-
Efficient Noninvasive Fault Injection Method Utilizing Intentional Electromagnetic Interference
Hikaru Nishiyama, Daisuke Fujimoto, Hideaki Sone, Yuichi Hayashi
IEEE Transactions on Electromagnetic Compatibility 1-9 2023
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
DOI：
10.1109/temc.2023.3264586
ISSN：
0018-9375
eISSN：
1558-187X
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TEMPEST attack against high-resolution displays using differences in the transfer function of EM waves
Taiki Kitazawa, Yoshiki Kitamura, Yougwoo Kim, Daisuke Fujimoto, Hideaki Sone, Yuichi Hayashi
2022 3rd URSI Atlantic and Asia Pacific Radio Science Meeting (AT-AP-RASC) 2022/05/29
Publisher:
IEEE
DOI：
10.23919/at-ap-rasc54737.2022.9814293
-
IEMI Fault Injection Method Using Continuous Sinusoidal Wave with Controlled Frequency, Amplitude, and Phase
Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Hideaki Sone, Yu-Ichi Hayashi
2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) 2022/03/09
Publisher:
IEEE
DOI：
10.1109/emccompo52133.2022.9758626
-
Design of Quick Response (QR) Barcode for Resistance Against Electromagnetic (EM) Information Leakage
International-journal
Peer-reviewed
Hideaki Sone, Daiya Nagata, Yuichi Hayashi, Takaaki Mizuki
URSI Radio Science Letters 3 1-4 2022/03
Publisher:
International Union of Radio Science (URSI)
DOI：
10.46620/21-0053
-
Proposal of Information Hub Models for Effective Disaster Support Activities
Dai Sato, Hideaki Sone
2021 International Conference on Information and Communication Technologies for Disaster Management (ICT-DM) 2021/12/03
Publisher:
IEEE
DOI：
10.1109/ict-dm52643.2021.9664139
-
Committed-format AND protocol using only random cuts
Yuta Abe, Takaaki Mizuki, Hideaki Sone
Natural Computing 20 (4) 639-645 2021/12
Publisher:
Springer Science and Business Media LLC
DOI：
10.1007/s11047-021-09862-2
ISSN：
1567-7818
eISSN：
1572-9796
-
QR Bar-Code Designed Resistant against em Information Leakage
Daiya Nagata, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
2021 34th General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2021 2021/08/28
Publisher:
Institute of Electrical and Electronics Engineers Inc.
DOI：
10.23919/URSIGASS51995.2021.9560638
-
Results of Research Data Management Survey at Tohoku University
Peer-reviewed
Masakazu Motoki, Hideaki Sone, Takuo Suganuma, Shinji Oriuchi
Proc. 2021 10th International Congress on Advanced Applied Informatics (IIAI-AAI) 277 2021/07
DOI：
10.1109/IIAI-AAI53430.2021.00048
-
Design of suitable controlled image for evaluation of EM information leakage
International-journal
Peer-reviewed
Daiya Nagata, Ryota Birukawa, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
URSI Radio Science Letters 2 1-4 2021/02
Publisher:
URSI
DOI：
10.46620/20-0054
-
Basic SecCap Cource in Tohoku University and Its Verification of Education Effectiveness
Peer-reviewed
Satoru Izumi, Yoshinari Kanaya, Hidemitsu Shoji, Takaaki Mizuki, Takuo Suganuma, Mitsuyuki Nakao, Hideaki Sone
Computer Software 38 (1) 1_45-1_51 2021/01/22
DOI：
10.11309/jssst.38.1_45
-
Measurement on Effect of Controlled Wave Phase in EM Fault Injection Attack
International-journal
Peer-reviewed
Yuto Shinoda, Mitsuki Takenouchi, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE (TS01-3) 23-23 2020/09/23
DOI：
10.1109/EMCEUROPE48519.2020.9245847
-
Card-Based ZKP Protocols for Takuzu and Juosan
International-coauthorship
Peer-reviewed
Daiki Miyahara, Léo Robert, Pascal Lafourcade, So Takeshige, Takaaki Mizuki, Kazumasa Shinagawa, Atsuki Nagao, Hideaki Sone
Fun with Algorithms (FUN 2021), Leibniz International Proceedings in Informatics (LIPIcs), Schloss Dagstuhl-Leibniz-Zentrum fuer Informatik 157 20:1-20:21 2020/09
DOI：
10.4230/LIPIcs.FUN.2021.20
-
Experimental Study on Measurement Resolution of Side Channel Waveform in Correlation Power Analysis
Peer-reviewed
Kohei Utsumi, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
EMC Europe 2020 (OD05-9) 23-25 2020/09
DOI：
10.1109/EMCEUROPE48519.2020.9245659
-
The Source Estimation of Electromagnetic Information Leakage from Information Devices
Peer-reviewed
Ryota Birukawa, Daiya Nagata, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science 2020/08
Publisher:
IEEE
DOI：
10.23919/ursigass49373.2020.9231979
-
Efficient card-based zero-knowledge proof for Sudoku
Peer-reviewed
Tatsuya Sasaki, Daiki Miyahara, Takaaki Mizuki, Hideaki Sone
Theoretical Computer Science 839 135-142 2020/05/26
DOI：
10.1016/j.tcs.2020.05.036
ISSN：
0304-3975
-
Public-PEZ Cryptography.
Soma Murata, Daiki Miyahara, Takaaki Mizuki, Hideaki Sone
Information Security. ISC 2020. Lecture Notes in Computer Science 12472 59-74 2020
DOI：
10.1007/978-3-030-62974-8_4
-
Six-Card Finite-Runtime XOR Protocol with Only Random Cut.
Kodai Toyoda, Daiki Miyahara, Takaaki Mizuki, Hideaki Sone
APKC '20: Proceedings of the 7th ACM Workshop on ASIA Public-Key CryptographyOctober 2020 2-8 2020
DOI：
10.1145/3384940.3388961
-
Card-based protocols for secure ranking computations.
Ken Takashima, Yuta Abe, Tatsuya Sasaki, Daiki Miyahara, Kazumasa Shinagawa, Takaaki Mizuki, Hideaki Sone
Theor. Comput. Sci. 845 122-135 2020
DOI：
10.1016/j.tcs.2020.09.008
-
Secure implementations of a random bisection cut.
Peer-reviewed
Itaru Ueda, Daiki Miyahara, Akihiro Nishimura, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Int. J. Inf. Sec. 19 (4) 445-452 2020
DOI：
10.1007/s10207-019-00463-w
ISSN：
1615-5262
eISSN：
1615-5270
-
Sharing Information to Eliminate Support Irregularities and Omissions: - Cases from Disaster Information Supporters in Japan -
Peer-reviewed
Dai Sato, Shoko Miyagawa, Michinori Hatayama, Yoichi Kayama, Hideaki Sone
6th International Conference on Information and Communication Technologies for Disaster Management, ICT-DM 2019 1-6 2019/12
DOI：
10.1109/ICT-DM47966.2019.9032973
-
Card-based physical zero-knowledge proof for kakuro
Peer-reviewed
Daiki Miyahara, Tatsuya Sasaki, Takaaki Mizuki, Hideaki Sone
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E102A (9) 1072-1078 2019/09
DOI：
10.1587/transfun.E102.A.1072
ISSN：
0916-8508
eISSN：
1745-1337
-
A study on an Effective Evaluation Method for EM Information Leakage without Reconstructing Screen
Peer-reviewed
Ryota Birukawa, Yu Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
EMC Europe 2019 - 2019 International Symposium on Electromagnetic Compatibility 2019 383-387 2019/09
DOI：
10.1109/EMCEurope.2019.8872035
-
Interactive Physical Zero-Knowledge Proof for Norinori.
Peer-reviewed
Jean-Guillaume Dumas, Pascal Lafourcade, Daiki Miyahara, Takaaki Mizuki, Tatsuya Sasaki, Hideaki Sone
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) 11653 LNCS 166-177 2019/07
DOI：
10.1007/978-3-030-26176-4_14
ISSN：
0302-9743
-
A Method for Distinguishing Faulty Bytes in Cryptographic Device Using EM Information Leakage
Peer-reviewed
Takenouchi Mitsuki, Saga Naoto, Hayashi Yuichi, Mizuki Takaaki, Sone Hideaki
2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility, Sapporo (EMC Sapporo & APEMC 2019) 2019 (ThuPM2C.1) 669-669 2019/06/06
-
Study on the Influence of Contact Surfaces Roughness on High-Frequency Signal Transmission Characteristics
Peer-reviewed
Kenji Aihara, Yuichi Hayashi, Takaaki Mizuki, Hideaki Sone
2019 Joint International Symposium on Electromagnetic Compatibility and Asia-Pacific International Symposium on Electromagnetic Compatibility, Sapporo (EMC Sapporo & APEMC 2019) 2019 (ThuPM1C.1) 621-621 2019/06/06
-
A practical evaluation method for EM information leakage by using audible signal
Peer-reviewed
Ryota Birukawa, Takaaki Mizuki, Hideaki Sone, Yu Ichi Hayashi
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility, EMC Sapporo/APEMC 2019 2019 (TuePM2Po.16) 250-253 2019/06/04
DOI：
10.23919/EMCTokyo.2019.8893761
10.34385/proc.58.TuePM2Po.16
-
Practical and Easy-to-Understand Card-Based Implementation of Yao's Millionaire Protocol.
Peer-reviewed
Daiki Miyahara, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) 11346 LNCS 246-261 2018/12/15
DOI：
10.1007/978-3-030-04651-4_17
ISSN：
0302-9743
-
Bird's Eyes Beside the Afflicted Areas of the Great East Japan Earthquake
Peer-reviewed
Dai Sato, Hideaki Sone
2018 5th International Conference on Information and Communication Technologies for Disaster Management, ICT-DM 2018 2018 P1.15 2018/12
-
Online Media Usage by Disaster Volunteer Centers
Peer-reviewed
Dai Sato, Hideaki Sone
2018 5th International Conference on Information and Communication Technologies for Disaster Management, ICT-DM 2018 2018 1-4 2018/12
DOI：
10.1109/ICT-DM.2018.8636391
-
Physical Zero-Knowledge Proof for Makaro.
