音響学会　1992/10
弾性波素子の非線形等価回路用定数の測定

脇田淳司

日本音響学会　1992/10
静磁波トランスバーサルフィルタ

井上貴章, 粟井郁雄

平成４年度電気・情報関連学会中国支部連合大会　1992/10
Dynamic Measuring Method of Velocity and Capacitance Variation of Piezoelectric Ceramics with Alternating Electric Field

F.Matsuno

IEEE 1992 Ultrasonics Symposium　1992/10
弾性波素子の非線形等価回路の定式化とその応用例

脇田淳司

日本学術振興会　1992/07
弾性波素子の非線形等価回路

第１６回非線形音響研究会　1992/07
弾性波素子の非線形等価回路による解析

樋野哲也

電子情報通信学会春季大会　1992/03
弾性波素子の非線形等価回路

樋野哲也

日本音響学会　1992/03
圧電材料の動的応力印加による非線形定数の測定法

松野文彦, 脇田淳司, 桐原昭雄

日本音響学会　1992/03
ＰＺＴセラミックスの印加電界による音速変化の動的測定

松野文彦, 脇田淳司

電気関係学会関西支部連合大会　1991/11
圧電セラミックスの印加電界による音速及び誘電率化の動的測定法

松野文彦, 脇田淳司

日本学術振興会　1991/11
連続波動作可能なマイクロ波超音波発生用凹形空洞共振器の試作

森本茂生

平成３年度電気・情報関連学会中国支部連合大会　1991/10
高次の誘電率の断面的測定

松野文彦

電気・情報関連学会中国支部連合大会　1991/10
３次の圧電定数の断熱的測定法

日本音響学会　1991/10

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松野文彦
電歪材料の諸定数間の関係とその圧電セラミックスへの適用範囲

松野文彦

電子情報通信学会　1991/07
圧電セラミックスの非線形定数の測定

松野文彦, 粟井郁雄

電子情報通信学会春期全国大会　1991/03
圧電セラミクスの非線形定数に関する一考察

電気関係学会中国支部連合大会　1990/10
鉄属イオンドープLiNbO3単結晶の弾性表面波常磁性共鳴

堀江秀善, 山之内和彦

日本音響学会　1990/03
鉄属イオンドープLiNbO3単結晶の弾性表面波常磁性共鳴

堀江秀善, 山之内和彦

超音波エレクトロニクスの基礎と応用に関するシンポジウム　1989/11
非線形定数の決定法

山之内和彦

第25回東北大通研シンポジウム　1989/02
SHF-Range Surface Acoustic Wave Inter-Digital Transducers Using Electron Beam Exposure International-presentation

K.Yamanouchi, T.Meguro

IEEE 1988 ULTRASONICS SYMPOSIUM　1988/11
ＳＨＦ帯弾性表面波の音響常磁性共鳴による吸収及び誘導放出

堀江秀善, 山之内和彦

日本音響学会　1988/10
ＳＨＦ帯弾性表面波の音響常磁性共鳴による吸収及び誘導放出

堀江秀善, 山之内和彦

電子情報通信学会　1988/09
水平取り出しエラステックコンボルバの高効率化に関する一考察

山之内和彦

日本音響学会　1987/03
ナノメータ加工技術をpいたＳＨＦ帯弾性表面波変換器

山之内和彦

日本音響学会　1987/03
Nonlinear Constants of Lithium Niobate International-presentation

K.Yamanouchi

IEEE 1986 ULTRASONICS SYMPOSIUM　1986/11
Theoretical and Experimental Studies of Transverse- International-presentation

K.Yamanouchi

IEEE 1986 ULTRASONICS SYMPOSIUM　1986/11
LiNbO3単結晶上を伝搬する弾性表面波に対する非線形スカラー波動方程式の一考察

山之内和彦

日本音響学会　1986/10
LiNbO3単結晶上を伝搬する弾性表面波ノ対する非線形スカラー波動方程式の一考察

山之内和彦

電子通信学会　1986/09
LiNbO3単結晶の非線形定数の決定と非線形弾性波デバイスへの応用

山之内和彦

電子通信学会　1986/07
LiNbO3エラステックコンボルバの最適カット

山之内和彦

日本学術振興会弾性波素技術第150委員会研究会　1986/05
LiNbO3単結晶の３次の弾性・圧電・誘電定数及び電歪定数の測定・評価

山之内和彦

日本音響学会　1986/03
水平取り出しエラステックコンボルバの性能指数

山之内和彦

日本音響学会　1986/03
水平電界型コンボルバの動作解析と実験−LiNbO3単結晶基板についての検討−

山之内和彦

東北大学電気通信研究所音響工学研究会　1986/02
３次の誘電・電歪・圧電及び弾性定数の解析と測定法−LiNbO3に対する測定・評価−

山之内和彦

電子通信学会　1985/09
LiNbO3単結晶の高次の諸定数の測定

山之内和彦

第５回強誘電体応用会議　1985/05
LiNbO3単結晶の非線形定数の測定

鈴木嘉久, 山之内和彦

日本音響学会　1985/03
弾性表面波を用いた薄膜状態に於ける粘性定数の測定法

鈴木嘉久, 山之内和彦

日本音響学会　1984/10
LiNbO3コンボルバの性能指数フ測定と３次の圧電定数の評価

山之内和彦

日本音響学会　1984/10
LiNbO3コンボルバの性能指数のカット面及び伝搬方向依存性の実験的検討と３次の電圧定数の評価

山之内和彦

電子通信学会　1984/06
LiNbO3コンボルバの性\指数のカット面及び伝搬方向依存性の実験的検討

山之内和彦

日本音響学会　1984/03
LiIO3単結晶の弾性表面波伝搬特性及び非線形効果

依田文夫, 山之内和彦

日本音響学会　1983/10
超高周波用コンボルバの取り出し電極に関する一考察

山之内和彦

電子通信学会総合全国大会　1983/03
ＧＨｚ帯でのＡｌ薄膜による弾性表面波の減衰特性

山之内和彦

応用物理学会　1983/03
エラステックコンボルバの性能指数の回転角依存性

山之内和彦

日本音響学会　1982/10
弾性表面波と半導体キャリヤとの相互作用を用いた非線形縦効果デバイス

山之内和彦

日本音響学会　1982/03
Nondestructive Measurements of Double-Layered Piezoelectric Polarity-Inverted Structure Using Scanning Nonlinear Dielectricy International-presentation

