Details of the Researcher

PHOTO

Kohei Yamasue
Section
Research Institute of Electrical Communication
Job title
Associate Professor
Degree

  • 博士（工学）（京都大学）

  • 修士（工学）（京都大学）

Research History 5

  • 2016/07 - Present
    Tohoku University　Research Institute of Electrical Communication　Associate Professor

  • 2010/04 - 2016/06
    Tohoku University　Research Institute of Electrical Communication　Assistant Professor

  • 2008/08 - 2010/03
    Kyoto University　Graduate School of Engineering　Assistant Professor

  • 2008/04 - 2008/07
    Kyoto University　Venture Business Laboratory　Researcher (VentureBusinessLaboratory (VBL))

  • 2007/04 - 2008/03
    Kyoto University　Venture Business Laboratory　Researcher（中核的研究機関研究員）

Education 2

  • Kyoto University　Graduate School of Engineering　Department of Electrical Engineering

    2002/04 - 2007/03

  • Kyoto University　Faculty of Engineering　Undergraduate Schoold of Electrical and Electronic Engineering

    1998/04 - 2002/03

Committee Memberships 19

  • 電子情報通信学会　代議員

    2025/04 - 2026/03

  • 電子情報通信学会 非線形問題研究専門委員会　専門委員

    2011/05 - 2014/05

  • 電子情報通信学会 非線形問題研究専門委員会　専門委員

    2011/05 - 2014/05

  • Nonlinear Theory ant Its Applications, The Institute of Electronics, Information and Communication Engineers　"Special Section on Nonlinear Vibration in Mechanical Systems and Its Control-from Nano to Macro-" Guest Editorial Committee, Secretary

    2012/09 - 2013/07

  • Nonlinear Theory ant Its Applications，電子情報通信学会　「Special Section on Nonlinear Vibration in Mechanical Systems and Its Control-from Nano to Macro-」英文論文小特集編集委員会 編集幹事

    2012/09 - 2013/07

  • 電子情報通信学会 非線形問題研究会　幹事補佐

    2009/05 - 2011/05

  • 電子情報通信学会 非線形問題研究会　幹事補佐

    2009/05 - 2011/05

  • システム制御情報学会第52期および第53期編集委員会　校正担当委員

    2008/11 - 2010/05

  • システム制御情報学会第52期および第53期編集委員会　校正担当委員

    2008/11 - 2010/05

  • 財団法人近畿地方発明センター テクノ愛’09 選考委員会　委員

    2009/06 - 2010/03

  • 財団法人近畿地方発明センター テクノ愛’09 選考委員会　委員

    2009/06 - 2010/03

  • 財団法人近畿地方発明センター　「テクノ愛’08」に係る事前書類審査員

    2008/05 - 2009/03

  • 財団法人近畿地方発明センター　「テクノ愛’08」に係る事前書類審査員

    2008/05 - 2009/03

  • 財団法人近畿地方発明センター　「テクノ愛’07」に係る事前書類審査員

    2007/05 - 2008/03

  • 財団法人近畿地方発明センター　「テクノ愛’07」に係る事前書類審査員

    2007/05 - 2008/03

  • 14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14)/26th International colloquium on Scanning Probe Microscopy (ICSPM26)　プログラム委員

    2026 -

  • 2025年度電気関係学会東北支部連合大会　実行委員会委員・役員会委員

    2025 -

  • 電子情報通信学会　東北支部会計幹事

    2024/06 -

  • 2024年度電気関係学会東北支部連合大会　実行委員会委員・役員会委員

    2024 -

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Professional Memberships 3

  • 日本表面科学会 プローブ顕微鏡研究部会 会員

  • The Institute of Electronics, Information, and Communication Engineers

  • American Physical Society

Research Areas 3

  • Manufacturing technology (mechanical, electrical/electronic, chemical engineering) / Communication and network engineering /

  • Manufacturing technology (mechanical, electrical/electronic, chemical engineering) / Electronic devices and equipment /

  • Nanotechnology/Materials / Thin-film surfaces and interfaces /

Awards 1

  1. 石田實記念財団研究奨励賞

    2021/11　一般財団法人 石田實記念財団　走査型非線形誘電率顕微鏡によるナノ・原子スケール物性評価

Papers 58

  1. Insulating tip for scanning near-field microwave microscopes: application to van der Waals semiconductor imaging Peer-reviewed

    Kohei Yamasue, Koki Takano, Taiyo Ishizuka, Yasuo Cho

    Appl. Phys. Lett.　126　(24)　242107　2025/06/18

    DOI： 10.1063/5.0268493 　

  2. Visualization of the local dipole moment at the Si(111) surface using DFT calculations Peer-reviewed

    Akira Sumiyoshi, Kohei Yamasue, Yasuo Cho, Jun Nakamura

    Sci. Rep.　15　(1)　7436　2025/03/03

    Publisher: Springer Science and Business Media LLC

    DOI： 10.1038/s41598-025-91645-1 　

    eISSN： 2045-2322

  3. 時間分解走査型非線形誘電率顕微鏡によるAl2O3/ダイヤモンドの 局所容量-電圧特性のナノスケールゆらぎ評価 Peer-reviewed

    山末 耕平, 松本 翼, 德田 規夫, 長 康雄

    第43回ナノテスティングシンポジウム(NANOTS2023)　26-30　2023/11

  4. Correlation analysis on local capacitance-voltage profiles of a SiO2/SiC interface observed by time-resolved scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)　2023/03/07

    Publisher: IEEE

    DOI： 10.1109/edtm55494.2023.10103002 　

  5. 時間分解走査型非線形誘電率顕微鏡による SiO2/SiC の局所容量-電圧特性のナノスケールゆらぎ解析 Peer-reviewed

    山末 耕平, 長 康雄

    第42回ナノテスティングシンポジウム(NANOTS2022)　31-35　2022/11

  6. Local capacitance-voltage profiling and deep level transient spectroscopy of SiO2/SiC interfaces by scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Microelectron. Reliab.　135　114588-114588　2022/08

    Publisher: Elsevier BV

    DOI： 10.1016/j.microrel.2022.114588 　

    ISSN： 0026-2714

  7. Microscopic Evaluation of Al2O3/p-Type Diamond (111) Interfaces Using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

    Yu Ogata, Kohei Yamasue, Xufang Zhang, Tsubasa Matsumoto, Norio Tokuda, Yasuo Cho

    Mater. Sci. Forum　1062　298-303　2022/05/31

    Publisher: Trans Tech Publications, Ltd.

    DOI： 10.4028/p-n0z51t 　

    eISSN： 1662-9752

    More details Close

    Improvement of channel mobility is required to improve the performance of the inversion channel MOSFETs using diamond. The previous studies have suggested that high interface defect density (Dit) at the Al2O3/diamond (111) interface has a significant impact on the carrier transport property on a channel region. To investigate the physical origins of the high Dit, especially from microscopic point of view, here we investigate Al2O3/p-type diamond (111) interfaces using scanning nonlinear dielectric microscopy (SNDM). We find the high spatial fluctuations of Al2O3/hydroxyl (OH)-terminated diamond (111) interface properties and their difference by the flatness of the diamond surface.

  8. Surface Potential Fluctuations of SiO2/SiC Interfaces Investigated by Local Capacitance-Voltage Profiling Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Mater. Sci. Forum　1062　335-340　2022/05/31

    Publisher: Trans Tech Publications, Ltd.

