Details of the Researcher

PHOTO

Masami Terauchi
Section
Institute of Multidisciplinary Research for Advanced Materials
Job title
Professor
Degree

  • 理学博士（東北大学）

Profile
電子顕微鏡を用いた分析技術（軟X線発光分光、電子エネルギー損失分光、収束電子回折）の開発と、その物性物理への応用により、新たな顕微分析技術の確立をメインテーマとして活動しています。最近、電子顕微鏡用軟X線発光分光装置を汎用化（商品化）したことから、研究だけでなく、その普及活動にも力を入れています。

Professional Memberships 3

  • THE JAPANESE SOCIETY OF MICROSCOPY

  • 日本物理学会

  • 日本結晶学会

Research Interests 4

  • Soft X-ray emission spectroscopy

  • Electron energy-loss spectroscopy

  • Eectron diffraction

  • Electron microscope

Research Areas 4

  • Nanotechnology/Materials / Crystal engineering / Applied Physics of Property and Crystallography

  • Nanotechnology/Materials / Applied materials / Applied Physics of Property and Crystallography

  • Natural sciences / Magnetism, superconductivity, and strongly correlated systems / Solid-State Physics II

  • Natural sciences / Semiconductors, optical and atomic physics / Solid-State Physics I

Awards 11

  1. 先端分析技術賞 JAIMA機器開発賞

    2024/09　日本分析化学会　軟X線ホログラフィック不等間隔溝回折格子の開発と高分解能発光分光システムへの応用

  2. 学術賞

    2024/02　日本ホウ素・ホウ化物研究会　分析電子顕微鏡を用いたホウ素・ホウ化物の電子状態解析

  3. 文部科学大臣表彰 科学技術賞（開発部門）

    2016/04

  4. 山﨑貞一賞（計測評価分野）

    2015/11

  5. Birks Award

    2015/08　Microbeamanalysis Society of America　Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM

  6. 論文賞（顕微法基礎部門）

    2015/05　A new grating X-ray spectrometer for 2-4 keV enabling a separate observation of In-Lb and Sn-La emissions of indium-tin-oxide

  7. 論文賞（顕微法基礎部門）

    2009/05　High energy-resolution electron energy-loss spectroscopy study of the electric structures of double-walled carbon nanotubes

  8. Macres Award

    2005/05　Microbeamanalysis Society of America　A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons

  9. 日本電子顕微鏡学会賞（瀬藤賞）

    2000/05　日本顕微鏡学会

  10. 日本結晶学会賞

    1995/10　日本結晶学会

  11. 第31回金属研究奨励賞

    1991/06　（財）金属研究助成会

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Papers 319

  1. High energy-resolution soft X-ray emission spectrometer using a back-thinned CMOS detector for chemical bonding state analysis

    Shogo Koshiya, Takanori Murano, Masami Terauchi

    Microscopy　2025/04/16

    DOI： 10.1093/jmicro/dfaf021 　

  2. Derivation method of the dielectric function of amorphous materials using angle-resolved electron energy loss spectroscopy for exciton size evaluation Peer-reviewed

    Tomoya Saito, Yohei K Sato, Masami Terauchi

    Microscopy　74　(2)　117-123　2025/03/31

    DOI： 10.1093/jmicro/dfae056 　

  3. Single Crystal Growth of Type-II Si Clathrate Containing Fully Occupied Na and Ba from a Na-Based Metal Complex Solution Peer-reviewed

    Haruhiko Morito, Yutaka IIjima, Masaya Fujioka, Rodion V. Belosludov, Masami Terauchi, Hisanori Yamane, Kozo Fujiwara

    Crystal Growth & Design　2120-2127　2025/03/11

    Publisher: American Chemical Society (ACS)

    DOI： 10.1021/acs.cgd.5c00013 　

    ISSN： 1528-7483

    eISSN： 1528-7505

  4. Design of Laminor-type Spherical Gratings Having High Groove Density, Varied Line Spacing Grooves, and Coated with Graded Refractive Index (GRI) Multilayer to Achieve High Resolution and High Diffraction Efficiency for Use with Soft X-ray Flat Field Spectrographs in the 2－4 keV Range Peer-reviewed

    56　57-67　2025/03

  5. TEM-EELS study of compressed graphite phase in high-pressure and high-temperature treated neutron-irradiated graphite Peer-reviewed

    Y.Ohsawa, Y.K.Sato, T.Saito, M.Terauchi, T.Kitazume, T.Tokunaga, Y.Higo, K.Niwase, M.Niibe, S.Honda

    Carbon Trends　19　100487-1-100487-6　2025/02

    DOI： 10.1016/j.cartre.2025.100487 　

  6. Self-absorption effect in soft X-ray emission spectra utilized for bandgap evaluation of semiconductors Peer-reviewed

    M.Terauchi, Y.K.Sato

    Microscopy　2025/01/24

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/jmicro/dfae008 　

    ISSN： 2050-5698

    eISSN： 2050-5701

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    Abstract In-situ observation has expanded the application of transmission electron microscopy (TEM) and has made a significant contribution to materials research and development for energy, biomedical, quantum, etc. Recent technological developments related to in-situ TEM have empowered the incorporation of three-dimensional observation, which was previously considered incompatible. In this review article, we take up heating as the most commonly used external stimulus for in-situ TEM observation and overview recent in-situ TEM studies. Then, we focus on the electron tomography (ET) and in-situ heating combined observation by introducing the authors’ recent research as an example. Assuming that in-situ heating observation is expanded from two dimensions to three dimensions using a conventional TEM apparatus and a commercially available in-situ heating specimen holder, the following in-situ heating-and-ET observation procedure is proposed: (i) use a rapid heating-and-cooling function of a micro-electro-mechanical system holder; (ii) heat and cool the specimen intermittently and (iii) acquire a tilt-series dataset when the specimen heating is stopped. This procedure is not too technically challenging and can have a wide range of applications. Essential technical points for a successful 4D (space and time) observation will be discussed through reviewing the authors’ example application.

  7. Design of soft x-ray high diffraction efficiency and spectral flux Au/Ni bilayer coated laminar-type diffraction grating for objective soft x-ray flat-field spectrograph in a region of 250–550 eV Peer-reviewed

    M. Koike, T. Hatano, A. S. Pirozhkov, T. Murano, Y. Oue, S. Koshiya, T. Kakio, K. Kondo, M. Terauchi

    Review of Scientific Instruments　95　123102-1-123102-7　2024/12/01

    DOI： 10.1063/5.0232922 　

  8. Anisotropic electronic structure study of MgB2C2 using soft X-ray emission spectroscopy microscopes Peer-reviewed

    Yuki Hada, Masami Terauchi, Tomoya Saito, Yohei K Sato, Masaaki Baba, Masatoshi Takeda

    Microscopy　74　(2)　86-91　2024/10/16

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/jmicro/dfae048 　

    ISSN： 2050-5698

    eISSN： 2050-5701

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    Abstract The anisotropic electronic structure of MgB2C2 was studied using soft X-ray emission spectroscopy electron microscopes. MgB2C2 fragments were selected by examining C K-emission profiles. C and B K-emission and Mg L-emission spectra were obtained, revealing common and distinct structures that reflect the mixing of valence orbitals. Since the material is reported to have two-dimensional B–C honeycomb layers, the orientational dependence of these emission spectra was also examined. Experimental data were compared with the theoretically calculated partial density of states of the valence bands (VBs) of the material. The C K-emission profile showed an apparent orientational dependence, while the B K-emission exhibited minimal dependence. This difference originated from the different energy distributions of C-2pz and B-2pz components in the VBs. The Mg L-emission intensity was very small, likely due to charge transfer from Mg atoms to B–N layers. The Mg L-emission profile showed a peak related to structures in C-K and B-K. An unexpected intensity was observed just above the VBs, which also showed orientational dependence, possibly due to a small deviation from the ideal composition of Mg:B:C = 1:2:2.

  9. Simple derivation of L-absorption spectra of 3d transition metal elements by the self-absorption effect observed in soft X-ray emission spectra Peer-reviewed

    Masami Terauchi, Yohei K Sato, Takaomi D Yokoyama, Takanori Murano

    Microscopy　73　(5)　451-455　2024/10/04

    DOI： 10.1093/jmicro/dfae012 　

  10. Observation of Thermally Induced Piezomagnetic Switching in Cu2OSeO3 Polymorph Synthesized under High‐Pressure Peer-reviewed

    Hung‐Cheng Wu, Takuya Aoyama, Daisuke Morikawa, Daisuke Okuyama, Kazuhiro Nawa, Wei‐tin Chen, Chan‐Hung Lu, Tsung‐Wen Yen, Shin‐Ming Huang, Stuart Calder, Shuki Torii, Kenya Ohgushi, Masami Terauchi, Taku J. Sato

    Advanced Physics Research　2024/08/05

    Publisher: Wiley

    DOI： 10.1002/apxr.202400054 　

    ISSN： 2751-1200

    eISSN： 2751-1200

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    Abstract A polymorph of Cu2OSeO3 with the distorted kagome lattice is successfully obtained using the high‐pressure synthesis technique (Cu2OSeO3‐HP). The structural analysis using X‐ray and neutron powder diffraction suggests that the tetrahedral Cu2+ clusters [similar to those in Cu2OSeO3 ambient‐pressure phase (Cu2OSeO3‐AP)] exist in Cu2OSeO3‐HP but with three symmetry inequivalent sites. No structural change is observed between 1.5 K and the room temperature. The complex magnetic H‐T phase diagram is established based on the temperature‐ and field‐dependent magnetization data, indicating two distinct antiferromagnetic phases at low and intermediate temperatures, in addition to the higher‐temperature spin‐glass‐like phase. The low temperature phase is identified by neutron powder diffraction refinements as a canted noncollinear antiferromagnetic order with a weak ferromagnetic component along the b‐axis. Size of the refined ordered moment is ≈1.00(4) µB in Cu2OSeO3‐HP, indicating a large enhancement compared to that of Cu2OSeO3‐AP (≈0.61 µB). By applying a uniaxial stress, finite enhancement of weak ferromagnetic component in the noncollinear antiferromagnetic phase in Cu2OSeO3‐HP is observed, which is the clear evidence of the piezomagnetic effect. Interestingly, the sign of the induced magnetization changes on heating from the low‐temperature to the intermediate‐temperature phases, indicating a novel piezomagnetic switching effect in this compound.

  11. Acoustic Oscillations on Piezoelectric Materials Excited by a GHz Pulsed Electron Beam

    Yohei K Sato, Kenji Tsuda, Spencer A Reisbick, Daisuke Morikawa, Masami Terauchi, Yimei Zhu

    Microscopy and Microanalysis　30　(Supplement_1)　2024/07/24

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/mam/ozae044.713 　

    ISSN： 1431-9276

    eISSN： 1435-8115

  12. Soft x-ray high diffraction efficiency and spectral flux laminar-type W/B4C multilayer diffraction grating for 300–1000 eV Peer-reviewed

    M. Koike, T. Hatano, A. S. Pirozhkov, Y. Oue, T. Murano, T. Kakio, S. Koshiya, K. Kondo, M. Terauchi

    Review of Scientific Instruments　95　(7)　2024/07/01

    Publisher: AIP Publishing

    DOI： 10.1063/5.0210722 　

    ISSN： 0034-6748

    eISSN： 1089-7623

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    Multilayer diffraction gratings are designed to improve the detection limit and sensitivity of soft x-ray flat-field spectrographs in the region of 300–1000 eV, placing emphasis on Fe-L (705 eV), Cu-L (930 eV), and Zn-L (1012 eV) emissions. For this purpose, spectral flux was used as the performance index, which is proportional to the amount of optical flux incident into a detector and correlated with detection sensitivity. A super-mirror-type W/B4C multilayer coating [Koike et al., Rev.Sci. Instrum. 94, 045109 (2023)] was employed to improve diffraction efficiency in a wide energy region. The unique feature of the multilayer structure is that the average refractive index and the period length of W/B4C layer pairs are increased from the bottom to top layers. In addition, the incidence angle was reduced to 86.03° from 88.65° and the nominal groove density was increased to 3200 lines/mm from 2400 lines/mm of our previous design, to improve spectral flux while maintaining dispersion and spectral resolution. A holographic varied-line-spacing spherical grating and a soft x-ray flat-field spectrograph were designed, using the aspherical-wavefront-recording method, assuming the nominal grating constant and incident angle described above. The numerical simulation results showed that the spectrograph employing the newly designed grating with the W/B4C multilayer indicated 3.2–8.2 times higher spectral flux compared with those using the previously designed grating while keeping the same spectral resolution.

  13. Design of soft x-ray varied-line-spacing (VLS) high-dispersion laminar-type grating coated with super-mirror-type (SMT) multilayer for flat-field spectrograph in a region of 2–4 keV Peer-reviewed

    M. Koike, T. Hatano, A. S. Pirozhkov, Y. Ueno, M. Terauchi

    Review of Scientific Instruments　95　(2)　2024/02/01

    Publisher: AIP Publishing

    DOI： 10.1063/5.0173068 　

    ISSN： 0034-6748

    eISSN： 1089-7623

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    A soft x-ray varied-line-spacing (VLS) laminar-type spherical grating with a super-mirror-type (SMT) multilayer was designed for a soft x-ray high resolution flat-field spectrograph in a region of 2–4 keV. The effective groove density of the designed VLS grating is 3200 lines/mm, and the local groove density varies from 2700 to 3866 lines/mm. The geometrical imaging property was evaluated by numerical calculations. The resolving power estimated by means of ray tracing was up to ∼103. For the evaluation of diffraction efficiency, the SMT multilayer structure designed for 3200 lines/mm in our previous work, Koike et al., Rev. Sci. Instrum. 94, 045109 (2023), was employed, and the numerical calculation was performed considering the local groove density of VLS grooves and the local incidence angle being affected by the curvature of the spherical surface and the geometrical relation between the source and incidence point on the grating. The results showed that the SMT multilayer-coated grating exhibited about an order of magnitude higher diffraction efficiency compared with an Au-coated grating.

  14. Laminar-type gratings overcoated with carbon-based materials to enhance analytical sensitivity of flat-field emission spectrograph in the VUV region Peer-reviewed

    T. Murano, S. Koshiya, M. Koike, T. Hatano, A. S. Pirozhkov, T. Kakio, N. Hayashi, Y. Oue, K. Konishi, T. Nagano, K. Kondo, M. Terauchi

    Review of Scientific Instruments　94　(12)　125113-1-125113-6　2023/12/29

    Publisher: AIP Publishing

    DOI： 10.1063/5.0176783 　

    ISSN： 0034-6748

    eISSN： 1089-7623

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    Laminar-type spherical diffraction gratings overcoated with carbon-based materials were designed, fabricated, and evaluated for the purpose of enhancing the analytical sensitivity of the flat-field spectrograph in a vacuum ultraviolet region of 35–110 eV. As the design benchmark for numerical calculations, diffraction efficiency (DE) and spectral flux, which are defined by the product of the DE and numerical aperture and correlate with the analytical sensitivity of the spectrograph, were used. To simplify the feasibility study on the overcoating effects, we assumed a laminar-type grating having a grating constant of 1/1000 mm and coated with a Au layer of 30.0 nm thickness and an incidence angle of 84.0°. The optimized groove depth and duty ratio were 30.0 nm and 0.3, respectively. In addition, the optimum thicknesses of the overcoating layer were 44, 46, 24, and 30 nm for B4C, C, diamond-like-carbon, and SiC, respectively. Based on these results, we have fabricated a varied-line-spacing holographic grating overcoated with B4C with a thickness of 47 nm. For the experimental evaluation, we used the light source of Mg-L and Al-L emissions excited by the electron beam generated from an electron microscope, an objective flat-field spectrograph, and a CCD imaging detector. The experimental results showed that the spectrograph employing a new grating overcoated with the B4C layer indicated almost the same spectral resolution and 2.9–4.2 times higher analytical sensitivity compared with those obtained with a previously designed Au-coated grating having a grating constant of 1/1200 mm and used at an incidence of 86.0°.

  15. Anisotropic electronic structure of NaAlSi studied by angle-resolved soft x-ray emission spectroscopy Peer-reviewed

    Ryogo Ebisu, Yohei K. Sato, Takahiro Yamada, Masami Terauchi

    Journal of Applied Physics　134　(21)　215107-1-215107-8　2023/12/01

    Publisher: AIP Publishing

    DOI： 10.1063/5.0178436 　

    ISSN： 0021-8979

    eISSN： 1089-7550

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    The characteristic x-ray emission direction of a material indicates the direction of the bonding orbitals and spatial symmetry of the electron orbitals. Accordingly, the intensity of x-ray emission, which varies with the direction of emission and crystal orientation, provides crucial information regarding anisotropic electronic structures. This study utilized angle-resolved soft x-ray emission spectroscopy (SXES) on a layered material, NaAlSi, to ascertain the spatial distribution of the valence electrons. Distinct alterations in the spectral intensity distributions were observed in the Al–L2,3 and Si–L2,3 spectra with respect to the emission angle. To interpret the anisotropic SXES spectra, the spatial distribution of each valence electronic state was simulated using first-principle calculations. Although the anisotropic emission intensity could not explain the symmetry of the spatial distributions of the isolated s and d atomic orbitals, the anisotropy of the SXES spectra could be interpreted as the spatial distribution of these orbitals when hybridized with p orbitals. Furthermore, the spectral structure corresponding to the electronic states near the Fermi level reflected the characteristics of the d orbitals. Therefore, angle-resolved SXES measurements can effectively discern the spatial distribution of hybridized electron orbitals with specific energy levels, which could enhance techniques related to electron distribution analysis, with potential applications in material science and electronic structure characterization.

  16. Deposition of amorphous carbon nitride thin films using pressure-gradient RF magnetron sputtering and their chemical bonding structures Peer-reviewed

    Masami Aono, Masami Terauchi, Yohei K. Sato, Kyoji Morita, Tasuku Inoue, Kazuhiro Kanda, Ken Yonezawa

    Applied Surface Science　635　157677-157677　2023/10

    Publisher: Elsevier BV

    DOI： 10.1016/j.apsusc.2023.157677 　

    ISSN： 0169-4332

  17. Determination of the crystal structure of NdBaMn2O6: coexisting polar and nonpolar phases Peer-reviewed

    Md S.Islam, D.Morikawa, S.Yamada, B.Aryal, K.Tsuda, M.Terauchi

    Physical Review B　108　L060104-1-L060104-6　2023/08

    DOI： 10.1103/PhysRevB.108.L060104 　

  18. Chemistry of zipping reactions in mesoporous carbon consisting of minimally stacked graphene layers Peer-reviewed

    Tian Xia, Takeharu Yoshii, Keita Nomura, Keigo Wakabayashi, Zheng-Ze Pan, Takafumi Ishii, Hideki Tanaka, Takashi Mashio, Jin Miyawaki, Toshiya Otomo, Kazutaka Ikeda, Yohei Sato, Masami Terauchi, Takashi Kyotani, Hirotomo Nishihara

    Chemical Science　14　(32)　8448-8457　2023/07

    Publisher: Royal Society of Chemistry (RSC)

    DOI： 10.1039/d3sc02163g 　

    ISSN： 2041-6520

    eISSN： 2041-6539

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    The structural evolution of highly mesoporous templated carbons is examined from temperatures of 1173 to 2873 K to elucidate the optimal conditions for facilitating graphene-zipping reactions whilst minimizing graphene stacking...

  19. Characteristics and exchange interactions observed in L-emission spectra of Fe, Mn and their oxides by using a high-energy-resolution soft X-ray emission spectroscopy instrument Peer-reviewed

    Masami Terauchi, Ryogo Ebisu, Yohei K Sato, Masato Koike

    Microscopy　72　(3)　243-248　2023/06

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/jmicro/dfac062 　

    ISSN： 2050-5698

    eISSN： 2050-5701

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    Abstract For examining the characteristics of L-emission spectra of Fe, Mn and their oxides, a larger energy-dispersion spectrometer for an electron probe microanalyser was constructed. The energy resolution was evaluated to be 0.3 eV at the Fermi edge observed for the B K-emission of LaB6. The Lα,β-emission profiles and peak positions of those oxides were different from those of pure metals, reflecting the different density of states of valence bands and different charge states of metal elements. The Lℓ-emission profiles of the oxides showed shoulder structures, even though the emission is caused by transitions between two inner shell levels. The presence of the shoulder structures was assigned to the result of the 3s3d exchange interaction in the final state of the Lℓ emission, in which the 3s state has a spin. The Lℓ profiles were decomposed into two peaks by Lorentz fit, and the energy separation was evaluated to be ∼3 eV.

  20. Design of soft x-ray laminar-type gratings coated with supermirror-type multilayer to enhance diffraction efficiency in a region of 2–4 keV Peer-reviewed

    M. Koike, T. Hatano, A. S. Pirozhkov, Y. Ueno, M. Terauchi

    Review of Scientific Instruments　94　(4)　045109-045109　2023/04/01

    Publisher: AIP Publishing

    DOI： 10.1063/5.0148908 　

    ISSN： 0034-6748

    eISSN： 1089-7623

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    Soft x-ray diffraction gratings coated with a supermirror-type multilayer were designed to enhance diffraction efficiency in the energy range of 2–4 keV by means of numerical calculations. The optimized groove depth and incidence angle are 2.05 nm and 88.65°, respectively, for the grating having a groove density of 3200 grooves/mm. Regarding the multilayer structure, the optimum number of B4C/W layers pair was 11 and the thickness of B4C was increased from bottom to top, while that of W was kept constant. The replacement of the top layer of W by either Co, Cr, or Ni was an effective means of obtaining uniform diffraction efficiency. In the region of 2–4 keV, the calculated diffraction efficiency of the designed gratings was up to ∼5.3%, on average, and almost eight times larger than that of ∼0.7% of an Au coated grating.

  21. STEM-EELS/EDS Chemical Analysis of Solute Clusters in a Dilute Mille-Feuille-Type Mg–Zn–Y Alloy Peer-reviewed

    Yohei K. Sato, Daisuke Egusa, Hidetoshi Miyazaki, Koji Kimura, Mitsuhiro Itakura, Masami Terauchi, Eiji Abe

    MATERIALS TRANSACTIONS　64　(5)　950-954　2023/03

    Publisher: Japan Institute of Metals

    DOI： 10.2320/matertrans.mt-md2022023 　

    ISSN： 1345-9678

    eISSN： 1347-5320

  22. Examining the anisotropic behavior of the excitons in anatase TiO2 by angle-resolved electron energy-loss spectroscopy Peer-reviewed

    Tomoya Saito, Yohei K. Sato, Masami Terauchi

    Journal of Applied Physics　133　(10)　105701-1-105701-9　2023/03

    DOI： 10.1063/5.0140536 　

  23. Space group determination and first-principles structure optimization of the A-site ordered perovskite-type manganite NdBaMn2O6 Peer-reviewed

    Md Shafiqul Islam, Daisuke Morikawa, Shigeki Yamada, Bikas Aryal, Kenji Tsuda, Masami Terauchi

    Physical Review B　105　(17)　174114-1-174114-9　2022/05/31

    Publisher: American Physical Society (APS)

    DOI： 10.1103/physrevb.105.174114 　

    ISSN： 2469-9950

    eISSN： 2469-9969

  24. 極点紫外線（EUV）域低入射角高回折効率ラミナー型回折格子の設計 Peer-reviewed

    小池雅人, 村野孝訓, 越谷翔悟, 羽多野忠, ピロジコフ, S.アレキサンダー, 垣尾翼, 林信和, 長野哲也, 近藤公伯, 寺内正己

    X線分析の進歩　53　69-76　2022/03

    ISSN： 0911-7806

  25. Analytical technique for self-absorption structure of iron L-emission spectra obtained by soft X-ray emission spectrometer Peer-reviewed

    Takaomi D Yokoyama, Hideyuki Takahashi, Shogo Koshiya, Takanori Murano, Masami Terauchi

    Microscopy　71　(3)　169-174　2022/02/17

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/jmicro/dfac009 　

    ISSN： 2050-5698

    eISSN： 2050-5701

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    Abstract The method deriving the L self-absorption spectrum from Lα,β emission spectra obtained at different accelerating voltages has been optimized for analyzing the chemical state of Fe in solid materials. Fe Lα,β emission spectra obtained are fitted using Pseudo-Voigt functions and normalized by the integrated intensity of each Fe Ll line, which is not affected by L2,3 absorption edge. The self-absorption spectrum is calculated by dividing the normalized intensity profile collected at low accelerating voltage by that collected at a higher accelerating voltage. The obtained profile is referred to as soft X-ray self-absorption structure (SX-SAS). This method is applied to six Fe-based materials (Fe metal, FeO, Fe3O4, Fe2O3, FeS and FeS2) to observe different chemical states of Fe in those materials. By comparing the self-absorption spectra of iron oxides, one can observe the L3 absorption peak structure shows a shift to the higher energy side as ferric (3+) Fe increases with respect to ferrous (+2) Fe. The intensity profiles of self-absorption spectra of metallic Fe and FeS2 shows shoulder structures between the L3 and L2 absorption peaks, which were not observed in spectra of Fe oxides. These results indicate that the SX-SAS technique is useful to examine X-ray absorption structure as a means to understand the chemical states of transition metal elements.

  26. Evaluation of exchange-correlation effects on the heat-shielding performance of carrier electrons in LaB6 using momentum-transfer resolved electron energy-loss spectroscopy Peer-reviewed

    Yohei K. Sato, Junichi Kamoi, Masami Terauchi

    Journal of Applied Physics　131　(6)　063104-063104　2022/02/14

    Publisher: AIP Publishing

    DOI： 10.1063/5.0076692 　

    ISSN： 0021-8979

    eISSN： 1089-7550

  27. In situ observation of the chemical bonding state of Si in the molten state of eutectic Au–Si alloy of Au81Si19 by using a soft X-ray emission spectroscopy electron microscope Peer-reviewed

    Masami Terauchi, Naoya Umemoto, Yohei K. Sato, Masaki Ageishi, An-Pang Tsai

    Microscopy　71　(1)　34-40　2022/01/29

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/jmicro/dfab029 　

    ISSN： 2050-5698

    eISSN： 2050-5701

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    <title>Abstract</title> Phase diagram of Au–Si binary alloy system shows a large drop in melting temperature of about 1000K compared with that of Si at a composition of Au:Si = 81:19, where the melting temperature is about 636K. Mixing of Au and Si below the melting temperature was observed by transmission electron microscopy experiment, and it was found that the mixed region shows a diffraction pattern of a diffuse ring intensity indicating an amorphous structure of the mixed area. Si L-emission spectra, which reflect the energy state of bonding electrons of Si atom, of molten Au81Si19 alloy were measured for the first time to investigate the energy state of valence electrons of Si. The Si L-emission spectrum showed a characteristic loss of L1 peak, which is related to sp3 directional bonding in crystalline Si. The intensity profile is also different from that of molten Si reported. This suggests a characteristic atomic arrangement that exists in the molten state. The intensity profile also indicated a small density of state in the molten state at Fermi energy. The obtained spectrum was compared with the calculated density of state of possible crystal structures reported. The comparison suggested that Si atoms are surrounded by eight Au atoms in the molten state of Au81Si19 alloy. The formation of this local atomic arrangement can be an origin of a large drop of melting temperature at about Au:Si = 81:19.

  28. Zigzag magnetic order in the Kitaev spin-liquid candidate material RuBr3 with a honeycomb lattice Peer-reviewed

    Yoshinori Imai, Kazuhiro Nawa, Yasuhiro Shimizu, Wakana Yamada, Hideyuki Fujihara, Takuya Aoyama, Ryotaro Takahashi, Daisuke Okuyama, Takamasa Ohashi, Masato Hagihala, Shuki Torii, Daisuke Morikawa, Masami Terauchi, Takayuki Kawamata, Masatsune Kato, Hirotada Gotou, Masayuki Itoh, Taku J. Sato, Kenya Ohgushi

    Physical Review B　105　(4)　L041112　2022/01/26

    DOI： 10.1103/physrevb.105.l041112 　

    ISSN： 2469-9950

    eISSN： 2469-9969

  29. Chemical state mapping of p/n-controlled SrB6 bulk specimens by soft X-ray emission electron microscope Invited

    M.Terauchi, Y.K.Sato, M.Takeda

    Applied Science　11　9588-1-9588-9　2021/10

  30. Improvement of precision in refinements of structure factors using convergent-beam electron diffraction patterns taken at Bragg-excited conditions Peer-reviewed

    B. Aryal, D. Morikawa, K. Tsuda, M. Terauchi

    Acta Crystallographica Section A Foundations and Advances　77　(4)　289-295　2021/07/01

    Publisher: International Union of Crystallography (IUCr)

    DOI： 10.1107/s2053273321004137 　

    eISSN： 2053-2733

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    A local structure analysis method based on convergent-beam electron diffraction (CBED) has been used for refining isotropic atomic displacement parameters and five low-order structure factors with sin θ/λ ≤ 0.28 Å−1 of potassium tantalate (KTaO3). Comparison between structure factors determined from CBED patterns taken at the zone-axis (ZA) and Bragg-excited conditions is made in order to discuss their precision and sensitivities. Bragg-excited CBED patterns showed higher precision in the refinement of structure factors than ZA patterns. Consistency between higher precision and sensitivity of the Bragg-excited CBED patterns has been found only for structure factors of the outer zeroth-order Laue-zone reflections with larger reciprocal-lattice vectors. Correlation coefficients among the refined structure factors in the refinement of Bragg-excited patterns are smaller than those of the ZA ones. Such smaller correlation coefficients lead to higher precision in the refinement of structure factors.

  31. Design and experimental evaluation of enhanced diffraction efficiency of lanthanum-based material coated laminar-type gratings in the boron K-emission region Peer-reviewed

    Tadashi Hatano, Masato Koike, Masami Terauchi, Alexander S. Pirozhkov, Nobukazu Hayashi, Hiroyuki Sasai, Tetsuya Nagano

    Applied Optics　60　(16)　4993-4993　2021/06/01

    Publisher: The Optical Society

    DOI： 10.1364/ao.430802 　

    ISSN： 1559-128X

    eISSN： 2155-3165

  32. Electron transfer in LiMn1.5Ni0.5O4 during charging studied with soft X-ray spectrometry Peer-reviewed

    Ryosuke Okamoto, Masami Terauchi

    Microscopy　70　450-460　2021/04/02

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/jmicro/dfab014 　

    ISSN： 2050-5698

    eISSN： 2050-5701

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    <title>Abstract</title> This is the first report on analyzing the chemical state of Li-ion battery electrodes at different states of charge by using a wavelength-dispersive spectrometer, which has a two-order improved energy resolution in the soft X-ray energy region compared with that of a conventional energy-dispersive X-ray analyzer. Electrodes containing LiMn1.5Ni0.5O4 were charged to prepare Li0.5Mn1.5Ni0.5O4 and λ-Mn0.75Ni0.25O2. The soft X-ray emission spectra obtained from those materials show that the O-K emission signal was drastically decreased throughout the charging process. This suggests that O-2p electron contributed to the electrochemical oxidation. The density of states and Bader charge evaluated from ab initio calculation support this result.

  33. Evaluation of TEM specimen quality prepared by focused ion beam using symmetry breaking index of convergent-beam electron diffraction Peer-reviewed

    Daisuke Morikawa, Masaki Ageishi, Kaori Sato, Kenji Tsuda, Masami Terauchi

    Microscopy　70　394-397　2021/01/15

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/jmicro/dfab002 　

    ISSN： 2050-5698

    eISSN： 2050-5701

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    <title>Abstract</title> Degradation of the crystalline quality of transmission electron microscopy specimens in silicon prepared with different conditions has been examined using convergent-beam electron diffraction (CBED). The specimens are prepared using focused ion beam (FIB) with different accelerating voltages, Ar-ion milling and crushing method. Symmetry breaking of CBED patterns was quantitatively evaluated by symmetry breaking index S, which has been previously reported. The degradation and inhomogeneity of the FIB specimen were suppressed by decreasing the accelerating voltages of the FIB fabrication in the final process.

  34. Microdiamond in a low-grade metapelite from a Cretaceous subduction complex, western Kyushu, Japan Peer-reviewed

    Tadao Nishiyama, Hiroaki Ohfuji, Kousuke Fukuba, Masami Terauchi, Ukyo Nishi, Kazuki Harada, Kouhei Unoki, Yousuke Moribe, Akira Yoshiasa, Satoko Ishimaru, Yasushi Mori, Miki Shigeno, Shoji Arai

    Scientific Reports　10　(1)　11645-1-11645-11　2020/12/01

    Publisher: Springer Science and Business Media LLC

    DOI： 10.1038/s41598-020-68599-7 　

    eISSN： 2045-2322

  35. Corrigendum to “Structural and Li-ion diffusion properties of lithium tantalum phosphate LiTa2PO8” [Solid State Ion. 351 (August 2020) 115314] (Solid State Ionics (2020) 351, (S0167273820300977), (10.1016/j.ssi.2020.115314))

    Norikazu Ishigaki, Kunimitsu Kataoka, Daisuke Morikawa, Masami Terauchi, Kikuko Hayamizu, Junji Akimoto

    Solid State Ionics　354　2020/10/15

    Publisher: Elsevier B.V.

    DOI： 10.1016/j.ssi.2020.115421 　

    ISSN： 0167-2738

  36. Photoinduced deformation of a-C thin films prepared by RF magnetron sputtering Peer-reviewed

    Masami Aono, Hisashi Miyazaki, Nobuaki Kitazawa, Yohei Sato, Masami Terauchi

    Diamond and Related Materials　108　107844-1-107844-6　2020/10

    DOI： 10.1016/j.diamond.2020.107844 　

    ISSN： 0925-9635

  37. Anisotropic dielectric properties and ensemble inhomogeneity of cesium-doped tungsten oxide nanoparticles studied by electron energy loss spectroscopy Peer-reviewed

    Keisuke Machida, Kenji Adachi, Yohei K. Sato, Masami Terauchi

    Journal of Applied Physics　128　(8)　083108-083108　2020/08/28

    Publisher: AIP Publishing

    DOI： 10.1063/5.0003007 　

    ISSN： 0021-8979

    eISSN： 1089-7550

  38. Recent developments in soft X-ray emission spectroscopy microscopy Peer-reviewed

    M Terauchi, T Hatano, M Koike, A S Pirozhkov, H Sasai, T Nagano, M Takakura, T Murano

    IOP Conference Series: Materials Science and Engineering　891　012022-012022　2020/08/06

    Publisher: IOP Publishing

    DOI： 10.1088/1757-899x/891/1/012022 　

    eISSN： 1757-899X

  39. Structural and Li-ion diffusion properties of lithium tantalum phosphate LiTa2PO8 Peer-reviewed

    Norikazu Ishigaki, Kunimitsu Kataoka, Daisuke Morikawa, Masami Terauchi, Kikuko Hayamizu, Junji Akimoto

    Solid State Ionics　351　115314-115314　2020/08

    Publisher: Elsevier BV

    DOI： 10.1016/j.ssi.2020.115314 　

    ISSN： 0167-2738

  40. Synthesis and electrical conductivity of Na3B20 Peer-reviewed

    H. Morito, S. Shibano, T. Yamada, K. Ikeda, M. Terauchi, R.V. Belosludov and H. Yamane

    Solid State Sciences　120　106166-1-106166-5　2020/03

  41. PM-06 Electronic Structure of Nitrogen-Doped Graphite Films Studied by Soft X-ray Emission Spectroscopy

    K Matsuura, Y Sato, M Terauchi, M Aono, S Hashimoto, S Ogawa, Y Takakuwa

    Microscopy　68　(Supplement_1)　i37-i37　2019/11/01

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/jmicro/dfz092 　

    ISSN： 2050-5698

    eISSN： 2050-5701

  42. PM-05 Anisotropic Electronic Structure of Metal Borides Studied by Soft X-ray Emission Spectroscopy

    Takeshi Ito, Yohei Sato, Masami Terauchi

    Microscopy　68　(Supplement_1)　i37-i37　2019/11/01

    Publisher: Oxford University Press (OUP)

    DOI： 10.1093/jmicro/dfz088 　

    ISSN： 2050-5698

    eISSN： 2050-5701

  43. Anisotropic plasmons due to a carrier electrons in Cs-doped hexagonal WO3 studied by momentum transfer resolved electron energy-loss spectroscopy Peer-reviewed

    Y. K. Sato, M. Terauchi, K. Adachi

    JOURNAL OF APPLIED PHYSICS　126　(18)　185107-1-8　2019/11

    DOI： 10.1063/1.5115068 　

    ISSN： 0021-8979

    eISSN： 1089-7550

  44. Information of valence charge of 3d transition metal elements observed in L-emission spectra Peer-reviewed

    M.Terauchi

    Microscopy　68　330-337　2019/05

  45. Electron diffraction study of crystal structures of (Sr1−xBax)2Nb2O7 Peer-reviewed

    B.Arial, D.Morikawa, K.Tsuda, S.Tsukada, Y.Akishige, M.Terauchi

    Physical Review Materials　3　(4)　044405-1-044405-6　2019/04

    DOI： 10.1103/PhysRevMaterials.3.044405 　

    ISSN： 2475-9953

  46. Carbon fibers having a nano-arched structure on Co-supersaturated Cu foils Peer-reviewed

    T.Odaira, S.Kameoka, M.Aono, M.Terauchi, A.P.Tsai

    Carbon　147　154-156　2019/03

  47. SXES study of thermoelectric bulk materials of MB6(M=Ca,Sr)

    Terauchi M., Sato Y., Takeda M.