CHO Yasuo

hird International Symposium on Dielectric Materials and Applications

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Industrial Property Rights 60

記録再生ヘッド及び記録再生装置

長康雄, 尾上篤

Property Type: Patent
走査型非線形誘電率顕微鏡を応用した超高感度変位計測方式

長康雄外

Property Type: Patent
誘電測定装置，誘電測定方法,及び情報記録・再生装置

長康雄外

Property Type: Patent
透磁率測定装置

長康雄

Property Type: Patent
圧電薄膜弾性波素子及びこれを用いた情報処理装置

芝隆司外

Property Type: Patent
誘電体記録・再生装置及び記録方法ならびにその電極

長康雄

Property Type: Patent
探針空隙制御方法，及び，記録再生装置

長康雄

Property Type: Patent
PbTiO3またはPb(ZrTi)O3の強誘電体薄膜単結晶の製造方法

森田剛外

Property Type: Patent
強誘電体記録媒体用の情報再生装置

長康雄, 尾上篤

特許第4328355

Property Type: Patent
強誘電体薄膜製造方法，電圧印加エッチング装置，強誘電体結晶薄膜基板及び強誘電体結晶ウエハ

長康雄, 尾上篤

Property Type: Patent
信号検出方法及び装置,並びに情報再生装置及び方法

長康雄, 尾上篤

Property Type: Patent
誘電率測定装置，誘電体測定方法，及び情報記録再生装置

長康雄外

Property Type: Patent
針状部材を用いたデータ記録再生装置及びデータ記録再生方法

長康雄外

Property Type: Patent
誘電体記録再生ヘッド及び誘電体記録再生装置

長康雄, 尾上篤

特許第3968196号

Property Type: Patent
誘電体再生装置,誘電体記録装置及び誘電体記録再生装置

長康雄, 尾上篤

特許第4098689号

Property Type: Patent
誘電体記録装置,誘電体再生装置及び誘電体記録再生装置

長康雄外

Property Type: Patent
誘電体記録再生ヘッド及びトラッキング方法

尾上篤, 長康雄

特許第4017104号

Property Type: Patent
ピックアップ装置

尾上篤, 長康雄

特許第3954456号

Property Type: Patent
誘電体記録媒体及び誘電体記録再生装置

尾上篤, 長康雄

特許第3964457号

Property Type: Patent
記録再生ヘッド及びその製造方法

長康雄, 尾上篤

特許第4082947号

Property Type: Patent
誘電体記録再生ヘッド，誘電体記録媒体ユニット及び誘電体記録再生装置

長康雄, 尾上篤

特許第4141745号

Property Type: Patent
誘電体記録媒体の記録条件抽出システム及び記録条件抽出方法ならびに情報記録装置

長康雄外

Property Type: Patent
誘電体記録媒体とその製造方法及びその製造装置

長康雄, 尾上篤

特許第4109475号

Property Type: Patent
誘電体記録媒体とその製造方法及びその製造装置

長康雄, 尾上篤

Property Type: Patent
誘電体記録媒体とその製造方法及びその製造装置

長康雄, 尾上篤

特許第4082911号

Property Type: Patent
誘電体情報装置，テープ状媒体記録再生装置及びディスク状媒体記録再生装置

長康雄, 尾上篤

特許第4771324号

Property Type: Patent
走査型非線形誘電率顕微鏡を応用した超高感度変位計測方式

長康雄, 安武正敏, 渡部和俊

特許第4673446号

Property Type: Patent
高次非線形誘電率を計測する走査型非線形誘電率顕微鏡

長康雄, 安武正敏, 渡部和俊

特許第4693270号

Property Type: Patent
三次元分極計測用の走査型非線形誘電率顕微鏡

長康雄, 小田川裕之, 安武正敏, 渡部和俊

特許第4445149号

Property Type: Patent
高安定高結合弾性表面波基板とそれを用いた弾性表面波フィルタ及び弾性表面波機能素子

長康雄, 山之内和彦

Property Type: Patent
誘電率温度係数測定装置

長康雄

特許第3204851号

Property Type: Patent
非線形誘電率測定装置

長康雄

特許第3204852号

Property Type: Patent
エラスティックコンボルバ装置

長康雄

特許第3222965号

Property Type: Patent
透磁率測定装置

長康雄

特許第5050208

Property Type: Patent
DATA RECORDING/REPRODUCING APPARATUS AND METHOD USING NEEDLE-SHAPED MEMBER

Yasuo Cho, Atsushi Onoe

US 8004,948,B2

Property Type: Patent
PERMRABILITY MEASURERMENT APPARATUS

Yasuo Cho

US 7,816,917 B2

Property Type: Patent
DIELECTRIC RECORDING MEDIUM, AND METHOD OF AND APPARATUS FOR PRODUCING THE SAME

Atsushi Onoe, Yasuo Cho

US7272,173,B2

Property Type: Patent
強誘電体薄膜製造方法，電圧印加エッチング装置，強誘電体結晶薄膜基板及び強誘電体結晶ウエハ

長康雄, 尾上篤

特許第4641943号

Property Type: Patent
信号検出方法及び装置,並びに情報再生装置及び方法

長康雄, 尾上篤

特許第4326007号

Property Type: Patent
Recording/reproducing head and recording/reproducing apparatus