    DOI： 10.4028/p-2t7zak 　

    eISSN： 1662-9752

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    We investigate surface potential fluctuations on SiO2/SiC interfaces by local capacitance-voltage profiling based on time-resolved scanning nonlinear dielectric microscopy. As experimental indicators of surface potential fluctuations, we measured the spatial fluctuations of local capacitance-voltage and its first derivative profiles through the detection of the voltages at the infection points of the profiles. We show that, even for a sample with a nitrided interface with low interface defect density, the fluctuations of the measured voltages are much higher than the thermal energy at room temperature. This indicates the existence of high potential fluctuations, which can give the significant impacts on the carrier transport at the SiO2/SiC interface of SiC metal-oxide-semiconductor field effect transistors.

  9. Local capacitance-voltage profiling on MoS2/SiO2 and MoS2/h-BN/SiO2 by scanning nonlinear dielectric microscopy assisted with an insulating tip Peer-reviewed

    Taiyo Ishizuka, Kohei Yamasue, Yasuo Cho

    2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)　2022/03/06

    Publisher: IEEE

    DOI： 10.1109/edtm53872.2022.9798093 　

  10. Boxcar Averaging Scanning Nonlinear Dielectric Microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Nanomaterials　12　(5)　794-1-794-19　2022/02/26

    Publisher: MDPI AG

    DOI： 10.3390/nano12050794 　

    eISSN： 2079-4991

    More details Close

    Scanning nonlinear dielectric microscopy (SNDM) is a near-field microwave-based scanning probe microscopy method with a wide variety of applications, especially in the fields of dielectrics and semiconductors. This microscopy method has often been combined with contact-mode atomic force microscopy (AFM) for simultaneous topography imaging and contact force regulation. The combination SNDM with intermittent contact AFM is also beneficial for imaging a sample prone to damage and using a sharp microscopy tip for improving spatial resolution. However, SNDM with intermittent contact AFM can suffer from a lower signal-to-noise (S/N) ratio than that with contact-mode AFM because of the shorter contact time for a given measurement time. In order to improve the S/N ratio, we apply boxcar averaging based signal acquisition suitable for SNDM with intermittent contact AFM. We develop a theory for the S/N ratio of SNDM and experimentally demonstrate the enhancement of the S/N ratio in SNDM combined with peak-force tapping (a trademark of Bruker) AFM. In addition, we apply the proposed method to the carrier concentration distribution imaging of atomically thin van der Waals semiconductors. The proposed method clearly visualizes an anomalous electron doping effect on few-layer Nb-doped MoS2. The proposed method is also applicable to other scanning near-field microwave microscopes combined with peak-force tapping AFM such as scanning microwave impedance microscopy. Our results indicate the possibility of simultaneous nanoscale topographic, electrical, and mechanical imaging even on delicate samples.

  11. Local capacitance-voltage profiling and high voltage stress effect study of SiO2/SiC structures by time-resolved scanning nonlinear dielectric microscopy Peer-reviewed

    K. Yamasue, Y. Cho

    Microelectron. Reliab.　126　114284-1-114284-6　2021/11

    Publisher: Elsevier BV

    DOI： 10.1016/j.microrel.2021.114284 　

    ISSN： 0026-2714

  12. Nanoscale capacitance-voltage profiling of DC bias induced stress on a high-κ/SiO2/Si gate stack Peer-reviewed

    Koharu Suzuki, Kohei Yamasue, Yasuo Cho

    Microelectron. Reliabi.　126　114278-1-114278-5　2021/11

    Publisher: Elsevier BV

    DOI： 10.1016/j.microrel.2021.114278 　

    ISSN： 0026-2714

  13. Simultaneous Interface Defect Density and Differential Capacitance Imaging by Time-Resolved Scanning Nonlinear Dielectric Microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    International Symposium for Testing and Failure Analysis　441-445　2021/10/31

    Publisher: ASM International

    DOI： 10.31399/asm.cp.istfa2021p0441 　

    ISSN： 0890-1740

    More details Close

    Abstract This work highlights the unique capabilities of time-resolved scanning nonlinear dielectric microscopy as demonstrated in the study of SiO2/SiC interfaces. Scanning nonlinear dielectric microscopy (SNDM) is a microwave-based scanning probe technique with high sensitivity to variations in tip-sample capacitance. Time-resolved SNDM, a modified version, is used in this study because it allows simultaneous nanoscale imaging of interface defect density (Dit) and differential capacitance (dC/dV), lending itself to correlation analysis and a better understanding of the relationships that influence interface quality. Through cross-correlation analysis, it is shown that Dit images are not strongly correlated with simultaneously obtained dC/dV images, but rather with difference images derived from dC/dV images recorded with different voltage sweep directions. The results indicate that the dC/dV images visualize the nonuniformity of the total interface charge density and the difference images reflect that of Dit at a particular energy range.

  14. Local Capacitance-Voltage Profiling and Deep Level Transient Spectroscopy of SiO2/SiC Interfaces by Scanning Nonlinear Dielectric Microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)　1-6　2021/09/15

    Publisher: IEEE

    DOI： 10.1109/ipfa53173.2021.9617348 　

  15. Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy Peer-reviewed

    Jun Hirota, Kohei Yamasue, Yasuo Cho

    Microelectron. Reliab.　114　113774-113774　2020/11

    Publisher: Elsevier BV

    DOI： 10.1016/j.microrel.2020.113774 　

    ISSN： 0026-2714

  16. Spatial scale dependent impact of non-uniform interface defect distribution on field effect mobility in SiC MOSFETs Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Microelectron. Reliab.　114　113829-113829　2020/11

    Publisher: Elsevier BV

    DOI： 10.1016/j.microrel.2020.113829 　

    ISSN： 0026-2714

  17. Nanoscale characterization of unintentional doping of atomically thin layered semiconductors by scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    J. Appl. Phys.　128　(7)　074301-074301　2020/08/21

    Publisher: AIP Publishing

    DOI： 10.1063/5.0016462 　

    ISSN： 0021-8979

    eISSN： 1089-7550

  18. Atomic Resolution Studies on Surface Dipoles by Noncontact Scanning Nonlinear Dielectric Microscopy and Potentiometry Invited Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)　2020/07

    Publisher: IEEE

    DOI： 10.1109/ifcs-isaf41089.2020.9234884 　

  19. Influence of Non-Uniform Interface Defect Clustering on Field-Effect Mobility in SiC MOSFETs Investigated by Local Deep Level Transient Spectroscopy and Device Simulation Peer-reviewed

    Kohei Yamasue, Yuji Yamagishi, Yasuo Cho

    Mater. Sci. Forum　1004　627-634　2020/07

    Publisher: Trans Tech Publications, Ltd.

    DOI： 10.4028/www.scientific.net/msf.1004.627 　

    eISSN： 1662-9752

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    It has recently been shown that interface defect density (<italic>D</italic>it) at SiO2/SiC interfaces can have non-uniform clustered distribution through the measurement by local deep level transient spectroscopy (local DLTS). Here we investigate the influence of the non-uniform <italic>D</italic>it clustering on the field-effect mobility in SiC metal-oxide-semiconductor field effect transistors (MOSFETs) by device simulation. We develop a three dimensional numerical model of a SiC MOSFET, which can incorporate actual <italic>D</italic>it distributions measured by local DLTS. Our main result is that the impact of the non-uniform <italic>D</italic>it clustering on field-effect mobility is negligible for a SiC MOSFET with high <italic>D</italic>it formed by dry thermal oxidation but it becomes significant for that with lower <italic>D</italic>it by post-oxidation annealing. The result indicates that channel mobility can be further improved by making <italic>D</italic>it distribution uniform as well as reducing <italic>D</italic>it.

