Details of the Researcher

PHOTO

Hiroki Koike
Section
Center for Innovative Integrated Electronic Systems
Job title
Associate Professor
Degree
  • Doctor of Information Engineering (Kyushu Institute of Technology)

Research Areas 1

  • Manufacturing technology (mechanical, electrical/electronic, chemical engineering) / Electronic devices and equipment /

Papers 39

  1. 40 nm 1T-1MTJ 128 Mb STT-MRAM With Novel Averaged Reference Voltage Generator Based on Detailed Analysis of Scaled-Down Memory Cell Array Design

    Hiroki Koike, Takaho Tanigawa, Toshinari Watanabe, Takashi Nasuno, Yasuo Noguchi, Mitsuo Yasuhira, Toru Yoshiduka, Yitao Ma, Hiroaki Honjo, Koichi Nishioka, Sadahiko Miura, Hirofumi Inoue, Shoji Ikeda, Tetsuo Endoh

    IEEE TRANSACTIONS ON MAGNETICS 57 (3) 2021/03

    DOI: 10.1109/TMAG.2020.3038110  

    ISSN: 0018-9464

    eISSN: 1941-0069

  2. Review of STT-MRAM circuit design strategies, and a 40-nm 1T-1MTJ 128Mb STT-MRAM design practice

    Hiroki KOIKE, Takaho TANIGAWA, Toshinari WATANABE, Takashi NASUNO, Yasuo NOGUCHI, Mitsuo YASUHIRA, Toru YOSHIDUKA, Yitao MA, Hiroaki HONJO, Koichi NISHIOKA, Sadahiko MIURA, Hirofumi INOUE, Shoji IKEDA, Tetsuo ENDOH

    2020 IEEE 31st Magnetic Recording Conference (TMRC) 2020/08/17

    Publisher: IEEE

    DOI: 10.1109/tmrc49521.2020.9366711  

  3. First demonstration of field-free SOT-MRAM with 0.35 ns write speed and 70 thermal stability under 400℃ thermal tolerance by canted SOT structure and its advanced patterning/SOT channel technology Peer-reviewed

    H. Honjo, T. V. A. Nguyen, T. Watanabe, T. Nasuno, C. Zhang, T. Tanigawa, S. Miura, H. Inoue, M. Niwa, T. Yoshiduka, Y. Noguchi, M. Yasuhira, A. Tamakoshi, M. Natsui, Y. Ma, H. Koike, Y. Takahashi, K. Furuya, H. Shen, S. Fukami, H. Sato, S. Ikeda, T. Hanyu, H. Ohno, T. Endoh

    International Electron Device Meeting 2019-December 2019/12

    DOI: 10.1109/IEDM19573.2019.8993443  

    ISSN: 0163-1918

  4. 12.1 An FPGA-Accelerated Fully Nonvolatile Microcontroller Unit for Sensor-Node Applications in 40nm CMOS/MTJ-Hybrid Technology Achieving 47.14μW Operation at 200MHz

    Masanori Natsui, Daisuke Suzuki, Akira Tamakoshi, Toshinari Watanabe, Hiroaki Honjo, Hiroki Koike, Takashi Nasuno, Yitao Ma, Takaho Tanigawa, Yasuo Noguchi, Mitsuo Yasuhira, Hideo Sato, Shoji Ikeda, Hideo Ohno, Tetsuo Endoh, Takahiro Hanyu

    Digest of Technical Papers - IEEE International Solid-State Circuits Conference 2019-February 202-204 2019/03/06

    DOI: 10.1109/ISSCC.2019.8662431  

    ISSN: 0193-6530

  5. A 47.14-µW 200-MHz MOS/MTJ-Hybrid Nonvolatile Microcontroller Unit Embedding STT-MRAM and FPGA for IoT Applications. Peer-reviewed