Atsushi Onoe, Yasuo Cho

GB2415827

Property Type: Patent
記録再生ヘッド及び記録再生装置

長康雄, 尾上篤

特許第4274571号

Property Type: Patent
SIGNAL DETECTING METHOD AND APPARATUS AND INFORMATION REPRODUCING APPARATUS AND METHOD

Yasuo Cho, Atsushi Onoe

7,590,040

Property Type: Patent
DATA RECORDING/REPRODUCING APPARATUS AND METHOD USING NEEDLE-SHAPED MEMBER

Yasuo Cho, Atsushi Onoe

US 7.385.901 B2

Property Type: Patent
DATA RTECORDING/REPRODUCING APPARATUS AND METHOD USING NEEDLE-SHAPED MEMBER

Yasuo Cho, Atsushi Onoe

US 7,385,901 B2

Property Type: Patent
SIGNAL DETECTING METHOD AND APPARATUS AND INFORMATION REPRODUCING APPRATUS AND METHOD

Yasuo Cho, Atsushi Onoe

US 7,590,040 B2

Property Type: Patent
DATA RECORDING / REPRODUCING APPARATUS AND METHOD USING NEEDLE-SHAPED MEMBER

Cho Yasuo, Pioneer Corporation

1486966

Property Type: Patent
DIELECTRIC RECORDING/REPROCUCING HEAD AND DIELECTRIC RECORDING/REPRODUCING APPARATUS

Yasuo Cho, Atsushi Onoe

US7,151,739 B2

Property Type: Patent
DIELECTRIC REPRODUCING APPARATUS, DIELECTRIC RECORDING APPARATUS, AND DIELECTRIC RECORDING/REPRODUCING APPARATUS

Yasuo Cho, Atsushi Onoe

US 7,336,590 B2

Property Type: Patent
DIELECTRIC RECORDING APPARATUS, DIELECTRIC REPRODUCING APPARATUS, AND DIELECTRIC RECORDING / REPRODUCING APPARATUS

Yasuo Cho, Atsushi Onoe

US 7.227.830 B2

Property Type: Patent
DIELECTRIC RECORDING APPARATUS DIELECTRIC REPRODUCING APPARATUS,AND DIELECTRIC RECORDING/REPRODUCING APPARATUS

Cho Yasuo, Onoe Atsushi

1 398 780

Property Type: Patent
DIELECTRIC REPRODUCING APPARATUS, DIELECTRIC RECORDING APPARATUS, AND DIELECTRIC RECORDING/ REPRODUCING APPARATUS

Cho Yasuo

1398779

Property Type: Patent
RECORDING/REPRODUCING HEAD

Atsushi Onoe, Yasuo Cho

US 7.283.453 B2

Property Type: Patent
DIELECTRIC RECORDING/PEPRODUCING HEAD AND TRACKING METHOD

Yasuo Cho

1 394 789

Property Type: Patent
DIELECTRIC RECORDING/REPRODUCING HEAD AND TRACKING METHOD

Yasuo Cho

1 752 981

Property Type: Patent
Record condition extraction system and method of dielectric recording medium, and information recording apparatus

Cho,Yasuo, Onoe Atsushi

No.1333436

Property Type: Patent
DIELECTRIC RECORDING MEDIUM AND APPARATUS FOR PRODUCING THE SAME

Atsushi Onoe, Yasuo Cho

US6942914 B2

Property Type: Patent
PICKUP DEVICE

Atsushi Onoe, Yasuo Cho

US7,221,639 B2

Property Type: Patent
DIELECTRIC CONSTANT MEASURING APPARATUS DIELECTRIC CONSTANT MEASURING METHOD, AND INFORMATION RECORDING/REPRODUCING APPARATUS

Yasuo Cho, Atsushi Onoe

US 7,218,600 B2

Property Type: Patent
DIELECTRIC INFORMATION APPARATUS, TAPE-LIKE MEDIUM RECORDING/REPRODUCING APPARATUS AND DISC-LIKE MEDIUM RECORDING/REPRODUCING APPARATUS

Yasuo Cho, Atsushi Onoe

US7,242,661 B2

Property Type: Patent
DIELECTRIC CONSTANT MEASURING APPARATUS, DIELECTRIC CONSTANT MEASURING METHOD, AND INFORMATION RECORDING/REPRODUCING APPARATUS

Onoe Atsushi, Cho Yasuo

1435003

Property Type: Patent

Show all Show first 5

Research Projects 57

走査型非線形誘電率顕微鏡を用いたGaN-MOSの高性能化に資する計測評価 Competitive

長康雄, 山末耕平

Offer Organization: 文部科学省

System: 革新的パワーエレクトロニクス創出基盤技術研究開発事業(次々世代・周辺技術領域)

Category: 受託研究

Institution: 東北大学電気通信研究所

2021/08 - 2023/03
Elucidation of atomic structure and dynamics of carrier trap sites Competitive

Offer Organization: Japan Society for the Promotion of Science

System: Grants-in-Aid for Scientific Research Grant-in-Aid for Challenging Research (Exploratory)

Category: Grant-in-Aid for Challenging Research (Exploratory)

Institution: Tohoku University

2021/07 - 2023/03
Origin elucidation of the problems in the interface electric charge transportation phenomenon using scanning nonlinear dielectric microscopy Competitive

Offer Organization: Japan Society for the Promotion of Science

System: Grants-in-Aid for Scientific Research Grant-in-Aid for Scientific Research (S)

Category: Grant-in-Aid for Scientific Research (S)

Institution: Tohoku University

2016/05 - 2022/03
超高次非線形誘電率顕微鏡法を用いたSiC基板材料及びパワーエレクトロニクス素子の高性能化に資する評価技術の開発 Competitive

長康雄

Offer Organization: NEDO

System: ＳＩＰ（戦略的イノベーション創造プログラム）／次世代パワーエレクトロニクス／将来のパワーエレクトロニクスを支える基盤研究開発

2014 - 2019/03
Measurement method for polarity-inverted layered piezoelectric thin films using scanning nonlinear dielectric microscopy

ODAGAWA HIROYUKI, CHO YASUO

Offer Organization: Japan Society for the Promotion of Science

System: Grants-in-Aid for Scientific Research

Category: Grant-in-Aid for Scientific Research (C)

Institution: National Institute of Technology, Kumamoto College

2015/04 - 2018/03

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Recently, it is reported that the polarity of ZnO and AlN piezoelectric thin film fabricated by radio frequency (RF) magnetron sputtering method can be switched by changing the growth condition, and polarity-inverted structure has been obtained. In this research, we have developed the quantitative measurement method for the thickness of a polarity inverted layer using canning nonlinear dielectric microscopy (SNDM). We derive an equation that represents the relationship between the output signal and the oscillation frequency of the SNDM probe, and developed the measurement procedure that can determine the thickness of polarity-inverted single layer structure. We applied it to two-dimensional distribution measurements of the layer thickness. Moreover, we investigated the measurement for double layered structure. We showed that it is possible to determine the thickness of two layers by controlling depth profile of electric field inside the measurement materials using a soft probe tip.
界面電荷輸送現象解明のための高機能走査型非線形誘電率顕微鏡群の研究開発 Competitive