Peer-reviewed
Xavier Bultel, Jannik Dreier, Jean-Guillaume Dumas, Pascal Lafourcade 0001, Daiki Miyahara, Takaaki Mizuki, Atsuki Nagao, Tatsuya Sasaki, Kazumasa Shinagawa, Hideaki Sone
International Symposium on Stabilizing, Safety, and Security of Distributed Systems, Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) 11201 LNCS 111-125 2018/11
DOI：
10.1007/978-3-030-03232-6_8
ISSN：
0302-9743
-
Information Leakage Threats for Cryptographic Devices Using IEMI and em Emission
Peer-reviewed
Ko Nakamura, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEEE Transactions on Electromagnetic Compatibility 60 (5) 1340-1347 2018/10
DOI：
10.1109/TEMC.2017.2766139
ISSN：
0018-9375
eISSN：
1558-187X
-
Pile-shifting scramble for card-based protocols
Peer-reviewed
Akihiro Nishimura, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E101A (9) 1494-1502 2018/09
Publisher:
The Institute of Electronics, Information and Communication Engineers (IEICE)
DOI：
10.1587/transfun.E101.A.1494
ISSN：
0916-8508
eISSN：
1745-1337
-
Analyzing Execution Time of Card-Based Protocols.
Peer-reviewed
Daiki Miyahara, Itaru Ueda, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
International Conference on Unconventional Computation and Natural Computation, Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) 10867 LNCS 145-158 2018/06/25
DOI：
10.1007/978-3-319-92435-9_11
ISSN：
0302-9743
-
Card-Based Zero-Knowledge Proof for Sudoku.
Peer-reviewed
Tatsuya Sasaki, Takaaki Mizuki, Hideaki Sone
9th International Conference on Fun with Algorithms (FUN 2018) Leibniz International Proceedings in Informatics, LIPIcs 100 29:1-29:10 2018/06
DOI：
10.4230/LIPIcs.FUN.2018.29
ISSN：
1868-8969
-
Five-Card AND Protocol in Committed Format Using Only Practical Shuffles
Peer-reviewed
Yuta Abe, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
APKC'18: PROCEEDINGS OF THE 5TH ACM ASIA PUBLIC-KEY CRYPTOGRAPHY WORKSHOP 3-8 2018/05/23
DOI：
10.1145/3197507.3197510
-
A study on an evaluation method for EM information leakage utilizing controlled image displaying
Peer-reviewed
Ryota Birukawa, Gentaro Tanabe, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 2018 13-13 2018/05/14
DOI：
10.1109/ISEMC.2018.8394013
-
Study on the effect of clock rise time on fault occurrence under IEMI
Peer-reviewed
Naoto Saga, Takuya Itoh, Yu Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 2018 9-9 2018/05/14
DOI：
10.1109/ISEMC.2018.8394009
-
Secret Key Amplification from Uniformly Leaked Key Exchange Complete Graph
Peer-reviewed
Tatsuya Sasaki, Bateh Mathias Agbor, Shingo Masuda, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
WALCOM: ALGORITHMS AND COMPUTATION, WALCOM 2018 10755 20-31 2018/03/03
DOI：
10.1007/978-3-319-75172-6_3
ISSN：
0302-9743
eISSN：
1611-3349
-
The Minimum Number of Cards in Practical Card-Based Protocols
International-coauthorship
Peer-reviewed
Julia Kastner, Alexander Koch, Stefan Walzer, Daiki Miyahara, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Advances in Cryptology -- ASIACRYPT 2017, Part III, Lecture Notes in Computer Science 10626 126-155 2017/12
DOI：
10.1007/978-3-319-70700-6_5
-
Card-based protocols using unequal division shuffles
Peer-reviewed
Akihiro Nishimura, Takuya Nishida, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
SOFT COMPUTING 22 (2) 361-371 2017/10/04
DOI：
10.1007/s00500-017-2858-2
ISSN：
1432-7643
eISSN：
1433-7479
-
Accelerating Risk Assessment of Heat Stroke for Human Exposure to Ambient Heat and Solar Radiation Using Vector Supercomputer SX-ACE
Peer-reviewed
Wataru NISHIO, Sachiko KODERA, Akimasa HIRATA, Daisuke SASAKI, Takeshi YAMASHITA, Ryusuke EGAWA, Hiroaki KOBAYASHI, Hideaki SONE
IEICE Transactions on Communications J100-C (5) 208-216 2017/05
-
Necessary and Sufficient Numbers of Cards for Securely Computing Two-Bit Output Functions
International-coauthorship
Peer-reviewed
Danny Francis, Syarifah Ruqayyah Aljunid, Takuya Nishida, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Paradigms in Cryptology (Mycrypt 2016), Lecture Notes in Computer Science 10311 193-211 2017/01
DOI：
10.1007/978-3-319-61273-7_10
ISSN：
0302-9743
eISSN：
1611-3349
-
How to Implement a Random Bisection Cut
Peer-reviewed
Itaru Ueda, Akihiro Nishimura, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Theory and Practice of Natural Computing (TPNC 2016), Lecture Notes in Computer Science 10071 58-69 2016/12
DOI：
10.1007/978-3-319-49001-4_5
ISSN：
0302-9743
eISSN：
1611-3349
-
Efficient Electromagnetic Analysis for Cryptographic Module on the Frequency Domain
Peer-reviewed
Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
Electronics and Communications in Japan 99 (10) 24-32 2016/10/01
DOI：
10.1002/ecj.11869
ISSN：
1942-9533
eISSN：
1942-9541
-
Fundamental Study on a Mechanism of Faulty Outputs from Cryptographic Modules Due to IEMI
Peer-reviewed
Yu ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
Electronics and Communications in Japan 99 (9) 72-78 2016/09/01
DOI：
10.1002/ecj.11855
ISSN：
1942-9533
eISSN：
1942-9541
-
Quantitative evaluation of inductance at the coaxial connector contact failure portion
Peer-reviewed
Tomoya Sato, Yu Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEEJ Transactions on Fundamentals and Materials 136 (6) 347-352 2016/06
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms.136.347
ISSN：
0385-4205
eISSN：
1347-5533
-
An implementation of non-uniform shuffle for secure multi-party computation
Peer-reviewed
Akihiro Nishimura, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
AsiaPKC 2016 - Proceedings of the 3rd ACM International Workshop on ASIA Public-Key Cryptography, Co-located with Asia CCS 2016 49-55 2016/05/30
Publisher:
Association for Computing Machinery, Inc
DOI：
10.1145/2898420.2898425
-
Five-card secure computations using unequal division shuffle
Peer-reviewed
Akihiro Nishimura, Takuya Nishida, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Theory and Practice of Natural Computing (TPNC 2015), Lecture Notes in Computer Science 9477 109-120 2015/12
Publisher:
Springer Verlag
DOI：
10.1007/978-3-319-26841-5_9
ISSN：
1611-3349 0302-9743
-
Fundamental study on randomized processing in cryptographic IC using variable clock against Correlation Power Analysis
Peer-reviewed
Megumi Saito, Takaaki Mizuki, Hideaki Sone, Yu Ichi Hayashi
EMC Compo 2015 - 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits 39-43 2015/11/10
DOI：
10.1109/EMCCompo.2015.7358327
-
Efficient electromagnetic analysis for cryptographic module on the frequency domain
Peer-reviewed
Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
IEEJ Transactions on Fundamentals and Materials 135 (9) 515-521 2015/09/01
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms.135.515
ISSN：
0385-4205
eISSN：
1347-5533
-
Method for Estimating Fault Injection Time on Cryptographic Devices from EM Leakage
Peer-reviewed
Ko Nakamura, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
2015 IEEE International Symposium on Electromagnetic Compatibility 235-240 2015/08
DOI：
10.1109/ISEMC.2015.7256165
ISSN：
2158-110X
-
Basic study on the method for real-time video streaming with low latency and high bandwidth efficiency
Peer-reviewed
Shoichi Ando, Yuichi Hayashi, Takaaki Mizuki, Hideaki Sone
MidCCI 2015: 1st IEEE International Workshop on Middleware for Cyber Security, Cloud Computing and Internetworking, COMPSAC 2015: The 39th Annual International Computers, Software & Applications Conference Taichung, Taiwan 2015 79-82 2015/07/04
DOI：
10.1109/COMPSAC.2015.217
ISSN：
0730-3157
-
Securely computing three-input functions with eight cards
Peer-reviewed
Takuya Nishida, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E98-A (6) 1145-1152 2015/06/01
DOI：
10.1587/transfun.E98.A.1145
ISSN：
0916-8508
eISSN：
1745-1337
-
Fundamental study on fault occurrence mechanisms by intentional electromagnetic interference using impulses
Peer-reviewed
Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
2015 Asia-Pacific International Symposium on Electromagnetic Compatibility, APEMC 2015 2015 (SS13-1.4) 585-588 2015/05/29
DOI：
10.1109/APEMC.2015.7175288
ISSN：
2162-7673
-
Card-Based Protocols for Any Boolean Function
Peer-reviewed
Takuya Nishida, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Theory and Applications of Models of Computation (TAMC 2015), Lecture Notes in Computer Science 9076 110-121 2015/05
DOI：
10.1007/978-3-319-17142-5_11
ISSN：
0302-9743
eISSN：
1611-3349
-
Fundamental study on a mechanism of faulty outputs from cryptographic modules due to IEMI
Peer-reviewed
Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
IEEJ Transactions on Fundamentals and Materials 135 (5) 276-281 2015/05/01
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms.135.276
ISSN：
0385-4205
eISSN：
1347-5533
-
A Threat for Tablet PCs in Public Space: Remote Visualization of Screen Images Using EM Emanation
Peer-reviewed
Yuichi Hayashi, Naofumi Homma, Mamoru Miura, Takafumi Aoki, Hideaki Sone
CCS'14: PROCEEDINGS OF THE 21ST ACM CONFERENCE ON COMPUTER AND COMMUNICATIONS SECURITY 2014 954-965 2014/11
DOI：
10.1145/2660267.2660292
-
Investigation of noise interference due to connector contact failure in a coaxial cable
Peer-reviewed
Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEICE Transactions on Electronics E97-C (9) 900-903 2014/09/01
DOI：
10.1587/transele.E97.C.900
ISSN：
0916-8524
eISSN：
1745-1353
-