    Masanori Natsui, Daisuke Suzuki, Akira Tamakoshi, Toshinari Watanabe, Hiroaki Honjo, Hiroki Koike, Takashi Nasuno, Yitao Ma, Takaho Tanigawa, Yasuo Noguchi, Mitsuo Yasuhira, Hideo Sato, Shoji Ikeda, Hideo Ohno, Tetsuo Endoh, Takahiro Hanyu

    J. Solid-State Circuits 54 (11) 2991-3004 2019

    DOI: 10.1109/JSSC.2019.2930910  

    ISSN: 0018-9200

    eISSN: 1558-173X

  6. A Fully Nonvolatile Microcontroller Unit with Embedded STT-MRAM and FPGA-Based Accelerator for Sensor-Node Applications in 40nm CMOS/MTJ-Hybrid Technology Peer-reviewed

    M. Natsui, D. Suzuki, A. Tamakoshi, T. Watanabe, H. Honjo, H. Koike, T. Nasuno, Y. Ma, T. Tanigawa, Y. Noguchi, M. Yasuhira, H. Sato, S. Ikeda, H. Ohno, T. Endoh, T. Hanyu

    IEEE Journal of Solid State Circuits 54 (11) 2991-3004 2019

    DOI: 10.1109/JSSC.2019.2930910  

    ISSN: 0018-9200

    eISSN: 1558-173X

  7. 14ns write speed 128Mb density Embedded STT-MRAM with endurance>10^10 and 10yrs retention @85°C using novel low damage MTJ integration process Peer-reviewed

    H. Sato, H. Honjo, T. Watanabe, M. Niwa, H. Koike, S. Miura, T. Saito, H. Inoue, T. Nasuno, T. Tanigawa, Y. Noguchi, T. Yoshiduka, M. Yasuhira, S. Ikeda, S.- Y. Kang, T. Kubo, K. Yamashita, Y. Yagi, R. Tamura, T. Endoh

    International Electron Devise Meeting 2018-December 27.2.1-27.2.4 2018/12

    DOI: 10.1109/IEDM.2018.8614606  

    ISSN: 0163-1918

  8. 1T-1MTJ Type Embedded STT-MRAM with Advanced Low-Damage and Short-Failure-Free RIE Technology down to 32 nmφ MTJ Patterning Peer-reviewed

    Hideo Sato, Toshinari Watanabe, Hiroki Koike, Takashi Saito, Sadahiko Miura, Hiroaki Honjo, Hirofumi Inoue, Shoji Ikeda, Yasuo Noguchi, Takaho Tanigawa, Mitsuo Yasuhira, Hideo Ohno, Song Yun Kang, Takuya Kubo, Koichi Takatsuki, Koji Yamashita, Yasushi Yagi, Ryo Tamura, Takuro Nishimura, Koh Murata, Tetsuo Endoh

    2018 IEEE International Memory Workshop (IMW) 1-4 2018/05

    Publisher: IEEE

    DOI: 10.1109/imw.2018.8388774  

  9. Impact of Tungsten Sputtering Condition on Magnetic and Transport Properties of Double-MgO Magnetic Tunneling Junction With CoFeB/W/CoFeB Free Layer Peer-reviewed

    H. Honjo, S. Ikeda, H. Sato, K. Nishioka, T. Watanabe, S. Miura, T. Nasuno, Y. Noguchi, M. Yasuhira, T. Tanigawa, H. Koike, H. Inoue, M. Muraguchi, M. Niwa, H. Ohno, T. Endoh

    IEEE TRANSACTIONS ON MAGNETICS 53 (11) 2017/11

    DOI: 10.1109/TMAG.2017.2701838  

    ISSN: 0018-9464

    eISSN: 1941-0069

  10. Origin of variation of shift field via annealing at 400 degrees C in a perpendicular-anisotropy magnetic tunnel junction with [Co/Pt]-multilayers based synthetic ferrimagnetic reference layer Peer-reviewed

    H. Honjo, S. Ikeda, H. Sato, T. Watanebe, S. Miura, T. Nasuno, Y. Noguchi, M. Yasuhira, T. Tanigawa, H. Koike, M. Muraguchi, M. Niwa, K. Ito, H. Ohno, T. Endoh