  20. Evaluation of interface defect density distribution on macrostepped SiO2/SiC by time-resolved local deep level transient spectroscopy Peer-reviewed

    Anna Hosaka, Kohei Yamasue, Judith Woerle, Corrado Bongiorno, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho

    The 38th Annual NANO Testing Symposium (NANOTS2019)　75-79　2019/11

  21. Improvement of signal-to-noise ratio in semiconductor carrier distribution imaging by intermittent scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    The 38th Annual NANO Testing Symposium (NANOTS2019)　130-134　2019/11

  22. Development of cantilevers with insulating coating for semiconductor carrier distribution imaging using scanning nonlinear dielectric microscopy and its application to layered semiconductors Peer-reviewed

    Koki Takano, Kohei Yamasue, Yasuo Cho

    The 38th Annual NANO Testing Symposium (NANOTS2019)　135-140　2019/11

  23. Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Proceedings from the 45th International Symposium for Testing and Failure Analysis　498-503　2019/11

  24. Boxcar Averaging Based Scanning Nonlinear Dielectric Microscopy and Its Application to Carrier Distribution Imaging on 2D Semiconductors Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    2019 IEEE International Integrated Reliability Workshop (IIRW)　2019/10

    Publisher: IEEE

    DOI： 10.1109/iirw47491.2019.8989887 　

  25. A Study on Evaluation of Interface Defect Density on High-K/SiO2/Si and SiO2/Si Gate Stacks using Scanning Nonlinear Dielectric Microscopy Peer-reviewed

    Koharu Suzuki, Kohei Yamasue, Yasuo Cho

    2019 IEEE International Integrated Reliability Workshop (IIRW)　2019/10

    Publisher: IEEE

    DOI： 10.1109/iirw47491.2019.8989881 　

  26. Spatially-Resolved Evaluation of Interface Defect Density on Macrostepped SiO2/SiC using Local Deep Level Transient Spectroscopy Peer-reviewed

    Anna Hosaka, Kohei Yamasue, Judith Woerle, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho

    2019 IEEE International Integrated Reliability Workshop (IIRW)　2019/10

    Publisher: IEEE

    DOI： 10.1109/iirw47491.2019.8989888 　

  27. Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Microelectronics. Reliab.　100-101　113345　2019/09

    DOI： 10.1016/j.microrel.2019.06.037 　

  28. Two-dimensional defect mapping of the SiO2/4H-SiC interface Peer-reviewed

    Judith Woerle, Brett C. Johnson, Corrado Bongiorno, Kohei Yamasue, Gabriel Ferro, Dipanwita Dutta, Thomas A. Jung, Hans Sigg, Yasuo Cho, Ulrike Grossner, Massimo Camarda

    Phys. Rev. Materials　3　084602　2019/08

    DOI： 10.1103/PhysRevMaterials.3.084602 　

  29. Improved signal intensity in carrier distribution imaging of few-layer MoS2 by scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    The 38th Annual NANO Testing Symposium (NANOTS2018)　196-199　2018/11

  30. Local carrier distribution imaging on few-layer MoS2 exfoliated on SiO2 by scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Appl. Phys. Lett.　112　(24)　243102　2018/06/11

    Publisher: American Institute of Physics Inc.

    DOI： 10.1063/1.5032277 　

    ISSN： 0003-6951

  31. Introduction of scanning nonlinear dielectric microscopy and its applications to the evaluation of electronic materials and devices Invited Peer-reviewed

    Kohei Yamasue, Norimichi Chinone, Yasuo Cho

    The Journal of the Institute of Electrical Engineers of Japan　137　(10)　697-700　2017/10

    Publisher: The Institute of Electrical Engineers of Japan

    DOI： 10.1541/ieejjournal.137.697 　

    ISSN： 1340-5551

  32. Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry Peer-reviewed

    Kohei Yamasue, Hirokazu Fukidome, Keiichiro Tashima, Maki Suemitsu, Yasuo Cho

    Jpn. J. Appl. Phys.　55　(8)　08NB02-1-08NB02-5　2016/08

    DOI： 10.7567/JJAP.55.08NB02 　

    ISSN： 0021-4922

    eISSN： 1347-4065

  33. Scanning nonlinear dielectric potentiometry Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Rev. Sci. Instrum.　86　(9)　093704　2015/09

    DOI： 10.1063/1.4930181 　

    ISSN： 0034-6748

    eISSN： 1089-7623

  34. Experimental study of electric dipoles on an oxygen-adsorbed Si(100)-2 x 1 surface by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

    Masataka Suzuki, Kohei Yamasue, Yasuo Cho

    APPLIED PHYSICS LETTERS　107　(3)　031604-1-031604-5　2015/07

    DOI： 10.1063/1.4927244 　

    ISSN： 0003-6951

    eISSN： 1077-3118

  35. K. Yamasue, Atomic dipole imaging: NC-SNDM study on a hydrogen-terminated Si surface Invited

    Kohei Yamasue

    Imaging & Microscopy　17　(3)　43-45　2015/07

  36. Interfacial Charge States in Graphene on SiC Studied by Noncontact Scanning Nonlinear Dielectric Potentiometry Peer-reviewed

    Kohei Yamasue, Hirokazu Fukidome, Kazutoshi Funakubo, Maki Suemitsu, Yasuo Cho

    Phys. Rev. Lett.　114　(22)　226103-1-226103-5　2015/06

    DOI： 10.1103/PhysRevLett.114.226103 　

    ISSN： 0031-9007

    eISSN： 1079-7114

  37. Improved study of electric dipoles on the Si(100)-2 x 1 surface by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

    Masataka Suzuki, Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

    Appl. Phys. Lett.　105　(10)　101603-1-101603-3　2014/09

    DOI： 10.1063/1.4895031 　

    ISSN： 0003-6951

    eISSN： 1077-3118

  38. Atomic-dipole-moment induced local surface potential on Si(111)-(7 x 7) surface studied by non-contact scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Masayuki Abe, Yoshiaki Sugimoto, Yasuo Cho

    Appl. Phys. Lett.　105　(12)　121601-1-121601-5　2014/09

    DOI： 10.1063/1.4896323 　

    ISSN： 0003-6951

    eISSN： 1077-3118

  39. Atomic dipole moment distribution on a hydrogen-adsorbed Si(111)-(7 x 7) surface observed by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

    Daisuke Mizuno, Kohei Yamasue, Yasuo Cho

    Appl. Phys. Lett.　103　(10)　101601-1-101601-5　2013/09

    DOI： 10.1063/1.4820348 　

    ISSN： 0003-6951

    eISSN： 1077-3118

  40. Simultaneous measurement of tunneling current and atomic dipole moment on Si(111)-(7 × 7) surface by noncontact scanning nonlinear dielectric microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Journal of Applied Physics　113　(1)　014307-1-014307-　2013/01/07

    DOI： 10.1063/1.4772705 　

    ISSN： 0021-8979

  41. High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy Peer-reviewed

    Norimichi Chinone, Kohei Yamasue, Koichiro. Honda, Yasuo Cho

    J. Phys.: Conf. Ser.　471　(1)　012023-1-012023-4　2013

    DOI： 10.1088/1742-6596/471/1/012023 　

    ISSN： 1742-6588

  42. Atomic Scale Imaging of TiO2(100) Reconstructed Surfaces by Noncontact Scanning Nonlinear Dielectric Microscopy Peer-reviewed

    Nobuhiro Sawai, Kohei Yamasue, Yasuo Cho

    Jpn. J. Appl. Phys.　51　(12)　121801-1-121801-7　2012/12

    DOI： 10.1143/JJAP.51.121801 　

    ISSN： 0021-4922

  43. Lateral resolution improvement in scanning nonlinear dielectric microscopy by measuring super-higher-order nonlinear dielectric constants Peer-reviewed

    Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga, Koichiro Honda, Yasuo Cho

    Appl. Phys. Lett.　101　(21)　213112-1-213112-4　2012/11

    DOI： 10.1063/1.4766349 　

    ISSN： 0003-6951

  44. Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy Peer-reviewed

    Norimichi Chinone, Kohei Yamasue, Yoshiomi Hiranaga, Yasuo Cho

    Jpn. J. Appl. Phys.　51　(9)　09LE7-1-09LE7-5　2012/09

    DOI： 10.1143/JJAP.51.09LE07 　

    ISSN： 0021-4922

  45. Observation of Polarization Distribution on Si(111) Surface by Scanning Nonlinear Dielectric Microscopy Peer-reviewed

    Kohei Yamasue, Yasuo Cho

    Jpn. J. Appl. Phys.　50　(9)　09NE12-1-09NE12-5　2011/09

    DOI： 10.1143/JJAP.50.09NE12 　

    ISSN： 0021-4922

  46. Nonlinear Dynamics in Atomic Force Microscopy and Its Control for Nanoparticle Manipulation Peer-reviewed

    Kohei Yamasue, Takashi Hikihara

    Nonlinear Dynamics of Nanosystems　267-286　2010/09/09

    Publisher: Wiley-VCH

    DOI： 10.1002/9783527629374.ch9 　

  47. Stabilization of cantilever oscillation in dynamic-mode atomic force microscopy using time-delayed feedback Invited Peer-reviewed

    Kohei Yamasue, Takashi Hikihara

    KENBIKYO　45　(2)　137-139　2010

    Publisher:

    ISSN： 1349-0958

  48. Controlling chaos in dynamic-mode atomic force microscope Peer-reviewed

    Kohei Yamasue, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige, Takashi Hikihara

    Phys. Lett. A　373　(35)　3140-3144　2009/08

    DOI： 10.1016/j.physleta.2009.07.009 　

    ISSN： 0375-9601

  49. Recent Trends and Perspectives on Control Application in Atomic Force Microscopy Invited Peer-reviewed

    Kohei Yamasue, Takashi Hikihara

    Systems, control and information　53　(6)　236-242　2009/06/15

    Publisher: Institute of Systems, Control and Information Engineers

    DOI： 10.11509/isciesci.53.6_236 　

    ISSN： 0916-1600

  50. Transient Dynamics of Duffing System under Time-Delayed Feedback Control: Global Phase Structure and Application to Engineering Peer-reviewed

    Takashi Hikihara, Kohei Yamasue

    Handbook of Chaos Control: Second Edition　793-809　2008/05/20

    Publisher: Wiley-VCH Verlag GmbH &amp; Co. KGaA

    DOI： 10.1002/9783527622313.ch36 　

  51. Control of microcantilevers in dynamic force microscopy using time delayed feedback Peer-reviewed

    Kohei Yamasue, Takashi Hikihara

    Rev. Sci. Instrum.　77　(5)　053703　2006/05

    DOI： 10.1063/1.2200747 　

    ISSN： 0034-6748

  52. Persistence of chaos in a time-delayed-feedback controlled Duffing system Peer-reviewed

    Kohei Yamasue, Takashi Hikihara

    Phys. Rev. E　73　(3)　036209　2006/03

    DOI： 10.1103/PhysRevE.73.036209 　

    ISSN： 1539-3755

  53. Suppression of subharmonics and chaos in tapping mode atomic force microscopy using time delayed feedback control Peer-reviewed

    Kohei Yamasue, Takashi Hikihara

    Proceedings of the 2005 International Symposium on Nonlinear Theory and its Applications　927-930　2006

  54. Annihilation of periodic orbits in time delayed feedback controlled systems Peer-reviewed

    Kohei Yamasue, Takashi Hikihara

    Proceedings of the 2005 International Symposium on Nonlinear Theory and its Applications　29-32　2005

  55. A study on vibration characteristics of microcantilever probe near period-doubling bifurcation Peer-reviewed

    Kohei Yamasue, Takashi Hikihara

    Proceedings of the 2005 International Symposium on Nonlinear Theory and its Applications　582-585　2005

  56. A numerical study on suspension of molecules by microcantilever probe Peer-reviewed

    Takashi Hikihara, Kohei Yamasue

    Proceedings of the Fifth International Symposium on Linear Drives for Industry Applications　29-32　2005

  57. Domain of attraction for stabilized orbits in time delayed feedback controlled Duffing systems Peer-reviewed

    K Yamasue, T Hikihara

    Phys. Rev. E　69　(5)　056209　2004/05

    DOI： 10.1103/PhysRevE.69.056209 　

    ISSN： 1539-3755

  58. A study on multiple steady states and their relation to global structure in time delayed feedback controlled Duffing System Peer-reviewed

    Kohei Yamasue, Takashi Hikihara

    Proceedings of the 2004 International Symposium on Nonlinear Theory and its Applications　259-262　2004

Show all ︎Show first 5

Misc. 11

  1. 非接触走査型非線形誘電率ポテンショメトリによる4H-SiC(000<span style=text-decoration:overline>1</span>)上グラフェンの観察

    山末耕平, 吹留博一, 舩窪一智, 末光眞希, 長康雄

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)　76th　2015

  2. 非接触走査型非線形誘電率顕微鏡による水素インターカレートされた4H-SiC(0001)上グラフェンの観察

    山末耕平, 吹留博一, 舩窪一智, 末光眞希, 長康雄

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)　75th　2014

  3. 非接触走査型非線形誘電率顕微鏡による4H-SiC(0001)上グラフェンの高分解能観察

    山末耕平, 吹留博一, 舩窪一智, 末光眞希, 長康雄

    応用物理学会春季学術講演会講演予稿集(CD-ROM)　61st　2014

  4. On uniform ultimate boundedness of solutions in time-delayed feedback controlled systems

    YAMASUE Kohei, HIKIHARA Takashi

    IEICE technical report　109　(269)　35-38　2009/11/04

    Publisher: The Institute of Electronics, Information and Communication Engineers

    ISSN： 0913-5685

    More details Close

    The time-delayed feedback control is a continuous control method for stabilizing unstable periodic orbits embedded in chaotic attractors. As an applicatoin of the Lyapunov-Razumikhin method, we show a class of two dimensional non-autonomous systems whose solutions are uniformly ultimately bounded under the control input. We also numerically discuss the behavior of solutions in the two-well Duffing system controlled by velocity feedback.

  5. A study on electrical control of parameters of cantilever with laminated piezoelectric plates : reguration of elasticity and Q factor

    TOMITA TATSUYA, YAMASUE Kohei, HIKIHARA Takashi

    IEICE technical report　106　(451)　41-46　2007/01/10

    Publisher: The Institute of Electronics, Information and Communication Engineers

    ISSN： 0913-5685

    More details Close

    Microfabricated cantilevers laminated with piezoelectric thin films (piezoelectric cantilevers) have been developed as probes of atomic force microscopes due to the capability of integrated deflection sensing and oscillation excitation. In this report, we propose parametric control of piezoelectric cantilevers, which allow us to control the quality factor and the elasticity using feedback. We also present the elasticity control without feedback based on the recently developed method by Date et al.. The proposed elasticity control methods enable the parametric resonance based operation presented by Moreno-Moreno et al..