Precisely Timed IEMI Fault Injection Synchronized with EM Information Leakage
Peer-reviewed
Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
2014 IEEE International Symposium on Electromagnetic Compatibility (TH-AM-3-1) 738-742 2014/08/07
DOI：
10.1109/ISEMC.2014.6899066
ISSN：
2158-110X
-
Development of Human Resources in Hardware Security through Practical Information Technology Education Program
Peer-reviewed
Naofumi Homma, Yu-ichi Hayashi, Toshihiro Katashita, Hideaki Sone
2014 IEEE International Symposium on Electromagnetic Compatibility (TH-AM-3-6) 764-767 2014/08/07
DOI：
10.1109/ISEMC.2014.6899071
ISSN：
2158-110X
-
Analysis of EM emission from cryptographic devices
Peer-reviewed
Hideaki Sone, Yu-ichi Hayashi, Takaaki Mizuki
2014 31th URSI General Assembly and Scientific Symposium, URSI GASS 2014 Scientific Session E (E05.4) 1-4 2014/08
DOI：
10.1109/URSIGASS.2014.6929521
-
Simulation-based analysis of inductance at loose connector contact boundaries
Peer-reviewed
Tomoya Sato, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
27th International Conference on Electrical Contacts, ICEC 2014 - Proceedings 377-380 2014/06/26
-
Efficient method for estimating propagation area of information leakage via EM field
Peer-reviewed
Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
2014 International Symposium on Electromagnetic Compatibility (EMC 14/Tokyo), Tokyo 2014 (14P2-A1) 298-301 2014/05/14
DOI：
10.34385/proc.18.14P2-A1
ISSN：
1077-4076
eISSN：
2158-1118
-
Minimizing ESCT forms for two-variable multiple-valued input binary output functions
Peer-reviewed
Takaaki Mizuki, Daizo Mikami, Hideaki Sone
Discrete Applied Mathematics 169 186-194 2014/05
DOI：
10.1016/j.dam.2013.12.023
ISSN：
0166-218X
eISSN：
1872-6771
-
Investigation on FPGA Malfunctions by Clock Glitch Induced by Disturbance Invasion through Power Cable
Iokibe Kengo, Maeshima Kazuhiro, Watanabe Tetsushi, Kagotani Hiroto, Nogami Yasuyuki, Hayashi Yu-ichi, Toyota Yoshitaka, Sone Hideaki
Proceedings of JIEP Annual Meeting 28 (0) 63-66 2014
Publisher:
The Japan Institute of Electronics Packaging
DOI：
10.11486/ejisso.28.0_63
-
Securely Computing the Three-Input Majority Function with Eight Cards
Peer-reviewed
Takuya Nishida, Takaaki Mizuki, Hideaki Sone
Theory and Practice of Natural Computing 2013, Lecture Notes in Computer Science 8273 193-204 2013/12
DOI：
10.1007/978-3-642-45008-2_16
ISSN：
0302-9743
eISSN：
1611-3349
-
Disruption-Tolerant, Large-Scale Wireless LAN Roaming Architecture for eduroam
Peer-reviewed
Hideaki Goto, Hao Liu, Shunichi Kinoshita, Motonori Nakamura, Hideaki Sone
Proceedings of the IADIS International Conference Applied Computing 2013 191-195 2013/10/23
-
Study on information leakage of input key due to frequency fluctuation of RC oscillator in keyboard
Peer-reviewed
Masahiro Kinugawa, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEICE Transactions on Communications E96-B (10) 2633-2638 2013/10
DOI：
10.1587/transcom.E96.B.2633
ISSN：
0916-8516
eISSN：
1745-1345
-
Evaluation of resistance and inductance of loose connector contact
Peer-reviewed
Kazuya Uehara, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEICE Transactions on Electronics E96-C (9) 1148-1150 2013/09
DOI：
10.1587/transele.E96.C.1148
ISSN：
0916-8524
eISSN：
1745-1353
-
Map-based analysis of IEMI fault injection into cryptographic devices
Peer-reviewed
Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
IEEE International Symposium on Electromagnetic Compatibility, Denver 829-833 2013/08/08
DOI：
10.1109/ISEMC.2013.6670525
ISSN：
1077-4076
eISSN：
2158-1118
-
Fault-tolerant wireless LAN roaming system using client certificates
Peer-reviewed
Shunichi Kinoshita, Toshiki Watanabe, Yasuhiro Yamasaki, Hideaki Goto, Hideaki Sone
2013 IEEE 37th International Conference on Computer Software and Applications (COMPSAC) 822-823 2013/07/23
DOI：
10.1109/COMPSAC.2013.137
ISSN：
0730-3157
-
Flexible access and priority control system based on 802.1x authentication in time of disaster
Peer-reviewed
Toshiki Watanabe, Shunichi Kinoshita, Yasuhiro Yamasaki, Hideaki Goto, Hideaki Sone
IEEE COMPSAC International Workshop, MidArch 2013: The 7th International Workshop on Middleware Architecture in the Internet 385-390 2013/07/22
DOI：
10.1109/COMPSACW.2013.66
ISSN：
0730-3157
-
Voting with a Logarithmic Number of Cards
Peer-reviewed
Takaaki Mizuki, Isaac Kobina Asiedu, Hideaki Sone
12th International Conference, UCNC Unconventional Computation and Natural Computation 2013, Lecture Notes in Computer Science 7956 162-173 2013/07
DOI：
10.1007/978-3-642-39074-6_16
ISSN：
0302-9743
eISSN：
1611-3349
-
Efficient evaluation of EM radiation associated with information leakage from cryptographic devices
International-coauthorship
Peer-reviewed
Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Haruki Shimada, Takafumi Aoki, Hideaki Sone, Laurent Sauvage, Jean-Luc Danger
IEEE Transactions on Electromagnetic Compatibility 55 (3) 555-563 2013/06
DOI：
10.1109/TEMC.2012.2222890
ISSN：
0018-9375
eISSN：
1558-187X
-
Analysis of electromagnetic information leakage from cryptographic devices with different physical structures
International-coauthorship
Peer-reviewed
Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, Laurent Sauvage, Jean-Luc Danger
IEEE Transactions on Electromagnetic Compatibility 55 (3) 571-580 2013/06
DOI：
10.1109/TEMC.2012.2227486
ISSN：
0018-9375
eISSN：
1558-187X
-
Introduction to Recent Research on EM Information Leakage
International-coauthorship
Peer-reviewed
Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, Laurent Sauvage, Jean-Luc Danger
2013 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC2013) 320-323 2013/05
-
Effect of connector contact points on common-mode current on a coaxial transmission line
Peer-reviewed
Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEEJ Transactions on Fundamentals and Materials 133 (5) 273-277 2013/05
DOI：
10.1541/ieejfms.133.273
ISSN：
0385-4205
eISSN：
1347-5533
-
Efficient Safety Evaluation of EM Information Leakage Using a Selected-Data Set
SHIMADA Haruki, HAYASHI Yu-ichi, HOMMA Naofumi, MIZUKI Takaaki, AOKI Takafumi, SONE Hideaki
The transactions of the Institute of Electronics, Information and Communication Engineers. B 96-B (4) 467-475 2013/04/01
Publisher:
The Institute of Electronics, Information and Communication Engineers
ISSN：
1344-4697
-
Transient IEMI threats for cryptographic devices
Peer-reviewed
Yu Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
IEEE Transactions on Electromagnetic Compatibility 55 (1) 140-148 2013/02
DOI：
10.1109/TEMC.2012.2206393
ISSN：
0018-9375
eISSN：
1558-187X
-
The Five-Card Trick Can Be Done with Four Cards
Peer-reviewed
Takaaki Mizuki, Michihito Kumamoto, Hideaki Sone
Advances in Cryptology -- ASIACRYPT 2012, Lecture Notes in Computer Science 7658 598-606 2012/12
DOI：
10.1007/978-3-642-34961-4_36
ISSN：
0302-9743
eISSN：
1611-3349
-
Evaluation of resistance and inductance at loose connector contact
Peer-reviewed
Kazuya Uehara, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
5th Pan-Pacific EMC Joint Meeting -PPEMC'12- (12) 2012/11/29
-
Cloud-based, Disaster-tolerant Delegate Authentication System for Low Deployment and Operational Costs of Large-scale eduroam System
Peer-reviewed
Hideaki Goto, Hideaki Sone
Proceedings of the IADIS International Conference Applied Computing 2012 369-374 2012/10/19
-
Recovery of Campus ICT Infrastructure after the Great East Japan Earthquake
Invited
Peer-reviewed
Hideaki Sone
The 14th Asia-Pacific Network Operations and Management Symposium APNOMS 2012 SS2-1-1-SS2-1-23 2012/09/26
-
Mechanism of increase in inductance at loosened connector contact boundary
Peer-reviewed
Kazuki Matsuda, Yu Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEICE Transactions on Electronics E95-C (9) 1502-1507 2012/09
DOI：
10.1587/transele.E95.C.1502
ISSN：
0916-8524
eISSN：
1745-1353
-
The effects of PS/2 keyboard setup on a conductive table on electromagnetic information leakages
Peer-reviewed
Masahiro Kinugawa, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Proceedings of the SICE Annual Conference 2012 (TuA03-03) 60-63 2012/08/21
-
Using selected-plaintext sets for efficient evaluation of EM information leakage from cryptographic devices
Peer-reviewed
Haruki Shimada, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
Proceedings of the SICE Annual Conference 2012 (TuA03-04) 64-67 2012/08/21
-
An efficient analysis method of the electromagnetic emissions in the frequency domain
Peer-reviewed
Narihiro Tada, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Proceedings of the SICE Annual Conference 2012 (TuA03-05) 68-72 2012/08/21
-
Efficient mapping of EM radiation associated with information leakage for cryptographic devices
International-coauthorship
Peer-reviewed
Haruki Shimada, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, Laurent Sauvage, Jean-Luc Danger
2012 IEEE International Symposium on Electromagnetic Compatibility, Pittsburgh (TH-PM-5-3) 794-799 2012/08/09
DOI：
10.1109/ISEMC.2012.6351663
ISSN：
2158-110X
-
An efficient method for estimating the area of information propagation through electromagnetic radiation
Peer-reviewed
Yu-ichi Hayashi, Naofumi Homma, Taishi Ikematsu, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, Jean-Luc Danger
2012 IEEE International Symposium on Electromagnetic Compatibility, Pittsburgh (TH-PM-5-4) 800-805 2012/08/09
DOI：