長康雄, 山末耕平, 平永良臣

Offer Organization: 日本学術振興会

System: 科学研究費助成事業基盤研究(A)

Category: 基盤研究(A)

Institution: 東北大学

2016/04 - 2017/03

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界面電荷輸送現象における諸問題の起源解明のための，新規多機能・高性能走査型非線形誘電率顕微鏡（SNDM）群を研究開発する．具体的には局所Deep-level transient spectroscopy(DLTS)法の行えるSNDM装置と走査型非線形誘電率常磁性共鳴顕微鏡法（SNDMR）を新規に開発のする.また近年開発してきた走査型非線形誘電率ポテンショメトリ（SNDP）法や，原子分解能非接触走査型非線形誘電率顕微鏡（NC-SNDM）法，超高次走査型非線形誘電率顕微鏡法（SHO-SNDM）の更なる高度化を図りそれらを総て組み合わせ，半導体MOS界面やグラフェン/SiCの移動度低下の原因を特定し，半ば永遠の工学的問題とされて来た問題を一挙に解決できる装置群とする．ひいては界面（表面）を使った半導体デバイスや伝導デバイスの性能を飛躍的に向上させる事に貢献する事を目的とする．この目的を達成するため本年度は ①超高次非線形誘電率顕微鏡法（SHO-SNDM）の更なる高度化. ②原子分解能非接触SNDM(NC-SNDM)法並びに界面評価用非線形誘電率ポテンショメリ（SNDP）の高度化． ③局所DLTS法の開発. を行う予定であったが研究を開始した直後，基盤研究（S）に採択され，重複制限に該当するため本基盤研究(A)は取り消しとなった．そのため実質的に研究できる期間は皆無であり，当然のことながら研究実績も一切無い.
High functionalization of nonlinear dielectric microscopy and its application to electronic devices

Cho Yasuo

Offer Organization: Japan Society for the Promotion of Science

System: Grants-in-Aid for Scientific Research Grant-in-Aid for Scientific Research (S)

Category: Grant-in-Aid for Scientific Research (S)

Institution: Tohoku University

2011/04 - 2016/03

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New SNDM family method, which measures not only dC/dV term but also higher order differentiation terms, has been developed. Using this method, we can obtain much more precise physical information of materials and devices. We name this technique super-higher-order scanning nonlinear dielectric microscopy (SHO-SNDM). We can easily reconstruct C-V curve at each pixel with this method. As a result, the analysis ability is drastically improved.Next, we have developed scanning nonlinear dielectric potentiometory (SNDP) which can measure dipole moment induced surface potential with atomic resolution. Using this method, we simultaneously measured topography and surface potential of mono layer graphene formed on the 4H-SiC(0001) substrate. Finally, memory density of 3.4Tbit/inch2 were achieved using the hard-disk-drive (HDD)-type ferroelectric data storage system.
Visualization of atomic dipole moment and identification of atomic species by using scanning nonlinear dielectric microscopy Competitive

CHO Yasuo

Offer Organization: Japan Society for the Promotion of Science

System: Grants-in-Aid for Scientific Research Grant-in-Aid for Challenging Exploratory Research

Category: Grant-in-Aid for Challenging Exploratory Research

Institution: Tohoku University

2012/04 - 2015/03

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In this study, aiming the identification of atomic species by developing a highly functionalized and high performance scanning nonlinear dielectric microscopy (SNDM), we performed atomically resolved measurement for several materials. We measured hydrogen adsorbed Si(111) surface and oxygen absorbed Si(100) surface and succeeded to identify the adsorption site and to determine atomic structure of the site. We newly invented a new atomically resolved potentiometry named scanning nonlinear dielectric potentiometry (SNDP). Using this SNDP, we revealed the electronic state of interface between graphene and SiC substrate. These results show that SNDM and SNDP have a great potential to identify atomic spices on the surface of condensed matter and their bonding state to substrates.
SiCパワーデバイス高精度定量測定技術の開発 Competitive

長康雄

Offer Organization: トヨタ自動車株式会社

System: 共同研究

2014 - 2014
Next Generation Super High Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy Technique Competitive

CHO Yasuo, HIROSE Ryusuke, HIRANAGA Yoshiomi, KIN Nobuhiro, YAMASUE Kohei

Offer Organization: Japan Society for the Promotion of Science

System: Grants-in-Aid for Scientific Research Grant-in-Aid for Specially Promoted Research

Category: Grant-in-Aid for Specially Promoted Research

Institution: Tohoku University

2006 - 2010

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We had made a study on next generation high density ferroelectric data storage based on scanning nonlinear dielectric microscopy. We have succeeded in forming world smallest ferroelectric single nano-domain dot with the size of 2.8nm in diameter. Also, we had achieved the memory density of 4Tbit/inch^2 in actual information recording which requires an abundance of bits to be packed together.
複合型走査型非線形誘電率顕微鏡の開発 Competitive

長康雄

System: 先端計測分析技術・機器開発事業・ナノレベルの物性・機能の複合計測

2004 - 2009/03
超高密度強誘電体記録の実用化研究 Competitive

長康雄

Offer Organization: (独)新エネルギー・産業技術総合開発機構(NEDO)

System: ナノテクノロジープログラム／ナノテク・先端部材実用化研究開発／平成１８－２０年度

2006 - 2008
ＳＮＤＭ強誘電体プローブメモリ Competitive

Offer Organization: 文部科学省

System: 科学技術振興調整費

Category: 産学官共同研究の効果的な推進

Institution: 東北大学電気通信研究所

2003 - 2006/03
非線形誘電率顕微鏡法を用いた超高密度超高速強誘電体記録 Competitive

Offer Organization: 文部科学省

System: 科学研究費補助金

Category: 基盤研究Ａ（２）

Institution: 東北大学電気通信研究所

2003 - 2006/03
1平方インチ当たり１０テラビットの記録密度を持つＳＮＤＭ強誘電体プローブメモリ Competitive

Offer Organization: 文部科学省

System: 科学研究費補助金

Category: 基盤研究Ａ

Institution: 東北大学電気通信研究所

2006 -

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特別推進研究採択のため中止
超高分解能走査型非線形誘電率顕微鏡法を用いた強誘電体中のドメイン構造の解析 Competitive