  6. A-2-23 A Numerical Study on Enhancement of Sensitivity of Piezoelectric Vibration Sensor

    Tomita Tatsuya, Yamasue Kohei, Hikihara Takashi

    Proceedings of the IEICE General Conference　2006　59-59　2006/03/08

    Publisher: The Institute of Electronics, Information and Communication Engineers

  7. A-2-10 Improved Transient Response in non-contact Atomic Force Microscopy under Time Delayed Feedback Control

    YAMASUE Kohei, HIKIHARA Takashi

    Proceedings of the IEICE General Conference　2005　49-49　2005/03/07

    Publisher: The Institute of Electronics, Information and Communication Engineers

  8. Application of time delayed feedback control to non-contact atomic force microscopy

    YAMASUE Kohei, HIKIHARA Takashi

    IEICE technical report. Nonlinear problems　104　(583)　1-4　2005/01/17

    Publisher: The Institute of Electronics, Information and Communication Engineers

    ISSN： 0913-5685

    More details Close

    Recently, it has been shown that a microcantilever-tip-sample system in atomic force microscopy possibly exhibits a chaotic motion due to the nonlinear tip-sample interaction force. In this report, we propose to employ the time delayed feedback control method (Pyragas method) to eliminate the chaotic vibration from the microcantilever-tip-sample system. The possibility of improvement in the sensing process is numerically discussed with relevance to the transient response of the controlled microcantilever-tip-sample system.

  9. Multiple Steady States and Their Relation to Remaining Chaos in Time Delayed Feedback Controlled Duffing System

    YAMASUE Kohei, HIKIHARA Takashi

    IEICE technical report. Nonlinear problems　104　(294)　11-15　2004/09/06

    Publisher: The Institute of Electronics, Information and Communication Engineers

    ISSN： 0913-5685

    More details Close

    This paper concerns the bifurcation and origin of nontarget periodic orbits, which are unexpectedly stabilized under the time delayed feedback control of a two-well Duffing system. We reveal that the annihilation of the nontarget orbits by saddle-node bifurcation gives a criterion for the disappearance of the global structure governed by original chaos under the control.

  10. Relationship between invariant manifold and convergence of solution in magneto-elastic beam system under time delayed feedback control

    YAMASUE Kohei, HIKIHARA Takashi

    IEICE technical report. Nonlinear problems　103　(185)　19-24　2003/07/14

    Publisher: The Institute of Electronics, Information and Communication Engineers

    ISSN： 0913-5685

    More details Close

    Time delayed feedback control is well-known as a practical method for stabilizing unstable periodic orbits embedded in chaotic attractors. The systems under the control method are described by delay differential equations and then become infinite dimensional systems whose phase space is in function space. However, no intrinsic discussion has been obtained for the control characteristics associated with global dynamics in function space. In this report, we numerically are going to discuss the unstable manifold originating from the unstabilizable solution with relation to the domain of attraction of target unstable periodic orbits and transient response in stabilization.

  11. Domain of attraction for initial function space towards convergent solutions in Duffing system under time-delayed feedback control

    HIKIHARA Takashi, YAMASUE Kohei

    IEICE technical report. Nonlinear problems　102　(298)　7-12　2002/08/28

    Publisher: The Institute of Electronics, Information and Communication Engineers

    ISSN： 0913-5685

    More details Close

    The time-delayed feedback control method for controlling chaos in Duffing system is numerically discussed. Especially the domain of attraction in the initial function space at the onset of control is focused on. As for the stabilization of UPOs embedded in chaotic attractors, the limitation of control was clarified experimentally and theoretically. However, the attraction domain in the initial function space has never been discussed from the standpoint of global dynamics in the system with time delay. In this report some numerical discussion on the domain of attraction will be given.

Show all ︎Show first 5

Books and Other Publications 2

  1. Nonlinear Dynamics of Nanosystems

    YAMASUE Kohei, HIKIHARA Takashi

    Wiley-VCH　2010/04

    ISBN: 9783527407910

  2. Handbook of Chaos Control Second completely revised and enlarged edition

    HIKIHARA Takashi, YAMASUE Kohei

    Wiley-VCH　2007/12

    ISBN: 9783527406050

Presentations 63

  1. アンダーサンプリングを用いた時間分解走査型非線形誘電率顕微鏡による掃引時間可変局所CV特性測定法の開発

    鈴木 智博, 山末 耕平

    第71回応用物理学会春季学術講演会, 東京理科大学野田キャンパス&オンライン　2025/03/16

  2. 時間分解走査型非線形誘電率顕微鏡によるSiO2/SiCの温度制御局所DLTS測定

    山末 耕平, 長 康雄

    第71回応用物理学会春季学術講演会, 東京理科大学野田キャンパス&オンライン　2025/03/17

  3. 熱アシスト誘電体記録における光照射ナノ秒誘電応答

    長 康雄, 山末 耕平

    第71回応用物理学会春季学術講演会, 東京理科大学野田キャンパス&オンライン　2025/03/15

  4. Combined local DLTS/CV measurement of Al2O3/OH-diamond (111) interface by time-resolved scanning nonlinear dielectric microscopy

    K. Yamasue, T. Matsumoto, N. Tokuda, Y. Cho

    2024 MRS Fall Meeting & Exhibit, Boston, Massachusetts, USA　2024/12/04

  5. Simulation for the in-plane surface dipole moment distribution of the Si surface using DFT calculations

    A. Sumiyoshi, K. Yamasue, Y. Cho, J. Nakamura

    32nd International Colloquium on Scanning Probe Microsopy (ICSPM-32), Sapporo, Japan　2024/11/18

  6. Visualization of the Surface Dipole Moment at the Si(111) Surfaces Using First-Principles Calculations

    A. Sumiyoshi, K. Yamasue, Y. Cho, J. Nakamura

    The 10th International Symposium on Surface Science (ISSS-10), Kita-kyushu, Japan　2024/10/21

  7. 走査型非線形誘電率顕微鏡によるAl2O3/OHダイヤモンド(111)の局所DLTS/CV特性同時測定

    山末 耕平, 松本 翼, 德田 規夫, 長 康雄

    第84回応用物理学会秋季学術講演会， 朱鷺メッセほか2会場&オンライン，新潟　2024/09/19

  8. HAFeR技術開発の為の時間分解SNDM法

    長 康雄, 山末 耕平

    第84回応用物理学会秋季学術講演会, 朱鷺メッセほか2会場&オンライン，新潟　2024/09/17

  9. 第一原理計算を用いた Si(111)-(7x7)表面における表面双極子の可視化

    住吉 晶, 山末 耕平, 長 康雄, 中村 淳

    第84回応用物理学会秋季学術講演会, 朱鷺メッセほか2会場&オンライン，新潟　2024/09/18

  10. Nanoscale probing of charge states at the Al2O3/OH-diamond (111) interface and their impact on diamond MOSFET performance

    K. Yamasue, Y. Ogata, T. Matsumoto, N. Tokuda, Y. Cho

    34th International Conference on Diamond and Carbon Materials, Dresden, Germany　2024/09/04

  11. Chaos control via time-delayed feedback: numerical studies and application to AFM cantilever dynamics Invited

    山末 耕平

    2024 年度共同利用・共同研究拠点明治大学MIMS「現象数理学研究拠点」共同研究集会MEMSデバイスに発生するtouch-down 現象の制御に向けた数理的アプローチ，明治大学中野キャンパス，東京都　2024/08/08