    AIP ADVANCES 7 (5) 2017/05

    DOI: 10.1063/1.4973946  

    ISSN: 2158-3226

  11. Beyond MRAM: Nonvolatile Logic-in-Memory VLSI Peer-reviewed

    Takahiro Hanyu, Tetsuo Endoh, Shoji Ikeda, Tadahiko Sugibayashi, Naoki Kasai, Daisuke Suzuki, Masanori Natsui, Hiroki Koike, Hideo Ohno

    Introduction to Magnetic Random-Access Memory 199-229 2016/11/26

    Publisher: wiley

    DOI: 10.1002/9781119079415.ch7  

  12. Standby-Power-Free Integrated Circuits Using MTJ-Based VLSI Computing Invited Peer-reviewed

    Takahiro Hanyu, Tetsuo Endoh, Daisuke Suzuki, Hiroki Koike, Yitao Ma, Naoya Onizawa, Masanori Natsui, Shoji Ikeda, Hideo Ohno

    PROCEEDINGS OF THE IEEE 104 (10) 1844-1863 2016/10

    DOI: 10.1109/JPROC.2016.2574939  

    ISSN: 0018-9219

    eISSN: 1558-2256

  13. Stochastic behavior-considered VLSI CAD environment for MTJ/MOS-hybrid microprocessor design Peer-reviewed

    M. Natsui, A. Tamakoshi, A. Mochizuki, H. Koike, H. Ohno, T. Endoh, T. Hanyu

    Proceedings - IEEE International Symposium on Circuits and Systems 2016- 1878-1881 2016/07/29

    Publisher: Institute of Electrical and Electronics Engineers Inc.

    DOI: 10.1109/ISCAS.2016.7538938  

    ISSN: 0271-4310

  14. Improvement of Thermal Tolerance of CoFeB-MgO Perpendicular-Anisotropy Magnetic Tunnel Junctions by Controlling Boron Composition Peer-reviewed

    H. Honjo, S. Ikeda, H. Sato, S. Sato, T. Watanabe, S. Miura, T. Nasuno, Y. Noguchi, M. Yasuhira, T. Tanigawa, H. Koike, M. Muraguchi, M. Niwa, K. Ito, H. Ohno, T. Endoh

    IEEE TRANSACTIONS ON MAGNETICS 52 (7) 2016/07

    DOI: 10.1109/TMAG.2016.2518203  

    ISSN: 0018-9464

    eISSN: 1941-0069

  15. An Overview of Nonvolatile Emerging Memories-Spintronics for Working Memories Invited Peer-reviewed

    Tetsuo Endoh, Hiroki Koike, Shoji Ikeda, Takahiro Hanyu, Hideo Ohno

    IEEE JOURNAL ON EMERGING AND SELECTED TOPICS IN CIRCUITS AND SYSTEMS 6 (2) 109-119 2016/06

    DOI: 10.1109/JETCAS.2016.2547704  

    ISSN: 2156-3357

  16. Optimum boron concentration difference between single and double CoFeB/MgO interface perpendicular MTJs with high thermal tolerance and its mechanism Peer-reviewed

    H. Honjo, H. Sato, S. Ikeda, S. Sato, T. Watanebe, S. Miura, T. Nasuno, Y. Noguchi, M.Yasuhira, T.Tanigawa, H.Koike, M.Muraguchi, M.Niwa, K.Ito, H.Ohno, T.Endoh

    13th Joint MMM-Intermag Conference FB-06 2016/01/14

  17. Demonstration of yield improvement for on-via MTJ using a 2-Mbit 1T-1MTJ STT-MRAM test chip Peer-reviewed

    Hiroki Koike, Sadahiko Miura, Hiroaki Honjo, Toshinari Watanabe, Hideo Sato, Soshi Sato, Takashi Nasuno, Yasuo Noguchi, Mitsuo Yasuhira, Takaho Tanigawa, Masakazu Muraguchi, Masaaki Niwa, Kenchi Ito, Shoji Ikeda, Hideo Ohno, Tetsuo Endoh