10.1109/ISEMC.2012.6351662
ISSN：
2158-110X
-
Flexible access control framework considering idp-side's authorization policy in roaming environment
Peer-reviewed
Toshiki Watanabe, Shunichi Kinoshita, Junichi Yamato, Hideaki Goto, Hideaki Sone
2012 IEEE 36th International Conference on Computer Software and Applications (COMPSAC) Workshops, MidArch 2012: The 6th IEEE International Workshop on Middleware Architecture in the Internet 76-81 2012/07/16
DOI：
10.1109/COMPSACW.2012.24
ISSN：
0730-3157
-
Implementation and evaluation of an OpenFlow-based access control system for wireless LAN roaming
Peer-reviewed
Shunichi Kinoshita, Toshiki Watanabe, Junichi Yamato, Hideaki Goto, Hideaki Sone
2012 IEEE 36th International Conference on Computer Software and Applications (COMPSAC) Workshops, MidArch 2012: The 6th IEEE International Workshop on Middleware Architecture in the Internet 82-87 2012/07/16
DOI：
10.1109/COMPSACW.2012.25
ISSN：
0730-3157
-
Analysis of magnetic field distribution around connector with contact failure
Peer-reviewed
Yu Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEEJ Transactions on Fundamentals and Materials 132 (6) 417-420 2012/06
DOI：
10.1541/ieejfms.132.417
ISSN：
0385-4205
eISSN：
1347-5533
-
Effect of contact failure of connector in electronic control units on radiated emissions
Peer-reviewed
Kazuya Uehara, Yu Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEEJ Transactions on Fundamentals and Materials 132 (6) 456-457 2012/06/01
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms.132.456
ISSN：
0385-4205
eISSN：
1347-5533
-
Evaluation of Information Leakage from Cryptographic Hardware via Common-Mode Current
Peer-reviewed
Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takeshi Sugawara, Yoshiki Kayano, Takafumi Aoki, Shigeki Minegishi, Akashi Satoh, Hideaki Sone, Hiroshi Inoue
IEICE Transactions on Electronics E95C (6) 1089-1097 2012/06
DOI：
10.1587/transele.E95.C.1089
ISSN：
1745-1353
eISSN：
1745-1353
-
A Threat of EM Information Leakage against Cryptographic Devices
Peer-reviewed
Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
2012 Korea-Japan EMT/EMC/BE Joint Conference (KJJC-2012) (2A-4) 2012/05/19
-
Investigation on the effect of parasitic inductance at connector contact boundary on electromagnetic radiation
Peer-reviewed
Yu-Ichi Hayashi, Kazuki Matsuda, Takaaki Mizuki, Hideaki Sone
2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings 65-68 2012/05
DOI：
10.1109/APEMC.2012.6237952
ISSN：
2162-7673
-
Fundamental study on mechanism of electromagnetic field radiation from electric devices with loose contact of connector
Peer-reviewed
Kazuki Matsuda, Yu-Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEEJ Transactions on Fundamentals and Materials 132 (5) 373-378 2012/05
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms.132.373
ISSN：
0385-4205
eISSN：
1347-5533
-
Effect of resistance at contact boundary of loose connector on electromagnetic radiation
Peer-reviewed
Kazuki Matsuda, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
26th International Conference on Electrical Contacts (ICEC 2012) (P13) 422-425 2012/05
Publisher:
IET
DOI：
10.1049/cp.2012.0688
-
Influence of PCB and attached line of hardware on electromagnetic (EM) information leakage
Peer-reviewed
Yu Ichi Hayashi, Kouhei Ohmura, Takaaki Mizuki, Hideaki Sone
IEEJ Transactions on Fundamentals and Materials 132 (2) 173-179 2012/02
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms.132.173
ISSN：
0385-4205
eISSN：
1347-5533
-
Recent research trends in side channel attack on cryptographic modules and its countermeasure
Invited
Yu-Ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
IEEJ Transactions on Fundamentals and Materials 132 (1) 9-12 2012/01
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms.132.9
ISSN：
0385-4205
eISSN：
1347-5533
-
Information leakage from the unintentional emissions of an integrated RC oscillator
Peer-reviewed
Masahiro Kinugawa, Yu Ichi Hayashi, Takaaki Mizuki, Hideaki Sone
Proceedings of the 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits 2011, EMC COMPO 2011 24-28 2011/11/07
-
Non-invasive Trigger-free Fault Injection Method Based on Intentional Electromagnetic Interference
Peer-reviewed
Yu-ichi Hayashi, Naofumi Homma, Takeshi Sugawara, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
The Non-Invasive Attack Testing Workshop (NIAT 2011) 15-19 2011/09
-
Contact Conditions in Connectors that Cause Common Mode Radiation
Peer-reviewed
Yu-ichi Hayashi, Yoshiki Kayano, Takaaki Mizuki, Hideaki Sone, Hiroshi Inoue
IEICE Transactions on Electronics E94C (9) 1369-1374 2011/09
DOI：
10.1587/transele.E94.C.1369
ISSN：
1745-1353
-
Analysis of Electromagnetic Radiation from Transmission Line with Loose Contact of Connector
Peer-reviewed
Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
IEICE Transactions on Electronics E94C (9) 1427-1430 2011/09
DOI：
10.1587/transele.E94.C.1427
ISSN：
1745-1353
eISSN：
1745-1353
-
An Application of st-Numbering to Secret Key Agreement
Peer-reviewed
Takaaki Mizuki, Satoru Nakayama, Hideaki Sone
International Journal of Foundations of Computer Science 22 (5) 1211-1227 2011/08
DOI：
10.1142/S0129054111008659
ISSN：
0129-0541
eISSN：
1793-6373
-
Non-Invasive EMI-Based Fault Injection Attack against Cryptographic Modules
Peer-reviewed
Yu-ichi Hayashi, Naofumi Homma, Takeshi Sugawara, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone
IEEE International Symposium on Electromagnetic Compatibility 2011 (THU-AM-4) 763-767 2011/08
DOI：
10.1109/ISEMC.2011.6038411
ISSN：
2158-110X
-
Suppression of information leakage from electronic devices based on SNR
Peer-reviewed
Taishi Ikematsu, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone
IEEE International Symposium on Electromagnetic Compatibility 2011 (THU-PM-2) 920-924 2011/08
DOI：
10.1109/ISEMC.2011.6038440
ISSN：
2158-110X
-
Optimization system of IP address using terminal ID in eduroam
Peer-reviewed
Yoshinori Miyamoto, Yasuhiro Yamasaki, Hideaki Goto, Hideaki Sone
2011 IEEE/IPSJ International Symposium on Applications and the Internet (SAINT) Workshop MidArch2011 Munich 2011 342-346 2011/07/18
DOI：
10.1109/SAINT.2011.65
-
Flexible access management system for campus VLAN based on openflow
Peer-reviewed
Yasuhiro Yamasaki, Yoshinori Miyamoto, Junichi Yamato, Hideaki Goto, Hideaki Sone
2011 IEEE/IPSJ International Symposium on Applications and the Internet (SAINT) Workshop MidArch2011 Munich 2011 347-351 2011/07/18
DOI：
10.1109/SAINT.2011.66
-
相互接続部の接触不良が車載電子機器のイミュニティに与える影響
上原 和也, 林 優一, 水木 敬明, 曽根 秀昭
電気関係学会東北支部連合大会講演論文集 2011 261-261 2011
Publisher:
電気関係学会東北支部連合大会実行委員会
DOI：
10.11528/tsjc.2011.0_261
-
The Influence of EMC Suppression Techniques on Acquisition of Electromagnetic Information Leakage
Tohoku-Section Joint Convention Record of Institutes of Electrical and Information Engineers, Japan 2011 19-19 2011
Publisher:
Organizing Committee of Tohoku-Section Joint Convention of Institutes of Electrical and Information Engineers, Japan
DOI：
10.11528/tsjc.2011.0_19
-
選択した平文セットによる暗号モジュールの安全性評価の効率化
嶋田 晴貴, 林 優一, 水木 敬明, 曽根 秀昭
電気関係学会東北支部連合大会講演論文集 2011 262-262 2011
Publisher:
電気関係学会東北支部連合大会実行委員会
DOI：
10.11528/tsjc.2011.0_262
-
Measurement of the Effect of Ungrounded Power Cables on Compromising Electromagnetic Emanation
KINUGAWA Masahiro, HAYASHI Yu-ichi, MIZUKI Takaaki, SONE Hideaki
The IEICE transactions on communications B 93 (11) 1559-1561 2010/11/01
Publisher:
The Institute of Electronics, Information and Communication Engineers
ISSN：
1344-4697
-
Modeling Connector Contact Condition Using a Contact Failure Model with Equivalent Inductance
International-coauthorship
Peer-reviewed
Yu-ichi Hayashi, Songping Wu, Jun Fan, Takaaki Mizuki, Hideaki Sone
2010 IEEE International Symposium on Electromagnetic Compatibility 743-747 2010/07/28
DOI：
10.1109/ISEMC.2010.5711371
ISSN：
2158-110X
-
Information Leakage from Cryptographic Hardware via Common-Mode Current
Peer-reviewed
Yu-ichi Hayashi, Takeshi Sugawara, Yoshiki Kayano, Naofumi Homma, Takaaki Mizuki, Akashi Satoh, Takafumi Aoki, Shigeki Minegishi, Hideaki Sone, Hiroshi Inoue
2010 IEEE International Symposium on Electromagnetic Compatibility 109-114 2010/07/27
DOI：
10.1109/ISEMC.2010.5711256
ISSN：
2158-110X
-
Centralized authentication system for location privacy protection and low operational cost of large scale WLAN roaming
Peer-reviewed
Ichiro Yamguchi, Takaaki Suzuki, Hideaki Goto, Hideaki Sone
SAINT 2010 The Fourth Workshop on Middleware Architecture in the Internet 2010 297-299 2010/07/20
DOI：
10.1109/SAINT.2010.25
-
An analysis of the standing wave on the imbalanced power line
Peer-reviewed
Masahiro Kinugawa, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
4th Pan-Pacific EMC Joint Meeting (PPEMC'10) 2010/05/27
-
Influence of device structure on electromagnetic (EM) information leakage from the device
Peer-reviewed
Kouhei Ohmura, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
4th Pan-Pacific EMC Joint Meeting (PPEMC'10) 2010/05/27
-
Teaching internet safety at universities using "Hikari & Tsubasa's information security game"
Peer-reviewed
Hitoshi Okada, Hideaki Sone, Masaru Ogawa
CSEDU 2010 - 2nd International Conference on Computer Supported Education, Proceedings 1 431-433 2010/04
-
Education materials for interactive communication security on the educational purpose and effects of Hikari and Tsubasa's tutorial for "putting our heads together" about information security