  12. 走査型非線形誘電率顕微鏡による原子層半導体積層構造のキャリア分布観察

    石塚 太陽, 山末 耕平

    通研共同プロジェクト研究(R05/S01) 夏季研究会 ～先端的コヒーレント波技術の応用研究～，東北大学電気通信研究所　2024/07/30

  13. 時間分解SNDMを⽤いた次世代半導体材料のナノスケール電荷状態観察 Invited

    山末 耕平

    次世代ナノプローブ技術委員会，第2回研究会，Shimadzu Tokyo Innovation Plaza, 川崎市　2024/03/12

  14. 走査型非線形誘電率顕微鏡の次世代パワーエレクトロニクス材料評価への応用 Invited

    山末 耕平

    名古屋大学VBLシンポジウム「GaNパワーデバイスの社会実装に向けた評価と技術」，名古屋大学　2023/11/30

  15. 走査型非線形誘電率顕微鏡によるSiO2上機械剥離MoS2の局所DLTS測定

    石塚 太陽, 山末 耕平

    第70回 応用物理学会春季学術講演会，上智大学四谷キャンパス+オンライン

  16. Scanning nonlinear dielectric microscopic investigation of mechanically exfoliated WSe2/SiO2 and suspended WSe2

    Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, Yasuo Cho

    2022 MRS Fall Meeting & Exhibit, Boston, Massachusetts, USA

  17. Real-space analysis on surface potential fluctuations of Al2O3/GaN interfaces by scanning nonlinear dielectric microscopy

    Kohei Yamasue, Yuto Ando, Manato Deki, Hiroshi Amano, Yasuo Cho

    International Workshop on Nitride Semiconductors (IWN2022), Berlin, Germany

  18. Comparative study on carrier distribution of mechanically exfoliated WSe2/SiO2 and suspended WSe2 by scanning nonlinear dielectric microscopy

    Koki Takano, Kohei Yamasue, Toshiaki Kato, Toshiro Kaneko, Yasuo Cho

    The 22nd International Vacuum Congress (IVC-22), Sapporo Convention Center, Sapporo, Japan

  19. 走査型非線形誘電率顕微鏡の原理と半導体ナノスケール物性評価への応用 Invited

    山末 耕平

    電気化学会電子材料委員会 第86回半導体・集積回路技術シンポジウム　2022/08/31

  20. 時間分解SNDMを用いた半導体のナノスケール評価に関する最近の展開 Invited

    山末 耕平

    東京大学物性研究所短期研究会 「機能的走査プローブ顕微鏡の新展開」　2022/03/30

  21. 時間分解走査型非線形誘電率顕微鏡によるSiO2/SiC界面のナノスケールキャリアダイナミクスの可視化

    山末 耕平, 長 康雄

    第41回ナノテスティングシンポジウム(NANOTS2021)　2021/10/25

  22. 時間分解走査型非線形誘電率顕微鏡による直流バイアスストレス印加時のhigh-κ/SiO2/Siにおける局所容量-電圧特性測定

    鈴木 小春, 山末 耕平, 長 康雄

    第41回ナノテスティングシンポジウム(NANOTS2021)　2021/10/27

  23. 時間分解SNDMを用いたダイヤモンドMOS界面の 界面準位密度評価に関する検討

    尾形 結友, 山末 耕平, Zhang Xufang, 松本 翼, 徳田 規夫, 長 康雄

    第41回ナノテスティングシンポジウム(NANOTS2021)　2021/10/27

  24. Nanoscale carrier distribution imaging on atomically-thin layered semiconductors by scanning nonlinear dielectric microscopy International-presentation Invited

    Kohei Yamasue, Yasuo Cho

    The 4th international symposium on “Elucidation of Property of Next Generation Functional Materials and Surface/Interface"　2019/12/09

  25. Unintentional n-type doping on single layer Nb-doped MoS＜SUB>2</SUB> observed by scanning nonlinear dielectric microscopy International-presentation

    Kohei Yamasue, Yasuo Cho

    2019 MRS fall meeting and exhibit　2019/12/05

  26. Improvement of signal-to-noise ratio in semiconductor carrier distribution imaging by intermittent scanning nonlinear dielectric microscopy International-presentation

    Kohei Yamasue, Yasuo Cho

    The 38th Annual NANO Testing Symposium (NANOTS2019)　2019/11/19

  27. Development of cantilevers with insulating coating for semiconductor carrier distribution imaging using scanning nonlinear dielectric microscopy and its application to layered semiconductors International-presentation

    Koki Takano, Kohei Yamasue, Yasuo Cho

    The 38th Annual NANO Testing Symposium (NANOTS2019)　2019/11/19

  28. Evaluation of interface defect density distribution on macrostepped SiO2/SiC by time-resolved local deep level transient spectroscopy International-presentation

    Anna Hosaka, Kohei Yamasue, Judith Woerle, Corrado Bongiorno, Gabriel Ferro, Ulrike Grossner, Massimo Camarda, Yasuo Cho

    The 38th Annual NANO Testing Symposium (NANOTS2019)　2019/11/18

  29. Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy International-presentation

    Kohei Yamasue, Yasuo Cho

    The 45th International Symposium for Testing and Failure Analysis (ISTFA2019)　2019/11/13

  30. Spatially Resolved Defect Mapping of the SiO2/4H-SiC Interface International-presentation

    Judith Woerle, Brett C. Johnson, Corrado Bongiorno, Kohei Yamasue, Gabriel Ferro, Dipanwita Dutta, Yasuo Cho, Ulrike Grossner, Massimo Camarda

    International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)　2019/10/02

  31. Influence of non-uniform interface defect distribution on channel mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation International-presentation

    Kohei Yamasue, Yuji Yamagishi, Yasuo Cho

    International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM 2019)　2019/10/01

  32. Optimization of signal intensity in intermittent contact scanning nonlinear dielectric microscopy International-presentation

    Kohei Yamasue, Yasuo Cho

    The 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019)　2019/09/25

  33. Improvement of signal-to-noise ratio in carrier distribution imaging in intermittent contact scanning nonlinear dielectric microscopy based on boxcar integration International-presentation

    Kohei Yamasue, Yasuo Cho

    18th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII)　2019/09/10

  34. Surface dipole induced potentials on metals observed by noncontact scanning nonlinear dielectric potentiometry International-presentation

    Kohei Yamasue, Yasuo Cho

    The 17th International Conference on the Formation of Semiconductor Interfaces (ICFSI-17)　2019/06/27

  35. 時間遅れフィードバックを用いたカオス制御系の力学構造について Invited

    山末 耕平

    同期現象と周期軌道の安定化に関するシンポジウム　2019/03

  36. 山末 耕平，原子分解能を持つ非接触走査型非線形誘電率顕微鏡の研究，日本顕微鏡学会 超高空間分解能SPMの最前線，大阪大学東京オフィス，Feb. 1(2019) Invited

    山末 耕平

    日本顕微鏡学会 超高空間分解能SPMの最前線　2019/02/01

  37. 原子分解能を有する非接触走査型非線形誘電率顕微鏡を用いた表面研究 Invited

    山末 耕平

    2018年日本表面真空学会学術講演会 プローブ顕微鏡研究部会「プローブ顕微鏡による表面研究の最前線」　2018/11/19

  38. 超高次走査型非線形誘電率顕微鏡法による次世代パワー半導体デバイスの評価と走査型非線形誘電率ポテンショメトリの提案 Invited

    長 康雄, 茅根 慎通, 廣瀬 光太郎, 山末 耕平

    2015年 第76回応用物理学会秋季学術講演会　2015/09/15

  39. Atomic dipole moments on hydrogen-adsorbed Si(111)-7×7 surface observed by using noncontact scanning nonlinear dielectric microscopy International-presentation

    Daisuke Mizuno, Yasuo Cho

    The 20th International Colloquium on Scanning Probe Microscopy　2012/12/17

  40. Super Higher Order Nonlinear Dielectric Microscopy with Super High Resolution International-presentation

    Norimichi Chinone, Yoshiomi Hiranaga, Koichiro Honda, Yasuo Cho

    2012 MRS fall meeting　2012/11/25

  41. Non-contact Scanning Nonlinear Dielectric Microscopy Studies of Atomic Dipole Moments on Hydrogen-adsorbed Si(111)‐(7×7) Surface International-presentation