    2016 IEEE 8TH INTERNATIONAL MEMORY WORKSHOP (IMW) 2016

    DOI: 10.1109/imw.2016.7495264  

    ISSN: 2330-7978

  18. 10 nm perpendicular anisotropy CoFeB-MgO magnetic tunnel junction with over 400oC high thermal tolerance by boron diffusion control Peer-reviewed

    H. Honjo, H. Sato, S. Ikeda, S. Sato, T. Watanebe, S. Miura, T. Nasuno, Y. Noguchi, M. Yasuhira, T. Tanigawa, H. Koike, M. Muraguchi, M. Niwa, K. Ito, H. Ohno, T. Endoh

    2015 Symposia on VLSI technology 2015-August T160-T161 2015/06/18

    DOI: 10.1109/VLSIT.2015.7223661  

    ISSN: 0743-1562

  19. 1T1MTJ STT-MRAM Cell Array Design with an Adaptive Reference Voltage Generator for Improving Device Variation Tolerance Peer-reviewed

    H. Koike, S. Miura, H. Honjo, T. Watanabe, H. Sato, S. Sato, T. Nasuno, Y. Noguchi, M. Yasuhira, T. Tanigawa, M. Muraguchi, M. Niwa, K. Ito, S. Ikeda, H. Ohno, T. Endoh

    2015 IEEE International Memory Workshop 1-4 2015/05/17

    DOI: 10.1109/IMW.2015.7150264  

  20. Properties of perpendicular-anisotropy magnetic tunnel junctions fabricated over the bottom Peer-reviewed

    S. Miura, H. Honjo, K. Kinoshita, K. Tokutome, H. Koike, S. Ikeda, T. Endoh, H. Ohno

    Japanese Journal of Applied Physics 54 (4) 04DM06-1-04DM06-4 2015/03/11

    DOI: 10.7567/JJAP.54.04DM06  

    ISSN: 0021-4922

    eISSN: 1347-4065

  21. Power-gated 32 bit microprocessor with a power controller circuit activated by deep-sleep-mode instruction achieving ultra-low power operation Peer-reviewed

    Hiroki Koike, Takashi Ohsawa, Sadahiko Miura, Hiroaki Honjo, Shoji Ikeda, Takahiro Hanyu, Hideo Ohno, Tetsuo Endoh

    Japanese Journal of Appllied Physics 54 (4) 2015

    DOI: 10.7567/JJAP.54.04DE08  

    ISSN: 0021-4922

    eISSN: 1347-4065

  22. A Power-gated 32bit MPU with a Power Controller Circuit Activated by Deep-sleep-mode Instraction Achieving Ultra-low Power Operation Peer-reviewed

    H. Koike, T. Ohsawa, S. Miura, H. Honjo, K, Kinoshita, S. Ikeda, T. Hanyu, H. Ohno, T. Endoh

    International Conference on Solid State Dvices and Materails (SSDM) A-7-1 2014/09/09

  23. Properties of Perpendicular-Anisotrapy Magnetic Tunnel Junctions Fabricated over the Cu Via Peer-reviewed

    S. Miura, H. Honjo, K. Kinoshita, K. Tokutome, H, Koike, S. Ikeda, T. Endoh, H. Ohno

    International Conference on Solid State Dvices and Materails (SSDM) A-6-3 2014/09/09

  24. 1.5ns/2.1nsのランダム読出/書込サイクル時間を達成した不揮発性混載メモリ用1Mb STT-MRAM -6T2MTJセルにバックグラウンド書き込み(BGW)方式を適用 Invited Peer-reviewed