Peer-reviewed
Hitoshi Okada, Hideaki Sone, Masaru Ogawa
ICSIT 2010 - International Conference on Society and Information Technologies, Proceedings 265-268 2010/04
-
A Scalable, Secure and User-Friendly VPN-Based Wireless LAN Roaming System
Peer-reviewed
Hideaki Goto, Takayuki Saito, Hideaki Sone
Proceedings of the IADIS International Conference WWW/INTERNET 2009 II 273-278 2009/11/19
-
An advisory method for BBS users and evaluation of BBS comments
Peer-reviewed
Yu Ichifuji, Susumu Konno, Hideaki Sone
Procedia - Social and Behavioral Sciences 2 (1) 218-224 2009/10
DOI：
10.1016/j.sbspro.2010.01.039
ISSN：
1877-0428
-
Speed-Up of Remote Visualization for Large-Scale Volume Data in Grid Environments
EBARA Yasuo, TANAKA Takuya, SONE Hideaki, KOYAMADA Koji
The IEICE transactions on communications B J92-B (10) 1611-1618 2009/10/01
Publisher:
The Institute of Electronics, Information and Communication Engineers
ISSN：
1344-4697
-
“Effective Remote Visualization for Large-scale Volume Data by Particle-based Volume Rendering”
Peer-reviewed
Yasuo Ebara, Ken Ichi Sakurai, Hideaki Sone, Naohisa Sakamoto, Koji Koyamada
Journal of the Institute of Image Electronics Engineers of Japan 38 (5) 753-761 2009/09/25
Publisher:
The Institute of Image Electronics Engineers of Japan
DOI：
10.11371/iieej.38.753
ISSN：
0285-9831
eISSN：
1348-0316
-
Relationship between Connector Contact Points and Common-Mode Current on a Coaxial Transmission Line
Peer-reviewed
Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
EMC 2009: IEEE International Symposium on Electromagnetic Compatibility 2009 209-212 2009/08
DOI：
10.1109/ISEMC.2009.5284621
ISSN：
2158-110X
-
Mechanism behind Information Leakage in Electromagnetic Analysis of Cryptographic Modules
Peer-reviewed
Takeshi Sugawara, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, Akashi Satoh
Information Security Applications: 10th International Workshop, WISA 2009, Lecture Notes in Computer Science / Security and Cryptology Series 5932 66-78 2009/08
DOI：
10.1007/978-3-642-10838-9_6
ISSN：
0302-9743
eISSN：
1611-3349
-
An Analysis of Information Leakage from a Cryptographic Hardware via Common-Mode Current
Invited
Peer-reviewed
Yu-ichi Hayashi, Takeshi Sugawara, Yoshiki Kayano, Naofumi Homma, Takaaki Mizuki, Akashi Satoh, Takafumi Aoki, Shigeki Minegishi, Hideaki Sone, Hiroshi Inoue
Proceedings of the 2009 International Symposium on EMC, Kyoto (21P1-5) 17-20 2009/07/21
DOI：
10.34385/proc.14.21P1-5
-
Spectrum Analysis on Cryptographic Modules to Counteract Side-Channel Attacks
Invited
Peer-reviewed
Takeshi Sugawara, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone, Akashi Satoh
Proceedings of the 2009 International Symposium on EMC, Kyoto (21P1-6) 21-24 2009/07/21
-
Six-Card Secure AND and Four-Card Secure XOR
Peer-reviewed
Takaaki Mizuki, Hideaki Sone
Frontiers in Algorithmics (FAW2009), Lecture Notes in Computer Science 5598 358-369 2009/06
DOI：
10.1007/978-3-642-02270-8_36
ISSN：
0302-9743
eISSN：
1611-3349
-
The effect of position of a connector contact failure on electromagnetic near-field around a coaxial cable
Peer-reviewed
Yu-ichi Hayashi, Hideaki Sone
IEICE Transactions on Communications E92-B (6) 1969-1973 2009/06
DOI：
10.1587/transcom.E92.B.1969
10.1093/ietcom/e92-b.6.1969-1973
ISSN：
0916-8516
eISSN：
1745-1345
-
A reletionship between magnetic field distribution and current distribution on connector contact failure
Peer-reviewed
Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone
2009 Korea-Japan Joint Conference on AP/EMC/EMT 2009/05/15
-
A one-round secure message broadcasting protocol through a key sharing tree
Peer-reviewed
Takaaki Mizuki, Takuya Sato, Hideaki Sone
Information Processing Letters 109 (15) 842-845 2009/04/05
DOI：
10.1016/j.ipl.2009.04.004
ISSN：
0020-0190
eISSN：
1872-6119
-
Open Research Testbed toward Future Network Architecture Development - Fact Sheets of Four Year Activities in National Project JGN7 - :
WAKIYAMA Shunichiro, KANNO Hironori, SONE Hideaki
IPSJ Magazine 49 (10) 1147-1152 2008/10/15
Publisher:
Information Processing Society of Japan (IPSJ)
ISSN：
0447-8053
-
On contact conditions in connectors to cause Common Mode radiation
Peer-reviewed
Yu-Ichi Hayashi, Yoshiki Kayano, Takaaki Mizuki, Hideaki Sone, Hiroshi Inoue
2008 International Symposium on Electromagnetic Compatibility, Detroit 2008 (TUE-AM-5-OF-6) 542-545 2008/08/19
DOI：
10.1109/ISEMC.2008.4652102
ISSN：
1077-4076
eISSN：
2158-1118
-
Fundamental measurement of electromagnetic field radiated from a coaxial transmission line caused by connector contact failure
Peer-reviewed
Yu-ichi Hayashi, Hideaki Sone
IEICE Transactions on Electronics E91-C (8) 1306-1312 2008/08
DOI：
10.1093/ietele/e91-c.8.1306
ISSN：
1745-1353
eISSN：
1745-1353
-
Resource access control for wireless LAN roaming systems
Peer-reviewed
Yoshikazu Watanabe, Hideaki Goto, Hideaki Sone
International Symposium on Applications and the Internet (SAINT2008) Workshop on Middleware Architecture in the Internet (Mid Arch 2008) 281-284 2008/07/29
DOI：
10.1109/SAINT.2008.29
-
High Speed Remote Visualization with Large-Scale Volume Data in Grid Environments
Peer-reviewed
Yasuo Ebara, Takuya Tanaka, Hideaki Sone, Koji Koyamada
IIEEJ Image Electronics and Visual Computing Workshop 2007 IEVC2007, Cairns (4C-3) 25-27 2007/11/25
-
Secure multiparty computations using the 15 puzzle
Peer-reviewed
Takaaki Mizuki, Yoshinori Kugimoto, Hideaki Sone
Lecture Notes in Computer Science/Combinatorial Optimization and Applications, COCOA 2007 (Extended abstract) 4616 255-266 2007/08
DOI：
10.1007/978-3-540-73556-4_28
ISSN：
0302-9743
eISSN：
1611-3349
-
Secure multiparty computations using a dial lock
Peer-reviewed
Takaaki Mizuki, Yoshinori Kugimoto, Hideaki Sone
Lecture Notes in Computer Science/Theory and Applications of Models of Computation TAMC 2007 4484 499-510 2007/07
DOI：
10.1007/978-3-540-72504-6_44
ISSN：
0302-9743
eISSN：
1611-3349
-
An application of ESOP expressions to secure computations
Peer-reviewed
Takaaki Mizuki, Taro Otagiri, Hideaki Sone
Journal of Circuits, Systems, and Computers 16 (2) 191-198 2007/04
DOI：
10.1142/S0218126607003605
ISSN：
0218-1266
eISSN：
1793-6454
-
A policy-based, secure access control mechanism for network roaming infrastructures
Peer-reviewed
Tetsuo Imai, Hideaki Goto, Hideaki Sone
SAINT - 2007 International Symposium on Applications and the Internet - Workshops, SAINT-W 30-30 2007/02
DOI：
10.1109/SAINT-W.2007.12
-
Securely computing XOR with 10 cards
Peer-reviewed
Takaaki Mizuki, Fumishige Uchiike, Hideaki Sone
Australasian Journal of Combinatorics 36 279-293 2006/10
-
The measurement of radiated electromagnetic field from a coaxial cable with connector contact failure
Peer-reviewed
Yu Ichi Hayashi, Hideaki Sone
IEEE International Symposium on Electromagnetic Compatibility 3 (TH-AM-2-1) 594-597 2006/08/17
DOI：
10.1109/isemc.2006.1706380
ISSN：
1077-4076
-
Worst-case optimal fingerprinting codes for non-threshold collusion
Peer-reviewed
Takaaki Mizuki, Satoshi Nounin, Hideaki Sone, Yousuke Toyota
Digital Rights Management. Technologies, Issues, Challenges and Systems, (First International Conference, DRMTICS 2005, Revised Selected Papers), Lecture Notes in Computer Science 3919 (6-2) 203-216 2006/08
DOI：
10.1007/11787952_16
ISSN：
0302-9743
eISSN：
1611-3349
-
Formation mechanism of dark bridge between contacts with very slow opening speed
Peer-reviewed
Hiroyuki Ishida, Shosuke Suzuki, Hideaki Sone, Hiroshi Inoue, Masanari Taniguchi, Tasuku Takagi
IEICE Transactions on Electronics E89-C (8) 1136-1140 2006/08/01
DOI：
10.1093/ietele/e89-c.8.1136
ISSN：
1745-1353
-
Fundamental measurement of radiated electromagnetic field from a transmission line which has connector contact failure
Peer-reviewed
Yu Ichi Hayashi, Hideaki Sone
23rd International Conference on Electrical Contacts, ICEC 2006 - together with the 6th International Session on Electromechanical Devices, IS-EMD 2006 23 (P22) 415-420 2006/06
-
Behavioral phenomena of bridge in contacts with respect to opening speed
Peer-reviewed
Hiroyuki Ishida, Shosuke Suzuki, Hideaki Sone, Hiroshi Inoue, Masanari Taniguchi, Tasuku Takagi
23rd International Conference on Electrical Contacts, ICEC 2006 - together with the 6th International Session on Electromechanical Devices, IS-EMD 2006 23 (P15) 378-383 2006/06
-
Secure computations in a minimal model using multiple-valued ESOP expressions
Peer-reviewed
Takaaki Mizuki, Taro Otagiri, Hideaki Sone
Theory and Applications of Models of Computation, Third International Conference, TAMC 2006, Lecture Notes in Computer Science 3959 547-554 2006/05
DOI：
10.1007/11750321_52
ISSN：
0302-9743
eISSN：
1611-3349
-
Application of an On-demand Delivery Method to Wide-area Distributed FTP Service and Its Evaluation
Peer-reviewed
Hironori Kanno, Hideaki Sone
IPSJ journal 47 (4) 1031-1041 2006/04/15
Publisher:
Information Processing Society of Japan (IPSJ)
ISSN：
1882-7764
-
Research and Development of Application-oriented Management Platform
Peer-reviewed
Hisanori Masuda, Takuo Suganuma, Glenn Mansfield Keeni, Yoshitaka Shibata, Tetsuo Kinoshita, Hideaki Sone
Journal of the National Institute of Information and Communications Technology 52 (3-4) 151-160 2005/12
ISSN：
1349-3205
-
Worst-Case Optimal Fingerprinting Codes for Non-threshold Collusion
Peer-reviewed