    Daisuke Mizuno, Yasuo Cho

    2012 MRS fall meeting　2012/11/25

  42. 非接触走査型非線形誘電率顕微鏡を用いたSi(111)再構成表面観察における双極子モーメント分布の可視化メカニズムに関する検討

    長康雄

    第73回応用物理学会学術講演会　2012/09/11

  43. 超高次非線形誘電率顕微鏡によるMOS型電界効果トランジスタ断面の高分解能観察

    茅根慎通, 本田耕一郎, 長康雄

    第73回応用物理学会学術講演会　2012/09/11

  44. Simultaneous imaging of current and local dipole moments of Si(111)-(7×7) surface by noncontact scanning nonlinear dielectric microscopy International-presentation

    長康雄

    15th International Conference on non-contact Atomic Force Microscopy　2012/07/01

  45. Observation of dipole moments on hydrogen-adsorbed Si(111)-(7×7) surface by non-contact scanning nonlinear dielectric microscopy International-presentation

    水野大督, 長康雄

    15th International Conference on non-contact Atomic Force Microscopy　2012/07/01

  46. 超高次非線形誘電率顕微鏡を用いた強誘電体ナノ分極の観察

    茅根慎通, 平永良臣, 長康雄

    第29回強誘電体応用会議　2012/05/23

  47. Observation of local dipole moments on cleaned Si(111)surface with defects by non-contact scanning nonlinear dielectric microscopy International-presentation

    Kohei Yamasue, Yasuo Cho

    14th International Conference on Noncontact Atomic Force Microscopy　2011/09/19

  48. 非接触走査型非線形誘電率顕微鏡によるSi(111)表面の電荷分布に関する検討

    山末耕平, 長康雄

    第72回応用物理学関係連合講演会　2011/08/31

  49. 走査型非線形誘電率顕微鏡によるSi(111)表面の分極分布観察

    長康雄

    第28回 強誘電体応用会議講演予稿集　2011/05/25

  50. 非接触走査型非線形誘電率顕微鏡によるSi(111)表面のドメイン境界観察

    長康雄

    第58回応用物理学関係連合講演会　2011/03/24

    More details Close

    発表会は東日本大震災のため中止，講演会は成立

  51. Chaotic cantilever oscillation and its control in amplitude modulation atomic force microscopy International-presentation

    YAMASUE Kohei, KOBAYASHI Kei, YAMADA Hirofumi, MATSUSHIGE Kazumi, HIKIHARA Takashi

    2nd Multifrequency AFM Conference　2009/06/15

  52. Experimental study on stabilization of chaotic cantilever oscillation in AM-AFM by time-delayed feedback control International-presentation

    YAMASUE Kohei, KOBAYASHI Kei, YAMADA Hirofumi, MATSUSHIGE Kazumi, HIKIHARA Takashi

    11th International Conference on Non-contact Atomic Force Microscopy (NCAFM-2008)　2008/09/16

  53. Control of chaotic sensor oscillation in dynamic-mode atomic force microscopy International-presentation

    YAMASUE Kohei, KOBAYASHI Kei, YAMADA Hirofumi, MATSUSHIGE Kazumi, HIKIHARA Takashi

    The 5th International Conference on Nonlinear Science (Dynamics Days Asia Pacific 5)　2008/09/09

  54. Parametric excitation of piezoelectric cantilevers based on elasticity control International-presentation

    TOMITA Tatsuya, YAMASUE Kohei, HIKIHARA Takashi

    9th International Conference on Atomically Controlled Surfaces(ACSIN-9)　2007/11/11

  55. 時間遅れフィードバックを用いたカオス制御系の力学構造について

    同期現象と周期軌道の安定化に関するシンポジウム　2007/03/09

  56. Suppression of subharmonics and chaos in tapping mode atomic force microscopy using time delayed feedback control International-presentation

    YAMASUE Kohei, HIKIHARA Takashi

    2006 International Symposium on Nonlinear Theory and its Applications　2006/09/11

  57. A study on vibration characteristics of microcantilever probe near period-doubling bifurcation International-presentation

    YAMASUE Kohei, HIKIHARA Takashi

    2005 International Symposium on Nonlinear Theory and its Applications　2005/10/18

  58. A Numerical Study on Suspension of Molecules by Microcantilever Probe International-presentation

    HIKIHARA Takashi, YAMASUE Kohei

    The Fifth International Symposium on Linear Drives for Industry Applications　2005/09/25

  59. Annihilation of periodic orbits in time delayed feedback controlled systems, 2005 International Symposium on Nonlinear Theory and its Applications International-presentation

    YAMASUE Kohei, HIKIHARA Takashi

    2005 International Symposium on Nonlinear Theory and its Applications　2005/09/18

  60. Improvement of transient response in non-contact atomic force microscopy: an application of time delayed feedback control International-presentation

    YAMASUE Kohei, HIKIHARA Takashi

    XXV Dynamics Days Europe 2005　2005/07/25

  61. A study on multiple steady states and their relation to global structure in time delayed feedback controlled Duffing System International-presentation

    YAMASUE Kohei, HIKIHARA Takashi

    2004 International Symposium on Nonlinear Theory and its Applications　2004/11/29

  62. Influence of remaining chaos on convergence of solutions in time delayed feedback controlled Duffing system International-presentation

    YAMASUE Kohei, HIKIHARA Takashi

    XXI International Congress of Theoretical and Applied Mechanics　2004/08/15

  63. A Study on domain of attraction in time-delayed feedback controlled Duffing system International-presentation

    HIKIHARA Takashi, YAMASUE Kohei

    Dynamics Days Europe 2002　2002/07/15

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Research Projects 13

  1. SNDMを用いた次世代パワーエレクトロニクスの創出に資する革新的評価技術の開発

    山末 耕平

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業

    Category: 基盤研究(A)

    Institution: 東北大学

    2024/04 - 2028/03

  2. 光支援・時間分解走査型非線形誘電率顕微鏡による半導体界面の深い欠陥準位の顕微分光

    山末 耕平

    Offer Organization: 公益財団法人村田学術振興・教育財団

    System: 研究助成

    Institution: 東北大学

    2025/07 - 2027/06

  3. 走査型非線形誘電率顕微鏡による原子層材料・デバイスのナノ・原子スケール物性評価

    山末 耕平

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業 基盤研究(B)

    Category: 基盤研究(B)

    Institution: 東北大学

    2020/04/01 - 2024/03/31

  4. 走査型非線形誘電率顕微鏡を用いたGaN-MOSの高性能化に資する計測評価

    長康雄,山末耕平

    Offer Organization: 文部科学省

    System: 革新的パワーエレクトロニクス創出基盤技術研究開発事業

    Institution: 東北大学

    2021/08 -

  5. 非線形誘電率顕微鏡法を用いた界面電荷輸送現象における諸問題の起源解明

    長 康雄, 平永 良臣, 山末 耕平

    Offer Organization: 日本学術振興会

    System: 科学研究費助成事業 基盤研究(S)

    Category: 基盤研究(S)