    Meeting Abstracts of the Physical Society of Japan　74.2　2185-2185　2019

    Publisher: The Physical Society of Japan

    DOI： 10.11316/jpsgaiyo.74.2.0_2185 　

    eISSN： 2189-0803

  48. Orientation-controlled, low-temperature plasma growth and applications of h-BN nanosheelts Peer-reviewed

    I.S.Merenkov, M.S.Myshenkov, Y.M.Zhukov, Y.Sato, T.S.Frolova, D.V.Danilov, L.A.Kasatkin, O.S.Medvedev, R.V.Pushkarev, O.I.Sinitsyna, M.Terauchi, I.A.Zvereva, M.L.Kosinova, K.Ostrikov

    Nano Research　12　(1)　91-99　2019

  49. Na-Ga-Si type-I clathrate crystals grown via Na evaporation using Na-Ga and Na-Ga-Sn fluxes Peer-reviewed

    H.Urushiyama, H.Morito, H.Yamane, M.Terauchi

    RSC Advances　8　40505-40510　2018/12

  50. Dielectric Properties of Photo-Luminescent CdSe/CdS Mono-Shell and CdSe/CdS/ZnS Multi-Shell Nanocrystals Studied by TEM-EELS Peer-reviewed

    Y.Sato, N.Nakahigashi, M.Terauchi, M.Uehara

    ECS J. of Solid State Science and Technology　7　(11)　R167-R174　2018/10

    DOI： 10.1149/2.0061811jss 　

    ISSN： 2162-8769

  51. Non-uniform Excitation States in Photoinduced Deformation of Amorphous Carbon Nitride Filems Peer-reviewed

    M.Aono, T.Harata, N.kitazawa, H.Abe, S.Ishii, Y.Sato, M.Terauchi

    Scientific Reports　8　15066-1-15066-7　2018/10

    DOI： 10.1016/j.diamond.2013.11.001 　

  52. Direct observation of Mn and Ni ordering in LiMn1.5Ni0.5O4 using atomic resolution scanning transmission electron microscopy Peer-reviewed

    R.Okamoto, K.Hayashi, S.Matsumoto, N.Suzuki, M.Terauchi, K.Tsuda

    Microscopy　67　(5)　280-285　2018/09

    DOI： 10.1093/jmicro/dfy034 　

  53. Soft X-ray emission spectroscopy study of characteristic bonding states and its distribution of amorphous carbon–nitride (a-CNx) films Peer-reviewed

    S.Ishii, M.Terauchi, Y.Sato, N.Tamura, M.Aono, H.Abe

    Microscopy　67　(4)　244-249　2018/07

  54. Soft X-ray emission spectroscopy study of electronic structure of sodium borosilicide Na8B74.5Si17.5

    Masami Terauchi, Haruhiko Morito, Hisanori Yamane, Shogo Koshiya, Koji Kimoto

    MICROSCOPY　67　2018/03

    DOI： 10.1093/jmicro/dfx132 　

    ISSN： 2050-5698

    eISSN： 2050-5701

  55. SXES study of thermoelectric material of CaB6

    Terauchi M., Sato Y., Takeda M.

    Meeting Abstracts of the Physical Society of Japan　73.2　2089-2089　2018

    Publisher: The Physical Society of Japan

    DOI： 10.11316/jpsgaiyo.73.2.0_2089 　

    eISSN： 2189-0803

  56. SXES study of electronic structure of sodium borosilicide Na8B74.5Si17.5 Peer-reviewed

    M.Terauchi, H.Morito, H.Yamane, S.Koshiya, K.Kimoto

    Microscopy　67　i72-i77　2018/01

    Publisher: The Physical Society of Japan

    DOI： 10.11316/jpsgaiyo.71.2.0_2600 　

  57. Information observed in Ti-La,b and Ti-Lℓ,h emission lines of Ti and its oxides Peer-reviewed

    M.Terauchi, S.Koshiya, K.Kimoto

    IOP Conf. Ser.: Mater. Sci. Eng.　304　012018-1-012018-6　2017/12

  58. Relationship between the crystal structures of LiMn1.5Ni0.5O4 and LiMn1.5Ni0.45Fe0.05O4 and their internal resistances as cathode materials for lithium ion batteries Peer-reviewed

    Ryosuke Okamoto, Kazuhide Hayashi, Satoshi Matsumoto, Naomi Suzuki, Masami Terauchi

    JOURNAL OF SOLID STATE ELECTROCHEMISTRY　21　(11)　3301-3314　2017/11

    DOI： 10.1007/s10008-017-3655-7 　

    ISSN： 1432-8488

    eISSN： 1433-0768

  59. Electron energy-loss and soft X-ray emission spectroscopy of electronic structure of MgB4 Peer-reviewed

    Yohei Sato, Taiki Saito, Kohei Tsuchiya, Masami Terauchi, Hiroki Saito, Masatoshi Takeda

    JOURNAL OF SOLID STATE CHEMISTRY　253　58-62　2017/09

    DOI： 10.1016/j.jssc.2017.05.007 　

    ISSN： 0022-4596

    eISSN： 1095-726X

  60. Modification of dielectric functions by lattice defects in lightly-absorbing LaB6 nanoparticles studied with effective medium theory Peer-reviewed

    Keisuke Machida, Satoshi Yoshio, Kenji Adachi, Yohei Sato, Masami Terauchi

    JOURNAL OF APPLIED PHYSICS　121　(22)　223101　2017/06

    DOI： 10.1063/1.4984934 　

    ISSN： 0021-8979

    eISSN： 1089-7550

  61. Direct evaluation about structure and optical property of individual multi-shell quantum dot by TEM

    M. Uehara, N. Nakahigashi, Y. Sato, M. Terauchi

    ECS Transactions　75　(53)　7-12　2017

    Publisher: Electrochemical Society Inc.

    DOI： 10.1149/07553.0007ecst 　

    ISSN： 1938-5862 1938-6737

  62. Low Voltage Soft X-ray Emission Analysis from 100 V for Depth Chemical Information from a few nm to several hundred nm

    H.Takahashi, S.Asahina, Y.Yamamoto, Y.Sakuda, T.Kanazawa, M.Terauchi, V.Robertson, P.McSwiggen, C.Dickinson

    Microscopy & Microanalysis　22　422-423　2016/07

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    1677

  63. Chemical States Analysis of Trace-boron by using an Improved SEM-SXES

    M.Terauchi, H.Takahashi, M.Takakura, T.Murano, M.Koike, T.Imazono, T.Nagano, H.Sasai, M.Koeda

    Microscopy & Microanalysis　22　422-423　2016/07

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    1676

  64. Heterogeneous diamond phases in compressed graphite studied by electron energy-loss spectroscopy Peer-reviewed

    Yohei Sato, Matthieu Bugnet, Masami Terauchi, Gianluigi A. Botton, Akira Yoshiasa

    DIAMOND AND RELATED MATERIALS　64　190-196　2016/04

    DOI： 10.1016/j.diamond.2016.02.010 　

    ISSN： 0925-9635

    eISSN： 1879-0062

  65. 22aAF-4 Electronic structures of a-CN_x studied by SXES

    Ishii S., Terauchi M., Sato Y., Aono M., Abe H., Tamura N.

    Meeting Abstracts of the Physical Society of Japan　71　2748-2748　2016

    Publisher: The Physical Society of Japan (JPS)

    DOI： 10.11316/jpsgaiyo.71.1.0_2748 　

    ISSN： 2189-079X

  66. 22aAF-3 Momentum resolved EELS study for electronic structure of materials

    Sato Y., Terauchi M.

    Meeting Abstracts of the Physical Society of Japan　71　2747-2747　2016

    Publisher: The Physical Society of Japan (JPS)

    DOI： 10.11316/jpsgaiyo.71.1.0_2747 　

    ISSN： 2189-079X

  67. epsilon-TiO, a Novel Stable Polymorph of Titanium Monoxide Peer-reviewed

    Shinsaku Amano, Dimitri Bogdanovski, Hisanori Yamane, Masami Terauchi, Richard Dronskowski

    ANGEWANDTE CHEMIE-INTERNATIONAL EDITION　55　(5)　1652-1657　2016/01

    DOI： 10.1002/anie.201510479 　

    ISSN： 1433-7851

    eISSN： 1521-3773

  68. Postsynthesis of h-BN/Graphene Heterostructures Inside a STEM Peer-reviewed

    Zheng Liu, Luiz H. G. Tizei, Yohei Sato, Yung-Chang Lin, Chao-Hui Yeh, Po-Wen Chiu, Masami Terauchi, Sumio Iijima, Kazu Suenaga

    SMALL　12　(2)　252-259　2016/01

    DOI： 10.1002/smll.201502408 　

    ISSN： 1613-6810

    eISSN： 1613-6829

  69. Experimental evaluation of enhancement of diffraction efficiency by overcoating diamond-like carbon (DLC) on soft X-ray laminar-type gratings Peer-reviewed

    Takashi Imazono, Masato Koike, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Satoshi Kuramoto, Masami Terauchi, Hideyuki Takahashi, Satoshi Notoya, Takanori Murano, Eric M. Gullikson

    PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI2015)　1741　040043-1-4　2016

    DOI： 10.1063/1.4952915 　

    ISSN： 0094-243X

  70. Enhancement of Diffraction Efficiency of Laminar-Type Diffraction Gratings Overcoated with Diamond-Like Carbon (DLC) in Soft X-Ray Region Peer-reviewed

    Masato Koike, Takashi Imazono, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto, Masami Terauchi, Hideyuki Takahashi, Satoshi Notoya, Takanori Murano

    PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI2015)　1741　040045-1-4　2016

    DOI： 10.1063/1.4952917 　

    ISSN： 0094-243X

  71. Development of soft X-ray emission spectrometer for EPMA/SEM and its application Peer-reviewed

    H. Takahashi, T. Murano, M. Takakura, S. Asahina, M. Terauchi, M. Koike, T. Imazono, M. Koeda, T. Nagano

    14TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS (EMAS 2015 WORKSHOP)　109　012017-1-11　2016

    DOI： 10.1088/1757-899X/109/1/012017 　

    ISSN： 1757-8981

  72. Possibility of material’s function imaging microscopy for bulk specimens Invited

    Masami Terauchi

    Microscopy　65　i5　2016

    Publisher: Oxford University Press

    DOI： 10.1093/jmicro/dfw097 　

    ISSN： 2050-5701 2050-5698

  73. Good reproductive preparation method of Li-intercalated hexagonal boron nitride and transmission electron microscopy - Electron energy loss spectroscopy analysis Peer-reviewed

    A. Sumiyoshi, H. Hyodo, Y. Sato, M. Terauchi, K. Kimura

    SOLID STATE SCIENCES　47　68-72　2015/09

    DOI： 10.1016/j.solidstatesciences.2015.04.011 　

    ISSN： 1293-2558

    eISSN： 1873-3085

  74. Amount of valence charge of Al- and Zn-based quasicrystals and related approximant crystals evaluated by chemical shift observations and Bader analysis Peer-reviewed

    S. Koshiya, M. Terauchi

    PHILOSOPHICAL MAGAZINE　95　(13)　1462-1470　2015/05

    DOI： 10.1080/14786435.2015.1033486 　

    ISSN： 1478-6435

    eISSN： 1478-6443

  75. Electronic structures of three-dimensional C-60 polymers studied by high-energy-resolution electron energy-loss spectroscopy based on transmission electron microscopy Peer-reviewed

    Yohei Sato, Masami Terauchi, Shoji Yamanaka

    CHEMICAL PHYSICS LETTERS　626　90-95　2015/04

    DOI： 10.1016/j.cplett.2015.03.017 　

    ISSN： 0009-2614

    eISSN： 1873-4448

  76. 16aAB-3 SXES and EELS studies on electronic structures of a-CN_x

    Ishii S., Terauchi M., Sato Y., Aono M., Abe H., Tamura N.

    Meeting Abstracts of the Physical Society of Japan　70　2394-2394　2015

    Publisher: The Physical Society of Japan (JPS)

    DOI： 10.11316/jpsgaiyo.70.2.0_2394 　

    ISSN： 2189-079X

  77. 16aAB-1 SXES study of charge states of transition metal elements II

    Terauchi Masami

    Meeting Abstracts of the Physical Society of Japan　70　2392-2392　2015

    Publisher: The Physical Society of Japan (JPS)

    DOI： 10.11316/jpsgaiyo.70.2.0_2392 　

    ISSN： 2189-079X

  78. 16aAB-2 Electronic structures of functional materials studies by q-resolved EELS

    Sato Y., Terauchi M.

    Meeting Abstracts of the Physical Society of Japan　70　2393-2393　2015

    Publisher: The Physical Society of Japan (JPS)

    DOI： 10.11316/jpsgaiyo.70.2.0_2393 　

    ISSN： 2189-079X

  79. 17pCL-11 TEM study of superlattice structure in the Al_<11>TM_4(TM=Ir,Rh)

    Nishimoto K., Yamaguchi N., Tamura R., Terauchi M., Tsai A. P.

    Meeting Abstracts of the Physical Society of Japan　70　1408-1408　2015

    Publisher: The Physical Society of Japan (JPS)

    DOI： 10.11316/jpsgaiyo.70.2.0_1408 　

    ISSN： 2189-079X

  80. 18pAD-6 A new pathway of electron microscopy based soft-X-ray emission spectroscopy for materials science IMRAM

    Terauchi Masami

    Meeting Abstracts of the Physical Society of Japan　70　2522-2522　2015

    Publisher: The Physical Society of Japan (JPS)

    DOI： 10.11316/jpsgaiyo.70.2.0_2522 　

    ISSN： 2189-079X

  81. Exciting possibilities of soft x-ray emission spectroscopy as chemical state analysis in EPMA and FESEM Peer-reviewed

    H. Takahashi, N. Handa, T. Murano, M. Terauchi, M. Koike, T. Kawachi, T. Imazono, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

    Microscopy and Microanalysis　20　(3)　684-685　2014/08/01

    Publisher: Cambridge University Press

    DOI： 10.1017/S1431927614005145 　

    ISSN： 1435-8115 1431-9276

  82. Present state of TEM-SXES analysis and its application to SEM aiming chemical analysis of bulk materials Peer-reviewed

    M. Terauchi, H. Takahashi, N. Handa, T. Murano, M. Koike, T. Imazono, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

    Microscopy and Microanalysis　20　(3)　682-683　2014/08/01

    Publisher: Cambridge University Press

    DOI： 10.1017/S1431927614005133 　

    ISSN： 1435-8115 1431-9276

  83. Van der Waals epitaxial growth of topological insulator Bi2-xSbxTe3-ySey ultrathin nanoplate on electrically insulating fluorophlogopite mica Peer-reviewed

    Ngoc Han Tu, Yoichi Tanabe, Khuong Kim Huynh, Yohei Sato, Hidetoshi Oguro, Satoshi Heguri, Kenji Tsuda, Masami Terauchi, Kazuo Watanabe, Katsumi Tanigaki

    APPLIED PHYSICS LETTERS　105　(6)　2014/08

    DOI： 10.1063/1.4892576 　

    ISSN： 0003-6951

    eISSN： 1077-3118

  84. Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry Peer-reviewed

    Masami Terauchi, Shogo Koshiya, Futami Satoh, Hideyuki Takahashi, Nobuo Handa, Takanori Murano, Masato Koike, Takashi Imazono, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto

    MICROSCOPY AND MICROANALYSIS　20　(3)　692-697　2014/06

    DOI： 10.1017/S1431927614000439 　

    ISSN： 1431-9276

    eISSN： 1435-8115

  85. High-Energy Resolution Electron Energy-Loss Spectroscopy Study of Interband Transitions Characteristic to Single-Walled Carbon Nanotubes Peer-reviewed

    Yohei Sato, Masami Terauchi

    MICROSCOPY AND MICROANALYSIS　20　(3)　807-814　2014/06

    DOI： 10.1017/S1431927614000580 　

    ISSN： 1431-9276

    eISSN： 1435-8115

  86. Chemical shifts of metallic and non-metallic Al-Re-Si approximant crystals studied by EELS and SXES Peer-reviewed

    S. Koshiya, M. Terauchi, Y. Takagiwa, K. Yamada, I. Kanazawa, K. Kimura

    PHILOSOPHICAL MAGAZINE　94　(15)　1711-1718　2014/05

    DOI： 10.1080/14786435.2014.894648 　

    ISSN： 1478-6435

    eISSN： 1478-6443

  87. Electron diffraction and electron energy-loss spectroscopy studies of a hybrid material composed of coronene molecules encapsulated in single-walled carbon nanotubes Peer-reviewed

    Md. Mahbubul Haque, Yohei Sato, Masami Terauchi, Yoko Iizumi, Toshiya Okazaki

    MICROSCOPY　63　(2)　111-117　2014/04

    DOI： 10.1093/jmicro/dft049 　

    ISSN： 2050-5698

    eISSN： 2050-5701

  88. Activation of Al-Cu-Fe quasicrystalline surface: fabrication of a fine nanocomposite layer with high catalytic performance Peer-reviewed

    Satoshi Kameoka, Toyokazu Tanabe, Futami Satoh, Masami Terauchi, An Pang Tsai

    SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS　15　(1)　014801-1-014801-7　2014/02

    DOI： 10.1088/1468-6996/15/1/014801 　

    ISSN： 1468-6996

    eISSN： 1878-5514

  89. High energy-resolution electron energy-loss spectroscopy and soft-x-ray emission spectroscopy studies of amorphous diamond transformed from neutron-irradiated graphite Peer-reviewed

    Y. Sato, M. Terauchi, K. Niwase, K. G. Nakamura, T. Atou, T. Iwata

    18TH APS-SCCM AND 24TH AIRAPT, PTS 1-19　500　(500)　192013-1-192013-5　2014

    DOI： 10.1088/1742-6596/500/19/192013 　

    ISSN： 1742-6588

  90. Chemical State Mapping via soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution Peer-reviewed

    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto

    Microscopy & Microanalysis　19　1258-1259　2013/10

  91. Construction of a SXES spectrometer for a conventional SEM Peer-reviewed

    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M. Koike, T.Kawachi, T.Imazono, N.Hasegawa, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto

    Microscopy & Microanalysis　19　1278-1279　2013/10

  92. A new grating X-ray spectrometer for 2-4 keV enabling a separate observation of In-Lβ and Sn-Lα emissions of indium tin oxide Peer-reviewed

    Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano, Masato Koike, Tetsuya Kawachi, Takashi Imazono, Noboru Hasegawa, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto

    Journal of Electron Microscopy　62　(3)　391-395　2013/06

    DOI： 10.1093/jmicro/dfs129 　

    ISSN： 0022-0744 1477-9986

  93. A new grating X-ray spectrometer for 2-4 keV enabling a separate observation of In-L beta and Sn-L alpha emissions of indium tin oxide Peer-reviewed

    Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano, Masato Koike, Tetsuya Kawachi, Takashi Imazono, Noboru Hasegawa, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto

    MICROSCOPY　62　(3)　391-395　2013/06

    DOI： 10.1093/jmicro/dfs129 　

    ISSN： 2050-5698

    eISSN： 2050-5701

  94. Characteristic chemical shifts of quasicrystalline Zn-Mg-Zr alloys studied by EELS and SXES Peer-reviewed

    S. Koshiya, M. Terauchi, S. Ohhashi, A. P. Tsai

    PHILOSOPHICAL MAGAZINE　93　(18)　2250-2258　2013/06

    DOI： 10.1080/14786435.2013.765994 　

    ISSN： 1478-6435

  95. Development of a flat-field spectrograph with a wide-band multilayer grating and prefocusing mirror covering 2-4 keV Peer-reviewed

    T. Imazono, M. Koike, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto, M. Terauchi, H. Takahashi, N. Handa, T. Murano

    11TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI 2012)　425　2013

    DOI： 10.1088/1742-6596/425/15/152008 　

    ISSN： 1742-6588

  96. Development of an objective flat-field spectrograph for electron microscopic soft x-ray emission spectrometry in 50-4000 eV Peer-reviewed

    T. Imazono, M. Koike, T. Kawachi, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto, M. Terauchi, H. Takahashi, N. Handa, T. Murano

    ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS VIII　8848　884812-1-884812-14　2013

    DOI： 10.1117/12.2024652 　

    ISSN： 0277-786X

  97. Formation of crosslinked-fullerene-like framework as negative replica of zeolite y Peer-reviewed

    Nueangnoraj, K., Nishihara, H., Imai, K., Itoi, H., Ishii, T., Kiguchi, M., Sato, Y., Terauchi, M., Kyotani, T.

    Carbon　62　455-464　2013

    DOI： 10.1016/j.carbon.2013.06.033 　

  98. High energy-resolution electron energy-loss spectroscopy study on the near-infrared scattering mechanism of Cs0.33WO3 crystals and nanoparticles Peer-reviewed

    Yohei Sato, Masami Terauchi, Kenji Adachi

    JOURNAL OF APPLIED PHYSICS　112　(7)　074308　2012/10

    DOI： 10.1063/1.4752867 　

    ISSN： 0021-8979

  99. High energy-resolution electron energy-loss spectroscopy analysis of dielectric property and electronic structure of hexagonal diamond Peer-reviewed

    Yohei Sato, Masami Terauchi, Wataru Inami, Akira Yoshiasa

    DIAMOND AND RELATED MATERIALS　25　40-44　2012/05

    DOI： 10.1016/j.diamond.2012.02.013 　

    ISSN： 0925-9635

    eISSN： 1879-0062

  100. Laminar and blazed type holographic gratings for a versatile soft x-ray spectrograph attached to an electron microscope and their evaluation in the 50-200 eV range Peer-reviewed

    Takashi Imazono, Masato Koike, Tetsuya Kawachi, Noboru Hasegawa, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto, Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano, Kazuo Sano

    APPLIED OPTICS　51　(13)　2351-2360　2012/05

    DOI： 10.1364/AO.51.002351 　

    ISSN： 1559-128X

    eISSN： 2155-3165

  101. Ultrasoft-X-ray emission spectroscopy using a newly designed wavelength-dispersive spectrometer attached to a transmission electron microscope Peer-reviewed

    Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano, Masato Koike, Tetsuya Kawachi, Takashi Imazono, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto

    JOURNAL OF ELECTRON MICROSCOPY　61　(1)　1-8　2012/02

    DOI： 10.1093/jmicro/dfr076 　

    ISSN： 0022-0744

  102. High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA Peer-reviewed

    T. Murano, H. Takahashi, N. Handa, M. Terauchi, M. Koike, T. Kawachi, I. Takashi, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

    Microscopy and Microanalysis　18　(2)　776-777　2012

    DOI： 10.1017/S1431927612005739 　

    ISSN： 1435-8115 1431-9276

  103. Characteristics in valence-band emission spectra of simple metals and transition metals obtained by SXES-TEM Peer-reviewed

    M. Terauchi, H. Takahashi, N. Handa, T. Murano, M. Koike, T. Kawachi, T. Imazono, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

    Microscopy and Microanalysis　18　938-939　2012

    DOI： 10.1017/S143192761200654X 　

    ISSN： 1435-8115 1431-9276

  104. A multilayer grating with a novel layer structure for a flat-field spectrograph attached to transmission electron microscopes in energy region of 2-4 keV Peer-reviewed

    T. Imazono, M. Koike, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto, M. Terauchi, H. Takahashi, N. Handa, T. Murano

    X-RAY OPTICS AND MICROANALYSIS　1437　24-28　2012

    DOI： 10.1063/1.3703337 　

    ISSN： 0094-243X

  105. Development of a Soft X-Ray Diffractometer for a Wideband Multilayer Grating with a Novel Layer Structure in the 2-4 keV Range Peer-reviewed

    Takashi Imazono, Masato Koike, Tetsuya Kawachi, Noboru Hasegawa, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto, Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano

    LASER-DRIVEN RELATIVISTIC PLASMAS APPLIED TO SCIENCE, ENERGY, INDUSTRY, AND MEDICINE　1465　(1465)　33-37　2012

    DOI： 10.1063/1.4737535 　

    ISSN： 0094-243X

  106. An Extension up to 4 KeV by a Newly Developed Multilayer-coated Grating for TEM-SXES Spectrometer

    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto

    Microscopy & Microanalysis　17 (suppl 2)　604-605　2011/08/07

  107. High Energy-Resolution EELS and SXES Studies on Characteristic Chemical Shifts and Charge Transfer in Al-Si-Mn and Zn-Mg-Zr Alloys

    S. Koshiya, M. Terauchi, A.P. Tsai

    Microscopy & Microanalysis　17 (suppl 2)　1184-1185　2011/08/07

  108. High energy-resolution electron energy-loss spectroscopy study of the dielectric properties of bulk and nanoparticle LaB6 in the near-infrared region Peer-reviewed

    Yohei Sato, Masami Terauchi, Masaki Mukai, Toshikatsu Kaneyama, Kenji Adachi

    ULTRAMICROSCOPY　111　(8)　1381-1387　2011/07

    DOI： 10.1016/j.ultramic.2011.05.003 　

    ISSN： 0304-3991

  109. 電子顕微鏡を用いた価電子（結合電子）状態分析技術の開発 Peer-reviewed

    寺内正己

    顕微鏡　46　(2)　105-110　2011/06

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    7218

  110. Superconductivity in Li-doped alpha-rhombohedral boron Peer-reviewed

    T. Nagatochi, H. Hyodo, A. Sumiyoshi, K. Soga, Y. Sato, M. Terauchi, F. Esaka, K. Kimura

    PHYSICAL REVIEW B　83　(18)　184507-1-184507-5　2011/05

    DOI： 10.1103/PhysRevB.83.184507 　

    ISSN： 1098-0121

  111. 電子プローブを用いた構造・物性解析手法の開発と応用 Peer-reviewed

    寺内正己, 津田健治, 佐藤庸平

    Materials Integration　24　(4&5)　208-211　2011/04

    Publisher:

    ISSN： 1344-7858

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    7217

  112. A Newly Developed Grating and Soft X-ray Spectrometer for Electron Probe Microanalyser ant Transmission Electron Microscope

    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto

    Abstract of Australian MicrobeamAnalysis Society XI　2011/02/07

  113. Development of a cryogenic stage for an ion-milling instrument Peer-reviewed

    Masami Terauchi, Futami Satou, Hideo Sugizaki, Katsuaki Suganuma

    JOURNAL OF ELECTRON MICROSCOPY　60　(1)　25-27　2011/02

    DOI： 10.1093/jmicro/dfq069 　

    ISSN： 0022-0744

  114. 合金触媒の薄膜試料作製法と透過型電子顕微鏡観察 Peer-reviewed

    田邊豊和, 寺内正己

    Catalysts & Catalysis　53　(1)　14-18　2011/01

    More details Close

    7206

  115. Characteristic chemical shift of quasicrystalline alloy Al53Si27Mn20 studied by EELS and SXES Peer-reviewed

    S. Koshiya, M. Terauchi, A. P. Tsai

    PHILOSOPHICAL MAGAZINE　91　(18)　2309-2316　2011

    DOI： 10.1080/14786435.2011.552450 　

    ISSN： 1478-6435

  116. Valence electron spectroscopy by SXES-TEM Invited

    M.Terauchi

    Abstract of 6th International Workshop on Nano-Scale Spectroscopy and Nanotechnology　I-7　2010/10/25

  117. High energy-resolution electron energy-loss spectroscopy study of nanoparticle of near infrared scattering materials

    Y.Sato, M.Terauchi, K.Adachi

    Abstract of 17th International Conference on Microscopy　I5-5　2010/09/17

  118. High energy-resolution electron energy-loss spectroscopy study of single-walled carbon nanotubes

    Y.Sato, M.Terauchi, Y.Saito

    Abstract of 17th International Conference on Microscopy　M2-34　2010/09/17

  119. Li K-emission measurements using a newly developed SXES-TEM instruments

    M.Terauchi, H.Takahashi, N.Handa, T.Murano, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto

    Microscopy & Microanalysis　16　1308-1309　2010/08/02

  120. A Soft X-ray Emission Spectrometer with High-energy Resolution for Electron Probe Microanalysis

    H.Takahashi, N.Handa, T.Murano, M.Terauchi, M.Koike, T.Kawachi, T.Imazono, M.Koeda, T.Nagano, H.Sasai, Y.Oue, Z.Yonezawa, S.Kuramoto

    Microscopy & Microanalysis　16　34-35　2010/08/02

  121. Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes-an introduction of valence electron spectroscopy for transmission electron microscopy Peer-reviewed

    Masami Terauchi, Masato Koike, Kurio Fukushima, Atsushi Kimura

    JOURNAL OF ELECTRON MICROSCOPY　59　(4)　251-261　2010/08

    DOI： 10.1093/jmicro/dfq010 　

    ISSN： 0022-0744

  122. EELS and SXES studies of electronic structures of Zn-Mg-Zr alloys

    S.Koshiya, M.Terauchi, S.Ohhashi, A.P.Tsai

    Abstract of 11th International Conference on Quasicrystals　P04-09　2010/06/15

  123. High energy-resolution EELS studies of surface plasmon of nm-scale metal particles in near infrared region by using a monochromator TEM

    Y.Sato, M.Terauchi, K.Adachi

    Abstract of 12th Frontiers of Electron Microscopy in Materials Science　P-097　2009/09/27

  124. EELS and SXES studies of electronic structures of Al53Si27Mn20 alloys

    S.Koshiya, M.Terauchi, A.P.Tsai

    Abstract of 12th Frontiers of Electron Microscopy in Materials Science　P-099　2009/09/27

  125. Development of TEM-SXES instruments for valence electron spectroscopy Invited

    M. Terauchi

    MICROSCOPY AND MICROANALYSIS　15　214-215　2009/07

    DOI： 10.1017/S1431927609096281 　

    ISSN： 1431-9276

  126. EELS and SXES studies of electronic structures of Al-TM alloys

    S. Koshiya, M. Terauchi, A. P. Tsai, Y. Takagiwa, K. Kimura

    Abstract of the 5th Asian International Workshop on Quasicrytals　58　2009/06/01

  127. Catalytic performance and microstructure of Al-Cu-Fe quasicrystalline catalyst

    T. Tanabe, S.Kameoka, F.Sato, M.Terauchi, An Pang Tsai

    Abstract of the 5th Asian International Workshop on Quasicrytals　8　2009/06/01

  128. Neutron Irradiation Effects on the Structure and Electrical Property of Boron Nanobelts

    K. Kirihara, Y. Sato, Y. Yamada, Y. Shimizu, T. Sasaki, N. Koshizaki, H. Yamamoto, S. Shamoto, K. Soga, H. Hyodo, M. Terauchi, K. Kimura

    Abstract of 15th International Symposium on Intercalation Compounds　2009/05/14

  129. Study of crystal and electronic structures of boron nanobelt using convergent-beam electron diffraction and electron energy-loss spectroscopy

    K. Tsuda, D. Morikawa, K. Iwasaki, Y. Sato, M. Terauchi, K. Kirihara, K. Kawaguchi, T. Sasaki, N. Koshizaki, H. Hyodo, K. Kimura

    Abstract of 15th International Symposium on Intercalation Compounds　2009/05/14

  130. Production of high purity alpha-Rhombohedral Boron and Li-doping into it, targeting superconductivity

    T. Nagatochi, H. Hyodo, K. Soga, Y. Sato, M. Terauchi, K. Kimura

    Abstract of 15th International Symposium on Intercalation Compounds　2009/05/14

  131. A possible buckybowl-like structure of zeolite templated carbon Peer-reviewed

    Hirotomo Nishihara, Quan-Hong Yang, Peng-Xiang Hou, Masashi Unno, Seigo Yamauchi, Riichiro Saito, Juan I. Paredes, Amelia Martinez-Alonso, Juan M. D. Tascon, Yohei Sato, Masami Terauchi, Takashi Kyotani

    CARBON　47　(5)　1220-1230　2009/04

    DOI： 10.1016/j.carbon.2008.12.040 　

    ISSN： 0008-6223

  132. A transmission electron microscopy study on the real structure of synthetic hematite Peer-reviewed

    Ralf Theissmann, Hartmut Fuess, Kenji Tsuda, Masami Terauchi

    JOURNAL OF MATERIALS SCIENCE　44　(5)　1421-1424　2009/03

    DOI： 10.1007/s10853-007-1718-3 　

    ISSN： 0022-2461

  133. Soft X-ray emission spectroscopy study of the valence electron states of alpha-rhombohedral boron Peer-reviewed

    Masami Terauchi, Yohei Sato, Hiroshi Hyodo, Kaoru Kimura

    16TH INTERNATIONAL SYMPOSIUM ON BORON, BORIDES AND RELATED MATERIALS (ISBB 2008)　176　012025　2009

    DOI： 10.1088/1742-6596/176/1/012025 　

    ISSN： 1742-6588

  134. Electron energy-loss and soft X-ray emission study of boron nanobelts Peer-reviewed

    Yohei Sato, Masami Terauchi, Kazuhiro Kirihara, Takeshi Sasaki, Kenji Kawaguchi, Naoto Koshizaki, Kaoru Kimura

    16TH INTERNATIONAL SYMPOSIUM ON BORON, BORIDES AND RELATED MATERIALS (ISBB 2008)　176　012029　2009

    DOI： 10.1088/1742-6596/176/1/012029 　

    ISSN： 1742-6588

  135. Nano-spectroscopies based on transmission electron microscopy

    M.Terauchi, Y.Sato

    Abstract of France-Tohoku workshop　2008/12/12

  136. Structure and electronic properties of Mg-doped <font face="symbol">b</font>-rhombohedral boron constructed from icosahedral clusters Peer-reviewed

    Hiroshi Hyodo, Satoshi Araake, Shizuka Hosoi, Kohei Soga, Yohei Sato, Masami Terauchi, Kaoru Kimura

    Transactions of the Materials Research Society of Japan　33　303-306　2008/12

  137. Recent development of soft-X-ray emission spectroscopy instruments for a conventional analytical transmission electron microscope Invited

    M.Terauchi, M.Koike

    Abstract of 9th Asia-Pacific Microscopy Conference　2008/11/02

  138. Evaluations of optical properties of Co based soft x-ray multilayer gratings Peer-reviewed

    Masahiko Ishino, Masato Koike, Futami Satou, Masami Terauchi, Kazuo Sano, Hiroyuki Sasai

    JOURNAL OF APPLIED PHYSICS　104　(7)　1-5　2008/10

    DOI： 10.1063/1.2990062 　

    ISSN： 0021-8979

  139. Nano-spectroscopies based on transmission electron microscopy Invited Peer-reviewed

    Masami Terauchi

    Abstract of 4th Handai Nanoscience and Nanotechnology International Symposium　O2-1　2008/09/29

  140. Electron energy-loss spectroscopy and soft X-ray emission spectroscopy studies of electronic structure of boron nanobelts

    Y. Sato, M. Terauchi, Z. Wang, Y. Shimizu, T. Sasaki, K. Kawaguchi, N. Koshizaki, K. Kimura

    Abstract of ISBB2008　107　2008/09/07

  141. Structure and electrical conduction of Li-doped and Mg-doped boron nanobelt

    H.Hyodo, K.Kirihara, K.Soga, K.Kawaguchi, Y.Shimizu, T.Sasaki, N.Koshizaki, Y.Sato, M.Terauchi, K.Kimura

    Abstract of ISBB2008　117　2008/09/07

  142. Convergent-beam electron diffraction study of boron nanobelts

    Kenji Tsuda, Keisuke Iwasaki, Yohei Sato, Masami Terauchi, Kaoru Kimura

    Abstract of ISBB2008　127　2008/09/07

  143. Soft-X-ray emission spectroscopy study of the valence electron states of a-rhombohedral boron

    Masami Terauchi, Yohei Sato, Kaoru Kimura

    Abstract of ISBB2008　138　2008/09/07

  144. The system of PbZr1-xTixO3 studied by convergent-beam electron diffraction

    Roland Schierholz, Ralf Theissmann, Hartmut Fuess, Kenji Tsuda, Masami Terauchi

    Acta Cryst A　64　145　2008/08/23

  145. Determination of chiral indices of carbon nanotubes using electron diffraction pattern

    Y. Sato, K. Tsuda, M. Terauchi, Y. Saito

    Acta Cryst. A　64　605-606　2008/08/23

  146. Relation between peak structures of loss functions of single double-walled carbon nanotubes and interband transition energies Peer-reviewed

    Yohei Sato, Masami Terauchi, Yahachi Saito, Kentaro Sato, Riichiro Saito

    JOURNAL OF ELECTRON MICROSCOPY　57　(4)　129-132　2008/08

    DOI： 10.1093/jmicro/dfn012 　

    ISSN： 0022-0744

  147. Electronic structure studies of carbon materials by high energy-resolution carbon K-emission spectroscopy measurements