Takaaki Mizuki, Satoshi Nounin, Hideaki Sone, Yousuke Toyota
DRMTICS 2005 (First International Conference on Digital Rights Management: Technology, Issues, Challenges and Systems, Sydney (6-2) 2005/11
-
Relationship between length and diameter of contact bridge formed under thermal equilibrium condition
Peer-reviewed
Hiroyuki Ishida, Masanari Taniguchi, Hideaki Sone, Hiroshi Inoue, Tasuku Takagi
IEICE Transactions on Electronics E88-C (8) 1566-1572 2005/08
DOI：
10.1093/ietele/e88-c.8.1566
ISSN：
1745-1353
-
A method to monitor a BBS using feature extraction of text data
Peer-reviewed
Yu Ichifuji, Susumu Konno, Hideaki Sone
3rd International Conference on Human.Society@Internet, Lecture Notes in Computer Science 3597 349-352 2005/07
DOI：
10.1007/11527725_38
ISSN：
0302-9743
-
A new dynamical domain decomposition method for parallel molecular dynamics simulation
Peer-reviewed
V. Zhakhovskii, K. Nishihara, Y. Fukuda, S. Shimojo, T. Akiyama, S. Miyanaga, H. Sone, H. Kobayashi, E. Ito, Y. Seo, M. Tamura, Y. Ueshima
2005 IEEE International Symposium on Cluster Computing and the Grid, CCGrid 2005, Cardiff 2 848-854 2005/05
DOI：
10.1109/CCGRID.2005.1558650
-
Time-Domain Analysis of Arc Voltage and Electromagnetic Noise Caused by Opening Arc Discharge between Carbon and Copper Contacts
Peer-reviewed
Toshiaki Koizumi, Kumio Takahashi, Yasuo Ebara, Hideaki Sone, Yosiaki Nemoto
Electronics and Communications in Japan, Part I: Communications (English translation of Denshi Tsushin Gakkai Ronbunshi) 87 (4) 92-99 2004/04
DOI：
10.1002/ecja.1188
ISSN：
8756-6621
-
A Method to Control the Impulsive Noise caused from the opening Discharge between C and Cu Contacts
Peer-reviewed
Toshiaki Koizumi, Kumio Takahashi, Yasuo Ebara, Hideaki Sone, Yoshiaki Nemoto
The Transactions of the Institute of Electronics, Information and Communication Engineers B 86-B (7) 1112-1119 2003/07/01
Publisher:
The Institute of Electronics, Information and Communication Engineers
ISSN：
1344-4697
-
Modeling of the Traffic in On-demand NetNews Delivery System and Its Evaluation of Response Time
Peer-reviewed
Hironori Kanno, Hideaki Sone, Yoshiaki Nemoto
IPSJ journal 44 (3) 535-543 2003/03/15
Publisher:
Information Processing Society of Japan (IPSJ)
ISSN：
1882-7764
-
Development of Network-based Support System for Children Avoiding School and Handicapped Children
Peer-reviewed
WATABE Shinichi, KUMAI Masayuki, SONE Hideaki, HIYANE Kazuo, IIO Jun, SUGAI Kuniaki
Japan Journal of Educational Technology 26 (1) 11-20 2002/06
Publisher:
Japan Society for Educational Technology
DOI：
10.15077/jmet.26.1_11
ISSN：
0385-5236
-
Application of an On-Demand Delivery Method to NetNews System and Its Evaluation
Peer-reviewed
KANNO Hironori, SONE Hideaki, NEMOTO Yoshiaki
Transactions of Information Processing Society of Japan 42 (12) 2963-2972 2001/12/15
Publisher:
Information Processing Society of Japan (IPSJ)
ISSN：
1882-7764
-
A Method to Reduce Electromagnetic Noise caused by Arc Discharge of Ag-Pd Electrical Contacts in terms of Thermal Factor
Peer-reviewed
EBARA Yasuo, SONE Hideaki, NEMOTO Yoshiaki
The Transactions of the Institute of Electronics,Information and Communication Engineers B J84-B (12) 2367-2373 2001/12/01
Publisher:
The Institute of Electronics, Information and Communication Engineers
ISSN：
1344-4697
-
Transition from the anodic arc phase to the cathodic metallic arc phase in vacuum at low DC electrical level
International-coauthorship
Peer-reviewed
L. Morin, N. Ben Jemaa, D. Jeannot, H. Sone
Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts 47 (3.3) 88-93 2001/09
DOI：
10.1109/HOLM.2001.953194
ISSN：
0361-4395
-
An experiment of transmitting regional live pictures by wireless communication system
Peer-reviewed
Masahiro Hiji, Yukinori Konno, Hideaki Sone, Shunichiro Wakiyama, Hironori Kanno
IEEE Region 10 International Conference on Electrical and Electronic Technology 2001 (32.4) 786-791 2001/08
DOI：
10.1109/TENCON.2001.949700
-
Experimental study on relationship between electromagnetic noise and surface profile from arc discharge of Cu-C contact
Peer-reviewed
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto
Electronics and Communications in Japan, Part II: Electronics (English translation of Denshi Tsushin Gakkai Ronbunshi) 83 (9) 55-64 2000/09
DOI：
10.1002/1520-6432(200009)83:9<55::AID-ECJB7>3.0.CO;2-9
ISSN：
8756-663X
-
Correlation between arcing phenomena and electromagnetic noise of opening electric contacts
Peer-reviewed
Yasuo Ebara, Hideaki Sone, Yoshiaki Nemoto
Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts 46 191-197 2000/09
DOI：
10.1109/HOLM.2000.889929
ISSN：
0361-4395
-
Time-domain Analysis of the Arc Voltage and Electromagnetic Noise caused from Opening Arc Discharge between the C and Cu Contact
Peer-reviewed
KOIZUMI Toshiaki, TAKAHASHI Kumio, EBARA Yasuo, SONE Hideaki, NEMOTO Yosiaki
The Transactions of the Institute of Electronics,Information and Communication Engineers B J83-B (7) 1027-1033 2000/07/25
Publisher:
The Institute of Electronics, Information and Communication Engineers
ISSN：
1344-4697
-
A discussion of electrode temperature dependency of arc duration in Ag and Pd contacts
Peer-reviewed
Hiroyuki Ishida, Hideaki Sone, Masanari Taniguchi, Tasuku Takagi
20th International Conference on Electrical Contacts 20 2.3 2000/06
-
A measurement on electromagnetic noise and change of surface in arcing electric contacts
Peer-reviewed
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto
IEEE Transactions on Components and Packaging Technologies 23 (2) 293-299 2000/06
DOI：
10.1109/6144.846767
ISSN：
1521-3331
-
Measurement on electromagnetic noise and change of surface in arcing electric contacts
Peer-reviewed
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto
Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts 45 (1.3) 17-23 1999/10/04
DOI：
10.1109/HOLM.1999.795922
ISSN：
0361-4395
-
Experiments on relationship between electromagnetic noise and surface profile change by arc discharge of heterogeneous material contacts
Peer-reviewed
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto
IEEE International Symposium on Electromagnetic Compatibility, Seattle 1 (1E-9) 165-170 1999/08/02
DOI：
10.1109/ISEMC.1999.812888
ISSN：
1077-4076
eISSN：
2158-1118
-
Measurements of arc phenomena and bridge phenomena in slowly opening Pd contacts
Peer-reviewed
Hiroyuki Ishida, Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi
ICECT'99, International Conference on Electrical Contacts 30 199-204 1999/07
-
An Experimental Study on Correlation between Electromagnetic Noise and Trace of Discharge in Cu-C Electrodes
Peer-reviewed
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto
1999 International Symposium on Electromagnetic Compatibility (EMC'99 Tokyo) (18P402) 122-125 1999/05/18
DOI：
10.1109/ELMAGC.1999.801278
-
An Experimental Study on Relationship between Electromagnetic Noise and Surface Profile from Arc Discharge of Cu-C Contact
Peer-reviewed
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto
The Transactions of the Institute of Electronics,Information and Communication Engineers. C-II 82 (4) 181-189 1999/04
Publisher:
The Institute of Electronics, Information and Communication Engineers
ISSN：
0915-1907
-
A fundamental study on effect of contact condition for electromagnetic noise at copper-carbon electrodes
Peer-reviewed
Yasuo Ebara, Toshiaki Koizumi, Hideaki Sone, Yoshiaki Nemoto
IEICE Transactions on Electronics E82-C (1) 49-54 1999/01
ISSN：
0916-8524
eISSN：
1745-1353
-
The dynamic symptom isolation algorithm for network fault management and its evaluation
Peer-reviewed
Takumi Mori, Kohei Ohta, Nei Kato, Hideaki Sone, Glenn Mansfield, Yoshiaki Nemoto
IEICE Transactions on Communications E81-B (12) 2471-2479 1998/12
ISSN：
0916-8516
eISSN：
1745-1345
-
Three Dimensional Visualization of Change in Contact Surface
Peer-reviewed
EBARA Yasuo, SONE Hideaki, NEMOTO Yoshiaki, TAKAGI Tasuku
Transactions of the Society of Instrument and Control Engineers 34 (11) 1526-1531 1998/11
Publisher:
The Society of Instrument and Control Engineers
DOI：
10.9746/sicetr1965.34.1526
ISSN：
0453-4654
-
Measurement of arc phenomena in slowly opening Ag and Pd contacts
Peer-reviewed
Hiroyuki Ishida, Hideaki Sone, Shunichi Kono, Tasuku Takagi
ICEC'98, 19th International Conference on Electric Contact Phenomena, Nuremberg (64) 77-81 1998/09
-
A high-resolution measurement system for surface profile of electric contact
Peer-reviewed
Yasuo Ebara, Hideaki Sone, Yoshiaki Nemoto, Tasuku Takagi
IEICE Transactions on Electronics E81-C (3) 432-434 1998/03
ISSN：
0916-8524
eISSN：
1745-1353
-
Divide and conquer technique for network fault management
Peer-reviewed
Kohei Ohta, Takumi Mori, Nei Kato, Hideaki Sone, Glenn Mansfield, Yoshiaki Nemoto
Proceedings of the Fifth IFIP/IEEE International Symposium on Integrated Network Management V (50) 675-687 1997/05/14
DOI：
10.1007/978-0-387-35180-3_50
-
A Method for Construction of Network Organized Database (NODB) and an Approach to Ling-Life Switching Contacts
Peer-reviewed
Sone Hideaki, Sugimoto Hitoshi, Ishida Hiroyuki, Takagi Tasuku
The Transactions of the Institute of Electronics,Information and Communication Engineers. C-(0xF9C2) J79-C-II (11) 657-663 1996/11/25
Publisher:
The Institute of Electronics, Information and Communication Engineers
ISSN：
0915-1907
-
Realtime Measurement of Electric Contact Phenomena.