    Institution: 東北大学

    2016/05/31 - 2021/03/31

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    ①H28年度に高度化した超高次非線形誘電率顕微鏡法を適用し太陽電池のパッシベーション膜に捕獲された固定電荷に関して詳細な観測を行うことに成功した． ②MoS2,WSe2等の新規2次元物質の評価解析を新たにPeak force tapping 方式のSNDMを開発することにより，極薄な層状構造半導体を破壊することなく，キャリアタイプと濃度が計測できる事を明らかにした． ③H28年度開発した局所DLTS法をさらに発展させSiO2/SiC界面の浅い準位の界面準位密度の2次元分布を計測した．具体的には新規に低温で計測できる局所DLTS計測装置を開発し，これを用いて浅い準位の界面準位密度計測し，更にエネルギー準位をできるだけ合わせて計測したSNDM像の間に正の相関があることを明らかにした． ④H28年度から開発を続けている，走査型非線形誘電率常磁性共鳴顕微鏡装置（SNDMR）に関する理論的研究を行い，SNDMの高感度性があれば，局所的な電子スピン共鳴を検出できる事を明らかにした． ⑤時間分解走査型非線形誘電率顕微鏡(Tr-SNDM)の開発に成功し，非常に広帯域で高速な静電容量応答が検出可能になった．更にこの手法を局所DLTS法に適用し高分解能な局所DLTSによるSiO2/4H-SiC界面の欠陥分布観察に成功した． ⑥線形誘電率分布計測の行えるdc/dz-SNDM法の開発に成功した．この手法の開発の成功により従来高精度な線形誘電率計測や半導体のドーパント濃度の定量計測が難しかったSNDM法の適用範囲を大幅に広げた．本装置はプローブ顕微鏡メーカで実用化されることが決定し現在実用機の開発が始まろうとしている．

  6. Development of scanning nonlinear dielectric potentiometry and its applications to electronic materials and devices evaluation

    Yamasue Kohei

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research Grant-in-Aid for Scientific Research (C)

    Category: Grant-in-Aid for Scientific Research (C)

    Institution: Tohoku University

    2015/04/01 - 2018/03/31

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    We developed a novel scanning probe microscopy method called scanning nonlinear dielectric potentiometry (SNDP). This microscopy method is a potentiometric extension of scanning nonlinear dielectric microscopy and allows the nano- to atomic-scale quantitative measurement of electric potentials induced by spontaneous polarization on surfaces and interfaces. In this project, we developed an apparatus for SNDP measurement, experimentally validated some theoretical aspects, and also made a further extension of SNDP. In addition, we explored the new application areas of SNDP and demonstrated that this microscopy method will useful for the nano-scale evaluation of emerging atomic-layer materials and devices such as graphene and related electronic devices.

  7. 超高次非線形誘電率顕微鏡法を用いたSiC基板材料及びパワーエレクトロニクス素子の高性能化に資する評価技術の開発

    Offer Organization: NEDO

    System: 戦略的イノベーション創造プログラム（SIP）

    Category: 次世代パワーエレクトロニクス

    Institution: 東北大学

    2014 - 2018

  8. High functionalization of nonlinear dielectric microscopy and its application to electronic devices

    Cho Yasuo

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research Grant-in-Aid for Scientific Research (S)

    Category: Grant-in-Aid for Scientific Research (S)

    Institution: Tohoku University

    2011/04/01 - 2016/03/31

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    New SNDM family method, which measures not only dC/dV term but also higher order differentiation terms, has been developed. Using this method, we can obtain much more precise physical information of materials and devices. We name this technique super-higher-order scanning nonlinear dielectric microscopy (SHO-SNDM). We can easily reconstruct C-V curve at each pixel with this method. As a result, the analysis ability is drastically improved.Next, we have developed scanning nonlinear dielectric potentiometory (SNDP) which can measure dipole moment induced surface potential with atomic resolution. Using this method, we simultaneously measured topography and surface potential of mono layer graphene formed on the 4H-SiC(0001) substrate. Finally, memory density of 3.4Tbit/inch2 were achieved using the hard-disk-drive (HDD)-type ferroelectric data storage system.

  9. 走査型非線形誘電率顕微鏡に基づくナノスケール自発分極定量測定法の開発

    Offer Organization: 公益財団法人島津科学技術振興財団

    System: 研究開発助成

    Institution: 東北大学

    2016 -

  10. Energy-assisted ferroelectric recording using scanning nonlinear dielectric microscopy

    YAMASUE Kohei

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research Grant-in-Aid for Young Scientists (B)

    Category: Grant-in-Aid for Young Scientists (B)

    Institution: Tohoku University

    2012/04/01 - 2015/03/31

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    Ferroelectric probe data storage has been known as a promising recording technology, because it is a potential candidate to replace the existing magnetic recording. In this research project, we performed a fundamental study and equipment development towards energy-assisted ferroelectric recording to reduce the energetic barrier height of polarization reversal by introducing external energy. We designed a recording head that can be integrated with scanning nonlinear dielectric microscopy (SNDM). In addition, we studied feedback mechanism to systematically identify the voltage necessary for the formation of nanodomains. We theoretically discuss the features of this feedback mechanism and also implemented it to an actual SNDM.

  11. Development of mechanism for operating nano/micro structure and scavenging micro-energy

    HIKIHARA Takashi, SATO Nobuo, YAMASUE Kohei

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research Grant-in-Aid for Challenging Exploratory Research

    Category: Grant-in-Aid for Challenging Exploratory Research

    Institution: Kyoto University

    2009 - 2011

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    The research topic focused on application of principles of electro-magnetic apparatuses to non-electro-magnetic force in nano/micro scale actuators. As results, the operation of micro mechanism and the possibility of energy scavenging was confirmed. These results can be extended to micro mechanical structure for energy propagation in one direction, that is ratchet mechanism. In addition, the possibility of functional memory is figure out based on mechanical resonators.

  12. Control of nonlinear cantilever oscillation in dynamic-mode atomic force microscopy

    YAMASUE Kohei

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research Grant-in-Aid for Young Scientists (B)

    Category: Grant-in-Aid for Young Scientists (B)

    2008 - 2010

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    Dynamic-mode atomic force microscopy has been a fundamental tool for research and development in the fields of nanoscience and nanotechnology. This microscopy enables us to observe topography and physical properties of sample surfaces by utilizing cantilever sensors that are extremely sensitive for tiny force at the atomic and molecular level. On the other hand, it has been recently reported that significant performance degradation can occur during measurement due to the irregular oscillation of cantilever sensors. In this research project, we proposed a novel control method for overcoming the performance degradation and newly developed a prototype controller for cantilever oscillation. The control performance was successfully demonstrated in an actual dynamic-mode atomic force microscope.

  13. Next Generation Super High Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy Technique

    CHO Yasuo, HIROSE Ryusuke, HIRANAGA Yoshiomi, KIN Nobuhiro, YAMASUE Kohei

    Offer Organization: Japan Society for the Promotion of Science

    System: Grants-in-Aid for Scientific Research Grant-in-Aid for Specially Promoted Research

    Category: Grant-in-Aid for Specially Promoted Research

    Institution: Tohoku University

    2006 - 2010

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    We had made a study on next generation high density ferroelectric data storage based on scanning nonlinear dielectric microscopy. We have succeeded in forming world smallest ferroelectric single nano-domain dot with the size of 2.8nm in diameter. Also, we had achieved the memory density of 4Tbit/inch^2 in actual information recording which requires an abundance of bits to be packed together.

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Teaching Experience 9

  1. 電磁気学I　東北大学工学部電気情報物理工学科

  2. 物理学実験　京都大学

  3. 電気電子工学実験A　京都大学工学部電気電子工学科

  4. 先端超高速情報工学　東北大学大学院工学研究科

  5. 固体電気音響デバイス工学　東北大学大学院工学研究科

  6. 電気・通信・電子・情報工学実験A　東北大学工学部情報知能システム総合学科

  7. 電気・通信・電子・情報工学実験B　東北大学工学部情報知能システム総合学科

  8. 電気情報物理工学実験B　東北大学工学部電気情報物理工学科

  9. 電磁気学I演習　東北大学工学部電気情報物理工学科

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