    M. Terauchi, H. Nishihara, T. Kyotani

    Microscopy and Microanalysis　14　(2)　796-797　2008/08

    DOI： 10.1017/S1431927608084353 　

    ISSN： 1431-9276 1435-8115

  148. Soft-X-ray emission spectroscopy study of transition intensities from the valence band to 3D core-hole of lanthanide oxides

    M. Terauchi, Y. Yoneda

    Microscopy and Microanalysis　14　(2)　822-823　2008/08

    DOI： 10.1017/S1431927608084365 　

    ISSN： 1431-9276 1435-8115

  149. High energy-resolution EELS studies on electronic excitations of LaB 6 and Cs0.33WO3 particles by using a monochromator transmission microscope

    Y. Sato, M. Terauchi, M. Tanaka, M. Mukai, T. Kaneyama, K. Adachi, T. Asahi

    Microscopy and Microanalysis　14　(2)　1356-1357　2008/08

    DOI： 10.1017/S1431927608084377 　

    ISSN： 1431-9276 1435-8115

  150. Mechanism of Formation of AlN Film by Sapphire Nitridation and Polarity Determination

    H.Fukuyama, T.Aikawa, H.Kobatake, K.Tsuda, M.Terauchi, K.Hiraga, K. Takada

    Abstract of 2nd International Symposium on Growth of III Nitrides　2008/07/06

  151. Crystal symmetry in single domains of PbZr0.54Ti0.46O3 Peer-reviewed

    Roland Schierholz, Hartmut Fuess, Kenji Tsuda, Yoishiro Ogata, Masami Terauchi, Ralf Theissmann

    PHYSICAL REVIEW B　78　(2)　024118-1-024118-7　2008/07

    DOI： 10.1103/PhysRevB.78.024118 　

    ISSN： 1098-0121

    eISSN： 1550-235X

  152. Total electronic structure analysis by EELS & SXES based on transmission electron microscopy Invited

    M.Terauchi

    Proc. of the 1st Int. Symp. on Advanced Microscopy and Theoretical Calculations　110-111　2008/06/29

  153. Quantitative Analysis of Intermetallic Compound and TEM Specimen Preparation for Sn Whiskers

    Katsuaki Suganuma, Masami Terauchi

    Proceedings of 2nd International Symposium on Tin Whiskers　1　1-3　2008/04/24

  154. Structure and electronic properties of Mg-doped beta-rhombohedral boron constructed from icosahedral clusters Peer-reviewed

    H. Hyodo, S. Araake, S. Hosoi, K. Soga, Y. Sato, M. Terauchi, K. Kimura

    PHYSICAL REVIEW B　77　(2)　024515　2008/01

    DOI： 10.1103/PhysRevB.77.024515 　

    ISSN： 1098-0121

  155. Mg-doping into boron icosahedral cluster solids, targeting high temperature superconductivity Peer-reviewed

    H. Hyodo, S. Hosoi, S. Araake, K. Soga, Y. Sato, M. Terauchi, K. Kimura

    TRANSACTIONS OF THE MATERIALS RESEARCH SOCIETY OF JAPAN, VOL 33, NO 2　33　(2)　303-306　2008

  156. Recent development of soft-X-ray emission spectroscopy instruments for a conventional analytical transmission electron microscope Invited Peer-reviewed

    M.Terauchi, M. Koike

    11th Frontiers of Electron Microscopy in Materials Science　2007/09

  157. New development of a wavelength-dispersive X-ray spectrometer up to 2 keV for a conventional analytical transmission electron microscope Peer-reviewed

    M.Terauchi, Y.Yoneda, M.Koike

    Microscopy & Microanalysis　13　(2)　166-167　2007/08

  158. High Energy-Resolution Electron Energy-Loss Spectroscopy Study of the Electronic Structures of One-Dimensional Nano-Scale Materials Peer-reviewed

    Y Satoh, M Terauchi, Y Saito, K Satoh, R Saito,J Kikkawa, S Takeda

    Microscopy and Microanalysis　13　744-745　2007/08

  159. Thermal stability of Co/SiO2 multilayers for use in the soft x-ray region Peer-reviewed

    Masahiko Ishino, Masato Koike, Mika Kanehira, Futami Satou, Masami Terauchi, Kazuo Sano

    JOURNAL OF APPLIED PHYSICS　102　(2)　1　2007/07

    DOI： 10.1063/1.2756741 　

    ISSN： 0021-8979

  160. Enhanced direct interband transitions in silicon nanowires studied by electron energy-loss spectroscopy Peer-reviewed

    J. Kikkawa, S. Takeda, Y. Sato, M. Terauchi

    PHYSICAL REVIEW B　75　(24)　2007/06

    DOI： 10.1103/PhysRevB.75.245317 　

    ISSN： 1098-0121

  161. Strain analysis of arsenic-doped silicon using CBED rocking curves of low-order reflections Peer-reviewed

    Kenji Tsuda, Hajime Mitsuishi, Masami Terauchi, Kazuo Kawamura

    JOURNAL OF ELECTRON MICROSCOPY　56　(2)　57-61　2007/04

    DOI： 10.1093/jmicro/dfm006 　

    ISSN： 0022-0744

  162. ZnO films grown on Si substrates with au nanocrystallites as nuclei Peer-reviewed

    Xia Feng, Junyong Kang, Wataru Inami, Xiaoli Yuan, Masami Terauchi, Takashi Sekiguchi, Shin Tsunekawa, Shun Ito, Toshio Sakurai

    CRYSTAL GROWTH & DESIGN　7　(3)　564-568　2007/03

    DOI： 10.1021/cg060237s 　

    ISSN： 1528-7483

  163. A transmission electron microscopy study on the real structure of synthetic hematite Peer-reviewed

    R.Theissmann, H.Fuess, K.Tsuda, M.Terauchi

    Journal of Materials Science　DOI101007/s　(10853-007)　-1718-3　2007

  164. TEM spectroscopy study of electronic structures of quasicrystals and approximants Peer-reviewed

    M. Terauchi, Y. Uemichi, H. Ueda, A. P. Tsai, T. Takeuchi, U. Mizutani

    PHILOSOPHICAL MAGAZINE　87　(18-21)　2947-2955　2007

    DOI： 10.1080/14786430701355158 　

    ISSN： 1478-6435

  165. Cross-section TEM investigation of quasicrystalline catalysts prepared by aqueous NaOH leaching Peer-reviewed

    T. Tanabe, S. Kameoka, F. Sato, M. Terauchi, A. Pang Tsaizx

    PHILOSOPHICAL MAGAZINE　87　(18-21)　3103-3108　2007

    DOI： 10.1080/14786430701365017 　

    ISSN： 1478-6435

  166. Soft-X-ray emission spectroscopy based on TEM - Toward a total electronic structure analysis Peer-reviewed

    Masami Terauchi, Masanao Kawana

    ULTRAMICROSCOPY　106　(11-12)　1069-1075　2006/10

    DOI： 10.1016/j.ultramic.2006.04.021 　

    ISSN： 0304-3991

  167. Monochromator for a 200kV Analytical Electron Microscope Peer-reviewed

    M. Mukai, W. Inami, K. Omoto, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, M. Naruse, T. Honda, M. Tanaka

    Proceedings of the 16th International Microscopy Congress (IMC16),　860　2006/09

  168. Monochromator for a 200 kV analytical electron microscope Peer-reviewed

    M. Mukai, W. Inami, K. Omoto, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, M. Naruse, T. Honda, M. Tanaka

    Microscopy and Microanalysis　12　(2)　1206-1207　2006/08

    DOI： 10.1017/S1431927606064816 　

    ISSN： 1431-9276 1435-8115

  169. Electronic structure analyses of BN network materials using high energy-resolution spectroscopy methods based on transmission electron microscopy Invited Peer-reviewed

    M. Terauchi

    MICROSCOPY RESEARCH AND TECHNIQUE　69　(7)　531-537　2006/07

    DOI： 10.1002/jemt.20323 　

    ISSN： 1059-910X

  170. Local lattice parameter determination of a silicon (001) layer grown on a sapphire (1(1)over-bar-02) substrate using convergent-beam electron diffraction Peer-reviewed

    Takayuki Akaogi, Kenji Tsuda, Masami Terauchi, Michiyoshi Tanaka

    JOURNAL OF ELECTRON MICROSCOPY　55　(3)　129-135　2006/06

    DOI： 10.1093/jmicro/dfl020 　

    ISSN： 0022-0744

  171. High energy-resolution electron energy-loss spectroscopy study of the electric structure of double-walled carbon nanotubes Peer-reviewed

    Yohei Sato, Masami Terauchi, Yahachi Saito, Riichiro Saito

    JOURNAL OF ELECTRON MICROSCOPY　55　(3)　137-142　2006/06

    DOI： 10.1093/jmicro/dfl021 　

    ISSN： 0022-0744

  172. Local lattice parameter determination of a silicon (001) layer grown on a sapphire (1(1)over-bar-02) substrate using convergent-beam electron diffraction Peer-reviewed

    Takayuki Akaogi, Kenji Tsuda, Masami Terauchi, Michiyoshi Tanaka

    JOURNAL OF ELECTRON MICROSCOPY　55　(3)　129-135　2006/06

    DOI： 10.1093/jmicro/dfl020 　

    ISSN： 0022-0744

  173. Recent advances in spectroscopy methods based on TEM Invited Peer-reviewed

    M.Terauchi

    Proceedings of 10th SANKEN International Symposium on Nanoscience and Nanotechnology　2006/04

  174. Silicon and boron carbonitride films obtained by CVD methods Peer-reviewed

    N.I.Fainer, M.L.Kosinova, V.S.Sulyaeva, Yu.M.Rumyantsev, E.A.Mavimovskii, B.M.Ayupov, B.A.Kolesov, F.A.Kuznetsov, V.G.Kesler, M.Terauchi, K.Shibata, F.Satoh, Z.X.Cao

    Proceedings of 5th Israeli-Russian bi-national workshop　2006/04

  175. High energy-resolution electron energy-loss Spectroscopy study of electronic structures of barium titanate nanocrystals Peer-reviewed

    K Suzuki, M Terauchi, Y Uemichi, K Kijima

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS　44　(10)　7593-7597　2005/10

    DOI： 10.1143/JJAP.44.7593 　

    ISSN： 0021-4922

  176. Nanocrystalline films of silicon carbonitride: chemical composition and bonding and functional properties Invited Peer-reviewed

    M.L. Kosinova, N.I. Fainer, V.S. Sulyaeva, Yu.M. Rumyantsev, F.A. Kuznetsov, E.A. Maximovskii, Z. Cao, M. Terauchi, K. Shibata, F. Satoh

    Proceedings of 15th European conference on chemical vapor deposition　1082-1087　2005/09/04

  177. Synthesis,Nanoindentation and afm studies of cvd boron carbon nitride films Peer-reviewed

    M.L. Kosinova, N.I. Fainer, V.S. Sulyaeva, Yu.M. Rumyantsev, F.A.Kuznetsov, E.A. Maximovskii, Z. Cao, M. Terauchi, K. Shibata, F. Satoh

    Proceedings of 15th European conference on chemical vapor deposition　1082-1087　2005/09

  178. Structure and electronic properties of Mg-doped a- and b-rhombohedral boron Invited Peer-reviewed

    H. Hyodo, S. Araake, K. Soga, Y. Satoh, M. Terauchi, K. Kimura

    Abstract of ISBB2005　2005/08/21

  179. Performance of a new Monochromator for a 200 kV Analytical Electron Microscope Invited Peer-reviewed

    M. Mukai, T. Kanayama, T. Tomota, K. Tsuno, M. Terauchi, K. Tsuda, M. Naruse, T. Honda, M. Tanaka

    Microscopy & Microanalysis　11　(2)　2134-2135　2005/08/01

    DOI： 10.1017/S1431927606064816 　

  180. Ultra High-Energy-Resolution Soft-X-ray emission Spectroscopy for TEM/STEM Invited Peer-reviewed

    Y. Murooka, Y. Ito, W.J. Fabella, M. Terauchi

    Microscopy & Microanalysis, late poster session　2005/08/01

  181. High energy-resolution electron energy-loss spectroscopy study of the electronic structure Of C-60 polymer crystals Peer-reviewed

    M Terauchi, S Nishimura, Y Iwasa

    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA　143　(2-3)　167-172　2005/05

    DOI： 10.1016/j.elspec.2004.09.024 　

    ISSN： 0368-2048

    eISSN： 1873-2526

  182. Development of wavelength-dispersive X-ray spectrometer for a conventional analytical transmission electron microscope Invited Peer-reviewed

    M. Terauchi, M. Koike, K. Fukushima, J. Kimura

    Abstract of EDGE2005 International EELS workshop　54　2005/05/01

  183. High energy-resolution electron energy-loss spectroscopy study of the electronic structure of two-wall carbon nanotubes Invited Peer-reviewed

    Y. Sato, M. Treauchi, Y. Saito, R. Saito

    Abstract of EDGE2005 International EELS workshop　135　2005/05/01

  184. Performance of a new Monochromator for a 200 kV Analytical Electron Microscope Invited Peer-reviewed

    M. Mukai, T. Kanayama, T. Tomota, K. Tsuno, M. Terauchi, K. Tsuda, M. Naruse, T. Honda, M. Tanaka

    Abstract of EDGE2005 International EELS workshop　25　2005/05/01

  185. Soft-X-ray emission spectroscopy based on TEM Invited Peer-reviewed

    M. Terauchi

    Abstract of EDGE2005 International EELS workshop　22　2005/05/01

  186. Frontiers of Electron Beam Analyses

    TERAUCHI Masami, ICHINOSE Hideki, TSUDA Kenji, KIMOTO Koji

    X-RAYS　47　(1)　2-2　2005/02/24

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.47.2 　

    ISSN： 0369-4585

  187. Effects of metal buffer layer on the morphology of the ZnO columns Peer-reviewed

    Xia Feng, Xiaoli Yuan, Takashi Sekiguchi, Masami Terauchi, Shin Tsunekawa, Shun Ito, Junyong Kang

    IEEE Semiconducting and Semi-Insulating Materials Conference, SIMC　2005　156-159　2005

    DOI： 10.1109/SIM.2005.1511407 　

  188. A new method to characterize dopant profiles in NMOSFETs using conventional transmission electron microscopy Invited Peer-reviewed

    K Kawamura, K Ikeda, M Terauchi

    APPLIED SURFACE SCIENCE　237　(1-4)　621-626　2004/10

    DOI： 10.1016/j.apsusc.2004.06.028 　

    ISSN： 0169-4332

  189. High-energy-resolution electron energy-loss spectroscopy study of the electronic structure of Cu- and Mg-Si-doped beta-rhombohedral boron crystals Peer-reviewed

    M Terauchi, Y Sato, T Nakayama, A Oguri, K Soga, K Kimura

    JOURNAL OF SOLID STATE CHEMISTRY　177　(8)　2916-2919　2004/08

    DOI： 10.1016/j.jssc.2004.04.044 　

    ISSN： 0022-4596

  190. Preparation of a novel copper catalyst from Al-Cu-Fe quasicrystalline Peer-reviewed

    S. Kameoka, T. Tanabe, M. Terauchi, A.P. Tsai

    Abstract of 13th International Congress on Catalysis　1-276　2004/07

  191. Test results of MIRAI-21 analytical electron microscope Peer-reviewed

    M. Mukai, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, D. Ioanoviciu, G. Martinez, M. Naruse, T. Honda, M. Tanaka

    Proceedings of 8th Asia-Pacific conference on electron microscopy　117-118　2004/06/09

  192. High energy-resolution electron energy-loss spectroscopy study of the electronic structure of two-wall carbon nanotubes Peer-reviewed

    Y. Sato, M. Terauchi, Y. Saito, R. Saito

    Proceedings of 8th Asia-Pacific conference on electron microscopy　150-151　2004/06

  193. Development of a wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate the density of states of the valence band (invited) Peer-reviewed

    M. Terauchi

    Proceedings of 8th Asia-Pacific conference on electron microscopy　159-160　2004/06

  194. Lattice parameter determination of a composition controlled Si1-xGex layer on a Si (001) substrate using a CBED Peer-reviewed

    T. Akaogi, K. Tsuda, M. Terauchi, M. Tanaka

    Proceedings of 8th Asia-Pacific conference on electron microscopy　499-500　2004/06

  195. A CBED technique for observation of polarity Invited Peer-reviewed

    M. Terauchi

    2nd German-Japanese school on CBED　2004/06

  196. Detection of the As-doped region in silicon by convergent-beam electron diffraction Invited Peer-reviewed

    M. Terauchi, H. Mitsuishi, K. Tsuda, K. Kawamura

    2nd German-Japanese school on CBED　2004/06

  197. The structural and electric properties of the perovskite system BaTiO3-Ba(Fe1/2Ta1/2)O-3 Peer-reviewed

    GB Li, SX Liu, FH Liao, SJ Tian, XP Jing, JH Lin, Y Uesu, K Kohn, K Saitoh, M Terauchi, NL Di, ZH Cheng

    JOURNAL OF SOLID STATE CHEMISTRY　177　(4-5)　1695-1703　2004/04

    DOI： 10.1016/j.jssc.2003.12.025 　

    ISSN： 0022-4596

  198. TEM用軟X線発光分光装置の開発 Peer-reviewed

    寺内正己

    電子顕微鏡　39　(39(3))　200-203　2004/04

    Publisher: The Japanese Society of Microscopy

    DOI： 10.11410/kenbikyo2004.39.200 　

    ISSN： 1349-0958

  199. 高エネルギー分解能ナノスケール軟X線分光系の開発 Peer-reviewed

    寺内正己, 小池雅人, 石野雅彦

    JAERI-Conf　(2004-09)　91-94　2004/04

  200. Li- and Mg-doping into icosahedral boron crystals, alpha- and beta-rhombohedral boron, targeting high-temperature superconductivity: structure and electronic states Peer-reviewed

    K Soga, A Oguri, S Araake, M Terauchi, A Fujiwara, K Kimura

    JOURNAL OF SOLID STATE CHEMISTRY　177　(2)　498-506　2004/02

    DOI： 10.1016/j.jssc.2003.03.002 　

    ISSN： 0022-4596

  201. Lattice parameter determination of a strained area of an InAs layer on a GaAs substrate using CBED Peer-reviewed

    T Akaogi, K Tsuda, M Terauchi, W Tanaka

    JOURNAL OF ELECTRON MICROSCOPY　53　(1)　11-19　2004

    DOI： 10.1093/jmicro/53.1.11 　

    ISSN： 0022-0744

  202. Lattice parameter determination of a composition controlled Si1-xGex layer on a Si(001) substrate using convergent-beam electron diffraction Peer-reviewed

    T Akaogi, K Tsuda, M Terauchi, M Tanaka

    JOURNAL OF ELECTRON MICROSCOPY　53　(6)　593-600　2004

    DOI： 10.1093/jmicro/dfh091 　

    ISSN： 0022-0744

  203. High energy-resolution electron energy-loss spectroscopy study of the electronic structures of Li- and Mg-doped alpha-rhombohedral boron Peer-reviewed

    M Terauchi, A Oguri, K Kimura, A Fujiwara

    JOURNAL OF ELECTRON MICROSCOPY　53　(6)　589-592　2004

    DOI： 10.1093/jmicro/dfh093 　

    ISSN： 0022-0744

  204. A high energy-resolution wavelength-dispersive soft-X-ray spectrometer for a transmission electron microscope to investigate valence electrons Peer-reviewed

    M. Terauchi

    Microscopy and Microanalysis　10　(2)　1044-1045　2004

    DOI： 10.1017/S1431927604883880 　

    ISSN： 1431-9276

  205. Local lattice parameter determination of strained areas of semiconductors using CBED Peer-reviewed

    Takayuki Akaogi, Kenji Tsuda, Masami Terauchi, Michiyoshi Tanaka

    Microscopy and Microanalysis　10　(2)　310-311　2004

    DOI： 10.1017/S1431927604883727 　

    ISSN： 1431-9276

  206. Detection of characteristic signals from As-doped (less than 1 at.%) regions of silicon by transmission electron microscopy and convergent-beam electron diffraction Peer-reviewed

    M. Terauchi, K. Tsuda, H. Mitsuishi, K. Kawamura

    Microscopy and Microanalysis　10　(2)　338-339　2004

    DOI： 10.1017/S1431927604883958 　

    ISSN： 1431-9276

  207. Performance of mirai-21 analytical electron microscope Peer-reviewed

    M. Mukai, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, D. Ioanoviciu, G. Martinez, M. Naruse, T. Honda, M. Tanaka

    Microscopy and Microanalysis　10　(2)　858-859　2004

    DOI： 10.1017/S1431927604883648 　

    ISSN： 1431-9276

  208. Polarity control of GaN epilayers grown on ZnO templates Peer-reviewed

    T Suzuki, HJ Ko, A Setiawan, JJ Kim, K Saitoh, M Terauchi, T Yao

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING　6　(5-6)　519-521　2003/10

    DOI： 10.1016/j.mssp.2003.07.002 　

    ISSN： 1369-8001

    eISSN： 1873-4081

  209. A New High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope Peer-reviewed

    M.Terauchi, M.Koike

    Microscopy & Microanalysis 2003　9　(2)　894-895　2003/08

  210. “MIRAI-21” ANALYTICAL ELECTRON MICROSCOPE - PERFORMANCE OF THE MONOCHROMATOR - Peer-reviewed

    M. Mukai, T, Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, K. Saitoh, M, Naruse,T. Honda, M. Tanaka

    Microscopy & Microanalysis 2003　9　(2)　954-956　2003/08

  211. GROWTH OF HOMOGENEOUS AND GRADIENT BCxnY FILMS BY PECVD USING TRIMETHYLAMINO BORANE COMPLEX Peer-reviewed

    M.L.Kosinova, N.I.Fainer, Yu.Rumyantsev, E.A.Maximovski, F.A.Kuznetsov, M.Terauchi, K.Shibata, F.Satoh

    Chemical Vapor Deposition XVI and EUROCVD 14　1　(1)　709-715　2003/04

  212. NANODRYSTALLINE SiCxNy FILMS: RPECVD SYNTHESIS AND TRANSFORMATION UNDER THERMAL ANNEALING Peer-reviewed

    N.I.Fainer, M, L.Kosinova, Yu.Rumyantsev, B.M.Ayupov, B.A.Kolesov, F.A.Kuzenetsov, A.I.Boronin, C.V.Koscheev, M.Terauchi, K.Shibata, F.Satoh

    Chemical Vapor Deposition XVI and EUROCVD 14　1　(2)　1086-1093　2003/04

  213. Nanocrystalline SiCxNy Films: RPECVD Synthesis and Transformation Under Thermal Annealing Peer-reviewed

    N.Fainer, M.Kosinova, Y.Rumyantsev, B.Ayupov, B.Kolesov, F.Kuznetsov, A.Boronin, S.Koscheev, M.Terauchi, K.Shibata, F.Satoh

    203rd Meeting of The Electrochemical Society　2003　(08)　1086-1093　2003/04

  214. Growth of Homogeneous and Gradient BCxNy Films by PECVD Using Trimethylamino Borane Complex Peer-reviewed

    M.Kosinova, N.Fainer, Y.Rumyantsev, E.Maximovski, F.Kuznetsov, M.Terauchi, K.Shibata, F.Satoh

    203rd Meeting of The Electrochemical Society　2003　(08)　708-715　2003/04

  215. Nanotubes without caobon atoms Peer-reviewed

    Masami Terauchi

    Parity　18　41-45　2003/04

  216. Electronic sturcture analyses by transmission electorn microscope Peer-reviewed

    Masami Terauchi

    Electron microscopy　38　(3)　186-191　2003/04

    Publisher: The Japanese Society of Microscopy

    DOI： 10.11410/kenbikyo1950.38.186 　

    ISSN： 0417-0326

  217. High energy-resolution EELS and XES analysis of BN materials Peer-reviewed

    M.Terauchi

    10th International Symposium on Advanced Materials　43-44　2003/03

  218. Control of crystal polarity of GaN epilayers grown on ZnO templates Invited Peer-reviewed

    T.Suzuki, J.-J.Kim, A.Setiawan, H.-J.Ko, K.Saitoh, M.Terauchi, T.Yao

    Abstract of 1st International Symposium on Point defect and Nonstoichiometry　FP-35　2003/03

  219. Detection of characteristic signals from As-doped (&lt; 1 at.%) regions of silicon by transmission electron microscopy and convergent-beam electron diffraction Peer-reviewed

    M Terauchi, K Tsuda, K Kawamura

    JOURNAL OF ELECTRON MICROSCOPY　52　(5)　441-448　2003

    DOI： 10.1093/jmicro/52.5.441 　

    ISSN： 0022-0744

  220. Functional Nanocrystalline Graded Materials on the basis of Boron Carbonitride Peer-reviewed

    M.L.Kosinova, Yu.M.Rumyantsev, N.I.Fainer, F.A.Kuznetsov, M.Terauchi, K.Shibata, F.Satoh

    Proceedings of APAM 2002 International Conference on International Collaboration and Networking　103-104　2002/12

  221. MIRAI-21 ANALYTICAL ELECTRON MICROSCOPE - PERFORMANCE OF THE MONOCHROMATOR - Invited Peer-reviewed

    M. Mukai, T. Kaneyama, T. Tomita, K. Tsuno, M. Terauchi, K. Tsuda, K. Saitoh, M. Kersker, M. Naruse, T. Honda, M. Tanaka

    Proc. 15th Int. Cong. Electron Microscopy　2002/09

  222. Development of A High Energy-resolution Soft-X-ray Spectrometer for A Transmission Electron Microscope Peer-reviewed

    M. Terauchi, M. Kawana

    Microscopy and Microanalysis 2002　8　(2)　644-655　2002/08

  223. Development of An 0.2eV Energy Resolution Analytical Electron Microscope Peer-reviewed

    M. Tanaka, M. Terauchi, K. Tsuda, K. Saitoh, M. Mukai, T, Kaneyama, T. Tomita, K. Tsuno, M. Kersker, M. Naruse, T. Honda

    Microscopy and Microanalysis 2002　68-69　2002/08

  224. Detection of the arsenic-doped region in silicon by convergent-beam electron diffraction Invited Peer-reviewed

    M.Terauchi, K.Kawamura

    Abstract of IUCr XIX　MS19　(1)　2002/08

  225. Synthesis of gradient nanocrystalline layers on the basis of carbonitride boron Invited Peer-reviewed

    M.L. Kosinova, Yu.M. Rumyantsev, N.I. Fainer, E.A. Maximovskii, K.G. Myakishev, I.P. Dolgovesova, B.M. Ayupov, B.A. Kolesov, M. Teruachi, K. Shibata, F. Satoh, M. Tanaka

    Abstract of VI Bilateral Russian-German Symposium “Physics and Chemistry of advanced materials　3,13　2002/08

  226. Strain-induced surface segregation in In0.5Ga0.5As/GaAs heteroepitaxy Peer-reviewed

    A Ohtake, M Ozeki, M Terauchi, F Sato, M Tanaka

    APPLIED PHYSICS LETTERS　80　(21)　3931-3933　2002/05

    DOI： 10.1063/1.1482792 　

    ISSN： 0003-6951

  227. Electron energy-loss spectroscopy based on transmission electorn microscope Peer-reviewed

    Masami Terauchi

    Journal of the Crystallographic Society of Japan　44　277-283　2002/04

  228. Electronic structure analyses by electron energy-loss spectroscopy Peer-reviewed

    Masami Terauchi

    Journal of the Crystallographic Society of Japan　44　347-354　2002/04

  229. Alkilamine borane complexes as single-source precursors for nano-scale functional graded materials on the basis of boron carbonitride Peer-reviewed

    M.L.Kosinova, Yu.M.Rumyantsev, N.I.Fainer, E.A.Maximovski, K.G. Myakishev, V.V.Volkov, I.P.Dolgovesova, B.M. Ayupov, B.A.Kolesov, M.Terauchi, K.Shibata, F.Satoh, M.Tanaka

    Programme and abstracts of Eleventh International Conference on Boron Chemistry. 2002　117　2002

  230. Control of crystal polarity in a wurtzite crystal: ZnO films grown by plasma-assisted molecular-beam epitaxy on GaN Peer-reviewed

    Soon-Ku Hong, Takashi Hanada, Hang-Ju Ko, Yefan Chen, Takafumi Yao, Daisuke Imai, Kiyoaki Araki, Makoto Shinohara, Koh Saitoh, Masami Terauchi

    Physical Review B - Condensed Matter and Materials Physics　65　(11)　1-10　2002

    DOI： 10.1103/PhysRevB.65.115331 　

    ISSN： 1550-235X 1098-0121

  231. Nano-wire crystals of π-conjugated organic materials Peer-reviewed

    T. Onodera, T. Oshikiri, H. Katagi, H. Kasai, S. Okada, H. Oikawa, M. Terauchi, M. Tanaka, H. Nakanishi

    Journal of Crystal Growth　229　(1)　586-590　2001/07/02

    Publisher: Elsevier

    DOI： 10.1016/S0022-0248(01)01233-7 　

    ISSN： 0022-0248

  232. Nano-wire crystals of π-conjugated organic materials Peer-reviewed

    T. Onodera, T. Oshikiri, H. Katagi, H. Kasai, S. Okada, H. Oikawa, M. Terauchi, M. Tanaka, H. Nakanishi

    Journal of Crystal Growth　229　(1)　586-590　2001/07/02

    Publisher: Elsevier

    DOI： 10.1016/S0022-0248(01)01233-7 　

    ISSN： 0022-0248

  233. Distinction between space groups having principal rotation and screw axes, which are combined with twofold rotation axes, using the coherent convergent-beam electron diffraction method Peer-reviewed

    Koh Saitoh, Kenji Tsuda, Masami Terauchi, Michiyoshi Tanaka

    Acta Crystallographica Section A: Foundations of Crystallography　57　(3)　219-230　2001/05

    DOI： 10.1107/S0108767300014896 　

    ISSN： 0108-7673

  234. Selective Excitation of a Symmetric Interface Plasmon Mode in Two Close Planar SiO2/Si Interface Observed by Electron Energy-loss Spectroscopy Peer-reviewed

    H. Komoda, A. Watada, K. Ishida, K. Sasakawa, T. Okano, Y. Tsubokawa, M. Terauchi

    Japanese Journal of Applied Physics　40　(7)　4512-4515　2001/04

    Publisher: INSTITUTE OF PURE AND APPLIED PHYSICS

    DOI： 10.1143/JJAP.40.4512 　

    ISSN： 0021-4922

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    We have studied the effects of the SiO2/Si interface parallel to an electron beam on transmission electron energy-loss spectra of a SiO2 area for poly-Si/SiO2/Si samples. The dependence of the energy-loss spectra on the distance from the interface to the probe position and on the distance between two interfaces was investigated. Spectra obtained from the center of the thick (150 nm) SiO2 layer had no peak in the energy region of 4–10 eV@. However, a peak at about 7 eV was observed in the spectra obtained at a position of 7.5 nm from the SiO2/Si interface for the same specimen. This peak was assigned to a SiO2/Si interface plasmon excitation. For the thin (15 nm) oxide poly-Si/SiO2/Si sample, on the other hand, the peak appeared at 8.7 eV@. Furthermore, this peak shifts to higher energies as the oxide thickness decreases. This peak was assigned to an excitation of a symmetric interference plasmon mode in two close planar SiO2/Si interfaces.

  235. Structure Study of Thin RPECVD CdxZn1-xS Films Peer-reviewed

    N. I. Fainer, M, L. Kosinova, Yu. M. Rumyantsev, E. A. Maximovski, M. Terauchi, K. Shibata, F. Satoh, M. Tanaka, N. P. Sysoeva, F. A. Kuznetsov

    Journal de Physique IV　11　979-985　2001/04

  236. Structure and Composition Investigation of RPECVD SiCN and LPCVD BCN Films Peer-reviewed

    M. L. Kosinova, N. I. Fainer, Y. M. Rumyantsev, M. Terauchi, K. Shibata, F. Satoh, M. Tanaka, F. A. Kuznetsov

    Journal de Physique IV　11　987-994　2001/04

  237. Wurtzite-zinc-blend Polytypism in ZnSe on GaAs(111)A Peer-reviewed

    A. Ohtake, J. Nakamura, M. Terauchi, F. Satoh, M. Tanaka, K. Kimura, T. Yao

    Physical Review: Third series B, Condensed Matter and Materials Phyics　63　(195325)　2001/04

  238. A Sub-eV Resolution Soft-X-ray Spectrometer for a Transmission Electron Microscope to Obtain the Density of States of the Valence Band Peer-reviewed

    M. Terauchi, H. Yamamoto, M. Tanaka

    Microscopy and Microanalysis, suppl.2　7　228-229　2001/04

  239. Hybridized Microcrystals Composed of Metal Fine Particles and π-Conjugated Organic Microcystals Peer-reviewed

    Akito Masuhara, Hitoshi Kasai, Shuji Okada, Hidetoshi Oikawa, Masami Terauchi, Michiyoshi Tanaka, Hachiro Nakanishi

    Japanese Journal of Applied Physics　40　(10)　L1129-L1131　2001/04

    Publisher: The Japan Society of Applied Physics

    DOI： 10.1143/JJAP.40.L1129 　

    ISSN： 0021-4922

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    We have successfully prepared hybridized microcrystals composed of polydiacetylene microcrystals and silver fine particles by means of the co-reprecipitation method, and investigated their hybridized structure and optical properties. It was revealed experimentally for the first time that the core domain of metal fine particles may interact optoelectronically with the shell layer of polydiacetylene in the hybridized microcrystals to give different electronic states from those of the original compounds.

  240. Hybridized Microcrystals Composed of Metal Fine Particles and π-Cojugated Organic Materials Peer-reviewed

    Akito Masuhara, Hitoshi Kasai, Shuji Okada, Hidetoshi Oikawa, Masami Terauchi, Michiyoshi Tanaka, Hachiro Nakanishi

    Japanese Journal of Applied Physics　40　(10)　L1129-L1131　2001/04

    Publisher: The Japan Society of Applied Physics

    DOI： 10.1143/JJAP.40.L1129 　

    ISSN： 0021-4922

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    We have successfully prepared hybridized microcrystals composed of polydiacetylene microcrystals and silver fine particles by means of the co-reprecipitation method, and investigated their hybridized structure and optical properties. It was revealed experimentally for the first time that the core domain of metal fine particles may interact optoelectronically with the shell layer of polydiacetylene in the hybridized microcrystals to give different electronic states from those of the original compounds.