    大澤隆, 小池洋紀, 三浦貞彦, 木下啓藏, 本庄弘明, 池田正二, 羽生貴弘, 大野英男, 遠藤哲郎

    信学技報 114 (13) 33-38 2014/04/17

  25. MTJベース不揮発フリップフロップを用いた3μsec-Entry/Exit 遅延時間のマイクロプロセッサ Invited Peer-reviewed

    小池洋紀, 崎村昇, 根橋竜介, 辻幸秀, 森岡あゆ香, 三浦貞彦, 本庄弘明, 杉林直彦, 大澤隆, 池田正二, 羽生貴弘, 大野英男, 遠藤哲郎

    信学技報 114 (13) 85-90 2014/04/17

  26. Wide operational margin capability of 1 kbit spin-transfer-torque memory array chip with 1-PMOS and 1-bottom-pin-magnetic-tunnel-junction type cell Peer-reviewed

    Hiroki Koike, Takashi Ohsawa, Sadahiko Miura, Hiroaki Honjo, Shoji Ikeda, Takahiro Hanyu, Hideo Ohno, Tetsuo Endoh

    JAPANESE JOURNAL OF APPLIED PHYSICS 53 (4) 2014/04

    DOI: 10.7567/JJAP.53.04ED13  

    ISSN: 0021-4922

    eISSN: 1347-4065

  27. A 1Mb Nonvolatile Embedded Memory Using 4T2MTJ Cell with 32b Fine-Grained Power Gating Scheme Peer-reviewed

    T. Ohsawa, H. Koike, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Hanyu, H. Ohno

    IEEE Journal of Solid State Circuits 48 (6) 1511-1520 2014

    DOI: 10.1109/JSSC.2013.2253412  

    ISSN: 0018-9200

  28. MTJ Resistance Distribution of 1-kbit 1T-1MTJ STT-MRAM Cell Arrays Fabricated on a 300-mm Wafer Peer-reviewed

    Hiroki Koike, Takashi Ohsawa, Katsuya Miura, Hiroaki Honjo, Shoji Ikeda, Takahiro Hanyu, Hideo Ohno, Tetsuo Endoh

    The 58th Annual Magnetism and Magnetic Materials Conference (MMM2013) DC-01 324-324 2013/11/04

  29. Wide Operational Margin Capability of 1kbit STT-MRAM Array Chip with 1-PMOS and 1-Bottom-Pin-MTJ Type Cell Peer-reviewed

    Hiroki Koike, Takashi Ohsawa, Sadahiro Miura, Hiroaki Honjo, Shoji Ikeda, Takahiro Hanyu, Hideo Ohno, Tetuso Endoh

    2013 International Conference on Solid State Devices and Materials (SSDM) M-7-3 1094-1095 2013/09/24

  30. IEEE Journal of Solid-State Circuits Peer-reviewed

    T. Ohsawa, H. Koike, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Hanyu, H. Ohno, T. Endoh

    A 1 Mb nonvolatile embedded memory using 4T2MTJ cell with 32 b fine-grained power gating scheme 48 (6) 1511-1520 2013/06/22

  31. A 1Mb STT-MRAM with Zero Array Standby Power and 1.5ns Quick Wake-up by 8b Fine-Grained Power Gating Peer-reviewed

    Takashi Ohsawa, Hiroki Koike, Takahiro Hanyu, Hideo Ohno, Tetuso Endoh

    5th IEEE International Memory Workshop (IMW) 80-83 2013/05/26

    DOI: 10.1109/IMW.2013.6582103  

  32. A fine-grained power gating architecture for MTJ-based embedded memories Peer-reviewed

    Takashi Ohsawa, Hiroki Koike, Sadahiko Miura, Hiroaki Honjo, Keiichi Tokutome, Shoji Ikeda, Takahiro Hanyu, Hideo Ohno, Tetsuo Endoh

    The 3nd CSIS International Symposium on Spintronics-based VLSIs 2013/01/31

  33. A power-gated MPU with 3-microsecond entry/exit delay using MTJ-based nonvolatile flip-flop

    H. Koike, T. Ohsawa, S. Ikeda, T. Hanyu, H. Ohno, T. Endoh, N. Sakimura, R. Nebashi, Y. Tsuji, A. Morioka, S. Miura, H. Honjo, T. Sugibayashi