Offer Organization: 文部科学省

System: 科学研究費補助金

Category: 特定領域研究(2)

Institution: 東北大学電気通信研究所

2000 - 2004/03
強誘電体薄膜の物性制御と次世代メモリデバイスへの応用

奥山雅則, 石橋善弘, 藤村紀文, 長康雄, 安田直彦, 清水勝

Offer Organization: 日本学術振興会

System: 科学研究費助成事業

Category: 特定領域研究

Institution: 大阪大学

2004 - 2004

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今日、高度化されまた今後も拡大化の続く情報化社会を支えるのがまさにコンピュータと通信機器であるが、特に記憶を司るメモリデバイスが非常に重要である。この半導体メモリの中で電源を切っても忘れない不揮発性メモリとして強誘電体メモリ(FeRAM)があり、その研究開発が進められている。しかし、強誘電体薄膜を信頼性の高いメモリデバイスに応用するには、多くの問題点が存在する。高集積化に伴う超微細化によって数十nmの厚さの強誘電体薄膜における分極反転の反復による強誘電性の劣化、分極履歴のシフト、分極の時間的劣化、絶縁性の劣化などである。これらの問題点は、微細な強誘電体薄膜の特性評価をし、薄膜作製法の改良と最適化で克服されようと多くの努力が払われているが、表面的改良ではなく、強誘電体ならびにその薄膜に起こる現象を根本的に理解し、種々の物性や素子特性を根本的に解明、制御する必要がある。本領域研究では薄膜での強誘電性の基本的要因を明確にし、これらを薄膜特有の現象や物性と絡み合わせながら、実験的に起こる様々な問題点を解決し、次世代強誘電体メモリデバイスの実用化をはかるべく、基礎的な性質を検討してきた。そこで、これらの成果を取りまとめ、平成12年度から15年度までの本領域の研究成果を広く公開するために、以下のような公開シンポジウムを開催した。さらに、成果を取りまとめ、英文単行本にまとめSpringerより出版した。公開シンポジウム「強誘電体薄膜の物性制御と次世代メモリデバイスへの応用」成果報告会(公開) 日時平成16年12月10、11日場所大阪大学中之島センター出席者専門家など30名講演件数 14および研究評価英文単行本題目「Ferroelectric Thin Films-Basic Properties and Device Physics for Memory Applications-」総ページ数 258
非線形誘電率顕微鏡法を用いた電気双極子モーメントメモリー Competitive

Offer Organization: 日本学術振興会

System: 科学研究費

Category: 基盤研究(B)(2)(展開)

Institution: 東北大学電気通信研究所

2001 - 2003/03
非線形誘電率顕微鏡法を用いた超高密度強誘電体記録用材料の研究 Competitive

CHO Yasuo

Offer Organization: 日本板硝子材料工学助成会

System: 平成１５年度日本板硝子材料工学助成

2003 - 2003
非線形誘電率顕微鏡の高性能化に関する研究 Competitive

Offer Organization: 日本学術振興会

System: 平成１３年度未来開拓学術研究推進事業

Category: フィージビリティスタディ

Institution: 東北大学電気通信研究所

2001 - 2002/03
走査型非線形誘電率顕微鏡法を用いた単一永久双極子モーメントの可視化 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 基盤研究(B)(2)(一般)

Institution: 東北大学電気通信研究所

2000 - 2002/03
KNbO_3単結晶を用いたIOGH_2広帯域SAWデバイスと製造プロセスの最適化

小田川裕之, 山之内和彦, 長康雄

Offer Organization: 日本学術振興会

System: 科学研究費助成事業

Category: 基盤研究(B)

Institution: 東北大学

2000 - 2002

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本研究は,最近研究者らにより,弾性表面波(SAW)の電気機械結合係数が従来の単結晶に比ベて約10倍大きいことが明らかになったKNbO_3圧電単結晶基板を用いて,次世代情報通信用10GHz帯SAWデバイスを実現することを目指して行われる研究である。そのためには,ラインアンドスペース0.1μmの周期電極を作製する必要があり,KNbO_3に最適なプロセス技術の検討を行った。 KNbO_3は225℃に相転移点が存在するため,作製プロセス中の基板温度を低温に抑える必要がある。そこで,電子線を用いた直接露光において,プロセス温度を低下させる研究を行い,150℃でラインアンドスペース0.1μmのアルミニウムの周期電極をKNbO_3単結晶上に作製することが可能となったが,SAWの送受特性は予想したものではなかった。その原因は,基板の極表面付近の強誘電分極の状態が不均一になっているためであることがことがわかった。KNbO_3は180°分域の他に90゜分域や60゜分域も有するため,走査型非線形誘電率顕微鏡でそれらが計測できるようなシステムの開発が本研究を進めるために必要であるという結論を得た。従来の走査型非線形誘電率顕微鏡は,基板表面に垂直な分極成分を主として計測しているため,面内方向に分極が向いている場合の計測が困難であるため,面内方向の分極成分を計測できる新しいプローブの開発と,走査型非線形誘電率顕微鏡システムの研究が不可欠であると考え,その研究を行った。これにより,面内方向の分極も計測できる走査型非線形誘電率顕微鏡の原型を得ることに成功した。この成果については,近日中に論文として投稿する予定である。来年度は,本システムを用いて分極の面内方向成分も含めて計測し,基板表面の分極状態が温度と共にどのように変化するかに調べることで,プロセス条件の最適化の研究を引き続き推進する予定である。
Development of a Method to Evaluate the Surface of Single Crystal Substrates for Super-High-Frequency SAW Devices by UMS Technology

KUSHIBIKI Jun-ichi, MATSUMOTO Yasushi, IZUMI Takanaga, ARAKAWA Mototaka, ODAGAWA Hiroyuki, CHO Yasuo