  241. Physical properties and superconductivity in Li- and Mg-doped a- and b-rhombohedral boron Invited Peer-reviewed

    A.Oguri, H.Yahata, K.Soga, K.Kimura, M.Terauchi, A.Fujiwara

    Abstract of 14th International symposium boron, borides and related compounds　2001/04

  242. Development of a Soft-X-ray Spectrometer for a Transmission Electron Microscope Peer-reviewed

    M. Terauchi, H. Yamamoto, M. Tanaka, M. Suzuki, K. Nitta, E. Ito, I. Takahashi

    Bulletin of the Research Institute for Scientific Measurements, Tohoku University　49　61-66　2001/04

  243. Development of a Sub-eV Enegy-Resolution Soft-X-ray Spectrometer for a Transmission Electron Microscope Peer-reviewed

    M. Terauchi, M. Tanaka

    Solid State Physics　36　281-286　2001/04

  244. Development of a sub-eV resolution soft-X-ray spectrometer for a transmission electron microscope Peer-reviewed

    M Terauchi, H Yamamoto, M Tanaka

    JOURNAL OF ELECTRON MICROSCOPY　50　(2)　101-104　2001

    DOI： 10.1093/jmicro/50.2.101 　

    ISSN： 0022-0744

  245. High energy-resolution EELS study of the electronic structure of boron nitride cones Peer-reviewed

    M Terauchi, M Kawana, M Tanaka, K Suzuki, A Ogino, K Kimura

    NANONETWORK MATERIALS: FULLERENES, NANOTUBES AND RELATED SYSTEMS　590　133-136　2001

    ISSN： 0094-243X

  246. A sign of superconductivity in Li-doped alpha-rhombohedral boron Peer-reviewed

    A Oguri, K Kimura, A Fujiwara, M Terauchi, M Tanaka

    NANONETWORK MATERIALS: FULLERENES, NANOTUBES AND RELATED SYSTEMS　590　507-510　2001

    ISSN： 0094-243X

  247. Studies Decagonal quesicrysstals by advanced Fanction ElectRon Microscopes

    TANAKA Michiyoshi, TERAUCHI Masami, TSUDA Kenji, SAITOH Koh, TSAI An-pang, ABE Eiji

    Bulletin of the Japan Institute of Metals　39　(8)　645-653　2000/08/20

    Publisher: The Japan Institute of Metals and Materials

    DOI： 10.2320/materia.39.645 　

    ISSN： 1340-2625

  248. Synthesis and Properties of boron Carbonitride and Boron Nitride films Peer-reviewed

    M.L.Kosinova, N.I.Fainer, E.A.Maximovski, Yu.M.Rumyantsev, M.Terauchi, K.Shibata, F.Satoh, M.Tanaka, F.A.Kuznetsov

    The 1st Asian Conferrence on Crystal Growth and Crrystal technology　2000/08

  249. Distinction of space groups (I23 and I2(1)3) and (I222 and I2(1)2(1)2(1)) using coherent convergent-beam electron diffraction Peer-reviewed

    K Tsuda, K Saitoh, M Terauchi, M Tanaka, P Goodman

    ACTA CRYSTALLOGRAPHICA SECTION A　56　359-369　2000/07

    ISSN： 0108-7673

  250. An 0.2eV energy resolution analytical electron microscope Peer-reviewed

    M Tanaka, M Terauchi, K Tsuda, K Saitoh, T Honda, K Tsuno, M Naruse, T Tomita, T Kaneyama

    MICROBEAM ANALYSIS 2000, PROCEEDINGS　(165)　217-218　2000

    ISSN： 0951-3248

  251. High energy-resolution electron energy-loss spectroscopy based on electron microscopy Peer-reviewed

    M Terauchi, M Tanaka

    MICROBEAM ANALYSIS 2000, PROCEEDINGS　(165)　211-212　2000

    ISSN： 0951-3248

  252. Advances in symmetry analysis by convergent-beam electron diffraction Peer-reviewed

    M Terauchi, M Tanaka

    MICROBEAM ANALYSIS 2000, PROCEEDINGS　(165)　201-202　2000

    ISSN： 0951-3248

  253. High energy-resolution electron energy-loss spectroscopy study on Sr-doping dependence of the electronic structure of La(2-x)Sr(x)CuO4 Peer-reviewed

    M. Terauchi, M. Tanaka

    Micron　30　(5)　371-377　1999/10

    DOI： 10.1016/S0968-4328(99)00040-2 　

    ISSN： 0968-4328

  254. A new 200 kV Omega-filter electron microscope Peer-reviewed

    M Tanada, K Tsuda, M Terauchi, K Tsuno, T Kaneyama, T Honda, M Ishida

    JOURNAL OF MICROSCOPY-OXFORD　194　219-227　1999/04

    ISSN： 0022-2720

  255. Development of a high energy resolution electron energy-loss spectroscopy microscope Peer-reviewed

    M Terauchi, M Tanaka, K Tsuno, M Ishida

    JOURNAL OF MICROSCOPY　194　(1)　203-209　1999/04

    DOI： 10.1046/j.1365-2818.1999.00450.x 　

    ISSN： 0022-2720

    eISSN： 1365-2818

  256. High Energy-Resolvtion Electron Energy-Loss Spectroscopy Microscope

    TERAUCHI Masami, TANAKA Michiyoshi

    Materia Japan　38　(3)　196-196　1999/03/20

    Publisher: The Japan Institute of Metals and Materials

    DOI： 10.2320/materia.38.196 　

    ISSN： 1340-2625

  257. Electron energy-loss spectroscopy study of the metal-insulator transition in (V1-xCrx)(2)O-3 (x = 0.012) Peer-reviewed

    H Abe, M Terauchi, M Tanaka, S Shin

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　38　(3A)　1403-1407　1999/03

    ISSN： 0021-4922

  258. Metallic-covalent bonding conversion in Alminum-based and Boron-based icosahedral cluster solids Peer-reviewed

    K. Kimura, H. Matsuda, M. Fujimori, M. Terauchi, M. Tanaka, H. Kumigashira, T. Yokoya, T. Takahashi

    Proc. 6th Int. Conf. Quasicrystals　595-598　1998/12

  259. Electron energy-loss spectroscopy of the electronic structure of boron nitride nanotubes Peer-reviewed

    寺内 正己

    J. Electron Microsc.　74　(4)　311　1998/04

  260. Electron energy-loss spectroscopy study of the metal-insulator transition in V2O3 Peer-reviewed

    H Abe, M Terauchi, M Tanaka, S Shin

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　37　(2)　584-588　1998/02

    ISSN： 0021-4922

  261. 収束電子回折法による積層欠陥の構造の研究

    坂本 敦, 寺内 正己, 田中 通義

    日本結晶学会誌　40　138-138　1998

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.40.Supplement_138 　

    ISSN： 0369-4585

  262. 収束電子回折法による複合結晶Sr14Cu24O41の対称性の研究

    寺内 正己, 田中 通義, 後藤 義人, 秋光 純

    日本結晶学会誌　40　196-196　1998

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.40.Supplement_196 　

    ISSN： 0369-4585

  263. C60モノマー・ダイマー・ポリマーの電子エネルバー損失分光

    西村 晋一, 寺内 正己, 田中 通義, 岩佐 義宏, 田上 究, 八木 健彦

    日本結晶学会誌　40　155-155　1998

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.40.Supplement_155 　

    ISSN： 0369-4585

  264. Electron-energy-loss spectroscopy study of a stable decagonal quasicrystal Al70Ni20Rh10 Peer-reviewed

    Masami Terauchi, Hiroshi Ueda, Michiyoshi Tanaka, An-Pang Tsai, Akihisa Inoue, Tsuyoshi Masumoto

    Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties　77　(6)　1625-1632　1998

    DOI： 10.1080/13642819808206409 　

    ISSN： 1364-2812

  265. Structures of polytypoids in AIN crystals containing oxygen Peer-reviewed

    Yanfa Yan, Masami Terauchi, Michiyoshi Tanaka

    Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties　77　(4)　1027-1040　1998

    DOI： 10.1080/01418619808221226 　

    ISSN： 0141-8610

  266. Construction and preliminary test of a new energy filtering TEM "JEM-2010FEF" Peer-reviewed

    T Kaneyama, K Tsuno, T Honda, M Kersker, K Tsuda, M Terauchi, M Tanaka

    ELECTRON MICROSCOPY 1998, VOL 1　235-236　1998

  267. Design of an Omega filter for 200 kV TEM Peer-reviewed

    K Tsuno, T Kaneyama, T Honda, Y Ishida, K Tsuda, M Terauchi, M Tanaka

    ELECTRON MICROSCOPY 1998, VOL 1　253-254　1998

  268. Performance of a new Omega-filter electron microscope on convergent-beam electron diffraction Peer-reviewed

    K Tsuda, K Saitoh, M Terauchi, M Tanaka, T Kaneyama, K Tsuno, T Honda

    ELECTRON MICROSCOPY 1998, VOL 1　251-252　1998

  269. Electron energy-loss spectroscopy study of the electronic structure of boron nitride nanotubes Peer-reviewed

    M Terauchi, M Tanaka, T Matsumoto, Y Saito

    JOURNAL OF ELECTRON MICROSCOPY　47　(4)　319-324　1998

    ISSN： 0022-0744

  270. High energy-resolution EELS study of the electronic structure of boron-nitride nanotubes Peer-reviewed

    M Terauchi, M Tanaka, T Matsumoto, Y Saito

    ELECTRON MICROSCOPY 1998, VOL 3　125-126　1998

  271. Progress in Convergent-Beam Electron Diffraction Technique

    TERAUCHI Masami

    X-RAYS　39　(3)　239-247　1997/06/28

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.39.239 　

    ISSN： 0369-4585

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    Four symmetries, which are needed for the determination of a diffraction group by convergent-beam electron diffraction (CBED), were obtained from one selected-area CBED pattern. An inversion symmetry and a four-fold inversion symmetry were observed by selectedarea CBED technique. Coherent CBED patterns show the phase information of crystal structure factors. The phase relations between crystal structure factors for a non-mirror symmetry, a mirror symmetry and a glide symmetry were observed by coherent CBED.

  272. High-resolution EELS study of carbon and boron allotropes Peer-reviewed

    寺内 正己

    J. Surface Amalysis　3　(2)　240-247　1997/04

  273. 収束電子回折法による結晶構造解析用ソフトウェアの開発

    津田 健治, 斎藤 晃, 寺内 正己, 田中 通義

    日本結晶学会誌　39　180-180　1997

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.39.Supplement_180 　

    ISSN： 0369-4585

  274. 構造解析用エネルギーフィルター電子顕微鏡

    寺内 正己, 津田 健治, 斎藤 晃, 田中 通義, 金山 俊克, 津野 勝重, 本田 敏和

    日本結晶学会誌　39　179-179　1997

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.39.Supplement_179 　

    ISSN： 0369-4585

  275. 特別推進研究による構造解析用エネルギーフィルター電子顕微鏡の開発と結晶構造解析への応用

    田中 通義, 津田 健治, 斎藤 晃, 寺内 正己, 金山 俊克, 津野 勝重, 本田 敏和

    日本結晶学会誌　39　178-178　1997

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.39.Supplement_178 　

    ISSN： 0369-4585

  276. 収束電子回折法によるデカゴナル準結晶の構造解析

    齋藤 晃, 津田 健治, 寺内 正己, 田中 通義, 蔡 安邦

    日本結晶学会誌　39　181-181　1997

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.39.Supplement_181 　

    ISSN： 0369-4585

  277. The structures of inversion domain boundaries in AIN ceramics Peer-reviewed

    Yanfa Yan, Masami Terauchi, Michiyoshi Tanaka

    Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties　75　(4)　1005-1022　1997

    DOI： 10.1080/01418619708214007 　

    ISSN： 0141-8610

  278. Design and testing of Omega mode imaging energy filters at 200 kV Peer-reviewed

    K Tsuno, T Kaneyama, T Honda, K Tsuda, M Terauchi, M Tanaka

    JOURNAL OF ELECTRON MICROSCOPY　46　(5)　357-368　1997

    ISSN： 0022-0744

  279. Electron energy-loss spectroscopy study of the metal-insulator transition in VO2 Peer-reviewed

    H Abe, M Terauchi, M Tanaka, S Shin, Y Ueda

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　36　(1A)　165-169　1997/01

    ISSN： 0021-4922

  280. Electron-energy-loss spectroscopy study of the electronic structure of a stable quasicrystal Al65Cu20Ru15 Peer-reviewed

    M Terauchi, M Tanaka, AP Tsai, A Inoue, T Masumoto

    PHILOSOPHICAL MAGAZINE LETTERS　74　(2)　107-112　1996/08

    ISSN： 0950-0839

  281. ELECTRON-ENERGY-LOSS SPECTROSCOPY STUDY OF C-76 Peer-reviewed

    R KUZUO, M TERAUCHI, M TANAKA, Y SAITO, Y ACHIBA

    PHYSICAL REVIEW B　51　(16)　11018-11021　1995/04

    ISSN： 2469-9950

    eISSN： 2469-9969

  282. Performance of a New High-Resolution Electron Energy-Loss Spectroscopy Microscope.

    Terauchi Masami, Kuzuo Ryuichi, Tanaka Michiyoshi

    Butsuri　50　(7)　566-569　1995

    Publisher: The Physical Society of Japan

    DOI： 10.11316/butsuri1946.50.566 　

    ISSN： 0029-0181

  283. Electron-energy-loss spectroscopy of oxide superconductor bÍ2sr2cacu208 Peer-reviewed

    Masami Terauchi, Michiyoshi Tanaka, Takashi Takahashi, Hiroshi Katayama-Yoshida, Takashi Mochiku, Kazuo Kadowaki

    Japanese Journal of Applied Physics　34　(11)　L1524-L1527　1995

    DOI： 10.1143/JJAP.34.L1524 　

    ISSN： 1347-4065 0021-4922

  284. OBSERVATION OF FOURFOLD ROTOINVERSION SYMMETRY BY CONVERGENT-BEAM ELECTRON-DIFFRACTION Peer-reviewed

    M TANAKA, M TERAUCHI, F SATO

    ULTRAMICROSCOPY　55　(3)　241-246　1994/09

    ISSN： 0304-3991

  285. ELECTRON-ENERGY-LOSS SPECTRA OF SINGLE-SHELL CARBON NANOTUBES Peer-reviewed

    R KUZUO, M TERAUCHI, M TANAKA, Y SAITO

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS　33　(9B)　L1316-L1319　1994/09

    ISSN： 0021-4922

  286. Electron Diffraction Study of an Inorganic Spin-Peierls System CuGeO3

    Kamimura Osamu, Terauchi Masami, Tanaka Michiyoshi, Fujita Osamu, Akimitsu Jun

    J Phys Soc Jpn　63　(7)　2467-2471　1994/07/15

    Publisher: The Physical Society of Japan (JPS)

    DOI： 10.1143/JPSJ.63.2467 　

    ISSN： 0031-9015

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    An electron diffraction study of an inorganic spin-Peierls system CuGeO3 was performed. Weak superlattice reflections indexed by (h/2)k(l/2)(h, k, l: odd) are observed in electron diffraction patterns taken at about 10 K with the [100] electron incidence. The reflections are interpreted as characteristic of a superlattice structure of the space group Bbcm or Bbmm with cell dimensions $a'\simeq 2a$, $b'\simeq b$ and $c'\simeq 2c$ and with dimerization of Cu atoms along the quasi-one-dimensional [001] or the [010] direction, which is strong evidence of the spin-Peierls transition. Strong diffuse streaks which run along the c*-direction through the fundamental reflections are observed at the same temperature. The streaks are attributed to low-frequency transverse acoustic waves of the oxygen octahedra and can be precursors to another phase transformation below the spin-Peierls transition.

  287. OBSERVATION OF LATTICE FRINGES IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS Peer-reviewed

    M TERAUCHI, K TSUDA, O KAMIMURA, M TANAKA, T KANEYAMA, T HONDA

    ULTRAMICROSCOPY　54　(2-4)　268-275　1994/06

    ISSN： 0304-3991

  288. コヒーレント収束電子回折法による結晶構造因子の位相検出

    津田 健治, 寺内 正己, 田中 通義, 金山 俊克, 本田 敏和

    日本結晶学会誌　36　46-46　1994

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.36.Supplement_46 　

    ISSN： 0369-4585

  289. Observation of coherent CBED patterns from small lattice spacings and stacking faults Peer-reviewed

    K TSUDA, M TERAUCHI, M TANAKA, T KANEYAMA, T HONDA

    ELECTRON MICROSCOPY 1994, VOL 1　865-866　1994

  290. High-resolution electron energy-loss study of solid C-60, C-70, C-84 and carbon nanotubes Peer-reviewed

    M TERAUCHI, R KUZUO, M TANAKA, K TSUNO, Y SAITO, H SHINOHARA

    ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B　333-334　1994

  291. Line defect configuration incorporated with self-interstitials in Si: A combined study by HRTEM, EELS and electronic calculation Peer-reviewed

    S TAKEDA, M TERAUCHI, M TANAKA, M KOHYAMA

    ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B　567-568　1994

  292. HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTRA OF SOLID C60, C70 AND CARBON NANOTUBES Peer-reviewed

    R KUZUO, M TERAUCHI, M TANAKA, Y SAITO, H SHINOHARA

    ADVANCED MATERIALS '93, I - A & B　14　(A & B)　1119-1122　1994

  293. CONVERGENT-BEAM ELECTRON-DIFFRACTION STUDY OF INCOMMENSURATELY MODULATED CRYSTALS .1. (3+1)-DIMENSIONAL POINT GROUPS Peer-reviewed

    M TERAUCHI, M TANAKA

    ACTA CRYSTALLOGRAPHICA SECTION A　49　722-729　1993/09

    ISSN： 0108-7673

  294. ELECTRON-MICROSCOPE STUDY OF DECAGONAL QUASI-CRYSTALS OF AL70NI15FE15 Peer-reviewed

    K TSUDA, M SAITO, M TERAUCHI, M TANAKA, AP TSAI, A INOUE, T MASUMOTO

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS　32　(1A)　129-134　1993/01

    ISSN： 0021-4922

  295. Temperature dependence of the volume-plasmon energy in aluminum

    Hiroyuki Abe, Masami Terauchi, Ryuichi Kuzuo, Michiyoshi Tanaka

    Journal of Electron Microscopy　41　(6)　465-468　1992/12

    ISSN： 0022-0744

  296. Space-group Determination of Incommensurately-modvlated Structures by convergent-beam Electron Diffraction Peer-reviewed

    寺内 正己

    Journal of the Crystallographic Society of Japan　34　(1)　11-18　1992/04

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.34.11 　

    ISSN： 0369-4585

    More details Close

    The interrelation between the symmetries of CBED patterns and symmetry symbols for incommensurately-modulated structures given by de Wolff, Jannsen and Janner are clarified. 1) Point groups; The symmetry symbol 1 shows no symmetry in CBED patterns. The symbols other than 1 show the symmetries of the corresponding symbols for the average structure. 2) Space groups; The four dimensional glide planes and screw axes give dynamical extinction in the kinematically forbidden reflections due to the symmetry elements. Dynamical extinction rules in CBED patterns were tabulated for one example of the four dimensional space groups.

  297. Electron energy-loss spectra of carbon nanotubes Peer-reviewed

    Ryuichi Kuzuo, Masami Terauchi, Michiyoshi Tanaka

    Japanese Journal of Applied Physics　31　(10)　L484-L1487　1992

    DOI： 10.1143/JJAP.31.L1484 　

    ISSN： 1347-4065 0021-4922

  298. Identification of Lattice Defects by Convergent-Beam Electron Diffraction Peer-reviewed

    寺内 正己

    J. Electron Microsc.　40　(4)　p211-220　1991/04

    Publisher:

    ISSN： 0022-0744

  299. PERFORMANCE OF A NEW HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPY MICROSCOPE Peer-reviewed

    M TERAUCHI, R KUZUO, F SATOH, M TANAKA, K TSUNO, J OHYAMA

    MICROSCOPY MICROANALYSIS MICROSTRUCTURES　2　(2-3)　351-358　1991/04

    ISSN： 1154-2799

  300. 収束電子回折法によるインコメンシュレート複合結晶BaxFe2S4の超空間群の決定

    寺内 正己, 田中 通義, 小野田 みつ子

    日本結晶学会誌　33　85-85　1991

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.33.Supplement_85 　

    ISSN： 0369-4585

  301. 高分解能エネルギー分析電子顕微鏡の開発

    寺内 正己, 葛尾 竜一, 田中 通義, 津野 勝重, 大山 純一

    日本結晶学会誌　33　89-89　1991

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.33.Supplement_89 　

    ISSN： 0369-4585

  302. High-resolution electron energy-loss spectra of solid c60 Peer-reviewed

    Ryuichi Kuzuo, Masami Terauchi, Michiyoshi Tanaka, Yahachi Saito, Hisanori Shinohara

    Japanese Journal of Applied Physics　30　(10B)　L1817-1818　1991

    DOI： 10.1143/JJAP.30.L1817 　

    ISSN： 1347-4065 0021-4922

  303. DESIGN AND PERFORMANCE OF A RETARDING WIEN FILTER INSTALLED IN A TEM FOR EELS Peer-reviewed

    K TSUNO, M TERAUCHI, M TANAKA

    EMAG-MICRO 89, VOLS 1 AND 2　98　71-74　1990

  304. DESIGN AND PERFORMANCE OF A RETARDING WIEN FILTER INSTALLED IN A TEM FOR EELS Peer-reviewed

    K TSUNO, M TERAUCHI, M TANAKA

    INSTITUTE OF PHYSICS CONFERENCE SERIES　(98)　71-74　1990

    ISSN： 0951-3248

  305. ELECTRON TRAJECTORY CALCULATION OF A STIGMATIC-FOCUS WIEN FILTER FOR ELECTRON-ENERGY LOSS SPECTROSCOPY-III Peer-reviewed

    K TSUNO, M TERAUCHI, M TANAKA

    OPTIK　83　(3)　77-84　1989/10

    ISSN： 0030-4026

  306. On the Dynamical Extinction dve to a Horizontal diamond Glide Plane Peer-reviewed

    寺内 正己

    Ultramicroscopy　27　1989/04

  307. 4次元空間群と収束電子回折図形の対称性

    寺内 正己, 田中 通義

    日本結晶学会誌　31　PB-33-PB-33　1989

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.31.Supplement_PB-33 　

    ISSN： 0369-4585

  308. ELECTRON TRAJECTORY CALCULATION OF A STIGMATIC-FOCUS WIEN FILTER FOR ELECTRON-ENERGY LOSS SPECTROSCOPY .2. Peer-reviewed

    K TSUNO, M TERAUCHI, M TANAKA

    OPTIK　80　(4)　149-154　1988/11

    ISSN： 0030-4026

  309. ELECTRON TRAJECTORY CALCULATION OF A STIGMATIC-FOCUS WIEN FILTER FOR ELECTRON-ENERGY LOSS SPECTROSCOPY .1. Peer-reviewed

    K TSUNO, M TERAUCHI, M TANAKA

    OPTIK　78　(2)　71-77　1988/01

    ISSN： 0030-4026

  310. ELECTRON-DIFFRACTION STUDY OF BA2YCU3O7-Y(Y=0.1-0.2) Peer-reviewed

    M TANAKA, M TERAUCHI, K TSUDA, A ONO

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS　26　(7)　L1237-L1239　1987/07

    ISSN： 0021-4922

  311. OBSERVATION OF DYNAMIC EXTINCTION DUE TO A GLIDE PLANE PERPENDICULAR TO AN INCIDENT BEAM BY CONVERGENT-BEAM ELECTRON-DIFFRACTION Peer-reviewed

    M TANAKA, M TERAUCHI, H SEKII

    ULTRAMICROSCOPY　21　(3)　245-250　1987

    ISSN： 0304-3991

  312. 大角度収束電子回折における多波回折図形の同時観察法

    寺内 正己, 田中 通義

    日本結晶学会誌　27　1839-1839　1985

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.27.Supplement_1839 　

    ISSN： 0369-4585

  313. 収束電子回折による正20面体対称をもつ準結晶の構造の研究

    田中 通義, 寺内 正己, 平賀 覧二, 平林 真

    日本結晶学会誌　27　1842-1842　1985

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.27.Supplement_1842 　

    ISSN： 0369-4585

  314. 収束電子回折によるSrTiO3の低温相の空間群の研究

    田中 通義, 寺内 正己

    日本結晶学会誌　27　1840-1840　1985

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.27.Supplement_1840 　

    ISSN： 0369-4585

  315. Simultaneous observation of bright-and dark-field large-angle convergent-beam electron diffraction patterns Peer-reviewed

    Masami Terauchi, Michiyoshi Tanaka

    Microscopy　34　(2)　128-135　1985

    DOI： 10.1093/oxfordjournals.jmicro.a050502 　

    ISSN： 2050-5701 2050-5698

  316. SIMULTANEOUS OBSERVATION OF ZONE-AXIS PATTERN AND +/-G-DARK-FIELD PATTERN IN CONVERGENT-BEAM ELECTRON-DIFFRACTION Peer-reviewed

    M TERAUCHI, M TANAKA

    JOURNAL OF ELECTRON MICROSCOPY　34　(4)　347-356　1985

    ISSN： 0022-0744

  317. CONVERGENT-BEAM AND SMALL-AREA PARALLEL-BEAM ELECTRON-DIFFRACTION OF ICOSAHEDRAL QUASI-CRYSTALS OF A MELT-QUENCHED AL-MN ALLOY Peer-reviewed

    M TANAKA, M TERAUCHI, K HIRAGA, M HIRABAYASHI

    ULTRAMICROSCOPY　17　(4)　279-285　1985

    ISSN： 0304-3991

  318. CONVERGENT-BEAM AND SMALL-AREA PARALLEL-BEAM ELECTRON-DIFFRACTION OF ICOSAHEDRAL QUASI-CRYSTALS OF A MELT-QUENCHED AL-MN ALLOY Peer-reviewed

    M TANAKA, M TERAUCHI, K HIRAGA, M HIRABAYASHI

    ULTRAMICROSCOPY　17　(4)　279-285　1985

    DOI： 10.1107/S010876818709743X 　

    ISSN： 0304-3991

  319. Hollow-Cone Beamによる収束電子回折図形とその解釈

    田中 通義, 高吉 浩人, 寺内 正己, 近藤 行人, 植野 勝義, 原田 嘉晏

    日本結晶学会誌　25　16A-9-16A-9　1983

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.25.Supplement_16A-9 　

    ISSN： 0369-4585

Show all ︎Show first 5

Misc. 294

  1. Synthesis of Mg-B compound by flux method and their electronic structures studied by microscopic SXES

    羽田有希, 斎藤興也, 佐藤庸平, 寺内正己, 池田颯, 齊藤大貴, 馬場奨亮, 武田雅敏

    日本物理学会講演概要集(CD-ROM)　78　(1)　2023

    ISSN： 2189-079X

  2. Total electronic structure analysis realized with soft X-rays Invited

    Research Features Magazine　141　10-13　2022/05

  3. Fine structures of Fe L-emission examined by a new HR-SXES instrument Peer-reviewed

    Masami Terauchi, Ryogo Ebisu, Yohei Sato, Masato Koike

    Microscopy and Microanalysis　27　(S1)　1370-1371　2021/08

    Publisher: Cambridge University Press (CUP)

    DOI： 10.1017/s1431927621005109 　

    ISSN： 1431-9276

    eISSN： 1435-8115

  4. 顕微軟X線発光分光法を用いた固体の化学結合状態分析 Invited Peer-reviewed

    寺内正己, 佐藤庸平, 武田雅敏

    まてりあ　20　(6)　341-346　2021/06

  5. Design, prototyping, and evaluation of soft X-ray high diffraction efficiency and wide acceptance angle laminar-type W/C multilayer diffraction grating for 200–900 eV range Peer-reviewed

    Tadashi HATANO, Masato KOIKE, Alexander S. PIROZHKOV, Nobukazu HAYASHI, Tsubasa KAKIO, Tetsuya NAGANO, Masami TERAUCHI

    Photon Factory Activity Report　39　90-1-90-3　2021

  6. Design and preliminary fabrication and evaluation of small incidente angle and high diffraction efficiency laminar-type diffraction grating optimized for the state analysis at the vicinity of Li-K emission Peer-reviewed

    Masato KOIKE, Tadashi HATANO, Alexander S. PIROZHKOV, Nobukazu HAYASHI, Tsubasa KAKIO, Tetsuya NAGANO, Masami TERAUCHI

    39　89-1-89-3　2021

  7. 電子エネルギー損失分光法による材料誘電特性解析の基礎と応用 Invited Peer-reviewed

    佐藤庸平, 寺内正己

    顕微鏡　55　(2)　75-82　2020/09

  8. Synthesis, crystal structure and physical properties of lithium ion conductor LiTa2PO8

    石垣範和, 片岡邦光, 森川大輔, 寺内正巳, 早水紀久子, 秋本順二

    電気化学会大会講演要旨集(CD-ROM)　87th　2020

  9. Information of Valence Charge of 3d Transition Metal Elements Observed in L-Emission Spectra

    Masami Terauchi

    Microscopy and Microanalysis　25　(S2)　248-249　2019/08

    Publisher: Cambridge University Press (CUP)

    DOI： 10.1017/s1431927619001971 　

    ISSN： 1431-9276

    eISSN： 1435-8115

  10. Chemical State Mapping of Amorphous Carbon Films by Soft X-ray Emission Spectroscopy Invited

    Masami Terauchi, Yohei Sato

    Microscopy and Microanalysis　25　(S2)　1754-1755　2019/08

    Publisher: Cambridge University Press (CUP)

    DOI： 10.1017/s1431927619009504 　

    ISSN： 1431-9276

    eISSN： 1435-8115

  11. Diffraction Efficiency Measurements of Laminar-Type Diffraction Gratings Overcoated with Lanthanum Series Layers for Boron-K Emission Spectroscopy

    Tadashi HATANO, Masato KOIKE, Masami TERAUCHI, Alexander S. PIROZHKOV, Nobukazu HAYASHI, Hiroyuki SASAI, Tetsuya NAGANO

    Photon Factory Activity Report 2018 #36　36　82-1-82-3　2019/07

  12. 可視光‐運動エネルギー変換能を有するアモルファス窒化炭素薄膜

    青野祐美, 原田人萌, 寺内正己

    ニューダイヤモンド　133　(2)　30-33　2019/04

  13. 軟X線発光分光の基礎とその応用 Invited Peer-reviewed

    寺内正己

    日本結晶学会誌　61　(1)　2-6　2019/02

  14. 電子顕微鏡―軟X線発光分光法による電子状態解析 Invited Peer-reviewed

    寺内正己

    セラミックス　54　(2)　81-84　2019/02

  15. 軟X線発光分光を用いた熱電材料MB6(M=Ca,Sr)の研究

    寺内正己, 佐藤庸平, 武田雅敏

    日本物理学会講演概要集(CD-ROM)　74　(2)　2019

    ISSN： 2189-079X

  16. Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES

    M. Terauchi, Y. Sato, M. Takeda, T. Hatano, M. Koike, H. Sasai, T. Nagano, M. Koeda, T. Murano, H. Takahashi

    Microscopy & Microanalysis　24　(suppl.1)　746-747　2018/08

  17. Chemical State Analyses by Soft X-ray Emission Spectroscopy

    M. Terauchi, Y. Sato

    JEOL NEWS　53　(1)　30-35　2018/08

  18. 軟X線発光分光（SXES）を用いた化学結合状態分析 Invited

    寺内正己, 佐藤庸平

    日本電子news　50　(1)　13-18　2018/05

  19. 軟X線発光分光による熱電材料CaB6の研究

    寺内正己, 佐藤庸平, 武田雅敏

    日本物理学会講演概要集(CD-ROM)　73　(2)　2018

    ISSN： 2189-079X

  20. TEM-EELS/XESを用いたMgB4電子構造の研究

    佐藤庸平, 齋藤泰樹, 土谷公平, 寺内正己, 齋藤広樹, 武田雅敏

    東北大学多元物質科学研究所研究発表会講演予稿集　16th　2016

  21. Chemical State Analysis with Soft-X-ray Emission Spectroscopy Based on SEM

    寺内正己, 今園孝志, 小池雅人

    表面科学　36　(4)　184-188　2015/04

    DOI： 10.1380/jsssj.36.184 　

    More details Close

    1410

  22. Characteristic Features and Application of a Newly Developed Wavelength Dispersive Soft X-ray Emission Spectrometer for Electron Probe Microanalyzers and Scanning Electron Microscopes

    H. Takahashi, T. Murano, M. Takakura, N. Handa, M.Terauchi, M. Koike, T. Kawachi, T. Imazono, N. Hasegawa, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

    JEOL News　49　73-80　2014/09

  23. キーマテリアルの高分解能顕微状態分析技術の開発

    寺内正己

    Isotope News　722　2-7　2014/06

  24. 高分解能EELSによる六方晶ダイヤモンド粒子の誘電特性

    佐藤庸平, 寺内正己, 居波渉, 吉朝朗

    ニューダイヤモンド　30　(2)　6-10　2014/04

    Publisher: オーム社

    ISSN： 1340-4792

  25. 高分解能EELSによる六方晶ダイヤモンド粒子の誘電特性

    佐藤庸平, 寺内正己, 居波渉, 吉朝朗

    日本結晶学会誌　55　(5)　302-307　2013/10

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.55.302 　

    ISSN： 0369-4585

    More details Close

    Electronic structure of hexagonal diamond（h-DIA）was investigated by using high energyresolution electron energy-loss spectroscopy（EELS）based on transmission electron microscopy. The dielectric function of h-DIA was derived by Kramers-Kronig analysis of the EELS spectrum. Core electron excitation spectrum of h-DIA revealed density of states in conduction band,which was different distribution from that of cubic diamond. The electronic structure of h-DIA was experimentally revealed for the first time.

  26. Development and Applications of a New Soft X-ray Emission Spectrometer for Electron Probe Microanalysis and/or Nanoanalysis

    H. Takahashi, N. Handa, T. Murano, M. Koike, T. Kawachi, T. Imazono, N. Hasegawa, M. Terauchi, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto

    JAEA-Conf　(2013-001)　13-15　2013/09

  27. 広帯域軟X 線発光分光システムの開発

    寺内正己, 高橋秀之, 飯田信雄, 村野孝訓, 小池雅人, 河内哲哉, 今園孝志, 長谷川登, 小枝勝, 長野哲也, 笹井浩行, 大上裕紀, 米澤善央, 倉本智史

    JAEA-Conf　(2013-001)　77-80　2013/09

  28. 新WDS装置を用いた軟X線発光分光による価電子状態分析

    寺内正己, 高橋秀之, 飯田信雄, 村野孝訓, 小池雅人, 河内哲哉, 今園孝志, 小枝 勝, 長野哲也, 笹井浩行, 大上裕紀, 米澤善央, 倉本智史

    日本電子ニュース　(44)　11-16　2012/10

  29. 新しい波長分散型軟X線発光分光器を搭載した電子プローブマイクロアナライザによる元素分析および元素の状態分析

    高橋秀之, 飯田信雄, 村野孝訓, 寺内正己, 小池雅人, 河内哲哉, 今園孝志, 小枝 勝, 長野哲也, 笹井浩行, 大上裕紀, 米澤善央, 倉本智史

    日本電子ニュース　(44)　50-54　2012/10

  30. A New WDS Spectrometer for Valence Electron Spectroscopy Based on Electron Microscopy

    Masami Terauchi, Hideyuki Takahashi, Nobuo Handa, Takanori Murano, Masato Koike, Tetsuya Kawachi, Takashi Imazono, Masaru Koeda, Tetsuya,Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto

    JEOL News　(47)　23-28　2012/07

  31. 21aTD-1 TEM-EELS study of electronic structures of 3D-C_<60> polymer

    Sato Y., Terauchi M., Yamanaka S.

    Meeting abstracts of the Physical Society of Japan　66　(2)　833-833　2011/08/24

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  32. 22pGD-6 Characteristic chemical shifts and charge transfer estimation of Zn-Mg-Zr alloys by using EELS and SXGS II

    Koshiya S., Terauchi M., Ohhashi S., Tsai P.

    Meeting abstracts of the Physical Society of Japan　66　(2)　810-810　2011/08/24

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  33. 21aJA-4 New development of a wide-band SXES instrument for electron microscopy III

    Terauchi M., Takahashi H., Handa N., Murano T., Koike M., Kawachi T., Imazono T., Hasegawa N., Koeda M., Nagano T, Sasai H., Oue Y., Yonezawa Z., Kuramoto S.

    Meeting abstracts of the Physical Society of Japan　66　(2)　969-969　2011/08/24

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  34. 21aJA-2 Study on symmetries of rocking X-ray incoherent channeling patterns

    Terauchi M., Igusa R., Tsuda K.

    Meeting abstracts of the Physical Society of Japan　66　(2)　968-968　2011/08/24

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  35. 21aJA-6 HR-EELS study of electronic structure of Cs doped WO_3

    Sato M., Terauchi M., Adachi K.

    Meeting abstracts of the Physical Society of Japan　66　(2)　969-969　2011/08/24

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  36. 24aTG-5 TEM/EELS studies of polyynes inside SWCNT

    Haque Md. Mahbubul, Sato Yohei, Terauchi Masami, Wakabayashi Tomonari

    Meeting abstracts of the Physical Society of Japan　66　(2)　893-893　2011/08/24

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  37. 電子顕微鏡を用いた価電子（結合電子）状態分析技術の開発

    寺内正己

    顕微鏡　46　(2)　105-110　2011/06

  38. 電子プローブを用いた構造・物性解析手法の開発と応用

    寺内正己

    Materials Integration　24　(4-5)　208-211　2011/04

  39. 26pEH-8 Characteristic chemical shifts and charge transfer estimation of Zn-Mg-Zr alloys by using EELS and SXES

    Koshiya S., Terauchi M., Ohhashi S., Tsai A. P.

    Meeting abstracts of the Physical Society of Japan　66　(1)　827-827　2011/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  40. 27pTN-9 The study of NIR absorption mechanism of Cs_xWO_3 nanoparticles by HR-EELS

    Sato Y., Terauchi M., Adachi K.

    Meeting abstracts of the Physical Society of Japan　66　(1)　986-986　2011/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  41. 27pTN-6 New development of a wide-band SXES instrument for electron microscopy II

    Terauchi M., Takahashi H., Handa N., Murano T., Koike M., Kawachi T., Imazono T., Koeda M., Nagano T., Sasai H., Oue Y., Yonezawa Z., Kuramoto S.

    Meeting abstracts of the Physical Society of Japan　66　(1)　986-986　2011/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  42. 合金触媒の薄膜試料作製法と透過型電子顕微鏡観察

    田邊豊和, 寺内正己

    触媒　53　(1)　14-18　2011/01

  43. 25pWZ-7 New development of a wide-band SXES instrument for electron microscopy

    Terauchi M., Takahashi H., Handa N., Murano T., Koike M., Kawachi T., Imazono T., Koeda M., Nagano T., Sasai H., Oue Y., Yonezawa Z., Kuramoto S.

    Meeting abstracts of the Physical Society of Japan　65　(2)　921-921　2010/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  44. 25pWZ-6 High energy-resorution EELS study of electronic structures of Cs_xWO_3

    Funao T., Sato Y., Terauchi M., Adachi K.