Invited
Peer-reviewed
SONE Hideaki
Journal of The Society of Instrument and Control Engineers 35 (8) 606-615 1996/08
Publisher:
The Society of Instrument and Control Engineers
DOI：
10.11499/sicejl1962.35.8_606
ISSN：
0453-4662
-
Problems in management information retrieval for high-speed networks and a proposed solution
Peer-reviewed
Kohei Ohta, Nei Kato, Hideaki Sone, Glenn Mansfield, Yoshiaki Nemoto
IEICE Transactions on Communications E79-B (8) 1054-1059 1996/08
ISSN：
0916-8516
eISSN：
1745-1345
-
Sensing device for in-line emi checker of small electric appliances
Peer-reviewed
Toshiaki Koizumi, Kumio Takahashii, Shun Suzukii, Hideaki Sone, Yoshiaki Nemotoii
IEICE Transactions on Communications E79-B (4) 509-514 1996/04
ISSN：
0916-8516
eISSN：
1745-1345
-
Experiments on relationship between metallic phase and gasenous phase arc and contact resistance in Ag cotacts with opening arc
Peer-reviewed
Hitoshi Sugimoto, Tasuku Takagi, Hideaki Sone
Electronics and Communications in Japan (Part II: Electronics) 78 (3) 106-112 1995/03
DOI：
10.1002/ecjb.4420780312
ISSN：
8756-663X
eISSN：
1520-6432
-
Recent development of testing system for arcing contacts
Invited
Peer-reviewed
Hideaki Sone, Tasuku Takagi
IEICE Transactions on Electronics E77-C (10) 1545-1552 1994/10
ISSN：
0916-8524
eISSN：
1745-1353
-
Experimental study on relationship between bridge and arc phenomena in breaking Ag contacts
Peer-reviewed
Satoru Yamano, Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi
Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts, Chicago 40 (2.2) 89-94 1994/10
DOI：
10.1109/HOLM.1994.636824
ISSN：
0361-4395
-
A measurement on contact resistance and surface profile of arcing Ag contacts
Peer-reviewed
Hideaki Sone, Hitoshi Sugimoto, Tasuku Takagi
Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts, Chicago 40 (2.4) 105-109 1994/10
DOI：
10.1109/HOLM.1994.636826
ISSN：
0361-4395
-
Experiments on Relationship between Metallic Phase and Gaseous Phase Arc and Contact Resistance in Ag Contacts with Opening Arc
Peer-reviewed
Sugimoto Hitoshi, Sone Hideaki, Takagi Tasuku
The Transactions of the Institute of Electronics,Information and Communication Engineers. C-(0xF9C2) J77-C-II (9) 371-376 1994/09/25
Publisher:
The Institute of Electronics, Information and Communication Engineers
ISSN：
0915-1907
-
Relationship between bridge and arc phenomena in opening Ag contacts
Peer-reviewed
Satoru Yamano, Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi
17th Int Conf on Electrical Contacts, Nagoya (S2-1) 39-43 1994/07/04
-
An experiment on the dependency of contact opening velocity on arc phenomena of slowly opening Ag and Pd contacts
Peer-reviewed
Hiroyuki Ishida, Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi
17th Int Conf on Electrical Contacts, Nagoya (S2-2) 45-50 1994/07/04
-
Relationship of contact resistance to arc duration in Ag contacts
Peer-reviewed
Hideaki Sone, Hiroyuki Ishida, Hitoshi Sugimoto, Tasuku Takagi
17th Int Conf on Electrical Contacts, Nagoya (S2-5) 63-67 1994/07/04
-
Relationship between contact resistance and surface profile in arcing Ag contact
Peer-reviewed
Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi
17th Int Conf on Electrical Contacts, Nagoya (S3-1) 71-78 1994/07/04
-
Optical surface profile measurement of operating electric contact
Peer-reviewed
Hitoshi Sugimoto, Hideaki Sone, Tasuku Takagi
1994 IEEE Instrumentation and Measurement Technology Conference, IMTC 3 (THPM5-5) 1341-1344 1994/05
DOI：
10.1109/IMTC.1994.351807
-
An Experiment on the Relationship between Arc Duration and Resistanec in Ag Contacts at Low Opening Speed
Peer-reviewed
Ishida Hiroyuki, Sugimoto Hitoshi, Sone Hideaki, Takagi Tasuku
IEEJ Transactions on Fundamentals and Materials 113 (5) 416-419 1993/05
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms1990.113.5_416
ISSN：
0385-4205
-
Passive electronic components / parts (C/P) : present and future
Invited
Hideaki Sone, Tasuku Takagi
International Conference Electronic Passive Components (C1) 1993/02
-
Experiments on dependency of metal mixing ratio in Ag‐Pd alloy contacts on breaking arc duration, metal erosion and transfer
Peer-reviewed
Hiroyuki Ishida, Hideaki Sone, Tasuku Takagi
Electrical Engineering in Japan 111 (6) 7-16 1991/06
DOI：
10.1002/eej.4391110602
ISSN：
0424-7760
eISSN：
1520-6416
-
Electrode Temperature Dependency on Arc and Erosion in Electric Contacts
Peer-reviewed
Hideaki Sone, Hiroyuki Ishida, Tasuku Takagi
IEEE Transactions on Components, Hybrids, and Manufacturing Technology 14 (2) 315-318 1991/06
DOI：
10.1109/33.87311
ISSN：
0148-6411
-
An Experimental study on the Effect of Non-Gaussian Burst Noise on TV Picture.
Peer-reviewed
Tanaka Motoshi, Sone Hideaki, Takagi Tasuku
The Journal of the Institute of Television Engineers of Japan 45 (5) 644-646 1991/05
Publisher:
The Institute of Image Information and Television Engineers
DOI：
10.3169/itej1978.45.644
ISSN：
0386-6831
-
Experimental Studies on Effects of Continuous Gaussian Noise and Burst Gaussian Noise on TV Picture
TANAKA Motoshi, SONE Hideaki, TAKAGI Tasuku
ITE Technical Report 15 (18) 49-54 1991
Publisher:
The Institute of Image Information and Television Engineers
DOI：
10.11485/tvtr.15.18_49
-
Optical transient spectrum analyzer (OTSA) with high time‐resolution
Peer-reviewed
Kiminori Sato, Yoji Nagasawa, Hideaki Sone, Tasuku Takagi
Electronics and Communications in Japan (Part II: Electronics) 73 (10) 42-50 1990/10
DOI：
10.1002/ecjb.4420731005
ISSN：
8756-663X
eISSN：
1520-6432
-
Analysis of arc discharge behavior in Ag, Pd and their alloy contacts by spectroscopic measurement
Peer-reviewed
Kiminori Sato, Hideaki Sone, Yoji Nagasawa, Tasuku Takagi
IEICE Transactions on Electronics II J73-C-II (10) 596-603 1990/10
-
Experiments on Dependency of Metai Mixing Ratio in Ag-Pd Alloy Contacts on Breaking Arc Duration, Metal Erosion and Transfer
Peer-reviewed
Ishida Hiroyuki, Sone Hideaki, Takagi Tasuku
IEEJ Transactions on Fundamentals and Materials 110 (8) 505-514 1990/08
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms1990.110.8_505
ISSN：
0385-4205
-
Electrode temperature dependency on arc and erosion in electric contacts
Peer-reviewed
Hideaki Sone, Hiroyuki Ishida, Tasuku Takagi
Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts 36 33-36 1990/08
DOI：
10.1109/HOLM.1990.112991
ISSN：
0361-4395
-
Optical Transient Spectrum Analyzer (OTSA) with High Time-Resolution
Peer-reviewed
Kiminori Sato, Hideaki Sone, Yoji Nagasawa, Tasuku Takagi
IEICE Transactions C-I J73-C-I (3) 121-127 1990/03
-
A Holographic Measurement of Microscopical Sliding of Electrical Contact Due to Contact Spring Thermal Deformation
Peer-reviewed
Masanari Taniguchi, Hideaki Sone, Tasuku Takagi
IEEE Transactions on Components, Hybrids, and Manufacturing Technology 13 (1) 20-26 1990/03
DOI：
10.1109/33.52879
ISSN：
0148-6411
-
Role of the Metallic Phase Arc Discharge on Arc Erosion in Ag Contacts
Peer-reviewed
Hideaki Sone, Tasuku Takagi
IEEE Transactions on Components, Hybrids, and Manufacturing Technology 13 (1) 13-19 1990/03
DOI：
10.1109/33.52844
ISSN：
0148-6411
-
An Experimental Study on the Relationship between Noise Parameters and Subjective Evaluation Score of TV Picture
TANAKA Motoshi, SONE Hideaki, TAKAGI Tasuku
ITE Technical Report 14 (55) 19-24 1990
Publisher:
The Institute of Image Information and Television Engineers
DOI：
10.11485/tvtr.14.55_19
-
Observation of electrical contact surface by using digital image processing system
Peer-reviewed
Masanari Taniguchi, Morimichi Mizuno, Hideaki Sone, Tasuku Takagi
Transactions IEICE E72 (10) 1069-1071 1989/10
-
An electromagnetic field pattern measuring technique and its application to analysis of indoor electromagnetic field
Peer-reviewed
Jian Qing Wang, Tsugio Sato, Hideaki Sone, Tasuku Takagi
IEEE International Symposium on Electromagnetic Compatibility pt 1 (8a-A3) 17-22 1989/09
ISSN：
0190-1494
-
Role of the metallic phase arc discharge on arc erosion in Ag contacts
Peer-reviewed
Hideaki Sone, Tasuku Takagi
Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts 79-85 1989/09
DOI：
10.1109/HOLM.1989.77920
ISSN：
0361-4395
-
A holographic measurement of microscopical sliding of electrical contact due to contact spring thermal deformation
Peer-reviewed
Masanari Taniguchi, Hideaki Sone, Tasuku Takagi
Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts 35 245-252 1989/09