Offer Organization: Japan Society for the Promotion of Science

System: Grants-in-Aid for Scientific Research

Category: Grant-in-Aid for Scientific Research (B)

Institution: Tohoku University

2000 - 2002

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In this study, ultrasonic microspectroscopy (UMS) technology, using the line-focus-beam (LFB) and plane-wave ultrasonic material characterization system, has been applied to the problems associated with the homogeneities and modified/damaged surface layers of LiNbO_3 and LiTaO_3 single crystals for super-high-frequency (SHF) surface acoustic wave (SAW) devices. The purpose of this study was to establish the quantitative analysis and evaluation method using this technology. 1. The relative and absolute accuracies for the propagation characteristics of leaky SAW (LSAW) measured by the LFB-UMC system have been improved. 2. Chemical composition dependences of the acoustical physical constants of LiNbO_3 and LiTaO_3 single crystals were determined. This enables us to calculate the propagation characteristics of LSAW and SAW for the crystals with an arbitrary chemical composition. 3. Experimental relationships (calibration lines) among the LSAW velocity, Curie temperature, lattice constants, etc., were obtained to evaluate each property of the crystals by a common scale of LSAW velocity. 4. A method for improving the crystal growth conditions through the evaluation of the chemical composition distributions of commercially available LiTaO_3 single crystals was proposed and an extremely homogeneous crystal was successfully grown. 5. For the demonstration of evaluating modified/damaged surface layers, we fabricated several LiTaO_3 substrates with protonexchanged layers and domain-inverted layers as model specimens. The thickness resolution of the surface layers estimated by LSAW velocity was nanometer order. 6. The resolution of scanning nonlinear dielectric microscopy was improved with an atomic size. 7. Center frequencies and SAW velocities were measured for 0.5, 1, and 2 GHz-band SAW filters fabricated on LiTaO_3 wafers whose distributions in chemical composition were preexamined by measuring LSAW velocities. The results exhibited that variations of the center frequencies and differences between the calculated and measured SAW velocities became larger as the frequency became higher. It was considered that problems associated with the damaged surface layers of the substrates were detected.
走査型電子線誘電率顕微鏡 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 基盤研究(C) (2)(一般)

Institution: 東北大学電気通信研究所

1998 - 2000/03
高分解能走査型非線形誘電率顕微鏡の開発とその強誘電体記録への展開 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 基盤研究(B)(2)(展開)

Institution: 山口大学

1997 - 2000/03
強誘電体単結晶を用いた双極子記録メディアの基礎的検討

小田川裕之, 長康雄

Offer Organization: 日本学術振興会

System: 科学研究費助成事業

Category: 萌芽的研究

Institution: 東北大学

2000 - 2000

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本研究では,磁気記録の記録密度を遙かに上回ると予想される,強誘電体のミクロな分極(双極子)を用いた高密度記録実現のひとつのステップとして,薄膜ではなく,強誘電体単結晶の表面を用いた新しい方法を提案し,微小領域への書き込み特性,及び将来の可能性を調べることを目的として行った。一般には,強誘電体記録には微小領域への書き込みを可能にするため薄膜を用いる方法が考えられているが,本研究は,容易に安定した表面が得られる単結晶基板を用いることを試みた。探針に電圧を印加する方法では,単結晶を非常に薄くすることで,実験的にサブミクロンの微小な書き込み領域を得ることが可能になった。しかし表面を改質する方法については,十分な成果は得ることができなかった。だが,単結晶表面に,バルクと異なった性質を有する薄い表面層が存在することを示唆する実験結果が得られており,今後より詳細な研究が必要であることがわかり,新たな研究課題を見いだすことができた。更に,今後表面層のミクロな分極状態を調べる研究を発展させるためには,分極の計測に今回の研究と同様,走査型非線形誘電率顕微鏡を用いることが不可欠であるが,今までの走査型非線形誘電率顕微鏡では困難であった試料表面の面内方向の分極成分を高い空間分解能で計測する必要があると考えられ,それを可能にするプローブにつても検討を行った。その結果,面内方向の分極成分を計測できるプローブの原型を得ることに成功した。これらの研究成果については,近日中に論文として投稿する予定である。
非線形誘電率顕微鏡法を用いた単一永久双極子モーメントの可視化 Competitive

CHO Yasuo

Offer Organization: 日本原子力研究所

System: 平成１２年度黎明研究

2000 - 2000
Fabrication of KNbO_3 Thin Film and Application to SAW Device for Future Mobile Tohoku University Communication

ODAGAWA Hiroyuki, YAMANOUCHI Kazuhiko, CHO Yasuo

Offer Organization: Japan Society for the Promotion of Science

System: Grants-in-Aid for Scientific Research

Category: Grant-in-Aid for Scientific Research (B).

Institution: Tohoku University

1999 - 2000

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In this research, properties of KNbO_3 films, which was deposited on SrTiO_3 (STO) substrate using a 2 cathode sputtering method and a metal organic chemical vapor deposition (MOCVD) method, were investigated for surface acoustic wave (SAW) applications. 1. We investigated the theoretical properties of SAW in KNbO_3 thin film on STO and Si substrates. As the results, we found that (001)<100>KNbO_3// (110)<1-10>STO was the best combination between the substrate and the orientation of the KNbO_3 thin film in the view of both SAW properties and a lattice matching. In this case, electromechanical coupling coefficient (k^2) is 10.4% for the film thickness of 1 wavelength. 2. We investigated a best combination of the targets composition of the sputtering. Experimentally, we found that K_2CO_3 : Nb_2O_5=1 : 0 and K_2CO_3 : Nb_2O_5=3 : 1 was the best one, and we could successfully obtained (001) oriented KNbO_3 thin film on STO substrates. 3. We observed the polarization distribution of the KNbO_3 thin films using scanning nonlinear dielectric microscope (SNDM), which was developed by one of the investigators of our research project. The results showed that the as-grown KNbO_3 film had an uniform polarization and its direction was along the surface normal if the film was fabricated by appropriate conditions. Also, as the result of the comparison between the polarization measurements and experimentally measured SAW properties, we could observe a large correlation between them. It means that we can estimate the SAW properties of thin films by SNDM without fabricate an actual SAW device
強誘電体超高密度記録 Competitive