    Meeting abstracts of the Physical Society of Japan　65　(2)　921-921　2010/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  45. 25pWZ-8 Angle-resolved soft-X-ray emission spectroscopy of anisotropic structured material based on transmission electron microscopy III

    Terauchi Masami, Sato Yohei

    Meeting abstracts of the Physical Society of Japan　65　(2)　922-922　2010/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  46. Evaluation of optical and structural properties of Co based soft x-ray multilayer gratings

    M.Ishino, M.Koike, F.Satou, M.Terauchi, K.Sano, H.Sasai

    Memoirs of the SR center, Ritsumeikan University　12　75-85　2010/08

  47. ナノスケール軟X線発光分光装置の角度分解SXES計測への適用

    寺内正己, 小池雅人

    JAEA-Conf　2010　(2)　71-74　2010/06

  48. 21aHS-9 Angle-resolved soft-X-ray emission spectroscopy of anisotropic structured material based on transmission electron microscopy II

    Terauchi Masami, Sato Yohei

    Meeting abstracts of the Physical Society of Japan　65　(1)　982-982　2010/03/01

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  49. 22pGR-8 High energy-resolution EELS study of the electronic structure of MgB_4 II

    Tsuchiya K., Sato Y., Terauchi M., Saito H., Takeda M.

    Meeting abstracts of the Physical Society of Japan　65　(1)　897-897　2010/03/01

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  50. 22pGR-13 Superconductivity in Li-doped α-Rhombohedral Boron

    Nagatochi T., Hyodo H., Soga K., Sato Y., Terauchi M., Esaka F., Kimura K.

    Meeting abstracts of the Physical Society of Japan　65　(1)　898-898　2010/03/01

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  51. 20pGS-2 High energy-resolution EELS study of excitonic effect of carbon nanotubes

    Sato Y., Terauchi M., Saito Y.

    Meeting abstracts of the Physical Society of Japan　65　(1)　857-857　2010/03/01

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  52. 21pHY-5 HR-EELS studies of Zn-Mg-Zr alloys

    Koshiya S., Terauchi M., Ohhashi S., Tsai A. P.

    Meeting abstracts of the Physical Society of Japan　65　(1)　833-833　2010/03/01

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  53. Co/SiO2多層膜回折格子の構造と光学特性評価

    石野雅彦, 佐藤二美, 寺内正己, 佐野一雄, 笹井一雄, 小池雅人

    JAEA-Conf　2009　(7)　65-68　2010/03

  54. 26pYD-9 TEM-EELS study of electronic structure of Li doped α-r-boron

    Sato Y., Terauchi M., Hyodo H., Soga K., Kimura K.

    Meeting abstracts of the Physical Society of Japan　64　(2)　763-763　2009/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  55. 25pYE-4 TEM-SXES study of electronic structures of polymerized C60 single grystals

    Terauchi M., Tsuchiya K., Kini N. S., Yamanaka S.

    Meeting abstracts of the Physical Society of Japan　64　(2)　742-742　2009/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  56. 26pYD-11 High energy-resolution EELS study of the electronic structure of MgB_4

    Tsuchiya K., Sato Y., Terauchi M., Saito H., Takeda M.

    Meeting abstracts of the Physical Society of Japan　64　(2)　763-763　2009/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  57. 26aYK-10 HR-EELS study of a magnetic transition of NnPd alloy

    Koshiya S., Terauchi M., Umetsu R. Y., Kainuma R., Fukamichi K.

    Meeting abstracts of the Physical Society of Japan　64　(2)　869-869　2009/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  58. 26aYK-9 TEM-EELS study of near infrared absorption materials

    Sato Y., Terauchi M., Adachi K.

    Meeting abstracts of the Physical Society of Japan　64　(2)　869-869　2009/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  59. 26aYK-12 Angle-resolved soft-X-ray emission spectroscopy of anisotropic structured material based on transmission electron microscopy

    Terauchi Masami

    Meeting abstracts of the Physical Society of Japan　64　(2)　870-870　2009/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  60. 25pYB-8 HR-EELS and SXES spectroscopy studies of Al-TM alloys

    Koshiya S., Terauchi M., Tsai A. P.

    Meeting abstracts of the Physical Society of Japan　64　(2)　695-695　2009/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  61. 27pRE-7 Study of electric structure of hexagonal diamond using monochromator electron microscope

    Sato Y., Terauchi M., Yoshiasa A.

    Meeting abstracts of the Physical Society of Japan　64　(1)　939-939　2009/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  62. 27pYK-4 Electron-beam spectroscopy studies of Al-Si-Mn alloys

    Koshiya S., Terauchi M., Tsai A. P.

    Meeting abstracts of the Physical Society of Japan　64　(1)　774-774　2009/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  63. 27aYH-2 TEM-XES studies of electronic structures of zeolite templated carbon II

    Terauchi M., Nishihara H., Kyotani T.

    Meeting abstracts of the Physical Society of Japan　64　(1)　811-811　2009/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  64. 高分解能EELSを用いたLaB6微粒子の近赤外吸収の研究

    佐藤庸平, 寺内正己, 向井雅貴, 金山俊克, 足立健治

    まてりあ　48　(12)　634-634　2009

    Publisher: The Japan Institute of Metals and Materials

    DOI： 10.2320/materia.48.634 　

    ISSN： 1340-2625

  65. 20aTA-3 TEM-XES studies of electronic structures of zeolite templated carbon

    Terauchi M., Nishihara H., Kyotani T.

    Meeting abstracts of the Physical Society of Japan　63　(2)　726-726　2008/08/25

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  66. 21pYJ-3 High energy-resolution EELS studies of pseudo-gap structures of Al-TM alloys

    Koshiya S., Terauchi M., Tsai A. P., Takagiwa Y., Kimura K.

    Meeting abstracts of the Physical Society of Japan　63　(2)　705-705　2008/08/25

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  67. 21pWA-4 Derivation of dielectric function of LaB_6 by Kramers-Kronig analysis of EELS spectrum

    Sato Y., Terauchi M., Adachi K.

    Meeting abstracts of the Physical Society of Japan　63　(2)　880-880　2008/08/25

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  68. 21pWA-5 TEM-XES studies of transition intensities from the valence band to 3d core-hole of lanthanide oxides

    Yoneda Y., Terauchi M.

    Meeting abstracts of the Physical Society of Japan　63　(2)　881-881　2008/08/25

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  69. 26aYF-5 Radiative surface plasmon study of silicon nanowires by using TEM-EELS

    Sato Y., Terauchi M., Kikkawa J., Takeda S.

    Meeting abstracts of the Physical Society of Japan　63　(1)　951-951　2008/02/29

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  70. Co/SiO2多層膜の耐熱性評価

    石野雅彦, 小池雅人, 兼平美香, 佐藤二美, 寺内正己, 佐野一雄

    JAERI-Conf　147-150　2008

  71. ナノスケール軟X線発光分析の新展開－X線多層膜回折格子の応用－

    寺内正己, 米田雄一, 小池雅人, 石野雅彦, 今園孝志

    JAERI-Conf　29-32　2008

  72. 透過型電子顕微鏡を使ったすずめっき膜構造の解析

    寺内正己, 佐藤二美

    UYEMURA Technical Report　63　3-8　2008

  73. 分析手法EELS&XESにおける最近の進展

    寺内正己

    金属　78　(5)　18-23　2008

  74. 23pTC-7 TEM-XES studies on electronic structures of 4f-electron system

    Yoneda Y., Terauchi M., Iga F.

    Meeting abstracts of the Physical Society of Japan　62　(2)　1003-1003　2007/08/21

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  75. 22aTD-10 Surface effect study of valence electron excitation spectra of SiNW by using TEM-EELS

    Sato Y., Terauchi M., Kikkawa J., Takeda S.

    Meeting abstracts of the Physical Society of Japan　62　(2)　985-985　2007/08/21

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  76. 19pRF-10 TEM-EELS/XES studies of electronic structures of Cd-Yb quasicrystalline and approximant crystals

    Terauchi M., Tsai A. P.

    Meeting abstracts of the Physical Society of Japan　62　(1)　783-783　2007/02/28

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  77. 19aXC-7 Electronic structure studies of SmB_6 by using EELS/XES based on TEM

    Yoneda Y., Terauchi M., Iga F.

    Meeting abstracts of the Physical Society of Japan　62　(1)　952-952　2007/02/28

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  78. 19aRG-2 Electrical properties of tetragonal boron nanobelts II

    Hyodo H., Kirihara K., Soga K., Kawaguchi K., Shimizu Y., Sasaki T., Koshizaki N., Sato Y., Terauchi M., Kimura K.

    Meeting abstracts of the Physical Society of Japan　62　(1)　822-822　2007/02/28

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  79. 19pXC-5 Development of a high energy-resolution X-ray spectrometer for a TEM to investigate local electronic structures of valence electrons

    Terauchi M.

    Meeting abstracts of the Physical Society of Japan　62　(1)　961-961　2007/02/28

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  80. Recent Development of Quasicrystalline Research in Japan

    TAKAKURA Hiroyuki, TERAUCHI Masami, SUGIYAMA Kazumasa, YOSHIASA Akira

    Nihon Kessho Gakkaishi　49　(1)　1-1　2007/02/27

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.49.1 　

    ISSN： 0369-4585

  81. ナノスケール軟X線分光系の高検出効率化に関する研究

    寺内正己, 小池雅人, 石野雅彦, 今園孝志

    JAERI-Conf　2007　(001)　167-170　2007

  82. 電子線を用いた準結晶の電子状態研究－準結晶の特徴は何か－

    寺内正己

    日本結晶学会誌　49　(1)　51-54　2007

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.49.51 　

    ISSN： 0369-4585

    More details Close

    Al L-shell excitation spectra of Al-based quasicrystals of Al75Cu15V10, Al73Co27 and Al70Pd20Mn10 and related crystals were obtained from specified single crystalline areas by using a high energy-resolution electron energy-loss spectroscopy microscope. Intensity distributions of the spectra of not only the quasicrystalline materials but also related crystalline materials showed a presence of pseudogap at around the Fermi level. Onset energies of the spectra of the quasicrystals showed shifts to the higher energy side by 0.3 eV for Al75Cu15V10 and Al73Co27 and 0.8 eV for Al70Pd20Mn 10 compared to that of aluminum. Those results show that a decrease of valence charge at Al sites is characteristic for Al-based quasicrystalline materials. It may be attributed to an increase of covalency in bonding nature of the quasicrystalline materials.

  83. AlCuFe準結晶触媒の表面及び断面TEM観察 Peer-reviewed

    田邉豊和, 亀岡聡, 佐藤二美, 寺内正己, 蔡安邦

    触媒　48　(6)　383-385　2006/09

  84. 24aYF-6 High energy-resolusion EEELS study of electronic structure of 3D C_<60>-polymer crystal

    Choto H., Terauchi M., Kubo A., Yamanaka S.

    Meeting abstracts of the Physical Society of Japan　61　(2)　679-679　2006/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  85. 25aYK-6 TEM-EELS/XES study of electronic structures of silicon nanowires

    Sato Y., Terauchi M., Kikkawa J., Takeda S.

    Meeting abstracts of the Physical Society of Japan　61　(2)　799-799　2006/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  86. 24aYK-12 Development of a Soft-X-ray emission spectroscopy (SXES) instrument for a TEM to investigate local electronic structures of valence electrons

    Terauchi M., Koike M.

    Meeting abstracts of the Physical Society of Japan　61　(2)　789-789　2006/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  87. 25aYB-6 Electronic structure study of Mg-doped boron nanobelts by EELS and XES

    Terauchi M., Sato Y., Kirihara K., Kawaguchi K., Sasaki T., Koshizaki N., Hyodo H., Kimura K.

    Meeting abstracts of the Physical Society of Japan　61　(2)　686-686　2006/08/18

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  88. 27pUF-4 TEM-EELS study of electric structure of carbon nanotube

    Sato Y., Terauchi M., Saito Y., Saito R.

    Meeting abstracts of the Physical Society of Japan　61　(1)　817-817　2006/03/04

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  89. 28pYA-9 Quantitative analysis of rocking-curves obtained from impurity-doped regions of Si II

    Mitsuishi H., Tsuda K., Terauchi M., Kawamura K.

    Meeting abstracts of the Physical Society of Japan　61　(1)　942-942　2006/03/04

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  90. 30aRC-4 TEM study of Mg-doped boron nanobelts

    Terauchi M., Sato Y., Kirihara K., Kawaguchi K., Sasaki T., Koshizaki N., Hyodo H., Kimura K.

    Meeting abstracts of the Physical Society of Japan　61　(1)　849-849　2006/03/04

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  91. Ge 濃度を制御したSi1-xGexの格子定数測定

    赤荻隆之, 津田健治, 寺内正己, 田中通義

    まてりあ　45　(12)　887-887　2006

    Publisher: The Japan Institute of Metals and Materials

    DOI： 10.2320/materia.45.887 　

    ISSN： 1340-2625

  92. 19aXA-6 TEM-EELS study of electric structure of double-walled carbon nanotubes

    Sato Y., Terauchi M., Saito Y., Saito R.

    Meeting abstracts of the Physical Society of Japan　60　(2)　673-673　2005/08/19

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  93. 19pYF-12 TEM-EELS study of electric structure of organic molecular encapsulated SWCNTs II

    Sato Y., Terauchi M., Takenobu T., Iwasa Y.

    Meeting abstracts of the Physical Society of Japan　60　(2)　685-685　2005/08/19

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  94. 21aXB-13 Development of a soft-X-ray spectrometer for a TEM VI

    Terauchi M., Koike M.

    Meeting abstracts of the Physical Society of Japan　60　(2)　604-604　2005/08/19

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  95. 22pXA-2 TEM-XES study of electronic structures of B_<12> cluster materials

    Terauchi M., Kimura K.

    Meeting abstracts of the Physical Society of Japan　60　(2)　721-721　2005/08/19

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  96. 20aYN-4 TEH-EEES analysis of valence electron excitation processes of silicon nanowires

    Kikkawa J., Takeda S., Sato Y., Terauchi M.

    Meeting abstracts of the Physical Society of Japan　60　(2)　810-810　2005/08/19

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  97. 21aYM-12 Quantitative analysis of Convergent-beam Electron Diffraction pattern obtained from impurity-doped Si.

    Mitsuishi H., Tsuda K., Terauchi M., Kawamura K.

    Meeting abstracts of the Physical Society of Japan　60　(2)　822-822　2005/08/19

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  98. TEM-XES法による電子状態解析

    寺内正己

    日本結晶学会誌　47　(1)　79-82　2005/04

    Publisher: The Crystallographic Society of Japan

    DOI： 10.5940/jcrsj.47.79 　

    ISSN： 0369-4585

    More details Close

    A development of an X-ray emission spectroscopy instrument for a transmission electron microscopy to obtain a density of states of valence bands is briefly described. An example of TEM-EELS/XES analysis presented that high energy-resolution spectroscopy methods combined with transmission electron microscopy is a promising method to analyze whole electronic structures of manometer scale materials.

  99. 高エネルギー分解能ナノスケール軟X線分光系の開発と応用

    寺内正己, 小池雅人, 石野雅彦

    JAERI-Conf　2005-004　74-77　2005/04

  100. 電子顕微鏡を用いた物性解析技術開発の最新動向

    寺内 正己

    セラミックス　40　(11)　918-922　2005/04

  101. 透過型電子顕微鏡用軟X線広波長領域平面結像型分光器の光学設計

    小池雅人, 寺内正己

    JAERI-Conf　2005-004　235-238　2005/04

  102. 26pXL-6 High-resolution electron spectroscopy : EELS/XES(Advanced diffractometry, microscopy and spectroscopy for structurally complex systems)

    Terauchi M.

    Meeting abstracts of the Physical Society of Japan　60　(1)　751-751　2005/03/04

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  103. 25pYS-4 Quantitative analysis of rocking curves obtained from As-doped regions of Si III.

    Mitsuishi H., Tsuda K., Terauchi M., Kawamura K.

    Meeting abstracts of the Physical Society of Japan　60　(1)　916-916　2005/03/04

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  104. 24aYN-1 TEM-EELS study of electric structure of organic molecular encapsulated SWCNTs

    Sato Y., Terauchi M., Takenobu T., Iwasa Y.

    Meeting abstracts of the Physical Society of Japan　60　(1)　772-772　2005/03/04

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  105. 25aYK-4 Preperation and evalation of Mg-doped α-rhombohedral born

    Hyodo H, Araake S, Soga K, Sato Y, Terauchi M, Kimura K

    Meeting abstracts of the Physical Society of Japan　60　(1)　784-784　2005/03/04

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  106. Preparation of novel catalyst from quasicrystalline alloys Peer-reviewed

    亀岡聡, 田邉豊和, 佐藤二美, 寺内正己, 蔡安邦

    触媒　46　441-443　2004/09

  107. 15aWA-5 TEM-XES study of the electronic structures of Al-based quasicrystyals and its approximant crystals

    Terauchi M., Tsai A. P., Takeuchi T., Mizutani U.

    Meeting abstracts of the Physical Society of Japan　59　(2)　730-730　2004/08/25

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  108. 12pWF-5 TEM-EELS Study of Electric Structure of SWCNTs

    Sato Y., Terauchi M., Kataura H.

    Meeting abstracts of the Physical Society of Japan　59　(2)　738-738　2004/08/25

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  109. 13pTJ-10 TEM-EELS study of electronic structure of hexagonal diamond

    Inami Wataru, Terauchi Masami, Yoshiasa Akira

    Meeting abstracts of the Physical Society of Japan　59　(2)　864-864　2004/08/25

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  110. 13pTJ-5 Quantitative analysis of rocking curves obtained from As-doped regions of Si

    Mitsuishi H., Tsuda K., Terauchi M., Kawamura K.

    Meeting abstracts of the Physical Society of Japan　59　(2)　863-863　2004/08/25

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  111. 高エネルギー分解能ナノスケール軟X線分光系の開発

    寺内正己, 小池雅人, 石野雅彦

    JAERI-Conf　(2004-09)　91-94　2004/04

  112. TEM用軟X線発光分光装置の開発

    寺内正己

    電子顕微鏡　(39(3))　2004/04

    DOI： 10.11410/kenbikyo2004.39.200 　

  113. 28pWN-14 Properties of Mg-doped β-rhombohedral boron as an icosahedral cluster solid 2

    Araake S., Hyodo H., Soga K., Sato Y., Terauchi M., Kimura K.

    Meeting abstracts of the Physical Society of Japan　59　(1)　857-857　2004/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  114. 30aZP-10 TEM-EELS Study of Electric Structure of CNT

    Sato Y., Terauchi M., Saito R., Saito Y., Kataura H.

    Meeting abstracts of the Physical Society of Japan　59　(1)　873-873　2004/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  115. 28aYC-3 TEM-EELS study of electronic structure of Al_<80>Ni_<20>, Al_<73>Co_<27>, Al<72>Ni_<20>Co_8 quasicrystal

    Uemichi Y., Terauchi M., Tsai A. P.

    Meeting abstracts of the Physical Society of Japan　59　(1)　807-807　2004/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  116. 29pXK-8 Contrast of 180 domains of BaTiO_3 in electron microscope images

    Tanaka M., Omoto K., Tsuda K., Terauchi M.

    Meeting abstracts of the Physical Society of Japan　59　(1)　976-976　2004/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  117. 28aXM-1 Application of the statistical dynamical theory to electron diffraction II

    Tsuda K., Terauchi M., Kawamura K.

    Meeting abstracts of the Physical Society of Japan　59　(1)　957-957　2004/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  118. 28aXM-8 Study of local strain measurement using convergent-beam electron diffraction IV

    Akaogi T., Tsuda K., Terauchi M., Tanaka M.

    Meeting abstracts of the Physical Society of Japan　59　(1)　959-959　2004/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  119. 28pXM-3 Quantitative analysis of rocking curves obtained from As-doped regions of Si

    Mitsuishi H., Tsuda K., Terauchi M., Kawamura K.

    Meeting abstracts of the Physical Society of Japan　59　(1)　968-968　2004/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  120. 30aXF-3 Activity report of the tohoku branch of the Physical Society of Japan

    Terauchi M

    Meeting abstracts of the Physical Society of Japan　59　(1)　135-135　2004/03/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  121. TEM-XES study of the electronic structures of Al-based quasicrystyals of Al_<73>Co_<27>, Al_<80>Ni_<20> and Al_<72>Ni_<20>Co_8

    Terauchi M., Uemichi Y., Tsai A. P.

    Meeting abstracts of the Physical Society of Japan　59　(1)　807-807　2004

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  122. TEM-EELS Study of Electric Structure of DWCNT II

    Sato Y., Terauchi M., Saito Y.

    Meeting abstracts of the Physical Society of Japan　58　(2)　733-733　2003/08/15

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  123. Study of local strain measurement using convergent-beam electron diffraction III

    Akaogi T., Tsuda K., Terauchi M., Tanaka M.

    Meeting abstracts of the Physical Society of Japan　58　(2)　866-866　2003/08/15

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  124. Application of the statistical dynamical theory to electron diffraction

    Tsuda K., Terauchi M., Kawamura K.

    Meeting abstracts of the Physical Society of Japan　58　(2)　866-866　2003/08/15

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  125. TEM-EELS/XES Analysis of the Electric Structure of Boron Nanobelts II

    Sato Y., Terauchi M., Wang Z., Shimizu Y., Sasaki T., Kawaguchi K., Kimura K., Koshizaki N.

    Meeting abstracts of the Physical Society of Japan　58　(2)　750-750　2003/08/15

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  126. Properties of Mg-doped β-rhombohedral boron as icosahedral cluster solid

    Araake S., Soga K., Kimura K., Saito Y., Terauchi M.

    Meeting abstracts of the Physical Society of Japan　58　(2)　750-750　2003/08/15

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  127. Observation of As-doped region in Si by transmission electron microscopy II

    Terauchi M., Tsuda K., Kawamura K.

    Meeting abstracts of the Physical Society of Japan　58　(2)　874-874　2003/08/15

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  128. Electronic sturcture analyses by transmission electorn microscope

    Masami Terauchi

    Electron microscopy　38　186-191　2003/04

    DOI： 10.11410/kenbikyo1950.38.186 　

  129. Nanotubes without caobon atoms

    Masami Terauchi

    Parity　18　41-45　2003/04

  130. TEM-EELS Study of Electric Structure of DWCNT

    Sato Y., Terauchi M., Saito Y.

    Meeting abstracts of the Physical Society of Japan　58　(1)　817-817　2003/03/06

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  131. Structure and electrical properties of Mg-doped β-rhombohedral boron as icosahedral cluster solid

    Araake S., Soga K., Kimura K., Terauchi M.

    Meeting abstracts of the Physical Society of Japan　58　(1)　829-829　2003/03/06

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  132. Study of local strain measurement using convergent-beam electron diffraction II

    Akaogi T., Tsuda K., Terauchi M., Tanaka M.

    Meeting abstracts of the Physical Society of Japan　58　(1)　915-915　2003/03/06

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  133. EELSの高分解能化によって何が得られるか (日本顕微鏡学会第48回シンポジウム 材料科学と生命科学のクロストーク--顕微解析の最前線) -- (非生物系セッション3 EELSのエネルギー分解能向上と電子状態解析)

    寺内 正己

    電子顕微鏡　38　87-90　2003

    Publisher: 日本顕微鏡学会

    ISSN： 0417-0326

  134. TEM-EELS/XES analysis of the pseudogap structure of quasicrystals and approximants

    Terauchi M.

    Meeting abstracts of the Physical Society of Japan　58　(1)　764-764　2003

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  135. Development of a soft X-ray spectrometer for a TEM V

    Terauchi M., Koike M.

    Meeting abstracts of the Physical Society of Japan　58　(2)　620-620　2003

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  136. TEM-EELS study of the electronic structure of Mg-doped BornII

    SATO Y., TERAUCHI M., OGURI J., YAHATA H., SOGA K., KIMURA K.

    37　141-141　2002/11/27

    ISSN： 0417-0326

  137. Study of local strain measurement by convergent beam electron diffraction

    AKAOGI T., TSUDA K., TERAUCHI M., TANAKA M.

    37　139-139　2002/11/27

    ISSN： 0417-0326

  138. Detection of the density of states of valence bands by using a newly developed WDS spectrometer for a transmission electron microscope

    TERAUCHI M.

    Electron-microscopy　37　71-74　2002/11/27

    Publisher: 日本電子顕微鏡学会

    ISSN： 0417-0326

  139. Toward nano-scale analysis of crystal structures and electronic states

    TANAKA M., TERAUCHI M., TSUDA K., SAITOH K., MUKAI M., KANEYAMA T., TOMITA K., NARUSE M., TSUNO K., HONDA T.

    Electron-microscopy　37　1-4　2002/11/27

    Publisher: 日本電子顕微鏡学会

    ISSN： 0417-0326

  140. Electron energy-loss spectroscopy based on transmission electorn microscope

    Masami Terauchi

    Journal of the Crystallographic Society of Japan　44　277-283　2002/04

  141. Electronic structure analyses by electron energy-loss spectroscopy

    Masami Terauchi

    Journal of the Crystallographic Society of Japan　44　347-354　2002/04

  142. Report on the Microscopy & Microanalysis 2001

    TERAUCHI Masami

    37　(1)　69-69　2002/03/30

    ISSN： 0417-0326

  143. Space-group distinction between I23 and I2_13 by coherent CBED

    Saitoh K., Tsuda K., Terauchi M., Tanaka M.

    Meeting abstracts of the Physical Society of Japan　56　(2)　801-801　2001/09/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  144. A Search for Superconductivity in (Li, Mg)-doped B_<12> Cluster Solids

    Oguri A., Yahata H., Kimura K., Fujiwara A., Terauchi M.

    Meeting abstracts of the Physical Society of Japan　56　(2)　687-687　2001/09/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  145. TEM-EELS study of the electronic structure of Li, Mg-doped Boron

    Terauchi M., Oguri J., Yahata H., Kimura K.

    Meeting abstracts of the Physical Society of Japan　56　(2)　687-687　2001/09/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  146. Delivery of Special Lectures for High Schools

    Terauchi Masami

    56　(7)　489-491　2001/07/05

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 0029-0181

  147. Development of a Sub-eV Enegy-Resolution Soft-X-ray Spectrometer for a Transmission Electron Microscope

    M. Terauchi, M. Tanaka

    Solid State Physics　36　281-286　2001/04

  148. High energy-resolution EELS study of the electronic structure of Li-doped α-Boron

    Terauchi M., Tanaka M., Oguri J., Kimura K., Fujiwara A.

    Meeting abstracts of the Physical Society of Japan　56　(1)　612-612　2001/03/09

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  149. A Sign of Superconductivity in Li-doped α-rhombohedral Boron

    Oguri A, Kimura K., Fujiwara A, Terauchi M., Tanaka M.

    Meeting abstracts of the Physical Society of Japan　56　(1)　612-612　2001/03/09

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  150. TEM-EELS/XES study of the electronic structure of h-BN

    Terauchi M., Kawana M.

    Meeting abstracts of the Physical Society of Japan　56　(2)　803-803　2001

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  151. Development of a sub-eV X-ray emission spectrometer for a TEM and its aplpication to boron allotropes

    yamamoto H., Terauchi M., Tanaka M.

    Meeting abstracts of the Physical Society of Japan　56　(1)　684-684　2001

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  152. 電子顕微鏡による価電子帯DOS測定法の開発 (日本電子顕微鏡学会第46回シンポジウム 材料のナノ・生物のナノ) -- (共通セッション3 装置)

    寺内 正己

    電子顕微鏡　36　153-156　2001

    Publisher: 日本電子顕微鏡学会

    ISSN： 0417-0326

  153. Production of zigzag-type BN nanotubes and BN cones by thermal annealing

    M Terauchi, M Tanaka, K Suzuki, A Ogino, K Kimura

    CHEMICAL PHYSICS LETTERS　324　(5-6)　359-364　2000/07

    DOI： 10.1016/S0009-2614(00)00637-0 　

    ISSN： 0009-2614

  154. EELS study of the electronic structure of alkali metal-doped C_<60> polymer

    TERAUCHI M., YAMAGUCHI T., TANAKA M., IWASA Y., MITANI T., YAGI T.

    35　319-319　2000/05/01

    ISSN： 0417-0326

  155. High energy-resolution EELS study of electronic structures of BN cones

    TERAUCHI M., TANAKA M., SUZUKI K., OGINO A., KIMURA K.

    35　316-316　2000/05/01

    ISSN： 0417-0326

  156. EELS study of the electronic structure of alkali metal-doped C_<60> polymer

    Yamaguchi T., Terauchi T., Tanaka M., Iwasa Y., Mitani T., Yagi T.

    Meeting abstracts of the Physical Society of Japan　55　(1)　713-713　2000/03/10

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  157. High energy-resolution EELS study of electronic structures of BN cones

    Terauchi M., Tanaka M., Suzuki K., Kimura K.

    Meeting abstracts of the Physical Society of Japan　55　(1)　716-716　2000

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  158. 27pYM-11 High energy-resolution EELS study of electronic structures of τ^0-and τ^2-Al__73Co__27 approximants

    Terauchi M., Tanaka M., Tsai A.P.

    Meeting abstracts of the Physical Society of Japan　54　(2)　725-725　1999/09/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  159. 24aF-10 Electron energy-loss spectra of Li-doped C_<60> polymer

    Yamaguchi T., Terauchi T., Tanaka M., Iwasa Y., Mitani T., Yagi T.

    Meeting abstracts of the Physical Society of Japan　54　(2)　730-730　1999/09/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  160. 27aYA-9 High energy-resolution EELS study of electronic structures of hexagonal, wrizite and cubic boron nitrides and boron nitride nanotubes

    Terauchi M, Tanaka M

    Meeting abstracts of the Physical Society of Japan　54　(2)　920-920　1999/09/03

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  161. 28a-XA-10 Electron Energy-loss Spectra of C_<60> polymers II

    Tanaka M., Nishimura S., Terauchi M., Iwasa Y., Mitani T., Yagi T.

    Meeting abstracts of the Physical Society of Japan　54　(1)　239-239　1999/03/15

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  162. 29a-ZH-11 Electron energy-loss spectroscopy study of TiO_2 polymorphs II.

    Abe H., Terauchi M., Tanaka M.

    Meeting abstracts of the Physical Society of Japan　54　(1)　199-199　1999/03/15

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  163. 29p-XA-4 Electron Energy-loss Spectra of Carbon nanotubes

    Terauchi M., Tanaka M., Saito Y.

    Meeting abstracts of the Physical Society of Japan　54　(1)　255-255　1999/03/15

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  164. 27aG-1 Electronic Structure of ferromagnetic cuprate(La, RE)_4Ba_2Cu_2O_<10>

    Nozaki H, Takeuchi K, Soda K, Mizuno T, Banno E, Yamada Y, Terauchi M, Saito Y, Muro T, Ikuta H, Hirabayashi I, Mizutani U

    Meeting Abstracts of the Physical Society of Japan　54.2.3　565　1999

    Publisher: The Physical Society of Japan

    DOI： 10.11316/jpsgaiyo.54.2.3.0_565_2 　

    eISSN： 2189-0803

  165. Electron energy loss spectra of C_<60> polymer

    TERAUCHI M., NISHIMURA S., TANAKA M., IWASA Y., TANOUE K., YAGI T.

    Meeting abstracts of the Physical Society of Japan　53　(2)　324-324　1998/09/05

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  166. Electron Energy-loss Spectroscopy study of electronic structures of B_6 cluster materials

    TERAUCHI M., TANAKA M., KIMURA K., FUJIMORI M.

    Meeting abstracts of the Physical Society of Japan　53　(2)　153-153　1998/09/05

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  167. Symmetry determination of a composit crystal of Sr_<14>Cu_<24>O_<41> by convergent-beam electron diffraction

    TARAUCHI M., TANAKA M., GOTO Y., AKIMITSU J.

    Meeting abstracts of the Physical Society of Japan　53　(2)　419-419　1998/09/05

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  168. Electton Energy-Loss spectra of BN-nanotubes III

    TERAUCHI M., TANAKA M., MAIDA M., SAITO Y.

    Meeting abstracts of the Physical Society of Japan　53　(2)　292-292　1998/09/05

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  169. Electron Energy-loss Spectroscopy study of electronic structures of La_4Ba_2Cu_2O_<10>

    TERAUCHI M., TANAKA M., NOZAKI H., MIZUTANI U., IKUTA H., HIRABAYASHI I.

    Meeting abstracts of the Physical Society of Japan　53　(2)　705-705　1998/09/05

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  170. Dielectric properties of extended defects in silicon studied by high-resolution transmission EELS

    KOHNO Hideo, MABUCHI Toshinobu, TAKEDA Seiji, KOHYAMA Masanori, TERAUCHI Masami, TANAKA Michiyoshi

    Journal of Electron Microscopy　47　(4)　311-317　1998/08/01

    Publisher: Published for the Japanese Society of Electron Microscopy by Oxford University Press

    ISSN： 0022-0744

  171. Electron-energy-loss spectroscopy study of a stable decagonal quasicrystal Al70Ni20Rh10

    M Terauchi, H Ueda, M Tanaka, AP Tsai, A Inoue, T Masumoto

    PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES　77　(6)　1625-1632　1998/06

    ISSN： 0141-8637

  172. Electron-energy-loss spectroscopy study of the electronic structure of a stable decagonal quasicrystal Al70Ni15Co15

    M Terauchi, H Ueda, M Tanaka, AP Tsai, A Inoue, T Masumoto

    PHILOSOPHICAL MAGAZINE LETTERS　77　(6)　351-357　1998/06

    DOI： 10.1080/095008398178336 　

    ISSN： 0950-0839

  173. Electron energy-loss spectroscopy study of TiO_2(Rutile,Anatase and Brookite)

    ABE H., TERAUCHI M., TANAKA M.

    Meeting abstracts of the Physical Society of Japan　53　(1)　195-195　1998/03/10

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  174. Formation conditions for BN nanotubes

    TAGUCHI R., SUZUKI K., MATSUDA H., KIMURA K., TERAUCHI M., TANAKA M., SUEMATU H.

    Meeting abstracts of the Physical Society of Japan　53　(1)　250-250　1998/03/10

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  175. Electton Energy-Loss spectra of BN-nanotubes II

    TERAUCHI M., TANAKA M., MATSUMOTO T., SAITO Y.

    Meeting abstracts of the Physical Society of Japan　53　(1)　250-250　1998/03/10

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  176. Electron Energy-loss Spectroscopy study of electronic structures of B_<12> cluster materials

    KIMURA K., FUJIMORI M., SAKAIRI Y., TERAUCHI M., TANAKA M.

    Meeting abstracts of the Physical Society of Japan　53　(1)　140-140　1998/03/10

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  177. EELSによるBNナノチューブの電子構造 (日本電子顕微鏡学会第43回シンポジウム論文集--21世紀へ向けての新技術の展開--平成10年10月28日(水)～30日(金),千葉大学けやき会館〔含 著者名索引〕) -- (ナノ構造解析の最前線)

    寺内 正己, 田中 通義, 斎藤 弥八

    電子顕微鏡　33　(2)　251-254　1998

    Publisher: 日本顕微鏡学会

    ISSN： 0417-0326

  178. Electron energy-loss spectroscopy study of the electronic structure of alpha-rhombohedral boron

    M Terauchi, Y Kawamata, M Tanaka, M Takeda, K Kimura

    JOURNAL OF SOLID STATE CHEMISTRY　133　(1)　156-159　1997/10

    DOI： 10.1006/jssc.1997.7336 　

    ISSN： 0022-4596

  179. Electron energy-loss spectroscopy study of the electronic structure of Li- and V-doped beta-rhombohedral boron

    M Terauchi, Y Kawamata, M Tanaka, H Matsuda, K Kimura

    JOURNAL OF SOLID STATE CHEMISTRY　133　(1)　152-155　1997/10

    DOI： 10.1006/jssc.1997.7335 　

    ISSN： 0022-4596

  180. 5a-G-10 Electton Energy-Loss spectra of wurtzite BN

    Terauchi M., Tanaka M., Shin S.

    Meeting abstracts of the Physical Society of Japan　52　(2)　198-198　1997/09/16

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  181. 5a-G-11 Electron energy-loss spectroscopy study of the metal-insulator transition in V_6O_<13>

    Abe H., Terauchi M., Tanaka M., Shin S., Ueda Y.

    Meeting abstracts of the Physical Society of Japan　52　(2)　198-198　1997/09/16

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  182. 7a-S-10 EELS Study of Extended Defects in silicon

    Kohno H., Mabuchi T., Hirata M., Takeda S., Kouyama M., Terauchi M., Tanaka M.

    Meeting abstracts of the Physical Society of Japan　52　(2)　109-109　1997/09/16

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  183. 5p-X-7 Crystal Structure Analysis by Convergent-Beam Electron Diffraction

    Tsuda K., Saitoh K., Terauchi M., Tanaka M., Kaneyama T., Tsuno K., Honda T.