    Proceedings of the 2013 IEEE Asian Solid-State Circuits Conference, A-SSCC 2013 317-320 2013

    DOI: 10.1109/ASSCC.2013.6691046  

  34. Restructuring of Memory Hierarchy in Computing System with Spintronics-Based Technologies Invited Peer-reviewed

    Tetsuo Endoh, Takashi Ohsawa, Hiroki Koike, Takahiro Hanyu, Hideo Ohno

    2012 Symposia on VLSI Technology and Circuits T1003 89-90 2012/06/11

    DOI: 10.1109/VLSIT.2012.6242475  

  35. 1Mb 4T-2MTJ Nonvolatile STT-RAM for Embedded Memories Using 32b Fine-Grained Power Gating Technique with 1.0ns/200ps Wake-up/Power-off Times Peer-reviewed

    T. Ohsawa, H. Koike, S. Miura, H. Honjo, K. Tokutome, S. Ikeda, T. Hanyu, H. Ohno, T. Endoh

    2012 Symposium on VLSI Circuits, Digest of Technical Papers J-C6.3 46-47 2012/06

    DOI: 10.1109/VLSIC.2012.6243782  

  36. High-Speed Simulator including Accurate MTJ Models for Spintronics Integrated Circuit Design Peer-reviewed

    Noboru Sakimura, Ryusuke Nebashi, Yukihide Tsuji, Hiroaki Honjo, Tadahiko Sugibayashi, Hiroki Koike, Takashi Ohsawa, Shunsuke Fukami, Takahiro Hanyu, Hideo Ohno, Tetsuo Endoh

    2012 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS 2012) 1971-1974 2012

    DOI: 10.1109/ISCAS.2012.6271663  

    ISSN: 0271-4302

  37. A new sensing scheme with high signal margin suitable for Spin-Transfer Torque RAM Peer-reviewed

    Hiroki Koike, Tetsuo Endoh

    International Symposium on VLSI Technology, Systems, and Applications, Proceedings 56-57 2011

    DOI: 10.1109/VTSA.2011.5872230  

  38. A 600MHz MTJ-based nonvolatile latch making use of incubation time in MTJ switching

    T. Endoh, S. Togashi, F. Iga, Y. Yoshida, T. Ohsawa, H. Koike, S. Fukami, S. Ikeda, N. Kasai, N. Sakimura, T. Hanyu, H. Ohno

    Technical Digest - International Electron Devices Meeting, IEDM 2011

    DOI: 10.1109/IEDM.2011.6131487  

    ISSN: 0163-1918

  39. Characteristics of 0.25.MU.m Ferroelectric Nonvolatile Memory with a Pb(Zr, Ti)O3 Capacitor on a Metal/via-Stacked Plug.

    Amanuma Kazushi, Kobayashi Sota, Tatsumi Toru, Maejima Yukihiko, Hada Hiromitsu, Yamada Junichi, Miwa Tohru, Koike Hiroki, Toyoshima Hideo, Kunio Takemitsu

    Japanese Journal of Applied Physics 39 (4) 2098-2101 2000

    Publisher: The Japan Society of Applied Physics

    DOI: 10.1143/JJAP.39.2098  

    ISSN: 0021-4922

    More details Close

    A 0.25-μm ferroelectric memory with 16 kbit-cell array was fabricated. A Pb(Zr, Ti)O<FONT SIZE="-1">3</FONT> (PZT) capacitor was formed on a metal(Al)/via(W)-stacked plug using low temperature metal organic chemical vapor deposition (MO-CVD). The backend process had no effect on the PZT capacitor properties. The 1 × 1 μm<FONT SIZE="-1">2</FONT> capacitor shows good fatigue and imprint endurance. Signal voltage on the bit-line in the cell array is 1.06 V for switching and 0.58 V for unswitching. These results agree well with the pulse-response measurement of the parallel capacitor. However, the signal voltage deviation becomes larger with the capacitor size reduction. The 16 kbit-cell array shows the column access time of 50 ns and the minimum operation voltage of 1.6 V.