2000/01 -
強誘電体中の単一双極子モーメントの可視化と単一双極子メモリーに関する研究 Competitive

CHO Yasuo

Offer Organization: 小笠原科学技術振興財団

System: 研究助成

1999 - 1999
サブナノメータ分解能を持つ走査型非線形誘電率顕微鏡の開発と単一双極子の可視化 Competitive

CHO Yasuo

Offer Organization: カシオ科学振興財団

System: 第１７回研究助成

1999 - 1999
走査型非線形誘電率顕微鏡を用いた単一永久双極子モーメントの可視化 Competitive

CHO Yasuo

Offer Organization: 住友財団

System: 基礎科学研究助成

1999 - 1999
超高分解能走査型非線形誘電率顕微鏡の開発とその強誘電体記録への応用」 Competitive

CHO Yasuo

Offer Organization: 石田（實）記念財団

System: 研究助成

1999 - 1999
Super High Coupling Surface Acoustic Wave Devices and Applications for Future Mobile Communication Systems

YAMANOUCHI Kazuhiko, HIROYUKI Odagawa, TSUYOSHI Takano

Offer Organization: Japan Society for the Promotion of Science

System: Grants-in-Aid for Scientific Research

Category: Grant-in-Aid for Scientific Research (B)

1998 - 1999

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Surface Acoustic Waves (SAW) are applied for the key devices of the future mobile communication as the high performance, light weight and small size, and mass production devices. The properties of SAW devices mainly depend on the choice of piezoelectric substrate materials. The important properties required for SAW substrates are large electromechanical coupling coefficient (k^2) and small temperature coefficient of frequency (TCF). Especially, super high coupling substrates are very important for fabricating the wideband SAW filters with small insertion loss. KNbO_3 single crystal has extremely large electromechanical coupling coefficient (K_2=53%) and zero TCF around a room temperature [1]. Also, single crystal growth technologies with a large size are very important for device applications. In this research, we obtained the following results : (1) The KNbO_3 single crystal growth with a large size are investigated. The Top Seeded Solution Growth Techniques (TSSG) and the large size ofcrucible of 60mm φ Platinum are applied in order to obtain a large size of KNbO_3 single crystal. The results show the 50x50x15mm^3 single crystals are obtained. Also, the poling techniques of KNbO_3 crystal are investigated by using the nonlinear scanning dielectric microscope and the poling direction is determined. (2) The results of the experimental SAW properties of the above KNbO_3 single crystal substrates agree with the theoretical ones. Also the KNbO_3 substrates showed experimentally the zero temperature coefficients of frequency (TCF) around 20℃. We are now trying to apply for zero TCF and wide band SAW filters. (3) We determined the nonlinear piezoelectric constants of KNbO_3. Also, the high efficient (+25dB higher than that of LiNbO_3) SAW elastic convolvers using KNbO_3 crystals than LiNbO_3 crystals are obtained. (4) The theoretical SAW propagation characteristics with the k^2 of about100% are analyzed and the physical phenomena of those are discussed. The above investigating results are very useful for the information technology of the next generation, especially for the mobile communication technology.
走査型非線形誘電率顕微鏡の高分解能化の達成とその強誘電体記録への応用 Competitive

CHO Yasuo

Offer Organization: 稲盛財団助成金

1997 - 1997
非線形誘電率顕微鏡の高分解能化の達成とその誘電体記録への応用 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 基盤研究(C) (2)(一般)

Institution: 山口大学

1996 - 1996/03
走査型非線形誘電率顕微鏡の高分解能化の達成とその強誘電体記録への応用 Competitive

CHO Yasuo

Offer Organization: 村田学術振興財団

System: （第１２回）研究助成

1996 - 1996
機能性材料の非線形特性の動的計測法の確立と非線形性出現機構の解明 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 一般研究（C)

Institution: 山口大学

1994 - 1995/03
機能性セラミックスの誘電・圧電・電歪及び弾性的非線形特性の断熱的計測法による評価と非線形性出現機構の解明 Competitive

CHO Yasuo

Offer Organization: 財団法人中国電力技術研究財団

System: 試験研究助成

1995 - 1995
金属グレーティング導波路上を伝搬するＳＡＷソリトンの実験的検証 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 奨励研究（Ａ）

Institution: 山口大学

1993 - 1994/03
機能性材料の非線形性出現機構の解明とその電気通信デバイXの高性能化への応用

Offer Organization: 電気通信普及財団

System: 海外渡航旅費援助

Category: 長期海外研究

Institution: 山口大学

1994 - 1994
非線形誘電率顕微鏡の開発 Competitive

CHO Yasuo

Offer Organization: 川崎製鉄

System: 川鉄２１世紀財団技術研究助成金

1994 - 1994
Competitive

CHO Yasuo

Offer Organization: 電気通信普及財団

System: 海外渡航旅費援助

1994 -
Competitive

CHO Yasuo

Offer Organization: Ｃ＆Ｃ振興財団

System: 国際会議論文発表者助成

1994 -
機能性セラミックスの誘電・圧電・電歪及び弾性的非線形特性の断熱的計測法による評価と非線形性出現機構の解明 Competitive

CHO Yasuo

Offer Organization: 財団法人中国電力技術研究財団

System: 試験研究助成

1994 -
音響常磁性共鳴と光ポンピング法を用いたサーフェスフォノンメーザに関する研究 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 奨励研究（Ａ）

Institution: 山口大学

1992 - 1993/03
Competitive

CHO Yasuo

Offer Organization: 東電記念科学技術研究所

System: 国際技術交流援助

1993 -
音響常磁性共鳴と光ポンピング法を用いたサーフェスフォノンメーザに関する研究 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 奨励研究（Ａ）

Institution: 山口大学

1991 - 1992/03
Competitive

CHO Yasuo

Offer Organization: 中国電力技術研究財団

System: 国際交流活動助成

1992 -
音響常磁性共鳴と光ポンピング法を用いたサーフェXフォノンメーザに関する研究 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 奨励研究（Ａ）