    Meeting abstracts of the Physical Society of Japan　52　(2)　392-392　1997/09/16

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  184. 8a-D-13 Formation conditions for BN nanotubes

    Taguchi R., Suzuki K., Matsuda H., Kimura K., Terauchi M., Tanaka M., Suematsu H.

    Meeting abstracts of the Physical Society of Japan　52　(2)　304-304　1997/09/16

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  185. 8a-D-11 Electton Energy-Loss spectra of BN-nanotubes

    Terauchi M., Tanaka M., Matsumoto T., Saito Y.

    Meeting abstracts of the Physical Society of Japan　52　(2)　303-303　1997/09/16

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  186. 28a-A-8 Application of an electron microscope with an omega-type energy filter to the convergent-beam electrion diffraction method

    Saitoh K, Tsuda K, Terauchi M, Tanaka M, Kaneyama T, Tsuno S, Honda T

    Meeting abstracts of the Physical Society of Japan　52　(1)　373-373　1997/03/17

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  187. 28a-A-5 Development of an Energy-Filter TEM and its Application to Crystal Structure Analysis

    Tanaka M, Saitoh K, Tsuda K, Terauchi M, Kaneyama T, Tsuno K, Honda T

    Meeting abstracts of the Physical Society of Japan　52　(1)　372-372　1997/03/17

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  188. 28a-A-7 Development of Energy-Filter FEG-TEM

    Kaneyama T, Tsuno K, Honda T, Tsuda K, Terauchi M, Tanaka M

    Meeting abstracts of the Physical Society of Japan　52　(1)　372-372　1997/03/17

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  189. 28a-A-9 Developement of software for crystal structure analysis using convergent-beam electron diffraction

    Tsuda K, Saitoh K, Terauchi M, Tanaka M

    Meeting abstracts of the Physical Society of Japan　52　(1)　373-373　1997/03/17

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  190. 28a-A-6 Design and construction of Wollnik type omega filter

    Tsuno K, Kaneyama T, Honda T, Tsuda K, Terauchi M, Tanaka M

    Meeting abstracts of the Physical Society of Japan　52　(1)　372-372　1997/03/17

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  191. 31a-D-14 Formation of BN-nanotubes and the study of its crystal-and electronic-structure

    Terauchi M, Tanaka M, Matsuda H, Takeda M, Kimura K

    Meeting abstracts of the Physical Society of Japan　52　(1)　294-294　1997/03/17

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  192. 28a-YC-12 Electoron energy-loss spectroscopy study of the metal-insulator transition in vanadium oxides

    Abe H, Terauchi M, Tanaka M, Shin S, Ueda Y

    Meeting abstracts of the Physical Society of Japan　52　(1)　185-185　1997/03/17

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  193. 30p-G-3 Metallic-Covalent Bonding Conversion in Icosahedral Cluster Solids

    Kimura K, Matsuda H, Fujimori M, Terauchi M, Tanaka M, Kumigashira H, Yokoya N, Takahashi T

    Meeting abstracts of the Physical Society of Japan　52　(1)　168-168　1997/03/17

    Publisher: The Physical Society of Japan (JPS)

    ISSN： 1342-8349

  194. 31P-X-1 Al_<75>CU_<15>V_<10>の電子エネルギー損失スペクトル

    上田 宏, 寺内 正己, 田中 通義, 蔡 安邦, 井上 明久, 増本 健

    日本物理学会講演概要集　52　(1)　552-552　1997/03/17

    Publisher: 一般社団法人日本物理学会

    ISSN： 1342-8349

  195. Electron Energy-Loss Spectroscopy Study of the Electronic Structure of Quasicrystals

    Terauchi M, Ueda H, Tanaka M, Tsai A.P, Inoue A, Masumoto T

    Proceedings of 6th International Conference on Quasicrystals　587-590　1997

  196. Helical nanotubes of hexagonal boron nitride

    M Terauchi, M Tanaka, H Matsuda, M Takeda, K Kimura

    JOURNAL OF ELECTRON MICROSCOPY　46　(1)　75-78　1997

    DOI： 10.1093/oxfordjournals.jmicro.a023492 　

    ISSN： 0022-0744

  197. Convergent-Beam Electron Diferaction and Electron Microscope Studies of Decagonal Quasicrystals

    Tsuda K, Saito K, Terauchi M, Tanaka M, Tsai A.P, Inoue A, Masumoto T

    Proceedings of 6th International Conference on Quasicrystals　11-18　1997

  198. High-resolution Electron Energy-loss Spectroscopy Microscope

    TERAUCHI Masami, TANAKA Michiyoshi

    Electron-microscopy　31　(2)　136-140　1996/11/30

    Publisher: 日本電子顕微鏡学会

    ISSN： 0417-0326

  199. Electron Energy-Loss Spectroscopy study of electronic structure of La_<2-x>Sr_xCuO_4(x≦0.15)

    Terauchi M., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1996　(3)　554-554　1996/09/13

    Publisher: The Physical Society of Japan (JPS)

  200. Electron Energy-Loss Spectra of Al_<70>Ni_<15>Co_<15>

    Ueda H., Terauchi M., Tanaka M., Tsai A.P., Inoue A., Masumoto T.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1996　(3)　314-314　1996/09/13

    Publisher: The Physical Society of Japan (JPS)

  201. Electron Energy-Loss Spectroscopy study of electronic structure of Li-doped α-rhombohedral boron

    Terauchi M., Tanaka M., Matsuda H., Takeda M., Kimura K.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1996　(2)　212-212　1996/09/13

    Publisher: The Physical Society of Japan (JPS)

  202. Electron Energy-Loss Spectroscopy study of electronic structure of Cu, Sr-doped β-rhombohedral boron

    Terauchi M., Tanaka M., Matsuda H., Nakayama T., Kimura K.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1996　(2)　213-213　1996/09/13

    Publisher: The Physical Society of Japan (JPS)

  203. Electron energy-loss spectroscopy study of the metal-insulator transition in (V_<1-x>Cr_x)_2O_3(x=0.012)II

    Abe H., Terauchi M., Tanaka M., Shin S.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1996　(2)　290-290　1996/09/13

    Publisher: The Physical Society of Japan (JPS)

  204. High-resolution EELS study of electronic structure of bulk specimens by fast electrons

    Terauchi M., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1996　(2)　663-663　1996/09/13

    Publisher: The Physical Society of Japan (JPS)

  205. CBED study of a relaxed strain field of a perfect dislocation in a thin foil

    Fukushima S., Terauchi M., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1996　(2)　648-648　1996/09/13

    Publisher: The Physical Society of Japan (JPS)

  206. 31a-Z-11 Electron Energy-Loss Spectroscopy study of Meatal-Insulator Transition of (V_<1-x>Cr_x)_2O_3(x=0.012)

    Abe H, Terauchi M, Tanaka M, Shin S

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　51　(2)　230-230　1996/03/15

    Publisher: The Physical Society of Japan (JPS)

  207. 1a-F-9 High Resolution Electron Energy-Loss Spectra of B_<12> Icosahedral Cluster Solids

    Kawamata Y., Terauchi M., Tanaka M., Matsuda H., Takeda M., Kimura K.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　51　(2)　155-155　1996/03/15

    Publisher: The Physical Society of Japan (JPS)

  208. Electron Energy-Loss Spectra of Al_<65>Cu_<20>Ru_<15>

    Terauchi M., Tanaka M., Tsai A.P., Inoue A., Masumoto K.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1995　(3)　269-269　1995/09/12

    Publisher: The Physical Society of Japan (JPS)

  209. 28a-P-8 Convergent-beam electron diffraction study of faulted interfaces in AIN ceramics

    Yan Yanfa, Terauchi M., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1995　(2)　535-535　1995/09/12

    Publisher: The Physical Society of Japan (JPS)

  210. 27a-W-6 Electron Energy-Loss Spectroscopy study of Metal-Insulator Transition of VO_2 II

    Abe H., Terauchi M., Tanaka M., Shin S., Ueda Y.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1995　(2)　225-225　1995/09/12

    Publisher: The Physical Society of Japan (JPS)

  211. 27a-W-5 Electron Energy-Loss Spectroscopy study of Metal-Insulator Transition of V_2O_3

    Abe H., Terauchi M., Tanaka M., Shin S., Ueda Y.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1995　(2)　225-225　1995/09/12

    Publisher: The Physical Society of Japan (JPS)

  212. 29p-X-2 Electron Energy-Loss Spectra of an amorphous diamond (shock-compressed C_<60>)

    Terauchi M., Tanaka M., Hirai H., Kondo K.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1995　(2)　182-182　1995/09/12

    Publisher: The Physical Society of Japan (JPS)

  213. 28p-W-4 High-Resolution Electron Energy-Loss Spectra of cubic-BN

    Kawamata Y, Terauchi M, Tanaka M, Shin S, Agui A, Mishima O, Era K

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1995　(2)　274-274　1995/09/12

    Publisher: The Physical Society of Japan (JPS)

  214. Coherent Convergent-Beam Electron Diffaction

    TANAKA Michiyoshi, TSUDA Kenji, TERAUCHI Masami

    Electron-microscopy　29　(3)　171-180　1995/03/31

    Publisher: 日本電子顕微鏡学会

    ISSN： 0417-0326

  215. Electron Energy-Loss Spectroscopy study of Metal-Insulator Transition of VO_2

    Abe H., Terauchi M., Tanaka M., Shin S., Ueda Y.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　50　(2)　263-263　1995/03/16

    Publisher: The Physical Society of Japan (JPS)

  216. Study of electronic states of carbon nanotubes by EELS

    Tanaka Michiyoshi, Terauchi M, Kuzuo R

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　50　(2)　411-411　1995/03/16

    Publisher: The Physical Society of Japan (JPS)

  217. EELS study of{113}defects in Si

    Takeda S, Terauchi M, Tanaka M, Kohyama M

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　50　(2)　34-34　1995/03/16

    Publisher: The Physical Society of Japan (JPS)

  218. Electron Energy-Loss Spectra of a quasi 1-dimensional carbon crystal "carbolite"

    Terauchi M, Tanaka M, Tanuma S, Palnichenko A

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　50　(2)　193-193　1995/03/16

    Publisher: The Physical Society of Japan (JPS)

  219. TEMPERATURE-DEPENDENCE OF THE VOLUME-PLASMON ENERGY IN SILVER

    H ABE, M TERAUCHI, M TANAKA

    JOURNAL OF ELECTRON MICROSCOPY　44　(1)　45-48　1995/02

    ISSN： 0022-0744

  220. 3p-X-4 Detemination of the displacement vector at a stacking fault of TiO_2 by Convergent-Beam Electron Diffraction

    Yamada S, Terauchi M, Tanaka M

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1994　(2)　449-449　1994/08/16

    Publisher: The Physical Society of Japan (JPS)

  221. 3p-X-3 Observation of stacking faults using coherent convergent-beam electron diffraction

    Tsuda K, Terauchi M, Tanaka M, Kaneyama T, Honda T

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1994　(2)　449-449　1994/08/16

    Publisher: The Physical Society of Japan (JPS)

  222. 2p-YC-5 Electron Energy Loss Spectra of Al_<75>Cu_<15>V_<10>

    Azuma R, Terauchi M, Tanaka M, Tsai A.P., Inoue A, Masumoto K

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1994　(3)　186-186　1994/08/16

    Publisher: The Physical Society of Japan (JPS)

  223. 5p-YE-4 Electron Energy-Loss Spectroscopy study on superconducting state of bismuth high-Tc superconductor

    Terauchi M, Tanaka M, Takahashi T, Yoshida H

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1994　(3)　410-410　1994/08/16

    Publisher: The Physical Society of Japan (JPS)

  224. OBSERVATION OF INTERFERENCE-FRINGES WITH A LATTICE SPACING OF 1.92-ANGSTROM IN CONVERGENT-BEAM ELECTRON-DIFFRACTION

    K TSUDA, M TERAUCHI, M TANAKA, T KANEYAMA, T HONDA

    JOURNAL OF ELECTRON MICROSCOPY　43　(3)　173-175　1994/06

    ISSN： 0022-0744

  225. 31a-YE-13 Transmission electron energy-loss spectroscopy study of bismuth high-Tc superconductor

    Terauchi M, Tanaka M, Takahashi T, Yoshida H

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　49　(3)　434-434　1994/03/16

    Publisher: The Physical Society of Japan (JPS)

  226. 28p-YK-5 Electron Energy-Loss Spectra of Carbon Nanotubes II

    Kuzuo R, Terauchi M, Tanaka M, Saito Y

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　49　(2)　298-298　1994/03/16

    Publisher: The Physical Society of Japan (JPS)

  227. CONVERGENT-BEAM ELECTRON DIFFRACTION AND ELECTRON MICROSCOPE STUDIES ON DECAGONAL QUASICRYSTALS OF AL-NI-FE AND AL-CU-CO ALLOYS

    K TSUDA, M SAITO, K SAITOH, M TERAUCHI, M TANAKA, AP TSAI, A INOUE, T MASUMOTO

    QUASICRYSTALS AND IMPERFECTLY ORDERED CRYSTALS　150　255-266　1994

    ISSN： 0255-5476

  228. 13a-DL-6 Observation of Stacking Faults using Coherent Convergent-Beam Electron Diffraction

    Terauchi M., Tsuda K., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1993　(2)　586-586　1993/09/20

    Publisher: The Physical Society of Japan (JPS)

  229. 13a-DL-7 Determination of the displacement vector at a {132} stacking fault of TiO_2 by Convergent-Beam Electron Diffraction

    Yamada S., Terauchi M., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1993　(2)　586-586　1993/09/20

    Publisher: The Physical Society of Japan (JPS)

  230. 15p-B-7 High-Resolution Electron Energy-Loss Spectra of Crystalline C_<84>

    Kuzuo R., Terauchi M., Tanaka M., Saito Y., Shinohara H.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1993　(2)　412-412　1993/09/20

    Publisher: The Physical Society of Japan (JPS)

  231. 13a-T-9 Transmission Electron Energy-Loss Spectroscopy study of Thallium High-Tc superconductor

    Terauchi M., Tanaka M., Takahashi T., Yoshida H., Kubo Y., Manako T.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1993　(3)　416-416　1993/09/20

    Publisher: The Physical Society of Japan (JPS)

  232. 15a-B-2 Convergent-Beam Electron Diffraction study of the structure of solid C_<60>

    Terauchi M., Tanaka M., Saito Y., Shinohara H.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1993　(2)　402-402　1993/09/20

    Publisher: The Physical Society of Japan (JPS)

  233. 13p-B-6 High-Resolution Electron Energy-Loss Spectra of K_xC_<60> and Rb_<x>C_<60>

    Kuzuo R., Terauchi M., Tanaka M., Saito Y., Shinohara H.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1993　(2)　376-376　1993/09/20

    Publisher: The Physical Society of Japan (JPS)

  234. 14a-J-5 Study of Symmetry of LaBGeO_5 using Convergent-Beam Electron Diffraction

    Kamimura O., Terauchi M., Tanaka M., Uesu Y.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1993　(2)　98-98　1993/09/20

    Publisher: The Physical Society of Japan (JPS)

  235. 14p-DD-7 Transmission Electron Energy-Loss Spectra of Fullerenes

    Terauchi M., Kuzuo R., Tanaka M., Saito Y., Shinohara H.

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting　1993　(2)　300-300　1993/09/20

    Publisher: The Physical Society of Japan (JPS)

  236. 30a-W-1 Electron Energy-Loss Spectra of Bi_2Sr_2CaCu_2O_8 single crystals

    Abe H., Terauchi M., Kuzuo R., Tanaka M., Takahashi T., Yoshida K., Yamanaka A., Takekawa S.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　48　(3)　282-282　1993/03/16

    Publisher: The Physical Society of Japan (JPS)

  237. 29p-ZB-11 Convergent-Beam Elevtron Diffraction study of Top-Bottom effect due to anomalous absorption

    Yamada S., Terauchi M., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　48　(2)　499-499　1993/03/16

    Publisher: The Physical Society of Japan (JPS)

  238. 29p-AB-7 Dynamical calculation of coherent convergent-beam electron diffraction patterns

    Tsuda K., Terauchi M., Saito M., Kamimura O., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　48　(2)　497-497　1993/03/16

    Publisher: The Physical Society of Japan (JPS)

  239. 29p-ZB-6 Coherent Convergent-Beam Electron Diffraction

    Tanaka M., Terauchi M., Tsuda K., Saito M., Kamimura O.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　48　(2)　497-497　1993/03/16

    Publisher: The Physical Society of Japan (JPS)

  240. 29p-ZB-10 Observation of Glide Planes using Coherent Convergent-Beam Electron Diffraction II

    Kamimura O., Terauchi M., Saito M., Tsuda K., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　48　(2)　499-499　1993/03/16

    Publisher: The Physical Society of Japan (JPS)

  241. 29p-ZB-8 Observation of mirror symmetry using Coherent Convergent-Beam Electron Diffraction

    Ishikawa A., Terauchi M., Saito M., Kamimura O., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　48　(2)　498-498　1993/03/16

    Publisher: The Physical Society of Japan (JPS)

  242. High-Resolution Electron Energy-Loss Spectra of C_<60> and C_<70> fcc single crystals

    Kuzuo R., Terauchi M., Tanaka M., Saito Y.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　48　(2)　301-301　1993/03/16

    Publisher: The Physical Society of Japan (JPS)

  243. 29a-M-9 Hight-Resolution Electron Energy-Loss Spectra of GaAs

    Terauchi M., Tanaka M.

    Abstracts of the meeting of the Physical Society of Japan. Annual meeting　48　(2)　127-127　1993/03/16

    Publisher: The Physical Society of Japan (JPS)

  244. ELECTRON-DIFFRACTION AND ELECTRON-MICROSCOPE STUDY ON DECAGONAL QUASI-CRYSTALS ON AL-NI-FE ALLOYS

    M TANAKA, K TSUDA, M TERAUCHI, A FUJIWARA, AP TSAI, A INOUE, T MASUMOTO

    JOURNAL OF NON-CRYSTALLINE SOLIDS　153　98-102　1993/02

    DOI： 10.1016/0022-3093(93)90322-O 　

    ISSN： 0022-3093

  245. 27p-J-13 Electron Energy-Lose Spectra of Carbon Nanotube

    Kuzuo R, Terauchi M, Abe H, Tanaka M, Saito Y

    1992　(2)　349-349　1992/09/14

    Publisher: The Physical Society of Japan (JPS)

  246. 25a-ZG-4 Electron Energy-Loss Spectroscopy study of the electronic structure of lattice defects

    Terauchi M, Tanaka M

    1992　(2)　108-108　1992/09/14

    Publisher: The Physical Society of Japan (JPS)

  247. 27p-S-5 Convergent-Beam Electron Diffraction study of the structures of C_<60> and C_<70>

    Terauchi M, Tanaka M, Saito Y

    1992　(2)　565-565　1992/09/14

    Publisher: The Physical Society of Japan (JPS)

  248. 27p-S-11 Determination of the displacement vector at a stacking fault of TiO_2 by Convergent-Beam Electron Diffraction with use of imaging plates

    Yamada S, Terauchi M, Tanaka M

    1992　(2)　568-568　1992/09/14

    Publisher: The Physical Society of Japan (JPS)

  249. 27p-S-10 Determination of the displacement vector at a sracjing fault of Si by Convergent-Beam Electron Diffraction with use of imaging plates

    Yamada S, Terauchi M, Tanaka M

    1992　(2)　568-568　1992/09/14

    Publisher: The Physical Society of Japan (JPS)

  250. 27p-S-13 Temperature Dependence of Volume-Plasmon Energy in Ag

    Abe H, Terauchi M, Kuzuo R, Tanaka M

    1992　(2)　569-569　1992/09/14

    Publisher: The Physical Society of Japan (JPS)

  251. 27a-ZB-9 Electron Energy Loss Spectra measured by a high energy resolution analytical TEM IV

    Kuzuo R, Terauchi M, Tanaka M, Tsuno K, Ohyama J

    47　(2)　502-502　1992/03/12

    Publisher: The Physical Society of Japan (JPS)

  252. 28a-ZF-10 Temperature Dependence of Plasmon Energy in Aluminum

    Abe H, Kuzuo R, Terauchi M, Tanaka M

    47　(2)　445-445　1992/03/12

    Publisher: The Physical Society of Japan (JPS)

  253. 30a-W-13 Electron Energy-Loss Spectroscopy study of electronic states of semiconductors

    Terauchi M., Kuzuo R., Abe H., Tanaka M.

    47　(2)　189-189　1992/03/12

    Publisher: The Physical Society of Japan (JPS)

  254. 30p-L-6 Convergent-Beam Electron Diffraction study of α-fringes with a phase angle of 180゜

    Yamada S., Terauchi M., Tanaka M.

    46　(2)　529-529　1991/09/12

    Publisher: The Physical Society of Japan (JPS)

  255. 30p-L-10 High-Resolution Electron Energy-Loss Spectra of solid C_<60>

    Kuzuo R., Terauchi M., Tanaka M., Saito Y., Shinohara H.

    46　(2)　531-531　1991/09/12

    Publisher: The Physical Society of Japan (JPS)

  256. 30p-L-7 Measurement of order parameter using Convergent-Beam Electron Diffraction

    Kaneyama T., Terauchi M., Tanaka M.

    46　(2)　530-530　1991/09/12

    Publisher: The Physical Society of Japan (JPS)

  257. 30p-L-9 Electron Energy-Loss Spectra measured by a high-resolution Energy analytical TEM III

    Terauchi M., kuzuo R., Tanaka M., Tsuno K., Ohyama J.

    46　(2)　531-531　1991/09/12

    Publisher: The Physical Society of Japan (JPS)

  258. 30p-L-5 Convergent-beam electron diffraction study of Al-Ni-Fe quasicrystals

    Fujiwara A., Tsuda K., Terauchi M., Tanaka M., Tsai An-Pang, Inoue A., Masumoto T.

    46　(2)　529-529　1991/09/12

    Publisher: The Physical Society of Japan (JPS)

  259. DEVELOPMENT OF A NEW INSTRUMENT FOR HIGH-RESOLUTION ELECTRON ENERGY-LOSS SPECTROSCOPY

    M TANAKA, M TERAUCHI, R KUZUO, K TSUNO

    JOURNAL OF ELECTRON MICROSCOPY　40　(3)　203-203　1991/06

    ISSN： 0022-0744

  260. 24p-Q-6 Super space-group determination of a composite crystal Ba_xFe_2S_4(x〜1.123) by Convergent-Beam Electron Diffraction

    Terauchi M., Takahashi M., Tanaka M., Onoda M.

    1991　(2)　522-522　1991/03/11

    Publisher: The Physical Society of Japan (JPS)

  261. 24p-Q-7 Measument of misorientation of coherent twin by Convergent-Beam Electron Diffraction

    Kaneyama T., Terauchi M., Tanaka M.

    1991　(2)　522-522　1991/03/11

    Publisher: The Physical Society of Japan (JPS)

  262. 24p-Q-13 Electron Energy Loss Spectra measured by a high energy resolution analytical TEM II

    Kuzuo R., Terauchi M., Tanaka M., Tsuno K., Ohyama J.

    1991　(2)　525-525　1991/03/11

    Publisher: The Physical Society of Japan (JPS)

  263. 3a-TA-6 Electron Energy Loss Spectra measured by a high energy resolution analytical TEM

    Kuzuo R., Terauchi M., Tanaka M., Tsuno K.

    1990　(2)　505-505　1990/09/12

    Publisher: The Physical Society of Japan (JPS)

  264. 2p-TA-8 Observation of 4-dimensional SymmetTies by Convergent-Beam Electron Diffraction

    Takahashi M., Terauchi M., Tanaka M.

    1990　(2)　501-501　1990/09/12

    Publisher: The Physical Society of Japan (JPS)

  265. 2p-TA-9 Determination of 4-dimensional Superspace Groups by Convergent-Beam Electron Diffraction and Dynamical Extinction Rules

    Takahashi M., Terauchi M., Tanaka M.

    1990　(2)　501-501　1990/09/12

    Publisher: The Physical Society of Japan (JPS)

  266. 5a-PS-45 High-resolution energy-analyzer(Wien filter)for Electron Microscope III

    Terauchi M., Kuzuo R., Tanaka M., Tsuno K., Ohyama J.

    1990　(2)　483-483　1990/09/12

    Publisher: The Physical Society of Japan (JPS)

  267. ELECTRON TRAJECTORY CALCULATION OF A WIEN-FILTER FOR EELS

    R KUZUO, M TERAUCHI, M TANAKA, K TSUNO

    JOURNAL OF ELECTRON MICROSCOPY　39　(4)　321-321　1990/08

    ISSN： 0022-0744

  268. Direct Observation of the 4^^- Axis by Convergent-Beam Electron Diffraction

    Tanaka M., Terauchi M.

    45　(2)　476-476　1990/03/16

    Publisher: The Physical Society of Japan (JPS)

  269. High-resolution energy-analyzer(Wien filter) for Electron Microscope II

    Terauchi M., Kuzuo R., Tanaka M., Tsuno K., Ishida M.

    45　(2)　410-410　1990/03/16

    Publisher: The Physical Society of Japan (JPS)

  270. Electron trajectory calculation of a Wien filter for EELS

    Kuzuo R., Terauchi M., Tanaka M., Tsuno K.

    45　(2)　410-410　1990/03/16

    Publisher: The Physical Society of Japan (JPS)

  271. 6p-W-8 Symmetries of Convergent-Beam Electron Diffraction from 4-dimensional space-group

    Terauchi M., Tanaka M.

    1989　(2)　488-488　1989/09/12

    Publisher: The Physical Society of Japan (JPS)

  272. 6p-T-4 High-resolution energy-analyzer (Wien filter) for Electron Microscope

    Terauchi M., Tanaka M., Tsuno K., Kokubo Y., Harada Y.

    1989　(2)　438-438　1989/09/12

    Publisher: The Physical Society of Japan (JPS)

  273. 5a-N-11 Convergent-beam electron diffraction study of a quasicrystal Al_<65>Cu_<15>Co_<28>

    Saito M., Terauchi M., Tanaka M., Inoue A., Masumoto T.

    1989　(3)　175-175　1989/09/12

    Publisher: The Physical Society of Japan (JPS)

  274. SYMMETRIES OF CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS FROM MODULATED STRUCTURES

    M TANAKA, M TERAUCHI

    JOURNAL OF ELECTRON MICROSCOPY　38　(4)　264-264　1989

    ISSN： 0022-0744

  275. 5p-E4-6 収束電子回折による単結晶Al_<65>Cu_<20>Fe_<15>の構造の研究(II)

    斉藤 雅和, 寺内 正巳, 田中 通義, 井上 明久, 増本 健

    秋の分科会講演予稿集　1988　(3)　180-180　1988/09/16

    Publisher: 一般社団法人日本物理学会

  276. 4p-B5-6 準周期構造の収束電子回折

    田中 通義, 寺内 正己

    秋の分科会講演予稿集　1988　(2)　442-443　1988/09/16

    Publisher: 一般社団法人日本物理学会

  277. 6a-B5-2 収束電子回折によるMO_8O_<23>幻の不整合相の研究

    寺内 正己, 田中 通義, 佐藤 正俊

    秋の分科会講演予稿集　1988　(2)　459-459　1988/09/16

    Publisher: 一般社団法人日本物理学会

  278. 3p-B3-4 収束電子回折によるSiO_2の不整合相の研究

    寺内 正己, 田中 通義

    秋の分科会講演予稿集　1988　(2)　70-70　1988/09/16

    Publisher: 一般社団法人日本物理学会

  279. 29p-A-8 入射電子線に垂直な映進面による動力学的消滅則

    寺内 正己, 田中 通義, 関井 宏

    秋の分科会講演予稿集　1987　(2)　423-423　1987/09/16

    Publisher: 一般社団法人日本物理学会

  280. 26a-O-4 ウィーンフィルターを用いた高分解能エネルギー分析電子顕微鏡 I

    寺内 正己, 田中 通義, 津野 勝重, 小久保 靖, 原田 嘉晏

    秋の分科会講演予稿集　1987　(2)　328-328　1987/09/16

    Publisher: 一般社団法人日本物理学会

  281. 26p-E-1 収束電子回折による準結晶の構造の研究 IV

    寺内 正己, 田中 通義, 平賀 賢二, 平林 真

    秋の分科会講演予稿集　1987　(3)　157-157　1987/09/16

    Publisher: 一般社団法人日本物理学会

  282. 27p-PA-4 電子回折法によるYBa_2Cu_3O_<7-y>の研究

    津田 健治, 寺内 正己, 田中 通義, 小野 晃

    秋の分科会講演予稿集　1987　(3)　198-198　1987/09/16

    Publisher: 一般社団法人日本物理学会

  283. 収束電子回折によるMn-Al,Mn-Al-Si準結晶の研究

    田中 通義, 寺内 正己

    固体物理　22　(3)　p193-199　1987/03

    Publisher: アグネ技術センタ-

    ISSN： 0454-4544

  284. 収束電子回折法によるAl-Mn,Al-Mn-Si系準結晶の研究(クエイサイクリスタルの構造と物性,科研費研究会報告)

    田中 通義, 寺内 正巳

    物性研究　48　(2)　A22-A24　1987

    Publisher: 物性研究刊行会

    ISSN： 0525-2997

    More details Close

    われわれは,準結晶の構造を議論するには従来示されているよりももっと詳細で精密な回析図形を操ることが必要であるとの観点から,収束電子回析法と微少領域からの平行電子線による回析法によって準結晶を調べた。

  285. 27a-RB-10 BaPb_<1-x>Bi_xO_3の結晶構造II

    藤木 英夫, 秋光 純, 北村 則久, 寺内 正己, 田中 通義

    秋の分科会講演予稿集　1986　(3)　255-255　1986/09/12

    Publisher: 一般社団法人日本物理学会

  286. 1a-UB-11 収束電子回折によるSrTiO_3の低温相の空間群の研究

    寺内 正己, 田中 通義

    秋の分科会講演予稿集　1985　(2)　97-97　1985/09/13

    Publisher: 一般社団法人日本物理学会

  287. 3a-N-6 大角度収束電子回折における多波回折図形の同時観察法

    寺内 正己, 田中 通義

    秋の分科会講演予稿集　1985　(2)　447-447　1985/09/13

    Publisher: 一般社団法人日本物理学会

  288. 3a-N-5 収束電子回折による正20面体対称をもつ準結晶の構造の研究

    寺内 正己, 田中 通義, 平賀 賢二, 平林 真

    秋の分科会講演予稿集　1985　(2)　447-447　1985/09/13

    Publisher: 一般社団法人日本物理学会

  289. WHOLE PATTERN IN CONVERGENT-BEAM ELECTRON-DIFFRACTION USING THE HOLLOW-CONE BEAM METHOD

    M TANAKA, M TERAUCHI

    JOURNAL OF ELECTRON MICROSCOPY　34　(1)　52-55　1985

    ISSN： 0022-0744

  290. SIMULTANEOUS OBSERVATION OF BRIGHT-FIELD AND DARK-FIELD LARGE-ANGLE CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS

    M TERAUCHI, M TANAKA

    JOURNAL OF ELECTRON MICROSCOPY　34　(2)　128-135　1985

    ISSN： 0022-0744

  291. 4a-M-9 電界放出型電子銃を用いた収束電子回折

    田中 通義, 寺内 正己, 高吉 浩人, 佐藤 二美, 富田 健, 原田 嘉晏

    秋の分科会講演予稿集　1984　(2)　448-448　1984/09/10

    Publisher: 一般社団法人日本物理学会

  292. 5a-C-1収束電子回折によるFe_3O_4の対称性の研究

    田中 通義, 寺内 正己, 東堂 栄

    秋の分科会講演予稿集　1984　(3)　227-227　1984/09/10

    Publisher: 一般社団法人日本物理学会

  293. 2a-M-10 収束電子回折法によるMo_2S_3の低温相の構造の研究

    寺内 正己, 田中 通義, 小林 典明, 古山 正文

    秋の分科会講演予稿集　1984　(2)　169-169　1984/09/10

    Publisher: 一般社団法人日本物理学会

  294. 14a-T-3 Hollow cone beam によるCBED図形の解釈

    田中 通義, 高吉 浩人, 寺内 正己, 近藤 行人, 植野 勝義, 原田 嘉晏

    秋の分科会講演予稿集　1983　(2)　450-450　1983/09/13

    Publisher: 一般社団法人日本物理学会

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Books and Other Publications 10

  1. ナノ電子線分光法を用いた熱線遮蔽フィルター材料の新たな評価技術の開発

    佐藤庸平, 町田佳輔, 寺内正己

    技術情報協会　2020/12

  2. 産業応用を目指した無機・有機新材料創製のための構造解析技術

    高田昌樹, 寺内正己

    シーエムシ―出版　2015/06

    More details Close

    863

  3. やさしい電子回折と初等結晶学（電子回折図形の指数付け、収束電子回折の使い方） 改訂新版

    田中通義, 寺内正己, 津田健治

    共立出版　2014/12

  4. Valence electron spectroscopy for transmission electron microscopy

    Masami Terauchi

    Springer　2014/01

  5. 形の科学百科事典

    津田健治, 齋藤晃, 寺内正己, 田中通義

    朝倉書店　2004/04

  6. Convergent-Beam Electron Diffraction IV

    M.Tanaka, M.Terauchi, K.Tsuda, K.Saitoh

    JEOL-Maruzen　2002/04

  7. やさしい電子回折

    田中通義, 寺内正己, 津田健治

    共立出版　1997/04

  8. Convergent-Beam Electron Dittraction III

    M.Tanaka, M.Terauchi, K.Tsuda

    JEOL-Maruzen　1994/04

  9. Convergent-Beam Electron Diffraction II

    M.Tanaka, M.Terauchi, T.Kaneyama

    JEOL-Maruzen　1988/04

  10. Convergent-Beam Electron Diffraction

    M.Tanaka, M.Terauchi

    JEOL-Maruzen　1985/04

Show all Show first 5

Presentations 209

  1. グラファイトのC-K発光異方性の定量解析

    畠山雄大, 佐藤庸平, 寺内正己

    日本物理学会　2025/03/19

  2. GHzパルス電子線を用いた圧電ナノ薄膜の弾性波励起の研究

    佐藤庸平, 津田健治, Spencer Reisbick, 森川大輔, 寺内正己, Yimei Zhu

    日本物理学会　2025/03/19

  3. 異方的B-K発光計測による結合状態異方性の研究

    羽田有希, 畠山雄大, 寺内正己, 佐藤庸平, 神津薫, 岡田繁

    日本ホウ素・ホウ化物研究会　2025/02/22

  4. 2~4keV領域軟X線高分解能平面結像型ラミナー型多層膜球面回折格子分光器の設計

    小池雅人, 羽多野忠, ピロジコフアレキサンダー, 大上裕紀, 垣尾翼, 近藤公伯, 寺内正己

    日本放射光学会　2025/01/11

  5. SEMを用いた材料の状態分析 Invited

    寺内正己

    日本顕微鏡学会ソフトマテリアル分科会　2024/12/17

  6. ホウ素関連物質合成へのSXES顕微技術の適用 Invited

    寺内正己

    第7回SXESスクール　2024/12/06

  7. 圧力勾配式スパッタ法を用いて作製したアモルファス窒化炭素薄膜の二次電子放出率における投入電力の影響

    青野祐美, 橋本義徳, 東明男, 佐藤庸平, 寺内正己

    ダイヤモンドシンポジウム　2024/11/20

  8. Design of Soft X-Ray Flat-Field Grating Spectrometer Equipped with a Laminar-Type Sherical Gratings having a High-Groove-Density Varied-Line-Spacing (VLS) Grooves that Achieves High Resolution and Graded-Refractive-Index (GRI) Multilayer Coating that Exhibits High Diffraction Efficiency in the 2–4 keV Region

    M.Koike, T.Hatano, A.S.Pirozhkov, T.Murano, Y.Oue, S.Koshiya, T.Kakio, M.Terauchi