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Misc. 6

  1. A demonstration of high-performance STT-MRAM by development of unit process and integration process

    H. Sato, H. Honjo, T. Watanabe, M. Niwa, H. Koike, S. Miura, T. Saito, H. Inoue, T. Nasuno, T. Tanigawa, Y. Noguchi, T. Yoshiduka, M. Yasuhira, S. Ikeda, S.- Y. Kang, T. Kubo, K. Yamashita, R. Tamura, T. Nishimura, K. Murata, T. Endoh

    ICD 2019/04/23

  2. 1T1MTJ STT-MRAM Cell Array Design with an Adaptive Reference Voltage Generator

    小池 洋紀, 三浦 貞彦, 本庄 弘明, 渡辺 俊成, 佐藤 英夫, 佐藤 創志, 那須野 孝, 野口 靖夫, 安平 光雄, 谷川 高穂, 村口 正和, 丹羽 正昭, 伊藤 顕知, 池田 正二, 大野 英男, 遠藤 哲郎

    電子情報通信学会技術研究報告 = IEICE technical report : 信学技報 116 (3) 51-56 2016/04/14

    Publisher: 電子情報通信学会

    ISSN: 0913-5685

  3. CT-1-3 Recent Trends for Magnetic Random Access Memory Technologies

    Koike Hiroki, Ohsawa Takashi, Ikeda Shoji, Hanyu Takahiro, Ohno Hideo, Endoh Tetsuo

    Proceedings of the Society Conference of IEICE 2014 (2) "SS-6"-"SS-9" 2014/09/09

    Publisher: The Institute of Electronics, Information and Communication Engineers

  4. Novel Memory Trend with Three-Dimensional Structured Cell and Spintronics Technology

    77 35-40 2013/07/11

    Publisher: 電気化学会電子材料委員会

  5. 1Mb 4T-2MTJ Nonvolatile STT-RAM for Embedded Memories Using 32b Fine-Gained Power Gating Technique : Achieves 1.0ns/200ps Wake-Up/Power-Off Times

    ENDOH Tetsuo, OHSAWA Takashi, KOIKE Hiroki, MIURA Sadahiko, HONJO Hiroaki, TOKUTOME Keiichi, IKEDA Shoji, HANYU Takahiro, OHNO Hideo

    Technical report of IEICE. ICD 113 (1) 27-32 2013/04/11

    Publisher: The Institute of Electronics, Information and Communication Engineers

    ISSN: 0913-5685

    More details Close

    A 1Mb embedded memory was designed and fabricated using a cell consisting of four NFETs and two spin-transfer torque magnetic tunnel junctions (STT-MTJs) which is a nonvolatile memory device with excellent write endurance. A 32b fine-grained power gating technique is applied to achieve a fast access/cycle times along with a low standby and operation powers. Since the 4T2MTJ cell size is defined by its four NFETs with the two MTJs put on them, the cell has a potential to become smaller than the SRAM cell. It was shown that the 4T2MTJ STT-RAM macro can be smaller than the SRAM counterpart by scaling the technology to 25nm-45nm and beyond, depending on its scaling scenarios, due to the MTJ switching current reduction by the scaling.

  6. Recent Trends for Spin-transfer Torque Magnetic Memories, which Break through the Limitation of Silicon Nonvolatile Technology

    ENDOH Tetsuo, OHSAWA Takashi, KOIKE Hiroki, HANYU Takahiro, KASAI Naoki, OHNO Hideo

    The Journal of the Institute of Electronics, Information, and Communication Engineers 95 (11) 986-991 2012/11/01

    Publisher: The Institute of Electronics, Information and Communication Engineers

    ISSN: 0913-5693

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