DOI：
10.1109/HOLM.1989.77946
ISSN：
0361-4395
-
Measurements on the influence of metallic phase arc on electrode surface for breaking Ag contacts
Peer-reviewed
Hideaki Sone, Tasuku Takagi, Masao Nakai
Electronics and Communications in Japan (Part II: Electronics) 72 (7) 101-106 1989/07
DOI：
10.1002/ecjb.4420720712
ISSN：
8756-663X
eISSN：
1520-6432
-
Real-time digital measurement of electric contact arcing phenomena
Peer-reviewed
Hideaki Sone, Tasuku Takagi
Proc. of Int. Conf. on Electrical Contacts and Electromechanical Components 543-547 1989/05
-
A measurement and a classification of arcing phenomena of AgPd alloy contacts in low pressure
Peer-reviewed
Hideaki Sone, Tasuku Takagi
Electronics and Communications in Japan (Part II: Electronics) 71 (11) 11-18 1988/11
DOI：
10.1002/ecjb.4420711102
ISSN：
8756-663X
eISSN：
1520-6432
-
Measurements on the Influence of metallic phase arc on electrode surface for breaking Ag contacts
Peer-reviewed
Hideaki Sone, Masao Nakai, Tasuku Takagi
IEICE Transactions on Electronics J71-C (10) 1368-1372 1988/10
Publisher:
ISSN：
0913-5723
-
Development of a spectroscopic measuring system for time-varying optical spectra using a CCD image sensor
Peer-reviewed
Kiminori Sato, Toshiaki Koizumi, Hideaki Sone, Tasuku Takagi
Conference onPrecision Electromagnetic Measurements, 1988. CPEM 88 Digest 361-362 1988/06
DOI：
10.1109/CPEM.1988.671346
ISSN：
0589-1485
-
A measurement on the relationship between metallic phase arc duration and electrode mass change in Ag contacts
Peer-reviewed
Hideaki Sone, Masao Nakai, Tasuku Takagi
Transaction of IEICE E71 (4) 268-271 1988/04
-
A measurement and a classification of arcing phenomena of AgPd alloy contacts in low pressure
Peer-reviewed
Hideaki Sone, Tasuku Takagi
IEICE Transactions on Electronics J70-C (12) 1569-1574 1987/12
Publisher:
ISSN：
0913-5723
-
Development of a Highspeed Time-Resolved Spectroscope and Its Application to Analysis of Time-Vaiying Optical Spectra
Peer-reviewed
Kiminori Sato, Tomohiko Sato, Hideaki Sone, Tasuku Takagi
IEEE Transactions on Instrumentation and Measurement IM-36 (4) 1045-1049 1987/12
DOI：
10.1109/TIM.1987.6312608
ISSN：
0018-9456
eISSN：
1557-9662
-
Automatic measurement of critical point and features of breaking arc voltage in Ag contacts
Peer-reviewed
Hideaki Sone, Masao Naki, Tasuku Takagi
Transactions of the Institute of Electronics, Information and Communication Engineers, Section E E70 (11) 1051-1053 1987/11
-
Current dependencies of contact resistance, arc duration and bridge voltage in Ag and Pd contacts
Peer-reviewed
Hideaki Sone, Tasuku Takagi
電子情報通信学会論文誌C J70-C (11) 1561-1563 1987/11
Publisher:
ISSN：
0913-5723
-
Fully digital gaussian signal source
Peer-reviewed
Hideaki Sone, Hiroki Shizuya, Tasuku Takagi
IEICE Transactions on Electronics J70C (7) 1101-1102 1987/07
-
Vector quantization of speech signals using principal component analysis
Peer-reviewed
Minoru Kohata, Hideaki Sone, Hiroshi Echigo, Tasuku Takagis
Electronics and Communications in Japan (Part I: Communications) 70 (5) 16-26 1987/05
DOI：
10.1002/ecja.4410700502
ISSN：
8756-6621
eISSN：
1520-6424
-
Precise Control and Stabilization of Laser Diode by using Micro-Computer
Peer-reviewed
Echigo Hiroshi, Otaguro Yukio, Sone Hideaki, Takagi Tasuku
IEEJ Transactions on Electronics, Information and Systems 107 (5) 471-476 1987/05
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejeiss1987.107.5_471
ISSN：
0385-4221
-
Relationship between bridge energy and metallic phase arc duration in electric contacts
Peer-reviewed
Kiminori Sato, Tomohiko Sato, Hideaki Sone, Tasuku Takagi
Japanese Journal of Applied Physics 26Part2 (4) L261-L263 1987/04
DOI：
10.1143/JJAP.26.L261
ISSN：
0021-4922
eISSN：
1347-4065
-
Development of a high speed time-resolved spectroscope and its application to analysis of time-varying optical spectrum
Peer-reviewed
Kiminori Sato, Tomohiko Sato, Hideaki Sone, Tasuku Takagi
Proc.IEEE Instrum. and Meas. Technol. Conf., IMTC 259-263 1987/04
-
High‐speed spectroscopic measuring apparatus for contact arc discharges using CCD image sensor
Peer-reviewed
Kiminori Sato, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi
Electronics and Communications in Japan (Part II: Electronics) 70 (3) 70-77 1987/03
DOI：
10.1002/ecjb.4420700307
ISSN：
8756-663X
eISSN：
1520-6432
-
A basic study on automatic measurement of surface profile of electric contact using light section microscope
Peer-reviewed
Hideaki Sone, Tasuku Takagi
IEICE Transactions on Electronics J70-C (3) 424-429 1987/03
Publisher:
ISSN：
0913-5723
-
Development of Time-Resolved CCD Spectroscope and Its Application
SATO Kiminori, KOIZUMI Toshiaki, SONE Hideaki, TAKAGI Tasuku
ITE Technical Report 11 (28) 13-18 1987
Publisher:
The Institute of Image Information and Television Engineers
DOI：
10.11485/tvtr.11.28_13
-
A study of thermal effects on arc duration in Pd and Pt contacts
Peer-reviewed
Hiroyuki Ishida, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi
Electrical Engineering in Japan 107 (1) 18-29 1987/01
DOI：
10.1002/eej.4391070103
ISSN：
0424-7760
eISSN：
1520-6416
-
An argumental expression of correlation function between arbitrary codewords
Peer-reviewed
Hiroki Shizuya, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi
Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E E69 (12) 1294-1302 1986/12
ISSN：
0387-236X
-
メル尺度化スペクトルを用いた周波数領域における音声データ圧縮法の検討
Peer-reviewed
久保田浩司, 木幡稔, 曽根秀昭, 越後宏, 高木相
電子通信学会論文誌A J69-A (11) 1439-1445 1986/11
-
A novel measurement system for electric contact phenomena using advanced electronic devices
Peer-reviewed
Hideaki Sone, Tasuku Takagi
Proc. of 13th Int. Conf. on Electr. Contacts 427-431 1986/09
-
Electrode temparature dependency of arc duration, material wear and transfer in bar contacts
Peer-reviewed
Tomohiko Sato, Hiroyuki Ishida, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi
Proc. of Int. Conf. on Electr. Contacts, Electromechanical Comp. and Their Appl. (IC-CEMCA) 185-194 1986/07
-
Highspeed time-resolved parallel spectroscopic measurement of contact arc using CCD image sensor
Peer-reviewed
Kiminori Sato, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi
Proc. of Int. Conf. on Electr. Contacts, Electromechanical Comp. and Their Appl. (IC-CEMCA) 929-938 1986/07
-
Automatic data acquisition and processing system of contact phenomena based on advanced microelectronics
Peer-reviewed
Hideaki Sone, Tasuku Takagi
Proc. of Int. Conf. on Electr. Contacts, Electromechanical Comp. and Their Appl. (IC-CEMCA) 939-946 1986/07
-
A Study of Thermal Effect on Arc Duration in Pd and Pt Contacts
Peer-reviewed
Hiroyuki Ishida, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi
IEEJ Transactions on Fundamentals and Materials 106 (5) 203-209 1986/05
Publisher:
The Institute of Electrical Engineers of Japan
DOI：
10.1541/ieejfms1972.106.203
ISSN：
0385-4205
eISSN：
1347-5533
-
主成分分析を用いた高速ベクトル量子化
Peer-reviewed
木幡稔, 曽根秀昭, 越後宏, 高木相
電子通信学会論文誌A J69-A (5) 675-676 1986/05
Publisher:
電子通信学会
ISSN：
0373-6091
-
コンタクトのアーク現象に及ぼすホルダ放熱の影響に関する実験的検討
Peer-reviewed
佐藤友彦, 石田広幸, 曽根秀昭, 越後宏, 高木相
電子通信学会論文誌C J69-C (4) 457-463 1986/04
Publisher:
電子通信学会
ISSN：
0373-6113
-
ＣＣＤイメージセンサを用いたコンタクトアークの高速分光計測装置
Peer-reviewed
佐藤公則, 曽根秀昭, 越後宏, 高木相
電子通信学会論文誌C J69-C (4) 464-470 1986/04
-
主成分分析を用いた音声信号のベクトル量子化
Peer-reviewed
木幡 稔, 曽根 秀昭, 越後 宏, 高木 相
電子通信学会論文誌A J69-A (2) 252-260 1986/02
Publisher:
電子通信学会
ISSN：
0373-6091
-
Automatic measuring system of E-M field pattern for the analyses of E-M environment
Peer-reviewed
Hiroshi Echigo, Youichi Yamamoto, Hideaki Sone, Tasuku Takagi
Proc ISAP 85 (034-2) 185-188 1985/08
-
Pattern quality evaluation in a TV receiver immunity test using a composite noise generator (CNG)
Peer-reviewed
Nobuo Handa, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi
1984 Int Symp Electromagn Compat (EMC'84) (17AA2) 205-210 1984/10/17
DOI：
10.1109/ISEMC2.1984.7568017
-
Digital Gaussian Noise Generator with Multiplex M-Sequences
Peer-reviewed
Hiroki Shizuya, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi
IEICE Transactions on Electronics J66-C (11) 882-883 1983/11
-
Hardware implementation of a new parallel Fourier transform system using a differential transform matrix
Peer-reviewed
Minoru Kohata, Hideaki Sone, Hiroshi Echigo, Tasuku Takagi
Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E E66 (10) 596-601 1983/10
ISSN：
0387-236X
https://orcid.org/0000-0002-9395-9987