    8th QST Int. Symposium　2024/11/14

  9. グラファイトのC-K発光異方性の定量解析

    畠山雄大, 佐藤庸平, 寺内正己

    日本顕微鏡学会　2024/11/02

  10. 1-2keV領域で高効率を呈する軟X線ラミナー型多層膜回折格子の設計と 平面結像型球面回折格子分光器への応用

    小池雅人, ピロジコフ S., アレキサンダー, 羽多野忠, 大上裕紀, 垣尾翼, 寺内正己

    X線分析討論会　2024/11/01

  11. Crystal structure and chemical bonding studies using convergent-beam electron diffraction Invited

    B.Aryal, D.Morikawa, K.Tsuda, M.Terauchi, L.Bourgeois, P.N.Nakashima

    Materials Oceania　2024/09/25

  12. 角度分解SXESによるh-BNの結合異方性の研究

    寺内正己, 畠山雄大, 佐藤庸平

    日本物理学会　2024/09/17

  13. 角度分解SXESによるFe2Bの電子構造の研究

    羽田有希, 佐藤庸平, 寺内正己

    日本物理学会　2024/09/17

  14. 角度分解EELSによるα-AgGaO2の励起子サイズ評価

    斎藤興也, 佐藤庸平, 寺内正己, 小俣孝久, 鈴木一誓, 吉川純

    日本物理学会　2024/09/17

  15. GHzパルス電子線を用いた弾性波励起の研究

    佐藤庸平, 津田健治, Spencer Reisbick, 森川大輔, 寺内正己, Yimei Zhu

    日本物理学会　2024/09/17

  16. 250～550 eV領域において高回折効率とspectral fluxを呈する軟X線平面結像型分光器用のAu/Niラミナー型回折格子の設計

    小池雅人, 羽多野忠, ピロジコフ S., アレキサンダー, 大上裕紀, 村野孝訓, 垣尾翼, 越谷翔悟, 寺内正己

    日本応用物理学会　2024/09/16

  17. 軟X線ホログラフィック不等間隔溝回折格子の開発と高分解能発光分光システムへの応用 Invited

    小池雅人, 寺内正己, 村野孝訓, 大上裕紀, 越谷翔悟, 垣尾翼

    日本分析化学会　2024/09/12

  18. Effects of amorphous structure inhomogeneity of nanoscale to microscale on photoinduced deformation of amorphous carbon nitride thin films

    M.Aono, H.Kishimura, K.Komatsu, Y.Yamamoto, Y.K.Sato, M.Terauchi

    ICDCM2024　2024/09/03

  19. Vacuum ultra violet emission spectra observed by newly designed grating with improved diffraction efficiency

    T.Murano, S.Koshiya, M.Takakura, M.Koike, M.Terauchi

    EMC2024　2024/08/27

  20. Li emission spectra obtained using a new diffraction grating with enhanced diffraction efficiency and widen energy range

    T.Murano, S.Koshiya, M.Takakura, K.Tsuji, K.Kondo, M.Koike, M.Terauchi

    Microscopy and Microanalysis　2024/07/31

  21. Acoustic oscillations on piezoelectric materials excited by a GHz pulsed electron beam

    Y.Sato, K.Tsuda, S.Reisbick, D.Morikawa, M.Terauchi, Y.Zhu

    Microscopy and Microanalysis　2024/07/30

  22. Enhancement of Diffraction Efficiency and Spectral Flux with Quasi-Graded Index Coating (QGIC) on Soft X-ray Laminar-Type Diffraction Gratings Optimized for B-K and Li-K Emissions

    M.Koike, T.Hatano, A.S.Pirozhkov, T.Murano, Y.Oue, S.Koshiya, T.Kakio, M.Terauchi

    7th QST International Symposium　2024/07/24

  23. The evaluation of exciton size by angle-resolved EELS and the role of exciton size in photocatalytic function

    T.Saito, Y.K.Sato, M.Terauchi, T.Omata, I.Suzuki, J.Kikkawa

    EDGE2024　2024/06/10

  24. B-KおよびLi-K発光用の軟X線回折格子の傾斜屈折率分布膜による回折効率の向上

    小池雅人, 羽多野忠, Pirozhkov Alexander, 寺内正己, 越谷翔悟, 村野孝訓, 垣尾翼, 林信和, 大上裕紀, 小西健太, 長野哲也

    日本顕微鏡学会　2024/06/04

  25. GraphiteのC-K発光異方性の高精度定量解析

    畠山雄大, 佐藤庸平, 寺内正己

    日本顕微鏡学会　2024/06/04

  26. 顕微SXESによる材料の構造・機能情報の観察 Invited

    寺内正己

    日本顕微鏡学会　2024/06/04

  27. 角度分解EELSによるβ-CuGaO2の励起子サイズ評価

    斎藤興也, 佐藤庸平, 寺内正己, 小俣孝久, 鈴木一誓, 吉川純

    日本顕微鏡学会　2024/06/04

  28. 電子励起SXESによる吸収効果の利用

    寺内正己

    日本顕微鏡学会　2024/06/03

  29. qEELSによる光エネルギー変換材料β-CuGaO2の電子構造の研究

    大澤優太, 佐藤庸平, 寺内正己, 鈴木一誓, 小俣孝久

    日本顕微鏡学会　2024/06/03

  30. 電子線励起SXESにおける吸収効果の利用 II

    寺内正己, 佐藤庸平

    日本物理学会　2024/03/20

  31. 角度分解SXESによる金属ドープLuAlB4の電子状態の研究

    羽田有希, 中根正勝, 佐藤庸平, 寺内正己, 神津 薫, 岡田 繁

    日本物理学会　2024/03/20

  32. 角度分解EELSによるβ-AgGaO2の励起子サイズ評価

    斎藤興也, 佐藤庸平, 寺内正己, 小俣孝久, 鈴木一誓, 吉川純

    日本物理学会　2024/03/20

  33. q分解EELSを用いたβ-CuGaO2の電子構造の研究 II

    大澤優太, 斎藤興也, 佐藤庸平, 寺内正己, 鈴木一誓, 小俣孝久

    日本物理学会　2024/03/20

  34. 中性子照射黒鉛から生成された圧縮黒鉛のTEM-EELSによる分析

    庭瀬敬右, 大澤優太, 斎藤興也, 佐藤庸平, 寺内正己, 北詰崇, 徳永匠, 肥後祐司, 新部正人, 本多信一

    日本金属学会　2024/03/14

  35. 角度分解SXESによる金属ドープLuAlB4の電子状態の研究

    羽田有希, 中根正勝, 佐藤庸平, 寺内正己, 神津 薫, 岡田 繁

    日本ホウ素・ホウ化物研究会　2024/02/17

  36. 分析電子顕微鏡を用いたホウ素・ホウ化物の電子状態解析 Invited

    寺内正己

    日本ホウ素・ホウ化物研究会　2024/02/16

  37. SXESを用いた解析～大学での応用例～ Invited

    寺内正己

    SXESスクール（Advanced）　2024/01/15

  38. 2~4keV領域軟X線高分散高回折効率傾斜屈折率スーパーミラー型多層膜回折格子の設計

    小池雅人, 羽多野 忠, ピロジコフS.アレキサンダー, 上野良弘, 寺内正己

    日本放射光学会　2024/01/12

  39. SXESとは何か？～電子状態解析～ Invited

    寺内正己

    SXESスクール（Basic）　2023/12/04

  40. アモルファス窒化炭素薄膜における膜厚方向の化学結合状態均一性が光誘起変形に及ぼす影響

    青野祐美, 島宏美, 小松啓志, 佐藤庸平, 寺内正己

    日本応用物理学会　2023/10/20

  41. 2~4keV領域高回折効率高分解能軟X線ラミナー型多層膜回折格子の設計(III)

    小池雅人, 羽多野 忠, ピロジコフS.アレキサンダー, 上野良弘, 寺内正己

    日本応用物理学会　2023/10/19

  42. Enhancement of Diffraction Efficiency and Spectral Flux with Quasi-Graded Index Coating (QGIC) on Soft X-Ray Laminar-Type Diffraction Gratings Optimized for B-K and Li-K Emissions

    M.Koike, T.Hatano, A.S. Pirozkov, M.Terauchi

    PXRNMS 2023　2023/10/11

  43. 軟X線自己吸収構造分析法（SX-SAS）を用いた第1遷移元素のL吸収端近傍構造の観察

    横山隆臣, 越谷翔悟, 村野孝訓, 高橋秀之, 寺内正己

    日本地球化学会　2023/09/23

  44. 電子線励起SXESにおける吸収効果の利用

    寺内正己, 佐藤庸平

    日本物理学会　2023/09/18

  45. 角度分解SXESによるLu(Al0.995Mo0.005)B4の電子構造の研究

    羽田有希, 佐藤庸平, 寺内正己, 神津薫, 岡田繁

    日本物理学会　2023/09/18

  46. q分解EELSを用いたβ-CuGaO2の電子構造の研究

    大澤優太, 斎藤興也, 佐藤庸平, 寺内正己, 鈴木一誓, 小俣孝久

    日本物理学会　2023/09/18

  47. Chemical bonding study of KNbO3 and KTaO3 using QCBED

    B.Aryal, P.N.H.Nakashima, L.Bourgeois, D.Morikawa, K.Tsuda, M.Terauchi

    IMC20　2023/09/14

  48. Examining of the anisotropic behavior of excitons in anatase TiO2 by angle- resolved EELS

    T.Saito, Y.K.Sato, M.Terauchi

    IMC20　2023/09/14

  49. Compressed graphite and its electronic structure investigated by TEM-EELS

    K.Niwase, Y.Ohsawa, Y.K.Sato, T.Saito, M.Terauchi, T.kitazume, T.Tokunaga, Y.Higo, M.Niibe, S.Honda

    33rd International conference on diamond and carbon materials　2023/09/10

  50. Angle-resolved SXES study on anisotropic electronic structure of NaAlSi

    Y.K.Sato, R.Ebisu, M.Terauchi, T.Yamada

    IMC20　2023/09/13

  51. Momentum resolved STEM-EELS analysis of the solute clusters in dilute Mg-Zn-Y alloy

    Y.K.Sato, D.Egusa, H.Miyazaki, K.Kimura, M.Itakura, M.Terauchi, E.Abe

    IMC20　2023/09/11

  52. Crystal structure study of (Sr1-xBax)2Nb2O7 using electron diffraction

    B.Aryal, D.Morikawa, K.Tsuda, S.Tsukasa, Y.Akishige, M.Terauchi

    IUCR 2023　2023/08/26

  53. Observation of temperature-induced piezomagnetic switching in Cu2OSeO3 polymorph synthesized under high-pressure

    H.C.Wu, T.Aoyama, D.Morikawa, D.Okuyama, K.Nawa, W.T.Chen, C.H.Lu, T.W.Yen, S.M.Huang, S.Calder, S.Torii, K.Ohgushi, M.Terauchi, T.J.Sato

    International Conference on Quantum Liquid Crystals　2023/08/09

  54. C-K、N-K、O-K発光対応高spectral fluxラミナー型回折格子の設計

    小池雅人, 羽多野忠, ピロジコフ アレキサンダー, 寺内正己, 越谷翔悟, 村野孝訓, 垣尾翼, 林信和, 大上裕紀, 小西健太, 長野哲也

    日本顕微鏡学会　2023/06/28

  55. 汎用電子顕微鏡に搭載可能な低エネルギー（35V～）帯軟X線発光分光器の開発

    越谷翔悟, 村野孝訓, 高倉優, 小池雅人, 近藤公伯, 寺内正己

    日本顕微鏡学会　2023/06/26

  56. 角度分解EELSによる励起子サイズ評価の研究

    斎藤興也, 佐藤庸平, 寺内正己

    日本顕微鏡学会　2023/06/26

  57. TEM-EELSを用いた圧縮グラファイトの電子構造の研究

    大澤優太, 佐藤庸平, 斎藤興也, 寺内正己, 北詰崇, 徳永匠, 藤井俊治朗, 庭瀬敬右, 新部正人, 本多信一

    日本顕微鏡学会　2023/06/26

  58. 顕微SXESによる光変形アモルファス窒化カーボン膜内の電子状態分布の研究

    寺内正己, 佐藤庸平, 山本康晶, 下野眞裕, 青野祐美

    日本顕微鏡学会　2023/06/26

  59. 角度分解SXES測定によるNaAlSiの異方的電子構造の研究

    佐藤庸平, 戎凌吾, 寺内正己, 山田高広

    日本顕微鏡学会　2023/06/26

  60. The Current Development Status of Electron Beam Induced Soft X-ray Emission Spectrometer

    S.Koshiya, T.Murano, M.Takakura, Y.Kato, H.Takahashi, M.Koike, K.Kondo, T.Hatano, M.Terauchi

    EMAS 2023　2023/05/08

  61. q分解EELSを用いたLSPO型Mg合金のプラズモン分散

    佐藤庸平, 斎藤興也, 寺内正己, 江草大佑, 阿部英司

    日本物理学会　2023/03/22

  62. 角度分解EELSによる励起子サイズ評価の研究

    斎藤興也, 佐藤庸平, 寺内正己

    日本物理学会　2023/03/22

  63. 顕微SXESによる光変形アモルファス窒化カーボン膜内の電子状態の研究

    寺内正己, 佐藤庸平, 山本康晶, 下野眞裕, 青野祐美

    日本物理学会　2023/03/22

  64. 顕微SXESにおける角度分解測定手法の開発III

    戎凌吾, 佐藤庸平, 山田高広, 寺内正己

    日本物理学会　2023/03/22

  65. フラックス法によるMg-B化合物の合成と顕微SXESによる電子構造の研究

    羽田有希, 斎藤興也, 佐藤庸平, 寺内正己, 池田颯, 齊藤大貴, 馬場将亮, 武田雅敏

    日本物理学会　2023/03/22

  66. 圧力勾配式高周波マグネトロンスパッタ法を用いたアモルファス窒化炭素薄膜の作製

    青野祐美, 寺内正己, 森田恭司, 井上祐, 神田一浩

    日本応用物理学会　2023/03/15

  67. フラックス法によるMg-B化合物の合成と顕微SXESによる電子構造の研究

    羽田有希, 斎藤興也, 佐藤庸平, 寺内正己, 池田颯, 齊藤大貴, 馬場将亮, 武田雅敏

    日本ホウ素・ホウ化物研究会　2023/02/11

  68. Improving the precision of electron density analysis using convergent-beam electron diffraction and its application to the ferroelectric phase transition

    B.Aryal, D.Morikawa, K.Tsuda, M.Terauchi

    Australian Conf. on Microscopy & Microanalysis　2023/01/31

  69. 低消衰透明膜の付加による真空紫外/軟X線ラミナー型回折格子の位相格子化と回折効率の向上

    小池雅人, 羽多野忠, ピロジコフアレキサンダー, 上野良弘, 寺内正己

    日本放射光学会　2023/01/09

  70. Electronic structure of Mg-Zn-Y cluster in dilute Mg alloys studied by STEM-EELS

    Y.K. Sato, D.Egusa, H.Miyazaki, K.Kimura, M.Itakura, M.Terauchi, E.Abe

    The 5th International Symposium on Long-Period Stacking/Order Structure and Miile-feuille Structure (LPSO/MFS2022)　2022/12/08

  71. 軟X線顕微計測が世界を変える―放射光技術の商用化で開発加速を― Invited

    寺内正己

    JAIMA未踏分析ウェビナー　2022/12/06

  72. Anisotropic behavior of excitons in anatase TiO2 studied by angle-resolved (AR-) EELS

    T.Saito, Y.K.Sato, M.Terauchi

    2022 ONLINE JOINT SYMPOSIUM Tohoku University & National Taipei University of Technology　2022/11/28

  73. SXESの基礎知識とその利用法―何がどう見えているのか？― Invited

    寺内正己

    SXESスクール　2022/11/25

  74. 「クライオ電子顕微鏡」産業界での利活用 Invited

    寺内正己

    KCみやぎセミナー　2022/11/24

  75. 軟X線スーパーミラー型高回折効率高分解能回折格子の設計

    小池雅人, 羽多野 忠, ピロジコフS.アレキサンダー, 上野良弘, 寺内正己

    X線分析討論会　2022/11/11

  76. 真空紫外/軟X線ラミナー型回折格子への低消衰透明膜のオーバーコートによる回折効率の向上

    小池雅人, 羽多野 忠, ピロジコフS.アレキサンダー, 上野良弘, 寺内正己

    日本分光学会　2022/10/13

  77. 2~4keV領域高回折効率高分解能軟X線ラミナー型多層膜回折格子の設計(II)

    小池雅人, 羽多野 忠, ピロジコフS.アレキサンダー, 上野良弘, 寺内正己

    日本応用物理学会　2022/09/21

  78. STEM-EELSを用いたMg-Zn-Y合金の電子構造の研究

    佐藤庸平, 江草大佑, 木村耕治, 宮崎秀俊, 板倉充洋, 寺内正己, 阿部英司

    日本金属学会　2022/09/21

  79. 3d遷移金属L発光スペクトルの吸収効果を用いた電子状態解析

    寺内正己, 佐藤庸平, 横山隆臣, 村野孝訓

    日本物理学会　2022/09/14

  80. 顕微SXESにおける角度分解測定法の開発II

    戎凌吾, 佐藤庸平, 山田高広, 寺内正己

    日本物理学会　2022/09/14

  81. qEELSを用いたキャリア電子の電子交換相関ポテンシャル評価

    佐藤庸平, 寺内正己

    日本物理学会　2022/09/14

  82. 角度分解EELSによるMg-Zn-Y合金の異方的プラズモンの研究

    斎藤興也, 佐藤庸平, 寺内正己, 江草大佑, 阿部英司

    日本物理学会　2022/09/14

  83. 角度分解EELSによるアナターゼ型TiO2中励起子の実空間分布評価

    斎藤興也, 佐藤庸平, 寺内正己

    日本顕微鏡学会　2022/05/12

  84. 顕微SXESにおける角度分解測定手法の開発

    戎凌吾, 佐藤庸平, 山田高広, 寺内正己

    日本顕微鏡学会　2022/05/11

  85. 電子線分光法によるMg-Zn-Y合金の電子構造の研究

    佐藤庸平, 寺内正己, 江草大佑, 木村耕治, 宮崎秀俊, 板倉充洋, 阿部英司

    日本顕微鏡学会　2022/05/11

  86. AR-EELSを用いたLaB6キャリア電子の電子相関交換効果の研究

    佐藤庸平, 寺内正己

    日本顕微鏡学会　2022/05/11

  87. 3d遷移金属L発光スペクトルからの吸収効果の抽出 II

    寺内正己, 佐藤庸平, 横山隆臣, 村野孝訓

    日本顕微鏡学会　2022/05/11

  88. Li-K発光対応高spectral fluxラミナー型回折格子の設計

    小池雅人, 羽多野忠, ピロジコフS.アレキサンダー, 大上裕紀, 林信和, 寺内正己

    日本顕微鏡学会　2022/05/11

  89. 1-2keV領域高spectral flux・高分解能軟X線ラミナー型多層膜回折格子の設計

    小池雅人, 羽多野忠, ピロジコフS.アレキサンダー, 大上裕紀, 林信和, 寺内正己

    日本応用物理学会　2022/03/24

  90. Charge orbital ordering in A-site ordered NdBaMn2O6 perovskite

    Md S.Islam, D.Morikawa, S.Yamada, K.Tsuda, M.Terauchi

    APS March meeting　2022/03/17

  91. EELSによるMg-Zn-Y合金の異方的電子構造の研究

    佐藤庸平, 寺内正己, 江草大佑, 阿部英司

    日本物理学会　2022/03/16

  92. 顕微SXESにおける角度分解測定手法の開発

    戎凌吾, 寺内正己, 佐藤庸平, 森川大輔, 山田高広

    日本物理学会　2022/03/16

  93. ビームロッキングEDS法による(Ba,Ca)TiO3のCa原子位置の解析

    津田健治, 安住成, Bikas Aryal, 森川大輔, 寺内正己, 大塚真弘, 武藤俊介, 符徳勝, 伊藤満

    日本物理学会　2022/03/15

  94. 顕微SXESの実用化とその材料研究への応用について Invited

    寺内正己

    応用物理学会 光機能研究会　2022/02/25

  95. 刻線密度3200本/mm軟X線ラミナー型回折格子の製作とW/C多層膜による回折効率増大

    羽多野忠, 小池雅人, Alexander S.Pirozhkov, 垣尾翼, 林信和, 笹井浩行, 長野哲也, 寺内正己

    日本放射光学会　2022/01/08

  96. 顕微SXESの基礎知識と利用法 －何をどう見るか？－ Invited

    寺内正己

    SXESスクール　2021/12/01

  97. 耐熱劣化性に優れるポリアミド材料の開発

    奥村知世, 小野尚志, 佐藤幸司, 佐藤庸平, 寺内正己

    ポリマー材料フォーラム

  98. 極端紫外 (EUV) 域低入射角高回折効率ラミナー型回折格子の開発

    小池雅人, 村野孝訓, 越谷翔悟, 羽多野忠, ピロジコフ S, アレキサンダー, 垣尾翼, 林信和, 長野哲也, 寺内正己

    X線分析討論会　2021/11/06

  99. Charge density analysis of NdBaMn2O6 by combination of CBED and DFT calculations

    M.S.Islam, D.Morikawa, K.Tsuda, S.Yamada, M.Terauchi

    日本物理学会　2021/09/23

  100. 3d遷移金属L発光スペクトルからの吸収効果の抽出II

    寺内正己, 佐藤庸平, 横山隆臣, 村野孝訓

    日本物理学会　2021/09/23

  101. 角度分解EELSによるアナターゼ型TiO2中励起子の実空間分布評価

    齋藤興也, 佐藤庸平, 寺内正己

    日本物理学会　2021/09/23

  102. AR-EELSによるLaB6結晶中のキャリア電子の交換相関効果の研究

    佐藤庸平, 寺内正己

    日本物理学会　2021/09/23

  103. 光誘起変形能を有するアモルファス炭素系薄膜のSXESスペクトル

    下野眞裕, 佐藤庸平, 寺内正己, 青野祐美

    日本応用物理学会　2021/09/22

  104. Fe L 発光対応高刻線密度ラミナー型W/C多層膜回折格子の開発

    羽多野忠, 小池雅人, ピロジコフアレキサンダー, 垣尾翼, 林信和, 笹井浩行, 長野哲也, 寺内正己

    日本応用物理学会　2021/09/10

  105. 軟X線発光分光法による鉄系熱安定剤含有ポリアミド材料の熱劣化挙動の解析

    奥村知世, 小野尚志, 佐藤幸司, 佐藤庸平, 寺内正己

    高分子討論会　2021/09/10

  106. 鉱物中の鉄の軟X線自己吸収構造解析法（SX-SAS）

    横山隆臣, 大西市朗, 高橋秀之, 寺内正己

    日本地球化学会　2021/09/06

  107. Improvement of precision and sensitivity in refinement of crystal structure factors using zone-axis and Bragg-excited CBED patters

    B.Aryal, D.Morikawa, K.Tsuda, M.Terauchi

    IUCr 2021　2021/08/15

  108. Fine structures of Fe L-emission examined by a new HR-SXES instrument

    M.Terauchi, R.Ebisu, Y.K.Sato, M.Koike

    Microscopy and Microanalysis　2021/08/03

  109. 収束電子回折法を用いた試料ダメージ層の定量評価 III

    上石正樹, 森川大輔, 佐藤香織, 津田健治, 寺内正己

    日本顕微鏡学会　2021/06/16

  110. 角度分解EELSを用いた熱線遮蔽材料の誘電特性解析 Invited

    佐藤庸平, 町田佳輔, 寺内正己, 足立健治

    日本顕微鏡学会　2021/06/15

  111. ビームロッキングEDS法によるCaドープBaTiO3のCa位置の解析

    安住成, 津田健治, 森川大輔, 寺内正己, 大塚真弘, 武藤俊介, 符徳勝, 伊藤満

    日本顕微鏡学会　2021/06/15

  112. 3d遷移金属L発光スペクトルからの吸収効果の抽出

    寺内正己, 戎凌吾, 佐藤庸平, 横山隆臣, 村野孝訓

    日本顕微鏡学会　2021/06/14

  113. HR-SXESの試作とFe-Lスペクトル測定

    寺内正己, 戎凌吾, 佐藤庸平, 小池雅人

    日本顕微鏡学会　2021/06/14

  114. Chemical State Mapping of Amorphous Carbon and Amorphous Carbon Nitride Thin Films via Soft X-ray and Synchrotron Radiation Infrared Rays

    M. Aono, M. Shimono, H. Kishimura, Y. Sato, M. Terauchi

    14th International conference on New Diamond and Nano Carbons 2020/2021　2021/06/08

  115. SEM-SXESを用いたLiMn1.5Ni0.5O4電極の解析

    岡本遼介, 寺内正己

    電気化学会　2021/03/22

  116. Improvement of accuracy and precision in refinement of crystal structure factors using zone-axis incidence and tilted CBED patters

    B.Aryal, D.Morikawa, K.Tsuda, M.Terauchi

    APS March Meeting　2021/03/19

  117. 刻線密度3200本/mmの軟X線ラミナー型回折格子の製作と評価

    羽多野忠, 小池雅人, ピロジコフアレキサンダー, 垣尾翼, 林信和, 笹井浩行, 長野哲也, 寺内正己

    応用物理学会　2021/03/16

  118. 3d遷移金属L発光スペクトルからの吸収効果の抽出

    寺内正己, 戎凌吾, 佐藤庸平, 横山隆臣, 村野孝訓

    日本物理学会　2021/03/13

  119. TEM-EELS/SXESによる圧縮グラファイトの電子構造の研究

    佐藤庸平, 齋藤興也, 寺内正己, 庭瀬敬右, 本多信一

    日本物理学会　2021/03/13

  120. Structure optimization of NdBaMn2O6 by combination of CBED and DFT calculation

    M.S.Islam, D.Morikawa, K.Tsuda, S.Yamada, M.Terauchi

    2021/03/13

  121. 顕微SXES技術の開発と材料評価への応用 Invited

    寺内正己

    長岡技術科学大学SHARE機器交流会　2020/12/21

  122. SXESの基礎知識と使い方―何をどう見るか？― Invited

    寺内正己

    第3回SXESスクール（オンライン）　2020/12/18

  123. Materials Analysis by using Electron Microscopes operated in IMRAM Invited

    M.Terauchi, H.Jinnai, Y.K.Sato, D.Morikawa, K.Tsuda, Z.Akase

    ONLINE JOINT SYMPOSIUM Engineer a Better Tomorrow　2020/11/30

  124. 角度分解EELSによるTiO2電子構造の研究

    山本剛史, 佐藤庸平, 寺内正己

    日本顕微鏡学会第63回シンポジウム　2020/11/20

  125. Imaging of p/n-type regions in a bulk CaB6 specimen by soft X-ray emission spectroscopy

    M.Terauchi, Y.K.Sato, M.Takeda

    Tohoku-Melbourne online WS　2020/11/09

  126. A Study on Occupation Sites in M6C Carbide in High Chromium Cast Iron Using Statistical Beam-Rocking TEM-EDS Analysis Invited

    S.Nusen, A.Wiengmoon, D.Morikawa, N.Azumi, T.Chairuangsri, K.Tsuda, M.Terauchi

    6th Forum of Center for Advanced Materials Research and International Collaboration　2020/10/01

  127. HR-SXES装置試作と3d遷移金属酸化物のL発光スペクトル測定

    寺内正己, 戎凌吾, 佐藤庸平

    日本物理学会　2020/09/09

  128. 角度分解EELS測定を用いたLaB6結晶のバンド構造解析

    佐藤庸平, 齋藤興也, 寺内正己

    日本物理学会　2020/09/09

  129. 運動量移送分解EELSによるRbタングステン酸化物の誘電応答測定

    町田佳輔, 足立健治, 佐藤庸平, 寺内正己

    日本物理学会　2020/09/09

  130. 角度分解EELSによるTiO2電子構造の研究

    山本剛史, 佐藤庸平, 寺内正己

    日本物理学会　2020/09/09

  131. Improvement in the precision of refinement of the crystal structure factors using convergent-beam electron diffraction

    B.Aryal、D.Morikawa, K.Tsuda, M.Terauchi

    2020/09/09

  132. SXES法を用いた窒化グラファイト薄膜の電子構造の研究

    松浦航人, 佐藤庸平, 寺内正己, 橋本晋, 小川修一, 高桑雄二

    日本顕微鏡学会　2020/05/27

  133. Q分解EELSによるTiO2の誘電特性解析

    佐藤庸平, 山本剛史, 寺内正己

    日本顕微鏡学会　2020/05/27

  134. 収束電子回折法を用いた試料ダメージ層の定量評価II

    上石正樹, 森川大輔, 佐藤香織, 津田健治, 寺内正己

    日本顕微鏡学会　2020/05/26

  135. Fe-L（705eV）発光対応高回折効率・広受光角ラミナー型多層膜回折格子の製作と評価

    小池雅人, 羽多野忠, 寺内正己, Pirozhkov Alexander, 林信和, 笹井浩行, 長野哲也

    日本顕微鏡学会　2020/05/26

  136. Electron density analysis of Potassium Tantalate (KTaO3) using convergent-beam electron diffraction

    B. Aryal, D. Morikawa, K. Tsuda, and M. Terauchi

    2020/03/18

  137. q分解EELSを用いたTiO2 の電子構造の研究

    佐藤庸平、山本剛史、寺内正己

    日本物理学会　2020/03/18

  138. 2-4keV領域高回折効率高分解能軟X線ラミナー型か多層膜回折格子の設計

    小池雅人, 上野良弘, 波多野忠, ピロジコフS.アレキサンダー, 寺内正己

    日本応用物理学会　2020/03/12

  139. 3d遷移金属L発光高感度分光計測のためのラミナー型W/C多層膜回折格子の開発

    羽多野忠, 小池雅人, 寺内正己, A.S.Pirozhkov, 林信和, 笹井浩行, 長野哲也

    日本放射光学会　2020/01/10

  140. Anisotropic Dielectric Properties of Cs-doped Tungsten Oxide Nanoparticles Studied by Electron Energy-loss Spectroscopy International-presentation

    K.Machida, K.Adachi, Y.Sato, M.Terauchi

    MRS 2019　2019/12/02

  141. 熱処理によるグラフェンナノスポンジ形成の機構解明

    野村啓太、西原洋知、田中秀樹、宮脇仁、寺内正己、大友季哉、池田一貴、京谷隆

    炭素材料学会年会　2019/11/30

  142. Anisotropic Electronic Structure of Metal Borides Studied by Soft X-ray Emission Spectroscopy

    T.Ito, Y.Sato, M.Terauchi

    日本顕微鏡学会シンポジウム　2019/11/30

  143. Electronic Structure of Nitrogen-Doped Graphite Films Studied by Soft X-ray Emission Spectroscopy

    K.Matsuura, Y.Sato, M.Terauchi, M.Aono, S.Hashimoto, S.Ogawa, Y.Takakuwa

    日本顕微鏡学会シンポジウム　2019/11/30

  144. Synthesis, Crystal Structure and Properties of Lithium-Ion conducting LiTa2PO8 International-presentation

    N.Ishigaki, K.Kataoka, D.Morikawa, M.Yerauchi, K.Hayamizu, J.Akimoto

    International Japan-Korea Seminar on Ceramics　2019/11/20

  145. ボロンK発光（183eV）分光計測のためのランタン系膜付加による高回折効率・広受光角軟X線ラミナー型回折格子の開発

    小池雅人, 寺内正己, 羽多野忠, 高橋秀之, 村野孝訓, 高倉優, 長野哲也, 笹井浩行, 林信和

    日本応用物理学会関西支部講演会　2019/11/08

  146. ボロンK発光対応増反射膜付加高回折効率軟X線ラミナー型回折格子の開発

    小池雅人, 羽多野忠, 寺内正己, ピロジコフS.アレキサンダー, 林信和, 笹井浩行, 長野哲也

    X線分析討論会　2019/10/30

  147. LaF3- and La/C-coated high efficiency laminar-type diffraction gratings for B K-emission spectroscopy

    T.Hatano, M.Koike, M.Terauchi, A.S.Pirozhkov, H.Nishihara, N.Hayashi, H.Sasai, T.Nagano

    X線結像光学シンポジウム　2019/10/25

  148. Design of Valid Line Spacing Holographic Grating with High Density and Multilayered Enhanced Diffraction Efficiency Laminar-Type Grooves for Flat Field Spectrometer Optimized for 200-900 eV Region

    M.Koike, T.Hatano, M.Terauchi, A.S.Pirozhkov, N.Hayashi, H.Sasai, T.Nagano

    X線結像光学シンポジウム　2019/10/25

  149. Electronic structure of MgB4 studied by EELS and SXES International-presentation

    Y.Sato, T.Saito, K.Tsuchiya, M.Terauchi, H.Saito, M.Takeda

    20th International Symposium on Boron, Borides and Related Materials　2019/09/24

  150. Carrier plasmon of LaB6 studied by momentum transfer resolved EELS International-presentation

    Y. Sato, J. Kamoi, M. Terauchi

    20th International Symposium on Boron, Borides and Related Materials　2019/09/24

  151. Functional imaging of p/n-controlled CaB6 and SrB6 bulk specimens by soft X-ray emission spectroscopy microscope International-presentation Invited

    M. Terauchi, Y. Sato, M. Takeda

    20th International Symposium on Boron, Borides and Related Materials　2019/09/24

  152. 超高圧シュードタキライトとナノダイヤモンド

    西山忠男, 鵜木康平, 西右京, 藤本智也, 吉朝朗, 大藤弘明, 寺内正己

    日本鉱物学会　2019/09/20

  153. 200-900eV域対応高回折効率・広受光角ラミナー型W/C多層膜回折格子の設計（II）

    小池雅人, 羽多野忠, 寺内正己, ピロジコフS.アレキサンダー, 林信和, 笹井浩行, 長野哲也

    日本応用物理学会　2019/09/18

  154. 200-900eV域対応高回折効率・広受光角ラミナー型W/C多層膜回折格子の製作と評価

    羽多野忠, 小池雅人, 寺内正己, ピロジコフS.アレキサンダー, 林信和, 笹井浩行, 長野哲也

    日本応用物理学会　2019/09/18

  155. 電子線分光法を用いたMgB4の電子状態の研究

    佐藤庸平, 斎藤泰樹, 土屋公平, 寺内正己, 斎藤広樹, 武田雅敏

    日本金属学会　2019/09/11

  156. 軟X線発光分光を用いた熱電材料MB6（M=Ca,Sr）の研究

    寺内正己, 佐藤庸平, 武田雅敏

    日本物理学会　2019/09/10

  157. 軟X線発光分光による窒素ドープ黒鉛薄膜の電子状態に関する研究

    寺内正己, 松浦航人, 佐藤庸平, 橋本晋, 小川修一, 高桑雄二

    日本物理学会　2019/09/10

  158. アモルファス炭素（a-C）薄膜の光誘起変形

    青野祐美, 鈴木健太, 北沢伸章, 佐藤庸平, 寺内正己

    日本応用物理学会　2019/08/18

  159. Chemical State Mapping of Amorphous Carbon Films by Soft X-ray Emission Spectroscopy International-presentation Invited

    M. Terauchi, Y. Sato

    Microscopy and Microanalysis　2019/08/08

  160. Information of valence charge of 3d transition metal elements observed in L-emission spectra International-presentation

    M. Terauchi

    Microscopy and Microanalysis　2019/08/05

  161. Design of soft X-ray high diffraction efficiency diffraction gratings with hybrid multilayer coatings in and energy range of 200-900 eV International-presentation

    M.Koike, T. Hatano, A.S.Pirozhkov, M.Terauchi, N.Hayashi, T.Nagano

    Vacuum Ultraviolet and X-ray Physics (VUVX19)　2019/07/01

  162. 機能性アモルファス窒化カーボン膜の軟X線発光分光による研究

    寺内正己, 石井信伍, 佐藤庸平, 青野祐美, 阿部洋

    物質・デバイス領域共同研究拠点活動報告会　2019/07/01

  163. 収束電子回折法を用いた試料ダメージ層の定量評価

    上石正樹, 森川大輔, 佐藤香織, 津田健治, 寺内正己

    日本顕微鏡学会　2019/06/18

  164. Fe-K(705 eV)対応高回折効率・広帯域軟X線ラミナー型多層膜回折格子の設計

    小池雅人, 羽多野忠, ピロジコフS.アレキサンダー, 寺内正己, 林信和, 笹井浩行, 長野哲也

    日本顕微鏡学会　2019/06/18

  165. SXESを用いたCaB6バルク材料の評価

    寺内正己, 佐藤庸平, 武田雅敏

    日本顕微鏡学会　2019/06/18

  166. 3d遷移金属元素のL発光スペクトルに含まれる情報

    寺内正己

    日本顕微鏡学会　2019/06/18

  167. qEELSを用いたシリコンクラスレート化合物のキャリア特性の研究

    佐藤庸平, 岩下哲士, 寺内正己, 森戸春彦, 山根久典

    日本顕微鏡学会　2019/06/18

  168. Recent Progresses in Soft X-ray Emission Spectroscopy International-presentation Invited

    M. Terauchi, T. Hatano, M. Koike, Alexander S. Pirozhkov, H. Sasai, T. Nagano, M. Takakura, T. Murano

    EMAS 2019　2019/05/23

  169. ホウ素-K発光分光のための酸化物膜付加による高回折効率ラミナー型回折格子

    小池雅人, 羽多野忠, Alexander S. Pirozhkov, 寺内正己, 浮田龍一, 西原弘晃, 笹井浩行, 長野哲也

    日本分光学会　2019/05/14

  170. 5V級正極活物質LiMn1.5Ni0.5O4の抵抗と結晶構造の関係

    岡本遼介, 松本哲, 鈴木奈緒美, 林一英, 寺内正己

    電気化学会　2019/03/27

  171. LiMn1.5Ni0.5O4のMn,Ni規則配列によるドメイン構造の観察

    岡本遼介, 鈴木奈織美, 松本哲, 林一英, 津田健治, 寺内正己

    日本セラミック協会　2019/03/24

  172. Na-Ga-Si三元系クラスレートの結晶構造および電子状態解析

    森戸春彦, 漆山宏直, 寺内正己, 藤原航三

    日本金属学会　2019/03/21

  173. 運動量移送分解EELSによる機能性材料中のキャリア電子特性の研究 Invited

    佐藤庸平, 岩下哲士, 町田佳輔, 寺内正己, 森戸春彦, 山根久典, 足立健治

    日本金属学会　2019/03/21

  174. EELSを用いたSiクラスレート化合物の電子構造の研究

    岩下哲士, 佐藤庸平, 寺内正己, 森戸春彦, 山根久典

    日本顕微鏡学会関東支部講演会　2019/03/16

  175. qEELSを用いたルチル・アナターゼの電子構造の研究

    佐藤庸平, 寺内正己

    日本物理学会　2019/03/15

  176. ボロンK発光（183eV）分光計測のための酸化物膜付加による高回折効率・広受光角軟X線ラミナー型回折格子の開発

    小池雅人, 羽多野忠, ピロジコフS.アレキサンダー, 寺内正己, 浮田龍一, 西原弘晃, 笹井浩行, 長野哲也

    量子ビームサイエンスフェスタ　2019/03/12

  177. 軟X線発光分光および高輝度赤外光を用いたアモルファス窒化炭素薄膜の化学結合状態評価

    青野祐美, 岸村浩明, 北沢伸章, 石井信伍, 佐藤庸平, 寺内正己

    日本応用物理学会　2019/03/09

  178. 200~900eV域対応高回折効率・広受光角軟X線ラミナー型W/C多層膜回折格子の設計

    小池雅人, 羽多野忠, ピロジコフS.アレキサンダー, 寺内正己, 林信和, 笹井浩行, 長野哲也

    日本応用物理学会　2019/03/09

  179. SXESを用いたCaB6バルク材料の評価

    寺内正己, 佐藤庸平, 武田雅敏

    日本ホウ素・ホウ化物研究会　2019/02/23

  180. Soft X-ray emission spectroscopy for chemical state analysis International-presentation Invited

    TERAUCHI Masami

    XVth Australian Microbeam Analysis Society symposium　2019/02/13

  181. Introduction to soft-X-ray emission spectroscopy with electron microscope and historical perspective International-presentation Invited