Institution: 山口大学

1990 - 1991/03
圧電セラミックスの断熱的非線形定数の測定法の確立 Competitive

CHO Yasuo

Offer Organization: 村田学術振興財団

System: 村田学術振興財団（第７回）研究助成

1991 -
フォノンメーザ用材料に関する基礎的研究 Competitive

CHO Yasuo

Offer Organization: 徳山科学技術振興財団

System: 徳山科学技術振興財団（第３回）研究助成

1991 -
音響常磁性共鳴によるサーフェスフォノンの吸収及び発生増幅 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 奨励研究（Ａ）

Institution: 東北大学電気通信研究所

1989 - 1990/03
フォノンメーザ用材料に関する研究 Competitive

CHO Yasuo

System: マツダ研究助成（第６回）

1990 -
「音響常磁性共鳴と光ポンピング法を用いたフォノンメーザに関する研究」放送文化基金奨励研究 Competitive

CHO Yasuo

System: 放送文化基金奨励研究

1990 -
音響常磁性共鳴によるサーフェスフォノンの吸収及び発生増幅 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 奨励研究（Ａ）

Institution: 東北大学電気通信研究所

1988 - 1989/03
音響常磁性共鳴によるサーフェスフォノンの吸収及び発生増幅 Competitive

Offer Organization: 文部省

System: 科学研究費

Category: 奨励研究（Ａ）

Institution: 東北大学電気通信研究所

1987 - 1988/03

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Teaching Experience 4

先端超高速情報工学講義　東北大学工学研究科
固体電気音響デバイス工学　東北大学工学研究科
電磁気学Ⅰ　東北大学工学部
先端超高周波情報工学　東北大学工学研究科

Social Activities 2

研究者を生きる

2019年度平生中学校キャリア教育講演会　山口県平生町

2019/05/17 - 2019/05/17
走査型非線形誘電率顕微鏡

第23回結晶工学セミナー　産総研臨海副都心センター別館,東京都

2018/12/21 - 2018/12/21

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SiCパワーデバイス高精度定量測定技術の開発

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拡散層の高精度な可視化の可能性あるSHO-SNDM法の検討
超高次非線形誘電率顕微鏡法を用いたSiC基板材料及びパワーエレクトロニクス素子の高性能化に資する評価技術の開発

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超高次非線形誘電率顕微鏡法(SHO-SNDM)を用いてSiCパワーMOSFETの評価を前提にSiCウエハや高性能なSiCパワーデバイスの開発に資することを目的として研究開発を行う
「Development of Ferroelectric Probe Data Storage」

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次世代強誘電体高密度記録
SNDM測定を用いた半導体ドーパントプロファイル計測に関する研究

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東北大長研究室保有の高感度SNDM装置を用いて、特に低濃度(15cm-3)領域の拡散層評価環境を構築する
超高密度強誘電体記録の実用化研究

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超高密度強誘電体記録の実用化研究について
複合型走査型非線形誘電率顕微鏡の開発

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複合型走査型非線形誘電率顕微鏡の開発について
非線形誘電率顕微鏡法を用いた超高密度強誘電体記録用材料の研究

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非線形誘電率顕微鏡法を用いた超高密度強誘電体記録用材料の研究について
ＳＮＤＭ強誘電体プローブメモリ

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ＳＮＤＭ強誘電体プローブメモリについて
非線形誘電率顕微鏡法を用いた電気双極子モーメントメモリー

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非線形誘電率顕微鏡法を用いた電気双極子モーメントメモリーについて
非線形誘電率顕微鏡の高性能化に関する研究

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非線形誘電率顕微鏡の高性能化に関する研究について
非線形誘電率顕微鏡法を用いた単一永久双極子モーメントの可視化

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非線形誘電率顕微鏡法を用いた単一永久双極子モーメントの可視化について
走査型非線形誘電率顕微鏡を用いた単一永久双極子モーメントの可視化

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走査型非線形誘電率顕微鏡を用いた単一永久双極子モーメントの可視化について
サブナノメータ分解能を持つ走査型非線形誘電率顕微鏡の開発と単一双極子の可視化

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サブナノメータ分解能を持つ走査型非線形誘電率顕微鏡の開発と単一双極子の可視化について
強誘電体中の単一双極子モーメントの可視化と単一双極子メモリーに関する研究

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強誘電体中の単一双極子モーメントの可視化と単一双極子メモリーに関する研究
超高分解能走査型非線形誘電率顕微鏡の開発とその強誘電体記録への応用

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超高分解能走査型非線形誘電率顕微鏡の開発とその強誘電体記録への応用について
走査型非線形誘電率顕微鏡の高分解能化の達成とその強誘電体記録への応用

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走査型非線形誘電率顕微鏡の高分解能化の達成とその強誘電体記録への応用について
走査型非線形誘電率顕微鏡の高分解能化の達成とその強誘電体記録への応用

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走査型非線形誘電率顕微鏡の高分解能化の達成とその強誘電体記録への応用について
機能性セラミックスの誘電・圧電・電歪及び弾性的非線形特性の断熱的計測法による評価と非線形性出現機構の解明

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機能性セラミックスの誘電・圧電・電歪及び弾性的非線形特性の断熱的計測法による評価と非線形性出現機構の解明について
機能性セラミックスの誘電・圧電・電歪及び弾性的非線形特性の断熱的計測法による評価と非線形性出現機構の解明

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機能性セラミックスの誘電・圧電・電歪及び弾性的非線形特性の断熱的計測法による評価と非線形性出現機構の解明について
機能性材料の非線形性出現機構の解明とその電気通信デバイXの高性能化への応用

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機能性材料の非線形性出現機構の解明とその電気通信デバイXの高性能化への応用について
非線形誘電率顕微鏡の開発

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非線形誘電率顕微鏡の開発について
フォノンメーザ用材料に関する基礎的研究

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フォノンメーザ用材料に関する基礎的研究について
圧電セラミックスの断熱的非線形定数の測定法の確立

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圧電セラミックスの断熱的非線形定数の測定法の確立について
音響常磁性共鳴と光ポンピング法を用いたフォノンメーザに関する研究

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音響常磁性共鳴と光ポンピング法を用いたフォノンメーザに関する研究について
フォノンメーザ用材料に関する研究

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フォノンメーザ用材料に関する研究について

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