    TERAUCHI Masami

    Work shop of Australian Microbeam Analysis Society　2019/02/11

  182. ボロンK-発光高感度分光計測のためのLa膜付加高効率回折格子の開発

    羽多野忠, 小池雅人, 西原弘晃, A.S.Pirozhkov, 寺内正己, 笹井浩行, 長野哲也

    日本放射光学会　2019/01/09

  183. 超高圧変成岩と超高圧クロミタイト：日本からの最初の報告とその意義

    西山忠男, 吉朝朗, 大藤弘明, 寺内正己

    東北大学金属材料研究所共同利用ワークショップ　2018/12/13

  184. SXESの基礎と使い方 Invited

    寺内正己

    SXESスクール2018　2018/11/30

  185. 増反射膜付加高回折効率・広受光角軟X線ラミナー型回折格子の最適設計

    小池雅人, 羽多野忠, ピロジコフアレキサンダー, 寺内正己, 西原弘晃, 笹井浩行, 長野哲也

    X線分析討論会　2018/10/25

  186. Snフラックスを用いたNa-Ga-Siクラスレートの単結晶育成

    漆山宏直, 森戸春彦, 山根久典, 寺内正己

    日本金属学会　2018/09/19

  187. ボロンK発光計測のための反射増加膜付加高回折効率・広受光角軟X線ラミナー型回折格子の設計指針

    小池雅人, 羽多野忠, ピロジコフアレキサンダー, 寺内正己, 西原弘晃, 笹井浩行, 長野哲也

    日本応用物理学会　2018/09/18

  188. ボロンK発光計測のためのランタン膜付加高回折効率・広受光角ラミナー型回折格子の製作と評価

    羽多野忠, 小池雅人, 西原弘晃, ピロジコフアレキサンダー, 寺内正己, 笹井浩行, 長野哲也

    日本応用物理学会　2018/09/18

  189. 軟X線発光分光によるDLCの電子状態研究III

    寺内正己, 小川修一, 橋本晋, 高桑雄二

    日本物理学会　2018/09/10

  190. 軟X線発光分光による熱電材料CaB6の研究

    寺内正己, 佐藤庸平, 武田雅敏

    日本物理学会　2018/09/10

  191. q-EELSによるSiクラスレート化合物の電子構造の研究

    岩下哲士, 佐藤庸平, 寺内正己, 森戸春彦, 山根久典

    日本物理学会　2018/09/10

  192. Momentum transfer resolved EELS study of anisotropic carrier plasmon in Cs0.33WO3 International-presentation

    Y. Sato, M. Terauchi, K. Adachi

    19th International Microscopy Congress (IMC19)　2018/09/09

  193. Soft-X-ray emission spectroscopy with electron micrscopy and its applications for materials characterization Invited

    第42回KPSIセミナー　2018/08/24

  194. Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES International-presentation

    M. Terauchi, Y. Sato, M. Takeda, T. Hatano, M. Koike, H. Sasai, T. Nagano, M. Koeda, T. Murano, H. Takahashi

    Microscopy & Microanalysis　2018/08/08

  195. Enhancement of diffraction efficiency and spectral flux of laminar-type diffraction gratings coated with Ni/La/C layers in soft X-ray region International-presentation

    T. Hatano, M. Koike, H. Nishihara, A.S. Pirozhkov, M. Terauchi, H. Sasai, T. Nagano

    13th Int. Conf. on Synchrotron Radiation Instrumentation　2018/06/11

  196. qEELSを用いたLaB6キャリアープラズモンの研究

    佐藤庸平, 鴨居潤一, 寺内正己

    日本電子顕微鏡学会　2018/05/31

  197. SXESによる低融点Au-Siの電子状態の研究

    梅本直也, 寺内正己, 佐藤庸平, 上石正樹, 蔡安邦

    日本電子顕微鏡学会　2018/05/31

  198. SXESによるDLCの電子状態の研究

    寺内正己, 小川修一, 橋本晋, 高桑雄二

    日本電子顕微鏡学会　2018/05/31

  199. ボロン-K発光分光分析用酸化物付加軟X線回折格子の回折効率評価

    小池雅人, 羽多野忠, ピロジコフアレキサンダー, 寺内正己, 西原弘晃, 浮田龍一, 笹井浩行, 長野哲也

    日本電子顕微鏡学会　2018/05/30

  200. High-Diffraction-Efficiency Wide-Acceptance-Angle Laminar-Type Diffraction Gratings Overcoated with Oxide Films for Boron-K Emission Spectroscopic Measurements

    M.Koike, T.Hatano, A.S.Pirozhkov, M.Terauchi, R.Ukita, H.Nishihara, H.Sasai, T.Nagano

    光・量子ビーム科学合同シンポジウム　2018/05/08

  201. Electron diffraction study of crystal structures of (Sr1-xBax)2Nb2O7

    B.Aryal, K.Tsuda, M.Terauchi, S.Tsukada, Y.Akishige

    日本物理学会　2018/03/24

  202. 軟X線発光分光によるDLCの電子状態研究 II

    寺内正己, 小川修一, 橋本晋, 高桑雄二

    日本物理学会　2018/03/22

  203. qEELS測定による電子ドープWO3材料の電子構造の研究

    佐藤庸平, 寺内正己, 足立健治

    日本物理学会　2018/03/22

  204. 軟X線発光分光法と走査型電子顕微鏡を用いた光照射下でのアモルファス窒化炭素薄膜の電子状態測定

    青野祐美, 阿部洋, 石井信伍, 佐藤庸平, 寺内正己

    日本応用物理学会　2018/03/17

  205. SXESによるアモルファスCNｘ膜の電子状態と物性の相関の研究

    石井信吾, 寺内正己, 佐藤庸平, 青野祐美, 阿部洋

    日本顕微鏡学会関東支部講演会　2018/03/10

  206. qEELSを用いたLaB6キャリアープラズモンの研究

    鴨居潤一, 佐藤庸平, 寺内正己

    日本顕微鏡学会関東支部講演会　2018/03/10

  207. 酸化物膜を付加した高回折効率軟X線ラミナー型回折格子の評価

    小池雅人, 羽多野忠, Alex S. Pirozhkov, 寺内正己, 西原弘晃, 浮田龍一, 笹井浩行, 長野哲也

    日本放射光学会　2018/01/08

  208. 低融点Au-Si合金中のSiの電子状態の研究

    梅本直也, 寺内正己, 蔡安邦

    多元物質科学研究所2017年研究発表会　2017/12/04

  209. 角度分解EELSによるアナターゼ型TiO2中励起子の実空間広がり評価

    斎藤興也, 佐藤庸平, 寺内正己

    日本顕微鏡学会シンポジウム

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Research Projects 29

  1. アモルファス炭素系薄膜の三次元構造不均一性と光誘起変形

    青野 祐美, 島 宏美, 寺内 正己, 佐藤 庸平

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業 基盤研究(A)

    Category: 基盤研究(A)

    Institution: 鹿児島大学

    2022/04 - 2027/03

  2. 3d遷移金属元素の酸化状態・スピン状態イメージング法の開拓 Competitive

    寺内 正己

    Offer Organization: 文部科学省

    System: 科学研究費 挑戦的研究（萌芽）

    2019/06 - 2021/05

  3. 格子欠陥（ナノ双晶）とバルク金属触媒の活性起源 Competitive

    蔡 安邦

    Offer Organization: 文部科学省

    System: 科学研究費 基盤研究（A）一般

    2015/04 - 2019/03

  4. Local structure analysis and polarization mapping of polarization nano domains of ferroelectrics using STEM-CBED

    Tsuda Kenji, TERAUCHI Masami, NISHIMATSU Takeshi

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for Scientific Research (B)

    Institution: Tohoku University

    2013/04/01 - 2016/03/31

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    A new method has been developed for investigating two-dimensional distributions of nanometer-scale local structures, with the combined use of scanning transmission electron microscopy and convergent-beam electron diffraction (STEM-CBED). The STEM-CBED system was constructed on an energy-filter transmission electron microscopy JEM-2010FEF. The method was applied to perovskite-type ferroelectrics such as barium titanate (BaTiO3), nanometer scale local structures were investigated below and above their ferroelectric phase transitions. Nanometer-scale fluctuations of polarization clusters were successfully observed

  5. Structure analysis of ferroelectric domain walls using coherent convergent-beam electron diffraction

    TSUDA Kenji, TERAUCHI Masami, NISHIMATSU Takeshi

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for Challenging Exploratory Research

    Institution: Tohoku University

    2013/04/01 - 2015/03/31

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    We have attempted to develop a method using the coherent CBED technique, which observes interference fringes appearing in overlapping areas of adjacent CBED disks. We performed coherent CBED experiments to observe ferroelectric domain boundaries of hexagonal YMnO3, using a TEM equipped with a cold-type field emission electron gun, a spherical aberration corrector and an Omega-type energy-filter. Phase differences due to the structure of the domain boundary have been first observed in the interference fringes. A software to simulate coherent CBED patterns at domain boundaries has been developed on the basis of the multiple scattering (dynamical diffraction) theory. Applications of the CBED method to phase transition materials were also conducted.

  6. ナノスケール軟X線分析システムの開発 Competitive

    高橋秀之

    Offer Organization: 日本科学技術振興機構

    System: 産学共同シーズイノベーション化事業（育成ステージ）

    2008/10 - 2012/03

  7. 配列ナノ空間を利用した新物質科学－ユビキタス元素戦略 Competitive

    谷垣勝己

    Offer Organization: 文部科学省

    System: 科学研究費補助金 特定領域研究

    2007/10 - 2012/03

  8. Electron-beam analyses of crystal- and electronic-structures

    TERAUCHI Masami, TSUDA Kenji, OGATA Yoichiro, SATO Yohei

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for Scientific Research on Priority Areas

    Institution: Tohoku University

    2007 - 2011

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    Base on transmission electron microscopy technique, high-quality specimen areas were examined by using CBED, EELS and SXES methods. Characteristic electronic states of boron nano-belt, zeolite-templated carbon, polymerized C_<60>, Li-doped α-rhombohedral boron and MgB_4 were revealed. Improvements of anisotropic valence charge density analyses by CBED and SXES, and optical properties of nano-partucles by EELS were also done.

  9. Electrostatic potential analysis of ferroelectric domains using convergent-beam electron diffraction

    TSUDA Kenji, TERAUCHI Masami

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for Scientific Research (B)

    Institution: Tohoku University

    2008 - 2010

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    An electrostatic potential analysis method using convergent-beam electron diffraction has been successfully developed, which enables us to determine electrostatic potential distribution from a nanometer-scale specimen area. Using this method, ferroelectric polarizations of ferroelectric materials such as LiNbO3 were observed through electrostatic potential. The method was also applied to visualization of orbital ordered states of 3d electrons in strongly-correlated electron systems.

  10. ナノスケール電子状態分析技術の実用化開発（軟X線発光分光器の実用化開発） Competitive

    寺内正己

    Offer Organization: 文部科学省

    System: リーディングプロジェクト

    2004/10 - 2007/03

  11. Development of a nanoscale point-defect analysis method using convergent-beam electron diffraction and its application to point-defect-induced properties

    TSUDA Kenji, TERAUCHI Masami

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for Scientific Research (C)

    Institution: Tohoku University

    2005 - 2006

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    The present research project aimed to develop a method to quantitatively analyze the atomic structure and distribution of point defects and the local lattice strain of their surrounding areas in a nanometer-scale spatial resolution. Impurity-doped Si was used as a test specimen containing point defects, in which anomalous intensity increase was found in rocking curves of low-order reflections of convergent-beam electron diffraction (CBED) patterns. In order to clarify the relationship between the anomalous intensity and the strain due to point defects, the intensities of the anomalous rocking curves were measured from specimens with various doping amounts using an energy-filter transmission electron microscope. The specimen preparation method not to cause the anomalous intensity was established. It was also found that the anomalous intensity increase can be caused by not only doped impurity atoms but also the atoms and small clusters induced by ion implantation. Simulation programs for the rocking curves was developed based on the statistical-dynamical diffraction theory, the multi-slice method and the Howie-Whelan's method. Simulations of rocking curves were performed using various strain distribution models and were compared with the experimental data. As a result, we have demonstrated that the anomalous CBED rocking curves can be explained by a strain-relaxation model with lattice bending. This implies that the CBED rocking curves of the low-order reflections can be successfully used for the determination of local strain distributions with a nanometer-scale spatial resolution. Local lattice strains of semiconductor devices have been so far examined using higher-order Laue zone (HOLZ) line patterns of CBED. The present method enables us to analyze such highly strained areas as HOLZ lines are blurred or unclear, to which the HOLZ line method cannot be applied.

  12. DF004法によるデバイス中ドープ元素の定量解析法の開発 Competitive

    寺内正己

    Offer Organization: 文部科学省

    System: 科学研究費補助金 萌芽研究

    2003/04 - 2005/03

  13. 高エネルギー分解能ナノスケール軟X線発光分光系の試作研究 Competitive

    寺内正己

    Offer Organization: 文部科学省

    System: 科学研究費 基盤研究（B）展開

    2001/04 - 2004/03

  14. 機能性セラミック材料のナノ構造・電子状態の研究

    寺内 正己, THEISSMANN Ralf

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業

    Category: 特別研究員奨励費

    Institution: 東北大学

    2003 - 2003

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    1.結晶性が良いヘマタイト(Fe_2O_3)粒子の生成条件を見つけるため、FeCl_3、H_2O、NH_4OHを出発物質とした水熱合成法の条件を色々と変化させてヘマタイト合成を行った.合成した試料を電子顕微鏡で粒径の評価を行いながら実験を繰り返した結果、温度:100-200度、合成時間:約170時間(7日間)の合成条件で、200-300nmの粒径からなる単相のヘマタイト試料を得られることが明らかになった. 2.合成したヘマタイト粒子を電子顕微鏡像および電子回折図形で評価し、良質な単結晶と判断された.しかし、収束電子回折図形による高精度の結晶性評価から、ヘマタイト粒子の中心付近には格子の乱れが存在することが明らかになった.これは、直径10nm以の粒子が集まって大きな粒子が生成されるという成長過程における微粒子同士の界面に起因するものと考えられる. 欠陥の無い領域から得た分光収束電子回折図形を撮影し、高次回折強度の解析による結晶構造精密解析を行うと同時に、低次結晶構造因子の精密化による価電子の空間分布解析を行った. 3.Fe_2O_3粒子と同じ合成条件を用い、(Fe_<1-x>Al_x)_2O_3(x=0.05,0.1),(Fe_<1-x>Cr_x)_2O_3(x=0.05,0.1)の元素置換をした試料の作成に成功した.電子顕微鏡像、電子回折図形、収束電子回折図形および放射光施設での粉末X線回折実験で試料の評価を行った.その結果、A1置換した試料Fe_2O_3粒子と同程度の結晶性の単相試料が得られるが、Cr置換した試料では結晶性が劣りかつ単相試料を得ることが困難であることが分かった.

  15. ナノスケール軟X線分光系の開発と電子系励起状態研究への応用 Competitive

    寺内正己

    Offer Organization: 文部科学省

    System: 科学研究費 基盤研究（B）一般

    2000/04 - 2002/03

  16. STRUCTURE ANALYSIS OF DECAGONAL QUASICRYSTALS USING THE HIGH-ANGLE ANNULER DARK-FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPE METHOD.

    TANAKA Michiyoshi, SAITOH Koh, TSUDA Kenji, TERAUCHI Masami

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for Scientific Research (A).

    Institution: Tohoku University

    1999 - 2000

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    ○Al_<72>Ni_<20>Co_8, Al_<73>Ni_<22>Fe_5 decagonal quasicrystals We, using the HAADF method, revealed that the atom cluster of an Al_<72>Ni_<20>Co_8 decagonal quasicrystal, which had been believed to be of tenfold rotation symmetry, is not of tenfold but of mirror symmetry for the first time, Furthermore, we found that Al_<72>Ni_<20>Co_8 is composed of basic atom clusters, which exist in a basic quasicrystalline approximant of monoclinic Al_<13>Fe_4. On the basis of the approximant structure, a new structural model of Al_<72>Ni_<20>Co_8 was constructed. It was also found using the HAADF method that an Al_<73>Ni_<22>Fe_5 decagonal quasicrystal has a similar structure to that of Al_<72>Ni_<20>Co_8. ○Al-Ni-Fe non-centrosymmetric decagonal quasicrystal We previously found, by conventional high-resolution electron microscopy, that an Al_<70>Ni_<15>Fe_<15> quasicrystal is formed by an atom cluster with fivefold rotation symmetry. We applied the HAADF method to the quasicrystal for the first time, and verified that the atom cluster is truly of fivefold symmetry. Furthermore, a structural model was constructed on the basis of the HAADF image and an approximant structure. The direct observation of an antiphase shift at an inversion domain boundary, which had not been carried out, was successfully performed by the HAADF method. ○Al-Fe and Al-Co crystalline approximants From the HAADF observations of an Al_<13>Fe_4 crystalline approximant, whose structure was already solved, it was confirmed that the HAADF images exhibit transition-metal-atom positions selectively. We found that HAADF images of a O^2-inflated Al_<13>Co_4 approximant show a similar image of the 2nm-diameter atom-clusters of decagonal quasicrystals. On the basis of the HAADF images and the structure of Al_<13>Fe_4, a structural model of O^2-inflated Al_<13>Co_4 approximant was constructed. Furthermore, by the comparison between the decagonal quasicrystal and its approximant structures, a formation model of decagonal quasicrystals from the O^2-inflated Al_<13>Co_4 was proposed.

  17. 高分解能電子エネルギー損失分光法によるBNチューブの電子構造の研究

    寺内 正己, 津田 健治

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業

    Category: 特定領域研究(A)

    Institution: 東北大学

    1999 - 2000

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    1.昨年度、新たに見出したBNコーンの先端部分と底の部分から高分解能EELS測定に成功し、バルクのBNよりもコーンの底の部分ではバンドギャップエネルギーが小さくなっているが、先端部ではさらに小さくなっていることが実験的に明らかにした。この現象は、これまでのBNナノチューブの実験結果"径の小さなBNナノチューブほどバンドギャップエネルギーが小さい"と同じであると解釈できることがわかった。 2.1.のBNコーンとBNナノチューブのバンドギャップエネルギーに関する特徴は"BNシートでは、バンドギャップはブリルアンゾーン境界にあり、そこでは価電子帯はN原子の電子軌道のみからできており伝導帯はB原子の電子軌道からのみできている"というBNシート特有の電子状態の結果として解釈できることが明らかになり、カーボンシートからできているカーボンナノチューブやカーボンコーンには期待できないことが明らかになった。 3.BNシートの端が露出しているBNコーンの底部分では、伝導帯に特徴的な状態密度分布が存在することが実験的に明らかになった。DV-Xα法を用いたBNシートの電子状態計算から、特徴的な状態密度が、BNシート端に局在するエッジ状態に起因することが明らかになった。 4.半導体であるボロンの超伝導化として期待されているLiドープαボロンは大きな単結晶が得られていない。われわれの開発してきた高分解能EELS電子顕微鏡を用いることで、初めてLiドープαボロン単結晶の高分解能EELS測定に成功し、フェルミ面の存在を明らかにした。すなわち、Liドープによりα-ボロンが金属化していることを実験的に明らかにした。

  18. ナノスケール電子分光法の新展開と先端材料への応用

    田中 通義, 弘津 禎彦, 進藤 大輔, 田中 信夫, 寺内 正己, 山本 直紀

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業

    Category: 基盤研究(C)

    Institution: 東北大学

    1999 - 1999

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    本企画調査研究では、近年の先端材料のナノスケール化に伴って社会的要請が高まっている"ナノスケール電子分光法"の組織的研究を展開するための調査を行った。 (1)国際会議の機会を使い先進的な研究室を訪問して現地調査を行った結果、海外でもナノスケール電子分光法確立の組織的研究が始まろうとしている事がわかった。 (2)2回の会合を開いて各々の研究者が扱うナノ先端材料についての電子分光法および分光電子顕微鏡法の有用性及び可能性を検討し、今後の電子分光研究の問題点を議論した。その結果、ナノレベルの電子構造を解明する新しい固体物性評価法の確立は、ナノスペクトロスコピーの基礎研究の発展のみならず、新素材の開発・応用における日本の国際競争力の強化に不可欠であるとの結論に達した。 (3)(1),(2)の結果に基づき、ナノスケール電子分光法の組織的研究のための組織案を作った。それに基づき、平成12年度発足特定領域研究(B)の申請を行った。申請領域名は「ナノスケール電子分光法の確立とその新機能材料への応用」(代表:田中通義)である。 さらに、 (4)新しい組織案に基づき・国内の電子分光研究者を一堂に会した研究会を仙台で開催した。そこでは、 ・新しい電子分光法開発の現状把握と、電子分光研究の問題点・将来展望 ・異なる研究グループの得意な技法およびノウハウの公開 ・理論グループと実験グループの情報交換のための電子メールリストの公開 等を議論して決めた。

  19. High energy-resolution EELS study of the electronic structure of nanotubes

    TERAUCHI Masami

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for Scientific Research (C)

    Institution: TOHOKU UNIVERSITY

    1998 - 1999

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    Results obtained are as follows. (1) The special resolution of a high energy-resolution EELS microscope was greatly impoved from 180nm to 35nm in diameter by using an aperture of 1μm in diameter. (2) EELS spectra were obtained from a tip and a body areas of one carbon nanotube. It was revealed that the density of stated of the π*-band is different from that of graphite. (3) EELS spectra were obtained from single BN nanotubes. It was found that the bandgap energies of BN nanotubes were smaller than that of hexagonal BN by an amount of 0.7eV. Intensity distributions of the plasmon peak were well explained not by a volume loss-function but by a surface loss-function. (4) EELS spectra of dimer-, one-dimensional- and two-dimensional-polymerized CィイD260ィエD2 were obtained from single crystalline areas for the first time. The bandgap energies of the materials were smaller than that of monomer CィイD260ィエD2 single crystal by an amount of 0.1-0.3eV. Intensity distributions of π to π* interband transitions was broader than that of monomer CィイD260ィエD2. Those results were explained by a deformation of CィイD260ィエD2 cluster due to the polymerization.

  20. Symmetry Determination of Single and Double Crystals by CBED

    TANAKA Michiyoshi, GOODMAN Peter, SAIYOH Koh, TSUDA Kenji, TERAUCHI Masami

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for international Scientific Research

    Institution: Research Institute for Scientific Measurements, Tohoku University

    1998 - 1998

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    It has been established that convergent-beam electron diffraction (CBED) is quite an effective method for determining crystal point groups and space groups. CBED allows the unique identification of all the 32 point groups and 200 space groups among 230 space groups. However, the other 30 space groups have still remained to be indistinguishable. In the present research, we have newly applied the coherent CBED method to distinguish the remaining space groups. The coherent CBED technique observes interference fringes appearing in the overlapping regions of CBED disks using an high coherency electron source (i.e., field-emission gun), and directly provides phase information of crystal structures. We have applied the method to two pairs of space groups (I23, I2_13) and (I222, I2_12_12_1), which belong to indistinguishable sets because of their same kinematical extinction and no dynamical extinction. We have first discovered that the coherent CBED method can elucidate site symmetries of crystals with respect to the electron prove position. We have successfully proved that coherent CBED can distinguish the space groups of (I23, I2_13) and (I222, I2_12_12_1) through investigating their site symmetries in their unit cells. The present research was carried out in close cooperation with Dr.P.Goodman (University of Melbourne, Australia) and Dr.C.J.Rossouw (CSIRO, Australia).

  21. Development of a nm-scale crystal structure refinement method

    TANAKA Michiyoshi, SAITOH Koh, TSUDA Kenji, TERAUCHI Masami

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for Specially Promoted Research

    Institution: RESEARCH INSTITUTE FOR SCIENTIFIC MEASUREMENTS,TOHOKU UNIVERSITY

    1994 - 1997

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    In materials science at the present time, how to control nm-scale structures of materials is the most important research theme. Crystal structure analysis in nm-scale is indispensable to solve the question. The aim of the present research is to develop an accurate crystalstructure refinement method for nm-diameter specimen areas using convergent-beam electron diffraction (CBED), and to apply using method to the determination of detailed structures of real quasicrystals. To rearize the method, a new electron microscope equipped with a field-emission gun, an omega type filter to remove inelastically scattered electrons, an imaging plate and a CCD electron detection system was developed. This microscope took an epoch-making step forward to allow remote computer control and simultaneous observation of electron microscope images at different places using an internet system. We developed a structure refinement software based fully upon the dynamical theory of electron diffraction, which makes possible two dimensional fitting of CBED patterns. We performed a structure refinement of a noncentrosymmetric material CdS.We determined the positional parameter of sulfur u to be 0.378 and two Debye-Waller factors of cadmium and sulfur B(Cd) and B(S) respectively to be 1.35 and 1.14. These values well agree with X-ray values of u=0.3771, B(Cd)=1.4 and B(S)=1.1. The success of the structure refinement of Cd S proved that the accurate structure refinement by CBED is practically useful for materials science. We discovered new structural features of decagonal quasicrystals which correct the results already accepted. That is, the 2nm-cluster, which was considered to be a basic unit of the decagonal quasicrystal, can be decomposed into two smaller clusters of about a 0.4nm diameter. These two clasters are very similar to those existing in the approximant crystal. This provided the guiding principle that the quasicrystal can be considered on the basis of the crystal structure of the approximant. We are in the course of structure analysis by applying the high-dimensional crystallography.

  22. コヒーレント収束電子回折による結晶構造因子の位相決定法の開発

    田中 通義, 細川 史生, 津田 健治, 寺内 正巳

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業

    Category: 試験研究(B)

    Institution: 東北大学

    1993 - 1994

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    イメージングプレート用カメラを試作し、そのテストを行った。動作は良好である。イメージングプレートはフィルムに比べて高感度なので露出時間が短くて済み、電気的、機械的ドリフトの影響を小さくすることができた。またコンピューターにディジタル画像として回折図形をとりこむことができるので、画像処理が容易に行えるようになり、必要な情報を有効に取り出すことができるようになった。コヒーレントビームによる予備的干渉実験を行った。鏡映面、映進面の対称性を干渉縞として検出することに成功した。すなわち、鏡映面のないSr_2Nb_2O_7では干渉縞は非対称に現れ、鏡映面のあるSr_2Ta_2O_7では干渉縞が対称に現れることを確認した。映進面のあるFeS_2では運動学的に消滅する反射内に反位相ずれた縞を観察することに成功した。どのくらい小さな面間隔からの干渉縞を得ることができるかが今度の応用のために大きな課題である。われわれは現在、世界最高の2.7A干渉縞の観察に成功した。また1次元的な干渉縞ばかりでなく2次元的な干渉縞を得ることにも成功した。さらに、回折の動力学的理論に基づくシュミレーションによって干渉縞の再現と動力学的効果の検出に成功した。これらの成果は 1)Journal Electron Microscopyと2)Ultramicroscopyに投稿した。1994年7月パリで開催される国際電子顕微鏡学会で成果を報告するため講演を申し込んだ。日本電子顕微鏡学会誌から"コヒーレント収束電子回折法"の執筆を依頼された。

  23. 透過型高分解能エネルギー損失分光による高温超伝導体の電子構造の研究

    田中 通義, 津田 健治, 寺内 正己

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業

    Category: 重点領域研究

    Institution: 東北大学

    1993 - 1994

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    透過型電子エネルギー損失分光(EELS)による高温超伝導体の電子構造の研究はドイツのカールスルーエ大学のFinkらによってなされてきた。かれらは、EELSスペクトルの1.2eV付近にフリーキァリアーに由来するプラズモンピークが現れ、フリーキャリアーの有効質量はm^*/m〜1であると報告している。しかし、この有効質量の値は角度分解型光電子分光から求められた値5〜10と比べてかなり小さく疑問である。また、光の反射率の実験では、約1eVに反射率の低下が観察されており、プラズマエッジと同定されている。しかし、プラズマエッジのエネルギーがキャリアーのドーピング量に依存しないという実験結果については疑問がのこる。われわれは、1eV付近のプラズモンの存在の有無とその原因について、微小領域の同定機能を備えた透過型EELS装置を用いてBi系2201相,2212相,2223相およびTl系2201相の常伝導状態でのEELSスペクトルを調べた。 われわれの実験では、1eV付近にプラズモンの励起に対応するピークは観察されなかった。さらに、Bi-2212相についてまず電子回折図形で単結晶であることを確認した400nmφの領域から酸素1s電子の励起スペクトルをとり、528〜529eVにO2pホールの存在を確認した。同じ単結晶領域の100nmφの領域から得た0〜10eVのEELSスペクトルでは約1.2eVでプラズモンに対応するピークは全く見られなかった。Bi-2212相のキャリアーの密度は〜3×10^<21>cm^<-3>と報告されている。この密度に対応する自由電子近似でのプラズモンエネルギーは約2eVとなる。実際の結晶でのフリーキャリアーによるプラズモンエネルギーはキャリアーの有効質量の(m^*/m)^<-1/2>に比例し、誘電率のε_1^<-1/2>に比例する。キャリアーのm^*/mの値は角度分解型光電子分光から5〜10という値が報告されている。この値とキャリアー密度を用いてプラズモンエネルギーを計算すると0.6〜0.9eVとなる。Finkの得たε_1〜4.5を用いて誘電率の影響を考慮するとさらに低エネルギー0.3〜0.4eVへシフトし、1eV付近にプラズモンピークは観察されないことが予想される。われわれのEELSスペクトルから0.6〜0.9eV領域での誘電率を求めるとε_1〜9という値を得た。この誘電率を考慮すると、プラズモンエネルギーは0.2〜0.3eVとなり、今回の実験でプラズモンピークは観察されないことが理解できる。また、光の反射率の低下の原因は、約2eVにあるバンド間遷移であろうと考えられる。

  24. コヒーレント収束電子回折法による結晶構造因子の位相決定法の研究と強誘電体への応用

    寺内 正己

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業

    Category: 奨励研究(A)

    Institution: 東北大学

    1993 - 1993

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    (CBED)(Sr_2Ta_2O_7,Sr_2Nb_2O_7,FeS_2,Mo_8O_<23>,6H-SiC)および積層欠陥(6H-SiC,AlN)の観察を行い、以下の結果を得た。 1.結晶が鏡映面をもつ場合は、コヒーレントCBED図形中の干渉縞の位置は鏡映対称を示す。一方、鏡映面がない場合は、注目する回折波によって干渉縞の位置が対称的であったり対称的でなかったりしており回折図形全体としては鏡映対称を示さない。結晶の映進面を持つ場合は、干渉縞が半周期ずれる。このように、結晶構造因子の位相の対称性がコヒーレントCBED図形中の干渉縞の位置関係として現れることを明らかにした。さらに、世界最小の0.27nmの格子面間隔からコヒーレントCBED図形を得ることに成功した。これらの研究成果を、1993年夏に北京で開催された第16回国際結晶学連合会会議(IUCrXVI)で発表した。 2.コヒーレントCBED法の応用として積層欠陥の観察を行い、積層欠陥に対応した領域の干渉縞は完全結晶の領域の干渉縞に比べてずれていることを見いだした。この干渉縞のずれは、積層欠陥面での結晶周期の不連続性(位相のずれ)に対応していることを明らかにした。このことはコヒーレントCBED法を用いると、これまでの回折強度ではなく位相という新しい観点から格子欠陥研究が行えることを示している。 今回、この科研費で試料のダメ-ジを極力抑えながら薄片試料を作成する装置を購入した結果、これまでよりも良質の薄片試料の作成が容易になり、より多くの物質に対してコヒーレントCBED法が適用できる用になった。

  25. 高分解能電子エネルギー損失分光法による半導体欠陥準位の研究

    寺内 正己

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業

    Category: 奨励研究(A)

    Institution: 東北大学

    1992 - 1992

  26. Development of Crystal Structure Analysis due to Convergent-Beam Electron Diffraction

    TANAKA Michiyoshi, TERAUCHI Masami

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research

    Category: Grant-in-Aid for General Scientific Research (A)

    Institution: Tohoku University

    1990 - 1991

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    This imaging plate (IP) has the following advantages for the detection of the election beam : (1) High sensitivity to small electron dose, (2) wide dynamic range, (3) linearity of sensitivity, (4) high precision digital images and (5) dry system. We have applied the IP to the convergent-beam electron diffraction (CBED) and obtained the following results. (a) It has been shown that the IP is effective to detect the symmetry of CBED patterns. As an example, very weak 200 and equivalent reflections of GaAs were recorded by the IP at the 001 incidence. These reflections all very important for the symmetry study of the material, and had not been recorded clearly by conventional photo films due to the back ground noise. The IP recording and successive image processing of the reflections enable us to reveal the symmetry formed by the 200 and equivalent reflections. (b) The symmetry of CBED patterns has been quantitatively examined for the first time. The symmetry of CBED pattern has been judged by human eyes but has not ever been studied quantitatively. Two reflections which are connected by a symmetry operation were compared. Intensity of one reflection is subtracted from that of the other and the value of R=ROO<SIGMA(I_1-I_2)^2/SIGMAI_1^2> is calculated. It was revealed that a CBED pattern of <111> Si, which is a typical example of good symmetry, showed a value of R<similar or equal>10 %. Human eyes recognize the breakdown of symmetry when CBED patterns which have a value of R beyond 20 %. (c) The displacement vector of a stacking fault can be determined by analyzing the intensity profiles of reflections appearing in CBED patterns. The IP is quite useful to record the intensities of profiles accurately. The displacement vectors of stacking faults in Si and TiO_2 could be reliably determined by applying IP. (d) One of the final goal of CBED is the crystal structure analysis, which requires precise intensity measurements. The IP is indispensable to develop the crystal structure analysis using CBED. Firstly, we tried to solve the crystal structure of the low temperature phase of SrTiO_3, or the rotation angle of the oxygen octahedron and the Debye-Waller factor. The computer analysis program using a nonlinear least-square method (SALS) was developed. Using the intensity data recorded by IP and the analysis program, the rotation angle of the oxygen octahedron was determined to be 1.12 <plus-minus> 0.04ﾟ. The value shows a good agreement with that obtained by the electron-spin resonance method. Secondary, the crystal structure of the intermediate phase of the hexagonal BaTiO_3, which had been remained unsolved, was determined under the guide of the result of the soft-mode analysis. These results strongly promise the success of the crystal structure analysis of a small specimen area using CBED.

  27. Development of a nm-scale spectroscopy method Competitive

    System: The Other Research Programs

    1990/04 -

  28. study of crystal Structures by Convergent-beam electron diffraction Competitive

    System: The Other Research Programs

    1990/04 -

  29. Application of High energy-resolution electron energy-loss spectroscopy on Solid State Physics Competitive

    System: Grant-in-Aid for Scientific Research

    1990/04 -

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